JP3240898B2 - Control method of continuous plating - Google Patents

Control method of continuous plating

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Publication number
JP3240898B2
JP3240898B2 JP31536795A JP31536795A JP3240898B2 JP 3240898 B2 JP3240898 B2 JP 3240898B2 JP 31536795 A JP31536795 A JP 31536795A JP 31536795 A JP31536795 A JP 31536795A JP 3240898 B2 JP3240898 B2 JP 3240898B2
Authority
JP
Japan
Prior art keywords
plating
strip
calculated
amount
cathode efficiency
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP31536795A
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Japanese (ja)
Other versions
JPH09157899A (en
Inventor
方志 中川
裕二 国島
俊之 村越
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Engineering Corp
Original Assignee
JFE Engineering Corp
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Filing date
Publication date
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Priority to JP31536795A priority Critical patent/JP3240898B2/en
Publication of JPH09157899A publication Critical patent/JPH09157899A/en
Application granted granted Critical
Publication of JP3240898B2 publication Critical patent/JP3240898B2/en
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Expired - Fee Related legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は連続電気めっきの制
御方法に係り、めっき処理槽内でストリップ表面に形成
されるめっき付着量を検出し、そのめっき付着量を目標
めっき付着量にするためのめっき処理槽の電流制御方法
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for controlling continuous electroplating, which detects a coating weight formed on a strip surface in a plating tank and sets the coating weight to a target coating weight. The present invention relates to a current control method for a plating bath.

【0002】[0002]

【従来の技術】従来、この種のめっき処理槽の電流制御
方法として、特開平6−41795号公報に開示されて
いるめっき電流制御方法がある。
2. Description of the Related Art Conventionally, as a current control method for a plating bath of this type, there is a plating current control method disclosed in Japanese Patent Application Laid-Open No. 6-41795.

【0003】この方法はめっき処理槽のストリップ挿入
点からめっき付着量検出地点までのストリップを所定長
さピッチで、ストリップ幅W、ライン速度V、トータル
のめっき電流Itをそれぞれトラッキングし、そのトラ
ッキングデータと付着量実績の瞬時値CW1 、幅方向付
着量平均値CW3 から瞬時値めっき陰極効率η1 、平均
値めっき陰極効率η3 を下記の(3)式、(1)式から
求め、且つ瞬時値めっき陰極効率η1 、平均値めっき陰
極効率η3 をN個算出し、この算出結果のうち、該効率
η1 、効率η3 の最小値の最小陰極効率η1 mIN 、η
3 mIN を各々選出し、めっき処理後のめっき付着量の保
証が厳しく要求される用途の場合は、下記(4)式によ
り、トータルのめっき電流設定値Ipを算出し、また、
めっき処理後のめっき付着量の保証がストリップの幅方
向で平均した付着量が確保できればよいという用途(以
降幅方向の複数点平均値保証と云う)の場合は、下記
(5)式により、トータルのめっき電流設定値Ipを算
出し、前記(4)式、(5)式から算出したトータルの
めっき電流設定値Ipを前記めっき処理槽の電流に流す
めっき電流の設定値として与えるようにしためっき電流
制御方法である。
In this method, a strip from a strip insertion point of a plating tank to a plating adhesion amount detection point is tracked at a predetermined length pitch, a strip width W, a line speed V, and a total plating current It, and the tracking data is obtained. And the instantaneous value CW 1 of the actual adhesion amount and the average value CW 3 of the adhesion amount in the width direction, the instantaneous plating cathode efficiency η 1 and the average plating cathode efficiency η 3 are obtained from the following equations (3) and (1), and The instantaneous value plating cathode efficiency η 1 and the average value plating cathode efficiency η 3 are calculated as N, and among the calculation results, the minimum cathode efficiency η 1 mIN , η of the minimum value of the efficiency η 1 and the efficiency η 3
For applications where 3 mIN is selected individually and the guarantee of the coating weight after plating is strictly required, the total plating current set value Ip is calculated by the following equation (4).
For applications in which it is only necessary to ensure the average coating weight in the width direction of the strip to guarantee the coating weight after the plating process (hereinafter referred to as “guaranteed average value of multiple points in the width direction”), the following formula (5) is used. The plating current set value Ip of the above is calculated, and the total plating current set value Ip calculated from the above formulas (4) and (5) is given as a set value of the plating current flowing in the current of the plating bath. This is a current control method.

【0004】[0004]

【数3】 (Equation 3)

【0005】[0005]

【数4】 (Equation 4)

【0006】[0006]

【数5】 (Equation 5)

【0007】[0007]

【数6】 (Equation 6)

【0008】[0008]

【発明が解決しようとする課題】しかしながら、上述し
ためっき電流制御方法では以下のような問題がある。
However, the above-described plating current control method has the following problems.

【0009】めっき処理後のめっき付着量が幅方向の複
数点平均値保証の製品の場合は、算出したN個の効率η
3の最小値を使用することにより、付着量が過保証とな
るケースがある。上記のような付着量の過保証を生じ、
それに起因して電流原単位が増加し、ストリップ長手方
向に不均一な付着量を生じる。
In the case of a product in which the coating weight after plating is guaranteed at an average value of a plurality of points in the width direction, the calculated N efficiency η
By using the minimum value of 3, the amount of adhesion may be over-guaranteed in some cases. Over-guarantee of the adhesion amount as mentioned above occurs,
As a result, the basic unit of current increases, and a non-uniform deposition amount occurs in the longitudinal direction of the strip.

【0010】本発明は上記のような問題点の解決を図っ
たものであり、ストリップ長手方向の均一な付着量を
得、電流原単位を低減させることの出来る連続めっきの
制御方法を提供することを目的とする。
SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and provides a method for controlling continuous plating capable of obtaining a uniform deposition amount in the longitudinal direction of a strip and reducing a basic unit of current. With the goal.

【0011】[0011]

【課題を解決するための手段】本発明は被めっきストリ
ップをめっき処理槽内に挿入して走行させ、前記ストリ
ップの表面にめっき層を形成し、めっき層形成ストリッ
プを前記めっき処理槽から引抜き、このめっき層形成ス
トリップのめっき付着量を検出し、そのめっき付着量が
目標めっき付着量になるように、めっき処理槽の電流を
制御する方法において、前記めっき処理槽のストリップ
挿入地点から付着量検出地点までのストリップを所定長
さピッチで、ストリップ幅W、ライン速度V、トータル
のめっき電流Itをそれぞれトラッキングし、そのトラ
ッキングデータと付着量実績の幅方向付着量平均値CW
3から平均値めっき陰極効率η3 を下記(1)式から求
め、且つ複数点の該陰極効率η3 をN個算出し、この算
出値から該陰極効率η3 の平均陰極効率η3 AVE を計算
し、その値が90以上110以下を満たす値を用いて下
記(2)式により、トータルのめっき電流設定値Ipを
算出し、そのトータルのめっき電流設定値Ipを前記め
っき処理槽のめっき電流設定値として与えるようにした
ことを特徴とする連続めっきの制御方法である。
According to the present invention, a strip to be plated is inserted into a plating bath and run, a plating layer is formed on the surface of the strip, and the plating layer forming strip is pulled out of the plating bath. In the method of detecting the amount of plating on the plating layer forming strip and controlling the current of the plating tank so that the amount of plating becomes the target amount of plating, the amount of coating is detected from the strip insertion point of the plating tank. The strip up to the point is tracked at a predetermined length pitch, the strip width W, the line speed V, and the total plating current It, respectively.
3 obtains the average value plating cathode efficiency eta 3 of the following formula (1) from, and the cathode efficiency eta 3 of the plurality of points and the N calculated average cathode efficiency eta 3 AVE of cathode efficiency eta 3 from the calculated value A total plating current set value Ip is calculated by the following equation (2) using a value that satisfies 90 to 110, and the total plating current set value Ip is calculated as the plating current of the plating tank. This is a control method of continuous plating characterized by being provided as a set value.

【0012】[0012]

【数7】 (Equation 7)

【0013】[0013]

【数8】 (Equation 8)

【0014】本発明によれば、上記構成であるので、算
出したN個の効率η3 の平均値を使用し、平均化された
η3 AVE に上下限を設けることにより、付着量をある一
定の範囲にて制御可能となり、過保証も軽減する。
According to the present invention, since the above configuration is used, the average value of the calculated N efficiencies η 3 is used, and the averaged η 3 AVE is set with upper and lower limits, so that the amount of adhesion is constant. , And over-guarantee is reduced.

【0015】[0015]

【発明の実施の形態】以下に本発明の実施例を図によっ
て説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below with reference to the drawings.

【0016】図1はこの発明の制御方法を実施するため
の連続電気めっき処理装置の全体の系統図である。
FIG. 1 is an overall system diagram of a continuous electroplating apparatus for implementing the control method of the present invention.

【0017】図1において、1はめっき処理槽(本実施
例では電気亜鉛めっき)であり、2 1 〜2n は被めっき
材であるストリップを挟む形で配置された電極である。
1 〜3n は21 〜2n に対してめっき電流を流す整流
器である。
In FIG. 1, reference numeral 1 denotes a plating tank (this embodiment)
In the example, electrogalvanizing) 1~ 2nIs to be plated
The electrodes are arranged so as to sandwich a strip as a material.
31~ 3nIs 21~ 2nRectification to apply plating current to
It is a vessel.

【0018】めっき電流は整流器31 〜3n から電極2
1 〜2n 、ストリップ5、めっき液6、通電ロール41
〜4(n +1) を通って整流器31 〜3n に戻るループに
なっている。11はダムロールである。
The plating current electrode 2 from the rectifier 3 1 to 3 n
1 to 2 n, the strip 5, the plating solution 6, conductive rolls 4 1
And a loop back to the rectifier 3 1 to 3 n through ~4 (n +1). 11 is a dam roll.

【0019】めっき槽1でめっきされたストリップ5は
ブライドルロール7によって走行させられ、最終めっき
処理槽から引き抜かれて付着量計8でその付着量が測定
される。
The strip 5 plated in the plating tank 1 is run by bridle rolls 7, pulled out of the final plating tank, and its adhesion is measured by an adhesion meter 8.

【0020】ここでは処理装置10が整流器31 〜3n
から各めっき電流実績It1 〜It n を、ライン制御装
置9から板幅W・ライン速度Vを付着量計8から付着量
実績の平均値CW3 を受信し、次に述べる演算を行な
い、各整流器31 〜3n にめっき電流を設定する。
Here, the processing device 10 is a rectifier 31~ 3n
From each plating current It1~ It nThe line control equipment
The sheet width W and the line speed V from the setting 9 and the adhesion amount from the adhesion amount meter 8
Average value of actual results CWThreeAnd perform the operation described below.
No, each rectifier 31~ 3nSet the plating current.

【0021】図2は図1の処理装置10における演算フ
ローチャートである。処理装置10はストリップのある
長さピッチ、例えば10mのピッチでトータル電流実績
値It(=ΣIti )、板厚W、ライン速度Vを収集す
る(S1)。
FIG. 2 is a flow chart of the operation in the processing device 10 of FIG. The processing device 10 collects the total current actual value It (= ΣIt i ), the plate thickness W, and the line speed V at a certain pitch of the strip, for example, a pitch of 10 m (S1).

【0022】そして、加減速中や目標付着量CW等の設
定替え時の過度状態かどうかが判断され(S2)、過度
状態でない場合には付着量計8までのデータをトラッキ
ングする(S3)。
Then, it is determined whether the state is an excessive state during acceleration / deceleration or when the setting of the target adhesion amount CW or the like is changed (S2). If not, the data up to the adhesion amount meter 8 is tracked (S3).

【0023】なお、S2において、加減速中や目標付着
量CW等の設定替え時の過度状態と判断された場合に
は、該データが削除され、これは使用されない(S
4)。
In S2, if it is determined that the state is excessive during acceleration / deceleration or when the setting of the target adhesion amount CW or the like is changed, the data is deleted and is not used (S2).
4).

【0024】そして、S3においてトラッキングしたデ
ータが付着量計8に達したとき、その時に付着量計8で
測定された平均値CW3を用い(S5)、(1)式で平
均陰極効率η3 を算出する(S6)。
When the data tracked in S3 reaches the adhesion meter 8, the average cathode efficiency η 3 is calculated by the equation (1) using the average value CW3 measured by the adhesion meter 8 at that time (S5). It is calculated (S6).

【0025】[0025]

【数9】 (Equation 9)

【0026】[0026]

【数10】 (Equation 10)

【0027】算出された平均陰極効率η3 は常時最新の
N個のデータ、例えば20個の入力された順番にバッフ
ァリングされており、新しく平均陰極効率η3 が算出さ
れると、20個のうち一番古い陰極効率が消され更新さ
れる。
The calculated average cathode efficiency η 3 is always buffered in the latest N pieces of data, for example, 20 pieces of data in the input order. When the new average cathode efficiency η 3 is newly calculated, 20 pieces of data are obtained. The oldest cathode efficiency is erased and updated.

【0028】また、平均陰極効率η3 AVE を求める(S
7)。そして、平均陰極効率η3 AV E が90以上110
以下であるかを判断され(S8)、範囲内でない場合に
は、該データは削除され、これは使用されない(S
9)。そして、平均陰極効率η3 AVE が90以上110
いかであれば、付着量が幅方向の複数点平均値保証の製
品の場合、付着量の平均値から求めた平均陰極効率η3
AVE を用い、(2)式よりトータルめっき電流設定値I
pを求め(S10)、各整流器31 〜3n に分配される
(S11)。
Further, the average cathode efficiency η 3 AVE is determined (S
7). And the average cathode efficiency η 3 AV E is 90 or more and 110
It is determined whether or not the data is below (S8). If not, the data is deleted and is not used (S8).
9). The average cathode efficiency η 3 AVE is 90 or more and 110
If this is the case, in the case of a product in which the adhesion amount is the average value of a plurality of points in the width direction, the average cathode efficiency η3 calculated from the average value of the adhesion amount
Using AVE , set the total plating current set value I from equation (2).
seeking p (S10), is distributed to each of the rectifier 3 1 ~3 n (S11).

【0029】ここで、平均陰極効率η3 AVE を90以上
110以下に限定する理由は、局部的に鋼板の形状等
(反り等)の異常により付着量が過不足が生じ、この範
囲外の値を用いると付着量のバラツキの増大を生じるた
めである。以上の処理はストリップが10m進む毎に行
われる。
Here, the reason why the average cathode efficiency η 3 AVE is limited to 90 or more and 110 or less is that the adhesion amount is excessively or deficient due to local abnormality of the shape or the like (warpage) of the steel plate, and the value outside this range is set. This is because the use of the compound increases the variation in the amount of adhesion. The above processing is performed every time the strip advances 10 m.

【0030】本発明方法によれば、図3(a)に示すよ
うに、付着量が幅方向の複数点平均値保証の製品の場
合、η3 の20個の平均をη3 AVE とし、η3 AVE の上
下限をそれぞれ90、110として、上記(2)式より
トータルのめっき電流設定値を算出し、このIpにより
めっきを行った場合、コイル単位での目標付着量に対す
る誤差が標準偏差にて従来より半減した。
According to the method of the present invention, as shown in FIG. 3 (a), in the case of a product in which the adhesion amount is the average value of a plurality of points in the width direction, the average of 20 η 3 is defined as η 3 AVE , 3 With the upper and lower limits of AVE set to 90 and 110, respectively, the total plating current set value is calculated from the above equation (2), and when plating is performed using this Ip, the error with respect to the target adhesion amount in coil units becomes a standard deviation. Halved than before.

【0031】(b)は従来技術による比較例である。図
3(a)、(b)から明らかなように、従来はバラツキ
が大きいかったので、目標付着量の公差範囲に対して+
側に高くして付着していたが、本発明ではバラツキが小
さいので、目標付着量の公差範囲に対して+側に最小限
高くして付着すればよく、従来に対して電力原単位約3
%、亜鉛原単位約3%の低減が出来た。
(B) is a comparative example according to the prior art. As is clear from FIGS. 3A and 3B, the variation was large in the past, and therefore, +
However, in the present invention, since the variation is small in the present invention, it is sufficient to attach the coating with a minimum height on the + side with respect to the tolerance range of the target amount of adhesion, and the power consumption is about 3
%, And a reduction in zinc basic unit of about 3%.

【0032】[0032]

【発明の効果】以上述べたように本発明は付着量の過保
証になるのを防止し、ストリップ長手方向の均一な付着
量と、電流原単位を低減させることの出来る。
As described above, according to the present invention, it is possible to prevent the adhesion amount from being over-guaranteed, to reduce the uniform adhesion amount in the longitudinal direction of the strip, and to reduce the basic unit of current.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の制御方法を実施するための連続電気め
っき処理装置の全体の系統図である。
FIG. 1 is an overall system diagram of a continuous electroplating apparatus for implementing a control method of the present invention.

【図2】本発明の演算フローチャートである。FIG. 2 is a calculation flowchart of the present invention.

【図3】本発明の目標付着量に対する付着量誤差の状態
を示す図である。
FIG. 3 is a diagram illustrating a state of an adhesion amount error with respect to a target adhesion amount according to the present invention.

【符号の説明】[Explanation of symbols]

1 めっき処理槽 21 〜2n 電極 31 〜3n 整流器 41 〜4(n+1 ) 通電ロール 5 ストリップ 6 めっき液 7 ブライドルロール 8 付着量計 9 ライン制御装置 10 処理装置 11 ダムロール1 plating tank 2 1 to 2 n electrode 3 1 to 3 n rectifier 4 1 ~4 (n + 1) conductive rolls 5 strip 6 plating solution 7 bridle roll 8 attached meter 9 line controller 10 processor 11 Damuroru

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) C25D 21/12 C25D 7/06 ──────────────────────────────────────────────────続 き Continued on front page (58) Field surveyed (Int.Cl. 7 , DB name) C25D 21/12 C25D 7/06

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 被めっきストリップをめっき処理槽内に
挿入して走行させ、前記ストリップの表面にめっき層を
形成し、めっき層形成ストリップを前記めっき処理槽か
ら引抜き、そのめっき層形成ストリップのめっき付着量
を検出し、そのめっき付着量が目標めっき付着量になる
ように、めっき処理槽の電流を制御する方法において、
前記めっき処理槽のストリップ挿入地点から付着量検出
地点までのストリップを所定長さピッチで、ストリップ
幅W、ライン速度V、トータルのめっき電流Itをそれ
ぞれトラッキングし、そのトラッキングデータと付着量
実績の幅方向付着量平均値CW3 から平均値めっき陰極
効率η3 を下記(1)式から求め、且つ複数点の該陰極
効率η3 をN個算出し、この算出値から該陰極効率η3
の平均陰極効率η3 AVE を計算し、その値が90以上1
10以下を満たす値を用いて下記(2)式により、トー
タルのめっき電流設定値Ipを算出し、そのトータルの
めっき電流設定値Ipを前記めっき処理槽のめっき電流
設定値として与えるようにしたことを特徴とする連続め
っきの制御方法。 【数1】 【数2】
1. A strip to be plated is inserted into a plating bath and allowed to run, a plating layer is formed on the surface of the strip, and a plating layer forming strip is pulled out of the plating bath, and plating of the plating layer forming strip is performed. In the method of detecting the amount of coating and controlling the current of the plating tank so that the amount of plating becomes the target amount of plating,
The strip width W, the line speed V, and the total plating current It are respectively tracked at a predetermined length pitch from the strip insertion point to the adhesion amount detection point of the plating tank, and the tracking data and the width of the actual adhesion amount are tracked. the average value plating cathode efficiency eta 3 of the following formula (1) from the direction adhesion amount average CW 3, and the cathode efficiency eta 3 of the plurality of points and the N calculated, the cathode efficiency eta 3 from the calculated value
Of the average cathode efficiency η 3 AVE of
A total plating current set value Ip is calculated by the following equation (2) using a value satisfying 10 or less, and the total plating current set value Ip is given as a plating current set value of the plating tank. A method for controlling continuous plating, characterized by: (Equation 1) (Equation 2)
JP31536795A 1995-12-04 1995-12-04 Control method of continuous plating Expired - Fee Related JP3240898B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31536795A JP3240898B2 (en) 1995-12-04 1995-12-04 Control method of continuous plating

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