JP3220739B2 - Electronic component manufacturing method - Google Patents

Electronic component manufacturing method

Info

Publication number
JP3220739B2
JP3220739B2 JP6425995A JP6425995A JP3220739B2 JP 3220739 B2 JP3220739 B2 JP 3220739B2 JP 6425995 A JP6425995 A JP 6425995A JP 6425995 A JP6425995 A JP 6425995A JP 3220739 B2 JP3220739 B2 JP 3220739B2
Authority
JP
Japan
Prior art keywords
sealing resin
gap
flip chip
resin
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP6425995A
Other languages
Japanese (ja)
Other versions
JPH08264587A (en
Inventor
敦史 奧野
紀隆 大山
常一 橋本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyu Rec Co Ltd
Original Assignee
Sanyu Rec Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyu Rec Co Ltd filed Critical Sanyu Rec Co Ltd
Priority to JP6425995A priority Critical patent/JP3220739B2/en
Publication of JPH08264587A publication Critical patent/JPH08264587A/en
Application granted granted Critical
Publication of JP3220739B2 publication Critical patent/JP3220739B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector

Landscapes

  • Wire Bonding (AREA)

Abstract

PURPOSE: To cut a time required for resin sealing, improving reliability of quality and enlarge a selection range of resin by adopting a method such as to forcibly suck and fill liquid sealing resin supplied around a flip chip in a gap between the flip chip and a substrate on vacuum inside the gap. CONSTITUTION: After a flip chip is mounted on a substrate through a bump, liquid sealing resin is filled into a gap 5 between a substrate and a flip chip and an electronic component is manufactured. In the process, after a circumference of the gap 5 is sealed by liquid sealing resin supplied around a flip chip, it is placed under a depressurized condition. Thereby, air in the gap 5 and in sealing resin is sucked and exhausted to an outside while keeping it sealed by sealing resin and an interior of the clearance 5 is evacuated simultaneously. Thereafter, sealing resin is forcibly sucked and filled into the clearance 5 based on vacuum in the gap 5 by releasing decompression. For example, viscosity of liquid sealing resin is made within a range of 10 to 10000 voids.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、フリップチップを搭載
するタイプの電子部品の製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing an electronic component on which flip chips are mounted.

【0002】[0002]

【従来技術とその問題点】上記電子部品の製造に際し、
フリップチップの実装は、フリップチップの電極と、基
板の電極とをバンプを介して接続固定することにより行
われ、基板と、該基板上に搭載されたフリップチップと
の間には、パンプにもとづく間隙が生ずる。この間隙内
には、熱サイクル寿命の向上を目的として、封止樹脂が
充填される。
2. Description of the Related Art When manufacturing the above electronic components,
The mounting of the flip chip is performed by connecting and fixing the electrodes of the flip chip and the electrodes of the substrate via bumps, and the gap between the substrate and the flip chip mounted on the substrate is based on a pump. Gaps occur. The gap is filled with a sealing resin for the purpose of improving the thermal cycle life.

【0003】従来、このような封止樹脂の充填は図8に
概略的に示すように、基板1′上に搭載されたフリップ
チップ2′の側部にディスペンサよりの吐出で所定量の
液状封止樹脂3′を供給し、しかる後該樹脂3′を、基
板1′とフリップチップ2′との間の間隙5′内に毛細
管現象を利用してしみ込ませることにより行われている
が、この従来法は次の通りの問題点があった。
Conventionally, such a sealing resin is filled with a predetermined amount of liquid sealing by discharging from a dispenser on the side of a flip chip 2 'mounted on a substrate 1', as schematically shown in FIG. This is performed by supplying a sealing resin 3 'and then impregnating the resin 3' into the gap 5 'between the substrate 1' and the flip chip 2 'by utilizing the capillary phenomenon. The conventional method has the following problems.

【0004】(イ)間隙5′内に封止樹脂3′がしみ込
んで完全に充填される迄にかなりの放置時間を必要と
し、実装工程中、最も時間のかかる工程になっており、
生産効率の低下原因になっている。特に最近、上記間隙
5′は例えば20〜100μmと相当に狭くなって来て
いることに加えフリップチップ2′のサイズも大型化す
る傾向にあるために、より一層、時間のかかる工程にな
っている。
(A) A considerable amount of time is required for the sealing resin 3 'to penetrate into the gap 5' and completely fill it, and this is the most time-consuming step in the mounting process.
This is a cause of a decrease in production efficiency. In particular, recently, the gap 5 'has become considerably narrower, for example, 20 to 100 [mu] m, and the size of the flip chip 2' tends to increase. I have.

【0005】(ロ)高密度化によりフリップチップ2′
下面のバンプ数が増加し、該バンプは間隙5′内への封
止樹脂3′の流れ込みを妨げるので、どうしても封止樹
脂中に多くの気泡が残存し、品質面の信頼性に乏しくな
る。
(B) Flip chip 2 'due to high density
Since the number of bumps on the lower surface increases, and the bumps prevent the sealing resin 3 'from flowing into the gap 5', many bubbles remain in the sealing resin and the reliability of quality becomes poor.

【0006】(ハ)封止樹脂の粘度は、これを低くしな
ければ充填されにくいために、通常100ポイズ以下に
制限される。そのため封止樹脂中の充填材の含有率は例
えば60重量%以下に抑えなければならず、また膨張係
数が30ppm以上と大きくなる。さらに粘度の制約に
より、使用できる樹脂や硬化剤の種類に規制を受け、高
品質、高信頼性の封止樹脂の開発を妨げている。
(C) The viscosity of the sealing resin is usually limited to 100 poises or less, since it is difficult to fill the resin if the viscosity is not reduced. Therefore, the content of the filler in the sealing resin must be suppressed to, for example, 60% by weight or less, and the expansion coefficient increases to 30 ppm or more. In addition, due to restrictions on viscosity, the types of resins and curing agents that can be used are restricted, which hinders the development of high-quality and highly reliable sealing resins.

【0007】本発明はこのような従来の問題点を一掃す
ることを目的としてなされたものである。
[0007] The present invention has been made to solve such a conventional problem.

【0008】[0008]

【問題点を解決するための手段】本発明は、基板上にフ
リップチップをバンプを介し搭載した後に、上記基板と
フリップチップとの間の間隙内に液状封止樹脂を充填す
る電子部品の製造方法において、上記間隙の周囲を、上
記フリップチップの周りに供給した液状封止樹脂により
密封した後に、減圧下に置くことにより、上記間隙内並
びに封止樹脂中の空気を該封止樹脂による密封状態を保
持した状態のままで外部に吸引排出し同時に上記間隙内
を真空となし、しかる後に上記減圧を解くことにより、
間隙内真空にもとづき、上記封止樹脂を上記間隙内に強
制的に吸引充填することを特徴とする電子部品の製造方
法に係る。
SUMMARY OF THE INVENTION The present invention relates to a method of manufacturing an electronic component in which a flip chip is mounted on a substrate via bumps, and then a liquid sealing resin is filled in a gap between the substrate and the flip chip. In the method, after the periphery of the gap is sealed with the liquid sealing resin supplied around the flip chip, by placing under reduced pressure, the air in the gap and in the sealing resin is sealed by the sealing resin. By sucking and discharging to the outside while maintaining the state and making the inside of the gap a vacuum at the same time, and then releasing the decompression,
The present invention relates to a method for manufacturing an electronic component, wherein the sealing resin is forcibly filled into the gap based on the vacuum in the gap.

【0009】[0009]

【実施例】以下に本発明の1実施例を添付図面にもとづ
き説明すると次の通りである。
DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below with reference to the accompanying drawings.

【0010】図1は樹脂封止に供される電子部品の本体
部Aの構造を概略的に示し、該本体部Aは、基板1と該
基板1上にバンプ2を介し搭載されたフリップチップ3
とを備え、バンプ2の下端は基板1上の回路4に電気的
に接続している。図中、5は基板1とフリップチップ3
間の隙間であり、該隙間5内には下記に述べるように封
止樹脂が充填される。このような本体部Aの構造は従来
品と実質的に異なる所がなく、常法に従い製造すればよ
い。
FIG. 1 schematically shows the structure of a main part A of an electronic component to be subjected to resin sealing. The main part A is composed of a substrate 1 and a flip chip mounted on the substrate 1 via bumps 2. 3
And the lower end of the bump 2 is electrically connected to the circuit 4 on the substrate 1. In the figure, 5 is a substrate 1 and a flip chip 3
The gap 5 is filled with a sealing resin as described below. Such a structure of the main body portion A does not substantially differ from a conventional product, and may be manufactured according to a conventional method.

【0011】本発明製造方法においては、基板1とフリ
ップチップ3間の隙間5内に封止樹脂を充填するため
に、図2に示すように先ず最初に、基板1上に、フリッ
プチップ3の全周囲を隙間なしに取り囲むように液状封
止樹脂6が供給され、該封止樹脂6により上記隙間5が
その外周部において密封される 上記封止樹脂6の供給は、図3、4に示すように孔版印
刷手段を適用して実施することができる。
In the manufacturing method of the present invention, in order to fill the gap 5 between the substrate 1 and the flip chip 3 with the sealing resin, first, as shown in FIG. The liquid sealing resin 6 is supplied so as to surround the entire circumference without a gap, and the gap 5 is sealed at the outer peripheral portion by the sealing resin 6. The supply of the sealing resin 6 is shown in FIGS. As described above, the present invention can be implemented by applying a stencil printing means.

【0012】即ち、図3に示す状態で、スキージー7の
作動をして、孔版8の通孔8aと、該通孔8a内に同心
状に収納されたフリップチップ3との間の周隙9内に図
4に示すように液状封止樹脂6を押込み充填した後、可
動側、例えば孔版8を所定位置まで上昇退去させること
により、図2に示す通りの中間製品A1 が得られる。
That is, in the state shown in FIG. 3, the squeegee 7 is actuated so that the circumferential gap 9 between the through hole 8a of the stencil 8 and the flip chip 3 housed concentrically in the through hole 8a. After the liquid sealing resin 6 is pressed and filled therein as shown in FIG. 4, the movable side, for example, the stencil 8 is moved up and down to a predetermined position, so that the intermediate product A 1 as shown in FIG. Is obtained.

【0013】このような孔版印刷手段による封止樹脂の
供給は、例えば本出願人が先に提案した特開平2−20
5390号から公知の孔版印刷手段を適用して行うこと
ができる。
The supply of the sealing resin by such a stencil printing means is disclosed in, for example, Japanese Patent Application Laid-Open No.
No. 5390 can be performed by applying a known stencil printing means.

【0014】孔版印刷手段による封止樹脂6の供給に際
し、フリップチップ3の上面への封止樹脂6の供給は、
これを行う場合と行わない場合があり、図3、4では後
者の場合が示されている。
When the sealing resin 6 is supplied by the stencil printing means, the supply of the sealing resin 6 to the upper surface of the flip chip 3 is performed as follows.
There are cases where this is performed and cases where it is not performed, and FIGS. 3 and 4 show the latter case.

【0015】図3、4において、8bは孔版8の通孔8
aの上端部に、該孔版8の上面と面一となるように残さ
れた蓋部を示し、該蓋部8bはフリップチップ3よりも
僅かに大きい平面形状を有し、該チップ3の上面を液状
封止樹脂6から隔離する働きをし、周側部の端面におい
て、細幅のブリッジ(図示せず)を介し孔版8に支持さ
れている。
3 and 4, reference numeral 8b denotes a through hole 8 of the stencil 8;
a lid portion left at the upper end portion of the chip 3 so as to be flush with the upper surface of the stencil 8, and the lid portion 8b has a planar shape slightly larger than the flip chip 3; And is supported by the stencil 8 through a narrow bridge (not shown) at the end face of the peripheral side portion.

【0016】図2に示す中間製品A1 は図5に示すよう
に気密に保持された室10内に収納された状態で、真空
発生装置11の作動をして減圧下に置かれる。
The intermediate product A 1 shown in FIG. 2 is placed under reduced pressure by operating the vacuum generator 11 in a state where the intermediate product A 1 is housed in a chamber 10 kept airtight as shown in FIG.

【0017】上記封止樹脂6中で気泡12を形成してい
る空気並びに上記隙間5内の空気は、減圧下に置かれる
間に封止樹脂6の層内を通って室外に吸引排出され、同
時に隙間5内が真空になる。
The air forming the air bubbles 12 in the sealing resin 6 and the air in the gap 5 are sucked and discharged outside through a layer of the sealing resin 6 while being placed under reduced pressure. At the same time, the inside of the gap 5 is evacuated.

【0018】室10内の真空度は、これがあまり低いと
真空化が不充分となり、また逆にあまり高くなりすぎる
と、封止樹脂6が形崩れし密封性が損なわれる虞れがあ
るので、10トール以下、例えば1〜10トール程度が
適当である。
If the degree of vacuum in the chamber 10 is too low, vacuuming becomes insufficient, and if it is too high, the sealing resin 6 may lose its shape and the sealing property may be impaired. 10 Torr or less, for example, about 1 to 10 Torr is appropriate.

【0019】脱泡処理と真空化を終えた後は、真空発生
装置11の作動を停止し、図6に示すように、室10内
を例えば大気圧に戻すと、封止樹脂6を境として内外で
圧力差を生ずる。よってこの圧力差により封止樹脂6が
図7に示すように隙間5内に強制的に吸引及び/又は押
圧充填される。この強制的充填により、充填時間が短縮
され、且つ狭い隙間でも支障なしに充填を行うことが可
能になり、また封止樹脂の充填可能粘度を10〜10,
000ポイズにまで、また充填材の含有率を30〜90
重量%まで、それぞれ拡大できる。さらに充填可能粘度
を拡大できるので、樹脂並びに硬化剤の選択幅が広が
り、信頼性の高い樹脂配合が可能になる。
After the defoaming process and the evacuation are completed, the operation of the vacuum generator 11 is stopped, and as shown in FIG. A pressure difference occurs between inside and outside. Therefore, the sealing resin 6 is forcibly sucked and / or pressed and filled in the gap 5 as shown in FIG. By this forcible filling, the filling time is shortened, the filling can be performed without any trouble even in a narrow gap, and the fillable viscosity of the sealing resin is reduced to 10 to 10,
000 poise, and the content of filler is 30-90
Each can be expanded up to% by weight. Furthermore, since the filling viscosity can be increased, the range of choice of the resin and the curing agent is widened, and highly reliable resin compounding becomes possible.

【0020】以下に本発明と比較例を揚げ、その比較試
験結果を示すと表1の通りである。 テストサンプル 基板寸法 32mm×32mm×0.4mm フリップチップ寸法 10mm×10mm×0.4mm 基板とフリップチップ間の隙間の長さ 50μm 封止樹脂の種類 下記a,b,c a)ビスフェノール型エポキシ樹脂(エポキシ当量190) 100部 メチル無水テトラヒドロフタル酸 90部 2P4MZ(イミダゾール、四国化成(株)) 1部 カーボンブラック 1部 KBM−403(シランカップリング剤、信越化学(株)) 1部 シリカ(平均粒径、5μm) 290部 を混合し充填剤量60wt%、粘度80ポイズの封止材を得た。
Table 1 shows the results of the comparative tests of the present invention and comparative examples. Test sample Substrate size 32mm × 32mm × 0.4mm Flip chip size 10mm × 10mm × 0.4mm Length of gap between substrate and flip chip 50μm Type of sealing resin a), b, c a) Bisphenol type epoxy resin ( Epoxy equivalent 190) 100 parts Methyl tetrahydrophthalic anhydride 90 parts 2P4MZ (imidazole, Shikoku Chemicals) 1 part Carbon black 1 part KBM-403 (silane coupling agent, Shin-Etsu Chemical Co., Ltd.) 1 part Silica (average particle) (Diameter: 5 μm) to obtain a sealing material having a filler amount of 60 wt% and a viscosity of 80 poise.

【0021】b)シリカを65wt%充填した以外は
a)と同じ配合で、粘度150ポイズの封止材を得た。
B) A sealing material having a viscosity of 150 poise was obtained with the same composition as in a) except that 65 wt% of silica was filled.

【0022】c)シリカを70wt%充填した以外は
a)と同じ配合で、粘度300ポイズの封止材を得た。
C) A sealing material having a viscosity of 300 poise was obtained with the same composition as in a) except that 70 wt% of silica was filled.

【0023】本発明 テストサンプルの所定部位に3種類の封止樹脂を図3、
4に示す孔版印刷手段を適用して供給した後、脱泡器内
で5mmHg以下に2分間保ち、しかる後常圧に戻し、
130℃で2時間硬化した。
In the present invention, three kinds of sealing resins are applied to predetermined portions of a test sample as shown in FIG.
After applying the stencil printing means shown in 4 and supplying, it is kept at 5 mmHg or less for 2 minutes in a defoamer, and then returned to normal pressure.
Cured at 130 ° C. for 2 hours.

【0024】比較例 テストサンプルを60℃に加温し、実施例の3種類の封
止材a)〜c)をシリンジに詰め、脱気処理を行なった
ものをフリップチップの片側に流し出し、十分にチップ
の下面および周囲に樹脂が行き渡るのを待って、130
℃/2時間硬化した。
Comparative Example A test sample was heated to 60 ° C., and the three types of sealing materials a) to c) of the example were packed in a syringe, and the degassed one was poured out to one side of a flip chip. Waiting for the resin to spread sufficiently on the lower surface and around the chip,
C./2 hours.

【0025】[0025]

【表1】 [Table 1]

【0026】表1から明らかなように、本発明では封止
時間を、低粘度(封止樹脂a:80ポイズ)の場合で5
分から3分に短縮でき、中粘度(封止樹脂b:150ポ
イズ)の場合では12分から3分に短縮でき、しかも高
粘度(封止樹脂c:300ポイズ)の場合では、比較例
では封止不可能であるのに対し、本発明で低、中粘度の
場合と同様に短時間で充填できる。また本発明では気泡
が存在せず、品質面でも比較例に比し遥かに優れてい
る。
As is clear from Table 1, in the present invention, the sealing time is set to 5 when the viscosity is low (sealing resin a: 80 poise).
From 3 minutes to 3 minutes. In the case of medium viscosity (sealing resin b: 150 poise), it can be shortened from 12 minutes to 3 minutes. In the case of high viscosity (sealing resin c: 300 poise), sealing is performed in the comparative example. While it is impossible, it can be filled in a short time as in the case of low and medium viscosity in the present invention. Further, in the present invention, there are no bubbles, and the quality is far superior to the comparative example.

【0027】[0027]

【発明の効果】本発明によれば次の効果が得られる。According to the present invention, the following effects can be obtained.

【0028】隙間5内に液状封止樹脂6を圧力差を利
用して強制的に充填できるので、樹脂封止に要する時間
を、従来の毛管現象利用方式に比べ少なくとも4割程度
短縮できる。
Since the gap 5 can be forcibly filled with the liquid sealing resin 6 by utilizing a pressure difference, the time required for resin sealing can be reduced by at least about 40% as compared with the conventional method using the capillary phenomenon.

【0029】真空充填方式なので、封止樹脂中に気泡
が含まれることがなくなり、品質面の信頼性を向上でき
る。
Since the vacuum filling method is employed, no bubbles are contained in the sealing resin, and the reliability of quality can be improved.

【0030】液状封止樹脂の適用可能な粘度範囲を拡
大でき、従って樹脂並びに硬化剤の選択巾が広がり、信
頼性の高い樹脂配合が可能になる。
The applicable viscosity range of the liquid sealing resin can be expanded, so that the range of choice of the resin and the curing agent is widened, and a highly reliable resin compounding becomes possible.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明製造方法において、樹脂封止に供される
電子部品本体部の構造を概略的に示す側面図である。
FIG. 1 is a side view schematically showing a structure of an electronic component body used for resin sealing in the manufacturing method of the present invention.

【図2】本発明製造方法における、フリップチップ周囲
への液状封止樹脂の供給状況を概略的に示す1部縦断側
面図である。
FIG. 2 is a partial vertical sectional side view schematically showing a supply state of a liquid sealing resin around a flip chip in the manufacturing method of the present invention.

【図3】液状封止樹脂の供給を孔版印刷手段を適用して
行っている状況であって、上記封止樹脂の供給前の状況
を示す一部縦断側面図である。
FIG. 3 is a partially longitudinal side view showing a state in which the supply of the liquid sealing resin is performed by applying a stencil printing means, and before the supply of the sealing resin.

【図4】同、供給後の状況を概略的に示す一部縦断側面
図である。
FIG. 4 is a partially longitudinal side view schematically showing a state after the supply.

【図5】本発明製造方法における、脱気工程の状況を示
す説明図である。
FIG. 5 is an explanatory view showing the state of a degassing step in the production method of the present invention.

【図6】同、大気圧への復帰工程を示す説明図である。FIG. 6 is an explanatory diagram showing a step of returning to atmospheric pressure.

【図7】同、液状封止樹脂の充填終了時の状況を示す説
明図である。
FIG. 7 is an explanatory view showing a state at the time of completion of filling of the liquid sealing resin.

【図8】従来法の説明図である。FIG. 8 is an explanatory diagram of a conventional method.

【符号の説明】[Explanation of symbols]

1 基板 2 バンプ 3 フリップチップ 4 回路 5 隙間 6 液状封止樹脂 7 スキージー 8 孔版 9 周隙 10 室 11 真空発生装置 12 気泡 DESCRIPTION OF SYMBOLS 1 Substrate 2 Bump 3 Flip chip 4 Circuit 5 Gap 6 Liquid sealing resin 7 Squeegee 8 Stencil 9 Peripheral gap 10 Room 11 Vacuum generator 12 Bubbles

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭54−11696(JP,A) 特開 平4−233742(JP,A) 特開 平2−205390(JP,A) (58)調査した分野(Int.Cl.7,DB名) H01L 21/60 311 H01L 21/50 ────────────────────────────────────────────────── ─── Continuation of front page (56) References JP-A-54-11696 (JP, A) JP-A-4-233742 (JP, A) JP-A-2-205390 (JP, A) (58) Field (Int.Cl. 7 , DB name) H01L 21/60 311 H01L 21/50

Claims (5)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 基板上にフリップチップをバンプを介し
搭載した後に、上記基板とフリップチップとの間の間隙
内に液状封止樹脂を充填する電子部品の製造方法におい
て、上記間隙の周囲を、上記フリップチップの周りに供
給した液状封止樹脂により密封した後に、減圧下に置く
ことにより、上記間隙内並びに封止樹脂中の空気を該封
止樹脂による密封状態を保持した状態のままで外部に吸
引排出し同時に上記間隙内を真空となし、しかる後に上
記減圧を解くことにより、間隙内真空にもとづき、上記
封止樹脂を上記間隙内に強制的に吸引充填することを特
徴とする電子部品の製造方法。
1. A method of manufacturing an electronic component, comprising: mounting a flip chip on a substrate via bumps; and filling a liquid sealing resin in a gap between the substrate and the flip chip. After sealing with the liquid sealing resin supplied around the flip chip, by placing it under reduced pressure, the air in the gap and in the sealing resin is externally kept in a state where the sealing resin is kept sealed. An electronic component characterized in that the gap is evacuated and at the same time a vacuum is formed in the gap, and then the pressure is released, whereby the sealing resin is forcibly suction-filled into the gap based on the vacuum in the gap. Manufacturing method.
【請求項2】 フリップチップ周りへの液状封止樹脂の
供給が、孔版印刷手段を適用して行われることを特徴と
する請求項1記載の製造方法。
2. The method according to claim 1, wherein the supply of the liquid sealing resin around the flip chip is performed by applying stencil printing means.
【請求項3】 液状封止樹脂の粘度が10〜10,00
0ポイズの範囲にあることを特徴とする請求項1記載の
製造方法。
3. The liquid sealing resin has a viscosity of 10 to 10,000.
2. The method according to claim 1, wherein the range is 0 poise.
【請求項4】 液状封止樹脂が30〜90重量%の充填
材を含有していることを特徴とする請求項3記載の製造
方法。
4. The method according to claim 3, wherein the liquid sealing resin contains 30 to 90% by weight of a filler.
【請求項5】 間隙内並びに封止樹脂中の空気の外部へ
の吸引排出を、10トール以下の真空度のもとに行うこ
とを特徴とする請求項1記載の製造方法。
5. The method according to claim 1, wherein the suction and discharge of air in the gap and in the sealing resin to the outside is performed under a degree of vacuum of 10 Torr or less.
JP6425995A 1995-03-23 1995-03-23 Electronic component manufacturing method Expired - Lifetime JP3220739B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6425995A JP3220739B2 (en) 1995-03-23 1995-03-23 Electronic component manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6425995A JP3220739B2 (en) 1995-03-23 1995-03-23 Electronic component manufacturing method

Publications (2)

Publication Number Publication Date
JPH08264587A JPH08264587A (en) 1996-10-11
JP3220739B2 true JP3220739B2 (en) 2001-10-22

Family

ID=13253023

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6425995A Expired - Lifetime JP3220739B2 (en) 1995-03-23 1995-03-23 Electronic component manufacturing method

Country Status (1)

Country Link
JP (1) JP3220739B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008113045A (en) * 2008-02-04 2008-05-15 Texas Instr Japan Ltd Method for manufacturing semiconductor device
JP7236807B2 (en) 2018-01-25 2023-03-10 浜松ホトニクス株式会社 Semiconductor device and method for manufacturing semiconductor device

Also Published As

Publication number Publication date
JPH08264587A (en) 1996-10-11

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