JP3244049U - Amplifier electrical performance test equipment - Google Patents

Abstract

[Problem] To provide a highly practical amplifier electrical performance testing device that reduces testing personnel costs, simplifies testing procedures, and improves testing reliability. The test device includes a base (110), a bracket, a mounting base (120), a test stand, a slide assembly including a mounting seat (146) and a slide rod (145), and a push-pull quick clamp (160), the bracket being vertically attached to the base and mounting The platform is attached to the top surface of the base, the push-pull quick clamp is attached to the side of the bracket away from the base, the test platform is attached to the bracket via a slide assembly, the test platform is connected to the push-pull quick clamp, and the push-pull The quick clamp moves up and down along the length of the bracket. [Selection diagram] Figure 1

Description

TECHNICAL FIELD The present invention relates to the technical field of amplifier testing equipment, and more particularly to amplifier electrical performance testing equipment.

As a 100W amplifier is an important component of a certain type of power amplification component, the quality of the product is influenced by factors such as management, operation, and raw materials. Test the 100W amplifier electrical performance indicators independently before assembling the power amplification components, in order to find and deal with the faults that appear in the 100W amplifier as soon as possible, and ensure that the 100W amplifier inside the power amplification components can work normally. do.

The conventional electrical performance testing process for a 100W amplifier is as follows. Before the test, the electrical equipment assembly worker needs to weld the test wire, and during the test, the tester connects the test wire clamp on the test stand to the test wire corresponding to the 100W amplifier, and connects both sides of the 100W amplifier housing. After the test, the tester cuts the test wire on the test stand from the test wire of the 100W amplifier, removes the test waveguide, and then the electrical equipment assembly worker removes the solder. Remove the test wire and clean the corresponding pad. Once the above steps are completed, subsequent equipment assembly operations are possible.

Currently, the following problems exist in the process of 100W amplifier electrical performance testing.
(1) Labor costs are high. Before the test, the electrical equipment assembly worker must complete the welding of the five 100W amplifier test wires, and after the test, the electrical equipment assembly worker must return to the electrical equipment assembly process to remove the five test wires and clean the pad. be. The process is highly dependent on the electrical equipment assembly workers. Taking the 100W amplifier of the power amplification component of the model number as an example, one set of power amplification component includes eight 100W amplifiers, and the manufacturing of 40 test wires. , involved in welding and desoldering. As a result of calculation, the manufacturing time for one test wire is approximately 0.5 min, the welding operation time for one test wire is approximately 1 min, and the time for removing and cleaning the pad for one test wire is approximately 1 min. It is. As a result, one set of power amplification components requires a total of about 100 min of operation time for an electrical equipment assembly worker before and after testing. When calculated based on the throughput of 4 sets/day, the operating time of an electrical equipment assembly worker per day is approximately 400 min. At the same time, detaching the test wire increases the product transshipment process, increasing the dispatcher's workload and time costs.
(2) Test operations are complicated. In the testing process, it is necessary to repeatedly connect the 6 test wire clamps on the test stand to the 5 test wires of the 100W amplifier, which is complicated to operate, increases the product testing time, and reduces the workload of the tester. Increase work intensity and reduce product testing efficiency.
(3) Test reliability is poor. During the testing process, some test points are in a high current environment (approximately 12A), and if the connection is poor at the part where the test wire clamp pinches the test wire, it may cause discharge or ignition, resulting in a chip destruction accident. It's easy to do. After chip destruction, it is necessary to open the 100W amplifier and replace the damaged chip. In addition, repetitive operations in the mass production process tend to reduce the sensitivity of workers to quality and increase the frequency of human-induced quality problems. For example, welding errors or welding leaks in test wires, clamping errors or clamp leaks in test wire clamps, etc. Therefore, a device is needed to test for 100W amplifier electrical performance.

The purpose of this invention is to provide a device for testing the electrical performance of 100W amplifiers in order to save labor cost input, simplify test procedures, and improve test efficiency and reliability of test results. shall be.

The amplifier electrical performance testing device provided by the present invention includes a base, a bracket, a mounting base, a test stand, a slide assembly, and a push-pull quick clamp, wherein the bracket is vertically attached to the base, and the mounting base includes: attached to the top surface of the base, the push-pull quick clamp attached to the side of the bracket away from the base, the test stand attached to the bracket via the slide assembly, and the test stand attached to the The bracket is connected to a push-pull quick clamp, and is moved up and down along the length of the bracket by driving the push-pull quick clamp.

The present invention has the following technical effects.
(1) Reduce labor costs By using a spring probe instead of the test wire, there is no need to weld and desolder the 100W amplifier test wires (5 wires) before and after the test. Taking a 100W amplifier as an example of a power amplification component of the model number, there are a total of 6 workers in the conventional electrical equipment assembly process, and if the throughput is calculated as 4 sets/day, the work of the electrical equipment assembly workers is The time decreases from 66.7 min/(person/day) to 0.
(2) Simplify test operations and improve test efficiency Use push-pull quick clamps instead of attaching and detaching the test wire clamps on the test stand. During the testing process, the tester does not need to repeatedly connect the test wire clamp to the test wire. For example, the test throughput for a 100W amplifier of the power amplification component of the model number is increased from the conventional 4 sets/day per person to 5 sets/day per person, and work efficiency is improved by 25%.
(3) Improve test reliability The stable pressure provided by the spring probe and the probe's serrated head design ensure sufficient contact between the probe and the test pad during the test process, and the probe The welded seam on the tail eliminates the need to connect the test wire with the clamp, which avoids the phenomenon of poor connection between the clamp and the test wire, and avoids the accident of destroying the chip due to discharge or ignition that occurs during the testing process. In addition, the use of the testing device reduces the large number of repetitive operations in the production and testing stages, avoids the occurrence of low-level artificial quality problems, and has high practicality.

The drawings described herein are for further understanding of the present invention and are a part of the present invention, and the exemplary embodiments of the present invention and their descriptions are used to explain the present invention, and This does not limit the idea to fraud.
1 is a perspective view of an amplifier electrical performance testing device in an embodiment provided by the present invention; FIG. FIG. 2 is a side view of the amplifier electrical performance testing device in FIG. 1. FIG. FIG. 2 is a front view of the amplifier electrical performance testing device in FIG. 1. FIG.

In order to clarify the technical problems, technical solutions, and beneficial effects to be solved by the present invention, the present invention will be described in more detail below with reference to drawings and embodiments. It should be noted that the specific embodiments described herein are used to explain the present invention and are not intended to limit the present invention.

Note that when an element is "fixed" or "installed" on another element, it may be located directly on the other element or may be located indirectly on the other element. When an element is "connected" to another element, it may be directly connected to the other element or it may be indirectly connected to the other element.

Additionally, the terms "first" and "second" are used for descriptive purposes only and do not indicate or imply relative importance or the number of technical features referred to. It should not be understood as giving instructions. Thereby, the features defined by "first" and "second" may explicitly include or implicitly include one or more such features. In the description of the present invention, "plurality" means two or more, unless there is a clear and specific limitation.

In the description of the present invention, the orientation or positional relationship indicated by terms such as "top", "bottom", "front", "rear", "left", "right", etc. is the orientation or positional relationship based on the drawing. However, it is only for the purpose of easily explaining the present invention and simplifying the explanation, and does not indicate or imply that the indicated device or element necessarily has a specific orientation and is constructed and operated in a specific orientation. They are not implied and should not be construed as limitations on the invention.

In the description of the present invention, terms such as "attachment," "connection," and "connection" should be understood in a broad sense, and may include, for example, a fixed connection, unless there are clear provisions and limitations. , which may be a removable or integral connection, may be a mechanical connection, may be an electrical connection, or may be a direct connection. , an indirect connection through an intermediate medium, internal communication between two elements, or interaction between two elements. Those skilled in the art can understand the specific meanings of the above terms in the present invention depending on the specific situation.

In detail, as shown in FIGS. 1 to 3, the amplifier electrical performance testing device provided by the present invention includes a base 110, a bracket, a mounting stand 120, a test stand, a slide assembly, and a push-pull quick clamp 160, the bracket is vertically attached to the base 110, the mount 120 is attached to the top surface of the base 110, the push-pull quick clamp 160 is attached to the side of the bracket away from the base 110, and the test platform is attached to the bracket via a slide assembly; The test stand is connected to a push-pull quick clamp 160, and is moved up and down along the length of the bracket by driving the push-pull quick clamp 160.

The specific solution proposed by the present invention is as follows.

The bottom of the base 110 is a flat surface, and the top is machined with screw holes for attaching the mount 120, the slide rod 145, and the pillar 155. The material of the base 110 is antistatic ABS plastic.

The bottom of the mount 120 is a flat surface, and the top is machined with standard through holes for attaching hexagon socket head bolts. According to the irregular polyhedral structural characteristics of the 100W amplifier, the mounting base 120 is machined with a corresponding position regulating groove on the top to ensure that the 100W amplifier can be placed in the test device only once; Rounding the corners of the position regulation groove protects the silver-plated casing of the 100W amplifier from damage during testing. Test waveguide mounting grooves are machined on both sides of the mount 120 to ensure that the external test waveguide does not interfere with the mount 120 during the test. The height of the mount 120 should be at least 15 mm lower than the PCB circuit board of the 100W amplifier to avoid the mount 120 interfering with the probe fixing plate 135 during testing. The material of the position regulation block is antistatic ABS plastic.

The spring probe 136 is a standard part with a diameter of 4 mm and a length of 40 mm, with one end of the probe having a serrated needle head to achieve sufficient contact with the test pad, and the other end connecting the test line of the test stand. It is a weld seam for welding. The working stroke of the spring probe 136 is 4.4 mm, the spring force during the working stroke is 3.0 N, and the maximum current that can pass during the working process is 50 A. The material of the needle head, needle tube, and needle sleeve of the spring probe 136 is beryllium copper alloy, and the surface is gold plated, and the material of the internal spring is high-alloy spring steel, and the material is at least 3× in an environment of -40°C to 80°C. Can meet 105 tests.

A spring probe 136 is used instead of the test wire. Depending on the magnitude of the current at each test point, use a probe with the corresponding specifications. One end of the probe contacts a pad corresponding to a 100W amplifier, and a test wire corresponding to a test stand is welded to the other end. The probe end uses a serrated needle head, and the spring elasticity can ensure sufficient contact between the probe and the pad. At the same time, the probe maintains elastic contact with the pad, avoiding rigid contact from destroying the pad surface. In addition, the probe tail is a welded seam, so the test wire on the test stand can be directly welded to the probe tail, and there is no need to connect with a clamp, avoiding chip destruction accidents due to discharge or ignition during the testing process.

The mounting base 120 is used to position and fix the module. The mount 120 for positioning and fixing the module is designed according to the external structure characteristics of the 100W amplifier, and the spring probe 136 is prevented from contacting the non-test pad due to the reverse placement direction of the module. At the same time, the mounting positions of the test waveguides are secured on both sides of the mount 120 to ensure that the mount 120 and the test waveguides do not interfere with each other, and to ensure the smooth progress of the 100W amplifier electrical performance test.

The bottom of the probe fixing plate 135 is a flat surface, with standard through holes machined at the mounting positions of the spring probe 136, shaft sleeve and push-pull quick clamp 160, and notches machined at the insulator manual measurement position of the 100W amplifier; Facilitate measurement using a digital multimeter pen during the testing process. The material of the probe fixing plate 135 is organic glass (acrylic), which facilitates observation during the test process.

The shaft sleeve (not shown) is a standard component and functions as a sliding bearing to ensure that the probe fixing plate 135 slides stably on the slide rod 145. The shaft sleeve material is medium carbon steel.

The push-pull quick clamp 160 is a standard part and consists of a handle, a connecting rod and a frame. By pushing/pulling the handle, the probe fixing plate 135 can be vertically moved up and down. The handle and connecting rod of the push-pull quick clamp 160 are made of carbon steel, the frame is made of cast iron, and the frame is painted to prevent rust.

A push-pull quick clamp 160 is used in place of the operation of attaching and detaching the test wire clamp on the test stand and the operation of welding the test wire. A single pull on the handle allows the six probes to descend vertically and achieve precise alignment in sync with the pads. During the testing process, the handle is in a self-locking state to ensure that the probe is stable and does not move. After completing the test, pull the handle one more time and the six probes will rise vertically and leave contact with the pads in sync, allowing the 100W amplifier to be removed.

The slide rod 145 is a standard bearing rod, and screw holes are machined at both ends. The slide rod 145 is used to achieve vertical sliding of the probe fixing plate 135. The material of the slide rod 145 is bearing steel.

The pillar 155 has a standard specification profile, and a screw hole is machined on the bottom surface of the profile. The pillar 155 is used to maintain the stability of the testing device during the testing process and the movement process of the push-pull quick clamp 160. The material of the pillar 155 is an aluminum alloy.

A standard through hole is formed in the back plate 156 at a position where it is connected to the push-pull quick clamp 160 and the pillar 155. The material of the back plate 156 is a carbon steel plate with a thickness of 8 mm, and the surface is painted to prevent rust.

The mounting seat 146, slider, hexagon socket head cap bolt, flat washer, spring washer, and nut are all standard parts and are used to fix and connect each part, and their specifications depend on the processing of the test equipment. Can be selected according to size and assembly requirements.

The implementation status of the technical proposal of this invention is as follows.

Attach the mount 120, slide rod 145, and pillar 155 to the base 110 with hexagon socket head bolts and flat washers, ensuring that the mounting screws of the mount 120, slide rod 145, and pillar 155 are tightened in place.

The spring probe 136 is attached to the probe fixing plate 135 by an interference fit. The shaft sleeve is similarly attached to the probe fixing plate 135 in an interference fit manner. The two slide rods 145 are passed through the two shaft sleeves of the probe fixing plate 135 at the same time. The horizontal surface of the mounting seat 146 is attached to the top end of the slide rod 145 using a hexagon socket head bolt and a flat washer, and the vertical surface of the mounting seat 146 is attached to the side surface of the pillar 155 using a slider (not shown) and a hexagon socket head bolt. All screws are tightened into place.

The connecting rod of the push-pull quick clamp 160 is attached to the probe fixing plate 135 with a nut, and the frame is attached to the back plate 156 with a hexagon socket bolt, a spring washer, and a nut. The back plate 156 is attached to the side surface of the pillar 155 using a slider and hexagon socket head bolts. All screws and nuts are tightened into place.

After the installation of the test equipment is completed, the test wire of the test stand is welded to the weld seam of the corresponding spring probe 136, and the 100W amplifier is placed in the position regulation groove of the mounting stand 120, and at the same time, the test waveguide is inserted into the 100W amplifier housing. Attach to both sides of the body.

By pulling the handle of the push-pull quick clamp 160, the connecting rod drops vertically with the probe fixing plate 135, making sure that the spring probe 136 is in sufficient contact with the corresponding test pad and applying a steady pressure through the spring. give. After the test wire is energized, the corresponding electrical performance data can be obtained from the test stand. During the testing process, a digital multimeter can be used to manually measure the insulation of the 100W amplifier through a pre-cut notch in the probe fixing plate 135.

After the test is completed, by pushing the handle of the push-pull quick clamp 160, the connecting rod rises vertically with the probe fixing plate 135, and the spring probe 136 is removed from contact with the corresponding test pad, and the test waveguide is removed. After removing the tubes, the 100W amplifier can be removed from the test equipment.

The present invention has the following technical effects.
(1) Reduce labor costs By using the spring probe 136 instead of the test wire, there is no need to weld and desolder the 100W amplifier test wires (5 wires) before and after the test. Taking a 100W amplifier as an example of a power amplification component of the model number, there are a total of 6 workers in the conventional electrical equipment assembly process, and if the throughput is calculated as 4 sets/day, the work of the electrical equipment assembly workers is The time decreases from 66.7 min/(person/day) to 0.
(2) Simplify test operations and improve test efficiency A push-pull quick clamp 160 is used instead of the test wire clamp on the test stand. During the testing process, the tester does not need to repeatedly connect the test wire clamp to the test wire. For example, the test throughput for a 100W amplifier of the power amplification component of the model number is increased from the conventional 4 sets/day per person to 5 sets/day per person, and work efficiency is improved by 25%.
(3) Improve test reliability: The stable pressure provided by the spring probe 136 and the serrated head of the probe ensure sufficient contact between the probe and the test pad during the test process, The welded seam on the probe tail eliminates the need to connect the test wire using the clamp, which avoids the phenomenon of poor connection between the clamp and the test wire, and avoids accidents where electrical discharge or ignition that occurs during the test process destroys the chip. . In addition, the use of the testing device reduces the large number of repetitive operations in the production and testing stages, avoids the occurrence of low-level artificial quality problems, and has high practicality.

In one possible embodiment, the test stand includes a probe fixing plate 135 and a plurality of spring probes 136, the plurality of spring probes 136 being attached to the probe fixing plate 135 in an interference fit, and the plurality of spring probes 136 being attached to the probe fixing plate 135 in an interference fit. Both ends pass through the probe fixing plate 135, one end of the spring probe 136 toward the mounting base 120 is a detection end, one end of the spring probe 136 away from the mounting base 120 is a welding end, and the welding end of the spring probe 136 is a testing end. Welded to the wire.

A plurality of spring probes 136 pass through the probe fixing plate 135, the sensing end of the spring probe 136 realizes close contact with the amplifier to be tested, and the welding end realizes welding with the test wire, and at the same time, the selected The elastic structure of the spring probe 136 realizes sufficient contact between the detection end and the test pad of the amplifier under test, and also avoids damage to the test pad by the spring probe 136, so that multiple spring probes 136 can be used at once. Multiple test pads can be detected.

In one possible embodiment, a plurality of spring probes 136 are arranged in parallel on the probe fixing plate 135. Additionally, the sensing edge is serrated.

The juxtaposed spring probes 136 and the serrated detection ends of the spring probes 136 are used to ensure sufficient contact between the spring probes 136 and the test pads of the amplifier under test to ensure the accuracy of the detection results.

In one possible embodiment, the bracket includes a pillar 155 and a back plate 156, where there are two pillars 155, the two pillars 155 are installed in parallel and are attached vertically to the base 110, and the back plate 156 is attached to one end of the pillar 155 remote from the base 110 and a push-pull quick clamp 160 is attached to the back plate 156.

The pillar 155 installed in parallel and the back plate 156 on the pillar 155 support the installation of a push-pull quick clamp 160, and the pillar 155 is installed vertically to the base 110, and the push-pull quick clamp 160 supports the test along the vertical direction. Ensure the platform is actuated to ensure sufficient contact between the spring probe 136 and the amplifier test pad under test.

As one possible embodiment, the slide assembly includes two mounting seats 146 and a number of slide rods 145 equal to the number of mounting seats 146, the two mounting seats 146 being attached to corresponding pillars 155, and the number of slide rods 145 equal to the number of mounting seats 146. One end is attached to the corresponding mounting seat 146, the other ends of the two slide rods 145 are attached to the base 110, and the test stand is slidably attached to the two slide rods 145.

By using the mounting format of the mounting seat 146 and the slide rod 145, it is easier to install them together.Furthermore, the base 110 is provided with a positioning hole for installing the slide rod 145, and one end of the slide rod 145 is inserted into the positioning hole. Once inserted, the other end of the slide rod 145 is attached and fixed by a mounting seat 146, and the slide rod 145 can serve to guide the vertical movement of the test stand.

In one possible embodiment, the slide assembly further includes a slider, the pillar 155 is an aluminum alloy profile, the outer periphery of the pillar 155 is provided with a strip groove, the slider is disposed within the strip groove of the pillar 155, and the mounting seat 146 is attached to the slider.

By combining the slider with the aluminum alloy profile pillar 155, the slider can freely move up and down within the strip groove of the pillar 155, and does not come off from the strip groove, and does not require drilling holes in the pillar 155. The mounting seat 146 and the slider are connected by hexagon socket head bolts, which makes it easier to install and assemble the slider, the mounting seat 146, and the slide rod 145.

As one possible embodiment, the two slide rods 145 are installed parallel and mounted perpendicularly to the mounting seat 146.

With the slide rod 145 installed in parallel, the test stand can move up and down along the slide rod 145 more smoothly, and by using the vertical mounting type, when the test stand moves down, the spring probe 136 is the test object. to ensure sufficient contact with the amplifier's test pad.

In one possible embodiment, the test stand further includes a shaft sleeve, the test bed is provided with a position regulating hole through which the slide rod 145 passes, and there are two shaft sleeves, and the two shaft sleeves are tightened. The two slide rods 145 pass through the corresponding shaft sleeves.

The installation of the shaft sleeve can act as a sliding bearing, reducing the resistance when the test stand moves up and down along the slide rod 145.

In one possible embodiment, the mount 120 is provided with a fixing groove for fixing the amplifier under test.

The installation of the fixing groove can effectively fix the amplifier under test, avoid the swinging of the amplifier under test, and allow the elastic probe to make sufficient contact with the test pad of the amplifier under test.

In the above descriptions of the embodiments, the specific features, structures, materials, or features may be combined in any suitable manner in any one or more embodiments or examples.

The contents described above are only specific embodiments of the present invention, and the protection scope of the present invention is not limited thereto. Any changes or replacements that can be easily conceived by a person skilled in the art within the technical scope disclosed in this publication should be included within the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

110 Base 120 Mounting base 135 Probe fixing plate 136 Spring probe 145 Slide rod 146 Mounting seat 155 Pillar 156 Back plate 160 Push-pull quick clamp

Claims (10)

Includes base, bracket, mount, test stand, slide assembly and push-pull quick clamp.
the bracket is attached vertically to the base, the mount is attached to the top surface of the base, the push-pull quick clamp is attached to the side of the bracket away from the base, and the test stand is attached to the The amplifier electrical performance test is attached to the bracket via a slide assembly, the test stand is connected to the push-pull quick clamp, and is moved up and down along the length of the bracket by the drive of the push-pull quick clamp. Device. The test stand includes a probe fixing plate and a plurality of spring probes,
A plurality of the spring probes are attached to the probe fixing plate in an interference fit, both ends of the plurality of spring probes pass through the probe fixing plate, and one end of the spring probes toward the mounting base is detected. The amplifier electrical performance testing device according to claim 1, wherein one end of the spring probe remote from the mounting base is a welding end, and the welding end is welded to a test line. The amplifier electrical performance testing device according to claim 2, wherein a plurality of the spring probes are arranged in parallel on the probe fixing plate. The amplifier electrical performance testing device according to claim 2, wherein the detection end of the spring probe is serrated. The bracket includes a pillar and a back plate,
the pillars are two, the two pillars are installed in parallel and vertically attached to the base, the back plate is attached to one end of the pillars away from the base, and the push-pull quick clamp The amplifier electrical performance testing device according to claim 1, wherein is attached to the back plate. The slide assembly includes two mounting seats and slide rods equal in number to the mounting seats,
The two mounting seats are attached to the corresponding pillars, one ends of the two slide rods are attached to the corresponding mounting seats, the other ends of the two slide rods are attached to the base, and the two slide rods are attached to the base. The amplifier electrical performance testing device according to claim 5, wherein a test stand is slidably attached to the two slide rods. the slide assembly includes a slider;
The amplifier electric according to claim 6, wherein the pillar is an aluminum alloy profile, a strip groove is provided on the outer periphery of the pillar, the slider is arranged in the strip groove of the pillar, and the mounting seat is attached to the slider. Performance testing equipment. The amplifier electrical performance testing device according to claim 6, wherein the two slide rods are installed in parallel and are mounted perpendicularly to the mounting seat. the test stand includes an axial sleeve;
The test stand is provided with a position regulation hole through which the slide rod passes, and the two shaft sleeves are installed in the corresponding position regulation holes in an interference fit. 7. The amplifier electrical performance testing device according to claim 6, wherein the two slide rods pass through the corresponding shaft sleeves. The amplifier electrical performance testing device according to claim 1, wherein the mounting base is provided with a fixing groove for fixing the amplifier to be tested.

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