JP3821400B2 - Treatment liquid coating apparatus and treatment liquid coating method - Google Patents

Treatment liquid coating apparatus and treatment liquid coating method Download PDF

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Publication number
JP3821400B2
JP3821400B2 JP10130596A JP10130596A JP3821400B2 JP 3821400 B2 JP3821400 B2 JP 3821400B2 JP 10130596 A JP10130596 A JP 10130596A JP 10130596 A JP10130596 A JP 10130596A JP 3821400 B2 JP3821400 B2 JP 3821400B2
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Prior art keywords
substrate
liquid coating
processing liquid
coating apparatus
holding member
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JPH09289151A (en
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隆行 佐藤
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Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
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Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • G03F7/162Coating on a rotating support, e.g. using a whirler or a spinner

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)

Description

【0001】
【発明の属する技術分野】
本発明は、例えば半導体基板や液晶表示基板、カラーフィルタ、プラズマ表示パネル(PDP:Plasma Display Panel)などの製造工程において、例えばフォトレジスト液や現像液などの処理液を基板上に塗布する処理液塗布装置および処理液塗布方法に関するものである。
【0002】
【従来の技術】
従来、例えば半導体基板や液晶表示基板などの製造工程において、フォトプロセスでパターンを形成する際には、基板にフォトレジスト液を塗布する工程や、基板に現像液を塗布する工程など、各種の処理液を塗布する塗布工程が不可欠である。このような処理液塗布工程に用いられる処理液塗布装置には、基板を水平状態に保持して回転させる基板載置部が設けられており、この基板載置部の周辺を半密閉空間として、基板上の中央部に処理液が乗せられた状態で半密閉空間内の空気といっしょに基板および基板載置部を回転させることにより、その遠心力で均一に処理液を基板上面に塗布している。
【0003】
図7は従来の処理液塗布装置の斜視図である。
【0004】
図7において、処理液塗布装置5は、角形の基板3を保持して回転させる基板載置部1と、この基板載置部1の上方に基板載置部1と平行に配置された上部回転板6と、これらの基板載置部1および上部回転板6を囲むように配設された下部ケース7aおよび上部ケース7bと、基板載置部1上に保持された基板3にフォトレジスト液を供給するための処理液供給部8と、基板載置部1の上面を洗浄するための上面洗浄部9aと、上部回転板6の下面を洗浄するための下面洗浄部9bとを有している。窒素ガス弁10aおよび真空弁10bは、基板載置部1の基板吸着面2aを負圧または正圧に択一的に切り換えする。
【0005】
図8は図7の処理液塗布装置5における基板載置部1の平面図である。
【0006】
図8において、基板載置部1は、上面に吸着面2aが形成され基板3を真空吸着することで保持するバキュームチャック2と、このバキュームチャック2の周辺部に配設された外周が円形状の整流板4とを有している。このバキュームチャック2は長方形状に構成されており、整流板4の中央部に埋め込まれるように配置されている。この場合のバキュームチャック2の上面の高さは、スピン処理後の処理液の基板裏面への回り込みを防止するために、整流板4の上面の高さよりも僅かに高くなるように設定されている。これによって、基板3がバキュームチャック2の上面に真空吸着により保持された場合、基板裏面と整流板4の上面との間に僅かな隙間が生じることになる。
【0007】
また、バキュームチャック2の吸着面2aには多数の溝(図示せず)が形成されており、それらの溝がバキュームチャック2の中央部付近に設けられた真空配管と連通しており、バキュームチャック2の上面を均一な吸着面2aとしている。これにより、吸着による基板保持は基板3をその吸着面2aで受けているため、基板3が大型化や薄型化していても機械的な保持に比べて基板3の損傷を防止 することができる。
【0008】
【発明が解決しようとする課題】
上記従来の構成では、基板3の中央部をバキュームチャック2により真空吸着して保持するが、大型化および薄型化した基板3に対して処理液を塗布する場合に、基板3の端部とバキュームチャック2の距離であるオーバーハング量が大きく、スピン処理後に基板3の端縁部が垂れ下がって基板3と整流板4の上面とが接触してその隙間が保てなくなる。このように、基板3の端部が整流板4の上面に接触したりその隙間が少な過ぎると、その接触部または隙間に液残りを生じやすく、処理液の基板裏面への回り込みが生じるという問題があった。逆に、基板3の端縁部と整流板4の上面との隙間を予め多く取っておくことも考えられるが、この隙間が多過ぎても、処理液の基板裏面への回り込みが生じやすいという問題があった。
【0009】
この場合に、バキュームチャック2および整流板4を基板3のサイズ毎に設ければ、バキュームチャック2との基板3のオーバーハング量を適正にすることができて基板3の端縁部の垂れ下がりは防止されることになる。ところが、バキュームチャック2および整流板4の組を基板3のサイズ毎に設けて交換装着作業をしなければならないという問題があった。
【0010】
本発明は、上記問題を解決するもので、基板上面に処理液を塗布する際に、基板サイズ毎に各種サイズのチャックおよび整流板を必要とせず、その処理液が基板裏面に回り込むのを確実に防止することができる処理液塗布装置および処理液塗布方法を提供することを目的とする。
【0011】
【課題を解決するための手段】
請求項1記載の処理液塗布装置は、基板を回転させた状態で前記基板上に処理液を塗布する処理液塗布装置において、基板を水平にかつ回転可能に保持する基板保持部材と、この基板保持部材の周囲に、この基板保持部材の上面位置よりも上面が僅かに所定寸法だけ低い位置に配設された整流部材と、前記基板保持部材上に保持された基板の裏面と前記整流部材の上面との間隙を、0.1mmを越えて0.6mm未満に維持しかつ基板の裏面にのみ当接する突起部材とを備えて構成されていることを特徴とするものである。
【0012】
請求項2記載の処理液塗布装置は、基板を水平に保持する基板保持部材が中央に設けられ、この基板保持部材の周囲に、この基板保持部材の上面位置よりも上面が僅かに所定寸法だけ低い位置に配設された整流部材が設けられ、前記基板保持部材上に保持された基板を回転させることにより前記基板上に処理液を塗布する処理液塗布装置において、前記基板保持部材上に保持された基板の裏面と前記整流部材の上面との間隙を、0.1mmを越えて0.6mm未満に維持すべく、前記基板の端縁部の裏面にのみ当接する突起を有する突起部材が前記整流部材側に設けられていることを特徴とするものである。
【0013】
これらの発明によれば、基板サイズが大きくて薄い場合に、基板の端縁部と基板保持部材との距離であるオーバーハング量が多くなり、スピン処理後に基板の端縁部が垂れ下がろうとしても、少なくとも最も垂れ下がる位置に突起部材の突起部(基板保持部材上に保持された基板の裏面と前記整流部材の上面との間隙を前記所定寸法に維持する部材)が位置していれば、基板の端縁部と整流部材の上面との隙間が所定寸法に維持され、従来のようにその接触部または隙間に液残りを生じるようなことはない。これによって、処理液が基板裏面に回り込むのが防止されて、基板の信頼性が向上するとともにその歩留まりも向上することになる。しかも、この処理液の基板裏面への回り込み防止によって、従来のように、基板サイズ毎に各種の基板保持部材および整流部材を設けて、交換装着作業をする必要はなくなる。
【0014】
請求項3記載の処理液塗布装置は、請求項1または2記載の処理液塗布装置において、前記突起部材は、前記基板の端縁部のうち少なくとも4角部に対応した前記整流部材側にそれぞれ設けられていることを特徴とするものである。
【0015】
この構成により、4角形の基板の場合、基板の端縁部と基板保持部材との距離であるオーバーハング量が最も多い4角部に突起部材が設置されていれば、基板上面に処理液を塗布する際に、基板サイズ毎に各種サイズのチャックおよび整流板を必要とせず、その処理液が基板裏面側に回り込むのが防止されるという効果が得られる。
【0016】
請求項4記載の処理液塗布装置は、請求項3記載の処理液塗布装置において、基板の端縁部の4角部に対応した前記整流部材側の突起部材と、当該突起部材に隣設されている突起部材とを結ぶ直線に略沿うように他の突起部材が設けられていることを特徴とするものである。
【0017】
請求項5記載の処理液塗布装置は、請求項1乃至4のいずれかに記載の処理液塗布装置において、前記突起部材は、前記保持部材に保持された基板の外周縁内側に沿って全体として矩形を形成する位置に配設されていることを特徴とするものである。
【0018】
請求項6記載の処理液塗布装置は、請求項1乃至5のいずれかに記載の処理液塗布装置において、前記突起部材は、整流部材からの突出量が0.1mmを越えて0.6mm未満に設定されていることを特徴とするものである。
【0019】
請求項7記載の処理液塗布装置は、請求項1乃至6のいずれかに記載の処理液塗布装置において、前記整流部材には、前記突起部材を装着する穴が設けられていることを特徴とするものである。
【0020】
請求項8記載の処理液塗布装置は、請求項7記載の処理液塗布装置において、前記突起部材は、前記穴に嵌入される本体部を有し、前記突起は、この本体部の上面から突設されていることを特徴とするものである。
【0021】
請求項9記載の処理液塗布装置は、請求項8記載の処理液塗布装置において、前記本体部は、所定厚さを有する円形の板状に形成されていることを特徴とするものである。
【0022】
請求項10記載の処理液塗布装置は、請求項2乃至9のいずれかに記載の処理液塗布装置において、前記突起は、先端が針鋭に形成されていることを特徴とするものである。
【0023】
請求項11記載の処理液塗布装置は、請求項2乃至10のいずれかに記載の処理液塗布装置において、前記整流部材と基板との間の間隙寸法は、前記突起によって調整されることを特徴とするものである。
【0024】
請求項12記載の処理液塗布装置は、請求項1乃至11のいずれかに記載の処理液塗布装置において、前記基板保持部材は、最も小さい基板に対応し得るように寸法設定されていることを特徴とするものである。
【0025】
請求項13記載の処理液塗布装置は、請求項1乃至12のいずれかに記載の処理液塗布装置において、前記基板保持部材は、真空吸着することで基板を保持するバキュームチャックであることを特徴とするものである。
【0026】
請求項14記載の処理液塗布装置は、請求項1乃至13のいずれかに記載の処理液塗布装置において、前記処理液は、フォトレジスト液または現像液であることを特徴とするものである。
【0027】
請求項15記載の処理液塗布装置は、請求項1乃至14のいずれかに記載の処理液塗布装置において、前記基板は、半導体基板、液晶表示基板、カラーフィルタおよびプラズマ表示パネルの内のいずれかに使用されるものであることを特徴とするものである。
【0028】
請求項16記載の処理液塗布方法は、基板を回転させた状態で前記基板上に処理液を塗布する処理液塗布方法において、基板を水平かつ回転可能に保持する基板保持部材の上面位置よりも上面が僅かに所定寸法だけ低い位置に配設された当該保持部材を囲む整流部材の上面と、基板の裏面との間に0.1mmを越えて0.6mm未満の間隙を形成させかつ基板の裏面にのみ当接する部材を介設した上で前記基板保持部材、整流部材および基板を中心回りに一体回転させながら、回転している基板の表面に処理液を供給することを特徴とするものである。
【0029】
請求項17記載の処理液塗布方法は、請求項16記載の処理液塗布方法において、前記間隙を形成させる部材として基板の端縁部の裏面に当接する突起を有する突起部材を用いることを特徴とするものである
【0030】
請求項18記載の処理液塗布方法は、請求項17記載の処理液の塗布方法において、前記突起として針状のものを用いることを特徴とするものである。
【0031】
請求項19記載の処理液塗布装置は、基板を回転させた状態で前記基板上に処理液を塗布する処理液塗布装置において、基板を水平にかつ回転可能に保持する基板保持部材と、この基板保持部材の周囲に、この基板保持部材の上面位置よりも上面が僅かに所定寸法だけ低い位置に配設された整流部材と、前記基板保持部材上に保持された基板の裏面と前記整流部材の上面との間隙寸法を0.1mmを越えて0.6mm未満に維持する突起部材とを備えて構成されていることを特徴とするものである。
【0032】
【発明の実施の形態】
以下、本発明の実施形態について図面を参照して説明する。
【0033】
図1は本発明の一実施形態を示す処理液塗布装置における基板載置部の平面図であり、図2は図1の基板載置部のAA′断面図である。
【0034】
図1および図2において、基板載置部11の中央部に、上面に吸着面12aが形成され基板13を真空吸着することで基板13を保持する長方形状の基板保持部材としてのバキュームチャック12が設けられている。このバキュームチャック12の周辺部に外周が円形状の整流部材としての整流板14が配設されており、この整流板14の中央部にバキュームチャック12が埋め込まれるように配置されている。この場合のバキュームチャック12の上面の高さは、スピン処理後のレジストの基板裏面への回り込みを防止するために、整流板14の上面の高さよりも僅かに高くなるように設定されている。これによって、基板13がバキュームチャック12の上面に真空吸着により保持された場合、基板裏面と整流板14の上面との間に僅かな隙間が生じることになる。この僅かな隙間は、0.2〜0.5mm程度の間隙であることが望ましい。この間隙が0.1mm以下であっても0.6mm以上であってもレジストの基板裏面への回り込みが起こりやすくなる。
【0035】
このような基板端部の裏面と整流板14の上面との間の僅かな隙間を維持するために、基板13のサイズが大きく、これがバキュームチャック12上に保持された場合、基板13のオーバーハング量が大きいので、基板13の端縁部が垂れ下がるが、その位置に垂れ下がり防止用の突起部材15を配置する。この突起部材15の配置は、少なくとも基板13の4角部に配置する必要がある。つまり、基板13のオーバーハング量が少なくとも最も大きい位置に突起部材15を配置することになる。本実施形態においては、基板13の4角部の他に、長方形状のバキュームチャック12の短辺側では、基板13の端縁部中央に対応する整流板14側の位置に突起部材15を埋め込んで、基板裏面と整流板14の上面との間の隙間が最適になるように調整している。また、基板13の4角部の他に、長方形状のバキュームチャック12の長辺側では、その基板13の長辺寸法の半分の ピッチ寸法を開けた位置に対応する整流板14側の位置にも突起部材15を2個ずつ埋め込んで、基板裏面と整流板14の上面との間の隙間が最適になるように調整している。
【0036】
また、この垂れ下がり防止用の突起部材15と基板13の端縁部との接触位置は、スピン処理後に、図3に示すように基板13の端縁部にレジスト18が溜って基板13の下面側に球状のしずく18aとなった場合に、少なくともそのしずく18aの直径寸法よりも内側の位置である必要がある。また、基板裏面と整流板14の上面との隙間を保つ必要から、この突起部材15の基板13の裏面との接触部分は一点の針状である方が望ましい。
【0037】
さらに、バキュームチャック12の吸着面12aには多数の溝(図示せず)が形成されており、それらの溝がバキュームチャック12の中央部付近に設けられた真空配管と連通しており、真空配管内の空気を脱気することによりバキュームチャック12の上面の多数の溝を介して吸着面12a全体を均一な吸着面としている。
【0038】
図4は図1の突起部材15の斜視図であり、図5は図4の突起部材15の平面図であり、図6は図4の突起部材15の側面図である。
【0039】
図4〜図6において、この突起部材15は、所定厚さを有する円形状の板状に構成されており、その一方面の中央部に突起部16を有している。この突起部16の高さはこの突起部材15が整流板14の凹部内にセットされたときに整流板14の上面から突出する寸法が、上記0.2〜0.5mm程度となるように設定している。この突起部16の位置に対して点対称な位置には、皿グリがなされたねじ用の孔17a,17bが設けられており、これらの孔17a,17bを介して整流板14側の凹部のねじ穴にねじを螺合させて突起部材15を整流板13側の凹部に固定する。このような突起部16は、突起部材15に少なくとも1個あればよい。
【0040】
上記構成により、数種類のサイズの基板を処理する必要があるときに、最も小さい基板に対応したバキュームチャック12を製作し、このバキュームチャック12で大きいサイズの基板13を保持する場合にも、基板13の端縁部の垂れで整流板14の上面に基板13の裏面が接触しないように基板13のオーバーハング量の大きい位置に突起部材15を配置することにより、強制的に基板13の端縁部裏側と整流板14の上面部との間隙を所定寸法以内に維持することができ、従来のようにその接触部または隙間に液残りを生じるようなことはなく、レジスト18の基板裏面への回り込みを防止することができる。
【0041】
また、このレジスト18の基板裏面への回り込み防止によって、基板サイズが多種類にわたってもバキュームチャック12および整流板14は1種類で済ますことができるため、基板サイズの変更に伴うバキュームチャック12および整流板14の交換装着作業は不要となる。
【0042】
さらに、大型サイズの基板に対してもバキュームチャック12を小さく構成することができるため、バキュームチャック12の作製が容易であり、軽いのでスピンモータにかかる負荷も低減することができる。
【0043】
さらに、突起部材15の突起部16で、基板13の端縁部裏側と整流板14の上面部との間隙を所定寸法以内に調整することができるため、整流板14の精度や、組立精度に応じて調整することができる。
【0044】
なお、本実施形態では、処理液としてレジスト18を用いたが、処理液として現像液などの他の処理液を用いても良い。
【0045】
【発明の効果】
以上のように本発明によれば、基板保持部材上に保持された基板の裏面と整流部材の上面との間隙が所定寸法を維持すべく、基板の端縁部のうち少なくとも4 角部に対応した整流部材側に突起部材が設けられているため、基板サイズが大きくて薄い場合、スピン処理後に基板の端縁部が垂れ下がろうとしても、少なくとも最も垂れ下がる位置に突起部材の突起部が位置しており、基板端縁部と整流板の上面との隙間が所定寸法に確保でき、従来のようにその接触部または隙間に液残りを生じるようなことはなく、処理液の基板裏面への回り込みを防止することができる。これによって、各種の基板の信頼性が向上するとともにその歩留まりも向上することができる。しかも、この処理液の基板裏面への回り込み防止によって、基板サイズ毎に基板保持部材および整流板を設けて、交換装着作業をする必要もなくなる。
【図面の簡単な説明】
【図1】 本発明の一実施形態を示す処理液塗布装置における基板載置部の平面図である。
【図2】 図1の基板載置部のAA′断面図である。
【図3】 図2のX部の拡大図である。
【図4】 図1の突起部材の斜視図である。
【図5】 図4の突起部材の平面図である。
【図6】 図4の突起部材の側面図である。
【図7】 従来の処理液塗布装置の斜視図である。
【図8】 図7の処理液塗布装置における基板載置部の平面図である。
【符号の説明】
11 基板載置部
12 バキュームチャック
12a 吸着面
13 基板
14 整流板
15 突起部材
16 突起部
18 レジスト
18a しずく
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a processing solution for applying a processing solution such as a photoresist solution or a developing solution on a substrate in a manufacturing process of a semiconductor substrate, a liquid crystal display substrate, a color filter, a plasma display panel (PDP), etc., for example. The present invention relates to a coating apparatus and a processing liquid coating method.
[0002]
[Prior art]
Conventionally, when a pattern is formed by a photo process in a manufacturing process of a semiconductor substrate or a liquid crystal display substrate, for example, various processes such as a step of applying a photoresist solution to the substrate and a step of applying a developer to the substrate. An application process for applying the liquid is indispensable. The processing liquid coating apparatus used in such a processing liquid coating process is provided with a substrate mounting portion that rotates while holding the substrate in a horizontal state, and the periphery of the substrate mounting portion is a semi-sealed space. By rotating the substrate and the substrate mounting section together with the air in the semi-enclosed space with the processing liquid placed on the center of the substrate, the processing liquid is uniformly applied to the upper surface of the substrate by the centrifugal force. Yes.
[0003]
FIG. 7 is a perspective view of a conventional treatment liquid coating apparatus.
[0004]
In FIG. 7, the processing liquid coating apparatus 5 includes a substrate platform 1 that holds and rotates a square substrate 3, and an upper rotation that is disposed above the substrate platform 1 in parallel with the substrate platform 1. A photoresist solution is applied to the plate 6, the lower case 7 a and the upper case 7 b disposed so as to surround the substrate platform 1 and the upper rotating plate 6, and the substrate 3 held on the substrate platform 1. A processing liquid supply unit 8 for supplying, an upper surface cleaning unit 9 a for cleaning the upper surface of the substrate mounting unit 1, and a lower surface cleaning unit 9 b for cleaning the lower surface of the upper rotating plate 6 are provided. . The nitrogen gas valve 10a and the vacuum valve 10b selectively switch the substrate adsorption surface 2a of the substrate platform 1 to a negative pressure or a positive pressure.
[0005]
FIG. 8 is a plan view of the substrate platform 1 in the processing liquid coating apparatus 5 of FIG.
[0006]
In FIG. 8, the substrate mounting portion 1 has a vacuum chuck 2 that has an adsorption surface 2 a formed on the upper surface and holds the substrate 3 by vacuum suction, and a circular outer periphery disposed on the periphery of the vacuum chuck 2. The current plate 4 is provided. The vacuum chuck 2 is configured in a rectangular shape and is disposed so as to be embedded in the central portion of the rectifying plate 4. In this case, the height of the upper surface of the vacuum chuck 2 is set to be slightly higher than the height of the upper surface of the rectifying plate 4 in order to prevent the processing liquid after the spin processing from entering the back surface of the substrate. . Thereby, when the substrate 3 is held on the upper surface of the vacuum chuck 2 by vacuum suction, a slight gap is generated between the rear surface of the substrate and the upper surface of the rectifying plate 4.
[0007]
The suction surface 2a of the vacuum chuck 2 is formed with a number of grooves (not shown), and these grooves communicate with a vacuum pipe provided near the center of the vacuum chuck 2. 2 is a uniform suction surface 2a. Thereby, since the substrate 3 is held by the suction by the suction surface 2a, the substrate 3 can be prevented from being damaged as compared with the mechanical holding even if the substrate 3 is enlarged or thinned.
[0008]
[Problems to be solved by the invention]
In the above-described conventional configuration, the central portion of the substrate 3 is vacuum-sucked and held by the vacuum chuck 2, but when the processing liquid is applied to the large and thin substrate 3, the end portion of the substrate 3 and the vacuum The amount of overhang, which is the distance of the chuck 2, is large, the edge of the substrate 3 hangs down after the spin processing, the substrate 3 and the upper surface of the rectifying plate 4 come into contact, and the gap cannot be maintained. As described above, when the end portion of the substrate 3 is in contact with the upper surface of the rectifying plate 4 or the gap is too small, a liquid residue is likely to be generated in the contact portion or the gap, and the processing liquid wraps around the back surface of the substrate. was there. Conversely, it is conceivable to leave a large gap between the edge of the substrate 3 and the upper surface of the rectifying plate 4 in advance, but even if there are too many gaps, the processing liquid tends to wrap around the back surface of the substrate. There was a problem.
[0009]
In this case, if the vacuum chuck 2 and the current plate 4 are provided for each size of the substrate 3, the amount of overhang of the substrate 3 with the vacuum chuck 2 can be made appropriate, and the sag of the edge portion of the substrate 3 is reduced. Will be prevented. However, there is a problem in that a replacement chucking operation must be performed by providing a set of the vacuum chuck 2 and the current plate 4 for each size of the substrate 3.
[0010]
The present invention solves the above-mentioned problem, and when applying the processing liquid to the upper surface of the substrate, it does not require chucks and current plates of various sizes for each substrate size, and ensures that the processing liquid wraps around the back surface of the substrate. It is an object of the present invention to provide a treatment liquid coating apparatus and a treatment liquid coating method that can be prevented.
[0011]
[Means for Solving the Problems]
The processing liquid coating apparatus according to claim 1 is a processing liquid coating apparatus for coating a processing liquid on the substrate while the substrate is rotated, and a substrate holding member that holds the substrate horizontally and rotatably, and the substrate. A rectifying member disposed around the holding member at a position where the upper surface is slightly lower than the upper surface position of the substrate holding member by a predetermined dimension, a back surface of the substrate held on the substrate holding member, and the rectifying member It is characterized by comprising a projecting member that maintains a gap with the upper surface of more than 0.1 mm and less than 0.6 mm and that abuts only on the back surface of the substrate.
[0012]
The processing liquid coating apparatus according to claim 2, wherein a substrate holding member that holds the substrate horizontally is provided in the center, and the upper surface of the substrate holding member is slightly larger than the upper surface of the substrate holding member by a predetermined dimension. A rectifying member disposed at a low position is provided, and is held on the substrate holding member in a processing liquid coating apparatus that applies a processing liquid onto the substrate by rotating the substrate held on the substrate holding member. A protrusion member having a protrusion that abuts only on the back surface of the edge portion of the substrate so as to maintain a gap between the back surface of the formed substrate and the top surface of the rectifying member to be more than 0.1 mm and less than 0.6 mm; It is provided on the rectifying member side.
[0013]
According to these inventions, when the substrate size is large and thin, the amount of overhang, which is the distance between the edge portion of the substrate and the substrate holding member, increases, and the edge portion of the substrate hangs down after the spin processing. As long as the protruding portion of the protruding member (a member that maintains the gap between the back surface of the substrate held on the substrate holding member and the upper surface of the rectifying member at the predetermined dimension) is positioned at least at the most drooping position, The gap between the edge portion of the substrate and the upper surface of the rectifying member is maintained at a predetermined size, and no liquid residue is generated at the contact portion or the gap as in the prior art. This prevents the processing liquid from flowing around the back surface of the substrate, improving the reliability of the substrate and improving the yield. In addition, by preventing the processing liquid from flowing into the back surface of the substrate, it is not necessary to provide various substrate holding members and rectifying members for each substrate size and to perform replacement mounting work as in the prior art.
[0014]
The treatment liquid coating apparatus according to claim 3 is the treatment liquid coating apparatus according to claim 1 or 2, wherein the protrusion member is on the rectifying member side corresponding to at least four corners of the edge portion of the substrate. It is characterized by being provided.
[0015]
With this configuration, in the case of a quadrangular substrate, if the protruding member is installed at the quadrangular portion where the overhang amount that is the distance between the edge portion of the substrate and the substrate holding member is the largest, the processing liquid is applied to the upper surface of the substrate. When applying, there is no need for chucks and rectifying plates of various sizes for each substrate size, and it is possible to obtain an effect that the processing liquid is prevented from entering the back side of the substrate.
[0016]
The treatment liquid coating apparatus according to claim 4 is the treatment liquid coating apparatus according to claim 3, wherein the rectifying member side projection member corresponding to the four corners of the edge portion of the substrate is adjacent to the projection member. Another projecting member is provided so as to be substantially along a straight line connecting the projecting member.
[0017]
The treatment liquid coating apparatus according to claim 5 is the treatment liquid coating apparatus according to any one of claims 1 to 4, wherein the protruding member is entirely along the inner periphery of the substrate held by the holding member. It is arranged at a position where a rectangle is formed.
[0018]
The treatment liquid coating apparatus according to claim 6 is the treatment liquid coating apparatus according to any one of claims 1 to 5, wherein the protruding member has a protruding amount from the rectifying member of more than 0.1 mm and less than 0.6 mm. It is characterized by being set to.
[0019]
The treatment liquid coating apparatus according to claim 7 is the treatment liquid coating apparatus according to any one of claims 1 to 6, wherein the rectifying member is provided with a hole for mounting the protruding member. To do.
[0020]
The treatment liquid application apparatus according to claim 8 is the treatment liquid application apparatus according to claim 7, wherein the protrusion member has a main body portion fitted into the hole, and the protrusion protrudes from an upper surface of the main body portion. It is characterized by being provided.
[0021]
According to a ninth aspect of the present invention, there is provided the processing liquid coating apparatus according to the eighth aspect, wherein the main body is formed in a circular plate shape having a predetermined thickness.
[0022]
A treatment liquid application apparatus according to a tenth aspect is the treatment liquid application apparatus according to any one of the second to ninth aspects, wherein the protrusion has a sharp tip.
[0023]
The treatment liquid coating apparatus according to claim 11 is the treatment liquid coating apparatus according to any one of claims 2 to 10, wherein a gap dimension between the rectifying member and the substrate is adjusted by the protrusion. It is what.
[0024]
The processing liquid coating apparatus according to claim 12 is the processing liquid coating apparatus according to any one of claims 1 to 11, wherein the substrate holding member is dimensioned so as to correspond to the smallest substrate. It is a feature.
[0025]
The processing liquid coating apparatus according to claim 13 is the processing liquid coating apparatus according to any one of claims 1 to 12, wherein the substrate holding member is a vacuum chuck that holds the substrate by vacuum suction. It is what.
[0026]
A treatment liquid coating apparatus according to a fourteenth aspect is the treatment liquid coating apparatus according to any one of the first to thirteenth aspects, wherein the treatment liquid is a photoresist liquid or a developer.
[0027]
The processing liquid coating apparatus according to claim 15 is the processing liquid coating apparatus according to any one of claims 1 to 14, wherein the substrate is one of a semiconductor substrate, a liquid crystal display substrate, a color filter, and a plasma display panel. It is what is used for.
[0028]
The processing liquid coating method according to claim 16 is a processing liquid coating method in which the processing liquid is applied onto the substrate in a state where the substrate is rotated, than the upper surface position of the substrate holding member that holds the substrate horizontally and rotatably. A gap of more than 0.1 mm and less than 0.6 mm is formed between the upper surface of the rectifying member surrounding the holding member disposed at a position where the upper surface is slightly lower by a predetermined dimension and the back surface of the substrate, and A process liquid is supplied to the surface of the rotating substrate while the substrate holding member, the rectifying member, and the substrate are integrally rotated around the center after a member that contacts only the back surface is interposed. is there.
[0029]
The treatment liquid application method according to claim 17 is characterized in that, in the treatment liquid application method according to claim 16, a protrusion member having a protrusion abutting against a back surface of an edge portion of the substrate is used as the member for forming the gap. To do .
[0030]
A treatment liquid coating method according to an eighteenth aspect is characterized in that, in the treatment liquid coating method according to the seventeenth aspect, a needle-shaped protrusion is used as the protrusion.
[0031]
20. The processing liquid coating apparatus according to claim 19, wherein the processing liquid coating apparatus applies a processing liquid onto the substrate while the substrate is rotated, and a substrate holding member that holds the substrate horizontally and rotatably, and the substrate. A rectifying member disposed around the holding member at a position where the upper surface is slightly lower than the upper surface position of the substrate holding member by a predetermined dimension, a back surface of the substrate held on the substrate holding member, and the rectifying member And a projecting member that maintains a gap dimension with the upper surface of more than 0.1 mm and less than 0.6 mm.
[0032]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of the present invention will be described below with reference to the drawings.
[0033]
FIG. 1 is a plan view of a substrate mounting portion in a processing liquid coating apparatus showing an embodiment of the present invention, and FIG. 2 is a cross-sectional view of the substrate mounting portion of FIG.
[0034]
In FIG. 1 and FIG. 2, a vacuum chuck 12 as a rectangular substrate holding member that holds the substrate 13 by forming a suction surface 12 a on the upper surface and vacuum-sucking the substrate 13 at the center of the substrate platform 11. Is provided. A rectifying plate 14 as a rectifying member having a circular outer periphery is disposed on the periphery of the vacuum chuck 12, and the vacuum chuck 12 is disposed so as to be embedded in the central portion of the rectifying plate 14. In this case, the height of the upper surface of the vacuum chuck 12 is set to be slightly higher than the height of the upper surface of the rectifying plate 14 in order to prevent the resist after spin processing from entering the back surface of the substrate. Thus, when the substrate 13 is held on the upper surface of the vacuum chuck 12 by vacuum suction, a slight gap is generated between the rear surface of the substrate and the upper surface of the rectifying plate 14. This slight gap is desirably a gap of about 0.2 to 0.5 mm. Regardless of whether the gap is 0.1 mm or less or 0.6 mm or more, the resist tends to wrap around the back surface of the substrate.
[0035]
In order to maintain a slight gap between the back surface of the substrate end and the upper surface of the rectifying plate 14, when the size of the substrate 13 is large and is held on the vacuum chuck 12, the substrate 13 overhangs. Since the amount is large, the edge of the substrate 13 hangs down, but a protrusion member 15 for preventing the sag is disposed at that position. The projecting member 15 needs to be disposed at least at the four corners of the substrate 13. That is, the protruding member 15 is disposed at a position where the overhang amount of the substrate 13 is at least the largest. In the present embodiment, in addition to the four corners of the substrate 13, the projecting member 15 is embedded at a position on the current plate 14 side corresponding to the center of the edge of the substrate 13 on the short side of the rectangular vacuum chuck 12. Thus, the gap between the back surface of the substrate and the upper surface of the rectifying plate 14 is adjusted to be optimum. In addition to the four corners of the substrate 13, on the long side of the rectangular vacuum chuck 12, a position on the rectifying plate 14 side corresponding to the position where the pitch dimension that is half the long side dimension of the substrate 13 is opened. Also, two protruding members 15 are embedded, and the gap between the back surface of the substrate and the upper surface of the rectifying plate 14 is adjusted to be optimal.
[0036]
Further, the contact position between the projecting member 15 for preventing the drooping and the edge of the substrate 13 is such that a resist 18 is accumulated on the edge of the substrate 13 as shown in FIG. In the case of a spherical drop 18a, the position needs to be at least inside the diameter dimension of the drop 18a. Further, since it is necessary to maintain a gap between the back surface of the substrate and the top surface of the rectifying plate 14, the contact portion of the protruding member 15 with the back surface of the substrate 13 is preferably a single needle.
[0037]
Furthermore, a number of grooves (not shown) are formed in the suction surface 12a of the vacuum chuck 12, and these grooves communicate with a vacuum pipe provided near the center of the vacuum chuck 12. By degassing the air inside, the entire suction surface 12a is made uniform through a large number of grooves on the upper surface of the vacuum chuck 12.
[0038]
4 is a perspective view of the protruding member 15 of FIG. 1, FIG. 5 is a plan view of the protruding member 15 of FIG. 4, and FIG. 6 is a side view of the protruding member 15 of FIG.
[0039]
4 to 6, the protruding member 15 is formed in a circular plate shape having a predetermined thickness, and has a protruding portion 16 at the center of one surface thereof. The height of the projecting portion 16 is set so that the dimension of the projecting member 15 protruding from the upper surface of the rectifying plate 14 is about 0.2 to 0.5 mm when the projecting member 15 is set in the recess of the rectifying plate 14. is doing. Screw holes 17a and 17b, which are countersunk, are provided at positions that are point-symmetric with respect to the positions of the protrusions 16, and the recesses on the rectifying plate 14 side are provided through these holes 17a and 17b. Screws are screwed into the screw holes to fix the protruding member 15 to the recess on the rectifying plate 13 side. It is sufficient that at least one protrusion 16 is provided on the protrusion member 15.
[0040]
With the above configuration, when it is necessary to process several types of substrates, the vacuum chuck 12 corresponding to the smallest substrate is manufactured, and even when the large size substrate 13 is held by the vacuum chuck 12, the substrate 13 By arranging the protruding member 15 at a position where the overhang amount of the substrate 13 is large so that the back surface of the substrate 13 does not contact the upper surface of the rectifying plate 14 due to sagging of the edge portion of the substrate 13, the edge portion of the substrate 13 is forcibly The gap between the back side and the upper surface portion of the rectifying plate 14 can be maintained within a predetermined dimension, and no liquid residue is generated at the contact portion or the gap as in the prior art, and the resist 18 wraps around the back surface of the substrate. Can be prevented.
[0041]
Further, by preventing the resist 18 from entering the back surface of the substrate, only one type of vacuum chuck 12 and rectifying plate 14 can be used even when there are many types of substrate sizes. 14 replacement mounting work becomes unnecessary.
[0042]
Further, since the vacuum chuck 12 can be made small even with respect to a large-sized substrate, the vacuum chuck 12 can be easily manufactured, and the load on the spin motor can be reduced because it is light.
[0043]
Furthermore, since the gap between the rear edge of the substrate 13 and the upper surface portion of the rectifying plate 14 can be adjusted within a predetermined dimension by the protruding portion 16 of the protruding member 15, the accuracy of the rectifying plate 14 and the assembly accuracy can be improved. Can be adjusted accordingly.
[0044]
In the present embodiment, the resist 18 is used as the processing liquid. However, other processing liquid such as a developer may be used as the processing liquid.
[0045]
【The invention's effect】
As described above, according to the present invention, the gap between the back surface of the substrate held on the substrate holding member and the top surface of the rectifying member corresponds to at least four corners of the edge portion of the substrate so as to maintain a predetermined dimension. If the substrate size is large and thin, even if the edge of the substrate tries to hang down after the spin processing, the protruding portion of the protruding member is positioned at least at the position where it hangs down. The gap between the edge of the substrate and the upper surface of the current plate can be secured to a predetermined size, and there is no liquid residue at the contact portion or gap as in the prior art. A wraparound can be prevented. As a result, the reliability of various substrates can be improved and the yield can be improved. In addition, by preventing the processing liquid from entering the back surface of the substrate, it is not necessary to provide a substrate holding member and a rectifying plate for each substrate size to perform replacement mounting work.
[Brief description of the drawings]
FIG. 1 is a plan view of a substrate mounting portion in a processing liquid coating apparatus showing an embodiment of the present invention.
FIG. 2 is a cross-sectional view taken along the line AA ′ of the substrate mounting portion in FIG.
FIG. 3 is an enlarged view of a portion X in FIG. 2;
4 is a perspective view of the protruding member of FIG. 1. FIG.
FIG. 5 is a plan view of the protruding member of FIG.
6 is a side view of the protruding member of FIG. 4;
FIG. 7 is a perspective view of a conventional processing liquid coating apparatus.
8 is a plan view of a substrate mounting portion in the processing liquid coating apparatus of FIG.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 11 Substrate mounting part 12 Vacuum chuck 12a Suction surface 13 Substrate 14 Current plate 15 Protruding member 16 Protruding part 18 Resist 18a Drop

Claims (19)

基板を回転させた状態で前記基板上に処理液を塗布する処理液塗布装置において、基板を水平にかつ回転可能に保持する基板保持部材と、この基板保持部材の周囲に、この基板保持部材の上面位置よりも上面が僅かに所定寸法だけ低い位置に配設された整流部材と、前記基板保持部材上に保持された基板の裏面と前記整流部材の上面との間隙寸法を、0.1mmを越えて0.6mm未満に維持しかつ基板の裏面にのみ当接する突起部材とを備えて構成されていることを特徴とする処理液塗布装置。In a processing liquid coating apparatus that coats a processing liquid on the substrate while the substrate is rotated, a substrate holding member that holds the substrate horizontally and rotatably, and the substrate holding member is disposed around the substrate holding member. The gap dimension between the rectifying member disposed at a position where the upper surface is slightly lower than the upper surface position by a predetermined dimension, and the back surface of the substrate held on the substrate holding member and the upper surface of the rectifying member is 0.1 mm. A processing liquid coating apparatus comprising: a protruding member that is maintained to be less than 0.6 mm and contacts only the back surface of the substrate. 基板を水平に保持する基板保持部材が中央に設けられ、この基板保持部材の周囲に、この基板保持部材の上面位置よりも上面が僅かに所定寸法だけ低い位置に配設された整流部材が設けられ、前記基板保持部材上に保持された基板を回転させることにより前記基板上に処理液を塗布する処理液塗布装置において、前記基板保持部材上に保持された基板の裏面と前記整流部材の上面との間隙を、0.1mmを越えて0.6mm未満に維持すべく、前記基板の端縁部の裏面にのみ当接する突起を有する突起部材が前記整流部材側に設けられていることを特徴とする処理液塗布装置。A substrate holding member for horizontally holding the substrate is provided in the center, and a rectifying member is provided around the substrate holding member and the upper surface of the substrate holding member is disposed at a position slightly lower than the upper surface by a predetermined dimension. And a back surface of the substrate held on the substrate holding member and an upper surface of the rectifying member in the processing liquid coating apparatus for applying the processing liquid on the substrate by rotating the substrate held on the substrate holding member. characterized in that gap and to maintain over a 0.1mm to less than 0.6 mm, the protrusion member having a projection only contacts the back surface of the edge portion of the substrate is provided on the rectifying member side with A processing liquid coating apparatus. 前記突起部材は、前記基板の端縁部のうち少なくとも4角部に対応した前記整流部材側にそれぞれ設けられていることを特徴とする請求項1または2記載の処理液塗布装置。  The treatment liquid coating apparatus according to claim 1, wherein the protruding member is provided on each of the rectifying members corresponding to at least four corners of the edge portion of the substrate. 基板の端縁部の4角部に対応した前記整流部材側の突起部材と、当該突起部材に隣設されている突起部材とを結ぶ直線に略沿うように他の突起部材が設けられていることを特徴とする請求項3記載の処理液塗布装置。  Other projecting members are provided so as to be substantially along a straight line connecting the rectifying member side projecting member corresponding to the four corners of the edge of the substrate and the projecting member adjacent to the projecting member. The treatment liquid coating apparatus according to claim 3. 前記突起部材は、前記保持部材に保持された基板の外周縁内側に沿って全体として矩形を形成する位置に配設されていることを特徴とする請求項1乃至4のいずれかに記載の処理液塗布装置。  5. The process according to claim 1, wherein the protruding member is disposed at a position that forms a rectangle as a whole along the inner periphery of the substrate held by the holding member. 6. Liquid coating device. 前記突起部材は、整流部材からの突出量が0.1mmを越えて0.6mm未満に設定されていることを特徴とする請求項1乃至5のいずれかに記載の処理液塗布装置。  The treatment liquid coating apparatus according to claim 1, wherein the protruding member is set so that a protruding amount from the rectifying member is more than 0.1 mm and less than 0.6 mm. 前記整流部材には、前記突起部材を装着する穴が設けられていることを特徴とする請求項1乃至6のいずれかに記載の処理液塗布装置。The treatment liquid coating apparatus according to claim 1, wherein the rectifying member is provided with a hole for mounting the protruding member . 前記突起部材は、前記穴に嵌入される本体部を有し、前記突起は、この本体部の上面から突設されていることを特徴とする請求項7記載の処理液塗布装置。The treatment liquid coating apparatus according to claim 7, wherein the protrusion member has a main body portion fitted into the hole, and the protrusion protrudes from an upper surface of the main body portion . 前記本体部は、所定厚さを有する円形の板状に形成されていることを特徴とする請求項8記載の処理液塗布装置。The processing liquid coating apparatus according to claim 8, wherein the main body is formed in a circular plate shape having a predetermined thickness . 前記突起は、先端が針鋭に形成されていることを特徴とする請求項2乃至9のいずれかに記載の処理液塗布装置。The treatment liquid coating apparatus according to claim 2, wherein the protrusion has a sharp tip . 前記整流部材と基板との間の間隙寸法は、前記突起によって調整されることを特徴とする請求項2乃至10のいずれかに記載の処理液塗布装置。The processing liquid coating apparatus according to claim 2, wherein a gap dimension between the rectifying member and the substrate is adjusted by the protrusion . 前記基板保持部材は、最も小さい基板に対応し得るように寸法設定されていることを特徴とする請求項1乃至11のいずれかに記載の処理液塗布装置。The processing liquid coating apparatus according to claim 1, wherein the substrate holding member is dimensioned so as to correspond to the smallest substrate . 前記基板保持部材は、真空吸着することで基板を保持するバキュームチャックであることを特徴とする請求項1乃至12のいずれかに記載の処理液塗布装置。The processing liquid coating apparatus according to claim 1, wherein the substrate holding member is a vacuum chuck that holds the substrate by vacuum suction . 前記処理液は、フォトレジスト液または現像液であることを特徴とする請求項1乃至13のいずれかに記載の処理液塗布装置。The processing liquid coating apparatus according to claim 1, wherein the processing liquid is a photoresist liquid or a developer . 前記基板は、半導体基板、液晶表示基板、カラーフィルタおよびプラズマ表示パネルの内のいずれかに使用されるものであることを特徴とする請求項1乃至14のいずれかに記載の処理液塗布装置。The substrate includes a semiconductor substrate, a liquid crystal display substrate, the treatment liquid application apparatus according to any one of claims 1 to 14, characterized in that for use in any of the color filter and the plasma display panel. 基板を回転させた状態で前記基板上に処理液を塗布する処理液塗布方法において、基板を水平かつ回転可能に保持する基板保持部材の上面位置よりも上面が僅かに所定寸法だけ低い位置に配設された当該保持部材を囲む整流部材の上面と、基板の裏In the processing liquid coating method in which the processing liquid is applied onto the substrate while the substrate is rotated, the upper surface is disposed at a position slightly lower than the upper surface of the substrate holding member that holds the substrate horizontally and rotatably. The upper surface of the rectifying member surrounding the holding member and the back of the substrate 面との間に0.1mmを越えて0.6mm未満の間隙を形成させかつ基板の裏面にのみ当接する部材を介設した上で前記基板保持部材、整流部材および基板を中心回りに一体回転させながら、回転している基板の表面に処理液を供給することを特徴とする処理液塗布方法。A gap between 0.1 mm and less than 0.6 mm is formed between the substrate and a member that contacts only the back surface of the substrate, and the substrate holding member, the rectifying member, and the substrate are integrally rotated around the center. A processing liquid coating method, wherein the processing liquid is supplied to the surface of the rotating substrate. 前記間隙を形成させる部材として基板の端縁部の裏面に当接する突起を有する突起部材を用いることを特徴とする請求項16記載の処理液塗布方法。The process liquid coating method according to claim 16, wherein a projection member having a projection abutting against the back surface of the edge portion of the substrate is used as the member for forming the gap . 前記突起として針状のものを用いることを特徴とする請求項17記載の処理液塗布方法。The treatment liquid coating method according to claim 17, wherein a needle-like member is used as the protrusion . 基板を回転させた状態で前記基板上に処理液を塗布する処理液塗布装置において、基板を水平にかつ回転可能に保持する基板保持部材と、この基板保持部材の周囲に、この基板保持部材の上面位置よりも上面が僅かに所定寸法だけ低い位置に配設された整流部材と、前記基板保持部材上に保持された基板の裏面と前記整流部材の上面との間隙寸法を、0.1mmを越えて0.6mm未満に維持する突起部材とを備えて構成されていることを特徴とする処理液塗布装置。In a processing liquid coating apparatus that coats a processing liquid on the substrate while the substrate is rotated, a substrate holding member that holds the substrate horizontally and rotatably, and the substrate holding member is disposed around the substrate holding member. The gap dimension between the rectifying member disposed at a position where the upper surface is slightly lower than the upper surface position by a predetermined dimension, and the back surface of the substrate held on the substrate holding member and the upper surface of the rectifying member is 0.1 mm. A processing liquid coating apparatus comprising a protruding member that is maintained to be less than 0.6 mm.
JP10130596A 1996-04-23 1996-04-23 Treatment liquid coating apparatus and treatment liquid coating method Expired - Fee Related JP3821400B2 (en)

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