JP3222367B2 - 温度測定回路 - Google Patents

温度測定回路

Info

Publication number
JP3222367B2
JP3222367B2 JP26285595A JP26285595A JP3222367B2 JP 3222367 B2 JP3222367 B2 JP 3222367B2 JP 26285595 A JP26285595 A JP 26285595A JP 26285595 A JP26285595 A JP 26285595A JP 3222367 B2 JP3222367 B2 JP 3222367B2
Authority
JP
Japan
Prior art keywords
voltage
operational amplifier
temperature
resistance
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP26285595A
Other languages
English (en)
Japanese (ja)
Other versions
JPH09105681A (ja
Inventor
裕之 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Azbil Corp
Original Assignee
Azbil Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Azbil Corp filed Critical Azbil Corp
Priority to JP26285595A priority Critical patent/JP3222367B2/ja
Priority to CN 96113066 priority patent/CN1077684C/zh
Publication of JPH09105681A publication Critical patent/JPH09105681A/ja
Application granted granted Critical
Publication of JP3222367B2 publication Critical patent/JP3222367B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Amplifiers (AREA)
JP26285595A 1995-10-11 1995-10-11 温度測定回路 Expired - Fee Related JP3222367B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP26285595A JP3222367B2 (ja) 1995-10-11 1995-10-11 温度測定回路
CN 96113066 CN1077684C (zh) 1995-10-11 1996-10-08 温度测量电路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26285595A JP3222367B2 (ja) 1995-10-11 1995-10-11 温度測定回路

Publications (2)

Publication Number Publication Date
JPH09105681A JPH09105681A (ja) 1997-04-22
JP3222367B2 true JP3222367B2 (ja) 2001-10-29

Family

ID=17381571

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26285595A Expired - Fee Related JP3222367B2 (ja) 1995-10-11 1995-10-11 温度測定回路

Country Status (2)

Country Link
JP (1) JP3222367B2 (zh)
CN (1) CN1077684C (zh)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6492694B2 (en) 1998-02-27 2002-12-10 Micron Technology, Inc. Highly conductive composite polysilicon gate for CMOS integrated circuits
US6746893B1 (en) 1997-07-29 2004-06-08 Micron Technology, Inc. Transistor with variable electron affinity gate and methods of fabrication and use
US6794255B1 (en) 1997-07-29 2004-09-21 Micron Technology, Inc. Carburized silicon gate insulators for integrated circuits
US6835638B1 (en) 1997-07-29 2004-12-28 Micron Technology, Inc. Silicon carbide gate transistor and fabrication process

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100458385C (zh) * 2005-10-24 2009-02-04 奇景光电股份有限公司 温度感测器
CN101169341B (zh) * 2006-10-25 2011-01-26 深圳迈瑞生物医疗电子股份有限公司 一种温度测量电路
GB2461300B (en) * 2008-06-27 2012-03-07 Gm Global Tech Operations Inc A method for estimating the temperature in an internal combustion engine
CN101718595B (zh) * 2009-12-15 2011-07-20 深圳和而泰智能控制股份有限公司 基于阻性温度传感器的温度测量方法及装置
JP6092129B2 (ja) 2014-01-16 2017-03-08 アズビル株式会社 温度計測システムおよび温度計測器
WO2016166901A1 (ja) * 2015-04-17 2016-10-20 三菱電機株式会社 温度測定装置
JP6785391B1 (ja) * 2020-04-02 2020-11-18 日本たばこ産業株式会社 エアロゾル吸引器及びエアロゾル吸引器の電源ユニット

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6746893B1 (en) 1997-07-29 2004-06-08 Micron Technology, Inc. Transistor with variable electron affinity gate and methods of fabrication and use
US6794255B1 (en) 1997-07-29 2004-09-21 Micron Technology, Inc. Carburized silicon gate insulators for integrated circuits
US6835638B1 (en) 1997-07-29 2004-12-28 Micron Technology, Inc. Silicon carbide gate transistor and fabrication process
US6492694B2 (en) 1998-02-27 2002-12-10 Micron Technology, Inc. Highly conductive composite polysilicon gate for CMOS integrated circuits

Also Published As

Publication number Publication date
JPH09105681A (ja) 1997-04-22
CN1077684C (zh) 2002-01-09
CN1151521A (zh) 1997-06-11

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