JP3130067B2 - Basket for semiconductor wafer - Google Patents

Basket for semiconductor wafer

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Publication number
JP3130067B2
JP3130067B2 JP6235791A JP6235791A JP3130067B2 JP 3130067 B2 JP3130067 B2 JP 3130067B2 JP 6235791 A JP6235791 A JP 6235791A JP 6235791 A JP6235791 A JP 6235791A JP 3130067 B2 JP3130067 B2 JP 3130067B2
Authority
JP
Japan
Prior art keywords
wafer
basket
ribs
side walls
slit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP6235791A
Other languages
Japanese (ja)
Other versions
JPH04276644A (en
Inventor
武美 柿崎
Original Assignee
株式会社柿崎製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社柿崎製作所 filed Critical 株式会社柿崎製作所
Priority to JP6235791A priority Critical patent/JP3130067B2/en
Publication of JPH04276644A publication Critical patent/JPH04276644A/en
Application granted granted Critical
Publication of JP3130067B2 publication Critical patent/JP3130067B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、多数の半導体ウエハを
所定ピッチ毎に並列状に整列して収納させ、洗浄やエッ
チングおよび乾燥等の処理を行う半導体ウエハ用バスケ
ツトに関し、特に大径の半導体ウエハに適する半導体ウ
エハ用バスケツトに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor wafer basket in which a large number of semiconductor wafers are arranged and stored in parallel at predetermined pitches, and are subjected to processes such as cleaning, etching and drying. The present invention relates to a semiconductor wafer basket suitable for a wafer.

【0002】[0002]

【従来の技術】この種の半導体ウエハ用バスケツトとし
ては、例えば本件出願人が先に提案した実公平2−25
233号に開示されているものがある。このバスケツト
Aは、図5乃至図7で示すように全体が弗素樹脂材で一
体成型され、長手方向に沿って平行する両側壁1,3の
両端部間を短手方向に沿う支持板13,14で各々連結
すると共に、当該両側壁1,3の下方にはウエハWを担
持する台部5,6が内側へ対向状に各々突設され、上下
が開口された箱形に形成されている。上記両側壁1,3
の内面には、ウエハWが挿入される縦方向へ延在する多
数のリブ2,4が当該両側壁1,3の長手方向へ所定ピ
ッチ毎に並列状に設けられ、これらリブ2,4の間には
両側壁1,3の内外を連通させる縦長のスリット7,8
が穿設されている。また、上記台部5,6の傾斜上面5
a,6aにも上記リブ2,4に連続して内向き傾斜状に
延在するリブ9,10が突設され、これらリブ9,10
の間にも両側壁1,3の内外を連通させる縦長のスリッ
ト11,12が各々穿設され、上記スリット7とスリッ
ト11またスリット8とスリット12はウエハWの挿入
方向に沿って各々上下に整合状態で配設されている。
2. Description of the Related Art As a basket for a semiconductor wafer of this kind, for example, Japanese Utility Model Application Publication No. 2-25 proposed previously by the present applicant.
No. 233 is disclosed. As shown in FIGS. 5 to 7, the entire basket A is integrally formed of a fluororesin material, and has a support plate 13 extending along the lateral direction between both ends of both side walls 1 and 3 parallel in the longitudinal direction. At the same time, bases 5 and 6 for supporting the wafer W are respectively provided to project inwardly below the side walls 1 and 3 so as to face each other, and are formed in a box shape with upper and lower openings. . The above both side walls 1, 3
A large number of ribs 2 and 4 extending in the vertical direction into which the wafer W is inserted are provided in parallel at a predetermined pitch in the longitudinal direction of the side walls 1 and 3 on the inner surface of the rib 2. Vertical slits 7 and 8 for communicating the inside and outside of both side walls 1 and 3 between them
Are drilled. In addition, the inclined upper surfaces 5 of the base portions 5 and 6
Ribs 9 and 10 protruding from the ribs 2 and 4 are also provided on the a and 6a.
Also, vertically elongated slits 11 and 12 for communicating the inside and the outside of both side walls 1 and 3 are formed between them, and the slits 7 and 11 and the slits 8 and 12 are respectively arranged vertically in the insertion direction of the wafer W. They are arranged in an aligned state.

【0003】上記のバスケツトAにウエハWを収納する
際には、ウエハWをリブ2,4の間に挿入させると、落
下しながらこれに連続するリブ9,10の間に達した当
該ウエハWの下方縁部が上記台部5,6の傾斜上面5
a,6aに担持される。このようにしてバスケツトA内
へ収納された多数のウエハWは、上記リブ2,4および
リブ9,10によって間隔が保持され、整列状態で隔置
されると共に、上記スリット7,8およびスリット1
1,12によって処理液の流通や液切れが良くなって均
一で良好な処理を行うことができる。
When the wafer W is inserted into the basket A, when the wafer W is inserted between the ribs 2 and 4, the wafer W which has fallen and has reached between The lower edge of the sloping upper surface 5 of the bases 5, 6
a, 6a. A large number of wafers W accommodated in the basket A in this manner are spaced apart from each other by the ribs 2 and 4 and the ribs 9 and 10 so as to be aligned, and the slits 7 and 8 and the slit 1
The flow of the processing liquid and the drainage of the processing liquid are improved by 1 and 12, so that a uniform and favorable processing can be performed.

【0004】[0004]

【発明が解決しようとする課題】ところが、この種の半
導体ウエハは近年の著しい技術革新によって大径のもの
の製造が可能になり、また出来るだけ大径の半導体ウエ
ハを造ってこれからチップを切り出すようにしたほうが
生産効率が高く経済的である等の理由から次第に大径化
し、最近では直径8インチのものも規格化されている。
この大径化に伴って半導体ウエハは重量が増し、割れや
変形を防止するために厚みも増してくるので、これに適
合するようにバスケツトの形状も大きくしなければなら
ないことは勿論であるが、それだけに止どまらずバスケ
ツトは今迄以上に均一で良好な処理が可能なものを要求
されるので、上記した従来構造のバスケツトを単に形状
だけ大きくしただけでは十分に対応できなくなる。
However, a remarkable technological innovation in recent years has enabled large-diameter semiconductor wafers of this kind to be manufactured, and semiconductor chips of as large a diameter as possible have to be cut out from chips. For this reason, the diameter is gradually increased for reasons such as higher production efficiency and economical efficiency. Recently, a diameter of 8 inches has been standardized.
As the diameter of the semiconductor wafer increases, the weight of the semiconductor wafer increases, and the thickness of the semiconductor wafer also increases to prevent cracking and deformation. Therefore, it is a matter of course that the shape of the basket must be increased to conform to this. In addition to this, since the basket is required to be more uniform and capable of better treatment than ever, it is not sufficient to simply increase the shape of the above-described conventional basket.

【0005】例えば、大径ウエハを上記した従来構造の
バスケットAに収納した場合に、ウエハWの下方縁部を
担持する台部5,6の傾斜上面5a,6aはウエハ重量
の増加によって今迄以上に大きな落下時の衝撃と荷重を
受ける。ところが、この傾斜上面5a,6aはスリット
11,12により中間部が切り欠かれているので受圧面
積が少なく、このために単位面積当たり大きな荷重を受
けると共に、特にスリット11,12の口縁部はウエハ
Wの縁部によって大きな落下衝撃を受ける。このため
に、ウエハWの出し入れを頻繁に繰り返すうちにこれを
担持する傾斜上面5a,6aが凹んだり、スリット1
1,12の口縁部が損傷したり、ウエハWが刺さり込ん
だりしてウエハWの出し入れが不能となる恐れがあると
共に、削り取られた微細な破片が処理液中に混入してウ
エハWに付着したり処理液を汚染させて当該ウエハWの
性能を著しく低下させて使用不能にさせる。
For example, when a large-diameter wafer is stored in the above-described conventional basket A, the inclined upper surfaces 5a and 6a of the pedestals 5 and 6 supporting the lower edge of the wafer W have been increased due to an increase in the weight of the wafer. It receives the impact and load at the time of a large drop. However, the inclined upper surfaces 5a and 6a have a small pressure receiving area because the middle portions are cut off by the slits 11 and 12, and therefore receive a large load per unit area. A large drop impact is received by the edge of the wafer W. For this reason, while the loading and unloading of the wafer W is frequently repeated, the inclined upper surfaces 5a and 6a that carry the wafer W are depressed,
The edges of the wafers 1 and 12 may be damaged, and the wafer W may be stabbed, making it impossible to take the wafer W in and out. The performance of the wafer W is remarkably reduced due to adhesion or contamination of the processing liquid, and the wafer W is made unusable.

【0006】また従来構造のバスケットAでは、上記ス
リット7とスリット11またスリット8とスリット12
が、各々ウエハWの挿入方向に沿って各々整合状態で上
下に配設されているので、厚いウエハWを隣接する各リ
ブ2,2間と各リブ9,9間および各リブ4,4間と各
リブ10,10間に各々挿入されると、当該ウエハWで
全ての各スリット7,8,11,12の一部が今迄以上
に内側から閉塞され、処理液の流動が悪くなってしまう
ことになる。しかし、これを防ぐために各リブ間のピッ
チを大きくして間隔を広げると、ウエハWの収納枚数が
少なくなって処理能力が低下すると共に、各リブ間でウ
エハWが揺動する遊び空間が大きくなって隣接するウエ
ハWが相互に接触して損傷する恐れもあるので、むやみ
にピッチを大きくすることはできない。
In the basket A having the conventional structure, the slits 7 and 11 or the slits 8 and 12
Are arranged vertically in alignment with each other in the insertion direction of the wafer W, so that the thick wafer W can be placed between the adjacent ribs 2 and 2 and between the ribs 9 and 9 and between the ribs 4 and 4. When each is inserted between the ribs 10 and 10, a part of all the slits 7, 8, 11, and 12 in the wafer W is more closed from the inside than before, and the flow of the processing liquid becomes poor. Will be lost. However, if the pitch between the ribs is increased to increase the spacing to prevent this, the number of wafers W to be stored is reduced and the processing capacity is reduced, and the play space in which the wafer W swings between the ribs is increased. As a result, the adjacent wafers W may be damaged by contact with each other, so that the pitch cannot be unnecessarily increased.

【0007】更に、上記した各スリット7,8,11,
12のうちで特に台部5,6に穿設された傾斜状のスリ
ット11,12は、上下方向へ連通されて最後の液切れ
を行う極めて重要な個所であり、このスリット11,1
2が上記のようにウエハWで閉塞されたり、落下したウ
エハWの衝撃等でスリット11,12の口縁部が損傷し
て滑面が毛羽立つた状態になると、この部分で処理液の
澱みを生じて均一な処理ができなくなる。そこで本発明
では、これらの課題を解決して大径で重量や厚みの増加
したウエハに適合し得る半導体ウエハ用バスケットの提
供を目的とするものである。
Further, each of the slits 7, 8, 11,
In particular, the inclined slits 11 and 12 formed in the pedestals 5 and 6 are extremely important places that communicate with each other in the vertical direction to perform the last liquid drainage.
2 is closed by the wafer W as described above, or when the edges of the slits 11 and 12 are damaged due to the impact of the dropped wafer W or the like and the smooth surface becomes fluffy, the processing liquid stagnates in this portion. As a result, uniform processing cannot be performed. SUMMARY OF THE INVENTION It is an object of the present invention to solve these problems and to provide a basket for a semiconductor wafer which can be adapted to a wafer having a large diameter and an increased weight and thickness.

【0008】[0008]

【課題を解決するための手段】本発明の要旨は、長手方
向に沿って平行する両側壁と、この両側壁の両端部間を
各々連結する左右の支持板と、両側壁の下方に連続状態
で延在されると共に、当該両側壁の内側へ対向状に各々
突設されてウエハの下方縁部を担持する内面が傾斜状の
受台部を備えた上下が開口する箱形のバスケツトに形成
され、上記両側壁の内面にはウエハの挿入通路を形成す
る縦方向へ延在した多数のリブが当該両側壁の長手方向
へ所定ピッチ毎に並列状に設けられ、これらの各リブ間
にはバスケツトの内外を連通させる縦長の上部スリット
が穿設されており、当該各リブを含む両側壁は上部側が
ほぼ垂直状で下部側は内側へ傾斜状に延在されて各リブ
は上記受台部との連結部分で終端されており、上記受台
部には上記上部スリットの延長線上で挿入されたウエハ
の下方縁部を担持する傾斜状担持面が形成され、当該傾
斜状担持面の両側にはバスケツトの内外を連通させる傾
斜状の下部スリットと、ウエハの下方縁部に係合して隔
置させる間隔保持部材とが各々上記リブの延長線上に整
合する態様で所定ピッチ毎に並列状に配設されている半
導体ウエハ用バスケットである。また本発明の他の要旨
は、上記した間隔保持部材の隣接相互間が形成する挿通
幅に対して上記した上部スリットの幅を広く形成した半
導体ウエハ用バスケットである。
SUMMARY OF THE INVENTION The gist of the present invention is that both side walls parallel to each other in the longitudinal direction, left and right support plates connecting both ends of the both side walls, and a continuous state below the both side walls. Are formed in a box-shaped basket having an upper and lower opening provided with a sloping pedestal portion, each of which protrudes inwardly to the inside of the both side walls and carries the lower edge portion of the wafer. On the inner surfaces of the side walls, a number of ribs extending in the vertical direction forming a wafer insertion passage are provided in parallel at a predetermined pitch in the longitudinal direction of the side walls, and between these ribs. A vertically elongated upper slit for communicating the inside and the outside of the basket is formed, and both side walls including the respective ribs extend substantially vertically on the upper side and are inclined inwardly on the lower side. At the connection with the An inclined support surface for supporting the lower edge of the wafer inserted on the extension of the cassette is formed. On both sides of the inclined support surface, an inclined lower slit for communicating the inside and the outside of the basket, A semiconductor wafer basket in which a spacing member that engages with and is spaced from an edge is arranged in parallel at a predetermined pitch so as to be aligned with an extension of the rib. Another aspect of the present invention is a semiconductor wafer basket in which the width of the upper slit is wider than the insertion width formed between the adjacent spacing members.

【0009】[0009]

【実施例】以下に、本発明を図1乃至図4で図示の実施
例に基づいて詳細に説明する。このバスケツト30は、
長手方向に沿って平行する両側壁31,32と、この両
側壁31,32の両端部間を各々連結する左右の支持板
33,34と、両側壁31,32の下方に連続状態で延
在されると共に、当該両側壁31,32内側へ対向状に
各々突設されたウエハWを下方縁部を担持する傾斜状の
受台部35,36と、この受台部35,36の下方に設
けられた脚部37,38とで上下が開口する箱形に形成
され、全体が弗素樹脂材で一体成型されている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail with reference to the embodiments shown in FIGS. This basket 30
Side walls 31 and 32 parallel to each other in the longitudinal direction, left and right support plates 33 and 34 connecting both ends of the side walls 31 and 32, respectively, and extend continuously below the side walls 31 and 32. At the same time, the inclined receiving bases 35 and 36 for holding the lower edges of the wafers W projecting to the inside of the both side walls 31 and 32 facing each other are provided below the receiving bases 35 and 36. It is formed in a box shape with upper and lower openings by the provided leg portions 37 and 38, and the whole is integrally formed of a fluorine resin material.

【0010】上記両側壁31,32の内面には、隣接相
互間でウエハWの挿入通路を形成する縦方向へ延在した
多数のリブ39,40が当該両側壁31,32の長手方
向へ所定ピッチ毎に並列状に設けられ、これらリブ3
9,40の間にはバスケツト30の内外を連通させる縦
長の上部スリット41,42が穿設されている。また、
上記両側壁31,32と各リブ39,40は上部側がほ
ぼ垂直状で下部側は内側へ傾斜状に延在されていると共
に、各リブ39,40は互いに対向状に突設されてい
る。またこれらの各リブ39,40は、中間部において
隣接する相互間が補強リブ43,44によって連結さ
れ、当該各リブ39,40は上記受台部35,36との
連結部分のところで終端されている。
On the inner surfaces of the side walls 31, 32, a number of longitudinally extending ribs 39, 40 are formed in the longitudinal direction of the side walls 31, 32 to form an insertion passage for the wafer W between adjacent sides. These ribs 3 are provided in parallel at every pitch.
Elongated upper slits 41 and 42 for communicating the inside and the outside of the basket 30 are formed between the slots 9 and 40. Also,
The side walls 31, 32 and the ribs 39, 40 extend substantially vertically on the upper side and inclined inward on the lower side, and the ribs 39, 40 project from each other. The ribs 39 and 40 are connected at their intermediate portions by reinforcing ribs 43 and 44 between adjacent ones, and the ribs 39 and 40 are terminated at the connecting portions with the receiving portions 35 and 36. I have.

【0011】次に、上記受台部35,36にはバスケツ
ト30の内外を連通させる短尺で傾斜状をした各下部ス
リット45,46と、ウエハWを係止して隔置させる間
隔保持部材としての位置決め突起47,48とが設けら
れている。上記下部スリット45,46と位置決め突起
47,48は、上記各リブ39,40の延長線上に整合
する態様で所定ピッチ毎に並列状に配設されており、当
該位置決め突起47,48は円錐台形状で隣接する位置
決め突起の基部側相互間に形成される間隔が、上記各リ
ブ39,40の隣接相互間の間隔よりも僅かに狭くなる
ようにしている。また、上記下部スリット45,46の
隣接相互間から位置決め突起47,48の隣接相互間に
渡って形成された傾斜状担持面35a,36aはウエハ
Wの外周面に適合する円弧状面に形成されている。
Next, the receiving portions 35 and 36 are short and inclined lower slits 45 and 46 for communicating between the inside and the outside of the basket 30, and a spacing member for locking and separating the wafer W. Are provided. The lower slits 45, 46 and the positioning projections 47, 48 are arranged in parallel at a predetermined pitch so as to be aligned with an extension of each of the ribs 39, 40, and the positioning projections 47, 48 are truncated cones. The interval formed between the base portions of the positioning projections adjacent to each other in shape is slightly smaller than the interval between the adjacent ribs 39 and 40. The inclined supporting surfaces 35a, 36a formed from between the adjacent lower slits 45, 46 and between the adjacent positioning projections 47, 48 are formed into arc-shaped surfaces that match the outer peripheral surface of the wafer W. ing.

【0012】上記のバスケツト30にウエハWを収納す
る際に、ウエハWをリブ39,40の隣接相互間に形成
された上部スリット41,42に挿入させると、落下し
たウエハWは下方縁部を受台部35,36の傾斜状担持
面35a,36aによって担持される。この傾斜状担持
面35a,36aは開口部がなくて広い受圧面積を有し
ているので、ウエハWの落下衝撃による損傷や変形が少
ない。またバスケツト30内に収納された多数のウエハ
Wは、両面に各々係合する上記リブ39,40および位
置決め突起47,48の隣接相互間で間隔が保持されて
整列状態で隔置されるが、当該リブ39,40と位置決
め突起47,48との隣接相互間が形成する挿通幅は、
従来構造の一連のリブの場合のように一定ではなく異な
った所望幅に設定させることができる。従って、例えば
上記実施例のようにリブ39,40側ではウエハWの挿
入が容易で且つ挿入されたウエハWによる上部スリット
41,42の閉塞を少なくするために上部側が揺動可能
なように挿通幅を広くし、位置決め突起47,48側で
は揺動した隣接するウエハW相互が接触しないように挿
通幅を狭くして間隔保持を計るようにすることができ
る。尚、上記した位置決め突起47,48の代わりに、
リブ39,40とは分離された短尺のリブを間隔保持部
材とするようにしても良い。更に、上記した下部スリッ
ト45,46は上部スリット41,42と整合しないよ
うに配設され、ウエハWを担持する傾斜状担持面35
a,36aの両側に開口されているので、ウエハWによ
って全く閉塞されることがなく然も当該ウエハWの両面
に対して効果的に処理液を流動させることができる。
When the wafer W is inserted into the upper slits 41 and 42 formed between the adjacent ribs 39 and 40 when the wafer W is stored in the basket 30, the dropped wafer W has a lower edge. It is carried by the inclined carrying surfaces 35a, 36a of the receiving portions 35, 36. Since the inclined carrying surfaces 35a and 36a have no opening and a wide pressure receiving area, damage and deformation due to a drop impact of the wafer W are small. A large number of wafers W accommodated in the basket 30 are spaced from each other adjacent to the ribs 39, 40 and the positioning projections 47, 48, which are respectively engaged with both surfaces, in an aligned state. The insertion width formed between adjacent ribs 39 and 40 and positioning projections 47 and 48 is
Instead of being constant as in the case of a series of ribs of conventional construction, they can be set to different desired widths. Therefore, for example, as in the above-described embodiment, the wafers W can be easily inserted into the ribs 39 and 40 at the side thereof, and the upper sides can be swingably inserted to reduce the closing of the upper slits 41 and 42 by the inserted wafer W. The width can be widened, and the insertion width can be narrowed at the positioning protrusions 47 and 48 so as to prevent the adjacent wafers W swinging from coming into contact with each other, thereby maintaining the spacing. In addition, instead of the positioning protrusions 47 and 48 described above,
A short rib separated from the ribs 39 and 40 may be used as the spacing member. Further, the lower slits 45 and 46 described above are disposed so as not to be aligned with the upper slits 41 and 42, and the inclined supporting surface 35 for supporting the wafer W.
Since the openings are formed on both sides of the wafer W, the processing liquid can be effectively flown to both sides of the wafer W without being completely blocked by the wafer W.

【0013】[0013]

【発明の効果】上記した実施例でも明らかなように、本
発明による半導体ウエハ用バスケットでは次のような効
果を奏する。このバスケツトでは、収納されるウエハの
下方縁部を受台部に形成された開口部のない広い受圧面
積の傾斜状担持面によって担持するようにしているの
で、ウエハの落下衝撃による損傷や変形が少ない。また
バスケツトに収納されたウエハは、上部側の両面に各々
係合するリブと、当該リブと分離形成された下部側の両
面に各々係合する位置決め突起または短尺のリブによる
間隔保持部材の隣接相互間で間隔保持されて整列状態で
隔置されるので、従来構造の一連のリブの場合のように
ウエハの挿入される挿通幅が一定に規制されずに、ウエ
ハの挿入並びに当該ウエハに対する処理液の流動に適し
た所望の挿通幅に個別に設定させることができる。従っ
て、例えばリブ間の挿通幅を広く間隔保持部材間の挿通
幅を狭く設定し、ウエハの挿入が容易で且つリブ間に形
成された上部スリットの閉塞を少なくするようにウエハ
の上部側が揺動可能にすると共に、隣接するウエハ相互
が接触しないように当該間隔保持部材間でウエハの下部
側の揺動を規制することができる。更に、受台部に形成
された下部スリットはリブ間に形成された上部スリット
と整合しないように配設され、この受台部の下部スリッ
トはウエハを担持する傾斜状担持面の両側に開口されて
いるので、ウエハによって全く閉塞されることがなく然
も当該ウエハの両面に対して効果的に処理液を流動させ
ることができる。
As is apparent from the above embodiment, the semiconductor wafer basket according to the present invention has the following effects. In this basket, the lower edge of the wafer to be stored is supported by the inclined supporting surface having a large pressure receiving area without an opening formed in the receiving base, so that damage or deformation due to the impact of falling of the wafer is prevented. Few. Further, the wafer housed in the basket is provided with ribs which are respectively engaged on both upper surfaces and positioning protrusions or short ribs which are separately formed from the ribs and which are respectively engaged with both lower surfaces, so that the spacing members are adjacent to each other. Since the gaps are maintained and aligned in the aligned state, the insertion width for inserting the wafer is not regulated as in the case of the series of ribs of the conventional structure, and the insertion of the wafer and the processing liquid for the wafer are not restricted. Can be individually set to a desired insertion width suitable for the fluid flow. Therefore, for example, the insertion width between the ribs is set to be wide and the insertion width between the spacing members is set to be narrow, and the upper side of the wafer is swung so that the wafer can be easily inserted and the upper slit formed between the ribs is less obstructed. In addition to this, swinging of the lower side of the wafer can be restricted between the spacing members so that adjacent wafers do not come into contact with each other. Further, the lower slit formed in the pedestal portion is disposed so as not to be aligned with the upper slit formed between the ribs, and the lower slit of the pedestal portion is opened on both sides of the inclined carrying surface for carrying the wafer. Therefore, the processing liquid can be effectively flown to both surfaces of the wafer without being completely blocked by the wafer.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施例による半導体ウエハ用バスケッ
トの一部を破断して示す要部斜視図。
FIG. 1 is a fragmentary perspective view showing a part of a semiconductor wafer basket according to an embodiment of the present invention, which is cut away.

【図2】同バスケットの全体を示す平面図。FIG. 2 is a plan view showing the entire basket.

【図3】同バスケットの全体を示す正面図。FIG. 3 is a front view showing the entire basket.

【図4】図2のB−C線に沿った縦断面図。FIG. 4 is a longitudinal sectional view taken along the line BC of FIG. 2;

【図5】従来例による半導体ウエハ用バスケットの全体
斜視図。
FIG. 5 is an overall perspective view of a conventional semiconductor wafer basket.

【図6】同バスケットの正面図。FIG. 6 is a front view of the basket.

【図7】図6のB−B線に沿った縦断面図。FIG. 7 is a longitudinal sectional view taken along the line BB of FIG. 6;

【符号の説明】[Explanation of symbols]

30 バスケツト 31,32 側壁 33,34 支持板 35,36 受台
部 35a,36a 傾斜状担持面 37,38 脚部 39,40 リブ 41,42 上部
スリット 43,44 補強リブ 45,46 下部
スリット 47,48 位置決め突起 W ウエハ
30 Basket 31, 32 Side wall 33, 34 Support plate 35, 36 Receiving part 35a, 36a Inclined supporting surface 37, 38 Leg 39, 40 Rib 41, 42 Upper slit 43, 44 Reinforcement rib 45, 46 Lower slit 47, 48 Positioning protrusion W Wafer

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) H01L 21/68 H01L 21/304 H01L 21/306 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 7 , DB name) H01L 21/68 H01L 21/304 H01L 21/306

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 長手方向に沿って平行する両側壁と、こ
の両側壁の両端部間を各々連結する左右の支持板と、両
側壁の下方に連続状態で延在されると共に、当該両側壁
の内側へ対向状に各々突設されてウエハの下方縁部を担
持する内面が傾斜状の受台部を備えた上下が開口する箱
形のバスケツトに形成され、上記両側壁の内面にはウエ
ハの挿入通路を形成する縦方向へ延在した多数のリブが
当該両側壁の長手方向へ所定ピッチ毎に並列状に設けら
れ、これらの各リブ間にはバスケツトの内外を連通させ
る縦長の上部スリットが穿設されており、当該各リブを
含む両側壁は上部側がほぼ垂直状で下部側は内側へ傾斜
状に延在されて各リブは上記受台部との連結部分で終端
されており、上記受台部には上記上部スリットの延長線
上で挿入されたウエハの下方縁部を担持する傾斜状担持
面が形成され、当該傾斜状担持面の両側にはバスケツト
の内外を連通させる傾斜状の下部スリットと、ウエハの
下方縁部に係合して隔置させる間隔保持部材とが各々上
記リブの延長線上に整合する態様で所定ピッチ毎に並列
状に配設されていることを特徴とした半導体ウエハ用バ
スケット。
1. Side walls parallel to each other along a longitudinal direction, left and right support plates connecting both ends of the side walls, and both of the side walls extend continuously below the side walls, and Each of the inner surfaces, each of which protrudes inwardly to face the lower surface of the wafer and which carries the lower edge of the wafer, is formed as a box-shaped basket having an inclined receiving base and having an open top and bottom. A large number of ribs extending in the vertical direction forming the insertion passage are provided in parallel at predetermined intervals in the longitudinal direction of the both side walls, and a vertically long upper slit communicating between the inside and outside of the basket is provided between these ribs. The upper and lower sides of the side walls including the respective ribs are extended substantially vertically and the lower side is inclined inward.Each of the ribs is terminated at a connection portion with the cradle portion, The pedestal section has a wafer inserted along the extension of the upper slit. An inclined supporting surface for supporting the lower edge of the c is formed, and an inclined lower slit for communicating between the inside and the outside of the basket is provided on both sides of the inclined supporting surface, and the inclined lower slit is engaged with the lower edge of the wafer to be spaced therefrom. A basket for semiconductor wafers, wherein the spacing members to be arranged are arranged in parallel at predetermined intervals so as to be aligned with the extension of the rib.
【請求項2】 上記した間隔保持部材の隣接相互間が形
成する挿通幅に対して上記した上部スリットの幅を広く
形成した請求項1に記載した半導体ウエハ用バスケッ
ト。
2. The semiconductor wafer basket according to claim 1, wherein a width of said upper slit is formed to be wider than an insertion width formed between adjacent ones of said spacing members.
JP6235791A 1991-03-05 1991-03-05 Basket for semiconductor wafer Expired - Fee Related JP3130067B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6235791A JP3130067B2 (en) 1991-03-05 1991-03-05 Basket for semiconductor wafer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6235791A JP3130067B2 (en) 1991-03-05 1991-03-05 Basket for semiconductor wafer

Publications (2)

Publication Number Publication Date
JPH04276644A JPH04276644A (en) 1992-10-01
JP3130067B2 true JP3130067B2 (en) 2001-01-31

Family

ID=13197785

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6235791A Expired - Fee Related JP3130067B2 (en) 1991-03-05 1991-03-05 Basket for semiconductor wafer

Country Status (1)

Country Link
JP (1) JP3130067B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2665148B2 (en) * 1994-05-10 1997-10-22 山口日本電気株式会社 Carrier for wet processing
JP2007019238A (en) * 2005-07-07 2007-01-25 Dainippon Screen Mfg Co Ltd Substrate processing apparatus

Also Published As

Publication number Publication date
JPH04276644A (en) 1992-10-01

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