JP3511636B2 - Board inspection method - Google Patents

Board inspection method

Info

Publication number
JP3511636B2
JP3511636B2 JP11971893A JP11971893A JP3511636B2 JP 3511636 B2 JP3511636 B2 JP 3511636B2 JP 11971893 A JP11971893 A JP 11971893A JP 11971893 A JP11971893 A JP 11971893A JP 3511636 B2 JP3511636 B2 JP 3511636B2
Authority
JP
Japan
Prior art keywords
inspection
area
inspection area
setting
screen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP11971893A
Other languages
Japanese (ja)
Other versions
JPH06334399A (en
Inventor
勝 市原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Panasonic Holdings Corp
Original Assignee
Panasonic Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp, Matsushita Electric Industrial Co Ltd filed Critical Panasonic Corp
Priority to JP11971893A priority Critical patent/JP3511636B2/en
Publication of JPH06334399A publication Critical patent/JPH06334399A/en
Application granted granted Critical
Publication of JP3511636B2 publication Critical patent/JP3511636B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、電子回路用プリント基
板の実装工程の中で生基板検査、印刷後検査、部品実装
後検査、リフロー後検査等の各工程でのプリント基板の
外観検査を自動的に行う検査装置のためのデータを作る
検査データ作成方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention provides a visual inspection of a printed circuit board in each step such as a raw board inspection, a post-printing inspection, a component mounting inspection, and a reflow inspection in the mounting process of a printed circuit board for an electronic circuit. The present invention relates to an inspection data creating method for creating data for an automatic inspection device.

【0002】[0002]

【従来の技術】近年、電子回路用プリント基板の高密度
化と接合点数の増大に伴って実装工程における人手によ
る検査が困難となっており、視覚認識技術により基板の
外観検査を自動化しようとする取り組みが進められてい
る。現在一般的に用いられている視覚認識装置の一画面
の解像度は横512×縦480画素程度であり、代表的
な高密度実装基板であるビデオムービーや携帯電話等の
プリント基板の半田ズレや部品ズレ等の不良を十分な精
度で認識するためには基板全体を数十画面から百数十画
面程度に分割して認識する必要がある。そのため、従来
の技術では図7に示すように基板全体をカメラの視野の
大きさに合わせて升目状に分割することにより検査画面
を決定していた。また、インラインでの検査では基板一
枚あたりの検査時間はライン全体の生産タクトよりも短
くなければならないので、現在実用化されている外観検
査装置では視覚認識装置を複数用いることにより複数の
検査画面の検査を並行処理させることにより検査タクト
短縮を図っている。
2. Description of the Related Art In recent years, as the density of printed circuit boards for electronic circuits has increased and the number of bonding points has increased, it has become difficult to perform manual inspections in the mounting process. Efforts are underway. The resolution of one screen of a visual recognition device which is generally used at present is about 512 pixels in the horizontal direction and 480 pixels in the vertical direction. In order to recognize a defect such as a deviation with sufficient accuracy, it is necessary to divide the entire substrate into several tens to hundreds of tens of screens for recognition. Therefore, in the conventional technique, the inspection screen is determined by dividing the entire substrate into a grid shape according to the size of the visual field of the camera as shown in FIG. Also, in in-line inspection, the inspection time per board must be shorter than the production takt time of the whole line, so the visual inspection equipment currently in practical use uses multiple visual recognition devices to provide multiple inspection screens. The inspection tact is shortened by performing the inspections in parallel.

【0003】[0003]

【発明が解決しようとする課題】しかしながら上記のよ
うな検査画面の分割方法では、基板内の検査箇所の存在
しない領域でもそのまま検査画面内に含めてしまうの
で、全体の検査画面数が多くなり検査時間が長くなって
いた。また、上記の方法では各検査画面ごとの検査箇所
数にばらつきが発生し、最も検査箇所数が多い検査画面
の検査時間が並行処理の完了時間となってしまう為に基
板全体の検査時間が長くなっていた。さらに、升目の境
界線付近にあり、二つの検査画面に跨ってしまう検査箇
所は未検査となるという問題点を有していた。
However, in the inspection screen dividing method as described above, even an area in the board where no inspection portion exists is included in the inspection screen as it is, so that the total number of inspection screens is increased. Time was getting longer. Further, in the above method, the number of inspection points for each inspection screen varies, and the inspection time of the inspection screen with the most inspection points becomes the completion time of the parallel processing. Was becoming. In addition, there is a problem that the inspection location which is near the boundary line of the grid and extends over the two inspection screens is not yet inspected.

【0004】本発明は上記問題点に鑑み、検査画面位置
を自在に設定して検査画面数を削減するとともに、各検
査画面間の検査箇所数のばらつきを小さくすることによ
り短い検査時間で検査を行え、さらに未検査箇所の発生
を事前に防止できる検査データの作成方法を提供するも
のである。
In view of the above problems, the present invention reduces the number of inspection screens by freely setting the inspection screen position and reduces the variation in the number of inspection points among the inspection screens, thereby performing inspection in a short inspection time. The present invention provides a method of creating inspection data that can be performed and that can prevent the occurrence of uninspected locations in advance.

【0005】[0005]

【課題を解決するための手段】上記問題点を解決するた
めに本発明の請求項1記載の検査データ作成方法は、基
板全体を縦に等間隔に分割して列を作成する工程と、検
査箇所の位置データを基板の上部にあるものから順に並
び変える工程と、各列ごとに最上部の検査箇所が画面の
上部に含まれるように検査画面を設定する工程と、設定
された検査画面内の検査箇所データを登録する工程とい
う構成を備えたものである。
In order to solve the above problems, the inspection data creating method according to claim 1 of the present invention comprises a step of creating a row by vertically dividing the entire substrate at equal intervals, and an inspection. Inside the set inspection screen, the process of rearranging the position data of the place in order from the top of the board, the process of setting the inspection screen so that the top inspection place is included in the upper part of the screen for each column. The inspection point data is registered.

【0006】さらに、本発明の請求項記載の検査デー
タ作成方法は、並行処理できる認識装置の個数ごとに、
隣接する検査画面間で上部に位置する検査画面の検査箇
所数から下部に位置する検査画面の検査箇所数を減算し
た結果が一定値以内かどうかを判断する工程と、減算の
結果が一定値以上の時は上部の検査画面に含まれる検査
箇所の内で下部に近いものの一部を登録せず、下部の検
査画面の位置を再設定する工程という構成を備えたもの
である。
Furthermore, test data creation method according to claim 1 of the present invention, for each number of the recognition device can be concurrently processed,
Determining whether the result of subtracting the number of inspection points on the lower inspection screen from the number of inspection points on the upper inspection screen between adjacent inspection screens is within a certain value, and the result of the subtraction is more than a certain value In the case of, a process is provided in which, of the inspection points included in the upper inspection screen, some of the inspection points closer to the lower one are not registered, and the position of the lower inspection screen is reset.

【0007】また、本発明の請求項記載の検査データ
作成方法は、登録されていない検査箇所を含む位置に検
査画面を設定する工程と、ここで設定された検査画面デ
ータを検査順序が最適となる位置に挿入する工程という
構成を備えたものである。
In the inspection data creating method according to the second aspect of the present invention, a step of setting an inspection screen at a position including an unregistered inspection point and an inspection order of the inspection screen data set here are optimal. It is provided with a structure called a step of inserting it at the position.

【0008】[0008]

【作用】本発明は上記構成によって、基板全体が縦に等
間隔に分割されて列が作成され、各列ごとに検査箇所の
位置データが基板の上部にあるものから順に並び変えら
れる。次に、各列ごとに最上部の検査箇所が検査画面の
上部に含まれるように検査画面の位置が設定され、設定
された検査画面内の検査箇所データが登録される。
According to the present invention, by the above-described configuration, the entire substrate is vertically divided into equal intervals to form columns, and the position data of the inspection points are rearranged in order from the upper part of the substrate for each column. Next, the position of the inspection screen is set so that the uppermost inspection place is included in the upper part of the inspection screen for each column, and the inspection place data in the set inspection screen is registered.

【0009】次に、登録された検査箇所を除いて残った
検査箇所の中で最上部に位置する検査箇所が検査画面の
上部に含まれるように検査画面の位置が設定され、先に
登録された検査画面の検査箇所数とこの検査画面内の検
査箇所数の差が許容値以内かどうかが判断される。もし
許容値以上であれば先の検査画面に含まれる検査箇所の
登録が取消され、再度画面の上部から順番に登録が行わ
れる。このとき2つの検査画面に含まれる検査箇所数の
合計を2で割った値まで登録されれば上部画面の登録が
終了し下部の検査画面の登録に移る。この処理が最後の
列まで行われることにより並行処理される検査画面間で
の検査箇所数の差が小さくなる。さらに、上記の処理が
完了後、基板の中に登録処理がされていない検査箇所が
存在する場合にその検査箇所を含む位置に検査画面が設
定され、ここで設定された検査画面データが検査順序の
最適な位置に挿入されることにより未検査が防止され
る。
Next, the position of the inspection screen is set so that the inspection position located at the top among the remaining inspection positions excluding the registered inspection position is included in the upper part of the inspection screen, and is registered first. It is determined whether the difference between the number of inspection points on the inspection screen and the number of inspection points on the inspection screen is within the allowable value. If it is more than the allowable value, the registration of the inspection points included in the previous inspection screen is canceled, and the registration is performed again in order from the upper part of the screen. At this time, if the value obtained by dividing the total number of inspection points included in the two inspection screens by 2 is registered, the registration of the upper screen is completed and the registration of the lower inspection screen is started. By performing this process up to the last column, the difference in the number of inspection points between the inspection screens processed in parallel becomes small. Furthermore, after the above processing is completed, if there is an inspection point that has not been registered in the board, the inspection screen is set at the position including the inspection point, and the inspection screen data set here is used for the inspection order. The non-inspection is prevented by being inserted in the optimum position of.

【0010】[0010]

【実施例】以下本発明の一実施例の検査データ作成方法
について、図面を参照にしながら説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An inspection data creating method according to an embodiment of the present invention will be described below with reference to the drawings.

【0011】図1は、本発明の実施例における検査デー
タ作成方法のフローチャートを示すものである。図1に
おいて、1は検査画面の各列の間の重なり部分の長さ、
すなわちオーバーラップ量や、同じ列で上下に隣接する
検査画面内の検査箇所数の差の許容値等の初期値を入力
する工程、2は基板の横方向の長さを検査画面ピッチす
なわち検査画面の横方向の長さから検査画面のオーバー
ラップ量を引いた値で分割することにより縦方向に列を
作り、列内の検査箇所データを並び変える工程、3は列
の中で現在登録されていない最上部の検査箇所が検査画
面の最上部に含まれるように検査画面位置を設定する工
程、4は検査画面内に含まれる検査箇所のデータを登録
し、登録された検査箇所を以後の検査面設定時の対象か
ら省くための工程である。さらに、5は工程4で登録さ
れた検査箇所を除いて新たに工程3と同様の方法で検査
画面を設定する工程、6は工程3及び工程5で設定され
た検査画面間で画面内の検査箇所の個数の差が許容値以
下かどうかを判断する工程、7は検査箇所数の個数の差
が許容値以上のとき工程4で登録した検査箇所を取消
し、工程3で設定した検査画面内で上部に位置する検査
箇所から順に (数1)に示す再登録個数まで登録する
工程、8は基板サイズからその列の最後まで検査画面の
設定が終了したかどうかを判断する工程、9は全検査箇
所データの中から未登録の検査箇所を探し出し、その未
登録箇所に検査画面を設定し、さらにその検査画面の位
置から既に設定されている検査画面の中で最適な検査順
序の位置に登録データを挿入する工程である。
FIG. 1 shows a flow chart of an inspection data creating method in an embodiment of the present invention. In FIG. 1, 1 is the length of the overlapping portion between each row of the inspection screen,
That is, the step of inputting the initial value such as the overlap amount or the allowable value of the difference in the number of inspection points in the vertically adjacent inspection screens in the same row, 2 is the horizontal length of the substrate, the inspection screen pitch, that is, the inspection screen. The process of rearranging the inspection point data in the column by dividing by the value obtained by subtracting the overlap amount of the inspection screen from the horizontal length of 3 is currently registered in the column. The step 4 of setting the inspection screen position so that the uppermost inspection point that is not included is included in the uppermost portion of the inspection screen. 4 is the step of registering the data of the inspection point included in the inspection screen, and the registered inspection point is subjected to the subsequent inspection. This is a process for omitting from the target when setting the surface. Further, 5 is a step of newly setting an inspection screen in the same manner as in step 3 except for the inspection points registered in step 4, and 6 is an inspection in the screen between the inspection screens set in step 3 and step 5. Step 7 is to judge whether the difference in the number of points is less than or equal to the allowable value. In step 7, if the difference in the number of inspection points is greater than or equal to the allowable value, the inspection point registered in step 4 is canceled and the inspection screen set in step 3 is displayed. Step of registering up to the re-registered number shown in ( Equation 1) in order from the inspection point located at the top, 8 is a step of judging whether the setting of the inspection screen is completed from the board size to the end of the row, 9 is all inspections The unregistered inspection location is searched from the location data, the inspection screen is set to the unregistered location, and the registration data is set to the optimal inspection sequence position from the inspection screen position already set. Is a step of inserting.

【0012】以上のように構成された検査データ作成方
法について、以下図1,図2,図3,図4,図5,図
6,図7を用いてその動作を説明する。
The operation of the inspection data creating method configured as described above will be described below with reference to FIGS. 1, 2, 3, 4, 5, 5, and 7 .

【0013】図6は、検査対象となるプリント基板の例
である。外周の長方形10はプリント基板の外形を表
し、プリント基板内の小さな長方形11及びその他多く
の長方形が検査箇所である。最初に、工程1によりオー
バーラップ量が設定され、検査箇所数許容差は4箇所以
内と設定されるとする。また、検査画面の大きさは予め
分かっているものとする。次に、工程2の動作によりプ
リント基板は図2に示すように縦に4分割されて第1列
12,第2列13,第3列14,第4列15が作成さ
れ、さらに各列ごと(表1)に示す検査箇所データテー
ブルが検査箇所右上Y座標の大きいものから順番に並び
変えられる。最初に第一列から検査画面の設定が開始さ
れる。工程3により第一列の最上部にある検査箇所16
が画面の最上部に入るように検査画面17が設定され
る。次に工程4により検査画面17内の検査箇所が登録
される。図2では、登録された検査箇所を点線で示して
いる。続いて、工程5により第一列で残された検査箇所
の中で最上部に位置する検査箇所18が画面の最上部に
入るように検査画面19が設定される。ここで工程6に
より検査画面17と検査画面19の検査箇所数の差が計
算される。この場合検査画面17の検査箇所数は9個、
検査画面19の検査箇所数は11個であるのでその差は
2個となり、許容差内なので工程7の画面位置再設定は
実行されない。次に工程8により検査画面17が列の最
後かどうかが判断され、最後ではないので工程3に戻っ
て第1列の残った検査箇所の中で最上部に位置する検査
箇所18が画面の最上部にはいるように検査画面19が
設定される。次に工程4により検査画面19内の検査箇
所が登録される。続いて、工程5により第一列で残され
た検査箇所の中で最上部に位置する検査箇所20が画面
の最上部に入るように検査画面21が設定される。ここ
で工程6により検査画面19と検査画面21の検査箇所
数の差が計算される。この場合検査画面19の検査箇所
数は11個、検査画面21の検査箇所数は6個であるの
でその差は5個となり、許容差を越えているので工程7
の画面位置再設定が実行される。工程7では検査画面1
9の検査箇所の登録を取消し、
FIG. 6 shows an example of a printed circuit board to be inspected. The outer peripheral rectangle 10 represents the outer shape of the printed circuit board, and the small rectangle 11 in the printed circuit board and many other rectangles are the inspection points. First, it is assumed that the overlap amount is set in the step 1 and the tolerance of the number of inspection points is set within 4 points. The size of the inspection screen is assumed to be known in advance. Next, the printed circuit board is vertically divided into four as shown in FIG. 2 by the operation of step 2 to form the first row 12, the second row 13, the third row 14, and the fourth row 15, and further, for each row. The inspection location data table shown in (Table 1) is rearranged in order from the inspection location having the highest right Y coordinate. First, the setting of the inspection screen is started from the first row. Inspection point 16 at the top of the first row by step 3
The inspection screen 17 is set so that is at the top of the screen. Next, in step 4, the inspection location in the inspection screen 17 is registered. In FIG. 2 , the registered inspection points are indicated by dotted lines. Subsequently, the inspection screen 19 is set so that the inspection position 18 located at the uppermost position among the inspection positions left in the first row in step 5 is located at the uppermost part of the screen. Here, in step 6, the difference in the number of inspection points on the inspection screen 17 and the inspection screen 19 is calculated. In this case, the number of inspection points on the inspection screen 17 is 9,
The number of inspection points on the inspection screen 19 is 11, so the difference is
Since the number is two, which is within the tolerance, the screen position resetting in step 7 is not executed. Next, in step 8, it is judged whether or not the inspection screen 17 is at the end of the row. Since it is not the last, the procedure returns to step 3 and the inspection point 18 located at the top among the remaining inspection points in the first row is at the top of the screen. The inspection screen 19 is set so as to enter the upper part. Next, in step 4, the inspection location in the inspection screen 19 is registered. Subsequently, the inspection screen 21 is set so that the inspection position 20 located at the top among the inspection positions left in the first row in step 5 is located at the top of the screen. Here, in step 6, the difference in the number of inspection points between the inspection screen 19 and the inspection screen 21 is calculated. In this case, since the number of inspection points on the inspection screen 19 is 11 and the number of inspection points on the inspection screen 21 is 6, the difference is 5, which exceeds the allowable difference.
The screen position is reset. Inspection screen 1 in step 7
Cancel the registration of 9 inspection points,

【0014】[0014]

【数1】 [Equation 1]

【0015】の計算を行った結果である再登録個数9個
まで再度検査箇所の登録を行う。ここで、mは自然数で
あり、画面mと画面m+1は、列方向で隣接する画面を
示す。このとき、検査箇所の再登録は画面の上部から行
われるので、検査箇所22及び23は登録されないこと
になる。最後に、工程3及び工程4により第一列で残さ
れた検査箇所の中で最上部に位置する検査箇所22が画
面の最上部に入るように検査画面24が設定される。
The inspection points are re-registered up to the re-registration number of 9 which is the result of the calculation of. Where m is a natural number
Yes, screen m and screen m + 1 are adjacent screens in the column direction.
Show. At this time, the inspection points are re-registered from the upper part of the screen, so that the inspection points 22 and 23 are not registered. Finally, the inspection screen 24 is set so that the inspection position 22 located at the uppermost position among the inspection positions left in the first row by the process 3 and the process 4 enters the uppermost part of the screen.

【0016】図3は上記と同様の動作により第2列に対
しても検査画面25及び26が設定されることを示して
いる。
FIG. 3 shows that the inspection screens 25 and 26 are set also for the second column by the same operation as described above.

【0017】図4は、請求項1及び2の動作が完了した
後、検査箇所27がどの検査画面にも含まれずに未検査
となっていることを示す。このとき、工程9は登録され
ていない検査箇所を
FIG. 4 shows that after the operations of claims 1 and 2 are completed, the inspection point 27 is not included in any inspection screen and is not yet inspected. At this time, step 9 is to check the unregistered inspection points.

【0018】[0018]

【表1】 [Table 1]

【0019】に示す検査箇所データの登録完了フラグを
探索することにより検出し、図5に示すように検査箇所
27が画面の中心に入る位置に検査画面28を設定す
る。次に、検査画面28のX座標の値を基にして
Detection is performed by searching the registration completion flag of the inspection point data shown in, and the inspection screen 28 is set at a position where the inspection point 27 enters the center of the screen as shown in FIG. Next, based on the value of the X coordinate on the inspection screen 28

【0020】[0020]

【表2】 [Table 2]

【0021】に示す検査画面データテーブルの検査画面
26のデータの次へ検査画面28のデータが挿入され
る。この場合、検査順序はプリント基板の左から右へ検
査されるものとする。
The data of the inspection screen 28 is inserted next to the data of the inspection screen 26 in the inspection screen data table shown in FIG. In this case, the inspection order shall be inspected from left to right on the printed circuit board.

【0022】以上のように本実施例によれば、図1に示
す各工程を設けることにより、図2に示すように検査画
面17,19,24の検査箇所数の差が4個以内とな
る。また、図3に示すように第2列の検査画面は25,
26の二つだけとなり、検査画面数を削減できる。ま
た、図5に示すように検査画面間に跨る検査箇所27に
対して専用の検査画面28が設定されるので未検査箇所
の発生が防止できる。
As described above, according to this embodiment, by providing each step shown in FIG. 1, the difference in the number of inspection points on the inspection screens 17, 19, 24 becomes within 4 as shown in FIG. . In addition, as shown in FIG. 3, the inspection screen of the second row is 25,
The number of inspection screens can be reduced because there are only two. Further, as shown in FIG. 5, since the dedicated inspection screen 28 is set for the inspection points 27 extending between the inspection screens, the occurrence of uninspected points can be prevented.

【0023】なお、実施例において基板の縦方向に列を
作ったが、基板の横方向に列を作成してもよい。また、
実施例では第一列を基板の左端としたが、第一列を基板
の右端としてもよい。
Although the rows are formed in the vertical direction of the substrate in the embodiment, the rows may be formed in the horizontal direction of the substrate. Also,
Although the first row is the left edge of the substrate in the embodiment, the first row may be the right edge of the substrate.

【0024】[0024]

【発明の効果】以上のように本発明は、プリント基板内
の検査箇所の存在しない領域をできるだけ含まないよう
に検査画面位置を自在に設定する工程を設けることによ
り、基板全体の検査画面数が少なくなり検査時間の短い
検査データを作成することができる。
As described above, according to the present invention, the number of inspection screens on the entire substrate is reduced by providing a step of freely setting the inspection screen position so as not to include an area where no inspection portion exists in the printed circuit board as much as possible. It is possible to create inspection data with less inspection time.

【0025】また、隣接する検査画面間で画面内の検査
箇所数の差が小さくなるように検査画面の位置を自動的
に設定する工程を設けることにより、視覚認識装置の負
荷が平準化されて検査時間が短くなる検査データを作成
することができる。
Further, by providing a step of automatically setting the position of the inspection screen so that the difference in the number of inspection points on the screen between adjacent inspection screens becomes small, the load of the visual recognition device is leveled. It is possible to create inspection data that shortens the inspection time.

【0026】さらに、未検査の箇所に対して新たに検査
画面を設定する工程を設けることにより、未検査箇所の
発生しない検査データを作成することができる。
Further, by providing a step of newly setting an inspection screen for an uninspected part, it is possible to create inspection data in which an uninspected part does not occur.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例における検査データ作成方法
のフローチャート
FIG. 1 is a flowchart of an inspection data creating method according to an embodiment of the present invention.

【図2】第1の実施例における検査データ作成方法の検
査画面分割方法の説明図
FIG. 2 is an explanatory diagram of an inspection screen dividing method of the inspection data creating method in the first embodiment.

【図3】第2の実施例における検査画面分割方法の説明
FIG. 3 is an explanatory diagram of an inspection screen dividing method according to the second embodiment.

【図4】本発明の第3の実施例における検査画面分割方
法の説明図
FIG. 4 is an explanatory diagram of an inspection screen dividing method according to the third embodiment of the present invention.

【図5】同検査画面分割方法の説明図FIG. 5 is an explanatory diagram of the inspection screen dividing method.

【図6】本発明の検査画面分割方法の説明に用いるプリ
ント基板の図
FIG. 6 is a diagram of a printed circuit board used for explaining the inspection screen dividing method of the present invention.

【図7】従来の技術の検査画面分割方法を示す説明図FIG. 7 is an explanatory diagram showing a conventional inspection screen dividing method.

【符号の説明】[Explanation of symbols]

2,3,4 工程 2, 3, 4 steps

Claims (7)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】1. 部品が実装された検査対象基板を複数のMultiple boards to be inspected with components mounted
検査領域を分割して、Divide the inspection area, 前記部品を検査する基板検査方法において、In a board inspection method for inspecting the component, 複数の検査領域に分割する方法が、The method of dividing into multiple inspection areas is 前記検査基板を列方向に複数の領域に分割する分割工程Dividing step of dividing the inspection substrate into a plurality of regions in the column direction
と、When, 前記分割された複数の列ごとに複数の前記検査対象物をA plurality of inspection objects are provided for each of the plurality of divided columns.
選択し、選択した前記検査対象物の中で、前記列方向のIn the selected inspection object, in the column direction
Y軸座標値が最大の前記検査対象物が前記検査領域の列The inspection object having the maximum Y-axis coordinate value is a column of the inspection area
方向のY軸座標値が最大の辺に内接する位置に第1検査First inspection at the position inscribed on the side with the largest Y-axis coordinate value in the direction
領域を設定する設定工程1と、A setting step 1 for setting a region, 前記検査領域内に包含された前記検査対象物の個数と各The number and the number of the inspection objects included in the inspection area
座標位置を登録する登録工程と、A registration process for registering coordinate positions, 前記設定工程1と前記登録工程を繰り返すことで、複数By repeating the setting step 1 and the registration step, a plurality of
の検査領域を設定する設定工程2と前記列方向に分割さSetting step 2 to set the inspection area of
れた複数の領域ごとに、前記設定工程1と前記登録工程The setting step 1 and the registration step for each of the plurality of regions
と前記設定工程2とを行うことを特徴とする基板検査方And a setting step 2 described above.
法。Law.
【請求項2】2. 第1検査領域を設定、登録後、列方向のAfter setting and registering the first inspection area,
Y軸座標値が小さく隣接する第2検査領域を設定するSet a second inspection area that has a small Y-axis coordinate value and is adjacent
時、前記第1の検査領域と前記第2の検査領域に含まれWhen included in the first inspection area and the second inspection area,
る検査対象物数の差が許容範囲内になるように、第1検The first inspection so that the difference in the number of inspection objects is within the allowable range.
査領域を変更する再設定工程を備えたことを特徴とするCharacterized by having a resetting process for changing the inspection area
請求項1記載の基板検査方法。The board inspection method according to claim 1.
【請求項3】3. 第1検査領域を設定、登録後、列方向のAfter setting and registering the first inspection area,
Y軸座標値が小さく隣接する第2検査領域を設定するSet a second inspection area that has a small Y-axis coordinate value and is adjacent
時、前記第1の検査領域に含まれる検査対象物数mと前When the number of inspection objects included in the first inspection area is m
記第2検査領域に含まれる検査対象物数nの差が許容値The difference in the number n of inspection objects included in the second inspection area is an allowable value.
以上の時に、第1検査領域に含まれる検査対象物の登録At the above time, registration of the inspection object included in the first inspection area
を一旦取消し、(m+n)/2の個数まで、前記検査対Is canceled once, and the above-mentioned inspection pair is repeated up to the number of (m + n) / 2.
象物の列方向のY軸座標値の大きいものから順に第1検The first inspection in order from the largest Y-axis coordinate value in the column direction of the elephant
査領域に登録する工程を備えたことを特徴とする請求項The method further comprising the step of registering in the inspection area.
2記載の基板検査方法。2. The board inspection method described in 2.
【請求項4】4. 部品が実装された検査対象基板を複数のMultiple boards to be inspected with components mounted
検査領域を分割して、Divide the inspection area, 前記部品を検査する基板検査方法において、In a board inspection method for inspecting the component, 複数の検査領域に分割する方法が、The method of dividing into multiple inspection areas is 前記検査基板を行方向に複数の領域に分割する分割工程Dividing step for dividing the inspection substrate into a plurality of regions in the row direction
と、When, 前記分割された複数の行ごとに複数の前記検査対象物をA plurality of the inspection objects for each of the plurality of divided lines
選択し、選択した前記検査対象物の中で、前記行方向のIn the selected object to be inspected, in the row direction
X軸座標値が最大の前記検査対象物が前記検査領域の行The inspection object having the maximum X-axis coordinate value is a line in the inspection area.
方向のX軸座標値が最大の辺に内接する位置に第1検査First inspection at the position where the X-axis coordinate value of the direction is inscribed in the side with the maximum
領域を設定する設定工程1と、A setting step 1 for setting a region, 前記検査領域内に包含された前記検査対象物の個数と各The number and the number of the inspection objects included in the inspection area
座標位置を登録する登録工程と、A registration process for registering coordinate positions, 前記設定工程1と前記登録工程を繰り返すことで、複数By repeating the setting step 1 and the registration step, a plurality of
の検査領域を設定する設定工程2と前記行方向に分割さSetting step 2 to set the inspection area of
れた複数の領域ごとに、前記設定工程1と前記登録工程The setting step 1 and the registration step for each of the plurality of regions
と前記設定工程2を行うことを特徴とする基板検査方And a method of inspecting a board, characterized in that the setting step 2 is performed.
法。Law.
【請求項5】5. 第1検査領域を設定、登録後、行方向のAfter setting and registering the first inspection area,
X軸座標値が小さく隣接する第2検査領域を設定するSet a second inspection area with a small X-axis coordinate value and adjacent to it
時、前記第1検査領域と前記第2検査領域に含まれる検At this time, the inspection included in the first inspection area and the second inspection area is performed.
査対象物数の差が許容範囲内になるように、第1検査領Make sure that the difference in the number of objects to be inspected is within the allowable range.
域を変更する再設定工程を備えたことを特徴とする請求A claim comprising a resetting step for changing the area
項4記載の基板検査方法。Item 4. The board inspection method according to Item 4.
【請求項6】6. 第1検査領域を設定、登録後、行方向のAfter setting and registering the first inspection area,
X軸座標値が小さく隣接する第2検査領域を設定するSet a second inspection area with a small X-axis coordinate value and adjacent to it
時、前記第1検査領域に含まれる検査対象物数mと前記At this time, the number m of inspection objects included in the first inspection area and the
第2検査領域に含まれる検査対象物数nの差が許容値以The difference in the number of inspection objects n included in the second inspection area is less than or equal to the allowable value.
上の時に、第1検査領域に含まれる検査対象物の登録をAt the time above, register the inspection object included in the first inspection area
一旦取消し、(m+n)/2の個数まで、前記検査対象Canceled once, the above-mentioned inspection target up to the number of (m + n) / 2
物の行方向のX軸座標値の大きいものから順に第1検査First inspection in descending order of X-axis coordinate value of the object
領域に登録する工程を備えたことを特徴とする請求項56. The method according to claim 5, further comprising a step of registering in the area.
記載の基板検査方法。The board inspection method described.
【請求項7】 基板全体の中で登録された検査対象物と
全検査対象物を比較して、登録されていない検査対象物
があるかどうかを探索する手段と、登録されていない検
査対象物がある場合にその検査対象物を含む位置に検査
画面を設定する手段と、その検査領域を検査順番にした
がって、前記登録された検査対象物の間へ挿入する手段
を備えたことを特徴とする請求項1から6のいずれかに
記載の基板検査方法。
7. A means for comparing an inspection object registered in the whole substrate with all inspection objects to search for an unregistered inspection object, and an unregistered inspection object. In the case where there is an inspection object, a means for setting an inspection screen at a position including the inspection object and a means for inserting the inspection area between the registered inspection objects according to the inspection order are provided. The board inspection method according to claim 1.
JP11971893A 1993-05-21 1993-05-21 Board inspection method Expired - Fee Related JP3511636B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11971893A JP3511636B2 (en) 1993-05-21 1993-05-21 Board inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11971893A JP3511636B2 (en) 1993-05-21 1993-05-21 Board inspection method

Publications (2)

Publication Number Publication Date
JPH06334399A JPH06334399A (en) 1994-12-02
JP3511636B2 true JP3511636B2 (en) 2004-03-29

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ID=14768400

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Application Number Title Priority Date Filing Date
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Country Link
JP (1) JP3511636B2 (en)

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