JP3233816B2 - Peeled defect detection method - Google Patents

Peeled defect detection method

Info

Publication number
JP3233816B2
JP3233816B2 JP13353995A JP13353995A JP3233816B2 JP 3233816 B2 JP3233816 B2 JP 3233816B2 JP 13353995 A JP13353995 A JP 13353995A JP 13353995 A JP13353995 A JP 13353995A JP 3233816 B2 JP3233816 B2 JP 3233816B2
Authority
JP
Japan
Prior art keywords
defect
peeling
echo
ultrasonic
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP13353995A
Other languages
Japanese (ja)
Other versions
JPH08327610A (en
Inventor
清隆 青木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP13353995A priority Critical patent/JP3233816B2/en
Publication of JPH08327610A publication Critical patent/JPH08327610A/en
Application granted granted Critical
Publication of JP3233816B2 publication Critical patent/JP3233816B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/044Internal reflections (echoes), e.g. on walls or defects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/26Scanned objects
    • G01N2291/269Various geometry objects
    • G01N2291/2693Rotor or turbine parts

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、タービンブレードのス
テライト銀ろう付部等に発生する剥離状欠陥の検出に
用される剥離状欠陥検出方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for detecting a peeling defect which is applied to the detection of a peeling defect occurring in a stellite silver brazing portion of a turbine blade or the like.

【0002】[0002]

【従来の技術】タービンブレードの表面には、図3に示
すように銀ろう付部11によりステライト12が接合さ
れており、この銀ろう付部11に生じる欠陥としてはボ
イド状欠陥13と剥離状欠陥14がある。
2. Description of the Related Art As shown in FIG. 3, a stellite 12 is joined to a surface of a turbine blade by means of a silver brazing portion 11, and defects generated in the silver brazing portion 11 are void-like defects 13 and peeling defects. There are defects 14.

【0003】従来のタービンブレードのステライト銀ろ
う付部の非破壊検査による欠陥検出においては、放射線
透過試験が適用されていたが、この試験による場合、ボ
イド状欠陥13については、健全部に比べ放射線の透過
度に大きな差があるために、感度よく検出することがで
きるが、健全部との透過度にほとんど差がない剥離状欠
陥14については、検出不可能であった。
[0003] In the conventional defect detection by nondestructive inspection of a stellite silver brazed portion of a turbine blade, a radiation transmission test has been applied. Since there is a large difference in the transmittance of the defect, it can be detected with high sensitivity. However, the peeling defect 14 having almost no difference in the transmittance with the healthy part cannot be detected.

【0004】[0004]

【発明が解決しようとする課題】従来のタービンブレー
ドのステライト銀ろう付部の欠陥検出においては、前記
のように、放射線透過試験が適用されており、ボイド状
欠陥については良好な検出が可能であるが、剥離状欠陥
については、健全部との間で放射線の透過度に差がない
ため、検出が不可能であった。
As described above, in the conventional defect detection of a stellite silver brazed portion of a turbine blade, a radiation transmission test is applied, and good detection of void-like defects is possible. However, it was impossible to detect a peeling defect because there was no difference in radiation transmittance between a healthy part and a peeling defect.

【0005】この対策として、超音波による剥離状欠陥
の検出が考えられるが、この超音波による欠陥検出の場
合、図4に示すように、その表面から被検体3に超音波
ビーム4を入射する探触子1には、その振動子1aが超
音波ビーム4を発信した後一定時間の不感帯6があり、
その間においてはエコーを検出することができない。
As a countermeasure, it is conceivable to detect a peeling defect using ultrasonic waves. In the case of defect detection using ultrasonic waves, as shown in FIG. 4, an ultrasonic beam 4 is incident on the subject 3 from its surface. The probe 1 has a dead zone 6 for a certain time after the transducer 1a transmits the ultrasonic beam 4,
During that time, no echo can be detected.

【0006】一方、被検体3については、ステライトと
銀ろう間の隙間は0.002mm程度と非常に微小であ
り、また、ステライトの厚みも1.6mmと薄い。そのた
め、通常の超音波探傷方法では剥離状欠陥14からの欠
陥エコー8が不感帯6の中に隠れてしまい、その判別が
不可能であった。本発明は上記の課題を解決しようとす
るものである。
On the other hand, for the subject 3, the gap between the stellite and the silver solder is very small, about 0.002 mm, and the thickness of the stellite is as thin as 1.6 mm. For this reason, the defect echo 8 from the peeling defect 14 is hidden in the dead zone 6 by the ordinary ultrasonic inspection method, and it is impossible to determine the defect echo 8. The present invention seeks to solve the above problems.

【0007】[0007]

【課題を解決するための手段】本発明の剥離状欠陥検出
方法は、タービンブレードにろう付けされたステライト
表面に遅延材を介して超音波探触子を配設して、超音
探触子からステライトに超音波ビームを入射し、ター
ビンブレードとステライト境界の欠陥により反射された
欠陥エコーを記超音波探触子受信してその反射回
数をカウントし、反射回数が4回以上の場合は剥離状欠
陥が発生し、4回未満の場合は剥離状欠陥が発生してい
ないと判定することを特徴としている。
According to the present invention, there is provided a method for detecting a spalled defect, comprising the steps of:
Surface by disposing an ultrasonic probe through the delay material, ultrasonic
The ultrasonic beam entering from the wave probe to stellite, terpolymers
Receives <br/> defect echo reflected by the defect of the bottle blades and stellite boundaries before Symbol ultrasonic probe, counts the number of reflections, a case where the number of reflections is more than 4 times the release form missing
If less than 4 times, peeling defects have occurred.
It is characterized by determining that there is no.

【0008】[0008]

【作用】上記において、超音波探触子が発信した超音波
ビームは、遅延材を介して被検体に入射し、金属製薄板
のろう付部に欠陥がある場合、その欠陥に到達する。
In the above, the ultrasonic beam transmitted by the ultrasonic probe is incident on the subject through the delay member, and reaches the defect when the brazing portion of the thin metal plate has a defect.

【0009】上記超音波ビームは遅延材により遅延して
欠陥に到達し、上記超音波探触子で受信されるため、こ
の欠陥による欠陥エコーは上記超音波探触子の超音波ビ
ーム発信直後に形成される不感帯を回避することがで
き、超音波探触子は確実に欠陥エコーを受信し、欠陥を
検出することができる。
[0009] The ultrasound beam reaches the defect and delayed by the delay member, because received by the ultrasonic probe, defect echo by the defect immediately after the ultrasonic beam transmission of the ultrasonic probe The dead zone that is formed can be avoided, and the ultrasonic probe can reliably receive the defect echo and detect the defect.

【0010】また、上記ろう付部に形成される欠陥のう
ちの剥離状欠陥は一定寸法以上の平面状のものであり、
被検体に入射した超音波ビームはこの欠陥により所定回
数以上の反射を繰返すため、欠陥エコーが4回以上繰返
して受信された場合には、剥離状欠陥が存在すると判定
することができる。
[0010] Further, among the defects formed in the brazed portion, the peel-like defects are planar with a certain dimension or more.
Since the ultrasonic beam incident on the subject repeatedly reflects a predetermined number of times or more due to the defect, when a defect echo is repeatedly received four times or more, it can be determined that a peeling defect exists.

【0011】[0011]

【実施例】本発明の一実施例に係る剥離状欠陥検出方法
について、図1を用いて説明する。なお、本実施例は、
被検体であるタービンブレードのステライト銀ろう付部
の欠陥検出に適用されたものでる。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A method for detecting a peeling defect according to one embodiment of the present invention will be described with reference to FIG. In this embodiment,
This is applied to the defect detection of the stellite silver brazed part of the turbine blade as the test object.

【0012】図1に示された本実施例の欠陥検出方法に
おいては、遅延材2を介して超音波探触子1を被検体3
の表面3aに配設し、超音波探触子1より超音波ビーム
4を発信した後、欠陥5からの欠陥エコー8の反射回数
をカウントし、この反射回数が4回以上のものを剥離状
欠陥14、また、4回未満のものをボイド状欠陥13と
判別している。
In the defect detection method of this embodiment shown in FIG. 1, the ultrasonic probe 1 is connected to the object 3 via the delay member 2.
After transmitting the ultrasonic beam 4 from the ultrasonic probe 1, the number of reflections of the defect echo 8 from the defect 5 is counted. The defects 14 and those less than four times are determined to be void defects 13.

【0013】上記において、探触子1が発信した超音波
ビーム4は、アクリル樹脂製の遅延材2を介して被検体
3内に入射するため、被検体3の表面3a、欠陥5及び
底面3bへの到達時間が遅れ、図1に示すように表面エ
コー7、欠陥エコー8及び底面エコー9は不感帯6通過
後に探触子1により受信することができる。
In the above description, since the ultrasonic beam 4 transmitted from the probe 1 enters the subject 3 via the delay member 2 made of acrylic resin, the surface 3a, the defect 5, and the bottom surface 3b of the subject 3 1, the surface echo 7, the defect echo 8, and the bottom surface echo 9 can be received by the probe 1 after passing through the dead zone 6 as shown in FIG.

【0014】そのため、従来の方法のように探触子1に
よる欠陥エコー8の受信時間が不感帯6内となり、欠陥
5を検出することができないという事態を回避すること
が可能となった。
Therefore, it is possible to avoid a situation in which the reception time of the defect echo 8 by the probe 1 is within the dead zone 6 and the defect 5 cannot be detected as in the conventional method.

【0015】上記超音波探触子1による欠陥検出の場
合、欠陥5の面積が大きいと、図2(a)に示すように
その大きさに応じて超音波ビーム4は何度も反射を繰返
すが、欠陥5の面積が小さいと、図2()に示すよう
にほとんど繰返しを生じない。
In the case of defect detection by the ultrasonic probe 1, if the area of the defect 5 is large, the ultrasonic beam 4 repeatedly reflects according to the size of the defect 5, as shown in FIG. but when the small area of the defect 5, does not cause almost repeated as shown in Figure 2 (c).

【0016】一方、上記欠陥5はステライトと銀ろう付
部の界面に形成されるもので、ボイド状欠陥13の場合
はその直径が2mm以下の球であり、超音波ビーム4の反
射面は球面状であるのに対して、剥離状欠陥14の場合
には長さが3mm以上の平面状である。そのため、剥離状
欠陥14の場合、超音波ビーム4はこの欠陥14により
反射を繰返す。
On the other hand, the defect 5 is formed at the interface between the stellite and the silver brazing portion. In the case of the void defect 13, the diameter is 2 mm or less, and the reflection surface of the ultrasonic beam 4 is spherical. On the other hand, in the case of the detachment defect 14, the length is 3 mm or more. Therefore, in the case of the separation defect 14, the ultrasonic beam 4 is repeatedly reflected by the defect 14.

【0017】上記欠陥5の反射面の大きさによる超音波
ビームの反射回数を確認するため、超音波探傷試験を行
ったところ、次表1に示す結果を得た。即ち、欠陥5の
直径が3mm以上の場合には、4回以上の反射を明瞭に繰
返すのに対して、2mm以下では、最大の反射回数が2回
であった。
An ultrasonic inspection test was performed to confirm the number of times of reflection of the ultrasonic beam depending on the size of the reflection surface of the defect 5, and the results shown in the following Table 1 were obtained. That is, when the diameter of the defect 5 is 3 mm or more, the reflection is repeated clearly four times or more, whereas when the diameter of the defect 5 is 2 mm or less, the maximum number of reflections is two times.

【0018】[0018]

【表1】 [Table 1]

【0019】そのため、本実施例においては、欠陥によ
る超音波ビーム4の反射回数が4回未満の場合はボイド
状欠陥13と判別し、4回以上の場合には剥離状欠陥1
4と判別することとした。なお、ボイド状欠陥13につ
いては放射線透過試験を併用することにより、より的確
な検出が可能である。
Therefore, in this embodiment, if the number of reflections of the ultrasonic beam 4 by the defect is less than four, it is determined to be a void defect 13, and if it is four or more, the peeling defect 1 is determined.
4 was determined. The void defect 13 can be detected more accurately by using a radiation transmission test together.

【0020】[0020]

【発明の効果】本発明の剥離状欠陥検出方法において
は、超音波探触子が発信した超音波ビームを遅延材を介
して被検体に入射し、同被検体内の欠陥による欠陥エコ
ーを上記超音波探触子が受信してその反射回数をカウン
トするものとしたことによって、超音波ビームは遅延材
により遅延して欠陥に到達し、その欠陥エコーは不感帯
を回避することができるため、的確な欠陥検出が可能と
なり、また、剥離状欠陥は他の欠陥に比べて超音波ビー
ムの受信面積が広く、超音波ビームを複数回反射させる
ため、欠陥エコーの反射回数をカウントし、反射回数が
4回以上であるか否かを判別することにより、剥離状欠
陥の識別が可能となる。
According to the peeling defect detecting method of the present invention, an ultrasonic beam emitted by an ultrasonic probe is incident on a subject through a delay member, and a defect echo caused by a defect in the subject is detected. Since the ultrasonic probe receives and counts the number of reflections, the ultrasonic beam is delayed by the delay material and reaches the defect, and the echo of the defect can avoid the dead zone. In addition, the defect-like defect has a larger ultrasonic beam receiving area than other defects and reflects the ultrasonic beam multiple times, so the number of reflection echoes is counted and the number of reflections is reduced.
By determining whether the number is four or more, it is possible to identify the peeling defect.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例の説明図で、(a)は本実施
例に係る超音波探触子、(b)は同探触子が受信するエ
コー、(c)は欠陥がボイド状欠陥の場合の超音波ビー
ム、(d)は(c)の場合の欠陥エコー、(e)は欠陥
が剥離状欠陥の場合の超音波ビーム、(f)は(e)の
場合の欠陥エコーの説明図である。
FIG. 1 is an explanatory view of an embodiment of the present invention, wherein (a) is an ultrasonic probe according to the embodiment, (b) is an echo received by the probe, and (c) is a defect having a void. An ultrasonic beam in the case of a shape defect, (d) is a defect echo in the case of (c), (e) is an ultrasonic beam in the case where the defect is a peeling defect, and (f) is a defect echo in the case of (e). FIG.

【図2】上記一実施例に係る作用説明図で、(a)は欠
陥が大きい場合の超音波ビーム、(b)は(a)の場合
の欠陥エコー、(c)は欠陥が小さい場合の超音波ビー
ム、(d)は(c)の場合の欠陥エコーの説明図であ
る。
FIGS. 2A and 2B are operation explanatory diagrams according to the embodiment, in which FIG. 2A shows an ultrasonic beam when a defect is large, FIG. 2B shows a defect echo in the case of FIG. FIG. 7D is an explanatory diagram of a defect echo in the case of FIG.

【図3】被検体の説明図である。FIG. 3 is an explanatory diagram of a subject.

【図4】従来の超音波による欠陥検出方法の説明図で、
(a)は従来の方法に係る超音波探触子、(b)は同探
触子が受信するエコー、(c)は欠陥が被検体の表面に
近い場合の欠陥エコーの説明図である。
FIG. 4 is an explanatory diagram of a conventional defect detection method using ultrasonic waves;
(A) is an ultrasonic probe according to a conventional method, (b) is an echo received by the probe, and (c) is an explanatory diagram of a defect echo when a defect is close to the surface of a subject.

【符号の説明】[Explanation of symbols]

1 超音波探触子 2 遅延材 3 被検体 4 超音波ビーム 5 欠陥 6 不感帯 8 欠陥エコー 11 銀ろう付部 12 ステライト 13 ボイド状欠陥 14 剥離状欠陥 DESCRIPTION OF SYMBOLS 1 Ultrasonic probe 2 Delay material 3 Subject 4 Ultrasonic beam 5 Defect 6 Dead zone 8 Defect echo 11 Silver brazing part 12 Stellite 13 Void defect 14 Peeling defect

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】タービンブレードにろう付けされたステラ
イトの表面に遅延材を介して超音波探触子を配設して、
前記超音波探触子からステライトに超音波ビームを入射
し、タービンブレードとステライト境界の欠陥による欠
陥エコーを記超音波探触子が受信してその反射回数を
カウントし、前記反射回数が4回以上の場合は剥離状欠
陥が発生し、4回未満の場合は剥離状欠陥が発生してい
ないと判定することを特徴とする剥離状欠陥検出方法。
1. A stella brazed to a turbine blade.
An ultrasonic probe is arranged on the surface of the
The incident ultrasound beam from the ultrasound probe to stellite receives the previous SL ultrasonic probe a defect echo due to defects in a turbine blade and Stellite boundary counts the number of reflections, the number of reflections 4 If more than one time, peeling off
If less than 4 times, peeling defects have occurred.
A method for detecting a peeling defect, the method comprising: determining that no defect exists.
JP13353995A 1995-05-31 1995-05-31 Peeled defect detection method Expired - Lifetime JP3233816B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13353995A JP3233816B2 (en) 1995-05-31 1995-05-31 Peeled defect detection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13353995A JP3233816B2 (en) 1995-05-31 1995-05-31 Peeled defect detection method

Publications (2)

Publication Number Publication Date
JPH08327610A JPH08327610A (en) 1996-12-13
JP3233816B2 true JP3233816B2 (en) 2001-12-04

Family

ID=15107183

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13353995A Expired - Lifetime JP3233816B2 (en) 1995-05-31 1995-05-31 Peeled defect detection method

Country Status (1)

Country Link
JP (1) JP3233816B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5624250B2 (en) * 2012-04-24 2014-11-12 非破壊検査株式会社 Lamination peel test method and peel inspection apparatus

Also Published As

Publication number Publication date
JPH08327610A (en) 1996-12-13

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