JP3796717B2 - Polishing and cleaning combined device - Google Patents

Polishing and cleaning combined device Download PDF

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Publication number
JP3796717B2
JP3796717B2 JP2002345348A JP2002345348A JP3796717B2 JP 3796717 B2 JP3796717 B2 JP 3796717B2 JP 2002345348 A JP2002345348 A JP 2002345348A JP 2002345348 A JP2002345348 A JP 2002345348A JP 3796717 B2 JP3796717 B2 JP 3796717B2
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polishing
processed
cleaning
pair
cylindrical
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JP2004174679A (en
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利男 長島
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株式会社ティーエスシー
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  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Description

【0001】
【発明が属する技術分野】
この発明は、磁気ディスク用基板、半導体ウェハー、液晶表示用ガラス基板、フォトマスク用ガラス基板などの薄板円盤状の被処理体の表面を研磨し、洗浄する研磨洗浄複合装置に関する。
【0002】
【従来の技術】
特許文献1は、複数の被研磨物を保持する孔を有するキャリアを上下定盤間で保持して公転及び正逆方向に交互に自転させて複数の被研磨物の両面を研磨する研磨装置を開示する。
【0003】
特許文献2は、研磨装置において、例えば、ウェハーの表面を研磨する工程を、粗い研磨工程、精密な研磨工程、仕上げの研磨工程といった複数の研磨工程で複数段階で行うことを開示し、研磨ステーション間でウェハーを移動させる場合に、ウェハーに付着したスラリーを十分に除去することを課題としている。このため、洗浄装置において、ウェハーには、保持ヘッドに保持された状態での洗浄及び保持台座上に載置された状態での洗浄がなされ、そして保持ヘッドも単独で洗浄されることが開示されている。
【0004】
【特許文献1】
特開2002−254301号公報
【特許文献2】
特開2001−144057号公報
【0005】
【発明が解決しようとする課題】
現在において、ウェハー等の薄板円盤状の被処理体を多量に研磨することが要求されており、従来では、特許文献1で開示されるように、複数の被処理体を受容可能な複数のキャリアを、自転する研磨面を有し、スラリーが供給される上定盤と下定盤の間で自転及び公転させることによって、一度の多数の被処理体を研磨していた。この場合、研磨終了後に被処理体を取り出すときに、被処理体に付着したスラリーにより研磨面が変化するため、できる限り早急に取り出す必要があり、取り出す順番によって品質に変化が生じるという不具合が生じる。
【0006】
また、特許文献2で開示されるように、研磨工程毎に洗浄によってスラリーの除去を行うことが望ましいが、工程が複雑になるという不具合が生じる。
【0007】
このため、この発明は、連続して被処理体の研磨及び洗浄が可能である研磨洗浄複合装置を提供することにある。
【0008】
【課題を解決するための手段】
したがって、この発明は、薄板円盤状の被処理体の研磨を行う研磨装置部と、該研磨装置で研磨された被処理体を洗浄する洗浄装置部とを一連に配した研磨洗浄複合装置において、前記研磨装置部は、研磨布が配された一対の円筒状研磨治具と、該円筒状研磨治具の上方に配され、前記被処理体の上方位置を制限すると共に前記被処理体を自転させる少なくとも一つの自転用ローラとによって少なくとも構成されると共に、前記一対の円筒状研磨治具によって、複数の被処理体が収容されたコンテナから順次搬送される被処理体を鉛直方向に挟持固定する保持手段と、該保持手段によって保持された被処理体を前記自転用ローラによって自転させると共に、前記一対の円筒状研磨治具を前記被処理体を引上げるように回転運動させる研磨手段とを少なくとも具備することにある。
【0009】
また、この発明は、薄板円盤状の被処理体の研磨を行う研磨装置部と、該研磨装置で研磨された被処理体を洗浄する洗浄装置部とを一連に配した研磨洗浄複合装置において、前記洗浄装置部は、前記研磨装置部から順次搬送される被処理体を保持する保持手段と、円周状に前記保持手段を均等に配する環状の搬送手段と、該搬送手段が回動し、前記保持手段によって保持された被処理体が所定の位置に移動した時に、前記被処理体を挟持する一対の洗浄治具を具備し、該一対の洗浄治具を回動させると共に前記被処理体を自転させる洗浄手段とを具備することにある。
【0010】
さらに、この発明は、薄板円盤状の被処理体の研磨を行う研磨装置部と、該研磨装置で研磨された被処理体を洗浄する洗浄装置部とを一連に配した研磨洗浄複合装置において、前記研磨装置部は、研磨布が配された一対の円筒状研磨治具と、該円筒状研磨治具の上方に配され、前記被処理体の上方位置を制限すると共に前記被処理体を自転させる少なくとも一つの自転用ローラとによって少なくとも構成されると共に、前記一対の円筒状研磨治具によって、複数の被処理体が収容されたコンテナから順次搬送される被処理体を鉛直方向に挟持固定する保持手段と、該保持手段によって保持された被処理体を前記自転用ローラによって自転させると共に、前記一対の円筒状研磨治具を前記被処理体を引上げるように回転運動させる研磨手段とを少なくとも具備すると共に、前記洗浄装置部は、前記研磨装置部から順次搬送される被処理体を保持する保持手段と、円周状に前記保持手段を均等に配する環状の搬送手段と、該搬送手段が回動し、前記保持手段によって保持された被処理体が所定の位置に移動した時に、前記被処理体を挟持する一対の洗浄治具を具備し、該一対の洗浄治具を回動させると共に前記被処理体を自転させる洗浄手段とを具備することにある。
【0011】
概略的には、研磨洗浄複合装置において、研磨装置部は、一対の円筒状研磨治具によって、複数の薄板円盤状の被処理体が収容されたコンテナから順次搬送される被処理体を順次鉛直方向に挟持固定し、自転用ローラによって自転させながら、前記一対の円筒状研磨治具を前記被処理体を引上げるように回転運動させて研磨を行い、洗浄装置部は、環状形状の搬送機構で、前記研磨装置部によって研磨された被処理体を、順次円周状に配された複数の保持手段によって保持して、所定の位置に移動させ、前記被処理体を挟持する一対の洗浄治具によって洗浄する。
【0012】
さらに、前記洗浄装置部の保持手段は、前記被処理体の周縁に接する複数の自転用ローラからなることが望ましい。
【0013】
さらにまた、前記一対の円筒状研磨治具は、前記被処理体の中心点を通過する水平基準線よりも所定値下側で、前記水平基準線に対して平行に前記被処理体に線的に接触することが望ましい。
【0014】
また、前記一対の円筒状研磨治具は、前記被処理体の中心点を通過する水平基準線よりも所定値下側で、前記水平基準線に対して所定角度傾斜して前記被処理体に線的に接触するものであっても良いものである。該所定角度は、5〜40°の範囲内であることが望ましく、特に10〜20°の範囲内であることが望ましい。
【0015】
前記研磨装置部を構成する自転用ローラの少なくとも一つは、前記被処理体の中心が前記円筒状研磨治具の接触領域を通過するように前記被処理体を移動(往復運動)、又は楕円旋回運動させることが望ましい。これにより、被処理体が薄型円板であり、且つ中央に開口部を有しない場合には、全体的に均一な研磨が可能となる。
【0016】
【発明の実施の形態】
以下、この発明の実施の形態について、図面により説明する。
【0017】
本願発明の実施の形態に係る研磨洗浄複合装置1は、研磨装置部2と、洗浄装置部3とによって少なくとも構成されている。
【0018】
コンテナ4に搭載された、例えば、磁気ディスク用基板、半導体ウェハー、液晶表示用ガラス基板、フォトマスク用ガラス基板などの薄板円盤状の被処理体5は、リフト機構6のグリップ6aによってグリップされ、コンテナ4から上方に持ち上げられる。そして、キャリア7が移動して、キャリア7の一次ホルダ7aが下方位置に到達したときに、グリップ6aが下降してキャリア7の一次ホルダ7aに被処理体5が載置される。
【0019】
前記一次ホルダ7aに被処理体5が載置されると、キャリア7は、前記一次ホルダ7aが研磨機構20の下方に位置する場所まで横方向に移動し、ここから、上方に移動する。前記研磨機構20は、上方に移動してきた被処理体5を保持する。
【0020】
前記研磨機構20は、図2(a),(b)で示すように、前記被処理体5の上方位置を制限し、且つ前記被処理体5を自転させる一対の自転用ローラ21と、前記被処理体5を挟持して保持すると共に、前記被処理体5を上方へ付勢する方向に回転する一対の円筒状研磨治具22とによって少なくとも構成される。前記円筒状研磨治具22は、円筒形状をしており、その外周側面には研磨布が装着される。また、円筒状研磨治具22は、前記被処理体5の中心点を通る中心基準線Mよりも所定値Dだけ下方である線的な当接位置(S)において、前記被処理体5の両側で接触する。これにより、線的な当接位置(S)が中心基準線Mと同一である場合よりも、前記被処理体5の保持力を向上させることができると共に、被処理体5の研磨の状態をさらに良好にすることができるものである。
【0021】
以上の構成によって、前記円筒状研磨治具22が、基準線Sにおいて前記被処理体5を挟持して、前記被処理体5を上方へ付勢する方向に回転すると共に、前記自転用ローラ21が前記被処理体5を自転させることによって、前記被処理体5の両面を研磨することができるものである。尚、この研磨工程において、前記円筒状研磨治具22の側面に装着された研磨布には、所定の特性を有するスラリーが供給されるものである。
【0022】
研磨工程が終了すると、前記キャリア7が図面左方向に移動し、一次ホルダ7aが新しい被処理体5を載置すると同時に、キャリア7の二次ホルダ7bが研磨機構20から研磨された被処理体5を受け取り、キャリア7が図面右方向に移動する。そして、研磨された被処理体5は、キャリア7の二次ホルダ7bから搬送機構8のグリップ8aによって洗浄装置部3に搬送される。
【0023】
前記洗浄装置部3は、周縁上に所定の間隔で配された複数の保持機構30を有する環状搬送機構10と、該環状搬送機構10の所定に位置に設けられた少なくとも一つ(この実施の形態では、2つ)の洗浄機構40とを具備する。また、前記環状搬送機構10は、略観覧車状に構成されるもので、前記保持機構30にグリップされた被処理体5を、所定の角度(この実施の形態では、45°)毎に回動させて、洗浄機構40に搬送し、洗浄した後、乾燥させながら、搬送機構9まで、順次移動させるものである。
【0024】
前記洗浄装置部3の保持機構30は、前記被処理体5を少なくとも3点で保持する3つの保持用ローラ31によって構成される。この場合、両側に位置する保持用ローラ31を中間に位置する保持用ローラ31側に付勢するように回転力を加えることによって前記被処理体5の保持力を向上させることができる。
【0025】
前記洗浄機構40は、図3(a),(b)に示すように、前記被処理体5を挟持して自転する一対の洗浄治具41と、前記保持用ローラ31を駆動して前記被処理体5を自転させる自転機構とによって構成される。尚、この洗浄治具41による洗浄工程では、洗浄水が供給され、被処理体5に付着したスラリー等のパーティクルを除去する。尚、この実施の形態では、保持用ローラ31を積極的に駆動させる機構としたが、前記保持用ローラ31を回動自在な構造とすることにより、前記洗浄治具41の回動に伴って被処理体5が自転運動を行うことができるものである。
【0026】
そして、前記環状搬送機構10が回動して、所定の位置まで搬送された研磨され且つ洗浄された被処理体5は、搬送機構9のグリップ9aによって保持機構30から搬出され、コンテナ4に収納される。
【0027】
このように、本願発明の研磨洗浄複合装置1において、コンテナ4に収納された被処理体5を、連続して研磨し、洗浄してコンテナ4に収納することができるため、一定の品質を保持できると共に、生産性を向上させることができるものである。
【0028】
図4に示される別の実施の形態に係る研磨機構20は、一対の円筒状研磨治具22の線的な当接位置S’を前述した線的な当接位置Sに対して所定角度(α)傾斜させたことを特徴とするものである。
【0029】
これは、例えば図5で示すように、上記実施の形態では、自転用ローラ21と被処理体5との接触点及び円筒状研磨治具22と被処理体5との接触線とを結んだ場合の交点Psが、被処理体5の回転中心Rsを通過する鉛直線ML上に位置するが、この実施の形態では、自転用ローラ21と被処理体5との接触点及び円筒状研磨治具22と被処理体5との接触線とを結んだ場合の交点Ps’は、被処理体5の回転中心Rsを通過する鉛直線MLからずれた位置に存在する。また、一方の自転用ローラ21と被処理体5との接触点及び円筒状研磨治具22と被処理体5との接触線とを結んで形成される三角形が、他方の自転用ローラ21と被処理体5との接触点及び円筒状研磨治具22と被処理体5との接触線とを結んで形成される三角形と非相似形となる。
【0030】
以上の要因により、被処理体5のぶれを防止できるので、上述した第1の実施の形態よりもさらに、研磨精度の向上させることができると共に、研磨性能を安定させることができるものである。尚、前記角度αとしては、5〜40°の範囲内であることが望ましく、特に10〜20°の範囲内であることが望ましい。
【0031】
また、図6(a),(b)で示す第3の実施の形態に係る研磨機構20では、上記第1の実施の形態及び第2の実施の形態に係る研磨機構20の一部を構成する少なくとも一つ(この実施の形態では、一つ)の自転用ローラ21を、上下(図6(a))又は円弧状(図6(b))に移動させて、前記被処理体5を他方の自転用ローラ21を中心とした円弧状に移動(往復運動)させ、被処理体5の中心を線的に接触する一対の円筒状研磨治具22の研磨領域を通過させるものである。これにより、例えば、被処理体5が中央に開口部を有しないタイプのものである場合でも良好な研磨性能を維持できるものである。
【0032】
さらに、図7(a),(b)で示す第4の実施の形態に係る研磨機構20では、上記第1の実施の形態及び第2の実施の形態に係る研磨機構20の一部を構成する自転用ローラ21を楕円旋回運動させ、前記被処理体5を楕円旋回運動させ、被処理体5の中心を線的に接触する一対の円筒状研磨治具22の研磨領域を通過させるものである。これにより、上述した第3の実施の形態と同様に、被処理体5が中央に開口部を有しないタイプのものである場合でも良好な研磨性能を維持できるものである。また、前記被処理体5の中心が前記円筒状研磨治具22の研磨領域を通過する運動を行うものであれば、前記自転用ローラ21の動作については特に限定しない。
【0033】
また、前記自転用ローラ21を前記円筒状研磨治具22の回転力に抗して前記被処理体5を下方に押し下げるように下方に移動させ、瞬間的に定位置に戻すように運動させることによっても、被処理体5の中心を円筒状研磨治具22の研磨領域を通過させることができるものである。このとき、被処理体5は瞬間的に横移動するが、被処理体5のこの横移動によって被処理体5の中心付近の研磨状態を良好にすることができるものである。
【0034】
【発明の効果】
以上説明したように、この発明によれば、研磨装置部と洗浄装置部を連続して配置すると共に、研磨工程及び洗浄工程を順次連続して行うようにしたため、連続した作業が可能となり、被処理体の高品質化及び生産性を向上させることができるものである。
【0035】
また、洗浄工程において、被処理体の研磨される表裏面を保持するのではなく、被処理体の周縁を点で保持するようにしたことから、品質を向上させることができるようになるものである。
【0036】
さらに、研磨工程において、被処理体と円筒研磨治具とが点接触となり、連続した直線欠陥を防止するものである。
【図面の簡単な説明】
【図1】本願発明の実施の形態に係る研磨洗浄複合装置の概略構成図である。
【図2】第1の実施の形態に係る研磨機構の概略構成図であり、(a)はその正面概略図であり、(b)はその側面概略図である。
【図3】洗浄機構の概略構成図であり、(a)はその正面概略図であり、(b)はその断面概略図である。
【図4】第2の実施の形態に係る研磨機構の正面概略図である。
【図5】第2の実施の形態に係る研磨機構の動作状況を示した説明図である。
【図6】第3の実施の形態に係る研磨機構を示すもので、(a)は第1の実施の形態に係る研磨機構の自転用ローラを上下運動させた場合を示し、(b)は第2の実施の形態に係る研磨機構の自転用ローラを他方の自転用ローラを支点として回動させた場合を示すものである。
【図7】第4の実施の形態に係る研磨機構を示すもので、(a)は第1の実施の形態に係る研磨機構の自転用ローラを楕円旋回運動させて被処理体を楕円旋回運動させる場合を示し、(b)は第2の実施の形態に係る研磨機構の自転用ローラを楕円旋回運動させて被処理体を楕円旋回運動させる場合を示すものである。
【符号の説明】
1 研磨洗浄複合装置
2 研磨装置部
3 洗浄装置部
4 コンテナ
5 被処理体
10 環状搬送機構
20 研磨機構
21 自転用ローラ
22 円筒状研磨治具
30 保持機構
31 保持用ローラ
40 洗浄機構
41 洗浄治具
[0001]
[Technical field to which the invention belongs]
The present invention relates to a polishing and cleaning composite apparatus that polishes and cleans the surface of a thin disk-shaped object such as a magnetic disk substrate, a semiconductor wafer, a liquid crystal display glass substrate, and a photomask glass substrate.
[0002]
[Prior art]
Patent Document 1 discloses a polishing apparatus that holds a carrier having a hole for holding a plurality of objects to be polished between upper and lower surface plates and alternately rotates in a revolving and forward / reverse direction to polish both surfaces of the objects to be polished. Disclose.
[0003]
Patent Document 2 discloses that in a polishing apparatus, for example, a process of polishing a surface of a wafer is performed in a plurality of stages by a plurality of polishing processes such as a rough polishing process, a precise polishing process, and a finishing polishing process. It is an object to sufficiently remove slurry adhering to the wafer when the wafer is moved between them. For this reason, in the cleaning apparatus, it is disclosed that the wafer is cleaned while being held by the holding head and cleaned while being placed on the holding base, and the holding head is also cleaned alone. ing.
[0004]
[Patent Document 1]
JP 2002-254301 A [Patent Document 2]
Japanese Patent Laid-Open No. 2001-144057
[Problems to be solved by the invention]
At present, it is required to polish a large amount of a thin disk-shaped object to be processed such as a wafer. Conventionally, as disclosed in Patent Document 1, a plurality of carriers capable of receiving a plurality of objects to be processed are disclosed. A large number of objects to be processed were polished once by rotating and revolving between an upper surface plate and a lower surface plate to which slurry is supplied and having a polishing surface that rotates. In this case, when the object to be processed is taken out after completion of polishing, the polishing surface changes due to the slurry adhering to the object to be processed, so it is necessary to take out as soon as possible, and there arises a problem that the quality changes depending on the order of extraction. .
[0006]
Moreover, as disclosed in Patent Document 2, it is desirable to remove the slurry by washing for each polishing process, but this causes a problem that the process becomes complicated.
[0007]
For this reason, this invention is providing the polishing washing | cleaning composite apparatus which can grind | polish and wash | clean a to-be-processed object continuously.
[0008]
[Means for Solving the Problems]
Accordingly, the present invention provides a polishing and cleaning composite apparatus in which a polishing apparatus unit for polishing a thin disk-shaped object to be processed and a cleaning device part for cleaning the object to be processed polished by the polishing apparatus are arranged in series. The polishing apparatus section is disposed above the cylindrical polishing jig and a pair of cylindrical polishing jigs on which polishing cloths are arranged, and restricts the upper position of the target object and rotates the target object. And at least one rotating roller to be rotated, and the pair of cylindrical polishing jigs hold and fix the objects to be sequentially conveyed from the container in which the plurality of objects to be processed are held in the vertical direction. A holding means and a polishing means for rotating the object to be processed held by the holding means by the rotation roller and rotating the pair of cylindrical polishing jigs to pull up the object to be processed. Some to at least provided.
[0009]
Further, the present invention relates to a polishing and cleaning composite apparatus in which a polishing unit for polishing a thin disk-shaped target object and a cleaning unit for cleaning the target object polished by the polishing apparatus are arranged in series. The cleaning unit includes a holding unit that holds the objects to be sequentially transferred from the polishing unit, an annular transfer unit that uniformly distributes the holding unit in a circumferential shape, and the transfer unit rotates. And a pair of cleaning jigs for sandwiching the object to be processed when the object to be processed held by the holding means moves to a predetermined position, rotating the pair of cleaning jigs and the object to be processed And a cleaning means for rotating the body.
[0010]
Furthermore, the present invention is a polishing and cleaning composite apparatus in which a polishing apparatus unit for polishing a thin disk-shaped object to be processed and a cleaning device part for cleaning the object to be processed polished by the polishing apparatus are arranged in series. The polishing apparatus section is disposed above the cylindrical polishing jig and a pair of cylindrical polishing jigs on which polishing cloths are arranged, and restricts the upper position of the target object and rotates the target object. And at least one rotating roller to be rotated, and the pair of cylindrical polishing jigs hold and fix the objects to be sequentially conveyed from the container in which the plurality of objects to be processed are held in the vertical direction. A holding means; and a polishing means for rotating the object to be processed held by the holding means by the rotation roller and rotating the pair of cylindrical polishing jigs to pull up the object to be processed. The cleaning device unit includes at least a holding unit that holds the objects to be sequentially transferred from the polishing device unit, an annular transfer unit that uniformly distributes the holding unit in a circumferential shape, When the conveying means rotates and the object to be processed held by the holding means moves to a predetermined position, the conveying means includes a pair of cleaning jigs that sandwich the object to be processed. And cleaning means for rotating the object to be processed.
[0011]
Schematically, in the polishing and cleaning composite apparatus, the polishing apparatus unit sequentially vertically moves the objects to be processed, which are sequentially conveyed from a container in which a plurality of thin disk-shaped objects to be processed are accommodated, by a pair of cylindrical polishing jigs. The pair of cylindrical polishing jigs are rotated and moved so as to pull up the object to be processed while being held and fixed in a direction and rotated by a rotation roller. Thus, a pair of cleaning treatments in which the object to be processed polished by the polishing apparatus unit is sequentially held by a plurality of holding means and moved to a predetermined position so as to sandwich the object to be processed. Wash with tools.
[0012]
Further, it is desirable that the holding means of the cleaning device section includes a plurality of rotation rollers that are in contact with the periphery of the object to be processed.
[0013]
Furthermore, the pair of cylindrical polishing jigs are linearly connected to the object to be processed in parallel to the horizontal reference line at a predetermined value below a horizontal reference line passing through the center point of the object to be processed. It is desirable to contact
[0014]
In addition, the pair of cylindrical polishing jigs are inclined by a predetermined angle with respect to the horizontal reference line below the horizontal reference line passing through the center point of the object to be processed. It may be in line contact. The predetermined angle is desirably within a range of 5 to 40 °, and particularly desirably within a range of 10 to 20 °.
[0015]
At least one of the rotation rollers constituting the polishing apparatus unit moves (reciprocates) the object to be processed so that the center of the object passes through a contact area of the cylindrical polishing jig, or an ellipse. It is desirable to make a swivel motion. As a result, when the object to be processed is a thin disk and does not have an opening at the center, uniform polishing can be achieved as a whole.
[0016]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of the present invention will be described below with reference to the drawings.
[0017]
The polishing / cleaning composite apparatus 1 according to the embodiment of the present invention includes at least a polishing apparatus unit 2 and a cleaning apparatus unit 3.
[0018]
For example, a thin disk-shaped object 5 such as a magnetic disk substrate, a semiconductor wafer, a liquid crystal display glass substrate, or a photomask glass substrate mounted on the container 4 is gripped by a grip 6a of a lift mechanism 6. The container 4 is lifted upward. When the carrier 7 moves and the primary holder 7 a of the carrier 7 reaches the lower position, the grip 6 a is lowered and the object 5 is placed on the primary holder 7 a of the carrier 7.
[0019]
When the workpiece 5 is placed on the primary holder 7a, the carrier 7 moves laterally to a location where the primary holder 7a is located below the polishing mechanism 20, and then moves upward. The polishing mechanism 20 holds the workpiece 5 that has moved upward.
[0020]
As shown in FIGS. 2A and 2B, the polishing mechanism 20 includes a pair of rotation rollers 21 that limit the upper position of the object 5 and rotate the object 5; The workpiece 5 is sandwiched and held, and at least includes a pair of cylindrical polishing jigs 22 that rotate in a direction in which the workpiece 5 is urged upward. The cylindrical polishing jig 22 has a cylindrical shape, and a polishing cloth is attached to the outer peripheral side surface thereof. Further, the cylindrical polishing jig 22 has a linear contact position (S) that is lower than the center reference line M passing through the center point of the object 5 by a predetermined value D. Contact on both sides. Accordingly, the holding force of the object to be processed 5 can be improved and the polishing state of the object to be processed 5 can be improved as compared with the case where the linear contact position (S) is the same as the center reference line M. It can be further improved.
[0021]
With the above-described configuration, the cylindrical polishing jig 22 rotates in the direction in which the object to be processed 5 is clamped on the reference line S and urges the object to be processed 5 upward, and the rotation roller 21 is rotated. However, by rotating the object 5 to be processed, both surfaces of the object 5 can be polished. In this polishing step, slurry having predetermined characteristics is supplied to the polishing cloth attached to the side surface of the cylindrical polishing jig 22.
[0022]
When the polishing process is completed, the carrier 7 moves in the left direction of the drawing, and the primary holder 7a places a new object 5 to be processed. At the same time, the secondary holder 7b of the carrier 7 is polished from the polishing mechanism 20. 5 is received, and the carrier 7 moves to the right in the drawing. Then, the polished object 5 is transported from the secondary holder 7 b of the carrier 7 to the cleaning device unit 3 by the grip 8 a of the transport mechanism 8.
[0023]
The cleaning device section 3 includes an annular transport mechanism 10 having a plurality of holding mechanisms 30 arranged at predetermined intervals on the periphery, and at least one provided at a predetermined position of the annular transport mechanism 10 (this embodiment In the embodiment, two cleaning mechanisms 40 are provided. In addition, the annular transport mechanism 10 is configured in a substantially ferris wheel shape, and the object to be processed 5 gripped by the holding mechanism 30 is rotated every predetermined angle (45 ° in this embodiment). It is moved, transported to the cleaning mechanism 40, cleaned, and then sequentially moved to the transport mechanism 9 while being dried.
[0024]
The holding mechanism 30 of the cleaning device unit 3 includes three holding rollers 31 that hold the object 5 to be processed at at least three points. In this case, the holding force of the workpiece 5 can be improved by applying a rotational force so that the holding rollers 31 located on both sides are biased toward the holding roller 31 located in the middle.
[0025]
As shown in FIGS. 3A and 3B, the cleaning mechanism 40 drives a pair of cleaning jigs 41 that rotate while sandwiching the object to be processed 5 and the holding roller 31 to drive the object to be processed. It is comprised by the autorotation mechanism in which the process body 5 rotates. In the cleaning process using the cleaning jig 41, cleaning water is supplied to remove particles such as slurry adhering to the object 5 to be processed. In this embodiment, the mechanism for positively driving the holding roller 31 is used. However, by making the holding roller 31 rotatable, the cleaning jig 41 is rotated. The to-be-processed object 5 can perform a rotation motion.
[0026]
Then, the polished and cleaned object 5 that has been transported to a predetermined position by rotating the annular transport mechanism 10 is unloaded from the holding mechanism 30 by the grip 9 a of the transport mechanism 9 and stored in the container 4. Is done.
[0027]
As described above, in the polishing / cleaning composite apparatus 1 according to the present invention, the object 5 stored in the container 4 can be continuously polished, cleaned, and stored in the container 4, so that a certain quality is maintained. It is possible to improve productivity.
[0028]
The polishing mechanism 20 according to another embodiment shown in FIG. 4 has a predetermined angle (with respect to the above-described linear contact position S with respect to the linear contact position S ′ of the pair of cylindrical polishing jigs 22. α) It is characterized by being inclined.
[0029]
For example, as shown in FIG. 5, in the above embodiment, the contact point between the roller 21 for rotation and the object to be processed 5 and the contact line between the cylindrical polishing jig 22 and the object to be processed 5 are connected. In this embodiment, the intersection point Ps is located on the vertical line ML passing through the rotation center Rs of the object 5 to be processed. In this embodiment, the contact point between the rotation roller 21 and the object 5 and the cylindrical polishing treatment The intersection point Ps ′ when the contact line between the tool 22 and the object to be processed 5 is connected exists at a position shifted from the vertical line ML passing through the rotation center Rs of the object to be processed 5. Further, a triangle formed by connecting a contact point between one rotation roller 21 and the object to be processed 5 and a contact line between the cylindrical polishing jig 22 and the object to be processed 5 is connected to the other rotation roller 21. The contact point with the workpiece 5 and the triangle formed by connecting the contact line between the cylindrical polishing jig 22 and the workpiece 5 are not similar.
[0030]
Due to the above factors, the shake of the workpiece 5 can be prevented, so that the polishing accuracy can be further improved and the polishing performance can be stabilized as compared with the first embodiment described above. The angle α is preferably in the range of 5 to 40 °, and more preferably in the range of 10 to 20 °.
[0031]
Further, in the polishing mechanism 20 according to the third embodiment shown in FIGS. 6A and 6B, a part of the polishing mechanism 20 according to the first embodiment and the second embodiment is configured. At least one (one in this embodiment) rotating roller 21 is moved up and down (FIG. 6 (a)) or arcuately (FIG. 6 (b)) to move the object 5 to be processed. It moves (reciprocates) in an arc shape around the other rotation roller 21 and passes through the polishing region of a pair of cylindrical polishing jigs 22 that linearly contact the center of the object 5 to be processed. Thereby, for example, even when the object 5 is of a type that does not have an opening at the center, good polishing performance can be maintained.
[0032]
Further, in the polishing mechanism 20 according to the fourth embodiment shown in FIGS. 7A and 7B, a part of the polishing mechanism 20 according to the first embodiment and the second embodiment is configured. The rotating roller 21 is rotated in an elliptical manner, the processed object 5 is moved in an elliptical rotation, and the polishing area of a pair of cylindrical polishing jigs 22 that linearly contact the center of the processed object 5 is passed. is there. As a result, as in the third embodiment described above, good polishing performance can be maintained even when the object 5 is of a type that does not have an opening at the center. Further, the operation of the rotation roller 21 is not particularly limited as long as the center of the workpiece 5 moves through the polishing region of the cylindrical polishing jig 22.
[0033]
Further, the rotating roller 21 is moved downward so as to push down the workpiece 5 against the rotational force of the cylindrical polishing jig 22, and is moved so as to instantaneously return to the fixed position. Also, the center of the workpiece 5 can be passed through the polishing region of the cylindrical polishing jig 22. At this time, the object to be processed 5 instantaneously moves laterally, but this lateral movement of the object to be processed 5 can improve the polishing state near the center of the object to be processed 5.
[0034]
【The invention's effect】
As described above, according to the present invention, the polishing device unit and the cleaning device unit are continuously arranged, and the polishing process and the cleaning process are sequentially performed. It is possible to improve the quality and productivity of the processed body.
[0035]
Further, in the cleaning process, the front and back surfaces of the object to be polished are not held, but the periphery of the object to be processed is held with dots, so that the quality can be improved. is there.
[0036]
Further, in the polishing process, the object to be processed and the cylindrical polishing jig are in point contact, and continuous linear defects are prevented.
[Brief description of the drawings]
FIG. 1 is a schematic configuration diagram of a polishing and cleaning composite apparatus according to an embodiment of the present invention.
FIG. 2 is a schematic configuration diagram of a polishing mechanism according to a first embodiment, (a) is a schematic front view thereof, and (b) is a schematic side view thereof.
FIG. 3 is a schematic configuration diagram of a cleaning mechanism, (a) is a schematic front view thereof, and (b) is a schematic sectional view thereof.
FIG. 4 is a schematic front view of a polishing mechanism according to a second embodiment.
FIG. 5 is an explanatory diagram showing an operation state of a polishing mechanism according to a second embodiment.
6A and 6B show a polishing mechanism according to a third embodiment, where FIG. 6A shows a case where the rotation roller of the polishing mechanism according to the first embodiment is moved up and down, and FIG. The case where the rotation roller of the polishing mechanism according to the second embodiment is rotated with the other rotation roller as a fulcrum is shown.
7A and 7B show a polishing mechanism according to a fourth embodiment. FIG. 7A shows an elliptical swiveling motion of an object to be processed by causing the roller for rotation of the polishing mechanism according to the first embodiment to swivel. (B) shows the case where the roller for rotation of the polishing mechanism according to the second embodiment is caused to make an elliptical swiveling motion to cause the object to be processed to make an elliptical swiveling motion.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Polishing cleaning composite apparatus 2 Polishing apparatus part 3 Cleaning apparatus part 4 Container 5 To-be-processed object 10 Annular conveyance mechanism 20 Polishing mechanism 21 Rolling roller 22 Cylindrical polishing jig 30 Holding mechanism 31 Holding roller 40 Cleaning mechanism 41 Cleaning jig

Claims (5)

薄板円盤状の被処理体の研磨を行う研磨装置部と、該研磨装置で研磨された被処理体を洗浄する洗浄装置部とを一連に配した研磨洗浄複合装置であって、
前記研磨装置部、研磨布が配された一対の円筒状研磨治具と、該円筒状研磨治具の上方に配され、前記被処理体の上方位置を制限すると共に前記被処理体を自転させる少なくとも一つの自転用ローラとによって少なくとも構成される研磨洗浄複合装置において、
前記研磨装置部は、前記一対の円筒状研磨治具を、前記被処理体の中心点を通過する水平基準線よりも所定値下側で前記被処理体に線的に接触させて、前記被処理体を鉛直方向に支持固定すると共に前記被処理体を引き上げるように回転運動させると同時に、前記自転ローラで前記被処理体を自転させることによって前記被処理体の研磨を行うことを特徴とする研磨洗浄複合装置。
A polishing and cleaning composite apparatus in which a polishing apparatus unit for polishing a thin disk-shaped object to be processed and a cleaning device part for cleaning the object to be processed polished by the polishing apparatus are arranged in series ,
Rotating the polishing apparatus unit includes a pair of cylindrical polishing jig polishing cloth was arranged, is arranged above the said cylindrical polishing jig, the workpiece as well as limiting the upper position of the object to be processed in at least one abrasive cleaning composite apparatus that will be at least composed of a-rotating roller which,
The polishing apparatus unit linearly contacts the pair of cylindrical polishing jigs with the object to be processed at a predetermined value lower than a horizontal reference line passing through a center point of the object to be processed. The processing object is supported and fixed in a vertical direction and is rotated so as to lift the object to be processed, and at the same time, the object to be processed is polished by rotating the object to be processed by the rotation roller. Polishing and cleaning composite device.
前記洗浄装置部は、前記研磨装置部から順次搬送される被処理体を保持する保持手段と、円周状に前記保持手段を均等に配する環状の搬送手段と、該搬送手段が回動し、前記保持手段によって保持された被処理体が所定の位置に移動した時に、前記被処理体を挟持する一対の洗浄治具を具備し、該一対の洗浄治具を回動させると共に前記被処理体を自転させる洗浄手段とを具備することを特徴とする請求項1記載の研磨洗浄複合装置。The cleaning unit includes a holding unit that holds the objects to be sequentially transferred from the polishing unit, an annular transfer unit that uniformly distributes the holding unit in a circumferential shape, and the transfer unit rotates. And a pair of cleaning jigs for sandwiching the object to be processed when the object to be processed held by the holding means moves to a predetermined position, rotating the pair of cleaning jigs and the object to be processed The polishing / cleaning composite apparatus according to claim 1 , further comprising cleaning means for rotating the body. 前記一対の円筒状研磨治具は、前記水平基準線に対して平行に前記被処理体に線的に接触することを特徴とする請求項1又は2記載の研磨洗浄複合装置。3. The polishing and cleaning composite apparatus according to claim 1, wherein the pair of cylindrical polishing jigs linearly contacts the object to be processed in parallel to the horizontal reference line. 前記一対の円筒状治具は、前記水平基準線に対して所定角度傾斜して前記被処理体に線的に接触することを特徴とする請求項1又は2記載の研磨洗浄複合装置。3. The polishing and cleaning composite apparatus according to claim 1, wherein the pair of cylindrical jigs are linearly in contact with the object to be processed while being inclined at a predetermined angle with respect to the horizontal reference line. 前記研磨装置部を構成する自転用ローラは、前記被処理体の中心が前記円筒状研磨治具の線的接触位置を横切るように、楕円線形運動を行うことを特徴とする請求項1〜4のいずれか一つに記載の研磨洗浄複合装置。Rotating rollers constituting the polishing apparatus unit, the so that the center of the object crosses the line contact position of said cylindrical polishing jig, claim and performs elliptical linear motion 1-4 The polishing / cleaning composite apparatus according to any one of the above.
JP2002345348A 2002-11-28 2002-11-28 Polishing and cleaning combined device Expired - Fee Related JP3796717B2 (en)

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