JP2004174679A - Polishing and washing composite device - Google Patents

Polishing and washing composite device Download PDF

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Publication number
JP2004174679A
JP2004174679A JP2002345348A JP2002345348A JP2004174679A JP 2004174679 A JP2004174679 A JP 2004174679A JP 2002345348 A JP2002345348 A JP 2002345348A JP 2002345348 A JP2002345348 A JP 2002345348A JP 2004174679 A JP2004174679 A JP 2004174679A
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Prior art keywords
polishing
cleaning
pair
processed
jigs
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JP2002345348A
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Japanese (ja)
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JP3796717B2 (en
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Toshio Nagashima
利男 長島
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TSC KK
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TSC KK
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Priority to JP2002345348A priority Critical patent/JP3796717B2/en
Priority to US10/646,778 priority patent/US6916233B2/en
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a polishing and washing composite device which continuously polishes and washes processing bodies. <P>SOLUTION: A polishing device part 2 in this polishing and washing composite device holds and fixes the plurality of thin plate disc-shaped processing bodies 5 successively carried from a container 4 storing the processing bodies 5 in the vertical direction by a pair of cylindrical polishing tool 22, and performs polishing by making the pair of cylindrical polishing tools 22 perform rotary motions to pull up the processing bodies, while being rotated by a roller 21 for rotation. A washing device part 3 in the polishing and washing composite device successively holds the processing bodies 5 polished by the polishing device part 2 by a plurality of holding means 30 arranged in a circumferential shape in an annular carrying mechanism 10, moves the processing bodies 5 to prescribed positions, and successively washes the processing bodies 5 by a pair of washing tools 41 holding the processing bodies 5. <P>COPYRIGHT: (C)2004,JPO

Description

【0001】
【発明が属する技術分野】
この発明は、磁気ディスク用基板、半導体ウェハー、液晶表示用ガラス基板、フォトマスク用ガラス基板などの薄板円盤状の被処理体の表面を研磨し、洗浄する研磨洗浄複合装置に関する。
【0002】
【従来の技術】
特許文献1は、複数の被研磨物を保持する孔を有するキャリアを上下定盤間で保持して公転及び正逆方向に交互に自転させて複数の被研磨物の両面を研磨する研磨装置を開示する。
【0003】
特許文献2は、研磨装置において、例えば、ウェハーの表面を研磨する工程を、粗い研磨工程、精密な研磨工程、仕上げの研磨工程といった複数の研磨工程で複数段階で行うことを開示し、研磨ステーション間でウェハーを移動させる場合に、ウェハーに付着したスラリーを十分に除去することを課題としている。このため、洗浄装置において、ウェハーには、保持ヘッドに保持された状態での洗浄及び保持台座上に載置された状態での洗浄がなされ、そして保持ヘッドも単独で洗浄されることが開示されている。
【0004】
【特許文献1】
特開2002−254301号公報
【特許文献2】
特開2001−144057号公報
【0005】
【発明が解決しようとする課題】
現在において、ウェハー等の薄板円盤状の被処理体を多量に研磨することが要求されており、従来では、特許文献1で開示されるように、複数の被処理体を受容可能な複数のキャリアを、自転する研磨面を有し、スラリーが供給される上定盤と下定盤の間で自転及び公転させることによって、一度の多数の被処理体を研磨していた。この場合、研磨終了後に被処理体を取り出すときに、被処理体に付着したスラリーにより研磨面が変化するため、できる限り早急に取り出す必要があり、取り出す順番によって品質に変化が生じるという不具合が生じる。
【0006】
また、特許文献2で開示されるように、研磨工程毎に洗浄によってスラリーの除去を行うことが望ましいが、工程が複雑になるという不具合が生じる。
【0007】
このため、この発明は、連続して被処理体の研磨及び洗浄が可能である研磨洗浄複合装置を提供することにある。
【0008】
【課題を解決するための手段】
したがって、この発明は、薄板円盤状の被処理体の研磨を行う研磨装置部と、該研磨装置で研磨された被処理体を洗浄する洗浄装置部とを一連に配した研磨洗浄複合装置において、前記研磨装置部は、研磨布が配された一対の円筒状研磨治具と、該円筒状研磨治具の上方に配され、前記被処理体の上方位置を制限すると共に前記被処理体を自転させる少なくとも一つの自転用ローラとによって少なくとも構成されると共に、前記一対の円筒状研磨治具によって、複数の被処理体が収容されたコンテナから順次搬送される被処理体を鉛直方向に挟持固定する保持手段と、該保持手段によって保持された被処理体を前記自転用ローラによって自転させると共に、前記一対の円筒状研磨治具を前記被処理体を引上げるように回転運動させる研磨手段とを少なくとも具備することにある。
【0009】
また、この発明は、薄板円盤状の被処理体の研磨を行う研磨装置部と、該研磨装置で研磨された被処理体を洗浄する洗浄装置部とを一連に配した研磨洗浄複合装置において、前記洗浄装置部は、前記研磨装置部から順次搬送される被処理体を保持する保持手段と、円周状に前記保持手段を均等に配する環状の搬送手段と、該搬送手段が回動し、前記保持手段によって保持された被処理体が所定の位置に移動した時に、前記被処理体を挟持する一対の洗浄治具を具備し、該一対の洗浄治具を回動させると共に前記被処理体を自転させる洗浄手段とを具備することにある。
【0010】
さらに、この発明は、薄板円盤状の被処理体の研磨を行う研磨装置部と、該研磨装置で研磨された被処理体を洗浄する洗浄装置部とを一連に配した研磨洗浄複合装置において、前記研磨装置部は、研磨布が配された一対の円筒状研磨治具と、該円筒状研磨治具の上方に配され、前記被処理体の上方位置を制限すると共に前記被処理体を自転させる少なくとも一つの自転用ローラとによって少なくとも構成されると共に、前記一対の円筒状研磨治具によって、複数の被処理体が収容されたコンテナから順次搬送される被処理体を鉛直方向に挟持固定する保持手段と、該保持手段によって保持された被処理体を前記自転用ローラによって自転させると共に、前記一対の円筒状研磨治具を前記被処理体を引上げるように回転運動させる研磨手段とを少なくとも具備すると共に、前記洗浄装置部は、前記研磨装置部から順次搬送される被処理体を保持する保持手段と、円周状に前記保持手段を均等に配する環状の搬送手段と、該搬送手段が回動し、前記保持手段によって保持された被処理体が所定の位置に移動した時に、前記被処理体を挟持する一対の洗浄治具を具備し、該一対の洗浄治具を回動させると共に前記被処理体を自転させる洗浄手段とを具備することにある。
【0011】
概略的には、研磨洗浄複合装置において、研磨装置部は、一対の円筒状研磨治具によって、複数の薄板円盤状の被処理体が収容されたコンテナから順次搬送される被処理体を順次鉛直方向に挟持固定し、自転用ローラによって自転させながら、前記一対の円筒状研磨治具を前記被処理体を引上げるように回転運動させて研磨を行い、洗浄装置部は、環状形状の搬送機構で、前記研磨装置部によって研磨された被処理体を、順次円周状に配された複数の保持手段によって保持して、所定の位置に移動させ、前記被処理体を挟持する一対の洗浄治具によって洗浄する。
【0012】
さらに、前記洗浄装置部の保持手段は、前記被処理体の周縁に接する複数の自転用ローラからなることが望ましい。
【0013】
さらにまた、前記一対の円筒状研磨治具は、前記被処理体の中心点を通過する水平基準線よりも所定値下側で、前記水平基準線に対して平行に前記被処理体に線的に接触することが望ましい。
【0014】
また、前記一対の円筒状研磨治具は、前記被処理体の中心点を通過する水平基準線よりも所定値下側で、前記水平基準線に対して所定角度傾斜して前記被処理体に線的に接触するものであっても良いものである。該所定角度は、5〜40°の範囲内であることが望ましく、特に10〜20°の範囲内であることが望ましい。
【0015】
前記研磨装置部を構成する自転用ローラの少なくとも一つは、前記被処理体の中心が前記円筒状研磨治具の接触領域を通過するように前記被処理体を移動(往復運動)、又は楕円旋回運動させることが望ましい。これにより、被処理体が薄型円板であり、且つ中央に開口部を有しない場合には、全体的に均一な研磨が可能となる。
【0016】
【発明の実施の形態】
以下、この発明の実施の形態について、図面により説明する。
【0017】
本願発明の実施の形態に係る研磨洗浄複合装置1は、研磨装置部2と、洗浄装置部3とによって少なくとも構成されている。
【0018】
コンテナ4に搭載された、例えば、磁気ディスク用基板、半導体ウェハー、液晶表示用ガラス基板、フォトマスク用ガラス基板などの薄板円盤状の被処理体5は、リフト機構6のグリップ6aによってグリップされ、コンテナ4から上方に持ち上げられる。そして、キャリア7が移動して、キャリア7の一次ホルダ7aが下方位置に到達したときに、グリップ6aが下降してキャリア7の一次ホルダ7aに被処理体5が載置される。
【0019】
前記一次ホルダ7aに被処理体5が載置されると、キャリア7は、前記一次ホルダ7aが研磨機構20の下方に位置する場所まで横方向に移動し、ここから、上方に移動する。前記研磨機構20は、上方に移動してきた被処理体5を保持する。
【0020】
前記研磨機構20は、図2(a),(b)で示すように、前記被処理体5の上方位置を制限し、且つ前記被処理体5を自転させる一対の自転用ローラ21と、前記被処理体5を挟持して保持すると共に、前記被処理体5を上方へ付勢する方向に回転する一対の円筒状研磨治具22とによって少なくとも構成される。前記円筒状研磨治具22は、円筒形状をしており、その外周側面には研磨布が装着される。また、円筒状研磨治具22は、前記被処理体5の中心点を通る中心基準線Mよりも所定値Dだけ下方である線的な当接位置(S)において、前記被処理体5の両側で接触する。これにより、線的な当接位置(S)が中心基準線Mと同一である場合よりも、前記被処理体5の保持力を向上させることができると共に、被処理体5の研磨の状態をさらに良好にすることができるものである。
【0021】
以上の構成によって、前記円筒状研磨治具22が、基準線Sにおいて前記被処理体5を挟持して、前記被処理体5を上方へ付勢する方向に回転すると共に、前記自転用ローラ21が前記被処理体5を自転させることによって、前記被処理体5の両面を研磨することができるものである。尚、この研磨工程において、前記円筒状研磨治具22の側面に装着された研磨布には、所定の特性を有するスラリーが供給されるものである。
【0022】
研磨工程が終了すると、前記キャリア7が図面左方向に移動し、一次ホルダ7aが新しい被処理体5を載置すると同時に、キャリア7の二次ホルダ7bが研磨機構20から研磨された被処理体5を受け取り、キャリア7が図面右方向に移動する。そして、研磨された被処理体5は、キャリア7の二次ホルダ7bから搬送機構8のグリップ8aによって洗浄装置部3に搬送される。
【0023】
前記洗浄装置部3は、周縁上に所定の間隔で配された複数の保持機構30を有する環状搬送機構10と、該環状搬送機構10の所定に位置に設けられた少なくとも一つ(この実施の形態では、2つ)の洗浄機構40とを具備する。また、前記環状搬送機構10は、略観覧車状に構成されるもので、前記保持機構30にグリップされた被処理体5を、所定の角度(この実施の形態では、45°)毎に回動させて、洗浄機構40に搬送し、洗浄した後、乾燥させながら、搬送機構9まで、順次移動させるものである。
【0024】
前記洗浄装置部3の保持機構30は、前記被処理体5を少なくとも3点で保持する3つの保持用ローラ31によって構成される。この場合、両側に位置する保持用ローラ31を中間に位置する保持用ローラ31側に付勢するように回転力を加えることによって前記被処理体5の保持力を向上させることができる。
【0025】
前記洗浄機構40は、図3(a),(b)に示すように、前記被処理体5を挟持して自転する一対の洗浄治具41と、前記保持用ローラ31を駆動して前記被処理体5を自転させる自転機構とによって構成される。尚、この洗浄治具41による洗浄工程では、洗浄水が供給され、被処理体5に付着したスラリー等のパーティクルを除去する。尚、この実施の形態では、保持用ローラ31を積極的に駆動させる機構としたが、前記保持用ローラ31を回動自在な構造とすることにより、前記洗浄治具41の回動に伴って被処理体5が自転運動を行うことができるものである。
【0026】
そして、前記環状搬送機構10が回動して、所定の位置まで搬送された研磨され且つ洗浄された被処理体5は、搬送機構9のグリップ9aによって保持機構30から搬出され、コンテナ4に収納される。
【0027】
このように、本願発明の研磨洗浄複合装置1において、コンテナ4に収納された被処理体5を、連続して研磨し、洗浄してコンテナ4に収納することができるため、一定の品質を保持できると共に、生産性を向上させることができるものである。
【0028】
図4に示される別の実施の形態に係る研磨機構20は、一対の円筒状研磨治具22の線的な当接位置S’を前述した線的な当接位置Sに対して所定角度(α)傾斜させたことを特徴とするものである。
【0029】
これは、例えば図5で示すように、上記実施の形態では、自転用ローラ21と被処理体5との接触点及び円筒状研磨治具22と被処理体5との接触線とを結んだ場合の交点Psが、被処理体5の回転中心Rsを通過する鉛直線ML上に位置するが、この実施の形態では、自転用ローラ21と被処理体5との接触点及び円筒状研磨治具22と被処理体5との接触線とを結んだ場合の交点Ps’は、被処理体5の回転中心Rsを通過する鉛直線MLからずれた位置に存在する。また、一方の自転用ローラ21と被処理体5との接触点及び円筒状研磨治具22と被処理体5との接触線とを結んで形成される三角形が、他方の自転用ローラ21と被処理体5との接触点及び円筒状研磨治具22と被処理体5との接触線とを結んで形成される三角形と非相似形となる。
【0030】
以上の要因により、被処理体5のぶれを防止できるので、上述した第1の実施の形態よりもさらに、研磨精度の向上させることができると共に、研磨性能を安定させることができるものである。尚、前記角度αとしては、5〜40°の範囲内であることが望ましく、特に10〜20°の範囲内であることが望ましい。
【0031】
また、図6(a),(b)で示す第3の実施の形態に係る研磨機構20では、上記第1の実施の形態及び第2の実施の形態に係る研磨機構20の一部を構成する少なくとも一つ(この実施の形態では、一つ)の自転用ローラ21を、上下(図6(a))又は円弧状(図6(b))に移動させて、前記被処理体5を他方の自転用ローラ21を中心とした円弧状に移動(往復運動)させ、被処理体5の中心を線的に接触する一対の円筒状研磨治具22の研磨領域を通過させるものである。これにより、例えば、被処理体5が中央に開口部を有しないタイプのものである場合でも良好な研磨性能を維持できるものである。
【0032】
さらに、図7(a),(b)で示す第4の実施の形態に係る研磨機構20では、上記第1の実施の形態及び第2の実施の形態に係る研磨機構20の一部を構成する自転用ローラ21を楕円旋回運動させ、前記被処理体5を楕円旋回運動させ、被処理体5の中心を線的に接触する一対の円筒状研磨治具22の研磨領域を通過させるものである。これにより、上述した第3の実施の形態と同様に、被処理体5が中央に開口部を有しないタイプのものである場合でも良好な研磨性能を維持できるものである。また、前記被処理体5の中心が前記円筒状研磨治具22の研磨領域を通過する運動を行うものであれば、前記自転用ローラ21の動作については特に限定しない。
【0033】
また、前記自転用ローラ21を前記円筒状研磨治具22の回転力に抗して前記被処理体5を下方に押し下げるように下方に移動させ、瞬間的に定位置に戻すように運動させることによっても、被処理体5の中心を円筒状研磨治具22の研磨領域を通過させることができるものである。このとき、被処理体5は瞬間的に横移動するが、被処理体5のこの横移動によって被処理体5の中心付近の研磨状態を良好にすることができるものである。
【0034】
【発明の効果】
以上説明したように、この発明によれば、研磨装置部と洗浄装置部を連続して配置すると共に、研磨工程及び洗浄工程を順次連続して行うようにしたため、連続した作業が可能となり、被処理体の高品質化及び生産性を向上させることができるものである。
【0035】
また、洗浄工程において、被処理体の研磨される表裏面を保持するのではなく、被処理体の周縁を点で保持するようにしたことから、品質を向上させることができるようになるものである。
【0036】
さらに、研磨工程において、被処理体と円筒研磨治具とが点接触となり、連続した直線欠陥を防止するものである。
【図面の簡単な説明】
【図1】本願発明の実施の形態に係る研磨洗浄複合装置の概略構成図である。
【図2】第1の実施の形態に係る研磨機構の概略構成図であり、(a)はその正面概略図であり、(b)はその側面概略図である。
【図3】洗浄機構の概略構成図であり、(a)はその正面概略図であり、(b)はその断面概略図である。
【図4】第2の実施の形態に係る研磨機構の正面概略図である。
【図5】第2の実施の形態に係る研磨機構の動作状況を示した説明図である。
【図6】第3の実施の形態に係る研磨機構を示すもので、(a)は第1の実施の形態に係る研磨機構の自転用ローラを上下運動させた場合を示し、(b)は第2の実施の形態に係る研磨機構の自転用ローラを他方の自転用ローラを支点として回動させた場合を示すものである。
【図7】第4の実施の形態に係る研磨機構を示すもので、(a)は第1の実施の形態に係る研磨機構の自転用ローラを楕円旋回運動させて被処理体を楕円旋回運動させる場合を示し、(b)は第2の実施の形態に係る研磨機構の自転用ローラを楕円旋回運動させて被処理体を楕円旋回運動させる場合を示すものである。
【符号の説明】
1 研磨洗浄複合装置
2 研磨装置部
3 洗浄装置部
4 コンテナ
5 被処理体
10 環状搬送機構
20 研磨機構
21 自転用ローラ
22 円筒状研磨治具
30 保持機構
31 保持用ローラ
40 洗浄機構
41 洗浄治具
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a combined polishing and cleaning apparatus for polishing and cleaning the surface of a thin disk-shaped object to be processed such as a magnetic disk substrate, a semiconductor wafer, a liquid crystal display glass substrate, and a photomask glass substrate.
[0002]
[Prior art]
Patent Literature 1 discloses a polishing apparatus that holds a carrier having holes for holding a plurality of objects to be polished between upper and lower platens and alternately rotates in revolving and forward and reverse directions to polish both surfaces of the plurality of objects to be polished. Disclose.
[0003]
Patent Document 2 discloses that in a polishing apparatus, for example, a step of polishing a surface of a wafer is performed in a plurality of polishing steps such as a rough polishing step, a precise polishing step, and a finishing polishing step in a plurality of steps. It is an object of the present invention to sufficiently remove slurry attached to a wafer when the wafer is moved between the wafers. For this reason, in the cleaning apparatus, it is disclosed that the wafer is cleaned while being held by the holding head and cleaning while being mounted on the holding pedestal, and the holding head is also independently cleaned. ing.
[0004]
[Patent Document 1]
JP 2002-254301 A [Patent Document 2]
JP 2001-144057 A
[Problems to be solved by the invention]
At present, it is required to polish a large amount of a thin disk-shaped workpiece such as a wafer, and conventionally, as disclosed in Patent Document 1, a plurality of carriers capable of receiving a plurality of workpieces. Has a polishing surface that rotates, and is rotated and revolved between an upper surface plate and a lower surface plate to which the slurry is supplied, thereby polishing a large number of workpieces at one time. In this case, when the object to be processed is taken out after the polishing is completed, the polishing surface changes due to the slurry attached to the object to be processed. Therefore, it is necessary to take out the object as soon as possible, and there is a problem that the quality changes depending on the order of taking out. .
[0006]
Further, as disclosed in Patent Document 2, it is desirable to remove the slurry by washing for each polishing step, but there is a disadvantage that the process becomes complicated.
[0007]
Therefore, an object of the present invention is to provide a combined polishing and cleaning apparatus capable of continuously polishing and cleaning an object to be processed.
[0008]
[Means for Solving the Problems]
Therefore, the present invention provides a polishing and cleaning combined apparatus in which a polishing apparatus section for polishing a thin disk-shaped object to be processed and a cleaning apparatus section for cleaning the object to be processed polished by the polishing apparatus are arranged in series. The polishing device section includes a pair of cylindrical polishing jigs on which a polishing cloth is disposed, and is disposed above the cylindrical polishing jig to restrict an upper position of the target object and rotate the target object. At least one rotating roller to be rotated, and the pair of cylindrical polishing jigs vertically clamps and fixes the workpieces sequentially conveyed from a container in which a plurality of workpieces are accommodated. Holding means, and polishing means for rotating the object to be processed held by the holding means by the rotation roller and rotating the pair of cylindrical polishing jigs so as to pull up the object to be processed. Some to at least provided.
[0009]
Further, the present invention provides a polishing and cleaning combined apparatus in which a polishing apparatus section for polishing a thin disk-shaped object to be processed and a cleaning apparatus section for cleaning the object polished by the polishing apparatus are arranged in series. The cleaning unit includes a holding unit that holds the workpieces sequentially transferred from the polishing unit, an annular transfer unit that evenly distributes the holding units in a circumferential shape, and the transfer unit rotates. A pair of cleaning jigs for holding the object to be processed when the object held by the holding means is moved to a predetermined position, rotating the pair of cleaning jigs, and Cleaning means for rotating the body.
[0010]
Further, the present invention provides a polishing and cleaning combined apparatus in which a polishing apparatus section for polishing a thin disk-shaped object to be processed and a cleaning apparatus section for cleaning the object polished by the polishing apparatus are arranged in series. The polishing device section includes a pair of cylindrical polishing jigs on which a polishing cloth is disposed, and is disposed above the cylindrical polishing jig to restrict an upper position of the target object and rotate the target object. At least one rotating roller to be rotated, and the pair of cylindrical polishing jigs vertically clamps and fixes the workpieces sequentially conveyed from a container in which a plurality of workpieces are accommodated. Holding means and polishing means for rotating the object to be processed held by the holding means by the rotation roller and rotating the pair of cylindrical polishing jigs so as to pull up the object to be processed. And a cleaning unit, a holding unit that holds the workpieces sequentially transferred from the polishing unit, an annular transfer unit that evenly distributes the holding unit in a circumferential shape, A pair of cleaning jigs for holding the object to be processed is provided when the object to be processed held by the holding means is moved to a predetermined position when the transfer means rotates, and the pair of cleaning jigs is rotated. Cleaning means for moving the object and rotating the object to be processed.
[0011]
Schematically, in the combined polishing and cleaning apparatus, the polishing apparatus section vertically moves the objects to be conveyed sequentially from a container containing a plurality of thin disk-shaped objects by a pair of cylindrical polishing jigs. The pair of cylindrical polishing jigs are rotated so as to pull up the object to be processed and polished while being pinched and fixed in the direction and rotated by a rotation roller. Then, the object to be polished by the polishing device is held by a plurality of holding means sequentially arranged in a circle, moved to a predetermined position, and a pair of cleaning jigs for clamping the object to be processed are held. Wash with utensil.
[0012]
Further, it is preferable that the holding means of the cleaning device section includes a plurality of rotation rollers which are in contact with a peripheral edge of the object to be processed.
[0013]
Furthermore, the pair of cylindrical polishing jigs are linearly parallel to the horizontal reference line at a predetermined value lower than a horizontal reference line passing through a center point of the target object. It is desirable to contact
[0014]
Further, the pair of cylindrical polishing jigs are inclined at a predetermined angle with respect to the horizontal reference line below the horizontal reference line passing through a center point of the object to be processed, and are disposed on the object to be processed. It may be one that makes linear contact. The predetermined angle is desirably in the range of 5 to 40 °, particularly desirably in the range of 10 to 20 °.
[0015]
At least one of the rotation rollers constituting the polishing apparatus moves (reciprocates) or moves the workpiece so that the center of the workpiece passes through the contact area of the cylindrical polishing jig. It is desirable to make a turning movement. Thereby, when the object to be processed is a thin disk and has no opening in the center, uniform polishing can be performed as a whole.
[0016]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
[0017]
The combined polishing and cleaning apparatus 1 according to the embodiment of the present invention includes at least a polishing apparatus section 2 and a cleaning apparatus section 3.
[0018]
A thin disk-shaped workpiece 5 such as a magnetic disk substrate, a semiconductor wafer, a liquid crystal display glass substrate, or a photomask glass substrate mounted on the container 4 is gripped by the grip 6a of the lift mechanism 6, The container 4 is lifted upward. Then, when the carrier 7 moves and the primary holder 7a of the carrier 7 reaches the lower position, the grip 6a descends and the workpiece 5 is placed on the primary holder 7a of the carrier 7.
[0019]
When the object 5 is placed on the primary holder 7a, the carrier 7 moves laterally to a position where the primary holder 7a is located below the polishing mechanism 20, and then moves upward. The polishing mechanism 20 holds the workpiece 5 that has moved upward.
[0020]
As shown in FIGS. 2A and 2B, the polishing mechanism 20 restricts a position above the workpiece 5 and rotates a pair of rotation rollers 21 for rotating the workpiece 5; It is at least constituted by a pair of cylindrical polishing jigs 22 that hold and hold the object 5 and rotate in a direction to urge the object 5 upward. The cylindrical polishing jig 22 has a cylindrical shape, and a polishing cloth is mounted on an outer peripheral side surface thereof. In addition, the cylindrical polishing jig 22 moves the workpiece 5 at a linear contact position (S) below the center reference line M passing through the center point of the workpiece 5 by a predetermined value D. Contact on both sides. This makes it possible to improve the holding force of the target object 5 and improve the polishing state of the target object 5 as compared with the case where the linear contact position (S) is the same as the center reference line M. It can be further improved.
[0021]
With the above-described configuration, the cylindrical polishing jig 22 rotates in the direction of holding the processing target 5 at the reference line S and urging the processing target 5 upward, and rotating the rotation roller 21. By rotating the object 5, both surfaces of the object 5 can be polished. In this polishing step, a slurry having predetermined characteristics is supplied to the polishing cloth mounted on the side surface of the cylindrical polishing jig 22.
[0022]
When the polishing process is completed, the carrier 7 moves to the left in the drawing, and the primary holder 7a mounts a new workpiece 5, and at the same time, the secondary holder 7b of the carrier 7 is polished from the polishing mechanism 20 to the workpiece. 5, the carrier 7 moves rightward in the drawing. Then, the polished workpiece 5 is transported from the secondary holder 7b of the carrier 7 to the cleaning unit 3 by the grip 8a of the transport mechanism 8.
[0023]
The cleaning device unit 3 includes an annular transport mechanism 10 having a plurality of holding mechanisms 30 arranged at predetermined intervals on a peripheral edge, and at least one provided at a predetermined position of the annular transport mechanism 10 (this embodiment). In the embodiment, two) cleaning mechanisms 40 are provided. The annular transport mechanism 10 is configured in a substantially ferris wheel shape, and rotates the workpiece 5 gripped by the holding mechanism 30 every predetermined angle (45 ° in this embodiment). Then, after being moved to the cleaning mechanism 40 and washed, it is sequentially moved to the transport mechanism 9 while being dried.
[0024]
The holding mechanism 30 of the cleaning unit 3 includes three holding rollers 31 that hold the object 5 at at least three points. In this case, the holding force of the workpiece 5 can be improved by applying a rotational force so as to urge the holding rollers 31 located on both sides toward the holding roller 31 located in the middle.
[0025]
As shown in FIGS. 3A and 3B, the cleaning mechanism 40 drives a pair of cleaning jigs 41 that sandwich the workpiece 5 and rotate, and the holding roller 31 to drive the workpiece. A rotation mechanism for rotating the processing body 5 is configured. In the cleaning process using the cleaning jig 41, cleaning water is supplied to remove particles such as slurry adhered to the object 5 to be processed. In this embodiment, the mechanism for positively driving the holding roller 31 is used. However, the holding roller 31 is configured to be rotatable, so that the cleaning jig 41 rotates. The object to be processed 5 can rotate.
[0026]
The polished and washed workpiece 5 transported to a predetermined position by rotating the annular transport mechanism 10 is carried out of the holding mechanism 30 by the grip 9 a of the transport mechanism 9 and stored in the container 4. Is done.
[0027]
As described above, in the polishing and washing combined apparatus 1 of the present invention, the object 5 stored in the container 4 can be continuously polished, washed, and stored in the container 4, so that a certain quality is maintained. It is possible to improve productivity.
[0028]
A polishing mechanism 20 according to another embodiment shown in FIG. 4 is configured such that a linear contact position S ′ of a pair of cylindrical polishing jigs 22 is at a predetermined angle ( α) characterized by being inclined.
[0029]
For example, as shown in FIG. 5, in the above embodiment, the contact point between the rotation roller 21 and the object 5 and the contact line between the cylindrical polishing jig 22 and the object 5 are connected. In this case, the intersection point Ps is located on the vertical line ML passing through the rotation center Rs of the workpiece 5, but in this embodiment, the contact point between the rotation roller 21 and the workpiece 5 and the cylindrical polishing The intersection Ps ′ when the tool 22 and the contact line between the workpiece 5 are connected is located at a position shifted from the vertical line ML passing through the rotation center Rs of the workpiece 5. In addition, a triangle formed by connecting a contact point between one rotation roller 21 and the workpiece 5 and a contact line between the cylindrical polishing jig 22 and the workpiece 5 forms a triangle with the other rotation roller 21. It has a non-similar shape to a triangle formed by connecting the contact point with the workpiece 5 and the contact line between the cylindrical polishing jig 22 and the workpiece 5.
[0030]
Due to the above factors, the movement of the object 5 can be prevented, so that the polishing accuracy can be further improved and the polishing performance can be stabilized more than in the first embodiment. The angle α is preferably in the range of 5 to 40 °, and more preferably in the range of 10 to 20 °.
[0031]
The polishing mechanism 20 according to the third embodiment shown in FIGS. 6A and 6B constitutes a part of the polishing mechanism 20 according to the first and second embodiments. At least one (in this embodiment, one) rotation roller 21 is moved up and down (FIG. 6 (a)) or in an arc shape (FIG. 6 (b)) to move the object 5 to be processed. The workpiece is moved (reciprocated) in an arc with the other rotation roller 21 as a center, and passes through a polishing area of a pair of cylindrical polishing jigs 22 that linearly contact the center of the workpiece 5. Thereby, for example, even when the object 5 is a type having no opening in the center, good polishing performance can be maintained.
[0032]
Further, the polishing mechanism 20 according to the fourth embodiment shown in FIGS. 7A and 7B constitutes a part of the polishing mechanism 20 according to the first and second embodiments. The object to be processed 5 is caused to rotate in an elliptical manner by rotating the rotation roller 21 for elliptical rotation, and passes through the polishing area of a pair of cylindrical polishing jigs 22 that linearly contact the center of the object to be processed 5. is there. As a result, as in the third embodiment described above, good polishing performance can be maintained even when the processing target 5 is of a type having no opening at the center. The operation of the rotation roller 21 is not particularly limited as long as the center of the processing object 5 moves so as to pass through the polishing area of the cylindrical polishing jig 22.
[0033]
Further, the rotation roller 21 is moved downward so as to push down the workpiece 5 downward against the rotational force of the cylindrical polishing jig 22, and is moved so as to return to the home position instantaneously. This also allows the center of the workpiece 5 to pass through the polishing area of the cylindrical polishing jig 22. At this time, the workpiece 5 moves instantaneously in the lateral direction, and the lateral movement of the workpiece 5 can improve the polishing state near the center of the workpiece 5.
[0034]
【The invention's effect】
As described above, according to the present invention, the polishing device and the cleaning device are arranged continuously, and the polishing process and the cleaning process are sequentially performed sequentially. It is possible to improve the quality and productivity of the treated body.
[0035]
Further, in the cleaning step, instead of holding the front and back surfaces of the object to be polished, instead of holding the peripheral edge of the object at points, the quality can be improved. is there.
[0036]
Further, in the polishing step, the object to be processed and the cylindrical polishing jig come into point contact with each other, thereby preventing continuous linear defects.
[Brief description of the drawings]
FIG. 1 is a schematic configuration diagram of a combined polishing and cleaning apparatus according to an embodiment of the present invention.
FIG. 2 is a schematic configuration diagram of a polishing mechanism according to a first embodiment, (a) is a schematic front view thereof, and (b) is a schematic side view thereof.
FIG. 3 is a schematic configuration diagram of a cleaning mechanism, (a) is a schematic front view thereof, and (b) is a schematic cross-sectional view thereof.
FIG. 4 is a schematic front view of a polishing mechanism according to a second embodiment.
FIG. 5 is an explanatory diagram showing an operation state of a polishing mechanism according to a second embodiment.
6A and 6B show a polishing mechanism according to a third embodiment, in which FIG. 6A shows a case in which a rotation roller of the polishing mechanism according to the first embodiment is moved up and down, and FIG. This shows a case where the rotation roller of the polishing mechanism according to the second embodiment is rotated around the other rotation roller as a fulcrum.
7A and 7B show a polishing mechanism according to a fourth embodiment, and FIG. 7A shows an elliptical turning motion of a rotation roller of the polishing mechanism according to the first embodiment to move an object to be processed in an elliptical turning motion. (B) shows a case in which the rotation roller of the polishing mechanism according to the second embodiment is caused to perform an elliptical turning motion to cause an object to be processed to perform an elliptical turning motion.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Polishing / cleaning combined apparatus 2 Polishing unit 3 Cleaning unit 4 Container 5 Object to be processed 10 Annular transport mechanism 20 Polishing mechanism 21 Roller for rotation 22 Cylindrical polishing jig 30 Holding mechanism 31 Holding roller 40 Cleaning mechanism 41 Cleaning jig

Claims (9)

薄板円盤状の被処理体の研磨を行う研磨装置部と、該研磨装置で研磨された被処理体を洗浄する洗浄装置部とを一連に配した研磨洗浄複合装置において、
前記研磨装置部は、研磨布が配された一対の円筒状研磨治具と、該円筒状研磨治具の上方に配され、前記被処理体の上方位置を制限すると共に前記被処理体を自転させる少なくとも一つの自転用ローラとによって少なくとも構成されると共に、前記一対の円筒状研磨治具によって、複数の被処理体が収容されたコンテナから順次搬送される被処理体を鉛直方向に挟持固定する保持手段と、該保持手段によって保持された被処理体を前記自転用ローラによって自転させると共に、前記一対の円筒状研磨治具を前記被処理体を引上げるように回転運動させる研磨手段とを少なくとも具備することを特徴とする研磨洗浄複合装置。
In a polishing and cleaning combined apparatus in which a polishing apparatus section for polishing a thin disk-shaped object to be processed and a cleaning apparatus section for cleaning the object to be polished by the polishing apparatus are arranged in series,
The polishing device section includes a pair of cylindrical polishing jigs on which a polishing cloth is disposed, and is disposed above the cylindrical polishing jig to restrict an upper position of the target object and rotate the target object. At least one rotating roller to be rotated, and the pair of cylindrical polishing jigs vertically clamps and fixes the workpieces sequentially conveyed from a container in which a plurality of workpieces are accommodated. Holding means, and at least polishing means for rotating the object to be processed held by the holding means by the rotation roller and rotating the pair of cylindrical polishing jigs so as to pull up the object to be processed. A combined polishing and cleaning apparatus, comprising:
薄板円盤状の被処理体の研磨を行う研磨装置部と、該研磨装置で研磨された被処理体を洗浄する洗浄装置部とを一連に配した研磨洗浄複合装置において、
前記洗浄装置部は、前記研磨装置部から順次搬送される被処理体を保持する保持手段と、円周状に前記保持手段を均等に配する環状の搬送手段と、該搬送手段が回動し、前記保持手段によって保持された被処理体が所定の位置に移動した時に、前記被処理体を挟持する一対の洗浄治具を具備し、該一対の洗浄治具を回動させると共に前記被処理体を自転させる洗浄手段とを具備することを特徴とする研磨洗浄複合装置。
In a polishing and cleaning combined apparatus in which a polishing apparatus section for polishing a thin disk-shaped object to be processed and a cleaning apparatus section for cleaning the object to be polished by the polishing apparatus are arranged in series,
The cleaning unit includes a holding unit that holds the workpieces sequentially transferred from the polishing unit, an annular transfer unit that evenly distributes the holding units in a circumferential shape, and the transfer unit rotates. A pair of cleaning jigs for holding the object to be processed when the object held by the holding means is moved to a predetermined position, rotating the pair of cleaning jigs, and A polishing and washing combined apparatus comprising: a washing means for rotating a body.
薄板円盤状の被処理体の研磨を行う研磨装置部と、該研磨装置で研磨された被処理体を洗浄する洗浄装置部とを一連に配した研磨洗浄複合装置において、
前記研磨装置部は、研磨布が配された一対の円筒状研磨治具と、該円筒状研磨治具の上方に配され、前記被処理体の上方位置を制限すると共に前記被処理体を自転させる少なくとも一つの自転用ローラとによって少なくとも構成されると共に、前記一対の円筒状研磨治具によって、複数の被処理体が収容されたコンテナから順次搬送される被処理体を鉛直方向に挟持固定する保持手段と、該保持手段によって保持された被処理体を前記自転用ローラによって自転させると共に、前記一対の円筒状研磨治具を前記被処理体を引上げるように回転運動させる研磨手段とを少なくとも具備すると共に、
前記洗浄装置部は、前記研磨装置部から順次搬送される被処理体を保持する保持手段と、円周状に前記保持手段を均等に配する環状の搬送手段と、該搬送手段が回動し、前記保持手段によって保持された被処理体が所定の位置に移動した時に、前記被処理体を挟持する一対の洗浄治具を具備し、該一対の洗浄治具を回動させると共に前記被処理体を自転させる洗浄手段とを具備することを特徴とする研磨洗浄複合装置。
In a polishing and cleaning combined apparatus in which a polishing apparatus section for polishing a thin disk-shaped object to be processed and a cleaning apparatus section for cleaning the object to be polished by the polishing apparatus are arranged in series,
The polishing device section includes a pair of cylindrical polishing jigs on which a polishing cloth is disposed, and is disposed above the cylindrical polishing jig to restrict an upper position of the target object and rotate the target object. At least one rotating roller to be rotated, and the pair of cylindrical polishing jigs vertically clamps and fixes the workpieces sequentially conveyed from a container in which a plurality of workpieces are accommodated. Holding means, and at least polishing means for rotating the object to be processed held by the holding means by the rotation roller and rotating the pair of cylindrical polishing jigs so as to pull up the object to be processed. Have it,
The cleaning unit includes a holding unit that holds the workpieces sequentially transferred from the polishing unit, an annular transfer unit that evenly distributes the holding units in a circumferential shape, and the transfer unit rotates. A pair of cleaning jigs for holding the object to be processed when the object held by the holding means is moved to a predetermined position, rotating the pair of cleaning jigs, and A polishing and washing combined apparatus comprising: a washing means for rotating a body.
前記洗浄装置部の保持手段は、前記被処理体の周縁に接する複数の自転用ローラからなることを特徴とする請求項2又は3記載の研磨洗浄複合装置。The polishing / cleaning combined apparatus according to claim 2 or 3, wherein the holding means of the cleaning unit comprises a plurality of rotation rollers in contact with a peripheral edge of the object to be processed. 前記一対の円筒状研磨治具は、前記被処理体の中心点を通過する水平基準線よりも所定値下側で、前記水平基準線に対して平行に前記被処理体に線的に接触することを特徴とする請求項1又は3記載の研磨洗浄複合装置。The pair of cylindrical polishing jigs linearly contact the workpiece parallel to the horizontal reference line at a predetermined value lower than a horizontal reference line passing through a center point of the workpiece. The combined polishing and cleaning apparatus according to claim 1 or 3, wherein: 前記一対の円筒状研磨治具は、前記被処理体の中心点を通過する水平基準線よりも所定値下側で、前記水平基準線に対して所定角度傾斜して前記被処理体に線的に接触することを特徴とする請求項1又は3記載の研磨洗浄複合装置。The pair of cylindrical polishing jigs are inclined by a predetermined angle with respect to the horizontal reference line at a predetermined value lower than a horizontal reference line passing through a center point of the processing object, and are linearly aligned with the processing object. The polishing and washing combined apparatus according to claim 1 or 3, wherein the combined apparatus is in contact with. 前記研磨装置部を構成する自転用ローラの少なくとも一つは、前記被処理体の中心が前記円筒状研磨治具の接触領域を通過するように前記被処理体を移動させることを特徴とする請求項1又は3〜7のいずれか一つに記載の研磨洗浄複合装置。At least one of the rotation rollers constituting the polishing device moves the workpiece so that the center of the workpiece passes through a contact area of the cylindrical polishing jig. Item 7. The combined polishing and cleaning apparatus according to any one of Items 1 to 3 to 7. 前記研磨装置部を構成する自転用ローラの少なくとも一つは、前記被処理体の中心が前記円筒状研磨治具の接触領域を横切るように前記被処理体を移動させることを特徴とする請求項1又は3〜7のいずれか一つに記載の研磨洗浄複合装置。At least one of the rotation rollers constituting the polishing device moves the workpiece so that a center of the workpiece crosses a contact area of the cylindrical polishing jig. The combined polishing and cleaning apparatus according to any one of 1 to 3 to 7. 前記研磨装置部を構成する自転用ローラは、前記被処理体の中心が前記円筒状研磨治具の接触領域を横切るように楕円旋回運動を行うことを特徴とする請求項1又は3〜7のいずれか一つに記載の研磨洗浄複合装置。The rotation roller constituting the polishing device portion performs an elliptical turning motion such that a center of the object to be processed crosses a contact region of the cylindrical polishing jig. The polishing and washing combined apparatus according to any one of the above.
JP2002345348A 2002-11-28 2002-11-28 Polishing and cleaning combined device Expired - Fee Related JP3796717B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2002345348A JP3796717B2 (en) 2002-11-28 2002-11-28 Polishing and cleaning combined device
US10/646,778 US6916233B2 (en) 2002-11-28 2003-08-25 Polishing and cleaning compound device

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011181644A (en) * 2010-03-01 2011-09-15 Ebara Corp Method and apparatus for cleaning substrate
CN114192460A (en) * 2021-12-06 2022-03-18 深圳市琦轩实创科技有限公司 Automatic cleaning device and cleaning method for electric soldering iron

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011181644A (en) * 2010-03-01 2011-09-15 Ebara Corp Method and apparatus for cleaning substrate
US9089881B2 (en) 2010-03-01 2015-07-28 Ebara Corporation Method and apparatus for cleaning substrate
CN114192460A (en) * 2021-12-06 2022-03-18 深圳市琦轩实创科技有限公司 Automatic cleaning device and cleaning method for electric soldering iron

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