JP3258904B2 - Scattered light detector - Google Patents

Scattered light detector

Info

Publication number
JP3258904B2
JP3258904B2 JP09606396A JP9606396A JP3258904B2 JP 3258904 B2 JP3258904 B2 JP 3258904B2 JP 09606396 A JP09606396 A JP 09606396A JP 9606396 A JP9606396 A JP 9606396A JP 3258904 B2 JP3258904 B2 JP 3258904B2
Authority
JP
Japan
Prior art keywords
light
receiving element
scattered light
scattered
light receiving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP09606396A
Other languages
Japanese (ja)
Other versions
JPH09257684A (en
Inventor
達夫 伊串
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP09606396A priority Critical patent/JP3258904B2/en
Publication of JPH09257684A publication Critical patent/JPH09257684A/en
Application granted granted Critical
Publication of JP3258904B2 publication Critical patent/JP3258904B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、試料に対して光源
光を照射させ、その散乱光を受光素子列で検出する散乱
光検出器に関し、例えば試料中の粒度分布を測定するた
めの装置の技術分野に属する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a scattered light detector for irradiating a sample with light from a light source and detecting the scattered light with a light receiving element array, for example, an apparatus for measuring a particle size distribution in the sample. Belongs to the technical field.

【0002】[0002]

【従来の技術】円弧状に形成した複数個のフォトダイオ
ード等の受光素子E1 …(図3参照)を同心円上に扇形
状に配列したリングディテクタと称される散乱光検出器
が公知である。
2. Description of the Related Art A scattered light detector called a ring detector in which a plurality of light receiving elements E 1 ... (See FIG. 3) such as photodiodes formed in an arc shape are arranged concentrically in a fan shape is known. .

【0003】このような散乱光検出器では、透過光(レ
ーザ光)を集光させる中心位置に4分割の受光素子a〜
dを設け、それぞれの光出力を測定してそれらが等しく
なるように光源光の光軸を調整していた。
In such a scattered light detector, four divided light-receiving elements a to a are located at a central position for condensing transmitted light (laser light).
d, the optical output of each light source was measured, and the optical axis of the light source light was adjusted so that they became equal.

【0004】[0004]

【発明が解決しようとする課題】上述の透過光を受光す
る受光素子a〜dは透過光が移動する領域分の大きさが
必要であり、従って、光軸が100μm移動するレーザ
光には半径100μmの受光素子が必要とされる。
The above-mentioned light receiving elements a to d for receiving the transmitted light need to have a size corresponding to the area in which the transmitted light moves. Therefore, the radius of the laser light whose optical axis moves by 100 μm is required. A light receiving element of 100 μm is required.

【0005】しかるに、より粒子径の大きな情報を持っ
ている小角散乱光を測定するためには、光軸中心により
近い位置に受光素子を設けなければならないが、中心部
には上述の透過光受光用の受光素子a〜dが配置されて
いるため、その位置に散乱光検出用の受光素子を設置す
ることが出来ず、広い粒度分布の測定が出来ないという
問題があった。
However, in order to measure small-angle scattered light having information of a larger particle diameter, a light-receiving element must be provided at a position closer to the center of the optical axis. Since the light receiving elements a to d are arranged, the light receiving element for detecting scattered light cannot be installed at that position, and there is a problem that a wide particle size distribution cannot be measured.

【0006】本発明はこのような実情に鑑みてなされ、
より広い範囲で粒度分布の測定が可能な散乱光検出器を
提供することを目的としている。
The present invention has been made in view of such circumstances,
It is an object of the present invention to provide a scattered light detector capable of measuring a particle size distribution in a wider range.

【0007】[0007]

【課題を解決するための手段】本発明は上述の課題を解
決するための手段を以下のように構成している。すなわ
ち、光源光を試料に照射させ、その散乱光を、同心円上
に配置した複数の円弧状の受光素子よりなる受光素子列
で検出する散乱光検出器にあって、集光した透過光を軸
心位置で検出するための受光素子と、その受光素子の周
囲に同一円上に配置される三個以上の同一円弧状をなす
軸心調整用の受光素子と、少なくとも前記軸心調整用の
受光素子の一つを含む前記受光素子列とを同一平面上に
配置した素子基板が、前記光源光の光軸方向(Z方向)
に移動可能に構成されていることを特徴としている。
According to the present invention, means for solving the above-mentioned problems are constituted as follows. That is, a sample is irradiated with light from a light source, and the scattered light is detected by a light-receiving element array comprising a plurality of arc-shaped light-receiving elements arranged on concentric circles. A light-receiving element for detecting at the center position, a light-receiving element for adjusting the center of the three or more arcs arranged on the same circle around the light-receiving element, and a light-receiving element for adjusting the axis at least An element substrate on which the light receiving element row including one of the elements is arranged on the same plane is arranged in an optical axis direction (Z direction) of the light source light.
It is characterized by being constituted so that it can be moved.

【0008】[0008]

【発明の実施の形態】以下に本発明の散乱光検出器の実
施形態を図面を参照しつつ説明する。図3は、散乱光検
出器を用いた粒度分布測定装置の要部構成を示し、符号
1はレーザ光2を発するレーザ管、3はレーザ光2を適
宜拡大するビーム拡大器、4は試料5を収容するセル、
6はセル4の後方に設けられる集光レンズ、7は集光レ
ンズ6からの散乱光を検出するフォトダイオードからな
る複数の受光素子を配列してなる散乱光検出器、8は散
乱光検出器7からの信号を取り込むマルチプレクサ、9
はマルチプレクサ8からの信号が入力され、散乱光強度
パターンに基づいて演算を行って粒度分布を求めるCP
Uである。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the scattered light detector of the present invention will be described below with reference to the drawings. FIG. 3 shows a main configuration of a particle size distribution measuring apparatus using a scattered light detector. Reference numeral 1 denotes a laser tube that emits laser light 2, 3 denotes a beam expander that appropriately expands the laser light 2, and 4 denotes a sample 5. A cell containing
Reference numeral 6 denotes a condensing lens provided behind the cell 4, reference numeral 7 denotes a scattered light detector in which a plurality of light receiving elements including photodiodes for detecting scattered light from the condensing lens 6 are arranged, and reference numeral 8 denotes a scattered light detector. A multiplexer that takes in signals from 7, 9
Is a CP which receives a signal from the multiplexer 8 and performs a calculation based on the scattered light intensity pattern to obtain a particle size distribution.
U.

【0009】このような粒度分布測定装置においては、
セル4に試料5を収容して、レーザ光2を試料セル4に
対して照射すると、レーザ光2の一部がセル4内の試料
5中の粒子を照射して散乱光10となり、残りの光は粒
子と粒子との間を通過して透過光11となる。そして、
これら散乱光10および透過光11はともに、集光レン
ズ6を経て散乱光検出器7に至る。
In such a particle size distribution measuring device,
When the sample 5 is accommodated in the cell 4 and the laser light 2 is irradiated on the sample cell 4, a part of the laser light 2 irradiates the particles in the sample 5 in the cell 4 to become scattered light 10, and the remaining The light passes between the particles and becomes transmitted light 11. And
Both the scattered light 10 and the transmitted light 11 reach the scattered light detector 7 via the condenser lens 6.

【0010】上述の散乱光検出器7の受光素子の配置は
図1に示され、同図にて、符号21は集光された透過光
11を軸心位置で検出し、レーザ光の強度をモニターす
るための受光素子で概ねレーザ光の径と同等の大きさに
設定される。31,…は散乱光を検出するための受光素
子、Gは各受光素子間に設定されるアイソレーションギ
ャップ,32a,32bは受光素子32と同一円上に等
間隔で配置される軸心調整用の受光素子であり、これら
各受光素子が素子基板41(図2参照)の前面に配置さ
れている。
The arrangement of the light receiving elements of the above-mentioned scattered light detector 7 is shown in FIG. 1. In FIG. 1, reference numeral 21 denotes the condensed transmitted light 11 detected at the axial center position and the intensity of the laser light is detected. The light receiving element for monitoring is set to a size substantially equal to the diameter of the laser beam. Are light-receiving elements for detecting scattered light, G is an isolation gap set between the light-receiving elements, and 32a and 32b are for adjusting the axial center arranged at equal intervals on the same circle as the light-receiving element 32. These light receiving elements are arranged on the front surface of the element substrate 41 (see FIG. 2).

【0011】その素子基板41は、図2に示すように、
X,Y,Z方向に移動可能な移動ステージ42上に設け
られている。同図にて、43A,43Bは、ギヤボック
ス45を介してモータ44によって互いにY方向に相対
移動するYステージ対で、上述の素子基板41は一方の
Xステージ43Aに取り付けられている。46A,46
Bは、ギヤボックス47を介してモータ48によって互
いにX方向に相対移動するXステージ対、49A,49
Bは、ギヤボックス51を介してモータ50によって互
いにZ方向に相対移動するZステージ対であり、そのY
ステージ43BはXステージ46Aに、Xステージ46
BはZステージ49Aにそれぞれ固定されている。な
お、図示は省略するが、移動ステージ42はアクチュエ
ータとしてピエゾ素子を用いたものであってもよい。
The element substrate 41 is, as shown in FIG.
It is provided on a movable stage 42 that can move in the X, Y, and Z directions. In the figure, 43A and 43B are a pair of Y stages which are relatively moved in the Y direction by a motor 44 via a gear box 45, and the above-mentioned element substrate 41 is attached to one X stage 43A. 46A, 46
B is a pair of X stages, which are relatively moved in the X direction by a motor 48 via a gear box 47;
B is a pair of Z stages which are relatively moved in the Z direction by a motor 50 via a gear box 51,
The stage 43B is connected to the X stage 46A,
B is fixed to each of the Z stages 49A. Although not shown, the moving stage 42 may use a piezo element as an actuator.

【0012】上述のように構成される散乱光検出器7で
は、まず、中心に配置されている受光素子21によりZ
軸方向の焦点位置を確認しておき、光軸調整をおこなう
ときに、その受光素子21の他に、三つの受光素子3
2,32a,32bにもレーザ光が照射されるように散
乱光検出器7をZ方向に移動させ、集光されたレーザ光
を拡大させる。そして、それぞれ受光素子32,32
a,32bによって検出される光出力が等しくなるよ
う、X軸、Y軸方向に散乱光検出器7の位置を調整し、
レーザ光の中心に散乱光検出器7の位置合わせをおこな
う。その調整が完了後、Z軸方向の位置をそのまま元の
焦点位置に戻すことにより、光軸が調整された状態下
で、散乱光の検出が可能となる。
In the scattered light detector 7 configured as described above, first, the light receiving element 21 disposed at the center causes the Z
When the focal position in the axial direction is confirmed and the optical axis is adjusted, three light receiving elements 3 in addition to the light receiving element 21 are used.
The scattered light detector 7 is moved in the Z direction so that the laser beams are also irradiated to the laser beams 2, 32a and 32b, and the converged laser beam is enlarged. And the light receiving elements 32, 32, respectively
a, the position of the scattered light detector 7 is adjusted in the X-axis and Y-axis directions so that the light outputs detected by the
The position of the scattered light detector 7 is adjusted to the center of the laser light. After the adjustment is completed, the position in the Z-axis direction is returned to the original focal position as it is, so that the scattered light can be detected with the optical axis adjusted.

【0013】散乱光の検出時には、最も内側に配置され
ている受光素子31によって粒子径の大きな小角散乱光
の検出が可能となり、また、光軸調整に用いた受光素子
32によっても散乱光の検出が可能であることから、中
心部に近接した位置にまで散乱光検出領域を拡大するこ
とができ、粒度分布の測定可能範囲が大幅に拡大される
こととなった。なお、本実施形態では、光軸調整用とし
て3つの受光素子32,32a,32bを用いている
が、4つもしくはそれ以上用いてもよいことはいうまで
もない。
At the time of detecting the scattered light, the light receiving element 31 disposed at the innermost side can detect the small angle scattered light having a large particle diameter, and the light receiving element 32 used for adjusting the optical axis can also detect the scattered light. Is possible, the scattered light detection region can be expanded to a position close to the center, and the measurable range of the particle size distribution is greatly expanded. In the present embodiment, three light receiving elements 32, 32a, and 32b are used for adjusting the optical axis, but it goes without saying that four or more light receiving elements may be used.

【0014】ちなみに、光軸調整に関し、3つの受光素
子32,32a,32bによって検出される回析光の強
度を均等化するだけでなく、中心部の受光素子21によ
って検出されるレーザ光の強度が最大となるようにX,
Y,Z方向に光軸を調整することによっても光軸位置精
度の向上を図ることができる。
Incidentally, regarding the optical axis adjustment, not only is the intensity of the diffraction light detected by the three light receiving elements 32, 32a, 32b equalized, but also the intensity of the laser light detected by the light receiving element 21 at the center. X, so that
Adjusting the optical axis in the Y and Z directions can also improve the optical axis position accuracy.

【0015】[0015]

【発明の効果】以上説明したように、本発明の散乱光検
出器によれば、集光した透過光を軸心位置で検出するた
めの受光素子と、その受光素子の周囲に同一円上に配置
される三個以上の同一円弧状をなす軸心調整用の受光素
子と、少なくとも前記軸心調整用の受光素子の一つを含
む受光素子列とを同一平面上に配置した素子基板を前記
光源光の光軸方向(Z方向)と、その光軸方向と直交す
るX方向およびY方向に移動可能に構成しているので、
中心部に近い位置に散乱光検出用の受光素子を配置する
ことができ、よりコンパクトな装置で、粒度分布の測定
領域の拡大を図ることができる。
As described above, according to the scattered light detector of the present invention, the light receiving element for detecting the condensed transmitted light at the position of the axis and the light receiving element on the same circle around the light receiving element. An element substrate in which three or more light receiving elements for adjusting the center of the same arc and the light receiving element array including at least one of the light receiving elements for adjusting the center of the axis is arranged on the same plane. Since it is configured to be movable in the optical axis direction (Z direction) of the light source light and in the X direction and the Y direction orthogonal to the optical axis direction,
The light receiving element for detecting scattered light can be arranged at a position near the center, and the measurement area of the particle size distribution can be expanded with a more compact device.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の散乱光検出器の一実施形態における受
光素子の配置図である。
FIG. 1 is a layout diagram of a light receiving element in one embodiment of a scattered light detector of the present invention.

【図2】同散乱光検出器の斜視図である。FIG. 2 is a perspective view of the scattered light detector.

【図3】同粒度分布測定装置の構成図である。FIG. 3 is a configuration diagram of the particle size distribution measuring device.

【図4】従来の散乱光検出器の受光素子の配置図であ
る。
FIG. 4 is a layout view of a light receiving element of a conventional scattered light detector.

【符号の説明】[Explanation of symbols]

2…光源光、5…試料、10…散乱光、11…透過光、
21,31,32,33,34,35,36,37,3
2a,32b…受光素子、41…素子基板。
2: light source light, 5: sample, 10: scattered light, 11: transmitted light,
21, 31, 32, 33, 34, 35, 36, 37, 3
2a, 32b: light receiving element, 41: element substrate.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 光源光を試料に照射させ、その散乱光
を、同心円上に配置した複数の円弧状の受光素子よりな
る受光素子列で検出する散乱光検出器において、集光し
た透過光を軸心位置で検出するための受光素子と、その
受光素子の周囲に同一円上に配置される三個以上の同一
円弧状をなす軸心調整用の受光素子と、少なくとも前記
軸心調整用の受光素子の一つを含む前記受光素子列とを
同一平面上に配置した素子基板が、前記光源光の光軸方
向(Z方向)に移動可能に構成されていることを特徴と
する散乱光検出器。
A scattered light detector for irradiating a sample with light from a light source and detecting the scattered light with a light receiving element array comprising a plurality of arc-shaped light receiving elements arranged on concentric circles. A light-receiving element for detecting at the axial center position, a light-receiving element for adjusting the axial center having three or more same arcs arranged on the same circle around the light-receiving element, and at least for adjusting the axial center; A light-receiving element array including one of the light-receiving elements arranged on the same plane so as to be movable in an optical axis direction (Z-direction) of the light source light; vessel.
JP09606396A 1996-03-26 1996-03-26 Scattered light detector Expired - Fee Related JP3258904B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP09606396A JP3258904B2 (en) 1996-03-26 1996-03-26 Scattered light detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP09606396A JP3258904B2 (en) 1996-03-26 1996-03-26 Scattered light detector

Publications (2)

Publication Number Publication Date
JPH09257684A JPH09257684A (en) 1997-10-03
JP3258904B2 true JP3258904B2 (en) 2002-02-18

Family

ID=14154980

Family Applications (1)

Application Number Title Priority Date Filing Date
JP09606396A Expired - Fee Related JP3258904B2 (en) 1996-03-26 1996-03-26 Scattered light detector

Country Status (1)

Country Link
JP (1) JP3258904B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4818527B2 (en) * 2001-04-06 2011-11-16 株式会社堀場製作所 Scattering particle size distribution measuring device
JP6955385B2 (en) * 2017-07-14 2021-10-27 株式会社堀場製作所 Monitor device for adjusting light irradiation in particle analyzer

Also Published As

Publication number Publication date
JPH09257684A (en) 1997-10-03

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