JP3099808B2 - Logic analyzer probe - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

The present invention relates to a probe for a logic analyzer interposed between a logic analyzer and a circuit not measured by the logic analyzer.

[0002]

2. Description of the Related Art Conventionally, when a non-measurement circuit is measured by a logic analyzer, a probe is connected to a measurement point of the non-measurement circuit, and the probe is connected to an input terminal of the logic analyzer.

A related prior art is disclosed in Japanese Unexamined Patent Publication No.
There is a "probe with a logical operation function" described in JP-A-3-279172 and an "integrated circuit test apparatus" described in JP-A-4-324379.

[0004]

However, since the conventional logic analyzer reads the input data into the memory and then displays the data, a logical operation is performed on the input data and the result is displayed. The result of the logical operation could be displayed only after the measurement was completed.
Therefore, in order to read input data at a timing at which a result of a predetermined logical operation is obtained from the input data, it is necessary to set a longer time for the logic analyzer to read the input data. It was difficult to increase the amount of data acquired.

An object of the present invention is to provide a probe for a logic analyzer which enables a logic analyzer to display a measurement result and a result of performing a logical operation on the measurement result in a short time.

[0006]

A probe for a logic analyzer according to the present invention is a probe circuit for a logic analyzer interposed between a logic analyzer and a non-measurement circuit measured by the logic analyzer. A probe circuit for converting electrical specifications of the input signal to output a converted signal, and a predetermined logic operation by inputting an output signal of the probe circuit and performing an output of the logic operation on the logic analyzer. And a logical operation unit for outputting the result.

The logic analyzer according to the present invention is characterized in that, in the above-described logic analyzer probe, the logic operation unit is a programmable gate array.

[0008] A probe system for a logic analyzer according to the present invention includes the logic analyzer described above, a writer for the programmable gate array, and a controller for the writer.

[0009]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described with reference to FIG.

In the probe according to the present embodiment, even when input data is read at a timing at which a predetermined logical operation result is obtained from the input data, the input data written in the memory is stored in the probe without being processed inside the logic analyzer. An object of the present invention is to provide a configuration in which a predetermined logical operation can be performed and output by a provided programmable gate array.

The present embodiment has a function of converting a signal waveform input from the circuit under test 4 into a logical signal, and converts the signal input from the measurement point of the non-measurement circuit 4 into voltage conversion, current conversion, impedance conversion, and the like. A probe circuit 1 having a function of converting electrical specifications and supplying the converted signal to the logic analyzer 5 and the programmable gate array 2, and a programmable circuit that performs logic processing on a signal input from the probe circuit 1 and outputs the processed signal to the logic analyzer 5. A probe 3 including a gate array 2; a logic analyzer 5 having a function of storing and displaying a waveform input from the probe 3; a gate array writer 6 for configuring a predetermined logic circuit in the programmable gate array 2; Writer 6
And a writer controller 7 having a function of sending a program for writing a predetermined logic circuit to the programmable gate array 2 to the gate array writer 6.

Next, the operation will be described.

The writer controller 7 sends out a program for writing a predetermined circuit to the gate array writer 6, and the gate array writer 6 creates a logic circuit in the programmable gate array 2. The logic analyzer main body 5 displays a logic signal input from the probe circuit 1 and a signal input from the programmable gate array 2. Regarding the display of the signal input from the programmable gate array 2, since the signal input by the logic analyzer 5 is not internally processed by the logic circuit corresponding to the programmable gate array 2, the display time is directly input from the probe circuit 1. It can be displayed in the same time as the displayed logic signal.

The present invention is not limited to the above-described embodiment. For example, the programmable gate array 2 can be applied to a device using an LSI having a similar function. If the use is limited, the logic circuit may be fixed.

[0015]

As described above, according to the present invention,
The signal processing is performed by the logic circuit written in the programmable gate array provided in the probe.Therefore, it is not necessary to perform the logic circuit processing internally on the signal input by the logic analyzer. Is shortened.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a configuration of a probe for a logic analyzer according to the present invention and circuits and devices connected thereto.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Probe circuit 2 Programmable gate array 3 Probe 4 Circuit under test 5 Logic analyzer 6 Writer for gate array 7 Controller for writer

Claims (2)

(57) [Claims] A logic analyzer and a logic analyzer
Logic between the non-measurement circuit measured by the
A probe circuit for a microanalyzer, wherein an electrical specification is applied to a signal input from a measurement point of the non-measurement circuit.
A probe circuit for performing the conversion and outputting the converted signal, and a predetermined logical operation by inputting the output signal of the probe circuit.
To output the output of the logical operation to the logic analyzer.
Logic analyzer probe with logic operation unit
3. The probe for a logic analyzer according to claim 1 , wherein the logical operation unit is a programmable gate array. 2. A probe system for a logic analyzer, comprising: the logic analyzer according to claim 1 ; a writer for the programmable gate array; and a controller for the writer.