JP3277247B2 - Method for creating an abnormality diagnosis reference pattern in an automated equipment system and an automatic diagnosis apparatus using the reference pattern - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for creating an abnormality diagnosis reference pattern in an automated equipment system operated by a sequencer and an automatic diagnosis apparatus using the created abnormality diagnosis reference pattern.

[0002]

2. Description of the Related Art Conventionally, in an automatic equipment system, a sequence program (control program) is generally executed by a sequencer to monitor the operation of the system. FIG. 12 schematically shows an example of the configuration of the automated equipment system. Here, free flow conveyor 10
A pallet 101 flows on the top 0, and for example, a production line is constituted by three processes of component insertion, caulking, and inspection.

[0003] In the component insertion process of the process 1, the pallet 10
After 1 arrives, the parts 104 supplied by the parts feeder 103 are gripped by the gripping jig 105 (chuck) using the biaxial cylinder 102 and inserted into the jig on the pallet 101. In the press-fitting process of process 2, pallet 1
01 arrives, and the press-in jig 107 is
Is pressed against the component 104 on the pallet 101 and caulking is performed.

In the inspection step 3, after the pallet 101 arrives, the inspection jig 109 is caulked to the part 104.
It is moved upward by the cylinder 108 to perform inspection. In such a system, the status change of the pallet arrival detection sensors X1, X2, X3 and the cylinder drive output contacts Y10, Y11, Y20, Y30 corresponding to each process are taken into the sequencer.
The state change of the component detection sensor X4 for detecting whether or not the component 104 has been supplied from the device is captured.

The operation of the sequencer will be described below.
The change of the pallet arrival detection sensor X1 from the off state to the on state is detected to detect that the pallet 101 has arrived at the process 1. Next, the component detection sensor X4 is turned on, and it is confirmed that the component 104 has been supplied.
The contact Y10 is turned off, the contact Y11 is turned on, the cylinder 102 is driven, and the gripping jig 105 is moved to the parts feeder 1.
Move to the component supply position 03. After the component 104 is gripped by the gripping jig 105, the contact Y10 is turned on.
The contact Y11 is turned off, and the pallet 101 is moved to the component insertion position to insert the component 104. Then, a series of operations for turning off both the contacts Y10 and Y11 and returning the gripping jig 105 to the original fixed position are repeated.

In step 2, when the sensor X2 detects a change from the off state to the on state, the contact Y20 is turned on, the press-fitting jig 107 is moved to the component position on the pallet 101, and caulking is performed. Turn off Y20,
A series of operations for returning the press-fitting jig 107 to the original home position is repeated. In step 3, the contact Y30 is turned on by detecting that the sensor X3 has changed from the off state to the on state, and the inspection jig 109 is moved to the component position on the pallet 101 for inspection, and then the contact Y30 is turned off. And inspection jig 1
09 is returned to the original home position.

As described above, in each process, the operation starts at an independent timing, and a series of operations is repeated. In such a system, the sensors X1 to X4 and the contacts Y10, Y11, Y20, Y3
The state change of 0 is recorded in time series, and based on this, abnormality diagnosis (failure diagnosis) is performed. For this purpose, a reference pattern is created in advance, and diagnosis is performed by comparison with the reference pattern.

Next, the reference pattern will be described.
FIG. 13 shows the state of each contact in a time chart. In this figure, between the ON change of the contact A and the next ON change (one cycle), the ON change and the OFF change of the contact B are performed once each, and the ON change and the OFF change of the contact C are performed twice each. It has become. As described above, when there is a contact (contacts B and C) whose number of state changes is always the same in each cycle with respect to the operation of the reference contact (contact A),
These can be used as reference patterns.

From the ON change of the contact A, the contact B turns on at the time T11 and turns off at the time T12, the contact C turns on at the times T21 and T23, and
It turns off at times T22 and T24. As described above, when there is a contact (contacts B and C) in which the relative time during which the state changes relative to the operation of the reference contact (contact A) is always the same in each cycle, these can be used as a reference pattern.

Further, from the time when the contact A is turned on to the time when the next contact is changed, the contact A is turned off, the contact B is turned on, the contact C is turned on, the contact C is turned off, and the contact B is turned off. The order of the ON and OFF changes is determined so that the OFF change, the ON change of the contact C, and the OFF change of the contact C are performed. In this way, for the operation of the reference contact (contact A), the order in which the state changes is always the same in each cycle (contacts B and C).
If there are, these can be used as reference patterns.

The contact D is always on in a normal operation state, and when it is turned off, it can be determined that an abnormality has occurred. In this manner, a contact (contact D) whose state does not change in a normal state and its state can be used as a reference pattern. As described above, conventionally, there are four types of reference pattern creation methods, which are appropriately used for abnormality diagnosis.

[0012]

However, as described above,
The creation of the abnormality diagnosis reference pattern in the automated equipment system is manually performed while observing the recorded state changes of the sensors and the contacts, and thus has the following problems. First, the operation of the system is difficult to understand just by looking at the time chart, etc., so it is necessary to decipher the machine operation and the ladder program, which requires a lot of time and effort, and the skilled person works. Needed.

Second, since it takes time to create a reference pattern, more time is required when there are a plurality of facilities to be diagnosed, and if diagnosis cannot be started immediately after introduction, Because we ca n’t make improvements smoothly,
It was not practical. Third, since the reference pattern is manually created, an erroneous reference pattern may be created, and the diagnosis accuracy may be deteriorated. In the event of a failure, quick and reliable investigation may not be possible. .

Fourth, after the reference pattern is created, if the operation timing changes due to aging or adjustment of the machine, it is troublesome to recreate the reference pattern.
The present invention has been made in view of the above circumstances, and does not require any skill, can automatically and quickly create a reference pattern automatically, and can also automatically modify the created reference pattern It is an object of the present invention to provide a method for creating an abnormality diagnosis reference pattern in an equipment system and to provide an automatic diagnosis device using the reference pattern.

[0015]

In order to achieve the above-mentioned object, the present invention proposes a method for creating an abnormality diagnosis reference pattern in an automated equipment system. Claim 1 is a method for creating a reference pattern used for abnormality diagnosis of an automation equipment system operated by a sequencer, wherein each time the sequencer executes a predetermined sequence program, an internal contact of the sequencer and the system are generated. The state changes of the sequence elements such as control contacts and sensors in the inside are read out in time series and recorded as sequence state change information, and from these recorded sequence state change information, the operation of the specified sequence element is Then, other sequence elements having a certain regularity are extracted, and change information of the other sequence elements extracted for each specified sequence element is put together using information processing by a computer to form a reference pattern for diagnosis. Create automatically.

Here, the sequencer means a programmable controller (PC), a sequence controller, a programmable logic controller (PLC), or the like.
It includes a broad concept that includes all controllers and computers that monitor the operation of a series of control programs. The control contacts in the sequence element include external connection contacts such as valves, cylinders, and motors of equipment machines, and the sequence element includes register data in addition to internal contacts of the sequencer.

In the case where a series of sequence programs is present, other internal contacts related to the operation of the notable internal contacts, and control contacts of the system, when a series of sequence programs are present. Alternatively, it may be created for each interrelated block including the state change of the sensor. According to a second aspect of the present invention, when an abnormality of the sequence program executed by the sequencer is diagnosed by using the created diagnostic reference pattern in the first aspect, the sequencer does not detect the abnormality, When the result of the diagnosis performed using the reference pattern becomes abnormal, the diagnostic reference pattern for which the diagnosis result is determined to be abnormal is automatically corrected in accordance with a previously prepared correction width.

Since the sequencer generally has an abnormality monitoring function, when the sequencer executes a sequence program and makes a diagnosis using the created reference pattern, the sequencer does not determine any abnormality. On the other hand, when the diagnosis result is determined to be abnormal, the reference pattern in which the abnormality is determined can be corrected by giving priority to the determination of the sequencer.

According to a third aspect of the present invention, the corrected diagnostic reference patterns are sequentially stored, and if necessary, history information indicating a correction width at the time of correction can be read out and displayed. According to the fourth aspect, the created diagnostic reference patterns are stored in groups for each sequencer element.
It can be displayed according to the specified group division or rearranged as necessary.

Claims 5 to 7 are specific methods for creating the diagnostic reference pattern. In claim 5, the reference pattern for diagnosis is, for the specified sequence element,
It is created by extracting another sequence element having a certain regularity in the operation timing. For example, from the state change of the specified sequence element, a sequence element that always changes state after the same time has elapsed is extracted to create a reference pattern.

In claim 6, the reference pattern for diagnosis is:
For the specified sequence element, another sequence element having a certain regularity in the number of operations is extracted and created. For example, from the state change of the specified sequence element to the next state change, the sequence element whose state is changed always is extracted the same number of times to create a reference pattern. According to the seventh aspect, the reference pattern for diagnosis is created by extracting a sequence element having a certain regularity in both the operation timing and the number of operations with respect to the specified sequence element.

An eighth aspect of the present invention proposes an automatic diagnosis apparatus using the abnormality diagnosis reference patterns created in the first and fifth to seventh aspects. That is, this automatic diagnostic apparatus includes a sequencer for monitoring and controlling the automation equipment system, and each time a sequencer repeatedly executes a sequence program, information on changes in sequence elements such as internal contacts of the sequencer, control contacts in the system, and sensors. From the sequence element change information included in the repeatedly executed sequence program read and recorded in time series for each program and recorded. Data extracting means for extracting another sequence element having a certain regularity with respect to the operation of the above, based on the change information of other sequence elements extracted for each specified sequence element by the data extracting means. Creates diagnostic reference patterns according to the attributes of identified sequence elements And a reference pattern creating means that.

Thus, the abnormality can be quickly and accurately diagnosed using the created reference pattern, and the cause of a failure or the like can be investigated in a short time. Claim 8
Proposes only a basic configuration for implementing claim 1, but in order to implement the method invention proposed in claims 2, 3 and 4, automatic correction means for the reference pattern, Means for displaying history information indicating the correction range of
It is needless to say that an automatic diagnosis apparatus for realizing the method proposed in each claim can be realized by adding a reference pattern group division and rearrangement display means.

[0024]

Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 is a diagram showing sequence state change information in an automated equipment system operated by a sequencer. The sequence state change information is obtained by reading and recording the state change of the sequence elements such as the internal contacts of the sequencer, the control contacts in the system, and the sensors in time series every time the sequencer executes a predetermined sequence program. According to the present invention, from the recorded sequence state change information, another sequence element having a certain regularity is extracted for the operation of the specified sequence element, and for each of the specified sequence elements, The change information of other extracted sequence elements is put together to automatically create a diagnostic reference pattern.

In general, a series of sequence programs are executed a plurality of times, and internal contacts for executing the program, control contacts in the system, and state change data of sensors are collected, and then internal contacts serving as reference contacts of a reference pattern are obtained. Identify the contacts and extract other internal contacts with a certain regularity for the operation of the contacts, control contacts of the system and changes in the state of the sensors, but include the operation of the identified internal contacts The sequence program alone may be executed for a plurality of cycles, and other internal contacts having a certain regularity with respect to the operation of the internal contacts, control contacts of the system, and state changes of the sensors may be extracted.

That is, the reference pattern for diagnosis can determine the range in which diagnosis can be performed by selecting which internal contact among the internal contacts of the sequencer and selecting it as the reference contact. If a series of sequence programs consists of multiple processes, specifying all internal contacts that change state in each process as reference contacts can diagnose abnormalities in all equipment and sensors in that process. By focusing on only specific internal contacts, specifying them as reference contacts and creating a reference pattern in accordance with them, equipment that operates with a certain regularity to the operation of internal contacts specified as reference contacts It may be possible to diagnose only the operation abnormality of.

Also, it is also possible to select only an arbitrary sequence element as a reference element of the reference pattern. In this way, the reference pattern is created for each specific sequence element, and when the sequence element serving as the reference element is a contact, the contact rises, falls, the retention time after the rise, the retention time after the fall, and the like. Is defined according to the attribute (operation characteristic) of the.

In the figure, the reference contact is set to X1, and the diagnostic contacts Y10 and Y11 are extracted as a sequence element, and these are put together to create a reference pattern for diagnosis. Hereinafter, a specific method of creating the reference pattern for diagnosis will be sequentially described.

First, a case will be described in which a reference pattern for diagnosis is created by extracting another sequence element having a certain regularity in the number of operations for a specified sequence element. Here, a sequence element whose state changes is always extracted the same number of times from the state change of the specified sequence element to the next state change to create a reference pattern.

FIG. 2 shows the result of measuring the number of times of turning on and off the other contacts from the time when the reference contact X1 is turned on to the time when the next contact is turned on. That is, (n) to (n + 1), (n + 1) to (n + 2),
The number of ON / OFF of the other contacts X2 to X4, Y10, Y11, Y20, and Y30 during each cycle of (n + 2) to (n + 3),.

As a result, the contacts Y10 and Y11 must be 1
Since the on / off state changes each time, the contact X1 is used as a reference contact, and these are used to form a reference pattern. In addition, from the off change of the reference contact X1 to the next off change,
The on / off times of the other contacts may be measured, and the same operation as above may be repeated to create a reference pattern by sequentially using other contacts than X1 as reference contacts.

FIG. 3 shows a case where a diagnosis is made using the reference pattern created in this way. Here, the reference contact is X1 and the diagnostic contact is Y50. FIG. 3A shows a case where the diagnostic result is normal, and FIG. 3B shows a case where it is abnormal. When the sequencer is executing the sequence program, it captures the change information of the sequence element,
The acquired change information is compared with the created reference pattern, and if they match in the comparison with the reference pattern, it is determined that the change is normal.

In (a), the contact Y50 is normal because it is turned on and off once in cycle 1 and cycle 2 of the reference contact X1. On the other hand, in (b), the contact Y50 is normal. In this case, the number of times of on / off change is different, so that it is determined to be abnormal. Next, a case will be described with reference to FIGS. 4 to 6 where another sequence element having a certain regularity in operation timing is extracted from a specified sequence element to create a reference pattern for diagnosis. I do. Here, a sequence element that changes state after a lapse of the same time is extracted from the specified state change of the sequence element, and a reference pattern is created.

In FIG. 4, the time from when the reference contact X1 is turned on until the other contact is turned on and when it is turned off is measured. In this figure, it takes time T2 until the contact Y10 turns on and time T3 until the contact Y turns off and is always constant, so it is extracted as a diagnostic contact.
It is to be noted that the time T1 until the reference contact X1 itself is turned off is constant, which is also a condition for generating the reference pattern. In this case, the reference contact itself is also a diagnostic contact.

FIG. 5 is an example when the reference contact is X2. In this figure, after the reference contact X2 is turned on,
The contact Y20 always turns on after time T5, turns off after time T6, and the reference contact X2 itself turns off after time T4 to create a reference pattern. As shown in FIGS. 4 and 5, a reference pattern can be created by sequentially changing the reference contacts.

A contact whose on and off times are constant in each cycle after the reference contacts X1 and X2 are turned off may be used as a diagnostic contact.
The time until the state of X2 itself changes does not have to be the condition for creating the reference pattern. FIG. 6 shows a case where a diagnosis is made using the reference pattern created as described above. Here, the reference contact is X1 and the diagnostic contact is Y60. FIG. 6A shows a case where the diagnostic result is normal.
(B) shows a case where there is an abnormality.

Here, as in the case of FIG. 3, when the sequencer is executing the sequence program, the change information of the sequence element is fetched, and the fetched change information is compared with the created reference pattern. If they match in comparison with the pattern, it is determined to be normal.
In (a), when the reference contact X1 changes to ON, the contact Y60 always changes to ON after time t2, and changes to time t3.
Later changed off. Further, the contact X1 itself is also at the time t1.
It is normal since it has changed off later. On the other hand, (b)
Then, the time until the contact Y60 turns on after the reference contact X1 turns on, the time until the contact turns off, and the time until the contact X1 itself turns off after the reference contact X1 are indeterminate. Is determined (t2 ≠ t5, t3 ≠)
t6, t1 ≠ t4).

The reference pattern for diagnosis can be created by extracting a sequence element having a certain regularity in both the operation timing and the number of operations for the specified sequence element. The diagnostic contacts Y10 and Y20 extracted in FIGS. 4 and 5 have the regularity that they change on and off once each in one cycle (from the on change to the next on change) of the reference contacts X1 and X2. Therefore, the above conditions are also met.

Next, automatic correction of the reference pattern will be described. In this correction method, when the abnormality diagnosis of the sequence program executed by the sequencer is performed using the diagnostic reference pattern created by the method described above, the sequencer does not detect the abnormality,
When the result of the diagnosis performed using the reference pattern for diagnosis becomes abnormal, the reference pattern for diagnosis that has determined the diagnosis result to be abnormal can be automatically corrected according to a correction width prepared in advance. .

That is, when a diagnosis is performed using the created reference pattern while the sequence program is being executed by the sequencer, an abnormality is determined by the abnormality monitoring function of the sequencer even though the diagnosis result is determined to be abnormal. If not, the normality of the sequencer is prioritized, and the reference pattern for which abnormality has been determined is corrected. With this, even though the equipment machine is operating normally, the number of samples is small, or even if the diagnosis using the reference pattern is determined to be abnormal due to adjustment of machine operation or aging, etc. By correcting the reference pattern, the subsequent abnormality diagnosis can be continued.

Further, the correction of the reference pattern is not limited to the case where the diagnosis is abnormal. The reference pattern can be corrected by automatically collecting data from the sequencer periodically. The operation in this case is shown by a flowchart (steps 100 to 111) in FIG. Here, correction of a reference value (timing time and number of changes) as an element constituting the reference pattern is shown.

When data is collected from the sequencer (100), if the equipment is out of order, a diagnostic process is executed using the reference pattern (106), and the cause of the abnormality is displayed on the screen (107). If is operating normally, the reference pattern and reference value are recreated (102). here,
The reference value (108) created last time is compared with the reference value created this time (103). If they match, the reference value is not changed.
While waiting for the next data collection, if they do not match, it is determined which part is different (104), and if the number of changes is different, this reference value is not used from the next time (109). , If the timing times are different,
The time tolerance of the reference value is expanded (105).

The correction of the timing time may be performed in multiple stages according to a correction range prepared within an allowable error range prepared in advance. The correction of the reference pattern is not limited to this, and the number of changes (109) to be discarded differently from the previous value
If the condition of the reference value is satisfied, the reference value created this time may be used as an element of the reference pattern. Here, the changed reference value is stored in the corrected reference value (1).
10), the history of the changed portion can be displayed on the screen (111). That is, the corrected reference patterns are sequentially stored and displayed as history information indicating the correction width at the time of correction as needed.

FIG. 8 shows a screen display example at this time. Here, when the operation time of the contact point X1 (from turning on to turning off) is used as a reference value, a history of automatically correcting the reference value is shown by a line graph. This makes it easy to grasp that the production time is increasing due to aging, reviewing the sequence program,
Can help with the change.

Note that this display method is not limited to this. A plurality of reference values may be displayed on the same screen, and the history may be displayed in another graph (such as a bar graph) or a numerical value. You may. In addition, since the created diagnostic reference patterns can be stored by being grouped for each sequencer element, they can be displayed according to the specified group division or rearranged as necessary. FIG. 9 shows a screen display example at this time.

Here, group 1 is assigned to each sequence element.
3 are shown, and the contacts X1, X2, and X3 displayed at the top of each group are reference contacts, and the contacts Y1 displayed below these are the reference contacts.
1, Y10, Y20 and Y30 are diagnostic contacts. Incidentally, since the contacts Y11 and Y10 are rearranged in order of operation timing, the contact Y11 is displayed above the contact Y10. This rearrangement can be performed in the order of the number added to each contact or in the order of the process to which each contact belongs. It should be noted that the timing time and the number of changes, which are reference values, can be displayed together with numerical values on the screen.

Next, an automatic diagnosis apparatus using the abnormality diagnosis reference pattern created as described above will be described. Here, a programmable controller (hereinafter, referred to as “PC”) as a sequencer and a data collection device 10 as data collection means are connected by a cable C1, and the PC monitors the automation equipment system and repeats a series of sequence programs. Each time the program is executed, change information of sequence elements such as internal contacts of the sequencer, control contacts in the system, and sensors is read in time series for each program and recorded in the data collection device 10.

The data collection device 10 has a
A computer 20 having both data extraction means and reference pattern creation means is connected via a cable C2. This computer 20 is connected to a specified sequence element from the change information of the sequence elements recorded in the data collection device 10. For the above operation, another sequence element having a certain regularity is extracted, and a diagnostic reference pattern corresponding to the attribute of the specified sequence element is extracted based on the change information of the extracted other sequence element. create.

As a result, the computer 20 can quickly and accurately diagnose an abnormality using the created reference pattern, and can find the cause of a failure or the like in a short time. The reference pattern history information shown in FIG. 8 and the grouped reference patterns shown in FIG. 9 are displayed on a CRT or the like provided in the computer 20. Further, the process of creating the reference pattern shown in the other figures and the diagnosis result are also displayed on the CRT.

In the figure, 1 in the PC is a CPU for executing a sequence program and detecting change information of sequence elements, 2 and 3 are I / O units, and 4 is a dedicated interface for connecting to the data collection device 10. Unit. The dedicated interface unit 4 takes in the change information of the sequence element via the I / O units 2 and 3 and transfers it to the data collection device 10. When the dedicated interface unit 4 has the same configuration as the I / O board, wiring work for each contact is not required, and it is not necessary to add a ladder program.

The data collection device 10 selects predetermined data from the data sent from the PC and automatically records the data together with time information. This recording is performed while being sequentially updated in a RAM or the like including a ring buffer. Furthermore, changes in specific information received from the PC,
The recorded data is stored in a storage area so as not to be erased by operating a button provided on the data collection device 10 or the like.

The stored data is input to the computer 20. As described above, when the data collection device 10 collects data from the PC, when an abnormality (failure) occurs in the equipment, the computer 20 is connected to the data collection device 10 in which the abnormality has occurred in the equipment, and the data is created in advance. The cause of the abnormality can be analyzed according to the reference pattern.

FIG. 11 shows a configuration example of the operation panel of the data collection device 10. In the figure, 11 is a storage start button provided for each divided storage area in advance, 12 is an LED for lighting or blinking the presence or absence of storage information corresponding to each storage area, and 13 is for resetting data storage. Reset button. In such a configuration,
Even if the save start button 11 corresponding to the save area where the data is saved is operated, a new save is not started,
If the save start button 11 and the reset button 13 are simultaneously operated, only the corresponding save area may be reset.

[0054]

As can be understood from the above description, according to the method for creating an abnormality diagnosis reference pattern in the automated equipment system according to the first to seventh aspects of the present invention, the following effects are obtained. . According to the first aspect, every time the sequencer executes a predetermined sequence program, a state change of a sequence element such as an internal contact of the sequencer is read in time series and recorded as sequence state change information. For the specified sequence element operation, another sequence element having a certain regularity is extracted, and change information of the other sequence elements extracted for each specified sequence element is put together to provide a diagnostic reference pattern. Is created automatically.

As a result, it is not necessary to manually create an abnormality diagnosis reference pattern as in the related art, so that a reference pattern can be quickly and accurately created and used for abnormality diagnosis. According to the second aspect, the created diagnostic reference pattern can be automatically corrected according to the correction width prepared in advance, so that the number of samples for creating the reference data is small, Even if the operation timing of the equipment changes due to, for example, it is possible to automatically correct and respond.

According to the third aspect, since the correction width of the corrected reference pattern can be displayed as history information, it is possible to visually determine the life of the equipment and unstable operation that may cause an abnormality. According to the fourth aspect, since the reference patterns can be displayed according to the specified group division or rearranged, the automatic diagnosis method can be understood at a glance, and the analysis for abnormality (failure) can be performed smoothly.

According to the fifth aspect, the reference pattern is created by extracting, from the specified sequence element, another sequence element having a certain regularity in operation timing. , The reference pattern is created by extracting another sequence element having a certain regularity in the number of operations for the specified sequence element. According to claim 7, the reference pattern is the specified sequence. For the element, since it is created by extracting a sequence element having a certain regularity in both the operation timing and the number of operations,
By using the reference pattern created in this way, a reliable abnormality diagnosis can be performed.

According to the automatic diagnosis apparatus using the abnormality diagnosis reference pattern in the automated equipment system according to the present invention, the change information of the sequence element is collected, and a specific rule is applied to a specific sequence element from the collected information. It is possible to extract a sequence element having a property and automatically create a reference pattern from the extracted sequence element. As a result, abnormality diagnosis can be performed quickly and accurately using the created reference pattern, and the cause of a failure or the like can be determined in a short time.

[Brief description of the drawings]

FIG. 1 is a diagram for explaining a method of creating an abnormality diagnosis reference pattern.

FIG. 2 is a diagram showing a process of a method for creating an abnormality diagnosis reference pattern.

FIG. 3 is a diagram illustrating an abnormality diagnosis based on an abnormality diagnosis reference pattern created by the method shown in FIG. 2;

FIG. 4 is a diagram for explaining an example of another method for creating an abnormality diagnosis reference pattern.

FIG. 5 is a diagram for explaining another example using the same method for creating an abnormality diagnosis reference pattern as in FIG. 4;

FIG. 6 is a diagram illustrating an abnormality diagnosis based on an abnormality diagnosis reference pattern created by the method shown in FIG. 5 or FIG. 6;

FIG. 7 is a flowchart illustrating an operation of automatically correcting a reference pattern.

FIG. 8 is a diagram showing a display example of history information of a correction width of a reference pattern.

FIG. 9 is a diagram showing a display example of a reference pattern divided into groups.

FIG. 10 is a block diagram illustrating an example of a configuration of an automatic diagnosis device.

FIG. 11 is a diagram illustrating an example of a configuration of an operation panel of the data collection device.

FIG. 12 is a schematic diagram illustrating an example of a configuration of an automated facility system.

FIG. 13 is a diagram for explaining creation of a reference pattern.

[Explanation of symbols]

 T1 to T6: operation timing time PC: programmable controller 10: data collection device 20: computer

Continuation of front page (56) References JP-A-5-134740 (JP, A) JP-A-63-292205 (JP, A) JP-A-5-11835 (JP, A) JP-A-5-77143 (JP) JP-A-6-102927 (JP, A) JP-A-1-255905 (JP, A) JP-A-63-311510 (JP, A) (58) Fields investigated (Int. Cl. ⁷ , DB G05B 23/02 G05B 19/05

Claims (8)

(57) [Claims] 1. A method for creating a reference pattern used for abnormality diagnosis of an automated equipment system operated by a sequencer, the method comprising the steps of: The state changes of the sequence elements such as the control contacts and sensors inside are read in chronological order and recorded as sequence state change information. From the recorded sequence state change information, the operation of the specified sequence element is In addition, other sequence elements with a certain regularity are extracted, and change information of the other sequence elements extracted for each specified sequence element is summarized to automatically create a diagnostic reference pattern. A method for creating an abnormality diagnosis reference pattern in an automated equipment system characterized by the following. 2. The method according to claim 1, wherein when the abnormality diagnosis of the sequence program executed by the sequencer is performed using the created reference pattern for diagnosis, the sequencer does not detect the abnormality, When the result of diagnosis performed using the reference pattern becomes abnormal, the diagnostic reference pattern for which the diagnosis result is determined to be abnormal is automatically corrected according to a previously prepared correction width. The method of creating the abnormality diagnosis reference pattern in the automated equipment system. 3. The automated equipment system according to claim 2, wherein the corrected reference patterns for diagnosis are sequentially stored, and history information indicating a correction width at the time of correction is displayed as necessary. To create an abnormal diagnosis reference pattern. 4. The diagnostic reference pattern according to any one of claims 1 to 3, wherein the created diagnostic reference patterns are stored by being grouped for each sequencer element, and are arranged in accordance with the specified group division as necessary. A method for creating an abnormality diagnosis reference pattern in an automated equipment system that can be displayed in a different manner. 5. The diagnostic reference pattern according to claim 1, wherein the reference pattern for diagnosis is obtained by extracting another sequence element having a certain regularity in operation timing with respect to the specified sequence element. A method for creating an abnormality diagnosis reference pattern in an automated equipment system to be created. 6. The diagnostic reference pattern according to claim 1, wherein the diagnostic reference pattern is obtained by extracting another sequence element having a certain regularity in the number of operations with respect to the specified sequence element. A method for creating an abnormality diagnosis reference pattern in an automated equipment system to be created. 7. The diagnostic reference pattern according to claim 1, wherein the diagnostic reference pattern includes a sequence element having a certain regularity in both the operation timing and the number of operations with respect to the specified sequence element. A method for creating an abnormality diagnosis reference pattern in an automated equipment system that is created by extraction. 8. Each time a sequencer that monitors and controls an automated equipment system repeatedly executes a series of sequence programs, information on changes in sequence elements such as internal contacts of the sequencer, control contacts in the system, and sensors is stored in each program. Data acquisition means for reading and recording the sequence elements in chronological order, and among the change information of the sequence elements included in the repeatedly executed sequence program read by the data acquisition means, Data extracting means for extracting another sequence element having a certain regularity; and the data extracting means specifies the specified sequence element based on change information of the other sequence element extracted for each specified sequence element. Reference pattern for creating diagnostic reference patterns according to the attributes of sequence elements Automatic diagnostic apparatus using the at abnormality diagnosing reference pattern automated equipment system characterized by comprising a creation unit.