JP3270799B2 - Semiconductor light emitting device - Google Patents

Semiconductor light emitting device

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Publication number
JP3270799B2
JP3270799B2 JP7196095A JP7196095A JP3270799B2 JP 3270799 B2 JP3270799 B2 JP 3270799B2 JP 7196095 A JP7196095 A JP 7196095A JP 7196095 A JP7196095 A JP 7196095A JP 3270799 B2 JP3270799 B2 JP 3270799B2
Authority
JP
Japan
Prior art keywords
semiconductor layer
conductivity type
light emitting
emitting device
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP7196095A
Other languages
Japanese (ja)
Other versions
JPH08274374A (en
Inventor
喜文 尾藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
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Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP7196095A priority Critical patent/JP3270799B2/en
Publication of JPH08274374A publication Critical patent/JPH08274374A/en
Application granted granted Critical
Publication of JP3270799B2 publication Critical patent/JP3270799B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は半導体発光装置に関し、
特にページプリンタ用感光ドラムの露光源などに用いら
れる半導体発光装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor light emitting device,
In particular, the present invention relates to a semiconductor light emitting device used as an exposure source of a photosensitive drum for a page printer.

【0002】[0002]

【従来の技術】従来の半導体発光装置を図4および図5
に示す。図5は、図4のA−A線断面図である。図4お
よび図5において、21は基板、22は島状半導体層、
23は個別電極、24は共通電極である。
2. Description of the Related Art A conventional semiconductor light emitting device is shown in FIGS.
Shown in FIG. 5 is a sectional view taken along line AA of FIG. 4 and 5, 21 is a substrate, 22 is an island-shaped semiconductor layer,
23 is an individual electrode and 24 is a common electrode.

【0003】基板21は、例えばシリコン(Si)やガ
リウム砒素(GaAs)などの単結晶半導体基板などか
ら成る。
The substrate 21 is made of, for example, a single crystal semiconductor substrate such as silicon (Si) or gallium arsenide (GaAs).

【0004】島状半導体層22は、ガリウム砒素やアル
ミニウムガリウム砒素などの化合物半導体などから成
り、逆導電型不純物を含有する層22aと一導電型不純
物を含有する層22bから成る。逆導電型不純物を含有
する層22aと一導電型不純物を含有する層22bの界
面部分で半導体接合部が形成される。この島状半導体層
22は、例えばMOCVD法やMBE法で単結晶の半導
体層を形成した後に島状に形成される。
The island-shaped semiconductor layer 22 is made of a compound semiconductor such as gallium arsenide or aluminum gallium arsenide, and includes a layer 22a containing impurities of the opposite conductivity type and a layer 22b containing impurities of one conductivity type. A semiconductor junction is formed at the interface between the layer 22a containing the opposite conductivity type impurity and the layer 22b containing the one conductivity type impurity. The island-shaped semiconductor layer 22 is formed in an island shape after a single-crystal semiconductor layer is formed by, for example, MOCVD or MBE.

【0005】島状半導体層22の表面部分には、例えば
窒化シリコン膜などから成る保護膜25が形成されてお
り、この保護膜25の表面部分には、例えば金(Au)
などから成る個別電極23が形成されている。この個別
電極23は、島状半導体層22のうちの逆導電型不純物
を含有する層22aの上面部分から壁面部分を経由し
て、隣接する島状半導体層22から交互に基板21の端
面近傍まで延在するように形成されている。また、基板
21の裏面側のほぼ全面には、金(Au)などから成る
共通電極24が形成されている。
A protective film 25 made of, for example, a silicon nitride film or the like is formed on the surface of the island-shaped semiconductor layer 22, and the surface of the protective film 25 is formed of, for example, gold (Au).
An individual electrode 23 is formed. The individual electrodes 23 are alternately provided from the upper surface portion of the layer 22 a containing the impurity of the opposite conductivity type of the island-like semiconductor layer 22 to the vicinity of the end surface of the substrate 21 from the adjacent island-like semiconductor layer 22 via the wall surface portion. It is formed to extend. A common electrode 24 made of gold (Au) or the like is formed on almost the entire back surface of the substrate 21.

【0006】島状半導体層22、個別電極23および共
通電極24で個々の発光素子(発光ダイオード)が構成
され、基板21に一列状に並ぶように形成される。この
場合、例えば個別電極23が発光ダイオードのアノード
電極となり、共通電極24がカソード電極となる。な
お、個別電極23はその広幅部分においてワイヤボンデ
ィング法などで外部回路と接続される。
Each light emitting element (light emitting diode) is composed of the island-shaped semiconductor layer 22, the individual electrode 23 and the common electrode 24, and is formed on the substrate 21 so as to be arranged in a line. In this case, for example, the individual electrode 23 becomes the anode electrode of the light emitting diode, and the common electrode 24 becomes the cathode electrode. The individual electrode 23 is connected to an external circuit at a wide portion by a wire bonding method or the like.

【0007】このような半導体発光装置では、図5に示
すように、例えば個別電極23から共通電極24に向か
って順方向に電流を流すと、逆導電型不純物を含有する
層22aには電子が注入され、逆導電型不純物を含有す
る層22bには正孔が注入される。これら少数キャリア
の一部が多数キャリアと発光再結合することによって光
を生じる。また、列状に形成された発光素子のいずれか
を選択して発光させることによって、例えばページプリ
ンタ用感光ドラムの除電用光源として用いられる。
In such a semiconductor light emitting device, as shown in FIG. 5, when a current flows in a forward direction from, for example, the individual electrode 23 to the common electrode 24, electrons are contained in the layer 22a containing the impurity of the opposite conductivity type. Holes are implanted into the layer 22b containing the impurity of the opposite conductivity type. Some of these minority carriers emit light by radiative recombination with majority carriers. In addition, by selecting one of the light emitting elements formed in a row to emit light, the light emitting element is used as a light source for static elimination of a photosensitive drum for a page printer, for example.

【0008】なお、図5における共通電極24を基板2
1表面側に設けることもある。
The common electrode 24 shown in FIG.
It may be provided on one surface side.

【0009】[0009]

【発明が解決しようとする課題】ところが、この従来の
半導体発光装置では、一導電型不純物を含有する半導体
層22bは基板21を介して基板21の裏面側に形成さ
れた共通電極24に接続されているものの、逆導電型不
純物を含有する半導体層22aは、個別電極23に個々
に接続されていることから、発光素子を高精細化する
と、個別電極23の形成密度も上がり、それに伴って外
部回路との接続箇所が増えると共に、ワイヤボンディン
グの作業性が悪くなるという問題があった。例えば30
0dpi(dot per inch)の半導体発光装置である
と、島状半導体層22の配列ピッチは84.6μmとな
り、600dpiの半導体発光装置であると、島状半導
体層22の配列ピッチは42.3μmで300dpiに
比べて半分となり、個別電極23を細幅にせざるを得
ず、ワイヤボンディングの作業性が悪くなるという問題
があった。
However, in this conventional semiconductor light emitting device, the semiconductor layer 22b containing one conductivity type impurity is connected via the substrate 21 to the common electrode 24 formed on the back side of the substrate 21. However, since the semiconductor layer 22 a containing the impurity of the opposite conductivity type is individually connected to the individual electrode 23, when the light emitting element is refined, the formation density of the individual electrode 23 is increased, and the external density is accordingly increased. There is a problem that the number of connection points with the circuit increases and the workability of wire bonding deteriorates. For example, 30
In the case of a semiconductor light emitting device of 0 dpi (dot per inch), the arrangement pitch of the island-shaped semiconductor layers 22 is 84.6 μm, and in the case of a semiconductor light emitting device of 600 dpi, the arrangement pitch of the island-shaped semiconductor layers 22 is 42.3 μm. There is a problem that the individual electrode 23 has to be narrower than 300 dpi, and the workability of wire bonding is deteriorated.

【0010】また、個別電極23の数が増えれば、それ
に応じてワイヤボンディングの箇所が増え、ワイヤボン
ディング作業に長時間を要するという問題があった。
Further, if the number of individual electrodes 23 increases, the number of wire bonding locations increases accordingly, and there is a problem that the wire bonding operation requires a long time.

【0011】[0011]

【発明の目的】本発明は、このような従来技術の問題点
に鑑みて発明されたものであり、発光素子に接続される
個別電極の形成密度があがることを解消すると共に、ワ
イヤボンディング作業に長時間かかることを解消した半
導体発光装置を提供することを目的とする。
SUMMARY OF THE INVENTION The present invention has been made in view of the above-mentioned problems of the prior art, and eliminates an increase in the formation density of individual electrodes connected to a light emitting element, and has been developed for wire bonding. It is an object of the present invention to provide a semiconductor light emitting device which eliminates a long time.

【0012】[0012]

【課題を解決するための手段】上記目的を達成するため
に、請求項1に記載した発明では、一導電型半導体層と
逆導電型半導体層から成る島状半導体層を基板上に設
け、この一導電型半導体層に共通電極を接続して設ける
と共に、逆導電型半導体層に個別電極を接続して設けた
複数の発光ダイオードから成る半導体発光装置におい
て、前記一導電型半導体層上に、前記逆導電型半導体層
を前記一導電型半導体層よりも小面積に設け、この一導
電型半導体層上から前記基板上にかけて複数の群に分け
た群毎の一導電型半導体層に接続された共通電極を設け
ると共に、前記逆導電型半導体層上から前記基板上にか
けて異なる群に属する複数の逆導電型半導体層に接続さ
れた個別電極を設けた。
In order to achieve the above object, according to the first aspect of the present invention, an island-shaped semiconductor layer comprising a semiconductor layer of one conductivity type and a semiconductor layer of the opposite conductivity type is provided on a substrate. A semiconductor light-emitting device comprising a plurality of light-emitting diodes provided with a common electrode connected to the one-conductivity-type semiconductor layer and provided with an individual electrode connected to the opposite-conductivity-type semiconductor layer. The opposite conductivity type semiconductor layer is provided in a smaller area than the one conductivity type semiconductor layer, and is connected to the one conductivity type semiconductor layer in each of a plurality of groups divided from the one conductivity type semiconductor layer to the substrate. An electrode was provided, and individual electrodes connected to a plurality of opposite conductivity type semiconductor layers belonging to different groups were provided from the opposite conductivity type semiconductor layer to the substrate.

【0013】[0013]

【作用】請求項に記載した半導体発光装置では、発光素
子に接続される個別電極の密度が下がると共に、個別電
極の個数も少なくなり、ワイヤボンディング作業を短時
間で行うことができるようになる。
In the semiconductor light emitting device according to the present invention, the density of the individual electrodes connected to the light emitting element is reduced and the number of the individual electrodes is reduced, so that the wire bonding operation can be performed in a short time.

【0014】[0014]

【0015】[0015]

【実施例】以下、本発明の一実施例を添付図面に基づき
詳細に説明する。図1は、本発明に係る半導体発光装置
の一実施例を示す図であり、図2は図1のA−A線断面
図である。図1および図2において、1は基板、2は島
状半導体層、3は個別電極、4は共通電極である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below in detail with reference to the accompanying drawings. FIG. 1 is a view showing one embodiment of a semiconductor light emitting device according to the present invention, and FIG. 2 is a sectional view taken along line AA of FIG. 1 and 2, 1 is a substrate, 2 is an island-shaped semiconductor layer, 3 is an individual electrode, and 4 is a common electrode.

【0016】基板1は、例えばシリコン(Si)やガリ
ウム砒素(GaAs)などの単結晶半導体基板などから
成る。
The substrate 1 is made of, for example, a single crystal semiconductor substrate such as silicon (Si) or gallium arsenide (GaAs).

【0017】島状半導体層2は、ガリウム砒素やアルミ
ニウムガリウム砒素(GaAlAs)などの化合物半導
体膜から成り逆導電型不純物を含有する層2aと一導電
型不純物を含有する層2bから成る。逆導電型不純物を
含有する層2aと一導電型不純物を含有する層2bを界
面部分で半導体接合部が形成される。この島状半導体層
2は、例えばMOCVD法やMBE法などで単結晶の半
導体層を形成した後に、島状に形成される。すなわち、
まず、基板1の自然酸化膜を800℃から1000℃の
高温で除去する。次に、450℃以下の低温で核となる
アモルファスガリウム砒素をMOCVD法やMBE法で
厚み0.1〜2μm程度の厚みに成長させた後、500
℃から700℃まで昇温し、前記アモルファスガリウム
砒素を再結晶化し、ガリウム砒素単結晶を成長する(二
段階成長法)。次に、750℃から1000℃の高温で
のアニールと600℃以下の低温への急冷を数回繰り返
す(温度サイクル法)等のポストアニールを行う。この
場合、ガリウムの原料としてはトリメチルガリウム
〔(CH33Ga〕などが用いられ、砒素の原料として
はアルシン〔AlH3〕などが用いられ、アルミニウム
の原料としてはトリメチルアルミニウム〔(CH33
l〕などが用いられる。
The island-shaped semiconductor layer 2 comprises a layer 2a made of a compound semiconductor film such as gallium arsenide or aluminum gallium arsenide (GaAlAs) and containing a reverse conductivity type impurity and a layer 2b containing one conductivity type impurity. A semiconductor junction is formed at the interface between the layer 2a containing the impurity of the opposite conductivity type and the layer 2b containing the impurity of the one conductivity type. The island-shaped semiconductor layer 2 is formed in an island shape after forming a single-crystal semiconductor layer by, for example, MOCVD or MBE. That is,
First, the natural oxide film of the substrate 1 is removed at a high temperature of 800 ° C. to 1000 ° C. Next, after growing amorphous gallium arsenide serving as a nucleus at a low temperature of 450 ° C. or less by MOCVD or MBE to a thickness of about 0.1 to 2 μm,
The temperature is raised from 700C to 700C, and the amorphous gallium arsenide is recrystallized to grow a gallium arsenide single crystal (two-step growth method). Next, post-annealing such as repeating annealing at a high temperature of 750 ° C. to 1000 ° C. and rapid cooling to a low temperature of 600 ° C. or less several times (temperature cycle method) is performed. In this case, trimethylgallium [(CH 3 ) 3 Ga] or the like is used as a raw material of gallium, arsine [AlH 3 ] or the like is used as a raw material of arsenic, and trimethyl aluminum [(CH 3 ) is used as a raw material of aluminum. 3 A
l] etc. are used.

【0018】また、逆導電型不純物を含有する層2a
は、例えばZn、Cdなどの半導体不純物元素を1016
〜1019cm-3程度含有し、一導電型不純物を含有する
層2bは、S、Se、Te、Ge、Siなどの不純物元
素を1016〜1019cm-3程度含有する。
The layer 2a containing the impurity of the opposite conductivity type
Is, for example Zn, 10 a semiconductor impurity element such as Cd 16
The layer 2b containing about 10 to 10 19 cm -3 and containing one conductivity type impurity contains about 10 16 to 10 19 cm -3 of an impurity element such as S, Se, Te, Ge, and Si.

【0019】なお、この逆導電型不純物を含有する層2
aまたは一導電型不純物を含有する層2bは、化合物の
混晶比が異なる複数の層で形成してもよい。この逆導電
型不純物を含有する層2aは、一導電型不純物を含有す
る層2bよりも小面積に形成されている。すなわち、一
導電型不純物を含有する層2bもその表面が一部露出す
るように形成されている。
The layer 2 containing the impurity of the opposite conductivity type is
The layer 2b containing a or one conductivity type impurity may be formed of a plurality of layers having different compound crystal ratios. The layer 2a containing the impurity of the opposite conductivity type has a smaller area than the layer 2b containing the impurity of the one conductivity type. That is, the layer 2b containing the one-conductivity-type impurity is also formed so that its surface is partially exposed.

【0020】島状半導体層2の表面部分には、例えば窒
化シリコン膜などから成る保護膜5が形成されており、
この島状半導体層2のうちの一導電型不純物を含有する
層2bの露出部分から基板1の端面近傍まで延在するよ
うに例えば金(Au)などから成る共通電極4a、4b
が形成されている。島状半導体層2は、一つおきに共通
電極4a、4bに交互に接続されている。すなわち、島
状半導体層2を二つの群に分けて、この群ごとに共通電
極4a、4bを設けた格好になっている。
On the surface of the island-shaped semiconductor layer 2, a protective film 5 made of, for example, a silicon nitride film is formed.
Common electrodes 4a and 4b made of, for example, gold (Au) so as to extend from the exposed portion of layer 2b containing one conductivity type impurity in island-shaped semiconductor layer 2 to the vicinity of the end face of substrate 1.
Are formed. The island-shaped semiconductor layers 2 are alternately connected to the common electrodes 4a and 4b alternately. That is, the island-shaped semiconductor layer 2 is divided into two groups, and the common electrodes 4a and 4b are provided for each group.

【0021】また、島状半導体層2のうちの逆導電型不
純物を含有する層2aの表面から反対側の壁面を経由し
て反対側の端面近傍に延在するように、個別電極3が形
成されている。この個別電極3は、隣接する島状半導体
層2ごとに一つ形成されている。すなわち、異なる群に
属する半導体発光素子ごとに個別電極3を一つ設けてい
る。個別電極3の広幅部分が外部回路と接続するための
ワイヤボンディングを行う電極パットとなる。個別電極
3と共通電極4a、4bの組み合わせを選択することに
より、個々の半導体発光素子を選択して発光させること
ができる。
The individual electrode 3 is formed so as to extend from the surface of the layer 2a containing the impurity of the opposite conductivity type in the island-shaped semiconductor layer 2 to the vicinity of the opposite end face via the opposite wall face. Have been. One individual electrode 3 is formed for each adjacent island-shaped semiconductor layer 2. That is, one individual electrode 3 is provided for each semiconductor light emitting element belonging to a different group. The wide portion of the individual electrode 3 becomes an electrode pad for performing wire bonding for connection to an external circuit. By selecting a combination of the individual electrode 3 and the common electrodes 4a and 4b, individual semiconductor light emitting elements can be selected to emit light.

【0022】図3は、本発明に係る半導体発光装置の一
実施例を示す回路図である。図3において、11は半導
体発光素子、12はスイッチング用トランジスタ、13
はゲート回路、14はラッチ回路、15はシフトレジス
タである。この半導体発光装置の駆動回路では、発光/
非発光のデータ信号をDATA1、DATA2からシフ
トレジスタ15にCLOCK信号のタイミングで入力
し、LATCH信号のタイミングでラッチ回路14に引
き上げる。この発光/非発光のデータ信号とSTPB1
またはSTPB2の論理積により、スイッチング用トラ
ンジスタ12をオンするかしないかを決定し、オンする
場合は、VDD1から半導体発光素子11を経由してG
ND1またはGND2(共通電極4aまたは4b)へ選
択して電流を流す。
FIG. 3 is a circuit diagram showing one embodiment of the semiconductor light emitting device according to the present invention. 3, reference numeral 11 denotes a semiconductor light emitting element, 12 denotes a switching transistor, and 13 denotes a switching transistor.
Is a gate circuit, 14 is a latch circuit, and 15 is a shift register. In the driving circuit of this semiconductor light emitting device,
A non-emission data signal is input from DATA1 and DATA2 to the shift register 15 at the timing of the CLOCK signal, and is pulled up to the latch circuit 14 at the timing of the LATCH signal. The emission / non-emission data signal and STPB1
Alternatively, it is determined whether or not the switching transistor 12 is to be turned on by the logical product of STPB2.
A current is selectively passed to ND1 or GND2 (common electrode 4a or 4b).

【0023】上記実施例では、複数の半導体発光素子2
を二群に分けて二本の共通電極4a、4bに接続すると
共に、それぞれの群に属する半導体発光素子2を2個1
組で個別電極3に接続することについて述べたが、複数
の半導体発光素子2を3群若しくはそれ以上に分けて、
半導体発光素子2を3個1組若しくはそれ以上で個別電
極3に接続してもよい。
In the above embodiment, a plurality of semiconductor light emitting elements 2
Are divided into two groups and connected to the two common electrodes 4a and 4b, and two semiconductor light emitting elements 2 belonging to each group are connected to each other.
Although the connection to the individual electrodes 3 has been described as a set, the plurality of semiconductor light emitting elements 2 are divided into three groups or more.
The semiconductor light emitting elements 2 may be connected to the individual electrodes 3 in sets of three or more.

【0024】[0024]

【発明の効果】以上のように、請求項1に記載した半導
体発光装置によれば、一導電型半導体層上に逆導電型半
導体層を一導電型半導体層よりも小面積に設け、この一
導電型半導体層上から基板上にかけて複数の群に分けた
群毎の一導電型半導体層に接続された共通電極を設ける
と共に、逆導電型半導体層上から基板上にかけて異なる
群に属する複数の逆導電型半導体層に接続された個別電
極を設けたことから、電極パッドの形成密度が下がり、
ワイヤボンディングの作業性が良好になると共に、短時
間で行なうことができるようになり、島状半導体層を複
数の群に分けて共通電極に接続できると共に、個別電極
を異なる群に属する複数の島状半導体層ごとに設けるこ
とができるようになる。
As described above, according to the semiconductor light emitting device of the first aspect, the opposite conductivity type semiconductor layer is provided on the one conductivity type semiconductor layer in a smaller area than the one conductivity type semiconductor layer. A common electrode connected to one conductive semiconductor layer is provided for each group divided into a plurality of groups from the conductive semiconductor layer to the substrate, and a plurality of reverse electrodes belonging to different groups from the reverse conductive semiconductor layer to the substrate are provided. Since the individual electrodes connected to the conductive semiconductor layer are provided, the formation density of the electrode pads is reduced,
The workability of wire bonding is improved, and the work can be performed in a short time. The island-shaped semiconductor layers can be divided into a plurality of groups and connected to a common electrode, and the individual electrodes can be connected to a plurality of islands belonging to different groups. It can be provided for each semiconductor layer.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る半導体発光装置の一実施例を示す
図である。
FIG. 1 is a diagram showing one embodiment of a semiconductor light emitting device according to the present invention.

【図2】図1中のA−A線断面図である。FIG. 2 is a sectional view taken along line AA in FIG.

【図3】本発明に係る半導体発光装置の一実施例を示す
電気回路図である。
FIG. 3 is an electric circuit diagram showing one embodiment of a semiconductor light emitting device according to the present invention.

【図4】従来の半導体発光装置の一実施例を示す電気回
路図である。
FIG. 4 is an electric circuit diagram showing one embodiment of a conventional semiconductor light emitting device.

【図5】図4中のA−A線断面図である。FIG. 5 is a sectional view taken along line AA in FIG.

【図6】従来の半導体発光装置を示す電気回路図であ
る。
FIG. 6 is an electric circuit diagram showing a conventional semiconductor light emitting device.

【符号の説明】[Explanation of symbols]

1・・・基板、2・・・島状半導体層、3・・・個別電
極、4・・・共通電極
DESCRIPTION OF SYMBOLS 1 ... Substrate, 2 ... Island-shaped semiconductor layer, 3 ... Individual electrode, 4 ... Common electrode

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 一導電型半導体層と逆導電型半導体層か
ら成る島状半導体層を基板上に設け、この一導電型半導
体層に共通電極を接続して設けると共に、逆導電型半導
体層に個別電極を接続して設けた複数の発光ダイオード
から成る半導体発光装置において、前記一導電型半導体
層上に、前記逆導電型半導体層を前記一導電型半導体層
よりも小面積に設け、この一導電型半導体層上から前記
基板上にかけて複数の群に分けた群毎の一導電型半導体
層に接続された共通電極を設けると共に、前記逆導電型
半導体層上から前記基板上にかけて異なる群に属する複
数の逆導電型半導体層に接続された個別電極を設けたこ
とを特徴とする半導体発光装置。
1. An island-shaped semiconductor layer comprising a semiconductor layer of one conductivity type and a semiconductor layer of opposite conductivity type is provided on a substrate, a common electrode is connected to the semiconductor layer of one conductivity type, and In a semiconductor light emitting device including a plurality of light emitting diodes provided by connecting individual electrodes , the opposite conductivity type semiconductor layer is provided on the one conductivity type semiconductor layer in a smaller area than the one conductivity type semiconductor layer. A common electrode connected to one conductive semiconductor layer is provided for each group divided into a plurality of groups from the conductive semiconductor layer to the substrate and belongs to different groups from the reverse conductive semiconductor layer to the substrate. Duplicate
A semiconductor light emitting device, comprising: a plurality of individual electrodes connected to opposite conductivity type semiconductor layers .
JP7196095A 1995-03-29 1995-03-29 Semiconductor light emitting device Expired - Fee Related JP3270799B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7196095A JP3270799B2 (en) 1995-03-29 1995-03-29 Semiconductor light emitting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7196095A JP3270799B2 (en) 1995-03-29 1995-03-29 Semiconductor light emitting device

Publications (2)

Publication Number Publication Date
JPH08274374A JPH08274374A (en) 1996-10-18
JP3270799B2 true JP3270799B2 (en) 2002-04-02

Family

ID=13475559

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7196095A Expired - Fee Related JP3270799B2 (en) 1995-03-29 1995-03-29 Semiconductor light emitting device

Country Status (1)

Country Link
JP (1) JP3270799B2 (en)

Also Published As

Publication number Publication date
JPH08274374A (en) 1996-10-18

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