JP3671904B2 - Scanning method - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
This invention relates to a scanning method, and more particularly to development processing scan be absent scanning method negative film without passing through the after bleaching and fixing steps through the development process to.
[0002]
[Prior art]
A conventional scanner device includes a light source that irradiates light on a negative film. The light irradiated and transmitted to the negative film is received by the CCD sensor, and the received light is converted into a pixel signal which is an electrical signal. The pixel signal is subjected to a predetermined conversion process to obtain image data.
If the negative film has an abnormal part that disturbs the optical path from the light source to the CCD sensor, such as a scratch, dust, fingerprint, etc., an abnormal image such as white spots (hereinafter referred to as “scratch image”) corresponding to the abnormal part. Appears in the scanned image obtained by scanning.
[0003]
Digital ice (registered trademark of Applied Science Fiction) is known as a technique for detecting an abnormal part present in a negative film. In this technique, the negative film is irradiated with infrared rays. Infrared rays applied to portions other than the abnormal portion of the negative film are transmitted through the negative film and received by the detecting means such as a CCD sensor, but the infrared rays irradiated to the abnormal portion are irregularly reflected and are not received by the detecting portion. As described above, this technique detects an abnormal site by receiving infrared light transmitted through a negative film.
[0004]
Japanese Patent Application Laid-Open No. 11-215319 proposes a technique for detecting an abnormal part present in a negative film.
Referring to FIG. 7, a scanner device 1 used in this technique includes a light source 2. The light source 2 emits diffused light to the negative film 3. A CCD sensor 4 is disposed on the opposite side of the light source 2 with respect to the negative film 3, and a projection lens 5 is disposed between the negative film 3 and the CCD sensor 4. The light source 2 is disposed at a position where it cannot be directly viewed from the CCD sensor 4. Therefore, the light transmitted through the negative film 3 other than the abnormal part does not reach the CCD sensor 4 directly. When there is an abnormal part in the negative film 3, the optical path of the light emitted from the light source 2 is disturbed when passing through the abnormal part, and the light with the disturbed optical path passes through the projection lens 5 and the CCD sensor 4. Is received. Thereby, the abnormal part of the negative film 3 is detected. As described above, in Japanese Patent Application Laid-Open No. 11-215319, an abnormal part is detected by light transmitted through the negative film 3.
[0005]
[Problems to be solved by the invention]
Recently, a method of performing rapid development processing (hereinafter referred to as “rapid development processing”) has been proposed in contrast to conventional general development processing. In general development processing, the photosensitive silver halide is converted to metallic silver and a color developing process for producing a dye from a color coupler, the bleaching process for converting the metallic silver back to silver halide, and the fixing process for washing away the silver halide from the negative film. The development process is performed through all of a stabilizing process for cleaning the chemicals adhering to the negative film to suppress a change with time, and a drying process for drying the negative film. Here, both the bleaching step and the fixing step are performed for desilvering. In contrast, in the rapid development processing, after the color development step, the development processing is performed without passing through at least one of the bleaching step and the fixing step. For this reason, a negative film that has been subjected to rapid development processing has a high concentration because it has not been desilvered.
[0006]
In such a negatively developed negative film, silver remains even after being developed. Therefore, even if irradiated with infrared rays, the infrared rays that are reflected by the silver remaining in the negative film cannot be transmitted and reach the detection means. There is. Therefore, since it is impossible to identify whether infrared rays do not reach the detection means because of irregular reflection at the abnormal part or whether it does not reach because it is reflected by silver, it is impossible to detect the position of the abnormal part of the negative film where silver remains in digital ice. Can not.
[0007]
The technique disclosed in Japanese Patent Application Laid-Open No. 11-215319 is based on the premise that a negative film that has undergone general development processing is scanned, and detects abnormal sites using the transmitted light of the negative film as described above. It is. However, since the negative film in which silver remains has a high density, very strong light is required to detect such an abnormal part of the negative film, and this technique using diffused light is insufficient in light quantity. Therefore, it is difficult to detect an abnormal portion of a negative film in which silver remains with the technique of JP-A-11-215319.
Therefore a primary object of the present invention is to provide a Luz scanning method can detect abnormalities in the film containing silver.
[0008]
[Means for Solving the Problems]
[0010]
In order to solve the above-mentioned problem, the scanning method according to claim 1 is a method for scanning a film containing silver that has been developed and not subjected to at least one of a bleaching step and a fixing step. A method for irradiating a film with light, and detecting an abnormal site by receiving reflected light from the light irradiated on the film and utilizing the disturbance of the light caused by the abnormal site present in the film. A detection step is provided.
The scanning method according to claim 2 is characterized in that, in the scanning method according to claim 1 , in the detecting step, the abnormal portion is detected by receiving light reflected by a portion other than the abnormal portion of the film. And
[0011]
In the scanning method according to claim 3 , in the scanning method according to claim 1 , in the detection step, an abnormal site is detected by receiving light that is irradiated perpendicularly to the film and reflected perpendicularly to the film. It is characterized by detecting.
[0012]
In a film containing silver, the irradiated light includes light that is reflected by silver, and light is difficult to transmit. However, the scanning method according to claim 1 reverses the characteristic that silver reflects light. Since the abnormal portion is detected by receiving the light reflected by the film, it is not necessary to irradiate the film with a particularly large amount of light even in the case of a film containing silver. Further, by utilizing the disturbance of the optical path due to the abnormal part, the abnormal part and the silver part can be easily identified, and the abnormal part can be easily detected. If an abnormal part can be detected, for example, by increasing the density of the part of the wound image corresponding to the abnormal part by digital image processing, a scan image in which the wound image is not noticeable can be obtained.
[0013]
A film that has been developed and then rapidly developed without passing through at least one of a bleaching step and a fixing step is not desilvered and thus has a high density and is difficult to transmit light. In the scanning method according to claim 1, since the reflected light is used instead of the transmitted light and the abnormal part and the silver part can be distinguished, it is not particularly necessary to irradiate the film with a large amount of light, and the abnormal part is easily detected. can do.
In scanning method according to claim 2, the light emitted to the part other than the abnormal region is reflected by the film while being received light, irradiates the abnormal region since the optical path of light irradiated to the abnormal site is disturbed light is not received light. Therefore, the position of the abnormal part can be detected by detecting the part where no light is received as the abnormal part.
[0014]
In the scanning method according to the third aspect , since the light is irradiated perpendicularly to the film and the light reflected vertically is received, an ideal film image without distortion can be detected. Therefore, the position of the abnormal part can be detected without requiring work such as correcting the distortion.
[0015]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of the present invention will be described below with reference to the drawings.
A scanner device 10 according to an embodiment of the present invention is used to detect an abnormal portion present in a negative film 12 that has been rapidly developed as shown in FIG.
[0016]
Specifically, when the negative film 12 is drawn out from the cartridge 14, it is dipped in the developer 18 in the color developing tank 16 and subjected to color development processing (color development step), and then dried by the drying device 20 (drying step). ) And conveyed to the scanner device 10. In addition, the negative film 12 is cut | disconnected by the cutter 22 as needed.
Since the negative film 12 contains silver without being desilvered without the bleaching step and the fixing step, the negative film 12 has a high concentration but is difficult to transmit light though it is rapidly developed.
As described above, the scanner device 10 is configured as follows so that an abnormal site can be easily detected even with the negative film 12 having a high density and hardly transmitting light.
[0017]
Referring to FIG. 2, scanner device 10 includes a CCD sensor 24 serving as detection means. The CCD sensor 24 is disposed facing the negative film 12 so as to receive the light reflected by the negative film 12. In addition, two lamps 26 serving as light sources are arranged at an equal distance from the negative film 12 and in the vicinity of the top and bottom of the CCD sensor 24. Thereby, the lamp 26 irradiates the predetermined range of the negative film 12 with uniform light. A projection lens 28 is disposed between the CCD sensor 24 and the negative film 12.
[0018]
When the light emitted from the lamp 26 is applied to the negative film 12, a part of the light is transmitted through the negative film 12, but since silver remains in the negative film 12, much of the light is transmitted to the negative film 12. Reflected by.
[0019]
Referring also to FIG. 3, abnormal surface 30 that disturbs the optical path from lamp 26 to CCD sensor 24, such as scratches, dust, and fingerprints, exists on the surface (hereinafter referred to as “film surface”) 12 a of negative film 12. There is a case. Lights 32 a and 32 c irradiated on portions of the film surface 12 a other than the abnormal part 30 are reflected at a reflection angle equal to the incident angle on the film surface 12 a and are received by the CCD sensor 24 through the projection lens 28. On the other hand, the light 32 b irradiated to the abnormal part 30 is irregularly reflected by the abnormal part 30, that is, the optical path is disturbed by the abnormal part 30 and does not reach the CCD sensor 24. As described above, in the CCD sensor 24, only the light 32a and 32c irradiated on the film surface 12a other than the abnormal portion 30 are received, and the light 32b irradiated on the abnormal portion 30 is not received. The scanner device 10 can detect the position of the abnormal part 30 present on the film surface 12 a by detecting the part that has not received light as the abnormal part 30.
[0020]
If the position of the abnormal part 30 existing on the film surface 12a can be detected, scan data that makes the scratched image inconspicuous can be created by increasing the density of the part of the wound image corresponding to the abnormal part 30 by digital image processing. .
Here, the film surface 12a means any main surface of the negative film 12, and does not mean only a specific main surface on the emulsion side or the base material side of the negative film 12.
[0021]
According to the scanner device 10, by utilizing the characteristic that silver reflects light, the light reflected by the negative film 12, such as the light 32a and 32c, is received instead of the light transmitted through the negative film surface 12. Since the abnormal portion 30 is detected, it is not necessary to irradiate the film with a large amount of light even when detecting the position of the abnormal portion 30 of the negative film 12 containing silver. Further, by utilizing the disturbance of the optical path caused by the abnormal portion 30, the abnormal portion 30 and the silver portion can be easily identified, and the position of the abnormal portion 30 can be easily detected.
[0022]
In addition, a light source that emits a large amount of light often emits heat together with the light, but since there is no need to use such a light source, there is no fear that the negative film 12 will be damaged by heat.
Furthermore, since the abnormal part 30 can be detected by irradiating light almost perpendicular to the negative film 12 with little projection relationship, the CCD sensor 24 can detect an image of the film surface 12a with almost no distortion. No processing such as distortion correction is required.
[0023]
Note that, for example, by disposing the two lamps 26 away from the CCD sensor 24 and covering the negative film 12, only the light irradiated to the abnormal portion 30 is CCD-reversed as in the case of the above-described embodiment. The light received by the sensor 24 and irradiated to the part other than the abnormal part 30 can be prevented from reaching the CCD sensor 24. Also by this, the position of the abnormal part 30 of the negative film 12 is detectable like the above-mentioned case.
Further, three or more lamps 26 may be provided around the CCD sensor 24 and arranged equally.
[0024]
Next, a scanner device 40 according to another embodiment will be described with reference to FIG. The scanner device 40 includes one lamp 42 serving as a light source. The lamp 42 is arranged so as to cover the negative film 12, that is, to irradiate the negative film 12 with light in an oblique direction. A CCD sensor 44 serving as detection means is disposed on the optical path of light emitted from the lamp 42 so as to cover the negative film 12 and reflected at the reflection angle equal to the incident angle on the negative film 12. A projection lens 46 is disposed on the optical path between the negative film 12 and the CCD sensor 44.
[0025]
As in the case of the scanner device 10, the CCD sensor 44 receives only the light irradiated on the film surface 12 a other than the abnormal part 30, and does not receive the light irradiated on the abnormal part 30. The scanner device 40 can detect the position of the abnormal part 30 present in the negative film 12 by detecting the part that has not received light as the abnormal part 30.
[0026]
According to the scanner device 40, the position of the abnormal part 30 can be easily detected even with the negative film 12 in which silver remains. Also, a single light source is sufficient and the configuration is simple.
[0027]
In the scanner device 40 as well, by adjusting the positions of the lamp 42, the CCD sensor 44, etc., only the light irradiated to the abnormal part 30 is received by the CCD sensor 44, and the part other than the abnormal part 30 is irradiated. The light may not reach the CCD sensor 44. Also by this, the position of the abnormal part 30 of the negative film 12 is detectable like the above-mentioned case.
[0028]
With reference to FIG. 5, the scanner apparatus 50 of other embodiment is demonstrated.
The scanner device 50 includes a CCD sensor 52 serving as detection means. The CCD sensor 52 is disposed so as to face the film surface 12 a of the negative film 12. A polarizing beam splitter 54 (hereinafter referred to as “PBS”) is disposed between the negative film 12 and the CCD sensor 52. The PBS 54 has a polarization separation film 54a. The rotation axis of the polarization separation film 54a is disposed in a direction perpendicular to the paper surface of FIG. 5, and the polarization separation film 54a is set to rise 45 degrees to the left in the horizontal direction.
[0029]
A lamp 56 serving as a light source is disposed above the PBS 54, and the lamp 56 emits red light toward the PBS 54.
A (¼) λ plate 58 is disposed between the PBS 54 and the negative film 12 and in the vicinity of the PBS 54. Further, a mirror 60 is disposed in parallel to the negative film 12 on the opposite side of the PBS 54 from the negative film 12 and in the vicinity of the negative film 12. Further, a projection lens 62 is disposed between the PBS 54 and the CCD sensor 52.
[0030]
The red non-polarized light emitted from the lamp 56 and incident on the PBS 54 is separated into two polarization components whose polarization directions are orthogonal to each other, that is, a P-polarized wave and an S-polarized wave when irradiated to the polarization separation film 54a of the PBS 54. . Specifically, for example, the P-polarized wave is transmitted through the polarization separation film 54a, and only the S-polarized wave is reflected by the polarization separation film 54a. The S-polarized wave reflected by the polarization separation film 54a passes through the (1/4) λ plate 58 and irradiates the negative film 12 perpendicularly.
[0031]
As described above, since silver remains in the negative film 12, a part of the light irradiated to the negative film 12 is reflected vertically by the silver in the negative film 12, and again (1/4) λ The light passes through the plate 58 and enters the PBS 54. At this time, the light incident on the PBS 54 is converted into a P-polarized wave whose phase is shifted by (1/2) λ and the plane of polarization is rotated by passing twice through the (¼) λ plate 58. And can pass through the polarization separation film 54a. The light transmitted through the polarization separation film 54 a is projected onto the CCD sensor 52 by the projection lens 62.
[0032]
Of the light irradiated to the negative film 12, the light transmitted through the negative film 12 is reflected vertically by the mirror 60, passes through the negative film 12 again (1/4), passes through the λ plate 58, and reaches the PBS 54. Incident. At this time, the light incident on the PBS 54 is converted into a P-polarized wave whose phase is shifted by (1/2) λ and the plane of polarization is rotated by passing twice through the (¼) λ plate 58. And can pass through the polarization separation film 54a. The light transmitted through the polarization separation film 54 a is projected onto the CCD sensor 52 by the projection lens 62.
[0033]
However, since the abnormal part 30 may exist in the negative film 12, all the light irradiated to the negative film 12 does not follow the optical path as described above. Of the light irradiated to the negative film 12, the light irradiated to the abnormal part 30 is disturbed by the abnormal part 30 and is not received by the CCD sensor 52. Therefore, the scanner device 50 can detect the position of the abnormal part 30 present in the negative film 12 by detecting the part that has not received light as the abnormal part 30.
[0034]
According to the scanner device 50, the irradiated light is not received by the CCD sensor 52 for the abnormal part 30, whereas not only the light reflected by the negative film 12 but also the negative part for parts other than the abnormal part 30. Even the light transmitted through the film 12 is received by the CCD sensor 52. Therefore, even in the negative film 12 in which silver remains, a scratch image corresponding to the abnormal part 30 is detected with high contrast, and the position of the abnormal part 30 can be detected with high accuracy.
[0035]
In addition, since the lamp 56 that emits red light is used as the light source, even in the negative film 12 in which silver remains, the CCD sensor 52 easily transmits light in a portion where there is no silver compared to light of other wavelengths. Therefore, a flaw image corresponding to the abnormal part 30 is detected with higher contrast, and the position of the abnormal part 30 can be detected with high accuracy.
[0036]
Furthermore, since light is irradiated vertically to the negative film 12 and the light reflected vertically is received, an ideal image of the negative film 12 without distortion can be detected. Therefore, the position of the abnormal part 30 can be detected without requiring work such as correcting distortion.
[0037]
Referring to FIG. 6, scanner devices 10, 40 and 50 are subjected to color development processing (color development step), and are then immersed in bleaching solution 66 in bleaching tank 64 and subjected to bleaching processing (bleaching step). Furthermore, it can also be used to detect an abnormal region 30 present in the negative film 12 that has been rapidly developed by being dried by the drying device 20 (drying step).
In FIG. 6, when the fixing process is performed instead of the bleaching process, the silver is not desilvered because the metallic silver is not returned to the silver halide, and the density of the negative film 12 is increased. The scanner devices 10, 40, and 50 can also be applied to detect the abnormal part 30 existing in the film 12.
[0038]
Further, in the rapid development processing, the means for applying the developer 18, the bleaching solution 66, or the fixing solution to the negative film 12 is not limited to those immersed in the color developing tank 16, the bleaching tank 64, etc. May be applied with a brush or roller, sprayed with a spray, or soaked into a cloth or the like.
The scanner devices 10, 40, and 50 are also effective when used to detect not only the negatively processed negative film 12 but also the abnormal portion 30 present in the black and white negative film.
[0039]
Furthermore, in the scanner device 10, it is preferable to provide a plurality of lamps 26 as light sources as described above, but it does not deny that only one is provided. Moreover, although it is preferable to irradiate light uniformly to the negative film 12, it is not limited to this.
Further, as described above, it is preferable to use the lamp 56 that emits red light as the light source of the scanner device 50. However, the present invention is not limited to this, and a light source that emits light of other wavelengths may be used.
[0040]
【The invention's effect】
According to the present invention, even in the case of a film containing silver, it is not necessary to irradiate the film with a large amount of light, and an abnormal site can be easily detected.
[Brief description of the drawings]
FIG. 1 is an illustrative view showing one example of rapid development processing of a negative film.
FIG. 2 is an illustrative view showing one embodiment of the present invention.
FIG. 3 is an illustrative view showing a state in which an optical path of light irradiated to an abnormal site is disturbed.
FIG. 4 is an illustrative view showing another embodiment.
FIG. 5 is an illustrative view showing another embodiment.
FIG. 6 is an illustrative view showing another example of rapid development processing of a negative film.
FIG. 7 is an illustrative view showing a conventional scanner device.
[Explanation of symbols]
10, 40, 50 Scanner device 12 Negative film 12a Film surface 16 Color developing tank 18 Developers 24, 44, 52 CCD sensors 26, 42, 56 Light source 30 Abnormal part 32 Light 54 Polarizing beam splitter (PBS)
54a Polarization separation film 58 (1/4) λ plate 64 bleaching tank 66 bleaching solution

Claims (3)

A method for scanning a film containing silver that has been developed and not subjected to at least one of a bleaching step and a fixing step after the development step,
An irradiation step of irradiating the film with light, and detection of detecting the abnormal site by receiving the reflected light of the light irradiated on the film and utilizing the disturbance of the light due to the abnormal site existing on the film A scanning method comprising a process. The scanning method according to claim 1 , wherein in the detecting step, the abnormal part is detected by receiving light reflected by a portion of the film other than the abnormal part. The scanning method according to claim 1 , wherein in the detecting step, the abnormal portion is detected by receiving light that is irradiated perpendicularly to the film and reflected perpendicularly to the film.

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