JP3603299B2 - Test system - Google Patents

Description

[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a test system for testing an object to be tested, for example, an IC, an LSI, and the like, and relates to a test system that can operate efficiently.
[0002]
[Prior art]
An object to be tested, for example, an IC or an LSI is set in the tester by the handler or the prober. Then, the tester gives a test pattern to the test object, compares the output of the test object with an expected value, and determines pass / fail. The handler, the prober, and the tester constitute one line, and the schedule is managed and operated for each line.
[0003]
Before testing the device under test, setup time is required for setting probers and handlers, loading tester programs, and installing performance boards. The setup time varies depending on each device and a person in charge of operating the device.
[0004]
The test time for testing the device under test also depends on the size of the program, the type of device under test, and the performance of each device. Further, even during the test, the time may exceed the scheduled time due to a transport error of the test object such as a tape jam or an unexpected trouble.
[0005]
Therefore, schedule management was left to each line person in charge. However, due to poor coordination between the lines, the schedules varied among the lines, and the test system could not be operated efficiently. Therefore, an apparatus for automatically scheduling each line is described in Japanese Patent Application Laid-Open No. H10-123216.
[0006]
[Problems to be solved by the invention]
However, even if the scheduling of each line is automated, the load on the test system has not been considered. For this reason, when the test amount of the test object increases and exceeds the capability limit of the test system, there is a problem that a delivery date is delayed.
[0007]
In addition, the tester requires regular maintenance of the operation time, but the scheduling does not consider maintenance. For this reason, there is a problem that the maintenance time is extended, and a failure or failure of consumables or the like causes a failure of the tester and hinders efficient operation.
[0008]
In the scheduling, it is difficult to consider a test time caused by a test program or the like. For this reason, there is a problem that it is difficult to know that the tester is not operating efficiently.
[0009]
Therefore, an object of the present invention is to realize a test system that can operate efficiently.
[0010]
[Means for Solving the Problems]
The present invention
In a test system that tests the object under test,
A tester that performs the test of the test target, and outputs operation total information of the total number of tests and the number of failures,
A test start signal, and an operation time measuring means for measuring an operation time of the tester based on a test end signal or an abnormal signal ,
Collection means for collecting operation result information of the tester;
Load predicting means for predicting the load rate of the tester based on the operation result information of the collecting means, the operating time of the operating time measuring means, and the delivery schedule of the test object. Things.
[0013]
further,
In a test system that tests the object under test,
A tester that performs the test of the test target, and outputs operation total information of the total number of tests and the number of failures,
A test start signal, and an operation time measuring means for measuring an operation time of the tester based on a test end signal or an abnormal signal ,
Collection means for collecting operation result information of the tester;
Based on the operation result information of the collecting means and the operation time of the operation time measuring means, the device cost is calculated as ( cost of test object) + (operating time of tester) × (running cost per unit time of tester) / ((Total number of tests) − (number of failures)) and a cost calculation means for displaying the calculated cost.
[0014]
BEST MODE FOR CARRYING OUT THE INVENTION
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 is a configuration diagram showing one embodiment of the present invention.
[0015]
In the figure, lines L1 to L3 are provided with testers T1 to T3 and handlers H1 to H3, respectively. The lines L1 to L3 may be probers instead of the handlers H1 to H3. The testers T1 to T3 test the object under test and output operation time information, a test start signal, a test end signal, and an abnormal signal. The handlers H1 to H3 attach test objects one after another to the testers T1 to T3, respectively. The test management system TC is connected to each of the lines L1 to L3 via a network, and manages the testers T1 to T3 and the handlers H1 to H3.
[0016]
The test management system TC includes a control unit 1, an operation unit 2, and a CRT (display unit) 3. The control unit 1 is connected to the operation unit 2 and the CRT 3 and includes a schedule unit 11, a schedule execution unit 12, an operation time measurement unit 13, an alarm unit 14, and an analysis unit 15.
[0017]
The schedule means 11 performs a test on each line L1 to L3 (each tester) based on the type of test object, name, number, delivery date, priority, scheduled test start time, setup time, designated tester, and failure information of each line L1 to L3. A schedule of T1 to T3) is created and displayed on the CRT3. The schedule executing means 12 loads a test program to each of the testers T1 to T3 according to the schedule of the schedule means 11.
[0018]
The operating time measuring means 13 measures the operating time of the testers T1 to T3 based on the test start signals of the testers T1 to T3 and the test end signals or abnormal signals from the testers T1 to T3.
[0019]
The alarm unit 14 displays a maintenance alarm on the CRT 3 based on the operation time from the operation time measurement unit 13.
[0020]
The analysis unit 15 inputs the schedule of the schedule unit 11 and the operation time of each line L1 to L3 of the operation time measurement unit 13 and performs analysis. The analysis unit 15 includes a collection unit 151, a load prediction unit 152, and a cost calculation unit 153. The collecting unit 151 collects operation result information of each of the testers T1 to T3. The load prediction unit 152 performs load prediction based on the operation time of the operation time measurement unit 13, the operation result information of the collection unit 151, and the schedule of the schedule unit 11, and displays a graph on the CRT 3. The cost calculation unit 153 calculates the device cost (the cost of the device under test) based on the operation result information of the collection unit 151 and the operation time of the operation time measurement unit 13 and displays the device cost on the CRT 3.
[0021]
The operation of such a device is described below.
The schedule means 11 is based on the type, name, number, delivery date, priority, scheduled test start time, setup time, designated tester, etc. of the object to be tested, which is input by the operator through the operation unit 2, and the failure information of each line L1 to L3. A schedule is created and displayed on CRT3. According to this schedule, the schedule execution means 12 loads a test program (including a test pattern) to each of the testers T1 to T3.
[0022]
As described above, since the schedule execution unit 12 loads the test program to each of the testers T1 to T3 according to the schedule of the schedule unit 11, no operator intervenes in loading the test program. That is, there is no mistake and the test system can be operated efficiently.
[0023]
Then, the operator performs setup such as mounting of a performance board, and starts operation of each of the lines L1 to L3. As a result, each of the testers T1 to T3 sends a test start signal (including information on the type and name of the device under test) to the test management system TC. Upon receiving the test start signal, the operating time measuring means 13 starts measuring the operating time of each of the lines L1 to L3.
[0024]
Then, the testers T1 to T3 of the respective lines L1 to L3 output a test end signal when the test ends, and send the tester ID, the total number of tests, the number of failures, and the like to the test management system TC. Upon receiving the test end signal, the operating time measuring means 13 calculates the operating time of each of the lines L1 to L3 up to the present. With this operation time, the alarm unit 14 outputs an alarm when the operation time requiring maintenance for each of the lines L1 to L3 has been reached. With this alarm, the alarm unit 14 displays a maintenance alarm display on the CRT 3. At this time, the collection unit 151 collects and holds operation result information such as the tester ID, the total number of tests, and the number of failures.
[0025]
When a failure occurs in the lines L1 to L3, for example, the testers T1 to T3, the testers T1 to T3 notify the test management system TC of an abnormal signal via a network. In response to the abnormal signal, the operating time measuring means 13 calculates the operating time of each of the lines L1 to L3 up to the present. With this operation time, the alarm unit 14 sets an alarm when the operation time requiring maintenance for each of the lines L1 to L3 has been reached. With this alarm, the alarm unit 14 displays a maintenance alarm display on the CRT 3. At this time, the schedule means 11 also accumulates failure information of the lines L1 to L3 according to the abnormal signal.
[0026]
As described above, the operating time measuring unit 13 measures the operating time of the tester, and the alarm unit 14 outputs an alarm based on the operating time. Therefore, it is possible to prevent the maintenance time from being extended. Thereby, the test system can be operated efficiently.
[0027]
Then, the operator operates the operation unit 2 to activate the load prediction unit 152. The load prediction unit 152 performs load prediction based on the operation result information of the collection unit 151, the schedule of the schedule unit 11, and the operation time of the operation time measurement unit 13, and displays, for example, graphs shown in FIGS. . FIG. 2 is a short-term graph in which the operation exceeds the load factor at the point B, so that the delivery date is expected to be delayed. Therefore, if the test is performed ahead of time A, the peak load can be reduced. FIG. 3 is a long-term graph. Since the load limit line is exceeded at the time point C, it is possible to predict the time of addition of a new line and replacement of a tester, handler, and prober, and to operate an appropriate test system.
[0028]
The operator operates the operation unit 2 to activate the cost calculation unit 153. The cost calculation unit 153 calculates a device cost from the operation result information of the collection unit 151 and the operation time of the operation time measurement unit 13 and displays the device cost on the CRT 3. The device cost is calculated by, for example, (cost of the device under test) + ((running cost for testing the device under test) / (number of devices under test that passed the test)). The running cost is calculated as ((tester purchase cost) + (total maintenance estimated cost)) / (tester total use estimated time).
[0029]
As described above, since the device cost is calculated and displayed by the cost calculating means 153, the test speed can be improved by changing the test program or the like. That is, the test system can be operated efficiently.
[0030]
The present invention is not limited to this, and may have the following configuration. Although the configuration in which the testers T1 to T3 output a test start signal, a test end signal, and an abnormal signal has been described, a configuration in which the testers T1 to T3 output the signals from devices in the lines L1 to L3 separately from the testers T1 to T3 may be used. When the schedule execution unit 12 has a configuration instructing a test start, the schedule execution unit 12 outputs a test start signal. That is, the operating time measuring means 13 only needs to be able to measure the operating times of the lines L1 to L3 (testers T1 to T3).
[0031]
Further, the alarm unit 14 is configured to display an alarm on the CRT 3, but the alarm unit 14 may be configured to notify the alarm by a warning sound or the like. Although the alarm unit 14 outputs the alarm after the abnormal signal or the test end signal, the alarm unit 14 outputs the alarm immediately when the operation time reaches the operation time requiring maintenance during the test. It may be.
[0032]
The load prediction unit 152 performs the load prediction based on the schedule by the schedule unit 11, but the load prediction unit 152 may perform the load prediction based on the schedule created by the operator.
[0033]
Further, although the configuration in which the test management system TC is provided independently is shown, it may be provided in one line and manage other lines.
[0034]
【The invention's effect】
According to the present invention, the following effects can be obtained.
According to the first and second aspects, the collecting means collects the operation result information from the tester, the operation time measuring means measures the operation time of the tester, and the load estimating means performs the load estimation. Thus, the load on the test system can be known in advance, so that the test system can be operated efficiently.
[0037]
According to the third aspect , since the device cost is calculated and displayed by the cost calculation means, the test speed can be improved by changing the test program or the like. That is, the test system can be operated efficiently.
[Brief description of the drawings]
FIG. 1 is a configuration diagram showing one embodiment of the present invention.
FIG. 2 is a diagram showing a display example of a load factor graph of the device shown in FIG.
FIG. 3 is a diagram showing a display example of a load factor graph of the apparatus shown in FIG. 1;
[Explanation of symbols]
T1 to T3 Tester 11 Schedule means 12 Schedule execution means 13 Operating time measurement means 14 Alarm means 151 Collection means 152 Load prediction means 153 Cost calculation means

Claims (3)

In a test system that tests the object under test,
A tester that performs the test of the test target, and outputs operation total information of the total number of tests and the number of failures,
A test start signal, and an operation time measuring means for measuring an operation time of the tester based on a test end signal or an abnormal signal ,
Collection means for collecting operation result information of the tester;
Load predicting means for predicting the load rate of the tester based on the operation result information of the collecting means, the operating time of the operating time measuring means, and the delivery schedule of the test object. Test system. Load prediction means, the test system of claim 1, wherein the displaying the load prediction graphically. In a test system that tests the object under test,
A tester that performs the test of the test target, and outputs operation total information of the total number of tests and the number of failures,
A test start signal, and an operation time measuring means for measuring an operation time of the tester based on a test end signal or an abnormal signal ,
Collection means for collecting operation result information of the tester;
Based on the operation result information of the collecting means and the operation time of the operation time measuring means, the device cost is calculated as ( cost of test object) + (operating time of tester) × (running cost per unit time of tester) / ((Total number of tests)-(number of fail)) and a cost calculating means for displaying the cost.

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