JP3901757B2 - Alkali-free glass, liquid crystal display panel and glass plate - Google Patents

Alkali-free glass, liquid crystal display panel and glass plate Download PDF

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JP3901757B2
JP3901757B2 JP31102095A JP31102095A JP3901757B2 JP 3901757 B2 JP3901757 B2 JP 3901757B2 JP 31102095 A JP31102095 A JP 31102095A JP 31102095 A JP31102095 A JP 31102095A JP 3901757 B2 JP3901757 B2 JP 3901757B2
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alkali
free glass
glass
mol
cao
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JPH09169539A (en
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学 西沢
泰昌 中尾
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AGC Inc
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Asahi Glass Co Ltd
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Description

【0001】
【発明の属する技術分野】
本発明は、各種ディスプレイやフォトマスク用基板ガラスとして好適な、アルカリ金属酸化物を実質上含有せずフロート成形可能な、無アルカリガラスおよびそれを用いた液晶ディスプレイパネルに関する。
【0002】
【従来の技術】
従来、各種ディスプレイ用基板ガラス、特に表面に金属または酸化物薄膜等を形成させるものでは、以下の特性が要求される。
【0003】
(1)アルカリ金属酸化物を含有すると、アルカリ金属イオンが薄膜中に拡散して、膜特性を劣化させるため、実質的にアルカリ金属イオンを含まないこと。
(2)薄膜形成工程で高温にさらされるので、ガラスの変形およびガラスの構造安定化に伴う収縮を最小限に抑えるため、高い歪点を有すること。
(3)半導体形成に用いられる各種薬品に対して充分な化学耐久性を有すること。特にSiOx やSiNx のエッチングのためのフッ酸、フッ化アンモニウム等を主成分とするバッファードフッ酸(BHF)に対して耐久性があること。
(4)内部および表面に欠点(泡、脈理、インクルージョン、ピット、キズ、等)をもたないこと。
【0004】
従来、各種ディスプレイやフォトマスク用基板ガラスとしてコーニングコード7059ガラスが広く用いられている。しかし、このガラスにはデイスプレイ用として以下に示す不充分な点があった。
【0005】
(1)歪点が593℃と低いので、ディスプレイ作製工程におけるガラスの収縮を低減するための前熱処理を、工程前に行わなければならない。
(2)金属電極や透明導電膜(ITOなど)のエッチングに用いる塩酸等への溶出量が多く、ディスプレイ作製工程中で溶出物が再結晶するなどして、ディスプレイ作製に困難がある。
【0006】
上記要求に加えて、近年、ディスプレイが大型化するに伴い次の2点が新たに要求されてきた。
【0007】
(1)上記コード7059ガラスの密度は2.76g/ccであり、さらに軽量化を図るため密度の小さいものが必要である。
(2)上記コード7059ガラスの熱膨張係数が46×10-7/℃であり、ディスプレイ作製時の昇降温速度を上げ、生産効率を上げるため、さらに熱膨張係数の小さいものが必要である。
【0008】
23 に関しては、特開平1−160844にはB23 を20〜23カチオン%含有するものが開示されているが、B23 量が多く歪点が充分には高くない。特開昭61−281041にはB23 を0.1〜4重量%、特開平4−175242にはB23 を0.1〜5モル%、特開平4−325435にはB23 を0〜3重量%、含有するものが開示されているが、B23 量が少なくBHFに対する耐久性が充分ではない。
【0009】
BaOに関しては、特開平4−325434にはBaOを10〜20重量%、特開昭63−74935にはBaOを10〜22重量%、特開昭59−169953にはBaOを15〜40重量%、含有するものが開示されているが、BaOが多く熱膨張係数が大きいうえ、密度も大きい。
【0010】
MgOに関しては、特開昭61−132536にはMgOを6.5〜12重量%、特開昭59−116147にはMgOを5〜15重量%、特開昭60−71540にはMgOを5〜17重量%、特開昭60−42246にはMgOを10〜25モル%、含有するものが開示されているが、MgOを多く含有したガラスは分相がおきやすくなる。
【0011】
CaOに関しては、特開昭63−176332にはCaOを11〜25重量%、特開昭58−32038にはCaOを7〜20モル%、特開平2−133334にはCaOを8〜15重量%、特開平3−174336にはCaOを7〜12重量%、特開平6−40739にはCaOを10〜12重量%、特開平5−201744にはCaOを18カチオン%以上、含有するものが開示されているが、CaOを多量に含有すると熱膨張係数が大きくなる傾向がある。
【0012】
Al23 に関しては、特開昭61−236631にはAl23 を22.5〜35重量%、含有するものが開示されているが、Al23 量が多く塩酸等への薬品への溶出が多い。
【0013】
25 に関しては、特開昭61−261232、特開昭63−11543、にはP25 を含有するものが開示されているが、薄膜の半導体特性を悪化させ好ましくない。
【0014】
【発明が解決しようとする課題】
また、歪点が640℃以上で、熱膨張係数が比較的小さいガラスは、特開平4−160030、特開平6−263473に記載されている。しかし、このガラスはBaOを相当量必須としているので、低密度と低熱膨張率の両立が難しく、より大型化をめざすという時代の要請に完全にこたえたものになっていない。
【0015】
本発明の目的は、上記欠点を解決するとともに、歪点が640℃以上で、熱膨張係数、密度が小さく、BHFにより白濁をおこさず、塩酸等の薬品への耐久性もすぐれ、熔解・成形が容易で、フロート成形が可能な無アルカリガラスを提供することにある。
【0016】
【課題を解決するための手段】
本発明は、歪点が640℃以上であって、モル%表示で実質的に、SiO2 :65〜70%、Al23 :9〜16%、B23 :6〜12%、MgO:0〜6%、CaO:0〜7%、SrO:1〜9%、MgO+CaO+SrO:7〜18%からなり、BaOを実質的に含有せず、密度が2.60g/cc未満であり、かつ90℃の0.1規定のHCl中に20時間浸漬後の単位面積あたりの重量減少量が0.3mg/cm 2 以下である無アルカリガラスである。
【0017】
【発明の実施の形態】
本発明の無アルカリガラスはアルカリ金属酸化物(例えばNa2 O、K2 Oなど)を実質的に含有しないものである。具体的にはアルカリ金属酸化物が総量で0.5重量%以下、より好ましくは0.2重量%以下とされる。
【0018】
上記の通り各成分の組成範囲を限定した理由について述べる。
【0019】
SiO2 はその含有量が60%モル未満では、歪点が充分に上げられないとともに、化学耐久性が悪化し、熱膨張係数が増大する。70モル%超では熔解性が低下し、失透温度が上昇する。好ましくは、66〜70モル%である。
【0020】
Al23 はガラスの分相性を抑制し、熱膨張係数を下げ、歪点を上げる。その含有量が5モル%未満ではこの効果があらわれず、16モル%超ではガラスの熔解性が悪くなる。好ましくは、9〜14モル%である。
【0021】
23 はBHFによる白濁発生を防止し、高温での粘性を高くさせずに熱膨張係数と密度の低下を達成できる。その含有量が5モル%未満ではBHF性が悪化し、12モル%超では耐酸性が悪くなるとともに歪点が低くなる。好ましくは、6〜9.5モル%である。
【0022】
MgOはアルカリ土類金属酸化物の中では熱膨張係数を低くし、かつ歪点が低下しないため、必須ではないが、含有させることができる。その含有量が6モル%超ではBHFによる白濁やガラスの分相が生じやすくなる。好ましくは、1〜5モル%である。
【0023】
CaOは必須ではないが、含有することによりガラスの熔解性を向上させうる。一方、モル%超では熱膨張係数を大きくし、失透温度を上げてしまう。好ましくは、1〜6モル%である。
【0024】
SrOはガラスの分相を抑制し、BHFによる白濁に対し比較的有用な成分であるため、少なくとも1モル%含有される。その含有量が9モル%超では膨張係数が増大する。好ましくは、2〜8モル%である。
【0025】
BaOは、より密度が小さく熱膨張係数を小さくするという観点で、不純物として含有される量を除いて実質的に含有されない。
【0026】
MgO+CaO+SrOは、その合量が7モル%未満では熔解を困難にさせる。18モル%超では密度が大きくなる。好ましくは、9〜16モル%である。
【0027】
近年、液晶表示装置としてすでに商品化されているアモルファスシリコンタイプのTFTを使用したものに対して、ポリシリコンタイプのTFTが提案され、使用されてきている。ポリシリコンタイプのTFTは、(1)トランジスタの易動度を上げうるので、1画素あたりの制御時間が短くなり、LCDの高精細化が可能になる、(2)画面周辺に駆動用ICを実装することが可能になる、などの利点がある反面、作製工程での強い熱処理(例えば、500〜600℃×数時間)が必要になる。
【0028】
このような高温では、ガラス中の不純物がTFTに拡散して、リーク電流が増大、TFT特性を悪化させ、高精細のTFT作製を難しくするおそれがある。このような不純物でもっとも問題視されるのは、リンである。ガラス基板にTFTを形成する際、熱処理によってリンがTFT中に拡散し、リーク電流を増大させ、TFT特性を悪化させるおそれがあるため、本発明では、リンは原子(カチオン)重量表示で20ppm以下にされることが好ましい。
【0029】
本発明のガラスは上記成分以外にガラスの熔解性、清澄性、成形性を改善するため、ZnO、SO3 、F、Clを総量で5モル%以下添加できる。
【0030】
また、PbO、As23 またはSb23 を含むとガラスカレットの処理に工数を多く必要とするので不純物等として不可避的に混入するものを除き含有しないことが好ましい。
【0031】
かくして本発明において好ましい態様のガラスの組成は、モル%表示で実質的に、SiO2 :66〜70%、Al23 :9〜14%、B23 :6〜9.5%、MgO:1〜5%、CaO:1〜6%、SrO:2〜8%、MgO+CaO+SrO:9〜16%からなり、BaOを実質的に含有しないものである。
【0032】
本発明のガラスは、歪点が640℃以上である。また、歪点が650℃以上であることが好ましい。熱膨張係数については、40×10-7/℃未満であることが好ましく、特に、30×10-7/℃以上40×10-7/℃未満であることが好ましい。密度については、2.60g/cc未満であ、より好ましくは2.55g/cc未満であり、もっとも好ましくは2.50g/cc未満である。
【0033】
本発明のガラスは、例えば次のような方法で製造できる。すなわち、通常使用される各成分の原料を目標成分になるように調合し、これを熔解炉に連続的に投入し、1500〜1600℃に加熱して熔融する。この熔融ガラスをフロート法により所定の板厚に成形し、徐冷後切断する。こうして得られたガラス板は、液晶ディスプレイのセルを形成する1対の基板のうちの少なくとも一方の基板として使用される。
【0034】
【実施例】
各成分の原料を目標組成になるように調合し、白金坩堝を用いて1500〜1600℃の温度で熔解した。熔解にあたっては、白金スターラを用い撹拌しガラスの均質化を行った。次いで熔解ガラスを流し出し、板状に成形後徐冷した。
【0035】
表1〜表4には、こうして得られたガラス組成と熱膨張係数、高温粘度、失透温度、歪点、密度、耐酸性、耐BHF性を示した。例1〜5、例7、例9、例10、例12〜19、例28〜31は実施例、例6、例8、例11、例20〜27、例32は比較例である。特に、例28〜32には、リンの含有量(原子重量ppm)と、TFT特性を示すリーク電流を併記した。
【0036】
熱膨張係数は単位:10-7/℃で示し、高温粘度は粘度が102 、104 ポイズとなる温度(単位:℃)で示し、失透温度、歪点は単位:℃で示し、密度は単位:g/ccで示した。歪点(単位:℃)はJIS R3103に従って測定した。
【0037】
耐酸性は、90℃の0.1規定のHCl中に20時間浸漬後の単位面積あたりの重量減少量(単位:mg/cm2 )で示す。耐酸性は0.3mg/cm2 以下であることが好ましく、0.2mg/cm2 以下であることが特に好ましい。
【0038】
耐BHF性は、NH4 F/HF混液(40重量%NH4 F水溶液と50重量%HF水溶液とを体積比で9:1に混合した液)中に25℃で20分浸漬後の単位面積あたりの重量減少量(単位:mg/cm2 )で示す。耐BHF性は0.7mg/cm2 以下であることが好ましく、0.6mg/cm2 以下であることが特に好ましい。
【0039】
リーク電流は、電極長さ10μmのポリシリコンタイプTFTをガラス基板上に作成し、ゲート電圧を−5V、ソース電圧を0V、ドレイン電圧を+10Vとしたときのリーク電流(単位:pA)を測定した。リーク電流は50pA程度以下であることが好ましい。
【0040】
例1〜25、例28〜31のガラスは、熱膨張係数は30×10-7〜40×10-7/℃の低い値を示し、歪点は640℃以上と高い値を示し、高温での熱処理に充分耐えられる。密度も2.60g/cc未満で従来のコーニングコード7059ガラスの2.76g/ccよりはるかに小さい。化学的特性に関してもBHFにより白濁を生じにくく、耐酸性にも優れる。熔解の目安となる102 ポイズに相当する温度も比較的低く熔解が容易であり、成形性の目安となる104 ポイズに相当する温度と失透温度の関係も良好で、成形時に失透が生成するなどのトラブルがないと考えられる。
【0041】
一方、本発明の範囲外の組成である例26、例27は熱膨張率が大きく、密度が比較的大きい。また、例32はリンの含有量が大きく、リーク電流が大きくなっている。
【0042】
【表1】

Figure 0003901757
【0043】
【表2】
Figure 0003901757
【0044】
【表3】
Figure 0003901757
【0045】
【表4】
Figure 0003901757
【0046】
【発明の効果】
本発明によるガラスは、フロート法による成形が可能である。また、BHFによる白濁が生じにくく、耐酸性に優れ、耐熱性が高く、低い熱膨張係数を有するのでディスプレイ用基板、フォトマスク基板として適する。特に、密度が非常に小さいので、大型のTFTタイプのディスプレイ基板等に好適である。[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a non-alkali glass suitable for various displays and photomask substrate glass, which can be float-molded substantially without containing an alkali metal oxide, and a liquid crystal display panel using the same.
[0002]
[Prior art]
Conventionally, various display substrate glasses, particularly those in which a metal or oxide thin film is formed on the surface, require the following characteristics.
[0003]
(1) When an alkali metal oxide is contained, the alkali metal ions diffuse into the thin film and deteriorate the film characteristics.
(2) Since it is exposed to a high temperature in the thin film formation process, it has a high strain point in order to minimize the deformation caused by glass deformation and glass structural stabilization.
(3) Sufficient chemical durability against various chemicals used for semiconductor formation. In particular, it has durability against buffered hydrofluoric acid (BHF) mainly composed of hydrofluoric acid, ammonium fluoride, etc. for etching SiO x and SiN x .
(4) There are no defects (bubbles, striae, inclusions, pits, scratches, etc.) inside and on the surface.
[0004]
Conventionally, Corning Code 7059 glass has been widely used as substrate glass for various displays and photomasks. However, this glass has the following inadequate points for display.
[0005]
(1) Since the strain point is as low as 593 ° C., pre-heat treatment for reducing glass shrinkage in the display manufacturing process must be performed before the process.
(2) The amount of elution into hydrochloric acid or the like used for etching a metal electrode or transparent conductive film (ITO, etc.) is large, and the eluate recrystallizes during the display manufacturing process, which makes it difficult to manufacture the display.
[0006]
In addition to the above requirements, the following two points have been newly demanded in recent years as the display becomes larger.
[0007]
(1) The density of the cord 7059 glass is 2.76 g / cc, and a glass with a low density is required to further reduce the weight.
(2) The above-described code 7059 glass has a thermal expansion coefficient of 46 × 10 −7 / ° C., and in order to increase the temperature raising / lowering speed during production of the display and increase the production efficiency, a glass having a smaller thermal expansion coefficient is required.
[0008]
Regarding B 2 O 3 , JP-A-1-160844 discloses B 2 O 3 containing 20 to 23 cations, but the amount of B 2 O 3 is large and the strain point is not sufficiently high. JP 61-281041 to 0.1 to 4% by weight of B 2 O 3 is from 0.1 to 5 mol% of B 2 O 3 is in JP-A 4-175242, the Japanese Patent Laid-Open 4-325435 B 2 O 3 0 to 3% by weight, although those containing discloses, is not sufficient resistance to the amount of B 2 O 3 is less BHF.
[0009]
Regarding BaO, JP-A-4-325434 contains 10 to 20% by weight of BaO, JP-A 63-74935 uses 10 to 22% by weight of BaO, and JP-A 59-169953 uses 15 to 40% by weight of BaO. Although what is contained is disclosed, the BaO content is large, the thermal expansion coefficient is large, and the density is also large.
[0010]
Regarding MgO, JP-A 61-132536 includes 6.5 to 12% by weight of MgO, JP-A 59-116147 includes 5 to 15% by weight of MgO, JP-A 60-71540 includes 5 to 5% of MgO. 17% by weight, and JP-A-60-42246 discloses a composition containing 10 to 25 mol% of MgO, but a glass containing a large amount of MgO tends to cause phase separation.
[0011]
Regarding CaO, JP-A-63-176332 has 11 to 25% by weight of CaO, JP-A-58-32038 has 7 to 20% by mole of CaO, and JP-A-2-133334 has 8 to 15% by weight of CaO. JP-A-3-174336 discloses 7-12% by weight of CaO, JP-A-6-40739 contains 10-12% by weight of CaO, and JP-A-5-201744 contains at least 18 cations of CaO. However, when CaO is contained in a large amount, the thermal expansion coefficient tends to increase.
[0012]
With respect to Al 2 O 3, chemicals to 22.5 to 35 wt% of Al 2 O 3 in JP 61-236631, although those containing discloses, Al 2 O 3 amount is large such as hydrochloric acid There are many elutions.
[0013]
Regarding P 2 O 5 , JP-A-61-261232 and JP-A-63-11543 disclose those containing P 2 O 5 , but this is not preferable because it deteriorates the semiconductor characteristics of the thin film.
[0014]
[Problems to be solved by the invention]
Glasses having a strain point of 640 ° C. or higher and a relatively small thermal expansion coefficient are described in JP-A-4-160030 and JP-A-6-263473. However, since this glass requires a considerable amount of BaO, it is difficult to achieve both a low density and a low coefficient of thermal expansion, and it has not completely met the demands of the era of increasing the size.
[0015]
The object of the present invention is to solve the above-mentioned drawbacks, have a strain point of 640 ° C. or higher, a small thermal expansion coefficient and density, no white turbidity due to BHF, excellent durability against chemicals such as hydrochloric acid, and melting / molding. It is an object of the present invention to provide an alkali-free glass that is easy to float and can be float formed.
[0016]
[Means for Solving the Problems]
In the present invention, the strain point is 640 ° C. or higher, and substantially in terms of mol%, SiO 2 : 65 to 70%, Al 2 O 3 : 9 to 16%, B 2 O 3 : 6 to 12%, MgO: 0~6%, CaO: 0~7 %, SrO: 1~9%, MgO + CaO + SrO: made 7-18%, is substantially free of BaO, density is der less than 2.60 g / cc And the weight loss per unit area after immersion in 0.1N HCl at 90 ° C. for 20 hours is 0.3 mg / cm 2. It is a Der Ru non-alkali glass below.
[0017]
DETAILED DESCRIPTION OF THE INVENTION
The alkali-free glass of the present invention contains substantially no alkali metal oxide (for example, Na 2 O, K 2 O, etc.). Specifically, the total amount of alkali metal oxide is 0.5% by weight or less, more preferably 0.2% by weight or less.
[0018]
The reason for limiting the composition range of each component as described above will be described.
[0019]
When the content of SiO 2 is less than 60% mol, the strain point cannot be sufficiently increased, the chemical durability is deteriorated, and the thermal expansion coefficient is increased. If it exceeds 70 mol%, the meltability is lowered and the devitrification temperature is raised. Preferably, it is 66-70 mol%.
[0020]
Al 2 O 3 suppresses the phase separation of the glass, lowers the thermal expansion coefficient, and increases the strain point. If the content is less than 5 mol%, this effect does not appear, and if it exceeds 16 mol%, the meltability of the glass deteriorates. Preferably, it is 9-14 mol%.
[0021]
B 2 O 3 prevents white turbidity from being generated by BHF, and can achieve a reduction in thermal expansion coefficient and density without increasing the viscosity at high temperatures. If the content is less than 5 mol%, the BHF property is deteriorated, and if it exceeds 12 mol%, the acid resistance is deteriorated and the strain point is lowered. Preferably, it is 6-9.5 mol%.
[0022]
MgO is not essential among alkaline earth metal oxides because it has a low coefficient of thermal expansion and does not lower the strain point, but it can be contained. If the content exceeds 6 mol%, white turbidity due to BHF or phase separation of glass tends to occur. Preferably, it is 1-5 mol%.
[0023]
Although CaO is not essential, the melting property of glass can be improved by containing CaO. On the other hand, if it exceeds 7 mol%, the coefficient of thermal expansion is increased and the devitrification temperature is increased. Preferably, it is 1-6 mol%.
[0024]
Since SrO suppresses the phase separation of glass and is a relatively useful component against white turbidity due to BHF, it is contained at least 1 mol%. If the content exceeds 9 mol%, the expansion coefficient increases. Preferably, it is 2-8 mol%.
[0025]
BaO is in terms of good Ri density to reduce the small thermal expansion coefficient, has a substantially contain except the amount contained as an impurity.
[0026]
MgO + CaO + Sr 2 O makes melting difficult if the total amount is less than 7 mol%. If it exceeds 18 mol%, the density increases. Preferably, it is 9-16 mol%.
[0027]
In recent years, polysilicon type TFTs have been proposed and used for those using amorphous silicon type TFTs that have already been commercialized as liquid crystal display devices. Polysilicon type TFT (1) Since the mobility of the transistor can be increased, the control time per pixel is shortened and the high definition of the LCD can be achieved. (2) A driving IC is provided around the screen. While there is an advantage that it can be mounted, a strong heat treatment (for example, 500 to 600 ° C. × several hours) is required in the manufacturing process.
[0028]
At such a high temperature, impurities in the glass diffuse into the TFT, increasing the leakage current, deteriorating the TFT characteristics, and making it difficult to produce a high-definition TFT. The most problematic of such impurities is phosphorus. When forming TFTs on a glass substrate, phosphorus diffuses into the TFTs by heat treatment, which may increase leakage current and deteriorate TFT characteristics. Therefore, in the present invention, phosphorus is 20 ppm or less in terms of atomic (cation) weight. It is preferable that
[0029]
In addition to the above components, the glass of the present invention can contain ZnO, SO 3 , F, and Cl in a total amount of 5 mol% or less in order to improve the meltability, clarity, and moldability of the glass.
[0030]
Further, when PbO, As 2 O 3 or Sb 2 O 3 is contained, it takes a lot of man-hours for the processing of glass cullet, so it is preferable not to include it except for those inevitably mixed as impurities.
[0031]
Thus, the composition of the glass of a preferred embodiment in the present invention is substantially SiO 2 : 66 to 70%, Al 2 O 3 : 9 to 14%, B 2 O 3 : 6 to 9.5% in terms of mol%, It consists of MgO: 1 to 5%, CaO: 1 to 6%, SrO: 2 to 8%, MgO + CaO + SrO: 9 to 16%, and does not substantially contain BaO.
[0032]
The glass of the present invention has a strain point of 640 ° C. or higher. Moreover, it is preferable that a strain point is 650 degreeC or more. The thermal expansion coefficient is preferably less than 40 × 10 −7 / ° C., and particularly preferably 30 × 10 −7 / ° C. or more and less than 40 × 10 −7 / ° C. The density, 2.60 g / cc less der is, more preferably less than 2.55 g / cc, and most preferably less than 2.50 g / cc.
[0033]
The glass of the present invention can be produced, for example, by the following method. That is, normally used raw materials for each component are blended so as to become target components, which are continuously charged into a melting furnace and heated to 1500 to 1600 ° C. for melting. The molten glass is formed into a predetermined plate thickness by a float method, and is cut after slow cooling. The glass plate thus obtained is used as at least one of a pair of substrates forming a cell of a liquid crystal display.
[0034]
【Example】
The raw material of each component was prepared so that it might become a target composition, and it melted at the temperature of 1500-1600 degreeC using the platinum crucible. In melting, the glass was homogenized by stirring with a platinum stirrer. Subsequently, the molten glass was poured out, formed into a plate shape, and then slowly cooled.
[0035]
Tables 1 to 4 show the glass composition, thermal expansion coefficient, high temperature viscosity, devitrification temperature, strain point, density, acid resistance, and BHF resistance thus obtained. Example 1 to 5 Example 7, Example 9, Example 10, Example 12-19, Example 28 to 31 Examples, Example 6, Example 8, Example 11, Example 2 0-27, Example 32 is a comparative example. In particular, in Examples 28 to 32, the phosphorus content (atomic weight ppm) and the leakage current indicating the TFT characteristics are shown together.
[0036]
The coefficient of thermal expansion is shown in units of 10 −7 / ° C., the high temperature viscosity is shown in terms of the viscosity (unit: ° C.) of 10 2 and 10 4 poise, the devitrification temperature and strain point are shown in units of ° C. Is expressed in units of g / cc. The strain point (unit: ° C.) was measured according to JIS R3103.
[0037]
The acid resistance is shown by the weight loss per unit area (unit: mg / cm 2 ) after immersion in 0.1 N HCl at 90 ° C. for 20 hours. The acid resistance is preferably 0.3 mg / cm 2 or less, and particularly preferably 0.2 mg / cm 2 or less.
[0038]
BHF resistance is a unit area after immersion for 20 minutes at 25 ° C. in a NH 4 F / HF mixed solution (a solution in which a 40 wt% NH 4 F aqueous solution and a 50 wt% HF aqueous solution are mixed at a volume ratio of 9: 1). The weight loss per unit (unit: mg / cm 2 ). The BHF resistance is preferably 0.7 mg / cm 2 or less, particularly preferably 0.6 mg / cm 2 or less.
[0039]
For the leakage current, a polysilicon type TFT having an electrode length of 10 μm was formed on a glass substrate, and the leakage current (unit: pA) was measured when the gate voltage was −5 V, the source voltage was 0 V, and the drain voltage was +10 V. . The leakage current is preferably about 50 pA or less.
[0040]
Glasses of Examples 1 to 25 and Examples 28 to 31 have a low coefficient of thermal expansion of 30 × 10 −7 to 40 × 10 −7 / ° C., and a strain point of a high value of 640 ° C. or higher. Can withstand the heat treatment. The density is also less than 2.60 g / cc, much less than 2.76 g / cc of conventional Corning Code 7059 glass. In terms of chemical characteristics, BHF hardly causes white turbidity and has excellent acid resistance. The temperature corresponding to 10 2 poise, which is a standard for melting, is relatively low, and melting is easy. The relationship between the temperature corresponding to 10 4 poise, which is a standard for moldability, and the devitrification temperature is good, and devitrification occurs during molding. There seems to be no trouble such as generating.
[0041]
On the other hand, Examples 26 and 27, which are compositions outside the scope of the present invention, have a large coefficient of thermal expansion and a relatively high density. In Example 32, the phosphorus content is large and the leakage current is large.
[0042]
[Table 1]
Figure 0003901757
[0043]
[Table 2]
Figure 0003901757
[0044]
[Table 3]
Figure 0003901757
[0045]
[Table 4]
Figure 0003901757
[0046]
【The invention's effect】
The glass according to the present invention can be formed by a float process. Further, white turbidity due to BHF hardly occurs, the acid resistance is excellent, the heat resistance is high, and the coefficient of thermal expansion is low, so that it is suitable as a display substrate or a photomask substrate. In particular, since the density is very low, it is suitable for a large TFT type display substrate.

Claims (10)

歪点が640℃以上であって、モル%表示で実質的に、SiO2 :65〜70%、Al23 :9〜16%、B23 :6〜12%、MgO:0〜6%、CaO:0〜7%、SrO:1〜9%、MgO+CaO+SrO:7〜18%からなり、BaOを実質的に含有せず、密度が2.60g/cc未満であり、かつ90℃の0.1規定のHCl中に20時間浸漬後の単位面積あたりの重量減少量が0.3mg/cm 2 以下である無アルカリガラス。A is the strain point of 640 ° C. or higher, substantially by mol%, SiO 2: 65~70%, Al 2 O 3: 9~16%, B 2 O 3: 6~12%, MgO: 0~ 6%, CaO: 0~7%, SrO: 1~9%, MgO + CaO + SrO: made 7-18%, is substantially free of BaO, density is Ri der less than 2.60 g / cc, and 90 The weight loss per unit area after immersion in 0.1N HCl at 20 ° C. for 20 hours is 0.3 mg / cm 2 The following Der Ru alkali-free glass. PbO、As23 およびSb23 を実質的に含有しない請求項1に記載の無アルカリガラス。PbO, alkali-free glass according to claim 1 which contains substantially no As 2 O 3 and Sb 2 O 3. 23の含有量が6〜9.5モル%である請求項1または2に記載の無アルカリガラス。The alkali-free glass according to claim 1 or 2, wherein the content of B 2 O 3 is 6 to 9.5 mol%. 熱膨張係数が40×10-7/℃未満である請求項1〜3のいずれかに記載の無アルカリガラス。The alkali-free glass according to any one of claims 1 to 3, which has a thermal expansion coefficient of less than 40 x 10-7 / ° C. リンの含有量が原子重量表示で20ppm以下である請求項1〜4のいずれかに記載の無アルカリガラス。  The alkali-free glass according to any one of claims 1 to 4, wherein the phosphorus content is 20 ppm or less in terms of atomic weight. CaOの含有量が1〜6モル%である請求項1〜5のいずれかに記載の無アルカリガラス。  The alkali-free glass according to any one of claims 1 to 5, wherein the content of CaO is 1 to 6 mol%. モル%表示で実質的に、SiO2 :66〜70%、Al23 :9〜14%、B23 :6〜9.5%、MgO:1〜5%、CaO:1〜6%、SrO:2〜8%、MgO+CaO+SrO:9〜16%からなり、BaOを実質的に含有しない請求項1、2、4または5に記載の無アルカリガラス。Essentially by mol%, SiO 2: 66~70%, Al 2 O 3: 9~14%, B 2 O 3: 6~9.5%, MgO: 1~5%, CaO: 1~6 %, SrO: 2 to 8%, MgO + CaO + SrO: 9 to 16%, and contains substantially no BaO. 6. The alkali-free glass according to claim 1, 2, 4 or 5. NH4 F/HF混液(40重量%NH4 F水溶液と50重量%HF水溶液とを体積比で9:1に混合した液)中に25℃で20分浸漬後の単位面積あたりの重量減少量が0.7mg/cm2 以下である請求項1〜のいずれかに記載の無アルカリガラス。Weight reduction per unit area after immersion in NH 4 F / HF mixture (40% by weight NH 4 F aqueous solution and 50% by weight HF aqueous solution mixed at a volume ratio of 9: 1) at 25 ° C. for 20 minutes alkali-free glass according to any one of claims 1 to 7 but is 0.7 mg / cm 2 or less. 請求項1〜のいずれかに記載の無アルカリガラスを、セルを形成する1対の基板の少なくとも一方の基板として使用した液晶ディスプレイパネル。The liquid crystal display panel which used the alkali free glass in any one of Claims 1-8 as at least one board | substrate of a pair of board | substrate which forms a cell. 請求項1〜のいずれかに記載の無アルカリガラスからなるガラス板であって、フロート法により成形されたガラス板。The glass plate which consists of an alkali free glass in any one of Claims 1-8 , Comprising: The glass plate shape | molded by the float glass process.
JP31102095A 1994-11-30 1995-11-29 Alkali-free glass, liquid crystal display panel and glass plate Expired - Lifetime JP3901757B2 (en)

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