JP3447890B2 - Substrate processing equipment - Google Patents

Substrate processing equipment

Info

Publication number
JP3447890B2
JP3447890B2 JP07897296A JP7897296A JP3447890B2 JP 3447890 B2 JP3447890 B2 JP 3447890B2 JP 07897296 A JP07897296 A JP 07897296A JP 7897296 A JP7897296 A JP 7897296A JP 3447890 B2 JP3447890 B2 JP 3447890B2
Authority
JP
Japan
Prior art keywords
substrate
water
liquid
processing
washing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP07897296A
Other languages
Japanese (ja)
Other versions
JPH09270408A (en
Inventor
光明 芳谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Screen Holdings Co Ltd
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Screen Holdings Co Ltd, Dainippon Screen Manufacturing Co Ltd filed Critical Screen Holdings Co Ltd
Priority to JP07897296A priority Critical patent/JP3447890B2/en
Publication of JPH09270408A publication Critical patent/JPH09270408A/en
Application granted granted Critical
Publication of JP3447890B2 publication Critical patent/JP3447890B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Coating Apparatus (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Liquid Crystal (AREA)
  • Cleaning By Liquid Or Steam (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、フォトレジスト塗
布液、感光性ポリイミド樹脂、カラーフィルター用の染
色剤等からなる薄膜が表面に形成された液晶用のガラス
基板、フォトマスク用のガラス基板等を対象とし、これ
ら基板の表面に所定の処理液を供給することによって処
理する基板処理装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a glass substrate for liquid crystal, a glass substrate for photomask, etc. on the surface of which a thin film made of a photoresist coating solution, a photosensitive polyimide resin, a dyeing agent for a color filter, etc. is formed. The present invention relates to a substrate processing apparatus for processing by supplying a predetermined processing liquid to the surfaces of these substrates.

【0002】[0002]

【従来の技術】従来、基板に薬液供給処理が施された
後、洗浄水による洗浄処理を施してから後工程に搬送す
るようにした基板処理装置が知られている。かかる基板
処理装置は、薬液処理部、水洗部および乾燥部が直列に
配設されて形成されている。これら薬液処理部、水洗部
および乾燥部を貫通するように基板の搬送手段が敷設さ
れ、基板はこの搬送手段によって基板処理装置内を薬液
処理部、水洗部および乾燥部の順に搬送されつつ処理さ
れる。
2. Description of the Related Art Conventionally, there is known a substrate processing apparatus in which a substrate is subjected to a chemical solution supply process, then subjected to cleaning treatment with cleaning water, and then conveyed to a subsequent process. Such a substrate processing apparatus is formed by arranging a chemical treatment section, a water washing section and a drying section in series. A substrate transfer means is laid so as to penetrate through the chemical solution processing section, the water washing section and the drying section, and the substrate is processed while being transferred in the substrate processing apparatus in this order by the chemical solution processing section, the water washing section and the drying section. It

【0003】そして基板は、薬液処理部においてアルカ
リ洗浄液、現像液、エッチング液あるいは剥離液等の薬
液が表面に供給されて所定の処理が施され、ついで水洗
部において水洗処理が施され、最後に乾燥部において気
体の噴射等による乾燥処理が行われるようになってい
る。
The substrate is subjected to a predetermined treatment by supplying a chemical solution such as an alkali cleaning solution, a developing solution, an etching solution or a stripping solution to the surface in a chemical solution processing section, and then subjected to a water cleaning processing in a water cleaning section, and finally. In the drying section, a drying process such as gas injection is performed.

【0004】ところで、薬液処理部で薬液による所定の
処理が施された基板は、その表面に薬液が付着した状態
になっているため、そのまま薬液処理部から水洗部に移
されると、水洗部内に薬液が持ち込まれることになり、
循環使用される洗浄水が薬液の混入によって汚染され、
洗浄性能の維持を図ることができなくなるという不都合
が生じる。
By the way, the substrate which has been subjected to the predetermined treatment with the chemical liquid in the chemical liquid processing unit has a state in which the chemical liquid adheres to its surface. Chemicals will be brought in,
The cleaning water that is circulated is contaminated by the mixture of chemicals,
There is an inconvenience that the cleaning performance cannot be maintained.

【0005】そこで、通常、薬液処理部と水洗部との境
界部分にエアーナイフが配設され、その気体吐出口から
基板の表面に向けてカーテン状の気体を吹き付け、基板
の表面に付着している薬液を、基板の表面が乾燥しない
程度に薬液処理部内に向けて吹き戻し、これによって薬
液の水洗部への持ち込みを防止するようにしている。ま
た、水洗部においては、第1の水洗部と第2の水洗部と
による少なくとも2段階の水洗処理が施され、水洗処理
の完全を期すようになされている。第1の水洗部と第2
の水洗部との間にもエアーナイフが採用され、薬液処理
部の薬液によって汚染された状態になり易い第1の洗浄
水が、より清浄な処理水を用いる第2の水洗部に持ち込
まれるのを防止している。
Therefore, an air knife is usually arranged at the boundary between the chemical treatment section and the water washing section, and a curtain-like gas is blown from the gas discharge port toward the surface of the substrate and adheres to the surface of the substrate. The chemical solution is blown back toward the inside of the chemical treatment section to the extent that the surface of the substrate is not dried, thereby preventing the chemical solution from being brought into the washing section. In addition, in the water washing section, at least two stages of water washing treatment are performed by the first water washing section and the second water washing section so that the water washing treatment is completed. First flush section and second
An air knife is also used between the first washing water and the water washing section, which tends to be contaminated by the chemical in the chemical treatment section, and is brought into the second washing section that uses cleaner treatment water. Is being prevented.

【0006】[0006]

【発明が解決しようとする課題】しかしながら、近年、
基板の大型化に伴い、基板の上流側が第1の水洗部で第
1の洗浄水の供給を受けつつ下流側では第2の水洗部で
第2の洗浄水の供給を受けるという工程の重複が生じる
ようになり、たとえ第1の水洗部と第2の水洗部との境
界部分でエアーナイフから基板の表面に向けて気体を噴
射しても、基板の上流側の表面には第1の洗浄水が、下
流側の表面には第2の洗浄水が同時に供給された状態に
なるため、基板の表面を通って第1の洗浄水が第2の水
洗部に入り込んだり、逆に第2の洗浄水が第1の水洗部
に移動したりすることがあり、境界部分において洗浄水
の確実な置換が行われなくなるという問題点が発生する
ようになった。
However, in recent years,
Due to the increase in size of the substrate, there is a duplication of processes in which the upstream side of the substrate receives the first cleaning water supplied from the first washing unit and the downstream side receives the second cleaning water supplied from the second washing unit. Even if the gas is jetted from the air knife toward the surface of the substrate at the boundary between the first water washing section and the second water washing section, the first washing is performed on the upstream surface of the substrate. Since the second cleaning water is simultaneously supplied to the surface on the downstream side, the first cleaning water enters the second cleaning section through the surface of the substrate, and conversely the second cleaning water is supplied. The wash water may move to the first water wash section, which causes a problem that the wash water cannot be reliably replaced at the boundary portion.

【0007】かかる問題点を解消するために、第1の水
洗部および第2の水洗部との間に未処理搬送部を設け、
基板が第1の水洗部と第2の水洗部との境界部分に差し
掛かった状態では、第1の洗浄水および第2の洗浄水の
いずれもが基板に供給されないようにすることが考えら
れるが、このようにすると処理槽を大型化しなければな
らず、設備コストが嵩むという新たな問題点が発生す
る。
In order to solve such a problem, an untreated transfer section is provided between the first water washing section and the second water washing section,
It is conceivable that neither the first cleaning water nor the second cleaning water is supplied to the substrate when the substrate is approaching the boundary between the first water washing section and the second water washing section. In this case, the processing tank must be upsized, which causes a new problem that the equipment cost increases.

【0008】一方、処理槽が大型化することによって、
上記境界部分でエアーナイフから基板の表面に吐出され
る気体により基板の表面が乾燥してしまうことがあり、
基板の表面が乾燥すると、その部分にシミが生じる。そ
して、このシミは水洗処理によっても取り除くことがで
きず、最終的に基板が乾燥処理された後にこのシミから
パーティクルが発生し、これによって基板の表面が再汚
染されるという問題点も有している。
On the other hand, as the processing tank becomes larger,
The surface of the substrate may be dried by the gas discharged from the air knife to the surface of the substrate at the boundary portion,
When the surface of the substrate dries, spots occur on that part. This stain cannot be removed even by washing with water, and there is also a problem that after the substrate is finally dried, particles are generated from this stain and the surface of the substrate is re-contaminated. There is.

【0009】本発明は、上記のような問題点を解決する
ためになされたものであり、設備の大型化を抑えた上
で、基板表面の処理液の液切りを確実に行わせつつ、基
板の乾燥によるパーティクルの発生も防止した基板処理
装置を提供することを目的としている。
The present invention has been made in order to solve the above-mentioned problems, and prevents the processing liquid from draining the processing liquid on the surface of the substrate while suppressing the enlargement of the equipment. An object of the present invention is to provide a substrate processing apparatus in which generation of particles due to drying of the substrate is prevented.

【0010】[0010]

【課題を解決するための手段】請求項1記載の発明は、
搬送方向に直交する面内で水平方向に対して傾斜した基
板載置面上を搬送される基板の主面に処理液を供給して
所定の処理を施す基板処理装置において、上記基板載置
面の上位側に、上記搬送方向に所定長の帯状で処理液を
上記基板に供給する処理液供給手段が設けられているも
のである。
The invention according to claim 1 is
In a substrate processing apparatus for supplying a processing liquid to a main surface of a substrate which is transported on a substrate mounting surface inclined with respect to a horizontal direction in a plane orthogonal to the transport direction, the substrate mounting surface On the upper side of the , the processing liquid in the form of a strip with a predetermined length in the transport direction.
Processing liquid supply means for supplying the substrate is provided .

【0011】この発明によれば、傾斜姿勢で搬送中の基
板に、処理液供給手段から基板に処理液が帯状で供給さ
れて基板の主面を処理しつつ傾斜に沿って流下するた
め、基板の上流側には液流状態で処理液が移行すること
はなく、従って処理液供給手段の下流側の基板主面上に
は処理液が薄膜状態で残留するのみとなり、基板が次工
程に搬送される前に実質的な液切り処理が施された状態
になる。従って、従来のように、下流側の処理装置との
間にエアナイフ等の液切り手段を設ける必要はなくな
り、その分、設備コストが低減されるとともに、基板の
主面に薄膜状態で処理液が残留することにより基板主面
の乾燥が抑制され、基板主面の乾燥に起因したパーティ
クルの発生を防止し得るようになる。
According to the present invention , the processing liquid is supplied in the form of a strip from the processing liquid supply means to the substrate being conveyed in the inclined posture.
Since the main surface of the substrate is processed and flows down along the slope, the processing liquid does not move in a liquid flow state on the upstream side of the substrate, and therefore, on the main surface of the substrate on the downstream side of the processing liquid supply means. However, the processing liquid remains only in a thin film state, and the substrate is in a state of being substantially drained before being transferred to the next step. Therefore, unlike the prior art, it is not necessary to provide a liquid draining means such as an air knife between the processing device on the downstream side, the equipment cost is reduced accordingly, and the processing liquid in a thin film state on the main surface of the substrate. By remaining, the drying of the main surface of the substrate is suppressed, and the generation of particles due to the drying of the main surface of the substrate can be prevented.

【0012】請求項2記載の発明は、請求項1記載の発
明において、上記処理液供給手段は、上記搬送方向に所
定長を有するスリット状の吐出口が形成された液吐出部
材であることを特徴とするものである。
According to a second aspect of the present invention, in the first aspect of the present invention, the processing liquid supply means is a liquid discharge member having a slit-shaped discharge port having a predetermined length in the carrying direction. It is a feature.

【0013】この発明によれば、処理液は液吐出部材か
ら基板に帯状で吐出される。
According to the present invention, the treatment liquid is ejected from the liquid ejection member onto the substrate in a band shape.

【0014】請求項3記載の発明は、請求項1または2
記載の発明において、上記基板載置面を横断する方向
(基板搬送方向と交差する方向)に延びる第2の処理液
供給手段を配設したことを特徴とするものである。
The invention according to claim 3 is the invention according to claim 1 or 2.
In the invention described above, a second processing liquid supply means extending in a direction crossing the substrate mounting surface (a direction intersecting the substrate transport direction) is provided.

【0015】この発明によれば、液吐出部材から吐出さ
れる処理液に加え、第2の処理液供給手段からの処理液
も基板の主面に供給されるため、基板の主面上での処理
液の流れに乱流が生じ、乱流による混合で処理液と基板
主面との接触状態が均一になり、処理液による基板主面
の処理効率が向上する。さらに吐出された第2の処理液
による衝撃効果により、基板面の洗浄効果がより高ま
る。
According to the present invention, in addition to the processing liquid discharged from the liquid discharging member, the processing liquid from the second processing liquid supply means is also supplied to the main surface of the substrate, so that the processing liquid on the main surface of the substrate is obtained. A turbulent flow is generated in the flow of the processing liquid, the contact state between the processing liquid and the main surface of the substrate is made uniform by mixing due to the turbulent flow, and the processing efficiency of the main surface of the substrate by the processing liquid is improved. Further, the impact effect of the discharged second processing liquid further enhances the cleaning effect on the substrate surface.

【0016】[0016]

【発明の実施の形態】図1は、本発明に係る基板処理装
置が適用された基板処理装置群の一実施形態を示す説明
図である。基板処理装置群1は、基板の表面(主面)に
所定の薬液を供給して処理する薬液処理部1a、第1次
水洗部2、この第1次水洗部2で水洗処理の施された基
板Bをさらに清浄な洗浄水で水洗する第2次水洗部3、
およびこの第2次水洗部3で水洗処理の施された基板B
を乾燥する乾燥部4が直列に上流側から順次配設されて
形成されている。
1 is an explanatory diagram showing an embodiment of a substrate processing apparatus group to which a substrate processing apparatus according to the present invention is applied. In the substrate processing apparatus group 1, a chemical liquid processing unit 1a that supplies a predetermined chemical liquid to the surface (main surface) of the substrate for processing, a first water washing unit 2, and a water washing process in the first water washing unit 2. A secondary washing section 3 for washing the substrate B with further clean washing water,
And the substrate B which has been subjected to the washing treatment in the secondary washing section 3
Is formed by sequentially arranging a drying unit 4 for drying the same from the upstream side.

【0017】上記薬液処理部1a、第1次水洗部2、第
2次水洗部3および乾燥部4は、それぞれ箱型の薬液処
理槽1b、第1次水洗槽21、第2次水洗槽31および
乾燥槽41を備えて形成されている。各槽1b,21,
31,41の上流壁および下流壁には水平方向で互いに
対向した基板通過口11が開口され、この基板通過口1
1を通して基板Bが各槽1b,21,31,41に入出
されるようになっている。本実施形態においては、薬液
処理部1aで使用される処理液(薬液)として洗剤の混
入された洗浄液が用いられ、第1次水洗部2では通常の
洗浄水が用いられ、第2次水洗部3ではイオン交換水や
純水等が用いられている。
The chemical solution treating section 1a, the first water washing section 2, the second water washing section 3 and the drying section 4 are respectively box-shaped chemical solution treating tanks 1b, a first water washing tank 21, and a second water washing tank 31. And a drying tank 41. Each tank 1b, 21,
Substrate passage ports 11 facing each other in the horizontal direction are opened in the upstream wall and the downstream wall of 31, 41, respectively.
Substrate B is put into and taken out of each tank 1b, 21, 31, 41 through 1. In the present embodiment, a cleaning liquid in which a detergent is mixed is used as a processing liquid (chemical liquid) used in the chemical liquid processing unit 1a, normal cleaning water is used in the first water washing unit 2, and a secondary water washing unit is used. In No. 3, ion-exchanged water or pure water is used.

【0018】基板Bを各槽1b,21,31,41内で
搬送する搬送手段としてはローラコンベアが適用されて
いる。このローラコンベアは、基板Bの搬送方向に直交
する面内で水平方向に対して傾斜した支持軸を有する搬
送ローラ5が搬送方向(図1の右方)に向けてほぼ等ピ
ッチで並設配置されて基板載置面を形成しており、図略
の駆動手段の駆動によって同一方向に同期回転されるよ
うになっている。従って、基板Bの各槽1b,21,3
1,41内における搬送路は、搬送方向に対して全体的
に幅方向に傾斜しており、基板Bはこの傾斜搬送路の基
板載置面に沿って傾斜姿勢で搬送されつつ、各槽1b,
21,31,41内で所定の処理が施される。本実施形
態においては、基板Bの水平面に対する傾斜角度α(図
3)は略5°に設定されている。
A roller conveyor is used as a transfer means for transferring the substrate B in each of the tanks 1b, 21, 31, 41. In this roller conveyor, conveyance rollers 5 each having a support shaft inclined with respect to the horizontal direction in a plane orthogonal to the conveyance direction of the substrate B are arranged side by side at substantially equal pitches in the conveyance direction (right side in FIG. 1). As a result, a substrate mounting surface is formed, and is driven to rotate synchronously in the same direction by driving a driving means (not shown). Therefore, each tank 1b, 21, 3 of the substrate B is
The transport paths in the insides of 1, 41 are inclined in the width direction as a whole with respect to the transport direction, and the substrate B is transported in an inclined posture along the substrate mounting surface of this inclined transport path while each tank 1b is being transported. ,
Predetermined processing is performed in 21, 31, and 41. In this embodiment, the inclination angle α (FIG. 3) of the substrate B with respect to the horizontal plane is set to approximately 5 °.

【0019】基板Bは、前工程から図略の上流側引継ぎ
手段を介して傾斜姿勢に姿勢変更された後、薬液処理槽
1bの直上流側に配設された搬送ローラ5に移載され、
ついで搬送ローラ5の駆動によって基板処理装置群1内
に導入され、ここで搬送ローラ5によって搬送方向(図
1の右方)に向けて搬送されつつ薬液処理槽1b内にお
いて薬液の供給による所定の薬液処理が施され、ついで
第1次水洗槽21内で洗浄水の供給を受けて第1次の洗
浄処理が施され、引き続き第2次水洗槽31内において
液吐出部材(処理液供給手段)6や純水供給ノズル32
等からの洗浄水の供給による第2次の水洗処理が施さ
れ、最後の乾燥槽41においてエアナイフ42からの気
体噴射供給による乾燥処理が施された後、乾燥槽41の
直ぐ下流側に配設された図略の下流側引継ぎ手段を介し
て元の水平姿勢に戻され、次工程に向けて導出されるよ
うになっている。なお、上記液吐出部材6は、基板搬送
方向に所定長を有するスリット状の吐出口が形成された
ものである。
The substrate B is tilted from the previous step through an unillustrated upstream take-up means, and is then transferred to the transport roller 5 arranged immediately upstream of the chemical treatment tank 1b.
Then, it is introduced into the substrate processing apparatus group 1 by driving the transport roller 5, and while being transported in the transport direction (rightward in FIG. 1) by the transport roller 5, a predetermined amount of chemical solution is supplied in the chemical solution processing tank 1b. The chemical treatment is performed, and then the primary washing treatment is performed by receiving the supply of the washing water in the primary washing tank 21 and then the secondary discharge vessel 31 in the secondary washing tank 31 (the treating liquid supply means). 6 and pure water supply nozzle 32
The second washing process is performed by supplying washing water from the above, and after the drying process is performed by the gas injection supply from the air knife 42 in the last drying tank 41, it is disposed immediately downstream of the drying tank 41. It is returned to the original horizontal posture through the illustrated unillustrated downstream side take-up means, and is led out toward the next step. The liquid ejection member 6 has a slit-shaped ejection port having a predetermined length in the substrate transport direction.

【0020】本発明に係る基板処理装置10は、本実施
形態においては上記第1次水洗部2および第2次水洗部
3の一部に適用されている。以下本発明に係る基板処理
装置10を第1次水洗部2に適用されたもので説明す
る。図2は、第1次水洗部2の第1次水洗槽21の一実
施形態を示す一部切欠き斜視図である。この図に示すよ
うに、第1次水洗槽21内には、上流側および下流側の
基板通過口11間に、同一高さレベルで搬送方向(右
方)に向かって5本の搬送ローラ5が配設され、図略の
駆動手段による各搬送ローラ5の同一方向の同期回転に
よって、上流側の基板通過口11から第1次水洗槽21
内に導入された基板Bは、下流側の基板通過口11に向
けて第1次水洗槽21内を搬送されるようになってい
る。
The substrate processing apparatus 10 according to the present invention is applied to a part of the primary water washing section 2 and the secondary water washing section 3 in this embodiment. Hereinafter, the substrate processing apparatus 10 according to the present invention will be described as being applied to the primary water washing section 2. FIG. 2 is a partially cutaway perspective view showing an embodiment of the primary washing tank 21 of the primary washing section 2. As shown in this figure, in the primary washing tank 21, between the upstream and downstream substrate passage ports 11, at the same height level, five transport rollers 5 are directed toward the transport direction (rightward). Is provided, and by the synchronous rotation of the respective conveying rollers 5 in the same direction by a drive means (not shown), the primary water washing tank 21 from the substrate passage opening 11 on the upstream side is provided.
The substrate B introduced therein is conveyed in the primary washing tank 21 toward the substrate passage port 11 on the downstream side.

【0021】上記搬送ローラ5は、第1次水洗槽21内
の側壁間に自軸心回りに回転可能に架橋されたローラ軸
51と、このローラ軸51の左右両側部にローラ軸51
と共回り可能に設けられた左右一対の側部ローラ52
と、ローラ軸51の中央部に設けられた中央ローラ53
とから形成された、いわゆる部分支持型ローラが採用さ
れている。かかる部分支持型ローラを適用することによ
り、撓みを規制し得るとともに搬送ローラ5による基板
B裏面の接触域を少なくし、基板Bの裏面への洗浄水や
気体の供給を良好に行い得るとともに、洗浄工程や乾燥
工程における搬送ローラ5と基板Bの裏面との接触によ
る汚染を最小限に抑えることが可能になる。
The transport roller 5 has a roller shaft 51 bridged between the side walls of the primary washing tank 21 so as to be rotatable about its own axis, and roller shafts 51 on both left and right sides of the roller shaft 51.
A pair of left and right side rollers 52 provided so as to rotate together with
And a central roller 53 provided at the center of the roller shaft 51.
A so-called partially supported roller, which is formed from the above, is used. By applying such a partially-supported roller, it is possible to regulate the bending and reduce the contact area of the back surface of the substrate B by the transport roller 5, and to favorably supply the cleaning water and the gas to the back surface of the substrate B. It is possible to minimize contamination due to the contact between the transport roller 5 and the back surface of the substrate B in the cleaning process and the drying process.

【0022】上記左右の側部ローラ52は、各々その外
方側部に側部ローラ52と一体の鍔部52aを有してお
り、この鍔部52aによって各ローラ52,53上に載
置されて搬送される基板Bの横ずれを防止するととも
に、特に下位側の鍔部52aによって基板Bが搬送路の
傾斜面に沿って滑落するのを防止している。また、各ロ
ーラ52,53にはゴム等の柔軟性材料からなる緩衝材
としてのOリング54が外嵌されており、このOリング
54の滑り止め作用によって基板Bの搬送を確実に行い
得るようにしている。
The left and right side rollers 52 each have a flange portion 52a on the outer side thereof which is integral with the side roller 52, and are placed on the rollers 52 and 53 by the flange portion 52a. The lateral deviation of the substrate B being conveyed is prevented, and in particular, the lower flange 52a prevents the substrate B from sliding down along the inclined surface of the conveying path. Further, an O-ring 54 made of a flexible material such as rubber is fitted on each of the rollers 52 and 53 so that the substrate B can be reliably transported by the non-slip action of the O-ring 54. I have to.

【0023】第1次水洗槽21内には、搬送方向の略中
央部であって、搬送ローラ5の上位側の内壁面に搬送方
向に延びた支持枠体25が設けられ、この支持枠体25
に下方に向いたスリット状の吐出口を搬送方向に沿わせ
るようにして配置した液吐出部材6が固定されている。
この液吐出部材6の前後方向の長さ寸法は、基板Bの長
さ寸法(搬送方向に延びる寸法)の略1/3に設定され
ている。そして、図2に示すように、基板B上の液吐出
部材6に対向する部分から下位側の側端縁に亘る部分に
液吐出部材6からの洗浄水Lの流下による基板処理域A
が形成されている。
In the primary washing tank 21, a support frame 25 extending in the transport direction is provided on the inner wall surface of the upper side of the transport roller 5, which is a substantially central portion in the transport direction. 25
The liquid discharge member 6 is fixed so that the slit-shaped discharge port facing downward is arranged along the transport direction.
The length dimension of the liquid ejection member 6 in the front-rear direction is set to approximately 1/3 of the length dimension of the substrate B (dimension extending in the transport direction). Then, as shown in FIG. 2, the substrate processing area A by the flow of the cleaning water L from the liquid ejection member 6 to the portion extending from the portion facing the liquid ejection member 6 on the substrate B to the side edge on the lower side.
Are formed.

【0024】一方、第1次水洗槽21の近傍には上記液
吐出部材6に供給するための洗浄水Lを貯留する洗浄水
貯留槽22が配設されている。この洗浄水貯留槽22と
上記液吐出部材6との間に洗浄水管路22aが配設され
ているとともに、第1次水洗槽21の底部と洗浄水貯留
槽22の上部との間には洗浄水戻り管路22bが配設さ
れ、これら洗浄水管路22aおよび洗浄水戻り管路22
bによって洗浄水貯留槽22内の洗浄水Lを液吐出部材
6を介して循環させる循環管路が形成されている。
On the other hand, a cleaning water storage tank 22 for storing the cleaning water L to be supplied to the liquid discharge member 6 is disposed near the primary water cleaning tank 21. A cleaning water conduit 22a is provided between the cleaning water storage tank 22 and the liquid discharge member 6, and cleaning is performed between the bottom of the primary water cleaning tank 21 and the upper portion of the cleaning water storage tank 22. A water return line 22b is provided, and these wash water line 22a and wash water return line 22 are provided.
By b, a circulation pipeline for circulating the cleaning water L in the cleaning water storage tank 22 through the liquid discharge member 6 is formed.

【0025】また、上記洗浄水貯留槽22の直ぐ下流側
の洗浄水管路22aには洗浄水ポンプ23が設けられて
いるとともに、洗浄水ポンプ23の直ぐ下流側にはフィ
ルター24が設けられている。従って、洗浄水ポンプ2
3を駆動することにより、洗浄水貯留槽22内の洗浄水
Lは、洗浄水管路22aを通してまずフィルター24で
異物が除去され、ついで液吐出部材6から搬送ローラ5
上の傾斜姿勢の基板B表面の上位側端縁に向けて吐出さ
れ、基板Bの傾斜に沿って流下しながら基板Bの表面に
所定の処理を施した後、基板Bの下位側端縁から第1次
水洗槽21の底部に落下し、洗浄水戻り管路22bを介
して洗浄水貯留槽22に戻され、以後、循環使用され
る。
A wash water pump 23 is provided in the wash water conduit 22a immediately downstream of the wash water storage tank 22, and a filter 24 is provided immediately downstream of the wash water pump 23. . Therefore, the wash water pump 2
By driving 3 of the cleaning water L in the cleaning water storage tank 22, foreign matters are first removed by the filter 24 through the cleaning water conduit 22a, and then the liquid discharging member 6 and the transport roller 5 are removed.
After being discharged toward the upper edge of the surface of the substrate B in the upper tilted posture, the surface of the substrate B is subjected to predetermined processing while flowing down along the inclination of the substrate B, and then from the lower edge of the substrate B. It falls to the bottom of the primary water washing tank 21 and is returned to the washing water storage tank 22 through the washing water return pipe line 22b, and thereafter is circulated and used.

【0026】図3は、液吐出部材6の一実施形態を示す
一部切欠き斜視図である。まず、液吐出部材6は、前後
方向に延びる長尺直方体状の部材本体61と、この部材
本体61の下部から延設された先細りのノズル部62と
を備えて形成されている。上記部材本体61は、内部に
前後方向に延びる洗浄水供給管路63を有しているとと
もに、頂部に雄ネジの螺設された接続筒64を有してい
る。この接続筒64に洗浄水管路22aの下流端に設け
られたジョイント22cが螺着されることにより、洗浄
水管路22aが液吐出部材6に接続されるようになって
いる。
FIG. 3 is a partially cutaway perspective view showing an embodiment of the liquid discharge member 6. First, the liquid discharge member 6 is formed by including a long rectangular parallelepiped member body 61 extending in the front-rear direction and a tapered nozzle portion 62 extending from a lower portion of the member body 61. The member main body 61 has a washing water supply pipe line 63 extending in the front-rear direction in the inside thereof, and also has a connection cylinder 64 in which a male screw is screwed at the top. A joint 22c provided at the downstream end of the cleaning water pipe 22a is screwed to the connection cylinder 64, so that the cleaning water pipe 22a is connected to the liquid discharge member 6.

【0027】また、上記ノズル部62には、洗浄水供給
管路63に連通した前後方向に延びるスリット状の洗浄
水吐出口65が設けられており、洗浄水管路22aを通
して部材本体61の洗浄水供給管路63に供給された洗
浄水Lは、洗浄水吐出口65から基板B上に供給され
る。
Further, the nozzle portion 62 is provided with a slit-shaped cleaning water discharge port 65 which extends in the front-rear direction and communicates with the cleaning water supply conduit 63, and the cleaning water of the member main body 61 is passed through the cleaning water conduit 22a. The cleaning water L supplied to the supply pipeline 63 is supplied onto the substrate B from the cleaning water discharge port 65.

【0028】図4は、本発明の作用を説明するための説
明図であり、(イ)は基板Bの搬送方向前端部が基板処
理域Aに侵入した直後の状態、(ロ)は基板Bの前後方
向の中央部が基板処理域Aに位置した状態、(ハ)は基
板Bが基板処理域Aから導出された状態をそれぞれ示し
ている。
4A and 4B are explanatory views for explaining the operation of the present invention. FIG. 4A shows a state immediately after the front end portion of the substrate B in the carrying direction has entered the substrate processing area A, and FIG. 4B shows the substrate B. The front and rear direction central portion of FIG. 3 is in the state of being located in the substrate processing area A, and FIG.

【0029】まず、図4の(イ)に示すように、搬送ロ
ーラ5の駆動により上流側(左方)の基板通過口11を
介して第1次水洗槽21内に導入されて基板処理域Aに
侵入した基板Bは、その搬送方向前端部の上位側に洗浄
水ポンプ23(図1、図2)の駆動で洗浄水管路22a
を通して液吐出部材6の洗浄水吐出口65から吐出され
た洗浄水Lが供給され、基板Bの前先端側の表面を上位
側から下位側に向けて洗浄水Lが流下し、これによって
基板Bの洗浄処理が行われる。処理後の洗浄水Lは基板
Bの下位側端縁を通って第1次水洗槽21の底部に落下
する。そして、洗浄水Lは基板Bの傾斜に沿って流下す
るため、洗浄水Lが基板Bの表面を伝って基板Bの後端
縁から第1次水洗槽21外に漏れ出るという不都合が回
避される。
First, as shown in FIG. 4A, the transfer roller 5 is driven to be introduced into the primary washing tank 21 through the substrate passage port 11 on the upstream side (left side) and the substrate processing area. The substrate B that has entered A is washed water conduit 22a on the upper side of the front end portion in the transport direction by driving the washing water pump 23 (FIGS. 1 and 2).
The cleaning water L discharged from the cleaning water discharge port 65 of the liquid discharging member 6 is supplied through the cleaning water L, and the cleaning water L flows down from the upper front surface of the substrate B toward the lower surface thereof. The cleaning process is performed. The treated cleaning water L passes through the lower edge of the substrate B and falls to the bottom of the primary water washing tank 21. Then, since the cleaning water L flows down along the inclination of the substrate B, the inconvenience that the cleaning water L leaks from the rear edge of the substrate B to the outside of the primary rinsing tank 21 along the surface of the substrate B is avoided. It

【0030】ついで、図4の(ロ)に示すように、搬送
ローラ5の駆動によって基板Bの中央部が基板処理域A
に位置した状態になると、液吐出部材6から吐出された
洗浄水Lは、基板B中央部の上位側端縁に供給され、こ
れによって基板Bの中央部が洗浄処理され、処理後の洗
浄水Lは基板Bの下位側端縁を通って第1次水洗槽21
の底部に落下する。そして、洗浄水Lは基板Bの傾斜に
沿って勢いよく流下し、下流側には液流となって向かわ
ないため、下流側の液吐出部材6を通過した基板Bの表
面は、洗浄水Lが極めて薄い薄膜状態で残留している状
態になっている。
Then, as shown in FIG. 4B, the central portion of the substrate B is moved to the substrate processing area A by driving the conveying roller 5.
When the cleaning liquid L is discharged from the liquid discharging member 6, the cleaning water L is supplied to the upper edge of the central portion of the substrate B, whereby the central portion of the substrate B is subjected to the cleaning treatment, and the cleaning water after the treatment is processed. L is the primary washing tank 21 passing through the lower edge of the substrate B.
Fall to the bottom of the. Then, the cleaning water L vigorously flows down along the inclination of the substrate B and does not flow toward the downstream side as a liquid flow. Therefore, the surface of the substrate B that has passed through the liquid discharge member 6 on the downstream side has the cleaning water L. Remains in a very thin film state.

【0031】さらに、図4の(ハ)に示すように、搬送
ローラ5の駆動で基板Bが完全に基板処理域Aから完全
に外れた状態になると、基板Bの表面はすでに洗浄水L
による洗浄処理が完了し、かつ、基板Bの表面には極め
て薄い薄膜状態の洗浄水Lが存在するのみの液切れ状態
になっているため、次工程である第2次水洗部3(図
1)での水洗処理時に洗浄水Lの洗浄水への混入量を最
小限に抑えることができるとともに、基板Bの表面が部
分乾燥することによる洗浄水Lに起因したパーティクル
の発生を確実に抑制することが可能になる。
Further, as shown in FIG. 4C, when the substrate B is completely removed from the substrate processing area A by driving the transport roller 5, the surface of the substrate B has already been washed with water L.
Since the cleaning process is completed, and the surface of the substrate B is in a liquid-runout state in which only a very thin thin film of cleaning water L exists, the secondary water cleaning unit 3 (FIG. The amount of the cleaning water L mixed into the cleaning water can be minimized at the time of the cleaning process in (1), and the generation of particles due to the cleaning water L due to the partial drying of the surface of the substrate B can be reliably suppressed. It will be possible.

【0032】本発明は、以上詳述したように、基板Bの
搬送方向に直交する面内で水平方向に対して傾斜配置さ
れた搬送ローラ5によって基板Bが第1次水洗槽21内
を傾斜姿勢で搬送されるに際し、基板Bの上位側の端縁
に液吐出部材6からの洗浄水Lをカーテン状(帯状)で
供給するように構成したものであるため、基板Bに供給
された洗浄水Lは、基板Bの傾斜面を上位側から下位側
に向けて流下し、この流下時に基板Bの表面が洗浄処理
されるとともに、洗浄水Lが傾斜に沿った流路、つまり
基板処理域Aから液流状態で外れることがなく、従っ
て、基板B上における基板処理域Aの上流側および下流
側に大量の洗浄水Lが移行しない状態で基板Bは搬送さ
れることになる。
In the present invention, as described in detail above, the substrate B is inclined in the primary washing tank 21 by the conveying roller 5 which is inclined with respect to the horizontal direction in the plane orthogonal to the conveying direction of the substrate B. Since the cleaning water L from the liquid discharge member 6 is supplied in a curtain shape (strip shape) to the upper edge of the substrate B when the substrate B is transported in the posture, the cleaning liquid supplied to the substrate B is cleaned. The water L flows down the inclined surface of the substrate B from the upper side to the lower side, and the surface of the substrate B is washed during this flow, and the washing water L is in the flow path along the inclination, that is, the substrate processing area. The substrate B is transported in a liquid flow state from A, and therefore the substrate B is transported in a state where a large amount of cleaning water L does not move to the upstream side and the downstream side of the substrate processing area A on the substrate B.

【0033】従って、従来のように、第1次水洗槽21
と第2次水洗槽31との境界部分に、エアナイフ等の液
切り手段を設けることなく、洗浄水Lの液切り処理が行
われることになり、設備コストの低減を図ることが可能
になるとともに、基板処理域Aの下流側の基板Bの表面
には極めて薄い洗浄水Lの薄膜層が形成されているた
め、第2次水洗槽31に移行するまでにエアの吹き付け
等が不要となるので、基板Bの表面が部分的に乾燥し、
これによってパーティクルが発生する等の不都合が生じ
ず、基板の汚染を有効に抑制する上での効果は大きい。
Therefore, as in the conventional case, the primary washing tank 21
The draining process of the wash water L is performed without providing a draining means such as an air knife at the boundary between the second washing tank 31 and the secondary washing tank 31, and the facility cost can be reduced. Since an extremely thin thin film layer of the cleaning water L is formed on the surface of the substrate B on the downstream side of the substrate processing area A, it is not necessary to blow air or the like before the transfer to the secondary water washing tank 31. , The surface of the substrate B is partially dried,
As a result, inconveniences such as generation of particles do not occur, and the effect of effectively suppressing the contamination of the substrate is great.

【0034】図5は、第1次水洗槽21内の処理液供給
手段の配置の他の実施形態を示す斜視図である。この実
施形態においては、液吐出部材6の基板搬送方向の中央
部に、処理液吐出域Aを幅方向に横断するように散水配
管(第2の処理液供給手段)60が配設され、液吐出部
材6からの洗浄水Lの吐出に加えてこの散水配管60か
らも基板Bに向けて散水されるようにしている。この散
水配管60は、その下面に複数の扇型、フルコーン型、
あるいはストレート型等の散水ノズル601を有し、こ
れらの散水ノズル601から洗浄水Lがスプレーされ
る。
FIG. 5 is a perspective view showing another embodiment of the arrangement of the treatment liquid supply means in the primary washing tank 21. In this embodiment, a sprinkling pipe (second processing liquid supply means) 60 is arranged in the central portion of the liquid discharge member 6 in the substrate transport direction so as to cross the processing liquid discharge area A in the width direction. In addition to the discharge of the cleaning water L from the discharge member 6, water is also sprayed toward the substrate B from this spray pipe 60. This sprinkling pipe 60 has a plurality of fan-shaped, full-cone-shaped,
Alternatively, it has a straight type sprinkling nozzle 601 and the washing water L is sprayed from these sprinkling nozzles 601.

【0035】このように液吐出部材6に加えて散水配管
60からも基板Bの主面に洗浄水Lを供給することによ
って、基板B上での洗浄水Lの流れに乱流が発生し、洗
浄水Lが十分に撹拌された状態で基板Bに接触するた
め、洗浄水Lによる処理効率を向上させることが可能に
なる。また、洗浄水Lの吐出圧による衝撃効果により、
基板Bに付着したパーティクル等の余剰物をより確実に
除去することができる。
As described above, by supplying the cleaning water L to the main surface of the substrate B not only from the liquid discharge member 6 but also from the sprinkling pipe 60, a turbulent flow occurs in the flow of the cleaning water L on the substrate B, Since the cleaning water L comes into contact with the substrate B in a state of being sufficiently stirred, it is possible to improve the processing efficiency of the cleaning water L. Also, due to the impact effect of the discharge pressure of the wash water L,
Excessive substances such as particles attached to the substrate B can be removed more reliably.

【0036】本発明は、上記の実施形態に限定されるも
のではなく、以下の内容をも包含するものである。
The present invention is not limited to the above-mentioned embodiment, but also includes the following contents.

【0037】(1)上記の実施形態においては、基板処
理装置10として第1次水洗槽21が適用されている
が、第1次水洗槽21に適用することに限定されるもの
ではなく、第2次水洗槽31に適用してもよい。
(1) In the above embodiment, the primary water washing tank 21 is applied as the substrate processing apparatus 10, but the invention is not limited to the application to the primary water washing tank 21. It may be applied to the secondary washing tank 31.

【0038】(2)上記の実施形態においては、処理液
として基板Bの表面を洗浄する洗浄水Lが用いられてい
るが、かかる洗浄水Lに代えて、処理液として現像液、
エッチング液、エッチング処理された基板Bの表面に被
着したレジスト膜を剥離する剥離液、あるいは剥離液を
置換するイソプロピルアルコール等の置換液または剥離
液を洗い流す純水であってもよい。
(2) In the above embodiment, the cleaning water L for cleaning the surface of the substrate B is used as the processing liquid. However, instead of the cleaning water L, a developing solution as the processing liquid,
It may be an etching solution, a stripping solution for stripping off the resist film deposited on the surface of the substrate B subjected to the etching treatment, or pure water for washing off a stripping solution or a substitution fluid such as isopropyl alcohol for replacing the stripping solution.

【0039】(3)上記の実施形態においては、液吐出
部材6は基板Bの表面側に設けられているが、これに加
えて基板Bの裏面側にも設けるようにしてもよい。
(3) In the above embodiment, the liquid ejection member 6 is provided on the front surface side of the substrate B, but in addition to this, it may be provided on the back surface side of the substrate B.

【0040】(4)上記の実施形態においては、基板処
理装置群1内において搬送ローラ5により傾斜姿勢で搬
送する基板Bの傾斜角度は略5°に設定されているが、
本発明は基板Bの傾斜角度を略5°に設定することに限
定されるものではなく、1°〜40°に設定してもよ
い。またより好ましくは3〜40°以上に傾斜させた方
が処理液の流下性が向上する。
(4) In the above embodiment, the inclination angle of the substrate B conveyed in the inclined posture by the conveying roller 5 in the substrate processing apparatus group 1 is set to about 5 °.
The present invention is not limited to setting the inclination angle of the substrate B to approximately 5 °, but may be set to 1 ° to 40 °. Further, more preferably, the inclination of 3 to 40 ° or more improves the flowability of the treatment liquid.

【0041】(5)上記の実施形態においては、液吐出
部材6から吐出される洗浄水Lによって基板Bの表面の
みが処理されるようになっているが、本発明は、基板B
の表面のみを処理することに限定されるものではなく、
搬送中の基板Bの裏面上位側に洗浄水Lを吐出する液吐
出部材を設け、この液吐出部材からの洗浄水Lの吐出に
よって基板Bの裏面をも処理するようにしてもよい。こ
うすることによって基板Bの裏面の上位側に吐出された
洗浄水Lは、基板Bの傾斜に沿って流下するため、支障
なく基板Bの裏面が洗浄処理される。
(5) In the above embodiment, only the surface of the substrate B is treated with the cleaning water L discharged from the liquid discharging member 6, but the present invention is not limited to this.
Is not limited to treating only the surface of
A liquid ejection member for ejecting the cleaning water L may be provided on the upper surface of the back surface of the substrate B which is being conveyed, and the back surface of the substrate B may be treated by ejecting the cleaning water L from the liquid ejection member. By doing so, the cleaning water L discharged to the upper side of the back surface of the substrate B flows down along the inclination of the substrate B, so that the back surface of the substrate B is cleaned without trouble.

【0042】(6)上記の実施形態においては、洗浄水
Lを帯状で液吐出部材6から吐出するようにしている
が、本発明は、このような液吐出部材6を採用すること
に限定されるものではなく、通常のコーンノズル、扇型
ノズル等から基板Bの上位側側縁部に向けて洗浄水Lを
吐出するようにしてもよい。
(6) In the above embodiment, the cleaning water L is discharged in the form of a strip from the liquid discharging member 6, but the present invention is not limited to the use of such a liquid discharging member 6. Alternatively, the cleaning water L may be discharged from a normal cone nozzle, a fan-shaped nozzle or the like toward the upper side edge of the substrate B.

【0043】[0043]

【発明の効果】請求項1記載の発明によれば、処理液
が、処理液供給手段により傾斜姿勢で搬送中の基板の上
位側端縁に向けて帯状で供給されるようにしているた
め、供給された処理液は、基板の主面を処理しつつ傾斜
に沿って流下し、基板の主面が均一に液流に曝され基板
の上流側に液流状態で移行することはなく、処理液供給
手段の上流側の基板主面上には薄膜状態で処理液が残留
するのみとなり、基板を次工程に搬送する前に実質的な
液切り処理が施された状態にすることができる。
According to the first aspect of the present invention, the processing liquid is supplied by the processing liquid supply means in a strip shape toward the upper edge of the substrate being conveyed in the inclined posture. The supplied processing liquid flows down along the slope while processing the main surface of the substrate, and the main surface of the substrate is not uniformly exposed to the liquid flow and does not move in the liquid flow state to the upstream side of the substrate. Only the processing liquid remains in a thin film state on the main surface of the substrate on the upstream side of the liquid supply means, and the substrate can be in a state of being substantially drained before being transferred to the next step.

【0044】従って、従来のように下流側の処理装置と
の間にエアナイフ等の液切り手段を設ける必要はなくな
り、その分、設備コストの低減を図ることができるよう
になるとともに、基板の主面に薄膜状態で処理液が残留
することにより基板主面の乾燥が抑制され、基板主面が
部分的に乾燥することによるパーティクルの発生を確実
に防止することができ、その結果パーティクルに起因し
た基板の再汚染が確実に防止される。
Therefore, it is not necessary to provide a liquid draining means such as an air knife between the processing apparatus on the downstream side as in the conventional case, and the equipment cost can be reduced accordingly, and the main substrate Drying of the substrate main surface is suppressed by leaving the treatment liquid in a thin film state on the surface, and it is possible to reliably prevent generation of particles due to partial drying of the substrate main surface. Recontamination of the substrate is reliably prevented.

【0045】請求項2記載の発明によれば、処理液供給
手段として搬送方向に所定長を有するスリット状の吐出
口が形成された液吐出部材が採用されているため、処理
液は液吐出部材から基板に帯状で吐出され、基板の主面
が均一に液流に曝されるようになり、バラツキの少ない
基板処理を行うことができる。
According to the second aspect of the invention, since the treatment liquid supply means is a liquid ejection member having a slit-shaped ejection port having a predetermined length in the carrying direction, the treatment liquid is ejected. Is discharged in a strip shape from the substrate to the substrate so that the main surface of the substrate is uniformly exposed to the liquid flow, and the substrate can be processed with less variation.

【0046】請求項3記載の発明によれば、基板載置面
を横断する方向に延びる第2の処理液供給手段を配設し
たため、第2の処理液供給手段からの基板主面への散液
によって処理液は主面上で乱流状態になり、これによっ
て処理液と基板主面との接触状態が均一になり、処理液
による基板主面の処理効率を向上させることができる。
According to the third aspect of the present invention, since the second processing liquid supply means extending in the direction crossing the substrate mounting surface is provided, the second processing liquid supply means disperses the liquid onto the main surface of the substrate. The liquid causes the processing liquid to be in a turbulent state on the main surface, which makes the contact state between the processing liquid and the main surface of the substrate uniform, thereby improving the processing efficiency of the main surface of the substrate by the processing liquid.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係る基板処理装置が適用された基板処
理装置群の一実施形態を示す説明図である。
FIG. 1 is an explanatory diagram showing an embodiment of a substrate processing apparatus group to which a substrate processing apparatus according to the present invention is applied.

【図2】第1次水洗槽の一実施形態を示す一部切欠き斜
視図である。
FIG. 2 is a partially cutaway perspective view showing an embodiment of a primary washing tank.

【図3】液吐出部材の一実施形態を示す一部切欠き斜視
図である。
FIG. 3 is a partially cutaway perspective view showing an embodiment of a liquid discharge member.

【図4】本発明の作用を説明するための説明図であり、
(イ)は基板の搬送方向前端部が基板処理域に侵入した
直後の状態、(ロ)は基板の前後方向の中央部が基板処
理域に位置した状態、(ハ)は基板が基板処理域から導
出された状態をそれぞれ示している。
FIG. 4 is an explanatory diagram for explaining the operation of the present invention,
(A) is the state immediately after the front end of the substrate in the transport direction has entered the substrate processing area, (b) is the state in which the front-rear center of the substrate is located in the substrate processing area, and (c) is the substrate processing area. The respective states derived from are shown.

【図5】第1次水洗槽内の処理液供給手段の配置の他の
実施形態を示す斜視図である。
FIG. 5 is a perspective view showing another embodiment of the arrangement of the treatment liquid supply means in the primary washing tank.

【符号の説明】[Explanation of symbols]

1 基板処理装置群 10 基板処理装置 11 基板通過口 1a 薬液処理部 1b 薬液処理槽 2 第1次水洗部 21 第1次水洗槽 22 洗浄水貯留槽 22a 洗浄水管路 22b 洗浄水戻り管路 23 洗浄水ポンプ 24 フィルター 3 第2次水洗部 31 第2次水洗槽 32 純水供給ノズル 4 乾燥部 41 乾燥槽 42 エアナイフ 5 搬送ローラ 51 ローラ軸 52 側部ローラ 52a 鍔部 53 中央ローラ 54 Oリング 6 液吐出部材(処理液供給手段) 60 散水配管(第2の処理液供給手段) 61 部材本体 62 ノズル部 63 洗浄水供給管路 64 接続筒 65 洗浄水吐出口 A 処理液吐出域 B 基板 1 Substrate processing equipment group 10 Substrate processing equipment 11 Substrate passage port 1a Chemical processing part 1b Chemical treatment tank 2 First flush section 21 First flush tank 22 Wash water storage tank 22a washing water line 22b Wash water return line 23 Wash water pump 24 filters 3 Second washing section 31 Second flush tank 32 Pure water supply nozzle 4 drying section 41 Drying tank 42 Air knife 5 Conveyor rollers 51 roller shaft 52 side roller 52a collar part 53 Central roller 54 O-ring 6 Liquid discharge member (processing liquid supply means) 60 Sprinkling pipe (second processing liquid supply means) 61 body 62 nozzle 63 Washing water supply line 64 connection tube 65 Cleaning water outlet A Processing liquid discharge area B board

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) H01L 21/304 B05C 11/08 B08B 3/08 G02F 1/1333 B05C 5/02 ─────────────────────────────────────────────────── ─── Continuation of the front page (58) Fields surveyed (Int.Cl. 7 , DB name) H01L 21/304 B05C 11/08 B08B 3/08 G02F 1/1333 B05C 5/02

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 搬送方向に直交する面内で水平方向に対
して傾斜した基板載置面上を搬送される基板の主面に処
理液を供給して所定の処理を施す基板処理装置におい
て、上記基板載置面の上位側に、上記搬送方向に所定長
の帯状で処理液を上記基板に供給する処理液供給手段
設けられていることを特徴とする基板処理装置。
1. A substrate processing apparatus for supplying a processing liquid to a main surface of a substrate transported on a substrate mounting surface inclined with respect to a horizontal direction in a plane orthogonal to the transport direction to perform a predetermined process, A predetermined length in the carrying direction on the upper side of the substrate mounting surface
A strip with a processing solution treatment liquid supply means for supplying to said substrate
A substrate processing apparatus, wherein the substrate processing apparatus is provided .
【請求項2】 上記処理液供給手段は、上記搬送方向に
所定長を有するスリット状の吐出口が形成された液吐出
部材であることを特徴とする請求項1記載の基板処理装
置。
2. The substrate processing apparatus according to claim 1, wherein the processing liquid supply means is a liquid discharge member having a slit-shaped discharge port having a predetermined length in the carrying direction.
【請求項3】 請求項1または2記載の基板処理装置に
おいて、 上記基板載置面を横断する方向に延びる第2の処理液供
給手段を配設したことを特徴とする基板処理装置。
3. The substrate processing apparatus according to claim 1, further comprising a second processing liquid supply means extending in a direction traversing the substrate mounting surface.
JP07897296A 1996-04-01 1996-04-01 Substrate processing equipment Expired - Lifetime JP3447890B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP07897296A JP3447890B2 (en) 1996-04-01 1996-04-01 Substrate processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP07897296A JP3447890B2 (en) 1996-04-01 1996-04-01 Substrate processing equipment

Publications (2)

Publication Number Publication Date
JPH09270408A JPH09270408A (en) 1997-10-14
JP3447890B2 true JP3447890B2 (en) 2003-09-16

Family

ID=13676824

Family Applications (1)

Application Number Title Priority Date Filing Date
JP07897296A Expired - Lifetime JP3447890B2 (en) 1996-04-01 1996-04-01 Substrate processing equipment

Country Status (1)

Country Link
JP (1) JP3447890B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009248069A (en) * 2008-04-11 2009-10-29 Dainippon Screen Mfg Co Ltd Device and method for treating substrate
CN112246705B (en) * 2020-10-08 2021-06-29 谭锦 Artificial stone surface flat grinding and cleaning device

Also Published As

Publication number Publication date
JPH09270408A (en) 1997-10-14

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