JP3058274B1 - Flat polishing machine - Google Patents
Flat polishing machineInfo
- Publication number
- JP3058274B1 JP3058274B1 JP5019299A JP5019299A JP3058274B1 JP 3058274 B1 JP3058274 B1 JP 3058274B1 JP 5019299 A JP5019299 A JP 5019299A JP 5019299 A JP5019299 A JP 5019299A JP 3058274 B1 JP3058274 B1 JP 3058274B1
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- polishing tool
- annular
- workpiece
- tool
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
【要約】
【課題】 平面研磨加工の高精度を維持しつつ装置全体
を更に確実に小型化し得る平面研磨装置を提供するこ
と。
【解決手段】 環状研磨工具2と、この環状研磨工具2
A上に載置される被加工物10を環状研磨工具2側に加
圧すると共に当該被加工物10と一体的に移動する円盤
状加圧部材11と、環状研磨工具2が回転した場合に被
加工物10および加圧部材11が回転するのを許容する
と共に被加工物10および円盤状加圧部材11が環状研
磨工具2と共に移動するのを阻止して所定の被研磨位置
を保持する研磨位置保持機構13とを備えている。そし
て、環状研磨工具2の外径を、被加工物10の外接円の
直径より大きく且つ当該被加工物10の外接円の直径の
二倍より小さい値に設定したこと。An object of the present invention is to provide a planar polishing apparatus capable of further reducing the size of the entire apparatus while maintaining high precision of the planar polishing processing. SOLUTION: An annular polishing tool 2 and the annular polishing tool 2 are provided.
A disk-shaped pressing member 11 that presses the workpiece 10 placed on the workpiece A toward the annular polishing tool 2 and moves integrally with the workpiece 10, and that is pressed when the annular polishing tool 2 rotates. A polishing position that allows the workpiece 10 and the pressing member 11 to rotate, and prevents the workpiece 10 and the disc-shaped pressing member 11 from moving together with the annular polishing tool 2 to maintain a predetermined polishing position. And a holding mechanism 13. Then, the outer diameter of the annular polishing tool 2 is set to a value larger than the diameter of the circumscribed circle of the workpiece 10 and smaller than twice the diameter of the circumscribed circle of the workpiece 10.
Description
【0001】[0001]
【発明の属する技術分野】本発明は、平面研磨装置に係
り、特に、半導体ウエハ,半導体回路を付したウエハ,
磁気ディスク等の円板状の被加工物を、或いはガラス基
板等の板状の被加工物を、それぞれ高度の平滑度をもっ
て平面加工するための平面研磨装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a planar polishing apparatus, and more particularly, to a semiconductor wafer, a wafer provided with semiconductor circuits,
The present invention relates to a planar polishing apparatus for planarly processing a disk-shaped workpiece such as a magnetic disk or a plate-shaped workpiece such as a glass substrate with a high degree of smoothness.
【0002】[0002]
【従来の技術】従来、環状の研磨加工面を有する環状研
磨工具を用いた平面研磨では、環状研磨工具を回転させ
て平面研磨する性質上より、加工対象物の大きさに制限
があった。即ち、環状研磨工具の回転中心から一方の側
(半径方向の側)に位置する研磨工具面の幅を基準と
し、それより小さい直径の被加工物に限定して、平面研
磨が行われていた。2. Description of the Related Art Conventionally, in planar polishing using an annular polishing tool having an annular polishing surface, the size of an object to be processed is limited due to the property of rotating the annular polishing tool to perform planar polishing. That is, based on the width of the polishing tool surface located on one side (radial side) from the center of rotation of the annular polishing tool, planar polishing is performed only on a workpiece having a smaller diameter. .
【0003】図6(a)(b)に従来例を示す。この図
6(a)(b)に示す従来例では、ターンテーブル10
1上に一定厚さの環状研磨工具102が装備されてい
る。この環状研磨工具102の直径D0は、ターンテー
ブル101と同一直径D0のものが使用されている。記
号d0は、環状研磨工具102の内径(中央部の貫通
穴)部分の直径を示す。又、記号wは、環状研磨工具1
02の半径方向における研磨工具面102Aの幅を示
す。この図4の場合には、研磨工具面の幅wは、w=
(D0 ―d0)/2となっている。FIGS. 6A and 6B show a conventional example. In the conventional example shown in FIGS. 6A and 6B, the turntable 10
1 is provided with an annular polishing tool 102 having a constant thickness. The diameter D0 of the annular polishing tool 102 is the same as the diameter D0 of the turntable 101. The symbol d0 indicates the diameter of the inner diameter (the central through hole) of the annular polishing tool 102. The symbol w indicates the annular polishing tool 1
02 shows the width of the polishing tool surface 102A in the radial direction 02. In the case of FIG. 4, the width w of the polishing tool surface is expressed as w =
(D0-d0) / 2.
【0004】符号100は、研磨工具面102A上に載
置された円盤状の被加工物を示す。この被加工物100
は、その直径K0が環状研磨工具102の研磨工具面の
幅wより小さいものが研磨加工の対象とされている。[0004] Reference numeral 100 denotes a disk-shaped workpiece placed on the polishing tool surface 102A. This workpiece 100
The object whose diameter K0 is smaller than the width w of the polishing tool surface of the annular polishing tool 102 is the object of polishing.
【0005】そして、この被加工物100は、同一直径
の円板状の加圧保持板201によって前述した環状研磨
工具102側に常時押圧された状態(適度の研磨用加圧
力が印加された状態)となっている。又、この図6に示
す従来例では、被加工物100と同一の直径K0を有す
る加圧保持板201が使用されている。The workpiece 100 is constantly pressed against the above-mentioned annular polishing tool 102 by a disk-shaped pressure holding plate 201 having the same diameter (a state in which an appropriate polishing pressure is applied). ). In the conventional example shown in FIG. 6, a pressure holding plate 201 having the same diameter K0 as the workpiece 100 is used.
【0006】この加圧保持板201は、前述した被加工
物100を環状研磨工具102側に押圧すると同時に当
該環状研磨工具102にて被加工物100と一体的に回
転し且つ移動可能となっている。また、符号202は、
加圧保持板201および被加工物100を研磨工具面1
02A上の所定位置に位置するように設定し保持する研
磨位置保持機構を示す。The pressure holding plate 201 presses the workpiece 100 toward the annular polishing tool 102 and simultaneously rotates and moves integrally with the workpiece 100 by the annular polishing tool 102. I have. Reference numeral 202 is
The pressure holding plate 201 and the work piece 100 are
12 shows a polishing position holding mechanism that is set and held so as to be located at a predetermined position on 02A.
【0007】そして、被加工物100の研磨加工に際
し、まず、ターンテーブル101が図示しない駆動モー
タに付勢されて矢印Rの方向に回転すると、研磨工具面
102A上に載置された被加工物100は、環状研磨工
具102と共に回転移動しようとするが、研磨位置保持
機構202に阻止されて図6に示す位置に留め置きされ
る。When the workpiece 100 is polished, first, when the turntable 101 is urged by a drive motor (not shown) to rotate in the direction of the arrow R, the workpiece placed on the polishing tool surface 102A is rotated. 100 is to rotate moved together with the annular polishing tool 102, is blocked by the polishing position holding mechanism 202 is Tomeoki the position shown in FIG.
【0008】同時に、環状研磨工具102の中心軸側と
外径側との周速度の相違から図6(b)に示すように、
研磨工具面102A上で且つ加圧保持板201に加圧さ
れた状態で矢印C方向に回転する。このため、当該研磨
工具面102Aとの間で擦り合わせ状態が生じ、これに
よって、被加工物100は環状研磨工具102により高
精度に且つ一様に研磨されることとなる。At the same time, as shown in FIG. 6 (b), due to the difference in peripheral speed between the center axis side and the outer diameter side of the annular polishing tool 102,
The polishing tool rotates in the direction of arrow C on the polishing tool surface 102A and while being pressed by the pressure holding plate 201. For this reason, a rubbing state occurs between the polishing tool surface 102 </ b> A and the workpiece 100 is polished with high precision and uniformity by the annular polishing tool 102.
【0009】又、研磨工具は、使用回数が増えるにつれ
て摩耗し、凹凸又は表面荒れを生ずる。そこで、近年、
ドレッサにより目出しを行い、研磨工具面を削りとるこ
とによって、平滑な研磨工具面を作成して高度に平滑な
研磨を行うという試みがなされている。一方、特開平7
−130688号公報では、常に清浄な状態で研磨を行
うために、研磨工程と洗浄工程を交互に繰り返し行うと
いう試みがなされている。そして、研磨に用いる研磨液
は、通常、研磨工具面の一部に滴らすか、スプレー等で
研磨工具面全体に吹き付ける等の操作を行うのが通例と
なっている。[0009] Further, the polishing tool wears as the number of times of use increases, causing irregularities or surface roughness. So, in recent years,
Attempts have been made to form a smooth polishing tool surface by performing indexing with a dresser and scraping the polishing tool surface to perform highly smooth polishing. On the other hand,
In JP-A-130688, an attempt is made to alternately repeat a polishing step and a cleaning step in order to constantly perform polishing in a clean state. The polishing liquid used for polishing is usually subjected to an operation such as dripping on a part of the polishing tool surface or spraying the entire surface of the polishing tool with a spray or the like.
【0010】[0010]
【発明が解決しようとする課題】しかしながら、上述し
た従来例では、環状研磨工具102の半径方向における
研磨工具面102Aの幅wより小さい直径K0の被加工
物100を対象として加工していたことから、当該円板
状被加工物100の直径が大きくなるにしたがって、環
状研磨工具102の大きさも巨大化せざるをえないとい
う不都合が生じていた。However, in the above-mentioned conventional example, since the workpiece 100 having a diameter K0 smaller than the width w of the polishing tool surface 102A in the radial direction of the annular polishing tool 102 is processed. However, as the diameter of the disk-shaped workpiece 100 increases, the size of the annular polishing tool 102 must be increased.
【0011】また、一個所に円板状被加工物100が固
定されて研磨されると、接触する研磨工具面が繰り返し
使われることになり、傷などが入ることが多かった。更
に、高度に平滑な平面研磨を行うために円板状ドレッサ
を用いて平坦な研磨工具面を作り出す場合、円板状ドレ
ッサの直径は、多くは研磨工具面102Aの幅より小さ
いことから、研磨工具面102Aの一部だけが削り取ら
れてしまうという不都合があった。Further, when the disk-shaped workpiece 100 is fixed and polished at one location, the polishing tool surface that comes into contact with the workpiece 100 is repeatedly used, which often causes scratches and the like. Furthermore, when a flat polishing tool surface is created using a disk-shaped dresser in order to perform highly smooth planar polishing, the diameter of the disk-shaped dresser is often smaller than the width of the polishing tool surface 102A. There is a disadvantage that only a part of the tool surface 102A is scraped off.
【0012】更に、常に清浄な状態で研磨を行うことを
意図して、円板状被加工物100に研磨工程と洗浄工程
を繰り返し交互に行う場合があるが、かかる場合には工
程が増え、時間がかかるという不都合が生じていた。Further, there is a case where the polishing process and the cleaning process are repeatedly and alternately performed on the disc-shaped workpiece 100 with the intention of always performing the polishing in a clean state. There was a problem that it took time.
【0013】また、研磨工具面102Aの一部に研磨液
を滴らすか又は全体に研磨液をスプレーする場合には、
一部だけに研磨液が溜まるか又は研磨工具面102A以
外の例えば空気中などにも研磨液が飛び散り、研磨液の
使用効率が悪いという不都合が生じていた。When the polishing liquid is dripped on a part of the polishing tool surface 102A or the polishing liquid is sprayed on the whole,
The polishing liquid accumulates only in a part of the polishing liquid, or the polishing liquid scatters in air other than the polishing tool surface 102A, for example, in the air.
【0014】[0014]
【発明の目的】本発明は、かかる従来例の有する不都合
を改善し、特に、平面研磨加工の高精度を維持しつつ装
置全体を更に確実に小型化し得る平面研磨装置を提供す
ることを、その目的とする。SUMMARY OF THE INVENTION It is an object of the present invention to provide a planar polishing apparatus which can solve the disadvantages of the prior art, and in particular, can reduce the size of the entire apparatus more reliably while maintaining high precision of the planar polishing processing. Aim.
【0015】[0015]
【課題を解決するための手段】上記目的を達成するた
め、請求項1記載の発明では、研磨工具面が環状の環状
研磨工具と、この環状研磨工具上に載置される被加工物
を環状研磨工具側に一様に押圧(加圧)すると共に当該
被加工物と一体的に移動する円盤状加圧部材と、環状研
磨工具が回転した場合に被加工物および円盤状加圧部材
が回転するのを許容し,且つ当該被加工物および当該円
盤状加圧部材が前述した環状研磨工具と共に移動するの
を阻止して所定の被研磨位置を保持する研磨位置保持機
構とを備えて成る平面研磨装置において、前述した環状
研磨工具の外径を、被加工物の外接円の直径より大きく
且つ当該被加工物の外接円の直径の二倍より小さい値に
設定する。更に、前述した研磨位置保持機構が、環状研
磨工具と被加工物との接触面積の中心位置に対して当該
被加工物の重心位置を一致させ且つ当該位置を保持する
被加工物用重心位置設定機能を備えている、という構成
を採っている。In order to achieve the above object, according to the first aspect of the present invention, an annular polishing tool having an annular polishing tool surface, and a workpiece mounted on the annular polishing tool are annular. A disc-shaped pressing member that uniformly presses ( presses ) the polishing tool side and moves integrally with the workpiece, and the workpiece and the disc-shaped pressing member rotate when the annular polishing tool rotates. from being allowed, and a polishing position holding mechanism in which the workpiece and the circular <br/> discotic pressure member to maintain a predetermined target polishing position by preventing the movement of an annular polishing tool described above The outer diameter of the annular polishing tool is set to a value larger than the diameter of the circumscribed circle of the workpiece and smaller than twice the diameter of the circumscribed circle of the workpiece . Further, the polishing position holding mechanism described above is
The center position of the contact area between the polishing tool and the workpiece
Align the center of gravity of the workpiece and maintain that position
A configuration is provided in which a center-of-gravity position setting function for a workpiece is provided .
【0016】このため、この請求項1記載の発明では、
装備全体を稼働状態に設定すると、まず、前述した従来
例の場合と同様に環状研磨工具が図1のイ方向に示す方
向に回転する。同時に研磨工具面上の被加工物および円
盤状加圧部材も同方向に回転しようとするが、研磨位置
保持機構に当該移動が阻止され、図1に図示した所定位
置に留めおかれる。この場合、被加工物と研磨工具面と
の間に、所定の摩擦が生じ、内径側と外径側との回転周
速度の相違により被加工物は、自ら回転する。回転によ
り、被加工物の直径が研磨工具面の半径方向の幅よりも
大きくても、はみ出た部分も順次研磨工具面に当接しす
り合わされることとなり、これによって被加工物は円滑
に研磨される。更に、図3に図示した通り、環状研磨工
具と被加工物との接触面積の中心位置(図心)と、当該
被加工物の重心位置を一致するようにしたので、被加工
物の被加工面が研磨工具面に、より多く当接することと
なり、これにより研磨加工を安定した状態で高精度に且
つ能率よく継続すること(つまり研磨効率をより高める
こと)ができるという利点がある。即ち、この請求項1
記載の発明では、被加工物の直径が研磨工具面の半径方
向の幅よりも大きくても、被加工物を有効に研磨加工す
ることができ、かかる点において、装置全体を確実に小
型化することができる。更に、環状研磨工具と被加工物
との接触面積の中心位置(図心)と、被加工物の重心位
置が一致している為、、環状研磨工具の直径を従来の環
状研磨工具の直径より小さくしても、研磨効率を、より
高めることができるという利点がある。 Therefore, according to the first aspect of the present invention,
If you set the whole equipment in the operational state, first, annular polishing tool as in the prior art example described above is rotated in the direction indicated in (a) direction of FIG. At the same time, the workpiece and the disc-shaped pressing member on the polishing tool surface also try to rotate in the same direction, but the movement is prevented by the polishing position holding mechanism, and the polishing position holding mechanism is kept at the predetermined position shown in FIG. In this case, a predetermined friction is generated between the workpiece and the polishing tool surface, and the workpiece rotates by itself due to a difference in rotational peripheral speed between the inner diameter side and the outer diameter side. Due to the rotation, even if the diameter of the workpiece is larger than the radial width of the polishing tool surface, the protruding portion is also sequentially brought into contact with the polishing tool surface and rubbed, whereby the workpiece is polished smoothly. You. Further, as shown in FIG.
Center position (center of gravity) of the contact area between the tool and the workpiece
Since the center of gravity of the workpiece is matched,
The machined surface of the workpiece contacts the polishing tool surface more
As a result, the polishing process is performed with high accuracy in a stable state.
Continuation efficiently (in other words, increase polishing efficiency
) Can be performed. That is, this claim 1
In the described invention, the diameter of the workpiece is the radius of the polishing tool surface.
Even if the width is larger than the width of the
At this point, the entire device can be reliably reduced.
Can be typed. In addition, annular grinding tools and workpieces
Center position (center of gravity) of contact area with the center of gravity of workpiece
The diameter of the annular grinding tool is
Polishing efficiency is improved even if it is smaller than the diameter of the grinding tool.
There is an advantage that it can be increased.
【0017】 請求項2記載の発明では、研磨工具面が環
状の環状研磨工具と、この環状研磨工具上に載置される
被加工物を環状研磨工具側に一様に加圧すると共に当該
被加工物と一体的に移動する円盤状加圧部材と、環状研
磨工具が回転した場合に被加工物および円盤状加圧部材
が回転するのを許容し,且つ当該被加工物および当該円
盤状加圧部材が前述した環状研磨工具と共に移動するの
を阻止して所定の被研磨位置を保持する研磨位置保持機
構とを備えて成る平面研磨装置において、前述した環状
研磨工具の外径を、被加工物の外接円の直径より大きく
且つ当該被加工物の外接円の直径の二倍より小さい値に
設定する。更に、前述した環状研磨工具の研磨工具面上
に当該研磨工具面の幅より大きい直径を有する円板状ド
レッサを配設すると共に、この円板状ドレッサを、環状
研磨工具の回転方向に対して被加工物の上流側に配設す
る、という構成を採っている。このため、この請求項2
記載の発明では、装備全体を稼働状態に設定すると、ま
ず、前述した従来例の場合と同様に環状研磨工具が図1
のイ方向に示す方向に回転する。同時に研磨工具面上の
被加工物および円盤状加圧部材も同方向に回転しようと
するが、研磨位置保持機構に当該移動が阻止され、図1
に図示した所定位置に留めおかれる。この場合、被加工
物と研磨工具面との間に、所定の摩擦が生じ、内径側と
外径側との回転周速度の相違により被加工物は、自ら回
転する。回転により、被加工物の直径が研磨工具面の半
径方向の幅よりも大きくても、はみ出た部分も順次研磨
工具面に当接しすり合わされることとなり、これによっ
て被加工物は円滑に研磨される。更に、環状研磨工具の
研磨工具面の目詰まりという事態を回避することがで
き、当該研磨工具面を常に新規な状態に維持し得ること
ができる。かかる点において装置全体を確実に小型化で
き,且つ被加工物の研磨作業を効率良く継続することが
できるという利点がある。 According to the second aspect of the present invention, an annular polishing tool having an annular polishing tool surface and a workpiece mounted on the annular polishing tool are uniformly pressed against the annular polishing tool, and the workpiece is processed. A disk-shaped pressing member that moves integrally with the object, a workpiece and the disk-shaped pressing member that are allowed to rotate when the annular polishing tool is rotated, and that the workpiece and the disk-shaped pressing member are rotated. A polishing position holding mechanism for holding a predetermined position to be polished by preventing a member from moving together with the above-mentioned annular polishing tool. Is set to a value larger than the diameter of the circumscribed circle and smaller than twice the diameter of the circumscribed circle of the workpiece. Further, a disc-shaped dresser having a diameter larger than the width of the polishing tool surface is disposed on the polishing tool surface of the annular polishing tool, and the disc-shaped dresser is moved with respect to the rotation direction of the annular polishing tool. It is configured to be arranged on the upstream side of the workpiece. Therefore, this claim 2
In the described invention, when the entire equipment is set to the operating state, first, as in the case of the above-described conventional example, the annular polishing tool is moved to the state shown in FIG.
It rotates in the direction shown in direction a. At the same time, the workpiece and the disc-shaped pressing member on the polishing tool surface also try to rotate in the same direction, but the movement is prevented by the polishing position holding mechanism, and FIG.
At a predetermined position shown in FIG. In this case, a predetermined friction is generated between the workpiece and the polishing tool surface, and the workpiece rotates by itself due to a difference in rotational peripheral speed between the inner diameter side and the outer diameter side. Due to the rotation, even if the diameter of the workpiece is larger than the radial width of the polishing tool surface, the protruding portion is also sequentially brought into contact with the polishing tool surface and rubbed, whereby the workpiece is polished smoothly. You. Further, it is possible to avoid a situation where the polishing tool surface of the annular polishing tool is clogged, and it is possible to always maintain the polishing tool surface in a new state. In this respect, there is an advantage that the entire apparatus can be reliably reduced in size, and the work of polishing the workpiece can be efficiently continued.
【0018】 請求項3記載の発明では、研磨工具面が環
状の環状研磨工具と、この環状研磨工具上に載置される
被加工物を環状研磨工具側に一様に加圧すると共に当該
被加工物と一体的に移動する円盤状加圧部材と、環状研
磨工具が回転した場合に被加工物および円盤状加圧部材
が回転するのを許容し,且つ当該被加工物および当該円
盤状加圧部材が前述した環状研磨工具と共に移動するの
を阻止して所定の被研磨位置を保持する研磨位置保持機
構とを備えて成る平面研磨装置において、前述した環状
研磨工具の外径を、被加工物の外接円の直径より大きく
且つ当該被加工物の外接円の直径の二倍より小さい値に
設定する。そして、前述した研磨位置保持機構が、被加
工物および円盤状加圧部材の回転中心を、環状研磨工具
の研磨工具面上の任意の位置に可変設定し保持する研磨
位置可変設定機能を備えている。更に、前述した環状研
磨工具の研磨工具面上に当該研磨工具面の幅より大きい
直径を有する円板状ドレッサを配設すると共に、この円
板状ドレッサを、環状研磨工具の回転方向に対して被加
工物の上流側に配設する、という構成を採っている。こ
のため、この請求項3記載の発明では、装備全体を稼働
状態に設定すると、まず、前述した従来例の場合と同様
に環状研磨工具が図1のイ方向に示す方向に回転する。
同時に研磨工具面上の被加工物および円盤状加圧部材も
同方向に回転しようとするが、研磨位置保持機構に当該
移動が阻止され、図1に図示した所定位置に留めおかれ
る。この場合、被加工物と研磨工具面との間に、所定の
摩擦が生じ、内径側と外径側との回転周速度の相違によ
り被加工物は、自ら回転する。回転により、被加工物の
直径が研磨工具面の半径方向の幅よりも大きくても、は
み出た部分も順次研磨工具面に当接しすり合わされるこ
ととなり、これによって被加工物は円滑に研磨される。
そして、被加工物および円盤状加圧部材を研磨工具面上
の任意の位置に可変設定し得ることから、被加工物の大
きさ等に応じた最適な研磨加工の位置を個別に選定する
ことができ、また、必要に応じて研磨工具面上を揺動さ
せることができる。更に、環状研磨工具の研磨工具面の
目詰まりという事態を回避することができ、当該研磨工
具面を常に新規な状態に維持し得ることができる。かか
る点において装置全体を確実に小型化でき,且つ被加工
物の研磨加工に際しての汎用性を高めることができ、更
に、被加工物の研磨作業を効率良く継続することができ
るという利点がある。 According to the third aspect of the present invention, an annular polishing tool having an annular polishing tool surface and a workpiece mounted on the annular polishing tool are uniformly pressed against the annular polishing tool, and the workpiece is processed. A disk-shaped pressing member that moves integrally with the object, a workpiece and the disk-shaped pressing member that are allowed to rotate when the annular polishing tool is rotated, and that the workpiece and the disk-shaped pressing member are rotated. A polishing position holding mechanism for holding a predetermined position to be polished by preventing a member from moving together with the above-mentioned annular polishing tool. Is set to a value larger than the diameter of the circumscribed circle and smaller than twice the diameter of the circumscribed circle of the workpiece. The above-mentioned polishing position holding mechanism has a polishing position variable setting function of variably setting and holding the rotation center of the workpiece and the disc-shaped pressing member at an arbitrary position on the polishing tool surface of the annular polishing tool. I have. Further, a disc-shaped dresser having a diameter larger than the width of the polishing tool surface is disposed on the polishing tool surface of the annular polishing tool, and the disc-shaped dresser is moved with respect to the rotation direction of the annular polishing tool. It is configured to be arranged on the upstream side of the workpiece. For this reason, according to the third aspect of the present invention, when the entire equipment is set to the operating state, first, the annular polishing tool rotates in the direction indicated by the arrow A in FIG.
At the same time, the workpiece and the disc-shaped pressing member on the polishing tool surface also try to rotate in the same direction, but the movement is prevented by the polishing position holding mechanism, and the polishing position holding mechanism is kept at the predetermined position shown in FIG. In this case, a predetermined friction is generated between the workpiece and the polishing tool surface, and the workpiece rotates by itself due to a difference in rotational peripheral speed between the inner diameter side and the outer diameter side. Due to the rotation, even if the diameter of the workpiece is larger than the radial width of the polishing tool surface, the protruding portion is also sequentially brought into contact with the polishing tool surface and rubbed, whereby the workpiece is polished smoothly. You.
Then, since the workpiece and the disc-shaped pressing member can be variably set at arbitrary positions on the surface of the polishing tool, it is necessary to individually select an optimal polishing processing position according to the size of the workpiece. And can be swung over the surface of the polishing tool as needed. Further, it is possible to avoid a situation where the polishing tool surface of the annular polishing tool is clogged, and it is possible to always maintain the polishing tool surface in a new state. In this respect, there is an advantage that the entire apparatus can be reliably reduced in size, the versatility in polishing the workpiece can be enhanced, and the polishing operation of the workpiece can be continued efficiently.
【0019】 請求項4記載の発明では、前述した請求項
1記載の平面研磨装置において、前述した環状研磨工具
の研磨工具面上に当該研磨工具面の幅より大きい直径を
有する円板状ドレッサを配設すると共に、この円板状ド
レッサを、環状研磨工具の回転方向に対して被加工物の
上流側に配設する、という構成を採っている。このた
め、この請求項4記載の発明では、前述した請求項1記
載の発明と同等の機能を有するほか、更に、環状研磨工
具の研磨工具面の目詰まりという事態を回避することが
でき、当該研磨工具面を常に新規な状態に維持し得るこ
とができ、これがため、被加工物の研磨作業を効率良く
継続することが可能となる。 According to a fourth aspect of the present invention, in the flat surface polishing apparatus of the first aspect, a disc-shaped dresser having a diameter larger than the width of the polishing tool surface is provided on the polishing tool surface of the annular polishing tool. In addition to the arrangement, the disc-shaped dresser is disposed upstream of the workpiece with respect to the rotation direction of the annular polishing tool. Therefore, according to the invention of claim 4, in addition to having the same function as the above-described invention of claim 1, clogging of the polishing tool surface of the annular polishing tool can be avoided. The polishing tool surface can always be maintained in a new state, which makes it possible to efficiently continue the work of polishing the workpiece.
【0020】 請求項5記載の発明では、研磨工具面が環
状の環状研磨工具と、この環状研磨工具上に載置される
被加工物を環状研磨工具側に一様に加圧すると共に当該
被加工物と一体的に移動する円盤状加圧部材と、環状研
磨工具が回転した場合に被加工物および円盤状加圧部材
が回転するのを許容し,且つ当該被加工物および当該円
盤状加圧部材が前述した環状研磨工具と共に移動するの
を阻止して所定の被研磨位置を保持する研磨位置保持機
構とを備えて成る平面研磨装置において、前述した環状
研磨工具の外径を、被加工物の外接円の直径より大きく
且つ当該被加工物の外接円の直径の二倍より小さい値に
設定する。更に、前述した環状研磨工具の研磨工具面上
に、所定間隔を隔てて当該環状研磨工具の研磨工具面上
に研磨液を供給する複数の液噴射ノズルを備えた研磨液
供給機構を装備すると共に該環状研磨工具の研磨工具面
上から使用済の研磨液を吸引し収集する研磨液吸引機構
を、それぞれ装備する。そして、研磨液供給機構を環状
研磨工具の回転方向に対し被加工物の上流側に配設する
と共に、研磨液吸引機構を環状研磨工具の回転方向に対
し前述した被加工物の下流側に配設する、という構成を
採っている。 According to the fifth aspect of the invention, an annular polishing tool having an annular polishing tool surface and a workpiece mounted on the annular polishing tool are uniformly pressed against the annular polishing tool, and the workpiece is processed. A disk-shaped pressing member that moves integrally with the object, a workpiece and the disk-shaped pressing member that are allowed to rotate when the annular polishing tool is rotated, and that the workpiece and the disk-shaped pressing member are rotated. A polishing position holding mechanism for holding a predetermined position to be polished by preventing a member from moving together with the above-mentioned annular polishing tool. Is set to a value larger than the diameter of the circumscribed circle and smaller than twice the diameter of the circumscribed circle of the workpiece. Further, a polishing liquid supply mechanism having a plurality of liquid injection nozzles for supplying a polishing liquid to the polishing tool surface of the annular polishing tool at predetermined intervals on the polishing tool surface of the annular polishing tool is provided. A polishing liquid suction mechanism for sucking and collecting used polishing liquid from the polishing tool surface of the annular polishing tool is provided. The polishing liquid supply mechanism is disposed upstream of the workpiece with respect to the rotation direction of the annular polishing tool, and the polishing liquid suction mechanism is disposed downstream of the workpiece with respect to the rotation direction of the annular polishing tool. To be installed.
【0021】 このため、この請求項5記載の発明では、
装備全体を稼働状態に設定すると、まず、前述した従来
例の場合と同様に環状研磨工具が図1のイ方向に示す方
向に回転する。同時に研磨工具面上の被加工物および円
盤状加圧部材も同方向に回転しようとするが、研磨位置
保持機構に当該移動が阻止され、図1に図示した所定位
置に留めおかれる。この場合、被加工物と研磨工具面と
の間に、所定の摩擦が生じ、内径側と外径側との回転周
速度の相違により被加工物は、自ら回転する。回転によ
り、被加工物の直径が研磨工具面の半径方向の幅よりも
大きくても、はみ出た部分も順次研磨工具面に当接しす
り合わされることとなり、これによって被加工物は円滑
に研磨される。更に、使用済の研磨液が研磨工具面上に
留まるという事態を回避することができ、これがため、
常に当初の研磨加工の加工条件を維持することができ
る。かかる点において装置全体を確実に小型化でき,且
つ研磨加工を長時間にわたって高精度に継続することが
できるという利点がある。 [0021] Therefore, in the invention of claim 5, wherein the
When the entire equipment is set to the operating state, first, the annular polishing tool rotates in the direction indicated by the arrow A in FIG. At the same time, the workpiece and the disc-shaped pressing member on the polishing tool surface also try to rotate in the same direction, but the movement is prevented by the polishing position holding mechanism, and the polishing position holding mechanism is kept at the predetermined position shown in FIG. In this case, a predetermined friction is generated between the workpiece and the polishing tool surface, and the workpiece rotates by itself due to a difference in rotational peripheral speed between the inner diameter side and the outer diameter side. Due to the rotation, even if the diameter of the workpiece is larger than the radial width of the polishing tool surface, the protruding portion is also sequentially brought into contact with the polishing tool surface and rubbed, whereby the workpiece is polished smoothly. You. Further, it is possible to avoid a situation in which the used polishing liquid remains on the polishing tool surface, and therefore,
The processing conditions of the initial polishing can always be maintained. In this respect, there is an advantage that the entire apparatus can be surely miniaturized and the polishing can be continued with high accuracy for a long time.
【0022】 請求項6記載の発明では、研磨工具面が環
状の環状研磨工具と、この環状研磨工具上に載置される
被加工物を環状研磨工具側に一様に加圧すると共に当該
被加工物と一体的に移動する円盤状加圧部材と、環状研
磨工具が回転した場合に被加工物および円盤状加圧部材
が回転するのを許容し,且つ当該被加工物および当該円
盤状加圧部材が前述した環状研磨工具と共に移動するの
を阻止して所定の被研磨位置を保持する研磨位置保持機
構とを備えて成る平面研磨装置において、前述した環状
研磨工具の外径を、被加工物の外接円の直径より大きく
且つ当該被加工物の外接円の直径の二倍より小さい値に
設定する。そして、前述した研磨位置保持機構が、被加
工物および円盤状加圧部材の回転中心を、環状研磨工具
の研磨工具面上の任意の位置に可変設定し保持する研磨
位置可変設定機能を備えている。更に、前述した環状研
磨工具の研磨工具面上に、所定間隔を隔てて当該環状研
磨工具の研磨工具面上に研磨液を供給する複数の液噴射
ノズルを備えた研磨液供給機構を装備すると共に該環状
研磨工具の研磨工具面上から使用済の研磨液を吸引し収
集する研磨液吸引機構を、それぞれ装備する。そして、
研磨液供給機構を環状研磨工具の回転方向に対し被加工
物の上流側に配設すると共に、研磨液吸引機構を環状研
磨工具の回転方向に対し前述した被加工物の下流側に配
設する、という構成を採っている。 According to the sixth aspect of the present invention, an annular polishing tool having an annular polishing tool surface and a workpiece mounted on the annular polishing tool are uniformly pressed against the annular polishing tool, and the workpiece is processed. A disk-shaped pressing member that moves integrally with the object, a workpiece and the disk-shaped pressing member that are allowed to rotate when the annular polishing tool is rotated, and that the workpiece and the disk-shaped pressing member are rotated. A polishing position holding mechanism for holding a predetermined position to be polished by preventing a member from moving together with the above-mentioned annular polishing tool. Is set to a value larger than the diameter of the circumscribed circle and smaller than twice the diameter of the circumscribed circle of the workpiece. The above-mentioned polishing position holding mechanism has a polishing position variable setting function of variably setting and holding the rotation center of the workpiece and the disc-shaped pressing member at an arbitrary position on the polishing tool surface of the annular polishing tool. I have. Further, a polishing liquid supply mechanism having a plurality of liquid injection nozzles for supplying a polishing liquid to the polishing tool surface of the annular polishing tool at predetermined intervals on the polishing tool surface of the annular polishing tool is provided. A polishing liquid suction mechanism for sucking and collecting used polishing liquid from the polishing tool surface of the annular polishing tool is provided. And
The polishing liquid supply mechanism is disposed on the upstream side of the workpiece with respect to the rotation direction of the annular polishing tool, and the polishing liquid suction mechanism is disposed on the downstream side of the workpiece with respect to the rotation direction of the annular polishing tool. , Is adopted.
【0023】 このため、この請求項6記載の発明では、
装備全体を稼働状態に設定すると、まず、前述した従来
例の場合と同様に環状研磨工具が図1のイ方向に示す方
向に回転する。同時に研磨工具面上の被加工物および円
盤状加圧部材も同方向に回転しようとするが、研磨位置
保持機構に当該移動が阻止され、図1に図示した所定位
置に留めおかれる。この場合、被加工物と研磨工具面と
の間に、所定の摩擦が生じ、内径側と外径側との回転周
速度の相違により被加工物は、自ら回転する。回転によ
り、被加工物の直径が研磨工具面の半径方向の幅よりも
大きくても、はみ出た部分も順次研磨工具面に当接しす
り合わされることとなり、これによって被加工物は円滑
に研磨される。そして、被加工物および円盤状加圧部材
を研磨工具面上の任意の位置に可変設定し得ることか
ら、被加工物の大きさ等に応じた最適な研磨加工の位置
を個別に選定することができ、また、必要に応じて研磨
工具面上を揺動させることができる。更に、使用済の研
磨液が研磨工具面上に留まるという事態を回避すること
ができ、これがため、常に当初の研磨加工の加工条件を
維持することができる。かかる点において装置全体を確
実に小型化でき,且つ被加工物の研磨加工に際しての汎
用性を高めることができ、更に、研磨加工を長時間にわ
たって高精度に継続することができるという利点があ
る。 [0023] Therefore, in the invention of claim 6 wherein the
When the entire equipment is set to the operating state, first, the annular polishing tool rotates in the direction indicated by the arrow A in FIG. At the same time, the workpiece and the disc-shaped pressing member on the polishing tool surface also try to rotate in the same direction, but the movement is prevented by the polishing position holding mechanism, and the polishing position holding mechanism is kept at the predetermined position shown in FIG. In this case, a predetermined friction is generated between the workpiece and the polishing tool surface, and the workpiece rotates by itself due to a difference in rotational peripheral speed between the inner diameter side and the outer diameter side. Due to the rotation, even if the diameter of the workpiece is larger than the radial width of the polishing tool surface, the protruding portion is also sequentially brought into contact with the polishing tool surface and rubbed, whereby the workpiece is polished smoothly. You. Then, since the workpiece and the disc-shaped pressing member can be variably set at arbitrary positions on the surface of the polishing tool, it is necessary to individually select an optimal polishing processing position according to the size of the workpiece. And can be swung over the surface of the polishing tool as needed. Furthermore, it is possible to avoid a situation in which the used polishing liquid remains on the polishing tool surface, and therefore, it is possible to always maintain the initial polishing processing conditions. In this respect, there is an advantage that the entire apparatus can be reliably reduced in size, versatility in polishing a workpiece can be enhanced, and polishing can be continued with high accuracy for a long time.
【0024】請求項7記載の発明では、前述した請求項
1記載の平面研磨装置において、環状研磨工具の研磨工
具面上に、所定間隔を隔てて当該環状研磨工具の研磨工
具面上に研磨液を供給する複数の液噴射ノズルを備えた
研磨液供給機構を装備すると共に該環状研磨工具の研磨
工具面上から使用済の研磨液を吸引し収集する研磨液吸
引機構を、それぞれ装備する。そして、研磨液供給機構
を環状研磨工具の回転方向に対し被加工物の上流側に配
設すると共に、研磨液吸引機構を環状研磨工具の回転方
向に対し前述した被加工物の下流側に配設する、という
構成を採っている。According to the seventh aspect of the present invention, the above-mentioned claim is provided.
In the plane polishing apparatus 1 Symbol placement, on the polishing tool surface of the annular grinding tool, a polishing liquid supply having a plurality of liquid jet nozzle for supplying a polishing liquid onto the polishing tool surface of the annular grinding tool at a predetermined distance A polishing liquid suction mechanism for mounting and collecting used polishing liquid from the polishing tool surface of the annular polishing tool is provided. The polishing liquid supply mechanism is disposed upstream of the workpiece with respect to the rotation direction of the annular polishing tool, and the polishing liquid suction mechanism is disposed downstream of the workpiece with respect to the rotation direction of the annular polishing tool. To be installed.
【0025】このため、この請求項7記載の発明では、
前述した請求項1記載の発明と同等の機能を有するほ
か、更に、使用済の研磨液が研磨工具面上に留まるとい
う事態を回避することができ、これがため、常に当初の
研磨加工の加工条件を維持することができ、かかる点に
おいても研磨加工を長時間にわたって高精度に継続する
ことができるという利点がある。Therefore, according to the invention of claim 7 ,
In addition to having the above claims 1 Symbol placement invention functions equivalent can further polishing solution spent to avoid a situation where remains on the polishing tool surface, which is therefore always processed in the initial polishing The condition can be maintained, and also in this respect, there is an advantage that the polishing can be continued with high accuracy for a long time.
【0026】請求項8記載の発明では、前述した請求項
2,3又は4記載の平面研磨装置において、前述した環
状研磨工具の研磨工具面上に、所定間隔を隔てて当該環
状研磨工具の研磨工具面上に所定の研磨液を供給する液
噴射ノズルを備えた研磨液供給機構を装備すると共に、
該環状研磨工具の研磨工具面上から使用済の研磨液を吸
引し収集する研磨液吸引機構をそれぞれ装備する。そし
て、前述した研磨液供給機構を環状研磨工具の回転方向
に対し前述した被加工物の上流側に配設すると共に、研
磨液吸引機構を環状研磨工具の回転方向に対して前述し
た円板状ドレッサの下流側に配設する、という構成を採
っている。In the invention according to claim 8 , the aforementioned claim is provided.
In the plane polishing apparatus 2, 3 or 4, wherein supply onto the polishing tool surface of the ring <br/> shaped polishing tool described above, a predetermined polishing liquid onto the polishing tool surface of the annular grinding tool at a predetermined distance Equipped with a polishing liquid supply mechanism with a liquid injection nozzle
Equipped respectively polishing solution suction mechanism for sucking and collecting the polishing liquid spent from the polishing tool surface of the annular grinding tool. The above-mentioned polishing liquid supply mechanism is arranged on the upstream side of the above-mentioned workpiece with respect to the rotation direction of the annular polishing tool, and the polishing liquid suction mechanism is provided with the above-mentioned disc-shaped liquid crystal in the rotation direction of the annular polishing tool. It is arranged downstream of the dresser.
【0027】このため、この請求項8記載の発明では、
前述した請求項2,3又は4記載の発明と同等の機能を
有するほか、更に、研磨液によって円板状ドレッサが研
磨工具面の目立ても同時に行うことができ、このため、
環状研磨工具の研磨工具面の研磨能力が経時的に劣化す
るのを継続使用しながら同時に有効に抑制することがで
きるという利点がある。Therefore, in the invention according to claim 8 ,
In addition to having an inventive equivalent functions of the above claims 2, 3 or 4, further comprising disc-shaped dresser GaKen by polishing solution
Polishing of the polishing tool surface can be performed at the same time.
There is an advantage that the deterioration of the polishing ability of the polishing tool surface of the annular polishing tool over time can be effectively suppressed simultaneously with continuous use.
【0028】請求項9記載の発明では、前述した請求項
5,6,7又は8記載の平面研磨装置において、研磨液
吸引機構(具体的には、液吸引ノズル)を、環状研磨工
具の研磨工具面の幅方向に沿って配設すると共に、この
液吸引ノズルが備えている複数の研磨液吸引孔を前述し
た環状研磨工具の研磨工具面に対向した面の内径側領域
と外径側領域に多く形成する、という構成を採ってい
る。According to a ninth aspect of the present invention, there is provided the planar polishing apparatus of the fifth , sixth , seventh or eighth aspect , wherein the polishing liquid
A suction mechanism (specifically, a liquid suction nozzle ) is provided along the width direction of the polishing tool surface of the annular polishing tool, and a plurality of polishing liquid suction holes provided in the liquid suction nozzle are formed in the above-described annular polishing tool. The polishing tool has a configuration in which a large amount is formed in the inner diameter side region and the outer diameter side region of the surface facing the polishing tool surface of the polishing tool.
【0029】このため、この請求項9記載の発明では、
前述した請求項5,6,7又は8記載の発明と同等の機
能を有するほか、更に、使用済の研磨液を効率良く収集
することができ、かかる点において研磨工具面の研磨能
力を常に良好な状態に維持することができるという利点
がある。Therefore, according to the ninth aspect of the present invention,
Claim 5 described above, 6, 7 or 8 invention and other functionally equivalent to the described, further, it is possible to efficiently collect the polishing solution spent, always good polishing ability of a polishing tool surface in this respect There is an advantage that it can be maintained in a proper state.
【0030】請求項10記載の発明では、前述した請求
項9記載の平面研磨装置において、液吸引ノズル部の前
述した環状研磨工具の研磨工具面に対向する面の両端部
角部に、外気に通ずる複数の浅溝を設ける、という構成
を採っている。According to a tenth aspect of the present invention, in the planar polishing apparatus according to the ninth aspect, corners at both ends of a surface of the liquid suction nozzle portion opposed to the polishing tool surface of the annular polishing tool are provided with outside air. A configuration in which a plurality of communicating shallow grooves are provided.
【0031】このため、この請求項10記載の発明で
は、前述した請求項9記載の発明と同等の機能を有する
ほか、更に、研磨工具面上における使用済の研磨液を更
により一層効率良く収集することができるという利点が
ある。Therefore, the tenth aspect of the present invention has the same function as that of the ninth aspect of the present invention, and furthermore, the used polishing liquid on the polishing tool surface is collected even more efficiently. There is an advantage that can be.
【0032】請求項11記載の発明では、前述した請求
項5乃至10の何れか一つに記載の平面研磨装置におい
て、前述した環状研磨工具の外周部に対向して所定間隔
を隔てて立ち上がり部を有し且つ当該環状研磨工具と一
体的に回転する断面U字状の研磨液収集槽を設ける。そ
して、この研磨液収集槽に、当該研磨液収集槽で収集さ
れた研磨液を吸引しつつ外部に送出する研磨液回収機構
を併設する、という構成を採っている。According to an eleventh aspect of the present invention, in the planar polishing apparatus according to any one of the fifth to tenth aspects, the rising portion is spaced apart from the outer peripheral portion of the annular polishing tool by a predetermined distance. And a polishing liquid collection tank having a U-shaped cross section that rotates integrally with the annular polishing tool. The polishing liquid collecting tank is provided with a polishing liquid collecting mechanism for sucking out the polishing liquid collected in the polishing liquid collecting tank and sending the polishing liquid to the outside.
【0033】このため、この請求項11記載の発明で
は、前述した請求項5乃至10の何れか一つに記載の発
明と同等の機能を有するほか、更に、研磨工具面から外
部に飛散する研磨液を有効に回収することができ、加工
工程における周囲の汚染を抑制することができる。The polishing Therefore, in the invention as claimed in claim 11, in addition to having an inventive function equivalent according to any one of claims 5 to 10 described above, further, scattered to the outside from the polishing tool surface The liquid can be effectively collected, and surrounding contamination in the processing step can be suppressed.
【0034】請求項12記載の発明では、前述した請求
項5乃至11の何れか一つに記載の平面研磨装置におい
て、前述した研磨液吸引機構等で吸引回収した研磨液を
再生して前述した研磨液供給機構に送給する研磨液用の
再生循環回路を備えた構成とする、という手法を採って
いる。According to a twelfth aspect of the present invention, in the flat surface polishing apparatus according to any one of the fifth to eleventh aspects, the polishing liquid sucked and collected by the polishing liquid suction mechanism or the like is regenerated and the above-mentioned polishing is performed. The method employs a configuration in which a recirculation circuit for polishing liquid to be supplied to the polishing liquid supply mechanism is provided.
【0035】このため、この請求項12記載の発明で
は、前述した請求項5乃至11の何れか一つに記載の発
明と同等の機能を有するほか、更に工具研磨液の再利用
が可能となり、研磨液の消費量を低減することがき、か
かる点において、研磨加工工程における生産性向上を図
ることができるという利点がある。[0035] Therefore, in the invention of claim 12, wherein, in addition to a function of the same or the like and the invention according to any one of claims 5 to 11 described above, further enables the reuse of the tool polishing solution In addition, the consumption of the polishing liquid can be reduced, and in this respect, there is an advantage that the productivity in the polishing process can be improved.
【0036】[0036]
【発明の実施の形態】以下、本発明の一実施の形態を、
図1乃至図4に基づいて説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an embodiment of the present invention will be described.
This will be described with reference to FIGS.
【0037】図1乃至図2において、符号1はケース本
体を示し、符号1Aはケース本体1の上床部を示す。こ
の上床部1Aの中央部には、駆動モータ3によって回転
駆動されるターンテーブル4が装備されている。このタ
ーンテーブル4上には、研磨工具面2Aが環状(ドーナ
ツ状)で且つ当該研磨工具面2Aが水平面を成すように
環状研磨工具2が装備されている。1 and 2, reference numeral 1 denotes a case main body, and reference numeral 1A denotes an upper floor portion of the case main body 1. At the center of the upper floor 1A, a turntable 4 that is rotated by a drive motor 3 is provided. The annular polishing tool 2 is mounted on the turntable 4 such that the polishing tool surface 2A is annular (donut-shaped) and the polishing tool surface 2A forms a horizontal plane.
【0038】又、上記環状研磨工具2の研磨工具面2A
上には、板面を研磨加工するための円板状の被加工物1
0が載置されるようになっている。この被加工物10
は、研磨加工に際しては、加圧部材である円盤状加圧部
材11によって前述した環状研磨工具2側に一様に押圧
されるようになっている。このため、被加工物10の被
研磨面が一様に且つ高精度に研磨されることとなる。The polishing tool surface 2A of the annular polishing tool 2
On the top, a disk-shaped workpiece 1 for polishing the plate surface
0 is placed. This workpiece 10
During polishing, the disk is uniformly pressed against the above-described annular polishing tool 2 by a disk-shaped pressing member 11 which is a pressing member. Therefore, so that the object to be <br/> Labs Migakumen of the workpiece 10 is polished to a uniform and high accuracy.
【0039】この円盤状加圧部材11については、本実
施形態では、図1乃至図2に示すように被加工物10の
直径K2と同一の直径を備えたものが使用され、自重で
被加工物10を環状研磨工具2側に押圧するようになっ
ている。このようにすると、被加工物10と円盤状加圧
部材11との一体化が容易であり、且つ着脱が容易とな
り、かかる点において作業性向上を図ることができる。In this embodiment, as shown in FIGS. 1 and 2, the disk-shaped pressing member 11 having the same diameter as the diameter K2 of the workpiece 10 is used. The object 10 is pressed against the annular polishing tool 2. In this way, the workpiece 10 and the disc-shaped pressing member 11 can be easily integrated, and can be easily attached and detached. In this respect, workability can be improved.
【0040】尚、この円盤状加圧部材11については、
被加工物10を環状研磨工具側に一様に押圧可能なもの
であれば、被加工物10の直径D10と異なった直径の
ものを使用してもよい。また、図1乃至図2では、自重
によって被加工物10を環状研磨工具2側に押圧する場
合の円盤状加圧部材11を開示したが、同様に機能する
ものであれば他の手法による加圧部材(例えば強制的に
加圧する手法のもの)であってもよい。更に、円盤状加
圧部材11に代えて他の形状の加圧部材であってもよ
い。The disc-shaped pressing member 11 is
As long as the workpiece 10 can be uniformly pressed toward the annular polishing tool, a workpiece having a diameter different from the diameter D10 of the workpiece 10 may be used. Also, in FIGS. 1 and 2, the disc-shaped pressing member 11 for pressing the workpiece 10 toward the annular polishing tool 2 by its own weight has been disclosed. A pressure member (for example, a method of forcibly pressurizing) may be used. Further, instead of the disc-shaped pressing member 11, a pressing member of another shape may be used.
【0041】環状研磨工具2の回転方向イに対して被加
工物10の下流側に、研磨位置保持機構13が装備され
ている。この研磨位置保持機構13は、前述した環状研
磨工具2を作動させて回転動作に移行した場合に、前述
した被加工物10および円盤状加圧部材11が回転する
のを許容すると共に当該被加工物10および円盤状加圧
部材11が前述した環状研磨工具2と一体的に移動する
のを阻止して所定の被研磨位置を保持する研磨位置保持
機能を備えている。A polishing position holding mechanism 13 is provided on the downstream side of the workpiece 10 with respect to the rotation direction A of the annular polishing tool 2. The polishing position holding mechanism 13 allows the workpiece 10 and the disc-shaped pressing member 11 to rotate when the annular polishing tool 2 described above is operated and the operation shifts to a rotating operation. object 10 and disc-like pressure member 11 is provided with a polishing position holding function of holding the predetermined target polishing position by preventing the movement of the annular polishing tool 2 as one body to above.
【0042】この研磨位置保持機構13は、具体的に
は、被加工物10および円盤状加圧部材11の回転を許
容し且つ所定間隔を隔てて配設された少なくとも二つの
支持ローラ13A,13Bと、この二つの支持ローラ1
3A,13Bを保持するアーム部材13Cとにより構成
されている。このアーム部材13Cの基端部は、伸縮駆
動機構部13Dを介して前述したケース本体1に保持さ
れている。Specifically, the polishing position holding mechanism 13 allows at least two support rollers 13A, 13B which allow the workpiece 10 and the disc-shaped pressing member 11 to rotate and are arranged at a predetermined interval. And these two support rollers 1
An arm member 13C for holding 3A and 13B is provided. The base end of the arm member 13C is held by the above-described case main body 1 via a telescopic drive mechanism 13D.
【0043】この伸縮駆動機構部13Dは、必要に応じ
て前述したアーム部材13Cをその突出方向に沿って伸
縮するが如く往復移動させるように機能を備えている。
符号13Eは、この伸縮駆動機構部13Dの動作を制御
する動作制御部を示す。これにより、前述したアーム部
材13Cと共に二つの支持ローラ13A,13Bの配設
位置を個別に若しくは一体的に変化させて、前述した被
加工物10を環状研磨工具2の研磨工具面2A上におけ
る最適研磨位置を選択することができるようになってい
る。The expansion / contraction drive mechanism 13D has a function to reciprocate the arm member 13C as required to extend and contract along its protruding direction as required.
Reference numeral 13E denotes an operation control unit that controls the operation of the telescopic drive mechanism 13D. Thereby, the arrangement position of the two support rollers 13A and 13B together with the above-mentioned arm member 13C is changed individually or integrally, and the above-mentioned workpiece 10 is optimally placed on the polishing tool surface 2A of the annular polishing tool 2. The polishing position can be selected.
【0044】即ち、研磨位置保持機構13は、この伸縮
駆動機構部13Dの動作により、前述した被加工物10
および円盤状加圧部材11の回転中心P10を、環状研
磨工具2の研磨工具面2A上の任意の位置に可変設定し
保持すること(研磨位置可変設定機能の実行)が可能と
なっている。このため、研磨工具面2Aに対応した同じ
箇所を繰り返し使用することによって起こる当該研磨工
具面2Aの偏った摩耗を確実に防ぐことができる。That is, the polishing position holding mechanism 13 operates the above-described workpiece 10 by the operation of the expansion / contraction drive mechanism 13D.
The rotation center P10 of the disc-shaped pressing member 11 can be variably set and held at an arbitrary position on the polishing tool surface 2A of the annular polishing tool 2 (execution of a polishing position variable setting function). Therefore, uneven wear of the polishing tool surface 2A caused by repeatedly using the same portion corresponding to the polishing tool surface 2A can be reliably prevented.
【0045】ここで、この研磨位置保持機構13につい
ては、更に、伸縮駆動機構部13Dを動作制御部13E
で駆動制御し、前述した環状研磨工具2と被加工物10
との接触面積の中心位置(図心)Psに対して前述した
被加工物10の重心位置P10を一致させ且つ当該位置
を保持する被加工物用重心位置設定機能を備えている。
この環状研磨工具2と被加工物10との接触面積の中心
位置(図心)Ps と被加工物10の重心位置P10とを
一致させた状態で研磨作業を実行すると、比較的安定し
た状態で、高精度に且つ能率良く研磨工程を継続し得る
ことを、実験的に確認することができた。Here, with respect to the polishing position holding mechanism 13, the telescopic drive mechanism 13D is further operated by the operation control unit 13E.
The annular polishing tool 2 and the workpiece 10 are controlled by the
A center-of-gravity position setting function for the workpiece is provided in which the center-of-gravity position P10 of the workpiece 10 described above is made coincident with the center position (center of gravity) Ps of the contact area with the workpiece and the position is maintained.
When the polishing operation is performed in a state where the center position (center of gravity) Ps of the contact area between the annular polishing tool 2 and the workpiece 10 coincides with the center of gravity P10 of the workpiece 10, a relatively stable state is obtained. It was experimentally confirmed that the polishing process could be continued with high accuracy and efficiency.
【0046】前述した環状研磨工具2の研磨工具面2A
上には、当該研磨工具面2Aに当接し且つ当該環状研磨
工具2の回転方向イに対して前述した被加工物10の上
流側に、前述した研磨工具面2Aの幅Wより大きい直径
を有する円板状ドレッサ14が配設されている。この円
板状ドレッサ14は、小型駆動モータ14Aによって回
転駆動されるようになっている。この円板状ドレッサ1
4及び小型駆動モータ14Aは、アーム状保持部材14
Bによって保持されている。The polishing tool surface 2A of the annular polishing tool 2 described above.
On the upper side, it has a diameter larger than the width W of the polishing tool surface 2A, which is in contact with the polishing tool surface 2A and on the upstream side of the above-described workpiece 10 with respect to the rotation direction a of the annular polishing tool 2. A disk-shaped dresser 14 is provided. The disc-shaped dresser 14 is driven to rotate by a small drive motor 14A. This disk-shaped dresser 1
4 and the small drive motor 14A
B.
【0047】そして、この円板状ドレッサ14によっ
て、前述した環状研磨工具2の研磨工具面2Aは常時そ
の目詰まりが除去され、常に研磨工具面2Aを新規な状
態に維持することができ、経時的に、被加工物10の研
磨作業の能率を低下させることなく円滑に進めることが
できる。The clogging of the polishing tool surface 2A of the annular polishing tool 2 is constantly removed by the disc-shaped dresser 14, and the polishing tool surface 2A can be maintained in a new state at all times. Thus, it is possible to smoothly proceed without lowering the efficiency of the polishing operation of the workpiece 10.
【0048】又、前述した環状研磨工具2の研磨工具面
2A上には、当該研磨工具面2Aに対して所定間隔を隔
てて当該研磨工具面2Aの幅Wのほぼ全域に所定の研磨
液を供給する複数の液噴射ノズル15aを備えた研磨液
供給機構15が装備されている。同時に、この研磨工具
面2Aの幅W上のほぼ全域から使用済の研磨液を吸引し
収集する研磨液吸引機構16が装備されている。On the polishing tool surface 2A of the annular polishing tool 2 described above, a predetermined polishing liquid is applied over substantially the entire width W of the polishing tool surface 2A at a predetermined distance from the polishing tool surface 2A. A polishing liquid supply mechanism 15 having a plurality of liquid injection nozzles 15a for supplying is provided. At the same time, a polishing liquid suction mechanism 16 for sucking and collecting used polishing liquid from almost the entire area on the width W of the polishing tool surface 2A is provided.
【0049】そして、この研磨液供給機構15は環状研
磨工具2の回転方向イに対して前述した被加工物10の
上流側に近接して配設されている。又、研磨液吸引機構
16は前述した環状研磨工具2の回転方向イに対して円
板状ドレッサ14の下流側に近接して配設されている。The polishing liquid supply mechanism 15 is disposed close to the upstream side of the workpiece 10 with respect to the rotation direction A of the annular polishing tool 2. Further, the polishing liquid suction mechanism 16 is disposed close to the downstream side of the disc-shaped dresser 14 with respect to the rotation direction A of the annular polishing tool 2 described above.
【0050】これにより、被加工物10の上流側の研磨
工具面2Aに噴射された研磨液は、被加工物10,又は
被加工物10と円板状ドレッサ14とを経た後、研磨液
吸引機構16によって吸引されるようになっている。こ
こで、円板状ドレッサ14を装備しない場合は、研磨液
吸引機構16は、前述した環状研磨工具2の回転方向イ
に対して被加工物10の下流側に配設されることとな
る。Thus, the polishing liquid sprayed on the polishing tool surface 2A on the upstream side of the workpiece 10 passes through the workpiece 10, or the workpiece 10 and the disk-shaped dresser 14, and then sucks the polishing liquid. The suction is performed by the mechanism 16. Here, when the disk-shaped dresser 14 is not provided, the polishing liquid suction mechanism 16 is disposed downstream of the workpiece 10 with respect to the rotation direction a of the annular polishing tool 2 described above.
【0051】研磨液吸引機構16は、本実施形態では、
前述した環状研磨工具2の研磨工具面2Aの幅方向に沿
って配設されている。又、この研磨液吸引機構16は図
4に示すように、環状研磨工具2の研磨工具面2Aに対
向した面の内径側領域S1と外径側領域S2に複数の研
磨液吸引孔16aがその中央領域よりも多く設けられて
いる。これにより、研磨加工時に研磨工具面2Aの内径
側領域S1と外径側領域S2にそれぞれ集まりやすい使
用済の研磨液をより効率良く吸引することができるよう
になっている。In this embodiment, the polishing liquid suction mechanism 16 is
The annular polishing tool 2 is disposed along the width direction of the polishing tool surface 2A of the annular polishing tool 2 described above. As shown in FIG. 4, the polishing liquid suction mechanism 16 has a plurality of polishing liquid suction holes 16a in the inner diameter side region S1 and the outer diameter side region S2 of the surface facing the polishing tool surface 2A of the annular polishing tool 2. More are provided than in the central area. As a result, the used polishing liquid that easily collects in the inner diameter side area S1 and the outer diameter side area S2 of the polishing tool surface 2A during polishing can be more efficiently sucked.
【0052】更に、研磨液吸引機構16の前述した環状
研磨工具2の研磨工具面2Aに対向する面の両端部に
は、図4に示すように外気に通ずる複数の浅溝16bが
設けられている。これにより、使用済の研磨液が研磨液
吸引機構16によって吸引され易いようになっている。Further, as shown in FIG. 4, a plurality of shallow grooves 16b communicating with the outside air are provided at both ends of the surface of the polishing liquid suction mechanism 16 facing the polishing tool surface 2A of the annular polishing tool 2 described above. I have. Thus, the used polishing liquid is easily sucked by the polishing liquid suction mechanism 16.
【0053】ここで、前述した環状研磨工具2について
更に詳述する。前述した環状研磨工具2は、本実施形態
では、その外径D2が、図3に示すように被加工物10
の外接円(被加工物10が円形でない場合、その当接面
の中心点を回転中心として研磨工具面2A上で自転した
場合に想定される円)の直径K2より大きく且つ当該被
加工物10の外接円の直径K2の二倍より小さい値に設
定されている。Here, the above-mentioned annular polishing tool 2 will be described in more detail. In the present embodiment, the outer diameter D2 of the annular polishing tool 2 described above has a workpiece 10 as shown in FIG.
Is larger than the diameter K2 of the circumscribed circle (the circle assumed when the workpiece 10 is not circular, and is assumed to rotate on the polishing tool surface 2A with the center point of the contact surface as the center of rotation) and the workpiece 10 Is set to a value smaller than twice the diameter K2 of the circumscribed circle.
【0054】例えば、環状研磨工具2は、その直径(外
径)D2が480〔mm〕で,内径d2が120〔m
m〕のものが使用されているとする(図3参照)。一
方、円板状の被加工物10としては12インチウエハ
(直径300〔mm〕、厳密には直径304.8〔m
m〕)を対象としている。この場合、被加工物10の回
転中心P10は、円環状研磨工具2との接触面積の図心
(接触面積の平均的中心点)Psが、円環状研磨工具2
の中心P2から E=130〔mm〕だけ離れた位置に
配設されている。これにより、本実施形態では、被加工
物10の大きさが同一とした場合には、従来の円環状研
磨工具に対して面積比が約2分の1の円環状研磨工具2
を提供することができる。For example, the annular polishing tool 2 has a diameter (outer diameter) D2 of 480 [mm] and an inner diameter d2 of 120 [m].
m] is used (see FIG. 3). On the other hand, as the disk-shaped workpiece 10, a 12-inch wafer (diameter 300 [mm] , strictly 304.8 [m
m] )). In this case, the rotational center P10 of the workpiece 10 is such that the centroid (the average center point of the contact area) Ps of the contact area with the annular polishing tool 2 is
Is disposed at a position away from the center P2 by E = 130 [mm]. Thus, in the present embodiment, when the size of the workpiece 10 is the same, the annular polishing tool 2 having an area ratio of about half that of the conventional annular polishing tool is used.
Can be provided.
【0055】これを従来例と比較すると、例えば図6に
示す従来例では、直径K0=300〔mm〕のウエハを
平面研磨する場合には、少なくとも研磨工具面102A
の幅wが300〔mm〕以上で且つ円環状研磨工具10
2の内側の円の直径が120〔mm〕あることを要する
ため、円環状研磨工具102の直径は少なくとも720
〔mm〕以上となる。これによると、直径比だけでも、
ほぼ従来の2分の1の大きさに小型化されている。面積
比に関してはその2乗数で小型化されることとなる。When this is compared with the conventional example, for example , in the conventional example shown in FIG. 6, when a wafer having a diameter K0 = 300 [mm] is planarly polished, at least the polishing tool surface 102A is required.
Is not less than 300 [mm] and the annular polishing tool 10
Since the diameter of the circle inside 2 needs to be 120 [mm], the diameter of the annular polishing tool 102 is at least 720 mm.
[Mm] or more. According to this, just the diameter ratio,
The size is reduced to almost half of the conventional size. The area ratio is reduced by the square of the area ratio.
【0056】このようなもので、環状研磨工具2の外径
D2を、図3に示すように被加工物10の直径K2(被
加工物10が円でない場合には、被加工物10がその当
接面の中心点を回転中心として研磨工具面2A上で自転
した場合に想定される円,即ち外接円の直径)の二倍よ
り僅かに小さい値とした場合について示す。 [0056] In this arrangement, when the outer diameter D2 of the annular grinding tool 2, the diameter K2 (the workpiece 10 of the workpiece 10 as shown in FIG. 3 is not circular, the workpiece 10 is that shown with the case where the contact surface circle is assumed when the center point and rotate on the polishing tool face 2A as the center of rotation, i.e. a two fold by <br/> Ri slightly smaller diameter of the circumscribed circle) .
【0057】この場合、被加工物10については、環状
研磨工具2の回転と共に当該環状研磨工具2の研磨工具
面2A上の所定箇所で当該被加工物10が自転による回
転動作を行うことから、被加工物10はその全面にわた
って確実に研磨を行うことができる。In this case, the workpiece 10 is rotated by its own rotation at a predetermined position on the polishing tool surface 2A of the annular polishing tool 2 together with the rotation of the annular polishing tool 2. The workpiece 10 can be reliably polished over the entire surface.
【0058】ここで、環状研磨工具2については、環状
研磨工具2の外径D2を前述した被加工物10の直径K
2より大きく設定すると共に、当該環状研磨工具2の研
磨工具面2Aの半径方向における工具幅Wを被加工物1
0の直径K2より小さく設定してもよい。このようにし
ても、前述した図1の場合と同様の機能を備えた環状研
磨工具2を得ることができる。Here, regarding the annular polishing tool 2, the outer diameter D2 of the annular polishing tool 2 is set to the diameter K of the workpiece 10 described above.
2 and the tool width W in the radial direction of the polishing tool surface 2A of the annular polishing tool 2 in the radial direction.
0 may be set smaller than the diameter K2. Even in this case, it is possible to obtain the annular polishing tool 2 having the same function as in the case of FIG. 1 described above.
【0059】前述した円板状ドレッサ14について、更
に詳述する。この図1乃至図2に開示した円板状ドレッ
サ14は、研磨工具面2Aの工具幅Wを180〔mm〕
とした場合、これより大きい直径200〔mm〕のもの
が装備されている。これにより、研磨工具面2Aは、そ
の幅全体が目立てされるので、常に平滑な研磨工具面2
Aで円板状被加工物10を研磨することができる。The above-mentioned disk-shaped dresser 14 will be described in more detail. The disc-shaped dresser 14 disclosed in FIGS. 1 and 2 has a tool width W of the polishing tool surface 2A of 180 [mm].
In this case, a larger one having a diameter of 200 [mm] is provided. Thus, the polishing tool face 2A, so the entire width is Te conspicuous, always smooth polished tool surface 2
A can polish the disk-shaped workpiece 10.
【0060】又、この円板状ドレッサ14については、
コストを下げ且つ高効率でドレッシングを行うために、
高価で摩耗しない研磨工具面2Aをシャープに目立てす
ることを意図して、少量の天然ダイアモンド粒子(15
0ミクロン)と安価で摩耗し易くとも研磨工具面2Aの
目立てに寄与する多くの人工ダイヤモンド粒子(100
ミクロン)が、その研磨工具面2A側に埋設されてい
る。これにより、コストパフォーマンスがよく、目立て
効率もよい円板状ドレッサ14を得ることができる。そ
して、研磨工具面2Aは、円環状研磨工具2が回転する
時には必ず目立てが継続実行されるため、常に平滑に保
たれる。The disk dresser 14 has the following structure.
In order to reduce costs and perform dressing with high efficiency,
In order to sharpen the expensive and wear-free abrasive tool surface 2A, a small amount of natural diamond particles (15
0 micron) and many artificial diamond particles (100) that are inexpensive and easy to wear but contribute to sharpening of the polishing tool surface 2A.
Microns) is buried on the polishing tool surface 2A side. This makes it possible to obtain the disc-shaped dresser 14 having good cost performance and good dressing efficiency. The polishing tool surface 2A is always kept smooth because sharpening is always performed when the annular polishing tool 2 rotates.
【0061】又、前述した研磨液吸引機構16は、研磨
吸引面の外周部に丸み(丸み半径2〔mm〕)を設け、
研磨液が溜まりやすい研磨工具面2Aの端面(外径領域
S1と内径領域S2)にはその中間領域よりも例えば三
倍多い研磨液吸引穴(直径約1〔mm〕)16aが設け
られている。[0061] Further, the polishing solution suction mechanism 16 described above is rounded (the rounding radius 2 [mm]) is provided on the outer periphery of Migaku Ken suction surface,
An end surface (outer diameter region S1 and inner diameter region S2) of the polishing tool surface 2A where the polishing liquid easily accumulates is provided with a polishing liquid suction hole (diameter of about 1 [mm]) 16a, for example, three times more than the intermediate region. .
【0062】これにより、研磨工具面2A上の円板状被
加工物10には、常に清浄な研磨液が供給され、このた
め、異物がたまる等の経時的な影響を受けることなく、
常に清浄な状態で平面研磨が行われることとなる。As a result, a clean polishing liquid is always supplied to the disk-shaped workpiece 10 on the polishing tool surface 2A, and therefore, there is no influence over time such as accumulation of foreign matter, and the like.
Planar polishing is always performed in a clean state.
【0063】符号21は環状研磨工具2の周囲および下
面側を覆うようにして断面U字状に形成された研磨液収
集槽を示す。この研磨液収集槽21は、環状研磨工具2
の外周部に対向して所定間隔を隔てて環状の立ち上がり
部21Aを備え、遠心力によって外部に流出する研磨液
を回収する機能を備えている。又、この研磨液収集槽2
1は、環状研磨工具2と同軸上に一体化され当該環状研
磨工具2と共に回転駆動されるようになっている。Reference numeral 21 denotes a polishing liquid collecting tank formed in a U-shaped section so as to cover the periphery and the lower surface of the annular polishing tool 2. The polishing liquid collecting tank 21 is provided with the annular polishing tool 2.
An annular rising portion 21A is provided facing the outer peripheral portion at a predetermined interval and has a function of collecting a polishing liquid flowing out due to centrifugal force. Also, this polishing liquid collecting tank 2
Numeral 1 is coaxially integrated with the annular polishing tool 2 and is driven to rotate together with the annular polishing tool 2.
【0064】この研磨液収集槽21には、当該研磨液収
集槽21で収集された研磨液を吸引しつつ外部に送出す
る研磨液回収機構22が併設されている。この研磨液回
収機構22は、前述したケース本体1に保持され、その
液吸引部である先端部が前述した研磨液収集槽21の内
底部に延設された状態となっている。The polishing liquid collecting tank 21 is provided with a polishing liquid collecting mechanism 22 which sucks out the polishing liquid collected in the polishing liquid collecting tank 21 and sends it out. The polishing liquid collecting mechanism 22 is held by the case main body 1 described above, and has a state in which a distal end, which is a liquid suction part, extends to the inner bottom of the polishing liquid collection tank 21 described above.
【0065】このため、被加工物10の研磨加工時に
は、この研磨液収集槽21および研磨液回収機構22の
作用によって、研磨液が外部に飛散することなく円滑に
回収されることとなる。これにより、より多くの使用済
み研磨液及び削り取られた研磨工具面2A上の屑等も、
高率よく回収される。For this reason, when the workpiece 10 is polished, the operation of the polishing liquid collecting tank 21 and the polishing liquid collecting mechanism 22 allows the polishing liquid to be collected smoothly without scattering to the outside. As a result, a larger amount of used polishing liquid and shavings on the polishing tool surface 2A are also removed.
Highly recovered.
【0066】又、前述した研磨液吸引機構16および研
磨液回収機構22で吸引回収される研磨液は、再生循環
回路31によって再生されて再び前述した研磨液供給機
構15に送給されるようになっている。The polishing liquid sucked and collected by the polishing liquid suction mechanism 16 and the polishing liquid collection mechanism 22 described above is regenerated by the regeneration circuit 31 so as to be supplied to the polishing liquid supply mechanism 15 again. Has become.
【0067】上記再生循環回路31は、図2に示すよう
に吸引側ポンプ32を備えた液回収管系33と、この液
回収管系33で回収した研磨液を三段の沈殿槽を介して
順次オーバーフローさせて濾過する研磨液再生槽34A
〜34Cと、この研磨液再生槽(研磨液タンク)34A
〜34Cの最下段に位置する研磨液再生槽34Cの上澄
みを再び供給側ポンプ35で吸い出して前述した研磨液
供給機構15に送り込む液再供給管系36とを備えた構
成となっている。この再生循環回路31は、液回収管系
33と液再供給管系36の一部を除いて前述したケース
本体1の内部下方(上床部1Aの下)に収納されてい
る。As shown in FIG. 2, the regenerating circuit 31 includes a liquid recovery pipe system 33 provided with a suction side pump 32 and a polishing liquid recovered by the liquid recovery pipe system 33 via a three-stage settling tank. Polishing liquid regeneration tank 34A that overflows and filters sequentially
To 34C and this polishing liquid regeneration tank (polishing liquid tank) 34A
And a liquid re-supply pipe system 36 for sucking the supernatant of the polishing liquid regenerating tank 34C located at the lowermost position of the polishing liquid supply pipe 35 again by the supply pump 35 and sending it to the polishing liquid supply mechanism 15 described above. The regeneration circulation circuit 31 is housed below the inside of the case main body 1 (below the upper floor 1A) except for a part of the liquid recovery pipe system 33 and the liquid resupply pipe system 36.
【0068】これにより、前述した研磨液吸引機構16
及び研磨液回収機構22により回収された研磨液及び研
磨工具面2A上の屑等の異物は、研磨液再生槽34A〜
34Cにおくりこまれ、研磨液が再生される。Thus, the above-mentioned polishing liquid suction mechanism 16
The polishing liquid collected by the polishing liquid recovery mechanism 22 and foreign substances such as debris on the polishing tool surface 2A are removed from the polishing liquid regeneration tanks 34A to 34A.
At 34C, the polishing liquid is regenerated.
【0069】前述した供給側ポンプ35は、例えば供給
量100〔cc/min〕程度の能力を有し、その出力
側には50〔μm〕と5〔μm〕のメッシュのフィルタ
35Aを備え、研磨液再生槽34A〜34Cで除去でき
なかった異物を除去する機能も備えている。そして、こ
の研磨液再生槽34A〜34Cで再生された研磨液は、
供給側ポンプ35で更に細かい不要粒子が除去されて液
再供給管系36から再供給管36Eを介して前述した研
磨液供給機構15に送り込まれる。The above-mentioned supply pump 35 has a supply capacity of, for example, about 100 [cc / min], and is provided with a filter 35A having a mesh of 50 [μm] and 5 [μm] on the output side thereof. It also has a function of removing foreign matter that could not be removed in the liquid regeneration tanks 34A to 34C. The polishing liquid regenerated in the polishing liquid regenerating tanks 34A to 34C is
The supply-side pump 35 removes finer unnecessary particles, and is sent from the liquid re-supply pipe system 36 to the polishing liquid supply mechanism 15 via the re-supply pipe 36E.
【0070】次に、上記実施形態の動作を説明する。被
加工物10および円盤状加圧部材11を図1乃至図2に
示すように環状研磨工具2の研磨工具面2A上に載置し
た後、装備全体を稼働状態に設定すると、まず、環状研
磨工具2が図1のイ方向に回転する。同時に研磨工具面
2A上の被加工物10および円盤状加圧部材11も同方
向に回転しようとするが、研磨位置保持機構13に当該
移動が阻止され、図1に図示した所定位置(具体的に
は、図3に図示した環状研磨工具と被加工物との接触面
積の中心位置(図心)と、前記被加工物の重心位置が一
致した場所)に留めおかれる。Next, the operation of the above embodiment will be described. After it placed on the polishing tool face 2A of the annular grinding tool 2 to the workpiece 10 and disc-like pressure member 11 shown in FIGS. 1 and 2, setting the entire equipment in the operational state, first, The annular polishing tool 2 rotates in the direction of FIG. Tries to rotate the workpiece 10 and also the same direction disc-shaped pressure member 11 on the same time the polishing tool surface 2A, the mobile is prevented in the polishing position holding mechanism 13, a predetermined position shown in FIG. 1 (specifically To
Is a contact surface between the annular polishing tool shown in FIG. 3 and the workpiece.
The center position (center of gravity) of the product and the center of gravity of the workpiece
Place) .
【0071】この場合、被加工物10と研磨工具面2A
との間に、所定の摩擦が生じるが、研磨工具面2Aの内
径側と外径側とでは、回転周速度の相違に起因して摩擦
力が異なり、その差によって被加工物10は研磨工具面
2A上で同図Cの方向に自ら回転する。この場合の符号
P10が被加工物10の回転中心となる。In this case, the workpiece 10 and the polishing tool surface 2A
Friction occurs between the inner diameter side and the outer diameter side of the polishing tool surface 2A due to the difference in rotational peripheral speed, and the workpiece 10 is polished by the difference. It rotates on the surface 2A in the direction of FIG. The symbol P10 in this case is the rotation center of the workpiece 10.
【0072】ここで、被加工物10が回転すると、研磨
工具面2Aに当接する被加工物10の回転面は、被加工
物10の直径K2が研磨工具面2Aの半径方向の幅Wよ
りも大きくても、はみ出た部分も順次研磨工具面2Aに
当接しすり合わされることとなり、これによって被加工
物10は円滑に研磨される。即ち、本実施形態では、被
加工物10の直径K2が研磨工具面2Aの半径方向の幅
Wよりも大きくても、被加工物10を有効に研磨加工す
ることができ、かかる点において、装置全体の小型化が
可能となるという利点がある。Here, when the workpiece 10 rotates, the rotating surface of the workpiece 10 which comes into contact with the polishing tool surface 2A is such that the diameter K2 of the workpiece 10 is larger than the radial width W of the polishing tool surface 2A. Even if it is large, the protruding portion is also sequentially brought into contact with and rubbed against the polishing tool surface 2A, whereby the workpiece 10 is polished smoothly. That is, in the present embodiment, even if the diameter K2 of the workpiece 10 is larger than the radial width W of the polishing tool surface 2A, the workpiece 10 can be effectively polished. There is an advantage that the overall size can be reduced.
【0073】被加工物10の研磨位置は、前述したよう
に、研磨位置保持機構13によって規制される。同時
に、伸縮駆動機構部13Dによってその研磨位置は(揺
動的に又は定期的に往復して)移動されるようになって
いる。又、装置全体の稼働と共に、円板状ドレッサ14
及びその駆動用の小型モータ14Aも作動し、同時に研
磨液供給機構15,研磨液吸引機構16,研磨液回収機
構22及び再生循環回路31も作動する。The polishing position of the workpiece 10 is regulated by the polishing position holding mechanism 13 as described above. At the same time, the polishing position is moved (oscillated or periodically reciprocated) by the telescopic drive mechanism 13D . In addition, with the operation of the whole apparatus,
The small motor 14A for driving the same also operates, and at the same time, the polishing liquid supply mechanism 15 , the polishing liquid suction mechanism 16 , the polishing liquid recovery mechanism 22, and the regeneration circuit 31 also operate.
【0074】これにより、円板状ドレッサ14の働きで
研磨工具面2Aは常に目立てが成され、同時に研磨液供
給機構15,研磨液吸引機構16,研磨液回収機構22
および再生循環回路31の働きによって、常に新鮮な研
磨液が研磨工具面2Aに供給される。このため、研磨工
具面2Aは継時的に目詰まりを起こすことなく円滑に且
つ高精度に研磨作業が継続される。As a result, the polishing tool surface 2A is always sharpened by the action of the disk-shaped dresser 14 , and at the same time, the polishing liquid is supplied.
Supply mechanism 15 , polishing liquid suction mechanism 16 , polishing liquid recovery mechanism 22
By the operation of the regenerating circuit 31, fresh polishing liquid is always supplied to the polishing tool surface 2A. For this reason, the polishing operation is continued smoothly and accurately with no clogging of the polishing tool surface 2A.
【0075】次に、上記実施形態について具体的なテス
ト結果について説明する。このテストでは、円環状研磨
工具2としてポリウレタン(外径480〔mm〕、内径
120〔mm〕)製のものを用い、研磨液としてコロイ
ダルシリカ(粒系は100オングストローム)を用い、
二酸化シリコン膜付きウエハ(外径300〔mm〕)を
研磨した。研磨工具回転数は24〔rpm〕、加工圧力
600〔g/平方センチメートル〕、研磨位置保持機構
13によるウエハの揺動幅40〔mm〕、研磨時間5分
でテストした。Next, specific test results of the above embodiment will be described. In this test, a tool made of polyurethane (outside diameter: 480 [mm], inside diameter: 120 [mm]) was used as the annular polishing tool 2 , and colloidal silica (particle size: 100 Å) was used as the polishing liquid.
A wafer with a silicon dioxide film (outer diameter 300 [mm]) was polished. Polishing tool rotation speed is 24 (rpm), processing pressure 600 [g / cm], rocking Dohaba the wafer 40 by the polishing position holding mechanism 13 mm and was tested in 5 minutes polishing time.
【0076】この場合、12インチのウエハの研磨量は
15000±500オングストロームで研磨均一性±3
%となり、小型化(研磨工具の面積比:従来の2分の
1)された平面研磨装置で大口径ウエハを高精度に研磨
することが可能になった。In this case, the polishing amount of a 12-inch wafer is 15000 ± 500 Å and the polishing uniformity is ± 3.
%, And a large-diameter wafer can be polished with high precision by a miniaturized planar polishing apparatus (area ratio of polishing tool: 1/2 of conventional one).
【0077】次に、他の実施形態を図5に基づいて説明
する。この図5に示す他の実施形態は、前述した図1乃
至図4の実施形態にて開示した円板状ドレッサ14およ
びその駆動機構の他の例を示すものである。この図5に
おいて、円板状ドレッサ24は、その直径が前述した研
磨工具面2Aの工具幅Wよりも小さい直径を持つ小円板
ドレッサ(例えば外径75〔mm〕)が使用されてい
る。この円板ドレッサ24は、小型駆動モータ24Aと
一体的に装備され、アーム部材24B上に装備された往
復移動移送機構(図示せず)に付勢されて、当該アーム
部材24B上を、所定範囲を往復移動するように装備さ
れている。Next, another embodiment will be described with reference to FIG. The other embodiment shown in FIG. 5 shows another example of the disc-shaped dresser 14 and the driving mechanism disclosed in the above-described embodiments of FIGS. In FIG. 5, as the disc-shaped dresser 24, a small disc dresser (for example, an outer diameter of 75 [mm]) having a diameter smaller than the tool width W of the polishing tool surface 2A described above is used. The disc dresser 24 is integrally provided with the small drive motor 24A, and is urged by a reciprocating transfer mechanism (not shown) provided on the arm member 24B to move the disc dresser 24 over a predetermined range on the arm member 24B. It is equipped to reciprocate.
【0078】この場合、円板ドレッサ24の反転動作
は、アーム部材24B上の両端部に装備されたマイクロ
スイッチ24a,24bによって反転信号が送出され、
図示しない制御手段によって反転移動が制御されるよう
になっている。その他の構成は前述した図1乃至図4に
示す実施形態と同一となっている。In this case, the reversing operation of the disk dresser 24 is performed by transmitting micro-switches 24a and 24b provided at both ends of the arm member 24B,
The reverse movement is controlled by control means (not shown). The other configuration is the same as the embodiment shown in FIGS. 1 to 4 described above.
【0079】このようにしても、前述した図1乃至図4
の実施形態と同一の作用効果を得ることができる。Also in this case, the above-described FIGS.
The same operation and effect as those of the embodiment can be obtained.
【0080】次に、この図5に示す実施形態の具体的な
テスト結果について説明する。Next, specific test results of the embodiment shown in FIG. 5 will be described.
【0081】このテストも前述した実施形態の場合と同
じ条件で行った。その結果、12インチウエハの研磨量
15000±600〔オングストローム〕で研磨均一性
±4〔%〕となり、小型化(研磨工具の面積比:従来の
2分の1)した平面研磨装置で大口径ウエハを高精度に
研磨することが可能になった。This test was also performed under the same conditions as in the above embodiment. As a result, the polishing uniformity is ± 4% when the polishing amount of a 12-inch wafer is 15000 ± 600 [angstrom], and the large-diameter wafer is polished with a downsized (polishing tool area ratio: 1/2 of conventional) polishing machine. Can be polished with high precision.
【0082】尚、上述した各実施形態において、円環状
研磨工具2の周縁部に研磨液の流出を防ぐための起立壁
を設けてもよい。このようにすると、円環状研磨工具2
に供給される研磨液の回収効率がよくなり、より、効率
のよい平面研磨装置が提供できる。また、上記各実施形
態では、12インチウエハの平面研磨に限定して説明を
行ったが、6,8,又は14インチウエハの平面研磨装
置に本発明を適用してもよい。このようにすると、当該
平面研磨装置を確実に小型化することができる。In each of the above-described embodiments, an upright wall may be provided at the periphery of the annular polishing tool 2 for preventing the outflow of the polishing liquid. By doing so, the annular polishing tool 2
The recovery efficiency of the polishing liquid supplied to the surface is improved, and a more efficient planar polishing apparatus can be provided. Further, in each of the above-described embodiments, the description is limited to the planar polishing of a 12-inch wafer. However, the present invention may be applied to a planar polishing apparatus for a 6, 8, or 14-inch wafer. By doing so, the size of the planar polishing apparatus can be reliably reduced.
【0083】また、円板状被加工物10は上記実施形態
で述べた二酸化シリコン膜付きウエハに限定されるもの
ではなく、例えば、金属配線付きウエハ、磁気ディス
ク、ガラス基板、その他のものであってもよい。Further, the disk-shaped workpiece 10 is not limited to the wafer with the silicon dioxide film described in the above embodiment, but may be, for example, a wafer with metal wiring, a magnetic disk, a glass substrate, or any other material. You may.
【0084】このように、本実施形態では、円環状研磨
工具2の研磨工具面2A上における半径方向の研磨工具
面2Aの幅Wより大きな直径(円板状でない場合は外接
円の直径)を有する被加工物10を、有効に平面研磨す
ることができ、このため、装置全体をその研磨加工の性
能を維持しつつ有効に且つ確実に小型化することができ
る。As described above, in the present embodiment, the diameter (the diameter of a circumscribed circle in the case of a non-disc shape) larger than the width W of the polishing tool surface 2A in the radial direction on the polishing tool surface 2A of the annular polishing tool 2 is set. The workpiece 10 to be processed can be effectively planar-polished, so that the entire apparatus can be effectively and reliably reduced in size while maintaining the performance of the polishing process.
【0085】なお、上記実施形態は、円環状研磨工具2
の研磨面2Aを水平に装備した場合を例示したが、垂直
又は斜めに装備してもよい。In the above embodiment, the annular polishing tool 2 is used.
Although the case where the polished surface 2A is mounted horizontally is illustrated, it may be mounted vertically or obliquely.
【0086】[0086]
【発明の効果】本発明は、以上のように構成され機能す
るので、円環状研磨工具の外半径より大きな直径を有す
る被加工物を高精度な平滑面に平面研磨することがで
き、且つ装置全体を確実に小型化できるという従来にな
い優れた平面研磨装置を提供できる効果がある。Since the present invention is constructed and functions as described above, a workpiece having a diameter larger than the outer radius of the annular polishing tool can be flat-polished to a highly accurate smooth surface, and the apparatus can be polished. This has the effect of providing an unprecedented and superior planar polishing apparatus capable of reliably reducing the size of the whole.
【図1】本発明の第一実施形態を示す概略平面図であ
る。FIG. 1 is a schematic plan view showing a first embodiment of the present invention.
【図2】図1の一部省略した概略縦断面図である。FIG. 2 is a schematic longitudinal sectional view of FIG. 1 with a part omitted;
【図3】図1内に開示した円環状研磨工具と被加工物と
の大きさ及び研磨加工時の位置等を示す説明図である。FIG. 3 is an explanatory view showing the size of the annular polishing tool disclosed in FIG. 1 and a workpiece, a position at the time of polishing, and the like.
【図4】図1内に開示した研磨液吸収機構の研磨液吸引
面の例を示す説明図である。FIG. 4 is an explanatory view showing an example of a polishing liquid suction surface of the polishing liquid absorption mechanism disclosed in FIG. 1;
【図5】本発明のたの実施形態を示す概略平面図であ
る。FIG. 5 is a schematic plan view showing another embodiment of the present invention.
【図6】図6(a)は従来例を示す概略側面図であり、
図6(b)は概略平面図である。FIG. 6 (a) is a schematic side view showing a conventional example,
FIG. 6B is a schematic plan view.
1 ケース本体 1A 上床部 2 環状研磨工具 2A 研磨工具面 3 駆動モータ 4 ターンテーブル 10 円板状被加工物 11 円盤状加圧部材 13 研磨位置保持機構 13A,13B 支持ローラ 13C アーム部材 13D 伸縮駆動機構部 13E 動作制御部 14 円板状ドレッサ 15 研磨液供給機構 15a 液噴射ノズル 16 研磨液吸引機構 21 研磨液収集槽 21A 立ち上り部 22 研磨液回収機構 31 再生循環回路 DESCRIPTION OF SYMBOLS 1 Case main body 1A Upper floor part 2 Annular grinding tool 2A Polishing tool surface 3 Drive motor 4 Turntable 10 Disk-shaped workpiece 11 Disk-shaped pressing member 13 Polishing position holding mechanism 13A, 13B Support roller 13C Arm member 13D Telescopic drive mechanism Unit 13E operation control unit 14 disk-shaped dresser 15 polishing liquid supply mechanism 15a liquid injection nozzle 16 polishing liquid suction mechanism 21 polishing liquid collection tank 21A rising section 22 polishing liquid collection mechanism 31 regeneration circulation circuit
───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI H01L 21/304 622 H01L 21/304 622M (56)参考文献 特開 平6−39705(JP,A) 特開 平7−251371(JP,A) 特開 昭50−48593(JP,A) 特開 平8−281551(JP,A) 特開 平9−36071(JP,A) 特開 平8−309659(JP,A) 特開 平4−75870(JP,A) 実開 昭58−852(JP,U) 特公 昭38−23595(JP,B1) 実公 昭48−5956(JP,Y1) (58)調査した分野(Int.Cl.7,DB名) B24B 37/04 B24B 37/00 H01L 21/304 622 ──────────────────────────────────────────────────の Continuation of the front page (51) Int.Cl. 7 Identification symbol FI H01L 21/304 622 H01L 21/304 622M (JP, A) JP-A-50-48593 (JP, A) JP-A-8-281551 (JP, A) JP-A-9-36071 (JP, A) JP-A-8-309659 (JP, A) Kaihei 4-75870 (JP, A) JP-A 58-852 (JP, U) JP-B 38-23595 (JP, B1) JP-B 48-5596 (JP, Y1) (58) Int.Cl. 7 , DB name) B24B 37/04 B24B 37/00 H01L 21/304 622
Claims (12)
の環状研磨工具上に載置される被加工物を前記環状研磨
工具側に一様に加圧すると共に当該被加工物と一体的に
移動する円盤状加圧部材と、前記環状研磨工具が回転し
た場合に前記被加工物および前記円盤状加圧部材が回転
するのを許容し,且つ当該被加工物および当該円盤状加
圧部材が前記環状研磨工具と共に移動するのを阻止して
所定の被研磨位置を保持する研磨位置保持機構とを備え
て成る平面研磨装置において、 前記環状研磨工具の外径を、前記被加工物の外接円の直
径より大きく且つ当該被加工物の外接円の直径の二倍よ
り小さい値に設定し、前記研磨位置保持機構が、前記環状研磨工具と前記被加
工物との接触面積の中心位置に対して前記被加工物の重
心位置を一致させ且つ当該位置を保持する被加工物用重
心位置設定機能を備え たことを特徴とする平面研磨装
置。1. An annular polishing tool having an annular polishing tool surface, and a workpiece mounted on the annular polishing tool is uniformly pressed against the annular polishing tool, and is integrally formed with the workpiece. a disc-shaped pressure member to move, said when the annular polishing tool is rotated to allow the workpiece and the disc-shaped pressure member is rotated, and the workpiece and the disc-shaped pressure member is And a polishing position holding mechanism for holding a predetermined position to be polished by preventing movement with the annular polishing tool, wherein an outer diameter of the annular polishing tool is set to a circumscribed circle of the workpiece. Is set to a value larger than the diameter of the workpiece and smaller than twice the diameter of a circumscribed circle of the workpiece.
The weight of the workpiece with respect to the center position of the contact area with the workpiece
Workpiece weight that matches and maintains the center position
A planar polishing apparatus having a center position setting function .
の環状研磨工具上に載置される被加工物を前記環状研磨
工具側に一様に加圧すると共に当該被加工物と一体的に
移動する円盤状加圧部材と、前記環状研磨工具が回転し
た場合に前記被加工物および前記円盤状加圧部材が回転
するのを許容し,且つ当該被加工物および当該円盤状加
圧部材が前記環状研磨工具と共に移動するのを阻止して
所定の被研磨位置を保持する研磨位置保持機構とを備え
て成る平面研磨装置において、前記環状研磨工具の外径
を、前記被加工物の外接円の直径より大きく且つ当該被
加工物の外接円の直径の二倍より小さい値に設定し、 前記環状研磨工具の研磨工具面上に当該研磨工具面の幅
より大きい直径を有する円板状ドレッサを配設すると共
に、この円板状ドレッサを、前記環状研磨工具の回転方
向に対して前記被加工物の上流側に配設したことを特徴
とする 平面研磨装置。2. An annular polishing tool having an annular polishing tool surface.
The workpiece to be mounted on the annular polishing tool is
Uniformly pressurized on the tool side and integrated with the workpiece
The moving disk-shaped pressing member and the annular polishing tool rotate.
The workpiece and the disc-shaped pressing member rotate
The work and the disk-shaped
To prevent the pressure member from moving with the annular polishing tool
A polishing position holding mechanism for holding a predetermined polishing position
An outer diameter of the annular polishing tool
Is larger than the diameter of the circumscribed circle of the workpiece and
Set to a value smaller than twice the diameter of the circumcircle of the workpiece, and the width of the polishing tool surface on the polishing tool surface of the annular polishing tool
When a disk-shaped dresser with a larger diameter is
This disk-shaped dresser is used for rotating the annular polishing tool.
Characterized in that it is arranged upstream of the workpiece with respect to the direction
Surface polishing apparatus according to.
の環状研磨工具上に載置される被加工物を前記環状研磨
工具側に一様に加圧すると共に当該被 加工物と一体的に
移動する円盤状加圧部材と、前記環状研磨工具が回転し
た場合に前記被加工物および前記円盤状加圧部材が回転
するのを許容し,且つ当該被加工物および当該円盤状加
圧部材が前記環状研磨工具と共に移動するのを阻止して
所定の被研磨位置を保持する研磨位置保持機構とを備え
て成る平面研磨装置において、前記環状研磨工具の外径
を、前記被加工物の外接円の直径より大きく且つ当該被
加工物の外接円の直径の二倍より小さい値に設定し、 前記研磨位置保持機構が、前記被加工物および前記円盤
状加圧部材の回転中心を、前記環状研磨工具の研磨工具
面上の任意の位置に可変設定し保持する研磨位置可変設
定機能を備え、 更に、前記環状研磨工具の研磨工具面上に当該研磨工具
面の幅より大きい直径を有する円板状ドレッサを配設す
ると共に、この円板状ドレッサを、前記環状研磨工具の
回転方向に対して前記被加工物の上流側に配設したこと
を特徴とする 平面研磨装置。(3)An annular polishing tool with an annular polishing tool surface
The workpiece to be mounted on the annular polishing tool is
Apply uniform pressure to the tool side and Integrally with the workpiece
The moving disk-shaped pressing member and the annular polishing tool rotate.
The workpiece and the disc-shaped pressing member rotate
The work and the disk-shaped
To prevent the pressure member from moving with the annular polishing tool
A polishing position holding mechanism for holding a predetermined polishing position
An outer diameter of the annular polishing tool
Is larger than the diameter of the circumscribed circle of the workpiece and
Set the value to less than twice the diameter of the circumcircle of the workpiece, The polishing position holding mechanism includes the workpiece and the disk.
The center of rotation of the annular pressing member, the polishing tool of the annular polishing tool
Polishing position variable setting that variably sets and holds at any position on the surface
Function Further, the polishing tool is provided on the polishing tool surface of the annular polishing tool.
Arrange a disk-shaped dresser with a diameter larger than the width of the surface
In addition, this disc-shaped dresser is
It is arranged on the upstream side of the workpiece with respect to the rotation direction
Characterized by Flat polishing machine.
研磨工具面の幅より大きい直径を有する円板状ドレッサ
を配設すると共に、この円板状ドレッサを、前記環状研
磨工具の回転方向に対して前記被加工物の上流側に配設
したことを特徴とする請求項1記載の平面研磨装置。4. A disk-shaped dresser having a diameter larger than the width of the polishing tool surface is disposed on a polishing tool surface of the annular polishing tool, and the disk-shaped dresser is rotated in a rotating direction of the annular polishing tool. the workpiece surface polishing apparatus according to claim 1 Symbol mounting, characterized in that disposed upstream of the relative.
の環状研磨工具上に載置される被加工物を前記環状研磨
工具側に一様に加圧すると共に当該被加工物と一体的に
移動する円盤状加圧部材と、前記環状研磨工具が回転し
た場合に前記被加工物および前記円盤状加圧部材が回転
するのを許容し,且つ当該被加工物および当該円盤状加
圧部材が前記環状研磨工具と共に移動するのを阻止して
所定の被研磨位置を保持する研磨位置保持機構とを備え
て成る平面研磨装置において、前記環状研磨工具の外径
を、前記被加工物の外接円の直径より大きく且つ当該被
加工物の外接円の直径の二倍より小さい値に設定し、 前記環状研磨工具の研磨工具面上に、所定間隔を隔てて
当該環状研磨工具の研磨工具面に所定の研磨液を供給す
る複数の液噴射ノズルを備えた研磨液供給機構を装備す
ると共に前記環状研磨工具の研磨工具面上から使用済の
研磨液を吸引し収集する研磨液吸引機構をそれぞれ装備
し、 前記研磨液供給機構を前記環状研磨工具の回転方向に対
し前記被加工物の上流側に配設すると共に、前記研磨液
吸引機構を前記環状研磨工具の回転方向に対し前記被加
工物の下流側に配設したことを特徴とする平面研磨装
置。Claim 5.An annular polishing tool with an annular polishing tool surface
The workpiece to be mounted on the annular polishing tool is
Uniformly pressurized on the tool side and integrated with the workpiece
The moving disk-shaped pressing member and the annular polishing tool rotate.
The workpiece and the disc-shaped pressing member rotate
The work and the disk-shaped
To prevent the pressure member from moving with the annular polishing tool
A polishing position holding mechanism for holding a predetermined polishing position
An outer diameter of the annular polishing tool
Is larger than the diameter of the circumscribed circle of the workpiece and
Set the value to less than twice the diameter of the circumcircle of the workpiece, On the polishing tool surface of the annular polishing tool, at a predetermined interval
A predetermined polishing liquid is supplied to the polishing tool surface of the annular polishing tool.
Equipped with a polishing liquid supply mechanism with multiple liquid injection nozzles
And used from the polishing tool surface of the annular polishing tool.
Equipped with a polishing liquid suction mechanism that sucks and collects polishing liquid
And the polishing liquid supply mechanism is moved in the rotational direction of the annular polishing tool.
The polishing liquid is disposed on the upstream side of the workpiece and the polishing liquid
The suction mechanism is moved in the rotation direction of the annular polishing tool.
It is located downstream of the structure.RupeiSurface polishing equipment
Place.
の環状研磨工具上に載置される被加工物を前記環状研磨
工具側に一様に加圧すると共に当該被加工物と一体的に
移動する円盤状加圧部材と、前記環状研磨工具が回転し
た場合に前記被加工物および前記円盤状加圧部材が回転
するのを許容し,且つ当該被加工物および当該円盤状加
圧部材が前記環状研磨工具と共に移動するのを阻止して
所定の被研磨位置を保持する研磨位置保持機構とを備え
て成る平面研磨装置において、前記環状研磨工具の外径
を、前記被加工物の外接円の直径より大きく且つ当該被
加工物の外接円の直径の二倍より小さい値に設定し、 前記研磨位置保持機構が、前記被加工物および前記円盤
状加圧部材の回転中心を、前記環状研磨工具の研磨工具
面上の任意の位置に可変設定し保持する研磨位置可変設
定機能を備え、 前記環状研磨工具の研磨工具面上に、所定間隔を隔てて
当該環状研磨工具の研磨工具面に所定の研磨液を供給す
る研磨液供給機構を装備すると共に前記環状研磨工具の
研磨工具面上から使用済の研磨液を吸引し収集する研磨
液吸引機構をそれぞれ装備し、 前記研磨液供給機構を前記環状研磨工具の回転方向に対
し前記被加工物の上流側に配設すると共に、前記研磨液
吸引機構を前記環状研磨工具の回転方向に対し前記被加
工物の下流側に配設したことを特徴とする平面研磨装
置。6.An annular polishing tool with an annular polishing tool surface
The workpiece to be mounted on the annular polishing tool is
Uniformly pressurized on the tool side and integrated with the workpiece
The moving disk-shaped pressing member and the annular polishing tool rotate.
The workpiece and the disc-shaped pressing member rotate
The work and the disk-shaped
To prevent the pressure member from moving with the annular polishing tool
A polishing position holding mechanism for holding a predetermined polishing position
An outer diameter of the annular polishing tool
Is larger than the diameter of the circumscribed circle of the workpiece and
Set the value to less than twice the diameter of the circumcircle of the workpiece, The polishing position holding mechanism includes the workpiece and the disk.
The center of rotation of the annular pressing member, the polishing tool of the annular polishing tool
Polishing position variable setting that variably sets and holds at any position on the surface
Function On the polishing tool surface of the annular polishing tool, at a predetermined interval
A predetermined polishing liquid is supplied to the polishing tool surface of the annular polishing tool.
Equipped with a polishing liquid supply mechanism,
Polishing that sucks and collects used polishing liquid from the polishing tool surface
A liquid suction mechanism is provided, and the polishing liquid supply mechanism is moved in a rotational direction of the annular polishing tool.
The polishing liquid is disposed on the upstream side of the workpiece and the polishing liquid
The suction mechanism is moved with respect to the rotation direction of the annular polishing tool.Addition
WorkIs located downstream ofRupeiSurface polishing equipment
Place.
定間隔を隔てて当該環状研磨工具の研磨工具面に所定の
研磨液を供給する研磨液供給機構を装備すると共に前記
環状研磨工具の研磨工具面上から使用済の研磨液を吸引
し収集する研磨液吸引機構をそれぞれ装備し、 前記研磨液供給機構を前記環状研磨工具の回転方向に対
し前記被加工物の上流側に配設すると共に、前記研磨液
吸引機構を前記環状研磨工具の回転方向に対し前記被加
工物の下流側に配設 したことを特徴とする請求項1記載
の平面研磨装置。7.On the polishing tool surface of the annular polishing tool,
At predetermined intervals on the polishing tool surface of the annular polishing tool,
Equipped with a polishing liquid supply mechanism for supplying a polishing liquid and
Suction of used polishing liquid from the polishing tool surface of the annular polishing tool
Equipped with a polishing liquid suction mechanism to collect The polishing liquid supply mechanism is moved in the rotating direction of the annular polishing tool.
The polishing liquid is disposed on the upstream side of the workpiece and the polishing liquid
The suction mechanism is moved in the rotation direction of the annular polishing tool.
Installed downstream of the structure Claims characterized by the following:1Description
Polishing equipment.
定間隔を隔てて当該環状研磨工具の研磨工具面に所定の
研磨液を供給する研磨液供給機構を装備すると共に前記
環状研磨工具の研磨工具面上から使用済の研磨液を吸引
し収集する研磨液吸引機構をそれぞれ装備し、 前記研磨液供給機構を前記環状研磨工具の回転方向に対
し前記被加工物の上流側に配設すると共に、前記研磨液
吸引機構を前記環状研磨工具の回転方向に対して前記円
板状ドレッサの下流側に配設し たことを特徴とする請求
項2,3又は4記載の平面研磨装置。 8. An annular polishing tool, comprising :
At predetermined intervals on the polishing tool surface of the annular polishing tool,
Equipped with a polishing liquid supply mechanism for supplying a polishing liquid and
Suction of used polishing liquid from the polishing tool surface of the annular polishing tool
And a polishing liquid suction mechanism for collecting and collecting the polishing liquid .
The polishing liquid is disposed on the upstream side of the workpiece and the polishing liquid
The suction mechanism is rotated in the circular direction with respect to the rotation
5. The flat polishing apparatus according to claim 2 , wherein the flat polishing apparatus is disposed downstream of the plate dresser .
具の研磨工具面の幅方向に沿って配設すると共に、この
研磨液吸引機構が備えている複数の研磨液吸引孔を、前
記環状研磨工具の研磨工具面に対向した面の内径側領域
と外径側領域に集中的に形成したことを特徴とする請求
項5,6,7又は8記載の平面研磨装置。9. The polishing apparatus according to claim 9, wherein said polishing liquid suction mechanism is provided with said annular polishing machine.
Along the width direction of the polishing tool surface of the tool
A plurality of polishing liquid suction holes provided in the polishing liquid suction mechanism
The inner diameter side area of the surface facing the polishing tool surface of the annular polishing tool
9. The flat-surface polishing apparatus according to claim 5, wherein the surface polishing apparatus is formed intensively in an outer diameter side region .
具の研磨工具面に対向する面の両端部に、外気に通ずる
複数の浅溝を設けたことを特徴とする請求項9記載の平
面研磨装置。 10. The annular polishing machine of the polishing liquid suction mechanism.
Open the outside air at both ends of the surface of the tool facing the polishing tool surface
The planar polishing apparatus according to claim 9 , wherein a plurality of shallow grooves are provided .
所定間隔を隔てて立ち上がり部を有し且つ当該環状研磨
工具と一体的に回転する断面U字状の研磨液収集槽を設
け、この研磨液収集槽に、当該研磨液収集槽で収集され
た研磨液を吸引しつつ外部に送出する研磨液回収機構を
併設したことを特徴とする請求項5乃至10の何れか一
つに記載の平面研磨装置。 11. An annular polishing tool facing an outer peripheral portion of the annular polishing tool.
Having a rising portion at a predetermined interval and the annular polishing
A polishing liquid collection tank with a U-shaped cross section that rotates integrally with the tool is installed.
The polishing liquid is collected in the polishing liquid collecting tank.
A polishing liquid recovery mechanism that sucks out the polishing liquid and sends it out
11. The device according to claim 5, wherein the device is provided in parallel.
A planar polishing apparatus according to any one of the preceding claims.
研磨液を再生して前記研磨液供給機構に送給する研磨液
用の再生循環回路を備えたことを特徴とする請求項5乃
至11の何れか一つに記載の平面研磨装置。 12. A polishing liquid suction mechanism and the like for suction and recovery.
Polishing liquid for regenerating polishing liquid and feeding it to the polishing liquid supply mechanism
5. A regenerative circulation circuit for use in a vehicle.
12. The planar polishing apparatus according to any one of -11.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5019299A JP3058274B1 (en) | 1999-02-26 | 1999-02-26 | Flat polishing machine |
US09/340,184 US6093088A (en) | 1998-06-30 | 1999-06-28 | Surface polishing machine |
CN99109433A CN1128695C (en) | 1998-06-30 | 1999-06-30 | Surface polishing machine |
KR1019990025704A KR100336933B1 (en) | 1998-06-30 | 1999-06-30 | Surface polishing machine |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5019299A JP3058274B1 (en) | 1999-02-26 | 1999-02-26 | Flat polishing machine |
Publications (2)
Publication Number | Publication Date |
---|---|
JP3058274B1 true JP3058274B1 (en) | 2000-07-04 |
JP2000246625A JP2000246625A (en) | 2000-09-12 |
Family
ID=12852305
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5019299A Expired - Fee Related JP3058274B1 (en) | 1998-06-30 | 1999-02-26 | Flat polishing machine |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3058274B1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110026881A (en) * | 2018-01-09 | 2019-07-19 | 信越半导体株式会社 | Grinding device and grinding method |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3852758B2 (en) | 2002-03-01 | 2006-12-06 | インターナショナル・ビジネス・マシーンズ・コーポレーション | Slurry recovery apparatus and method |
JP2008279539A (en) * | 2007-05-10 | 2008-11-20 | Nomura Micro Sci Co Ltd | Method and device for recovering polishing fluid |
JP5248209B2 (en) * | 2008-05-30 | 2013-07-31 | 野村マイクロ・サイエンス株式会社 | Chemical recovery device and chemical recovery method |
JP5479781B2 (en) * | 2009-05-29 | 2014-04-23 | 野村マイクロ・サイエンス株式会社 | Slurry recovery method and recovery device |
CN102240965B (en) * | 2011-07-08 | 2013-08-14 | 无锡市锡斌光电设备有限公司 | Annular grinding polishing machine |
KR101429949B1 (en) * | 2013-11-29 | 2014-08-14 | 엘오엘 주식회사 | Manufacturing device for Die Casting Member |
CN109732438A (en) * | 2019-01-24 | 2019-05-10 | 泉州市友腾光电科技有限公司 | A kind of good miniature stick mirror plane ring polishing apparatus of polishing effect |
-
1999
- 1999-02-26 JP JP5019299A patent/JP3058274B1/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110026881A (en) * | 2018-01-09 | 2019-07-19 | 信越半导体株式会社 | Grinding device and grinding method |
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JP2000246625A (en) | 2000-09-12 |
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