JP3584273B2 - Film thickness measurement method - Google Patents

Film thickness measurement method Download PDF

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Publication number
JP3584273B2
JP3584273B2 JP10117199A JP10117199A JP3584273B2 JP 3584273 B2 JP3584273 B2 JP 3584273B2 JP 10117199 A JP10117199 A JP 10117199A JP 10117199 A JP10117199 A JP 10117199A JP 3584273 B2 JP3584273 B2 JP 3584273B2
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thickness
covering
measuring device
measuring
contact
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JP2000292106A (en
Inventor
泰明 河合
英之 正木
美明 恵比根
俊彦 井上
明人 秋本
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Toyota Motor Corp
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Toyota Motor Corp
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Description

【0001】
【技術分野】
本発明は,例えば電池用のシート電極のような,箔状の基材の表面に皮膜を積層してなる被覆シートにおける,皮膜の厚さをオンラインで測定することができる皮膜厚さ測定モニター装置に関する。
【0002】
【従来技術】
例えば電池用のシート電極は,金属よりなる箔状の基材の表面に,活物質よりなる皮膜を積層した被覆シートとして形成される。この電池用シート等の被覆シートにおいては,積層した皮膜の厚さによって諸性能が左右されるので,その厚さを正確に測定モニターすることが重要である。
【0003】
従来,被覆シートにおける皮膜厚さを測定する装置としては,オフラインで測定するもの,オンラインで測定するもの,接触式,非接触式,等様々な形式のものが提案されている。
【0004】
【解決しようとする課題】
しかしながら,従来の皮膜厚さ測定モニター装置においては,次のような問題があり,上記被覆シートの皮膜厚さを正確に効率よく測定することが困難である。
例えば,特許第2628516号公報には,フィルム状の樹脂シートの厚さをオフラインにおいて測定する接触式の厚さ計測装置が示されている。この測定装置は,基材が金属箔状の薄物である場合にはその保持ができず厚さ測定ができないという点と,オンラインにおいて連続測定ができないという点に問題がある。
【0005】
また,特公平8−30647号公報においては,フィルム状の樹脂シートの厚さを,レーザと渦電流を併用することによりオンラインにおいて測定する装置が提案されている。この装置は非接触状態において厚さ測定ができる点において優れているが,基材が金属である場合には測定できない。
【0006】
また,光学的手段により,光ファイバープローブの受光距離特性を利用して,皮膜厚さを測定することも考えられる。しかしながら,皮膜の色が一定でない場合には,正確な測定は困難であるので,例えば上記電池用シート電極の活物質の厚さ測定には利用できない。
また,半導体レーザビームの指向性を利用して特定の間隔を測定する方法もあるが,上記と同様の皮膜の色彩並びに形状,光沢等に左右されるという問題がある他に,装置の大型化,高価格化を招き,振動,周囲雰囲気温度を充分に管理しないとオンライン化が困難であるという問題もある。
【0007】
本発明は,かかる従来の装置上の問題点に鑑みてなされたもので,基材および皮膜の種類に殆ど左右されず,被覆シートの皮膜厚さを正確かつ効率的に測定モニターすることができる皮膜厚さ測定方法を提供しようとするものである。
【0008】
【課題の解決手段】
本発明は,シート状の基材としての金属箔の表面に,電池電極用の活物質よりなる皮膜を積層してなる被覆部と,上記基材が露出したままの余白部とを有する被覆シートにおける,上記皮膜の厚さを測定するための皮膜厚さ測定方法であって,
上記被覆シートの裏面を接触させるロール面を有する円柱状の基準ロールと,
該基準ロールに接触した上記被覆シートにおける,上記被覆部の厚さを測定するための被覆部測定器と,上記余白部の厚さを測定する余白部測定器と,
上記被覆部測定器と上記余白部測定器との測定値を基に上記皮膜の厚さを演算するための演算部とを有し,
上記被覆部測定器と上記余白部測定器とは,いずれも,上記基準ロールの上記ロール面に対して垂直方向に進退可能に設けた軸部と,該軸部の上記進退方向における変位を測定するための変位検出部と,上記軸部の先端に回転可能に設けられた球状の接触端子とを有してなる装置を用い
上記被覆部測定器における上記接触端子を上記被覆部に当接させて上記基準ロールとの間に上記被覆部を挟持してその厚さAを測定し,一方,上記余白部測定器における上記接触端子を上記余白部に当接させて上記基準ロールとの間に上記余白部を挟持してその厚さBを測定し,上記皮膜の厚さCは,上記演算部において(A−B)を演算して求めるにあたり,
上記基準ロールに沿って上記被覆シートを前進させると共に,上記被覆部測定器における上記接触端子を上記被覆部の範囲内において幅方向に往復移動させ,上記被覆部測定器における上記接触端子の軌跡をジグザグ状にすることを特徴とする皮膜厚さ測定方法にある。
【0009】
本発明において最も注目すべきことは,上記装置が,上記被覆部測定器と上記余白部測定器とは,いずれも,上記基準ロールの上記ロール面に対して垂直方向に進退可能に設けた軸部と,該軸部の上記進退方向における変位を測定するための変位検出部と,上記軸部の先端に回転可能に設けられた球状の接触端子とを有しており,かつ,上記皮膜の厚さCを求めるにあたり,上記基準ロールに沿って上記被覆シートを前進させると共に,上記被覆部測定器における上記接触端子を上記被覆部の範囲内において幅方向に往復移動させ,上記被覆部測定器における上記接触端子の軌跡をジグザグ状にすることである。
【0010】
上記基準ロールは,軸振れのほとんどない円柱状のものを用いる。なお,内部を中空にすることも可能である。
また,上記軸振れとは基準軸線のまわりに基準ロールを回転させたときの任意の点の位置変化量をいい,これは3/1000mm以下であることが好ましい。3/1000mmを超える軸振れが基準ロールにおいて生ずる場合には,厚さ測定時の基準点が不安定となり,正確な厚さ測定ができないという問題がある。
【0011】
また,上記基準ロールは中空構造等とするため溶接構造をとる。そのため,アンバランス測定・修正機(Balancing Machine)に取りつけ,軽い方向に質量を付加したりして調整を行う。この場合のアンバランス値が20g以下であることが好ましい。20gを超える場合には,振動,騒音の原因になるという問題がある。
【0012】
また,上記基準ロールにおいて,円筒部分の幾何学的な円筒面からの狂いの大きさと定義される円筒度,および円形部分の幾何学的円からの狂いの大きさと定義される真円度は,いずれも3/1000mm以下であることが好ましい。これらの値が3/1000mmを超える場合にも,厚さ測定の基準点が不安定となって正確な厚さ測定ができないという問題がある。
【0013】
また,上記基準ロールの表面は,例えばハードクロムメッキを施して硬度(耐摩耗性)を向上させることが好ましい。これにより,さらに,厚さ測定の基準点の安定性を向上させることができる。
【0014】
また,上記基準ロールへの上記被覆シートの接触部は,密着させる必要があるので,接触面積を大きくすることが好ましい。特に基準ロールの断面から見て,その円弧の半分以上(中心角180°(度)以上)において両者を接触させることが好ましい。これにより,基準ロールと被覆シートとの間に巻き込まれる空気を減少させることができ,厚さ測定精度を向上させることができる。
また,上記基準ロールの前後には,上記被覆シートに対して張力をかける張力コントロール装置を設けることが好ましい。張力コントロール装置としては,例えばダンサーロール等が有る(実施形態例参照)。
【0015】
上記被覆部測定器および余白部測定器は,上記のごとく,軸部と,変位検出部と,上記軸部の先端に回転可能に設けられた球状の接触端子とを有する。上記軸部は,上記基準ロールのロール面に対して垂直方向,即ち基準ロールの円形断面の半径方向に進退可能に設けてある。
【0016】
また,上記軸部の進退方向における変位は,上記変位検出部により検出するように構成してある。この変位検出部の構成は,例えば,差動変圧器を応用した構成,その他,機械式の構成等,種々の構成とすることができる。
また,上記変位検出部は,すべて上記演算部に電気的に接続されている。
【0017】
また,上記軸部の先端には,上記球状の接触端子を回転可能に設けてある。この接触端子の保持方法としては,例えば,筆記用具のボールペンの先端部のボールのように,任意の方向に回動可能に保持する方法がある。また,接触端子の回転方向が1方向だけでよい場合は,所望の回転方向が得られる回転軸を設けてこれに保持することもできる。
【0018】
また,上記被覆部測定器としては,1つのものを左右に移動させて測定位置を幅方向において変化させながら測定するように構成することができる。また,被覆部測定器を複数用い,これを横に並べて配設してそれぞれの位置の厚さを測定するように構成してもよい。いずれの場合も,被覆部の厚さを1点だけでなく広い範囲で測定することができ,皮膜厚さの幅方向のばらつきを求めることができる。
【0019】
次に,本発明の作用につき説明する。
本例の皮膜厚さ測定モニター装置は,上記被覆部測定器と余白部測定器とを用いて,上記被覆シートにおける被覆部と余白部の厚さをそれぞれ接触状態で測定する。この測定は,例えば,予め上記接触端子を基準ロールに当接させた状態を0(ゼロ)点としておくことにより,上記被測定部を挟持した際の変位量をそのまま上記厚さAまたはBとすることができる。
そのため,上記被覆部測定器および余白部測定器による厚さ測定は,被測定物である被覆シートの基材および皮膜の材質,色彩等にかかわらず,容易かつ正確に行うことができる。
【0020】
また,上記各測定器の先端には,上記回転可能に設けた球状の接触端子を設けてある。そのため,該接触端子を当接させた被覆シートを移動させることができる。即ち,上記基準ロールに接触させた被覆シートを,基準ロールの回転に合わせて順次前進させながら,上記被覆部の厚さAおよび余白部の厚さBをオンラインで連続して測定モニターすることができる。
【0021】
また,点接触が実現でき,被覆シート走行中に左右にトラバースするので,接触箇所を常に変化させることができる。そのため,軟質活物質などの摩耗粉が特定部位に付着するのを防止できる。それ故,被覆シート等を構成する活物質等の摩耗粉の影響を少なくでき,測定の精度を向上させうる。
【0022】
また,上記皮膜の厚さCは,上記演算部において,上記厚さデータA,Bを用いて,A−Bの演算を行うことにより,素材の長さ方向の厚さ製造ムラがあっても皮膜の厚さを非常に容易かつ正確に求めることができる。
【0023】
このように,本発明によれば,基材および皮膜の種類に殆ど左右されず,被覆シートの皮膜厚さを正確かつ効率的に測定することができる皮膜厚さ測定モニター装置を提供することができる。
【0024】
【発明の実施の形態】
実施形態例1
本発明の実施形態例にかかる皮膜厚さ測定モニター装置につき,図1〜図6を用いて説明する。
本例の皮膜厚さ測定モニター装置1は,図6(a)に示すごとく,シート状の基材81としての金属箔の表面に,皮膜82としての活物質を積層してなる被覆部820と上記基材81が露出したままの余白部810とを有する被覆シート8としての電池用のシート電極における,皮膜82の厚さCを測定するための装置である。なお,図6(b)に示すごとく,基材81の両面に被覆部820を設ける場合もある。
【0025】
皮膜厚さ測定モニター装置1は,図1に示すごとく,上記被覆シート8の裏面をロール面20に接触させる円柱状の基準ロール2と,基準ロール2に接触した上記被覆シート8における,被覆部820の厚さを測定するための被覆部測定器3と,上記余白部810の厚さを測定する余白部測定器4と,被覆部測定器3と余白部測定器4との測定値を基に上記皮膜の厚さを演算するための演算部5とを有する。
【0026】
図1,図3に示すごとく,上記被覆部測定器3と余白部測定器4とは,いずれも,基準ロール2のロール面20に対して垂直方向に進退可能に設けた軸部31と,該軸部31の上記進退方向における変位を測定するための変位検出部32と,軸部31の先端に回転可能に設けられた球状の接触端子33とを有している。
【0027】
図1に示すごとく,被覆部測定器3は接触端子33を被覆部820に当接させて基準ロール2との間に被覆部820を挟持してその厚さAを測定する。一方,余白部測定器4は接触端子33を余白部810に当接させて基準ロール2との間に余白部810を挟持してその厚さBを測定する。そして,上記皮膜82の厚さCは,上記演算部5において(A−B)を演算して求めるよう構成してある。
【0028】
以下,これを詳説する。
本例の皮膜厚さ測定モニター装置1は,図1,図2に示すごとく,被覆シート8としてのシート電極作製ラインに組み込まれた装置であって,上記基準ロール2の入側にダンサーロール191を,出側に固定ロール192を設け,これらの沿って送られてくる被覆シート8の皮膜厚さを測定するものである。即ち,図2に示すごとく,被覆シート8は,まずダンサーロール191に接触して方向を転換して上方の基準ロール2に向かい,さらに基準ロール2に沿って方向を転換して下方の固定ロール192に沿って方向を転換して次の工程に送られる。
【0029】
上記ダンサーロール191は,被覆シート8にかかる張力を一定にすべく,上下するよう設けられている。
また,これら3本のロール2,191,192の配置は,基準ロール2への被覆シート8の接触状態が,基準ロール断面の中心角αにおいて約180°近い円弧において接触するように行った。
【0030】
また,図1に示すごとく,基準ロール2は,被覆シート8の全幅よりも広いロール面20を有し,その両端に支持用のネック部21を設けてある。ロール面20は,約50μm厚さのハードクロムメッキを施して高硬度に仕上げてある。また,基準ロール2は,中空状であると共に,その軸振れは3/1000mm以下,アンバランス値は20g以下,円筒度および真円度は3/1000mm以下となるように製作したものである。
【0031】
この基準ロール2は,図1に示すごとく,左右一対のハウジング11に設けた軸受部12においてベアリング13を介して回動可能に支持されている。また,ハウジング11の上方には,ブラケット14を介して,測定器支持部材15を設けてある。この測定器支持部材15には,上記被覆部測定器3と余白部測定器4とを配設してある。
【0032】
図1に示すごとく,余白部測定器4は,被覆シート8の余白部810に当接する位置に固定してある。また,被覆部測定器3は,被覆部測定器8の被覆部820上において左右に移動できるように,移動装置16を介して測定器支持部材15に移動可能に固定されている。
また,図1,図2に示すごとく,これら被覆部測定器3および余白部測定器4は,上記のごとく,その軸部31を基準ロール2のロール面20に対して垂直に配設した。
【0033】
次に,図3〜図5を用いて,被覆部測定器3および余白部測定器4の構造を説明する。
被覆部測定器3は,略球状のハウジング30を有し,その上下に設けた軸受35,36に上記軸部31を上下動可能に保持している。軸部31には,その上下動を安定させるための案内ピン319を設けてあり,これをハウジング30に設けた案内溝309に係合させてある。
【0034】
また,軸部31とハウジング30は,それぞれスプリング係止部318,308を有しており,これらの間には軸部31を下方に付勢するためのスプリング307を配設してある。このスプリング307は,被覆部測定器3および余白部測定器4の被覆部820および余白部810への当接力(接触荷重)に影響するものである。本例では,被覆部測定器3の当接力が1N以下,余白部測定器4の当接力が約5Nとなるように設定した。
【0035】
また,ハウジング30の中心部付近には,軸部31の進退方向(上下方向)における変位を測定するための変位検出部(コア部)32を設けてある。
この変位検出部32は,図4,図5に示すごとく,軸部31を囲うように断面コ字状を有する支持材321を介して軸部31に固定された鉄心部322と,ハウジング30に固定されたコイル部323とよりなる。
【0036】
鉄心部322は鉄心をガラスによって被覆して仕上げてある。また,コイル部323は交流電源に接続された励磁用の一次コイルとこれを挟持するように配置された2つの二次コイルとよりなり,全体をガラスによって被覆して仕上げてある。
そして,変位検出部32は,鉄心部322とコイル部323の相対的な移動によって上記二次コイルから検出される電圧変化から変位量をデジタル出力で測定するよう構成されている。なお,この測定原理は差動変圧器を応用したものである。
【0037】
また,図3に示すごとく,上記軸部31の先端に配設する球状の接触端子33は,ボールペンの先端のような構造を有した先端支持体335に回動可能に保持されている。この接触端子33は,先端支持体335のねじ部336を軸部31の先端穴316に螺合させることにより固定される。
また,上記球状の接触端子33は鋼材の表面にクロムメッキを施した直径2mmのものを使用した。これは,耐摩耗性の点からアルミナ等の高硬度のセラミック材に変更することもできる。
【0038】
また,図1に示すごとく,被覆部測定器3と余白部測定器4とは,演算部5に電気的に接続されている。この演算部5は,AD変換器を内蔵しており,アナログデータをデジタルデータに変換すると共に,皮膜厚さCを上記(A−B)により演算し,これをモニター55に表示するよう構成されている。
【0039】
また,本例の被覆シート8は,上記のごとく電池用のシート電極であって,厚さ0.01〜0.03mm,幅150〜600mmのアルミニウム又は銅の金属箔よりなる基材81と,その表面に設けた厚さ約0.05〜0.2mm,幅130〜580mmの正負極よりなる活物質とからなる。余白部は左右両側に設けてあり,いずれも10mmの幅寸法を有する。この被覆シート8は,上記皮膜厚さ測定モニター装置1の前工程において,基材81にペースト状の活物質を塗布し,乾燥させることにより上記皮膜82を形成してある。
【0040】
次に,上記皮膜厚さ測定モニター装置1を用いて被覆シート8の皮膜厚さを実際に測定する際には,図1,図2に示すごとく,まず,基準ロール2に密着した被覆シート8の被覆部820に対して被覆部測定器3の接触端子33を当接させて基準ロール2との間に被覆部820を挟持すると共に,余白部810に対して余白部測定器4の接触端子33を当接させて基準ロール2との間に余白部810を挟持する。
【0041】
そして,基準ロール2に沿って被覆シート8を一定速度で前進させると共に被覆部測定器3を被覆部820の範囲内において幅方向に往復移動させる。これにより,被覆部測定器3の接触端子33の軌跡88はジグザグ状となって,幅方向の広い範囲にわたって被覆部820の厚さ測定を行うことができる。
また,被覆部測定器3および余白部測定器4により測定された被覆部厚さAおよび余白厚さBは,上記のごとく演算部5に逐次伝送され,(A−B)の演算を行うことにより,連続して皮膜82の厚さCを測定することができる。
【0042】
このように,本例の皮膜厚さ測定モニター装置1は,被覆部測定器3と余白部測定器4とを用いて,接触状態で上記厚さA,Bを測定し,これを用いて皮膜厚さCを演算により求めることができる。そのため,被覆シートの基材および皮膜の材質,色彩等にかかわらず,容易かつ正確に皮膜厚さを測定モニターすることができる。それ故,本例のように被覆シート8がどのような材料の電池用のシート電極であっても,その活物質よりなる皮膜82の厚さを正確に測定することができる。
【0043】
また,上記被覆部測定器3と余白部測定器4の接触端子33は,上記のごとく,回転可能に設けた球状体である。そのため,被覆部測定器3と余白部測定器4を被覆シート8に当接させたまま相対移動させることができ,オンラインにおいて連続的に厚さ測定モニターを行うことができる。
【0044】
また,本例においては,上記被覆部測定器3を左右に往復移動させながら上記厚さ測定モニターを行うことができる。そのため,皮膜厚さの幅方向のばらつきも測定することができ,皮膜厚さ管理精度の向上を図ることができる。
【0045】
したがって,本例によれば,基材81および皮膜82の種類に殆ど左右されず,被覆シート8の皮膜厚さを正確かつ効率的に測定することができる皮膜厚さ測定モニター装置1を提供することができる。
【0046】
実施形態例2
本例は,実施形態例1の皮膜厚さ測定モニター装置1に皮膜欠陥判定機能を設けたものである。
即ち,図7に示すごとく,皮膜厚さCの目標値C,上限値CU,下限値CLを予め決めておく。そして上記演算部5においては,皮膜厚さCを演算した際に,その厚さCが上記上限値CUまたは下限値CLを超えるか否かを判断し,超えた場合には,警報を発するように構成してある。
その他は,実施形態例1と同様である。
【0047】
この場合には,上記皮膜厚さCの大きなばらつきによって,皮膜に欠陥があることを認識することができ,不良品の認定を容易化することができる。
その他は,実施形態例1と同様の作用効果が得られる。
【0048】
実施形態例3
本例は,図8に示すごとく,実施形態例1の左右移動可能な被覆部測定器3に代えて,3組の被覆部測定器301〜303を幅方向に等間隔をあけて固定したタイプの皮膜厚さ測定モニター装置である。各被覆部測定器301〜303は,いずれも上記演算部5に電気的に接続されている。そして,左に配された被覆部測定器301が左側皮膜厚さを,中央に配された被覆部測定器302が中央皮膜厚さを,右に配された被覆部測定器303が右側皮膜厚さをそれぞれ測定モニターするように構成してある。その他は,実施形態例1と同様である。
【0049】
この場合には,常時3点の皮膜厚さを測定モニターすることができるので,皮膜の厚さばらつきをさらに精度よく測定することができる。
図9には,皮膜厚さCをモニター55に表示させた例を示す。同図には,左側,中央,右側の皮膜厚さをそれぞれ符号L,C,Rとして示した。同図より知られるごとく,被覆部820における上記3点の皮膜厚さを常時把握モニターすることができる。
その他は,実施形態例1と同様の作用効果が得られる。
また,この皮膜厚み測定モニター装置は,塗工機などに取り付け,その測定値を塗工ギャップなどの調整用にフィードバックする制御に用いてもよい。
【0050】
【発明の効果】
上述のごとく,本発明によれば,基材および皮膜の種類に殆ど左右されず,被覆シートの皮膜厚さを正確かつ効率的に測定することができる皮膜厚さ測定モニター装置を提供することができる。
【図面の簡単な説明】
【図1】実施形態例1における,皮膜厚さ測定モニター装置の構成を示す説明図。
【図2】実施形態例1における,皮膜厚さ測定モニター装置のロール配置を示す説明図。
【図3】実施形態例1における,被覆部測定器(余白部測定器)の構造を示す説明図。
【図4】実施形態例1における,被覆部測定器の変位検出部を示す,図3のA−A線矢視断面図。
【図5】実施形態例1における,被覆部測定器の変位検出部を示す,図4のB視説明図。
【図6】実施形態例1における,被覆シートの構成を示す説明図。
【図7】実施形態例2における,皮膜欠陥判定機能における,皮膜厚さCの目標値C0,上限値CU,下限値CLを示す説明図。
【図8】実施形態例3における,皮膜厚さ測定モニター装置の構成を示す説明図。
【図9】実施形態例3における,皮膜厚さ測定モニター結果チャートを示す説明図。
【符号の説明】
1...皮膜厚さ測定モニター装置,
2...基準ロール,
20...ロール面,
3...被覆部測定器,
31...軸部,
32...変位検出部,
33...接触端子,
4...余白部測定器,
5...演算部,
8...被覆シート,
81...基材,
82...皮膜,
810...余白部,
820...被覆部,
[0001]
【Technical field】
The present invention relates to a film thickness measuring and monitoring apparatus capable of measuring the thickness of a film on a coated sheet formed by laminating a film on the surface of a foil-like substrate, such as a sheet electrode for a battery. About.
[0002]
[Prior art]
For example, a sheet electrode for a battery is formed as a cover sheet in which a film made of an active material is laminated on a surface of a foil-shaped base material made of a metal. In the case of a covering sheet such as a battery sheet, various properties are affected by the thickness of the laminated film, and it is important to accurately measure and monitor the thickness.
[0003]
2. Description of the Related Art Conventionally, various types of devices for measuring the film thickness of a coating sheet, such as a device that measures offline, a device that measures online, a contact type, and a non-contact type, have been proposed.
[0004]
[Problem to be solved]
However, the conventional film thickness measurement monitor has the following problems, and it is difficult to accurately and efficiently measure the film thickness of the coated sheet.
For example, Japanese Patent No. 2628516 discloses a contact-type thickness measuring device that measures the thickness of a film-shaped resin sheet off-line. This measuring device has problems in that when the base material is a thin metal foil, it cannot be held and the thickness cannot be measured, and in that it cannot be continuously measured online.
[0005]
Japanese Patent Publication No. 8-30647 proposes an apparatus for measuring the thickness of a film-shaped resin sheet online by using both laser and eddy current. This device is excellent in that it can measure the thickness in a non-contact state, but cannot measure it when the substrate is metal.
[0006]
It is also conceivable to measure the film thickness by optical means using the light receiving distance characteristics of the optical fiber probe. However, when the color of the film is not constant, accurate measurement is difficult, so that it cannot be used, for example, for measuring the thickness of the active material of the battery sheet electrode.
There is also a method of measuring a specific interval by using the directivity of a semiconductor laser beam. However, in addition to the above-described problem of being affected by the color, shape, gloss, and the like of the film, there is a problem that the size of the apparatus is increased. However, there is also a problem that it is difficult to go online if the vibration and the ambient atmosphere temperature are not sufficiently controlled.
[0007]
The present invention has been made in view of the problems of the conventional apparatus, and can measure and monitor the film thickness of the coated sheet accurately and efficiently regardless of the types of the substrate and the film. An object of the present invention is to provide a method for measuring a film thickness.
[0008]
[Means for solving the problem]
The present invention relates to a coated sheet having a coated portion formed by laminating a film made of an active material for a battery electrode on the surface of a metal foil as a sheet-shaped substrate , and a blank portion where the substrate is exposed. A coating thickness measuring method for measuring the thickness of the coating in the above,
A cylindrical reference roll having a roll surface for contacting the back surface of the covering sheet;
A covering portion measuring device for measuring the thickness of the covering portion in the covering sheet in contact with the reference roll, a margin measuring device for measuring the thickness of the margin portion,
A calculating unit for calculating the thickness of the film based on the measured values of the covering portion measuring device and the margin measuring device,
Each of the covering portion measuring device and the blank portion measuring device measures a shaft portion provided so as to be able to advance and retreat in a direction perpendicular to the roll surface of the reference roll and a displacement of the shaft portion in the advance and retreat direction. a displacement detector for a device comprising a and contact terminals spherical rotatably provided on the tip of the shaft portion used,
The contact terminals in the covering portion measuring device is brought into contact with the covering portion sandwiching the covering portion between the reference roll to measure its thickness A, whereas, the contact in the blank portion measuring device The terminal is brought into contact with the margin, the margin is sandwiched between the reference roll and the thickness B is measured, and the thickness C of the film is calculated by (AB) in the arithmetic unit. per to calculate and obtain,
The covering sheet is advanced along the reference roll, and the contact terminals of the covering section measuring instrument are reciprocated in the width direction within the range of the covering section, and the trajectory of the contact terminals in the covering section measuring instrument is determined. A method for measuring a film thickness characterized by forming a zigzag shape .
[0009]
It is most remarkable in the present invention that the above-mentioned apparatus is characterized in that both the covering portion measuring device and the blank portion measuring device are provided with shafts provided so as to be able to advance and retreat in a direction perpendicular to the roll surface of the reference roll. Part, a displacement detection part for measuring the displacement of the shaft part in the retreating direction, and a spherical contact terminal rotatably provided at the tip of the shaft part . In obtaining the thickness C, the covering sheet is advanced along the reference roll, and the contact terminals of the covering section measuring device are reciprocated in the width direction within the range of the covering section. Is to make the locus of the contact terminal in zigzag .
[0010]
As the reference roll, a cylindrical roll having almost no shaft runout is used. The interior can be hollow.
The shaft runout refers to a position change amount of an arbitrary point when the reference roll is rotated around the reference axis, and is preferably 3/1000 mm or less. When the shaft runout exceeding 3/1000 mm occurs in the reference roll, there is a problem that the reference point at the time of thickness measurement becomes unstable, and accurate thickness measurement cannot be performed.
[0011]
Further, the reference roll has a welding structure in order to have a hollow structure or the like. Therefore, it is mounted on an unbalance measuring / correcting machine (balancing machine), and adjustment is performed by adding mass in a light direction. The unbalance value in this case is preferably 20 g or less. If it exceeds 20 g, there is a problem that it causes vibration and noise.
[0012]
In the above reference roll, the cylindricity defined as the deviation of the cylindrical portion from the geometrical cylindrical surface and the circularity defined as the deviation of the circular portion from the geometric circle are: In any case, it is preferable that the thickness be 3/1000 mm or less. Even when these values exceed 3/1000 mm, there is a problem that the thickness measurement reference point becomes unstable and accurate thickness measurement cannot be performed.
[0013]
Further, it is preferable that the surface of the reference roll is subjected to, for example, hard chrome plating to improve hardness (abrasion resistance). Thereby, the stability of the reference point of the thickness measurement can be further improved.
[0014]
In addition, the contact area of the covering sheet with the reference roll needs to be in close contact, so it is preferable to increase the contact area. In particular, when viewed from the cross section of the reference roll, it is preferable that both are brought into contact with each other at a half or more (center angle of 180 ° (degree) or more) of the arc. Thereby, the air caught between the reference roll and the covering sheet can be reduced, and the thickness measurement accuracy can be improved.
Further, it is preferable to provide a tension control device for applying tension to the covering sheet before and after the reference roll. As the tension control device, for example, there is a dancer roll (see the embodiment).
[0015]
As described above, the covering portion measuring device and the blank portion measuring device have the shaft portion, the displacement detecting portion, and the spherical contact terminal rotatably provided at the tip of the shaft portion. The shaft portion is provided so as to be able to advance and retreat in a direction perpendicular to the roll surface of the reference roll, that is, in a radial direction of a circular cross section of the reference roll.
[0016]
Further, the displacement of the shaft portion in the forward / backward direction is detected by the displacement detecting section. The configuration of the displacement detection unit can be various configurations such as a configuration using a differential transformer, a mechanical configuration, and the like.
Further, the displacement detection units are all electrically connected to the calculation unit.
[0017]
The spherical contact terminal is rotatably provided at the tip of the shaft. As a method of holding the contact terminal, for example, there is a method of holding the contact terminal rotatably in an arbitrary direction like a ball at the tip of a ballpoint pen of a writing utensil. When only one rotation direction of the contact terminal is required, a rotation shaft that can obtain a desired rotation direction can be provided and held on the rotation shaft.
[0018]
In addition, it is possible to adopt a configuration in which one of the covering portion measuring devices is moved left and right to measure while changing the measuring position in the width direction. Alternatively, a plurality of covering portion measuring devices may be used, arranged side by side, and the thickness at each position may be measured. In any case, the thickness of the coating can be measured not only at one point but also in a wide range, and variation in the film thickness in the width direction can be obtained.
[0019]
Next, the operation of the present invention will be described.
The film thickness measuring and monitoring device of the present example measures the thickness of the covering portion and the margin portion of the covering sheet in a contact state by using the covering portion measuring device and the margin measuring device. In this measurement, for example, by setting the state in which the contact terminal is brought into contact with the reference roll in advance as a zero (0) point, the displacement amount when the measured portion is clamped is directly used as the thickness A or B. can do.
Therefore, the thickness measurement by the above-mentioned covering portion measuring device and margin measuring device can be easily and accurately performed irrespective of the material, color, etc. of the substrate and the film of the covering sheet as the object to be measured.
[0020]
Further, a spherical contact terminal rotatably provided at the tip of each of the measuring instruments is provided. Therefore, the covering sheet with which the contact terminals have been brought into contact can be moved. That is, it is possible to continuously measure and monitor the thickness A of the covering portion and the thickness B of the margin portion continuously online while advancing the covering sheet in contact with the reference roll sequentially according to the rotation of the reference roll. it can.
[0021]
In addition, point contact can be realized and traversed left and right while the covering sheet is running, so that the contact point can be constantly changed. Therefore, it is possible to prevent wear powder such as a soft active material from adhering to a specific portion. Therefore, the influence of abrasion powder such as an active material constituting the covering sheet or the like can be reduced, and the measurement accuracy can be improved.
[0022]
Also, the thickness C of the film can be calculated by the arithmetic unit using the thickness data A and B to calculate AB, so that even if there is unevenness in thickness in the length direction of the material. The thickness of the coating can be determined very easily and accurately.
[0023]
As described above, according to the present invention, it is possible to provide a film thickness measurement monitor device that can measure the film thickness of a coated sheet accurately and efficiently without being largely influenced by the types of the substrate and the film. it can.
[0024]
BEST MODE FOR CARRYING OUT THE INVENTION
Embodiment 1
A film thickness measurement monitoring device according to an embodiment of the present invention will be described with reference to FIGS.
As shown in FIG. 6A, the coating thickness measuring and monitoring device 1 of the present embodiment includes a coating portion 820 formed by laminating an active material as a coating 82 on the surface of a metal foil as a sheet-like base material 81. This is an apparatus for measuring the thickness C of the coating 82 in the battery sheet electrode as the covering sheet 8 having the blank portion 810 where the base material 81 is exposed. In addition, as shown in FIG. 6B, the cover portions 820 may be provided on both surfaces of the base material 81 in some cases.
[0025]
As shown in FIG. 1, the coating thickness measurement monitor device 1 includes a cylindrical reference roll 2 for bringing the back surface of the covering sheet 8 into contact with the roll surface 20, and a covering portion of the covering sheet 8 contacting the reference roll 2. Based on the measured values of the covering portion measuring device 3 for measuring the thickness of the margin 820, the margin measuring device 4 for measuring the thickness of the margin 810, and the covering portion measuring device 3 and the margin measuring device 4. And a calculation unit 5 for calculating the thickness of the film.
[0026]
As shown in FIGS. 1 and 3, each of the covering portion measuring device 3 and the blank portion measuring device 4 includes a shaft portion 31 provided so as to be able to advance and retreat in a direction perpendicular to the roll surface 20 of the reference roll 2. It has a displacement detector 32 for measuring the displacement of the shaft 31 in the above-mentioned forward and backward directions, and a spherical contact terminal 33 rotatably provided at the tip of the shaft 31.
[0027]
As shown in FIG. 1, the covering portion measuring device 3 makes the contact terminal 33 contact the covering portion 820, clamps the covering portion 820 between the reference roll 2, and measures the thickness A thereof. On the other hand, the margin measuring device 4 makes the contact terminal 33 abut on the margin 810, clamps the margin 810 with the reference roll 2, and measures the thickness B thereof. The thickness C of the film 82 is calculated by calculating (AB) in the calculation unit 5.
[0028]
The details are described below.
As shown in FIGS. 1 and 2, the film thickness measuring and monitoring device 1 of this example is a device incorporated in a sheet electrode production line as a covering sheet 8, and a dancer roll 191 is provided on the entrance side of the reference roll 2. Is provided with a fixing roll 192 on the output side, and the film thickness of the covering sheet 8 sent along these is measured. That is, as shown in FIG. 2, the covering sheet 8 first contacts the dancer roll 191 and changes its direction to the upper reference roll 2, and further changes its direction along the reference roll 2 to lower the fixed roll. The direction is changed along 192 to be sent to the next step.
[0029]
The dancer roll 191 is provided to move up and down in order to keep the tension applied to the covering sheet 8 constant.
The three rolls 2, 191, 192 were arranged such that the contact state of the covering sheet 8 with the reference roll 2 was in an arc of about 180 ° at the central angle α of the reference roll cross section.
[0030]
As shown in FIG. 1, the reference roll 2 has a roll surface 20 wider than the entire width of the covering sheet 8, and has a support neck 21 at both ends. The roll surface 20 is hard chrome-plated to a thickness of about 50 μm and finished with high hardness. The reference roll 2 is hollow and has a shaft runout of 3/1000 mm or less, an unbalance value of 20 g or less, and a cylindricity and a roundness of 3/1000 mm or less.
[0031]
As shown in FIG. 1, the reference roll 2 is rotatably supported via bearings 13 in bearings 12 provided on a pair of left and right housings 11. A measuring device support member 15 is provided above the housing 11 via a bracket 14. The measuring device support member 15 is provided with the covering portion measuring device 3 and the margin measuring device 4.
[0032]
As shown in FIG. 1, the margin measuring device 4 is fixed at a position where it contacts the margin 810 of the covering sheet 8. Further, the covering portion measuring device 3 is movably fixed to the measuring device support member 15 via the moving device 16 so as to be able to move left and right on the covering portion 820 of the covering portion measuring device 8.
Further, as shown in FIGS. 1 and 2, the covering portion measuring device 3 and the blank portion measuring device 4 have their shaft portions 31 arranged perpendicular to the roll surface 20 of the reference roll 2 as described above.
[0033]
Next, the structures of the covering portion measuring device 3 and the blank portion measuring device 4 will be described with reference to FIGS.
The covering portion measuring device 3 has a substantially spherical housing 30, and the shaft portion 31 is held by bearings 35 and 36 provided above and below the housing 30 so as to be vertically movable. The shaft portion 31 is provided with a guide pin 319 for stabilizing the vertical movement thereof, and this is engaged with a guide groove 309 provided in the housing 30.
[0034]
The shaft portion 31 and the housing 30 have spring engaging portions 318 and 308, respectively, and a spring 307 for urging the shaft portion 31 downward is provided between these. The spring 307 affects the contact force (contact load) of the covering portion measuring device 3 and the margin measuring device 4 on the covering portion 820 and the margin portion 810. In this example, the contact force of the covering part measuring device 3 was set to be 1 N or less, and the contact force of the margin measuring device 4 was set to about 5 N.
[0035]
In the vicinity of the center of the housing 30, a displacement detecting section (core section) 32 for measuring the displacement of the shaft section 31 in the reciprocating direction (vertical direction) is provided.
As shown in FIGS. 4 and 5, the displacement detection unit 32 includes an iron core 322 fixed to the shaft 31 via a support member 321 having a U-shaped cross section so as to surround the shaft 31 and the housing 30. It comprises a fixed coil portion 323.
[0036]
The core 322 is finished by covering the core with glass. The coil section 323 is composed of a primary coil for excitation connected to an AC power supply and two secondary coils arranged so as to sandwich the primary coil, and the whole is covered with glass and finished.
The displacement detection unit 32 is configured to measure a displacement amount as a digital output from a voltage change detected from the secondary coil by a relative movement of the iron core 322 and the coil 323. This measurement principle is based on the application of a differential transformer.
[0037]
Further, as shown in FIG. 3, the spherical contact terminal 33 provided at the tip of the shaft portion 31 is rotatably held by a tip support 335 having a structure like a tip of a ballpoint pen. The contact terminal 33 is fixed by screwing the screw portion 336 of the tip support 335 into the tip hole 316 of the shaft portion 31.
The spherical contact terminal 33 used had a diameter of 2 mm with chrome plating applied to the surface of a steel material. This can be changed to a ceramic material of high hardness such as alumina from the point of abrasion resistance.
[0038]
In addition, as shown in FIG. 1, the covering portion measuring device 3 and the blank portion measuring device 4 are electrically connected to the calculating portion 5. The arithmetic unit 5 has a built-in AD converter, is configured to convert analog data into digital data, calculate the film thickness C by the above (A-B), and display this on the monitor 55. ing.
[0039]
The covering sheet 8 of this example is a sheet electrode for a battery as described above, and includes a base material 81 made of aluminum or copper metal foil having a thickness of 0.01 to 0.03 mm and a width of 150 to 600 mm; An active material comprising positive and negative electrodes having a thickness of about 0.05 to 0.2 mm and a width of 130 to 580 mm provided on the surface. The margins are provided on both left and right sides, each having a width of 10 mm. This coating sheet 8 forms the coating 82 by applying a paste-like active material to a base material 81 and drying it in a previous step of the coating thickness measurement monitoring device 1.
[0040]
Next, when actually measuring the film thickness of the coating sheet 8 using the film thickness measurement monitor device 1, as shown in FIGS. The contact terminal 33 of the covering portion measuring device 3 is brought into contact with the covering portion 820 to sandwich the covering portion 820 between the reference roll 2 and the contact portion of the margin measuring device 4 with respect to the margin portion 810. The margin portion 810 is sandwiched between the reference roll 2 and the reference roll 2.
[0041]
Then, the covering sheet 8 is advanced at a constant speed along the reference roll 2 and the covering portion measuring device 3 is reciprocated in the width direction within the range of the covering portion 820. Accordingly, the trajectory 88 of the contact terminal 33 of the covering portion measuring device 3 has a zigzag shape, and the thickness of the covering portion 820 can be measured over a wide range in the width direction.
The coating thickness A and the margin thickness B measured by the coating measuring device 3 and the blank measuring device 4 are sequentially transmitted to the calculating portion 5 as described above, and the calculation of (A−B) is performed. Thereby, the thickness C of the film 82 can be continuously measured.
[0042]
As described above, the film thickness measuring and monitoring device 1 of the present embodiment measures the above thicknesses A and B in a contact state using the covering portion measuring device 3 and the margin measuring device 4, and uses this to measure the film thickness. The thickness C can be obtained by calculation. Therefore, it is possible to easily and accurately measure and monitor the thickness of the coating regardless of the base material of the coating sheet and the material and color of the coating. Therefore, even if the covering sheet 8 is a sheet electrode for a battery of any material as in this example, the thickness of the film 82 made of the active material can be accurately measured.
[0043]
Further, the contact terminals 33 of the covering portion measuring device 3 and the margin measuring device 4 are spherical bodies rotatably provided as described above. Therefore, the covering portion measuring device 3 and the blank portion measuring device 4 can be relatively moved while being in contact with the covering sheet 8, and the thickness measurement monitor can be continuously performed online.
[0044]
Further, in this example, the thickness measurement monitor can be performed while reciprocating the covering portion measuring device 3 right and left. Therefore, the variation in the film thickness in the width direction can be measured, and the accuracy of the film thickness management can be improved.
[0045]
Therefore, according to the present embodiment, there is provided a film thickness measuring and monitoring apparatus 1 which can measure the film thickness of the covering sheet 8 accurately and efficiently without being largely influenced by the types of the base material 81 and the film 82. be able to.
[0046]
Embodiment 2
In this example, the film thickness measurement monitor device 1 of the first embodiment is provided with a film defect determination function.
That is, as shown in FIG. 7, a target value C 0 , upper limit value CU, and lower limit value CL of the film thickness C are determined in advance. Then, when calculating the film thickness C, the calculation unit 5 determines whether the thickness C exceeds the upper limit value CU or the lower limit value CL, and if so, issues an alarm. It is configured in.
Others are the same as the first embodiment.
[0047]
In this case, it is possible to recognize that there is a defect in the film due to the large variation in the film thickness C, and it is possible to easily recognize defective products.
Otherwise, the same operation and effect as those of the first embodiment can be obtained.
[0048]
Embodiment 3
In this example, as shown in FIG. 8, a type in which three sets of covering portion measuring devices 301 to 303 are fixed at equal intervals in the width direction instead of the covering portion measuring device 3 which can move left and right in the first embodiment. Is a film thickness measurement monitor device. Each of the covering section measuring devices 301 to 303 is electrically connected to the arithmetic section 5. The coating measuring instrument 301 arranged on the left shows the thickness of the left coating, the coating measuring instrument 302 arranged in the center shows the thickness of the central coating, and the coating measuring instrument 303 arranged on the right shows the thickness of the right coating. It is configured to monitor each of the measurements. Others are the same as the first embodiment.
[0049]
In this case, since the film thickness at three points can be constantly measured and monitored, the thickness variation of the film can be measured more accurately.
FIG. 9 shows an example in which the film thickness C is displayed on the monitor 55. In the drawing, the film thicknesses on the left, center, and right sides are indicated by symbols L, C, and R, respectively. As can be seen from the figure, it is possible to constantly monitor the thickness of the coating at the three points in the coating portion 820.
Otherwise, the same operation and effect as those of the first embodiment can be obtained.
Further, the film thickness measurement monitor device may be attached to a coating machine or the like, and may be used for control of feeding back the measured value for adjusting the coating gap or the like.
[0050]
【The invention's effect】
As described above, according to the present invention, it is possible to provide a film thickness measurement monitor device that can measure the film thickness of a coated sheet accurately and efficiently without being largely influenced by the types of the substrate and the film. it can.
[Brief description of the drawings]
FIG. 1 is an explanatory diagram showing a configuration of a film thickness measurement monitor device according to a first embodiment.
FIG. 2 is an explanatory view showing a roll arrangement of a film thickness measurement monitor device in the first embodiment.
FIG. 3 is an explanatory diagram showing a structure of a covering portion measuring device (margin portion measuring device) in the first embodiment.
FIG. 4 is a cross-sectional view taken along line AA of FIG. 3, showing a displacement detection unit of the covering part measuring device in the first embodiment.
FIG. 5 is an explanatory diagram viewed from B in FIG. 4 illustrating a displacement detection unit of the covering unit measuring device in the first embodiment.
FIG. 6 is an explanatory diagram showing a configuration of a covering sheet according to the first embodiment.
FIG. 7 is an explanatory diagram showing a target value C0, an upper limit value CU, and a lower limit value CL of a film thickness C in a film defect determination function according to the second embodiment.
FIG. 8 is an explanatory diagram showing a configuration of a film thickness measurement monitor device according to a third embodiment.
FIG. 9 is an explanatory diagram showing a film thickness measurement monitor result chart in the third embodiment.
[Explanation of symbols]
1. . . Monitor for measuring film thickness,
2. . . Reference roll,
20. . . Roll surface,
3. . . Coating measuring instrument,
31. . . Shaft,
32. . . Displacement detector,
33. . . Contact terminal,
4. . . Margin measuring instrument,
5. . . Arithmetic unit,
8. . . Cover sheet,
81. . . Base material,
82. . . Film,
810. . . Margins,
820. . . Covering part,

Claims (1)

シート状の基材としての金属箔の表面に,電池電極用の活物質よりなる皮膜を積層してなる被覆部と,上記基材が露出したままの余白部とを有する被覆シートにおける,上記皮膜の厚さを測定するための皮膜厚さ測定方法であって,
上記被覆シートの裏面を接触させるロール面を有する円柱状の基準ロールと,
該基準ロールに接触した上記被覆シートにおける,上記被覆部の厚さを測定するための被覆部測定器と,上記余白部の厚さを測定する余白部測定器と,
上記被覆部測定器と上記余白部測定器との測定値を基に上記皮膜の厚さを演算するための演算部とを有し,
上記被覆部測定器と上記余白部測定器とは,いずれも,上記基準ロールの上記ロール面に対して垂直方向に進退可能に設けた軸部と,該軸部の上記進退方向における変位を測定するための変位検出部と,上記軸部の先端に回転可能に設けられた球状の接触端子とを有してなる装置を用い
上記被覆部測定器における上記接触端子を上記被覆部に当接させて上記基準ロールとの間に上記被覆部を挟持してその厚さAを測定し,一方,上記余白部測定器における上記接触端子を上記余白部に当接させて上記基準ロールとの間に上記余白部を挟持してその厚さBを測定し,上記皮膜の厚さCは,上記演算部において(A−B)を演算して求めるにあたり,
上記基準ロールに沿って上記被覆シートを前進させると共に,上記被覆部測定器における上記接触端子を上記被覆部の範囲内において幅方向に往復移動させ,上記被覆部測定器における上記接触端子の軌跡をジグザグ状にすることを特徴とする皮膜厚さ測定方法
The above-mentioned coating in a coated sheet having a coating formed by laminating a coating made of an active material for a battery electrode on the surface of a metal foil as a sheet-shaped base, and a blank portion where the base is exposed. Film thickness measuring method for measuring the thickness of
A cylindrical reference roll having a roll surface for contacting the back surface of the covering sheet;
A covering portion measuring device for measuring the thickness of the covering portion of the covering sheet in contact with the reference roll, a margin measuring device for measuring the thickness of the margin portion,
A calculating unit for calculating the thickness of the film based on the measured values of the covering part measuring device and the margin measuring device,
Each of the covering portion measuring device and the blank portion measuring device is configured to measure a shaft portion provided so as to be able to advance and retreat in a direction perpendicular to the roll surface of the reference roll, and to measure a displacement of the shaft portion in the advance and retreat direction. a displacement detector for a device comprising a and contact terminals spherical rotatably provided on the tip of the shaft portion used,
The contact terminals in the covering portion measuring device is brought into contact with the covering portion sandwiching the covering portion between the reference roll to measure its thickness A, whereas, the contact in the blank portion measuring device The terminal is brought into contact with the margin, and the margin is sandwiched between the reference roll and the thickness B. The thickness B of the film is measured. per to calculate and obtain,
The covering sheet is advanced along the reference roll, and the contact terminal of the covering section measuring instrument is reciprocated in the width direction within the range of the covering section, and the trajectory of the contact terminal of the covering section measuring instrument is determined. A film thickness measuring method characterized by forming a zigzag shape .
JP10117199A 1999-04-08 1999-04-08 Film thickness measurement method Expired - Fee Related JP3584273B2 (en)

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