JP3264146B2 - Electronic component soldering method - Google Patents

Electronic component soldering method

Info

Publication number
JP3264146B2
JP3264146B2 JP17850395A JP17850395A JP3264146B2 JP 3264146 B2 JP3264146 B2 JP 3264146B2 JP 17850395 A JP17850395 A JP 17850395A JP 17850395 A JP17850395 A JP 17850395A JP 3264146 B2 JP3264146 B2 JP 3264146B2
Authority
JP
Japan
Prior art keywords
electronic component
substrate
conductor
soldering
solder bumps
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP17850395A
Other languages
Japanese (ja)
Other versions
JPH0936537A (en
Inventor
壽雄 西
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Corp
Panasonic Holdings Corp
Original Assignee
Panasonic Corp
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Panasonic Corp, Matsushita Electric Industrial Co Ltd filed Critical Panasonic Corp
Priority to JP17850395A priority Critical patent/JP3264146B2/en
Publication of JPH0936537A publication Critical patent/JPH0936537A/en
Application granted granted Critical
Publication of JP3264146B2 publication Critical patent/JP3264146B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/303Surface mounted components, e.g. affixing before soldering, aligning means, spacing means
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3431Leadless components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/40Forming printed elements for providing electric connections to or between printed circuits
    • H05K3/42Plated through-holes or plated via connections

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、バンプを備えた電子部
品の半田付け方法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for soldering electronic components having bumps.

【0002】[0002]

【従来の技術】BGA(ボールグリッドアレイ)のよう
に、下面に突出する複数の半田バンプを備えた電子部品
を基板に半田付けする工法が行われている。以下従来の
この工法の問題点を図4を参照しながら、説明する。
2. Description of the Related Art A method of soldering an electronic component having a plurality of solder bumps projecting from a lower surface, such as a BGA (ball grid array), to a substrate has been performed. Hereinafter, problems of this conventional method will be described with reference to FIG.

【0003】図4(a)〜(c)は、従来の電子部品の
半田付け方法の工程説明図である。図4において、1は
基板、2は基板1の表面に形成された電極、3は下面に
複数の半田バンプ4を備える電子部品である。
FIGS. 4 (a) to 4 (c) are views for explaining steps of a conventional method for soldering electronic components. In FIG. 4, reference numeral 1 denotes a substrate, 2 denotes an electrode formed on the surface of the substrate 1, and 3 denotes an electronic component having a plurality of solder bumps 4 on a lower surface.

【0004】まずこの方法では、図4(a)に示すよう
に、位置決めされた基板1の電極2に半田バンプ4が位
置合わせされた後、電子部品3の半田バンプ4が電極2
上に搭載される。
In this method, first, as shown in FIG. 4A, after the solder bumps 4 are aligned with the electrodes 2 of the substrate 1 which has been positioned, the solder bumps 4 of the electronic component 3 are connected to the electrodes 2.
Mounted on top.

【0005】そして、図示していないリフロー装置など
の加熱手段によって、半田の溶融温度以上に一旦加熱し
た後冷却することにより、半田バンプ4を溶融させた後
固化させて半田バンプ4により基板1に電子部品3を半
田付けするようになっている。
The solder bumps 4 are melted and solidified by heating once by a heating means such as a reflow device (not shown) or the like at a temperature equal to or higher than the melting temperature of the solder, and then solidified on the substrate 1 by the solder bumps 4. The electronic component 3 is soldered.

【0006】[0006]

【発明が解決しようとする課題】ところが、従来の半田
付け方法では、図4(b)に示すように、固化した半田
バンプ4がタイコ形のフィレット形状となることが多か
った。このタイコ形のフィレット形状となると、電極2
と半田バンプ4との境界付近において、断面形状が不連
続かつ急激に変化し、この付近に応力が集中しやすい。
また、電子部品3と基板1の熱膨張係数が大きく相違す
るので、後工程において加熱した際に、図4(c)に示
すように、半田バンプ4において熱応力が集中して、半
田バンプ4にクラック5が発生し、半田付けの信頼性が
低下するという問題点があった。
However, in the conventional soldering method, as shown in FIG. 4 (b), the solidified solder bumps 4 often have a Tyco-shaped fillet shape. When this Tyco-shaped fillet shape is obtained, the electrode 2
In the vicinity of the boundary between the solder bump 4 and the solder bump 4, the cross-sectional shape changes discontinuously and rapidly, and stress tends to concentrate near this.
Further, since the thermal expansion coefficients of the electronic component 3 and the substrate 1 are greatly different from each other, when heating is performed in a subsequent step, as shown in FIG. In addition, there is a problem that cracks 5 are generated and reliability of soldering is reduced.

【0007】そこで本発明は、信頼性の高い電子部品の
半田付け方法を提供することを目的とする。
It is an object of the present invention to provide a highly reliable method for soldering electronic components.

【0008】[0008]

【課題を解決するための手段】本発明の電子部品の半田
付け方法は、基板に、電極に連続し、かつ基板を貫通す
るスルーホールを設けておき、少なくとも半田バンプを
溶融させる際、電子部品と基板との間に、基板に対する
電子部品の高さを規定する高さ規定部材を介在させ、溶
融した半田バンプが前記スルーホールに流れ込むことに
より生じる電子部品の沈み込みを前記高さ規定部材で阻
止し、且つ溶融した半田バンプの一部を前記スルーホー
ルに流れ込ませることにより半田バンプの体積を減少さ
せて半田バンプをツヅミ形のフィレット形状とする。
According to a method of soldering an electronic component of the present invention, a through hole is formed in a substrate so as to be continuous with an electrode and penetrate the substrate. and between the substrate, it is interposed the height regulating member which defines the height of the electronic component to the substrate, solvent
The molten solder bumps flow into the through holes
The height of the electronic component is reduced
Stop and part of the molten solder bumps
To reduce the volume of solder bumps.
So it shall be the hourglass shape of the fillet shape of the solder bumps.

【0009】[0009]

【作用】上記構成により、基板の電極上に電子部品の半
田バンプが搭載された後、半田バンプを溶融させてその
後固化させるのであるが、半田バンプが溶融した際にス
ルーホール内に半田バンプの一部が流れ込み、流れ込ん
だだけ半田バンプの実質的な体積が減少する。
According to the above configuration, after the solder bumps of the electronic component are mounted on the electrodes of the substrate, the solder bumps are melted and then solidified. When the solder bumps are melted, the solder bumps are placed in the through holes. Part of the solder bumps flow, and the substantial volume of the solder bumps decreases as much as the flow.

【0010】このため、電子部品はやや下方に沈み込
み、電子部品が高さ規定部材に接触し、ある高さ以下に
下降できなくなる。一方、溶融した半田バンプは、電子
部品の高さにかかわらずスルーホール内に流れ込む。そ
の結果、さらに電子部品と電極間に存在する実質的な半
田バンプの体積が少なくなり、半田バンプはタイコ形で
なくより体積が少ない際のツヅミ形のフィレット形状と
なる。
Therefore, the electronic component sinks slightly downward, and the electronic component comes into contact with the height defining member and cannot be lowered below a certain height. On the other hand, the molten solder bump flows into the through hole regardless of the height of the electronic component. As a result, the volume of the substantial solder bump existing between the electronic component and the electrode is further reduced, and the solder bump has a fillet shape of a knob shape when the volume is smaller, instead of a Tyco shape.

【0011】このツヅミ形のフィレット形状となると、
後工程において加熱した際に応力集中が生じにくく、ク
ラックの発生を抑制し半田付けの信頼性を向上すること
ができる。
When this knob-shaped fillet shape is obtained,
Stress concentration is less likely to occur when heated in a later step, so that cracks can be suppressed and soldering reliability can be improved.

【0012】[0012]

【実施例】以下、本発明の実施例について図面を参照し
ながら説明する。
Embodiments of the present invention will be described below with reference to the drawings.

【0013】図1(a)〜(c)は、本発明の一実施例
における電子部品の半田付け方法の工程説明図である。
なお、本実施例において従来の構成を示す図4の同様の
構成要素については、同一符号を付すことにより説明を
省略する。
FIGS. 1 (a) to 1 (c) are views for explaining steps of a method for soldering electronic components according to an embodiment of the present invention.
In this embodiment, the same components as those in FIG. 4 showing the conventional configuration are denoted by the same reference numerals, and the description is omitted.

【0014】まず図1に示すように、本実施例では、電
極2に連続し、かつ基板1を貫通するスルーホール6が
形成してある。このスルーホール6は電極2の中心に対
して同軸的に形成されている。
First, as shown in FIG. 1, in this embodiment, a through-hole 6 which is continuous with the electrode 2 and penetrates the substrate 1 is formed. This through hole 6 is formed coaxially with the center of the electrode 2.

【0015】また7は高さ規定部材としての、スペーサ
である。高さ規定部材としては、スペーサ7のほかに、
電子部品3そのものから下向きに突起を突出させてもよ
いし、基板1そのものに上向きの突出部を設けたり、基
板1にテープなどを貼ってもよい。要するに、後述する
ように電子部品3が沈み込んだ際に、電子部品3を基板
1に対して、半田バンプ4よりも低い一定の高さに保持
できるものであればよい。
Reference numeral 7 denotes a spacer as a height defining member. As the height regulating member, in addition to the spacer 7,
A projection may be projected downward from the electronic component 3 itself, an upward projection may be provided on the substrate 1 itself, or a tape or the like may be attached to the substrate 1. In short, what is necessary is just to be able to hold the electronic component 3 with respect to the substrate 1 at a certain height lower than the solder bumps 4 when the electronic component 3 sinks as described later.

【0016】さて、従来の電子部品の半田付け方法と同
様に、半田バンプ4を備えた電子部品3を基板1上に搭
載するのであるが、あらかじめ搭載に先立ちスペーサ7
を基板1上に載置しておく。
The electronic component 3 having the solder bumps 4 is mounted on the substrate 1 in the same manner as the conventional method of soldering electronic components.
Is placed on the substrate 1.

【0017】次いで、図1(b)に示すように、電子部
品3の半田バンプ4を電極2上に搭載する。この際、基
板1の表面から電子部品3の下面までの高さを元の高さ
H2とすると、上述したようにスペーサ7の高さは元の
高さH2からやや低い規定高さH1となるようにしてあ
る。即ち、半田バンプ4を電極2上に搭載した状態で
は、電子部品3の下面はスペーサ7の上面からやや浮い
た状態にある。
Next, as shown in FIG. 1B, the solder bumps 4 of the electronic component 3 are mounted on the electrodes 2. At this time, assuming that the height from the surface of the substrate 1 to the lower surface of the electronic component 3 is the original height H2, the height of the spacer 7 is slightly lower than the original height H2 as described above. It is like that. That is, when the solder bumps 4 are mounted on the electrodes 2, the lower surface of the electronic component 3 is slightly floating from the upper surface of the spacer 7.

【0018】次に、基板1を図示していないリフロー装
置などに入れ、半田バンプ4を溶融させる。すると、図
1(c)に示すように、溶融した半田バンプ4の一部は
スルーホール6内に流れ込み、電子部品3と電極2の間
に存在する実質的な半田バンプ4の体積が減少する。こ
れにより、電子部品3は、元の高さH2から沈み込んで
ゆき、規定高さH1まで達する。しかしながら、電子部
品3と基板1の間には、スペーサ7が介在しているの
で、電子部品3は規定高さH1となった後、スペーサ7
に阻まれてさらに沈み込むことはできない。一方、溶融
した半田バンプ4は、電子部品3の高さに関わらず、ス
ルーホール6内に流れ込む。その結果、電子部品3と電
極2の間に存在する実質的な半田バンプ4の体積がかな
り少なくなり、図1(c)に示すように、半田バンプ4
はツヅミ形のフィレット形状となる。そして、基板1を
冷却し、ツヅミ形のフィレット形状としたまま、半田バ
ンプ4を固化させる。
Next, the substrate 1 is put into a reflow device (not shown) or the like, and the solder bumps 4 are melted. Then, as shown in FIG. 1C, a part of the melted solder bump 4 flows into the through hole 6, and the substantial volume of the solder bump 4 existing between the electronic component 3 and the electrode 2 is reduced. . As a result, the electronic component 3 sinks from the original height H2 and reaches the specified height H1. However, since the spacer 7 is interposed between the electronic component 3 and the substrate 1, the electronic component 3 reaches the specified height H1, and
I can't sink further. On the other hand, the molten solder bumps 4 flow into the through holes 6 regardless of the height of the electronic component 3. As a result, the substantial volume of the solder bump 4 existing between the electronic component 3 and the electrode 2 is considerably reduced, and as shown in FIG.
Has a knob-shaped fillet shape. Then, the substrate 1 is cooled, and the solder bumps 4 are solidified while keeping the knob-shaped fillet shape.

【0019】この後、加熱処理をしても、半田バンプ4
はツヅミ形のフィレット形状となっているので、応力集
中が生じにくく、クラックの発生を抑制して半田付けの
信頼性を向上することができる。
After that, the solder bump 4
Since it is in the shape of a fillet in the shape of a pin, stress concentration is unlikely to occur, cracks can be suppressed, and the reliability of soldering can be improved.

【0020】さて、電子部品3の下面に形成されている
半田バンプ4の形状は、必ずしも一様であるとは限らな
い。即ち、半田バンプ4を形成する際に、高さのばらつ
きを生じていることがある。その結果、一部の半田バン
プ4の半田付け不良が発生することがある。次に、この
ための半田付け状態の検査方法を図2、図3を参照しな
がら、説明する。なお、この検査は、通常半田バンプ4
の周囲に存在するフラックスを洗浄して取り除いた後に
行う。
The shape of the solder bumps 4 formed on the lower surface of the electronic component 3 is not always uniform. That is, when the solder bumps 4 are formed, variations in height may occur. As a result, soldering failure of some solder bumps 4 may occur. Next, a method of inspecting a soldering state for this purpose will be described with reference to FIGS. Note that this inspection is usually performed using the solder bump 4
The cleaning is performed after the flux existing around is removed by washing.

【0021】図2において、10は細長い針状の第1の
導電体であり、第1の導電体10の周囲には絶縁層11
が被覆され、第1の導電体10の上端部のみは外部に露
呈している。絶縁層11の外周には、筒状に形成され、
上部が斜めに切断された第2の導電体12が設けられて
いる。勿論第1の導電体10と第2の導電体12は、電
気的に絶縁されている。13は第1の導電体10と第2
の導電体12との間の抵抗値を計測する抵抗計である。
In FIG. 2, reference numeral 10 denotes an elongated needle-shaped first conductor, and an insulating layer 11 is provided around the first conductor 10.
And only the upper end of the first conductor 10 is exposed to the outside. The outer periphery of the insulating layer 11 is formed in a cylindrical shape,
A second conductor 12 whose upper portion is obliquely cut is provided. Of course, the first conductor 10 and the second conductor 12 are electrically insulated. 13 is the first conductor 10 and the second conductor 10
This is a resistance meter that measures a resistance value between the conductor 12 and the conductor 12.

【0022】そして、第1の導電体10を基板1の裏面
側からスルーホール6を通じて、半田バンプの下部に接
触させ、また第2の導電体12を電極2に接触させる。
ここで、図2の例では、図2左側の半田バンプ8は半田
付け良、右側の半田バンプ9は高さが不足して半田付け
不良となっている。
Then, the first conductor 10 is brought into contact with the lower part of the solder bump through the through hole 6 from the back side of the substrate 1, and the second conductor 12 is brought into contact with the electrode 2.
Here, in the example of FIG. 2, the solder bump 8 on the left side of FIG. 2 has good soldering, and the solder bump 9 on the right side has insufficient height, resulting in poor soldering.

【0023】なお、BGAなどの半田バンプを備えた電
子部品では、半田バンプが電子部品と基板の間に挟まれ
て、外部から観察することができず、不良の半田バンプ
9などがあっても、目視により半田付け不良と判定する
ことはきわめて難しい。
In an electronic component having a solder bump such as a BGA, the solder bump is sandwiched between the electronic component and the substrate and cannot be observed from the outside. It is extremely difficult to visually judge that the soldering is defective.

【0024】さて、本実施例の検査方法を半田バンプ8
について行うと、第1の導電体10は半田バンプ8の下
部に接触し、第2の導電体12は電極2に接触する。そ
して、半田バンプ8はしっかり電極2に半田付けされて
いるので、このときの抵抗計13が示す抵抗値は、ほと
んどゼロであり、第1の導電体10と第2の導電体12
が接触していることがわかる。この接触に基づいて、半
田バンプ8の半田付け状態は良であると判定する。
Now, the inspection method of this embodiment is applied to the solder bump 8
Then, the first conductor 10 contacts the lower part of the solder bump 8 and the second conductor 12 contacts the electrode 2. Since the solder bump 8 is firmly soldered to the electrode 2, the resistance value indicated by the resistance meter 13 at this time is almost zero, and the first conductor 10 and the second conductor 12
Are in contact with each other. Based on this contact, the soldering state of the solder bump 8 is determined to be good.

【0025】一方、半田バンプ9については、図2の鎖
線で示すように、第1の導電体10を半田バンプ9の下
部に接触させ、第2の導電体12を電極2に接触させた
際、抵抗計13が示す抵抗値は、ほどんど無限大とな
り、接触していないことが確認できる。これにより、半
田バンプ9は半田付け不良と判定するものである。
On the other hand, as shown by the dashed line in FIG. 2, when the first conductor 10 is brought into contact with the lower part of the solder bump 9 and the second conductor 12 is brought into contact with the electrode 2, as indicated by the chain line in FIG. The resistance value indicated by the resistance meter 13 becomes almost infinite, and it can be confirmed that there is no contact. Thus, the solder bump 9 is determined to be defective in soldering.

【0026】加えて、図3を参照しながら、半田付け不
良と判定された場合の補修方法について説明する。図2
の例では、上述したように半田バンプ9の半田付けが不
良と判定される。このとき、ノズル14から導電性ペー
スト15をスルーホール6を介して注入し、導電性ペー
スト15を電極2及び半田バンプ9に到達させる。この
導電性ペースト15としては、半田の溶融温度よりやや
低い約150℃程度で熱硬化するものが好適である。ま
た導電性ペースト15にかえて、溶融した半田を用いて
もよい。このようにすれば、不良と判定された半田バン
プ9の補修を行うことができる。なお、こののち、熱硬
化性の導電性ペースト15であれば、硬化温度まで加熱
して硬化させるものである。
In addition, a repairing method when it is determined that the soldering is defective will be described with reference to FIG. FIG.
In the example, the soldering of the solder bumps 9 is determined to be defective as described above. At this time, the conductive paste 15 is injected from the nozzle 14 through the through holes 6, and the conductive paste 15 reaches the electrodes 2 and the solder bumps 9. As the conductive paste 15, a paste that is thermoset at about 150 ° C., which is slightly lower than the melting temperature of the solder, is preferable. Further, molten solder may be used instead of conductive paste 15. In this way, it is possible to repair the solder bump 9 determined to be defective. After that, if the thermosetting conductive paste 15 is used, it is heated to a curing temperature to be cured.

【0027】[0027]

【発明の効果】本発明の電子部品の半田付け方法は、基
板に、電極に連続し、かつ基板を貫通するスルーホール
を設けておき、少なくとも半田バンプを溶融させる際、
電子部品と基板との間に、基板に対する電子部品の高さ
を規定する高さ規定部材を介在させ、溶融した半田バン
プが前記スルーホールに流れ込むことにより生じる電子
部品の沈み込みを前記高さ規定部材で阻止し、且つ溶融
した半田バンプの一部を前記スルーホールに流れ込ませ
ることにより半田バンプの体積を減少させて半田バンプ
をツヅミ形のフィレット形状とするようにしているの
で、確実にツヅミ形のフィレットを形成する半田付けを
行うことができ、応力集中によるクラックの発生を抑制
して、信頼性の高い半田付けを行うことができる。
According to the method of soldering an electronic component of the present invention, a through hole is provided on a substrate, which is continuous with an electrode and penetrates the substrate.
A height defining member for defining the height of the electronic component with respect to the substrate is interposed between the electronic component and the substrate, and the molten solder bump is provided.
Electrons generated by the pump flowing into the through hole
Submersion of parts is prevented by the height regulating member, and melting
Part of the solder bumps
By reducing the volume of the solder bumps,
Since the so that to the fillet of the clutch type, and can be reliably perform soldering to form a fillet of the clutch type, by suppressing the generation of cracks due to stress concentration, highly reliable soldering It can be carried out.

【図面の簡単な説明】[Brief description of the drawings]

【図1】(a)本発明の一実施例における電子部品の半
田付け方法の工程説明図 (b)本発明の一実施例における電子部品の半田付け方
法の工程説明図 (c)本発明の一実施例における電子部品の半田付け方
法の工程説明図
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1A is an explanatory view of a process of a method of soldering an electronic component according to an embodiment of the present invention. FIG. 1B is an explanatory view of a process of a soldering method of an electronic component according to an embodiment of the invention. Process explanatory drawing of the soldering method of the electronic component in one Example

【図2】本発明の一実施例における半田付け状態の検査
方法の工程説明図
FIG. 2 is a process explanatory view of an inspection method of a soldering state according to an embodiment of the present invention.

【図3】本発明の一実施例における補修方法の工程説明
FIG. 3 is an explanatory diagram showing steps of a repair method according to an embodiment of the present invention.

【図4】(a)従来の電子部品の半田付け方法の工程説
明図 (b)従来の電子部品の半田付け方法の工程説明図 (c)従来の電子部品の半田付け方法の工程説明図
FIG. 4A is a process explanatory view of a conventional electronic component soldering method. FIG. 4B is a process explanatory view of a conventional electronic component soldering method. FIG. 4C is a process explanatory view of a conventional electronic component soldering method.

【符号の説明】[Explanation of symbols]

1 基板 2 電極 3 電子部品 4 半田バンプ 6 スルーホール 7 スペーサ DESCRIPTION OF SYMBOLS 1 Substrate 2 Electrode 3 Electronic component 4 Solder bump 6 Through hole 7 Spacer

Claims (3)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】電子部品の下面に突出するように形成され
た半田バンプを基板の表面に形成された電極上に搭載
し、前記半田バンプを溶融させた後固化させて前記半田
バンプにより電子部品を前記基板に半田付けする電子部
品の半田付け方法であって、 前記基板に、前記電極に連続し、かつ前記基板を貫通す
るスルーホールを設けておき、少なくとも前記半田バン
プを溶融させる際、電子部品と前記基板との間に、前記
基板に対する電子部品の高さを規定する高さ規定部材を
介在させ、溶融した半田バンプが前記スルーホールに流
れ込むことにより生じる電子部品の沈み込みを前記高さ
規定部材で阻止し、且つ溶融した半田バンプの一部を前
記スルーホールに流れ込ませることにより半田バンプの
体積を減少させて半田バンプをツヅミ形のフィレット形
状とすることを特徴とする電子部品の半田付け方法。
An electronic component is mounted by mounting a solder bump protruding from a lower surface of an electronic component on an electrode formed on a surface of a substrate, and melting and solidifying the solder bump. A method of soldering an electronic component to the substrate, wherein the substrate is provided with a through hole that is continuous with the electrodes and penetrates the substrate, and when melting at least the solder bumps, A height defining member for defining the height of the electronic component with respect to the substrate is interposed between the component and the substrate, and the molten solder bump flows through the through hole.
Sinking of electronic components caused by
Prevent some solder bumps from being blocked by the specified members.
The solder bumps
Fillet-shaped solder bumps are reduced by reducing the volume
Soldering method of the electronic component, wherein Jo and to Rukoto.
【請求項2】前記高さ規定部材は、前記基板の上面上に
載置されるスペーサであることを特徴とする請求項1記
載の電子部品の半田付け方法。
2. The method according to claim 1, wherein the height defining member is a spacer mounted on an upper surface of the substrate.
【請求項3】記基板の裏面側から前記スルーホールを
通じて第1の導電体に対して前記半田バンプを接触さ
せ、前記第1の導電体に対して絶縁された第2の導電体
を前記電極に接触させ、前記第1の導電体と前記第2の
導電体との接触を検査し、接触がないときに半田付け不
良と判定することを特徴とする請求項1または2記載の
電子部品の半田付け方法。
Wherein said contacting the solder bump from the rear side of the front Stories substrate with respect to the first conductor through the through hole, said second conductor being insulated from said first conductor The method according to claim 1, wherein the first conductor and the second conductor are contacted with an electrode, and the contact between the first conductor and the second conductor is inspected .
Soldering only way of electronic components.
JP17850395A 1995-07-14 1995-07-14 Electronic component soldering method Expired - Fee Related JP3264146B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17850395A JP3264146B2 (en) 1995-07-14 1995-07-14 Electronic component soldering method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17850395A JP3264146B2 (en) 1995-07-14 1995-07-14 Electronic component soldering method

Publications (2)

Publication Number Publication Date
JPH0936537A JPH0936537A (en) 1997-02-07
JP3264146B2 true JP3264146B2 (en) 2002-03-11

Family

ID=16049609

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17850395A Expired - Fee Related JP3264146B2 (en) 1995-07-14 1995-07-14 Electronic component soldering method

Country Status (1)

Country Link
JP (1) JP3264146B2 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7372147B2 (en) * 2003-07-02 2008-05-13 Hewlett-Packard Development Company, L.P. Supporting a circuit package including a substrate having a solder column array
FR2884049B1 (en) * 2005-04-01 2007-06-22 3D Plus Sa Sa LOW THICK ELECTRONIC MODULE COMPRISING A STACK OF CONNECTING BIT ELECTRONIC BOXES
JP4760621B2 (en) * 2006-09-01 2011-08-31 セイコーエプソン株式会社 Tape circuit board manufacturing method and tape circuit board
KR100900182B1 (en) * 2007-12-13 2009-06-02 앰코 테크놀로지 코리아 주식회사 Semiconductor package
JP5458751B2 (en) * 2009-09-04 2014-04-02 富士通株式会社 Electronic device and manufacturing method thereof
CN103153001B (en) * 2013-02-05 2016-11-16 浙江宇视科技有限公司 A kind of pcb board processing method

Also Published As

Publication number Publication date
JPH0936537A (en) 1997-02-07

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