JP2954075B2 - Terminal coplanarity measuring method and apparatus - Google Patents

Terminal coplanarity measuring method and apparatus

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Publication number
JP2954075B2
JP2954075B2 JP8925097A JP8925097A JP2954075B2 JP 2954075 B2 JP2954075 B2 JP 2954075B2 JP 8925097 A JP8925097 A JP 8925097A JP 8925097 A JP8925097 A JP 8925097A JP 2954075 B2 JP2954075 B2 JP 2954075B2
Authority
JP
Japan
Prior art keywords
contact
terminal
terminals
contact detection
detection unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP8925097A
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Japanese (ja)
Other versions
JPH10281748A (en
Inventor
賢一 菅原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TOHOKU NIPPON DENKI KK
Original Assignee
TOHOKU NIPPON DENKI KK
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Filing date
Publication date
Application filed by TOHOKU NIPPON DENKI KK filed Critical TOHOKU NIPPON DENKI KK
Priority to JP8925097A priority Critical patent/JP2954075B2/en
Publication of JPH10281748A publication Critical patent/JPH10281748A/en
Application granted granted Critical
Publication of JP2954075B2 publication Critical patent/JP2954075B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Manufacturing Of Electrical Connectors (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、被検査物に列設さ
れた複数の端子のコプラナリティ(平坦度)を測定する
ための方法及び装置に関し、特にコネクタやIC(集積
回路装置)に列設された複数の端子のためのコプラナリ
ティ測定方法及び装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and an apparatus for measuring coplanarity (flatness) of a plurality of terminals arranged on an object to be inspected, and more particularly, to an arrangement of connectors and ICs (integrated circuit devices). And apparatus for measuring coplanarity for a plurality of terminals.

【0002】[0002]

【従来の技術】従来の端子のコプラナリティ測定方法
は、基準面上に被検査物の端子を載せ,端子の画像をカ
メラで取り込んで画像処理を用いて行っていた。
2. Description of the Related Art In a conventional method of measuring the coplanarity of a terminal, a terminal of an object to be inspected is mounted on a reference surface, an image of the terminal is captured by a camera, and image processing is performed.

【0003】例えば、特開平5−166907号公報に
は図5に示すような端子のコプラナリティ測定方法が示
されている。
For example, Japanese Patent Application Laid-Open No. 5-166907 discloses a method of measuring coplanarity of a terminal as shown in FIG.

【0004】図5において、光透過性のガラス製等の測
定ステージ52上にICからなる被検査物51を載せ,
一方の側より光源60から光を照射し、他方の側に配置
したカメラ59で被検査物51の画像を得る。
In FIG. 5, an inspection object 51 made of an IC is placed on a measurement stage 52 made of light-transmitting glass or the like.
Light is emitted from a light source 60 from one side, and an image of the inspection object 51 is obtained by a camera 59 arranged on the other side.

【0005】図6はカメラ59で撮った被検査物51の
画像に予め測定ステージ52をカメラ59で撮像し白黒
反転して得た基準平面53の画像を合成したものであ
る。この画像では被検査物51のカメラ59の側に設け
られた端子55の像の背景に光源60の側に設けられた
端子58の像が重って写り込んでしまう。図6の画像を
2値化したものが図7で、この2値化した画像を用いて
各端子55と基準平面53との間隔を算出して端子55
のコプラナリティを得ていた。
FIG. 6 shows an image of a reference plane 53 obtained by imaging the measurement stage 52 with the camera 59 in advance and inverting black and white with the image of the inspection object 51 taken with the camera 59. In this image, the image of the terminal 58 provided on the light source 60 side overlaps with the background of the image of the terminal 55 provided on the camera 59 side of the inspection object 51. FIG. 7 shows a binarized version of the image shown in FIG. 6. The interval between each terminal 55 and the reference plane 53 is calculated using the binarized image, and
Was gaining coplanarity.

【0006】[0006]

【発明が解決しようとする課題】従来の画像処理を用い
た端子のコプラナリティの測定方法は、端子と基準面と
の間の距離が小さいと照射光の干渉や透過光量の不足に
より誤測定を起こすことがあるという欠点があった。
In the conventional method of measuring the coplanarity of a terminal using image processing, when the distance between the terminal and the reference plane is small, erroneous measurement occurs due to interference of irradiation light or insufficient transmitted light. There was a disadvantage that there was.

【0007】また、図5〜図7に示した従来の端子のコ
プラナリティ測定方法では、検査すべき端子55に反対
側の端子58が重ってしまうため、端子55の最下端の
位置として真の値より低いものを測定してしまい、コプ
ラナリティの測定が不正確になってしまうという欠点が
あった。
In the conventional terminal coplanarity measuring method shown in FIGS. 5 to 7, the terminal 58 on the opposite side overlaps with the terminal 55 to be inspected. There is a drawback that the measurement of a value lower than the value results in inaccurate measurement of coplanarity.

【0008】本発明の目的は、画像処理を用いないで照
射光の影響を受けないで済み、しかも被検査物の両側に
端子が列設されていても、両側の端子が互いに測定の邪
魔とならないような端子のコプラナリティ測定方法を提
供することにある。
An object of the present invention is to eliminate the influence of irradiation light without using image processing, and even if terminals are arranged on both sides of an object to be inspected, the terminals on both sides may interfere with measurement with each other. It is an object of the present invention to provide a method for measuring coplanarity of a terminal that does not become impossible.

【0009】[0009]

【課題を解決するための手段】本発明の端子のコプラナ
リティ測定方法は、複数の端子(図1の5)を接触部が
端子接触面上に在るようにして設けた被検査物(図1の
1)に対し前記端子接触面に平行な接触検出面を有する
接触検出ユニット(図1の3)を前記端子接触面とは垂
直な方向に移動させ、前記端子が前記接触検出面と接触
した時の前記接触検出ユニットの位置を測定することを
特徴とし、望ましくは前記接触検出面の前記複数の端子
の接触部それぞれに対応する位置に対をなす複数対のパ
ッド(図1の6,7)が設けられ、この対をなすパッド
が前記端子の対応するものを介して導通したことを検出
することにより、前記端子の前記接触検出面との接触を
検出するようにし、前記接触検出ユニットを前記複数の
端子を全てが前記接触検出面と接触していない位置から
前記複数の端子の全てが前記接触検出面と接触する位置
まで移動させて前記端子が前記端子接触面と接触した時
の前記接触検出ユニットの位置を測定したり、前記接触
検出ユニットを前記複数の端子の全てが前記接触検出面
に押されて弾性限度範囲内でたわまされた位置から前記
複数の端子の全てが前記接触検出面と接触しない位置ま
で移動させて前記端子が前記端子接触面と接触した時の
前記接触検出ユニットの位置を測定するようにできる。
According to the method for measuring the coplanarity of a terminal according to the present invention, an object to be inspected (FIG. 1) provided with a plurality of terminals (5 in FIG. 1) such that the contact portions are on the terminal contact surfaces. With respect to 1), a contact detection unit (3 in FIG. 1) having a contact detection surface parallel to the terminal contact surface is moved in a direction perpendicular to the terminal contact surface, and the terminal comes into contact with the contact detection surface. A plurality of pairs of pads (6, 7 in FIG. 1) preferably corresponding to positions of the contact detection surface corresponding to the contact portions of the plurality of terminals. ) Is provided, and by detecting that the paired pads are conducted through the corresponding one of the terminals, contact with the contact detection surface of the terminal is detected, and the contact detection unit is All of the plurality of terminals are Move the position of the plurality of terminals from a position not in contact with the touch detection surface to a position where all of the plurality of terminals are in contact with the contact detection surface, and measure the position of the contact detection unit when the terminal comes into contact with the terminal contact surface. Or, the contact detection unit may be moved from a position where all of the plurality of terminals are pressed by the contact detection surface and bent within the elastic limit range to a position where all of the plurality of terminals do not contact the contact detection surface. By moving the terminal, the position of the contact detection unit when the terminal comes into contact with the terminal contact surface can be measured.

【0010】また、上述の端子のコプラナリティ測定方
法は、前記端子が前記端子接触面に接触した時の前記接
触検出ユニットの位置から当該端子の前記端子接触面に
垂直な方向の位置を算出したり、前記端子のいずれか1
つが前記接触検出面に接触した時の前記接触検出ユニッ
トの位置と前記端子の全てが前記接触検出面に接触した
時の前記接触検出ユニットの位置との間の距離を前記端
子接触面と垂直な方向における最も下にある前記端子の
接触部と最も上にある前記端子の接触部との間の距離と
して算出したりでき、望ましくは前記接触検出面の前記
端子の接触部それぞれに対応する部分又は前記パッドの
前記端子接触面と垂直な方向の位置のばらつきを予め求
めておき、前記端子が前記端子接触面と接触した時の前
記接触検出ユニットの位置を前記ばらつきで補正した値
から当該端子接触面に接触した端子の位置又は前記端子
接触面の垂直な方向における最も下にある前記端子の接
触部と最も上にある前記端子の接触部との間の距離を算
出するようにすればよい。
In the above-described method of measuring the coplanarity of a terminal, the position of the terminal in a direction perpendicular to the terminal contact surface may be calculated from the position of the contact detection unit when the terminal contacts the terminal contact surface. , One of the terminals
The distance between the position of the contact detection unit when one contacts the contact detection surface and the position of the contact detection unit when all of the terminals contact the contact detection surface is perpendicular to the terminal contact surface. It can be calculated as the distance between the contact portion of the terminal at the bottom and the contact portion of the terminal at the top in the direction, and preferably a portion corresponding to the contact portion of the terminal on the contact detection surface or Variations in the position of the pad in the direction perpendicular to the terminal contact surface are determined in advance, and the position of the contact detection unit when the terminal contacts the terminal contact surface is corrected from the value corrected by the variation to determine the terminal contact. The distance between the position of the terminal in contact with the surface or the contact portion of the lowest terminal in the direction perpendicular to the terminal contact surface and the contact portion of the highest terminal is calculated. Good.

【0011】本発明の端子のコプラナリティ測定装置
は、複数の端子(図1の5)を接触部が端子接触面に在
るように設けた被検査物(図1の1)を保持する受け台
(図1の2)と,前記端子接触面と平行な接触検出面を
有し、前記端子接触面と垂直な方向に移動する接触検出
ユニット(図1の3)と,前記接触検出面に前記端子の
接触部それぞれに対応する位置に対をなして設けられた
複数対のパッド(図1の6,7)と,前記接触検出ユニ
ットの前記端子接触面と垂直な方向の位置を測定する距
離検出ユニット(図1の4)とを含み、対をなす前記パ
ッドの導通により対応する前記端子の前記接触検出面と
の接触を検出することを特徴とする。
A terminal coplanarity measuring apparatus according to the present invention is a pedestal for holding an inspection object (1 in FIG. 1) provided with a plurality of terminals (5 in FIG. 1) such that a contact portion is on a terminal contact surface. (2 in FIG. 1); a contact detection unit (3 in FIG. 1) having a contact detection surface parallel to the terminal contact surface and moving in a direction perpendicular to the terminal contact surface; A plurality of pairs of pads (6, 7 in FIG. 1) provided in pairs at positions corresponding to the contact portions of the terminal, and a distance for measuring a position of the contact detection unit in a direction perpendicular to the terminal contact surface. And a detection unit (4 in FIG. 1), wherein a contact of the corresponding terminal with the contact detection surface is detected by conduction of the pair of pads.

【0012】[0012]

【発明の実施の形態】次に、本発明の実施の形態につい
て図面を参照して詳細に説明する。
Next, embodiments of the present invention will be described in detail with reference to the drawings.

【0013】図1(a)〜(c)は、それぞれ本発明の
実施の形態の端子のコプラナリティ検査装置の正面図,
平面図及び側面図である。
FIGS. 1A to 1C are front views of a terminal coplanarity inspection apparatus according to an embodiment of the present invention, respectively.
It is a top view and a side view.

【0014】受け台2上にコネクタからなる被検査物1
の本体を載せる。被検査物1の一方の側面には端子5が
列設されている。端子5の先端は接触部をなし、被検査
物1は複数の端子5の接触部が平面(端子接触面)上に
位置するように製作されている。受け台2の一方の側に
は受け第2と平行な接触検出ユニット3が上下動可能に
設けられている。接触検出ユニット3の高さは距離測定
ユニット4により測定される。
Inspection object 1 consisting of a connector on cradle 2
Put the main body. Terminals 5 are arranged in line on one side surface of the inspection object 1. The tip of the terminal 5 forms a contact portion, and the DUT 1 is manufactured such that the contact portions of the plurality of terminals 5 are located on a plane (terminal contact surface). On one side of the cradle 2, a contact detection unit 3 parallel to the second cradle is provided so as to be vertically movable. The height of the contact detection unit 3 is measured by the distance measurement unit 4.

【0015】図2(a)〜(c)はそれぞれ図1に示す
A部,B部及びC部の拡大図である。接触検出ユニット
3の上面(特許請求の範囲に記載した接触検出面に相
当)には各端子5に対応して対をなす接触パッド6,7
が設けられ、パッド6,7は共に対応する端子5と少く
とも一部が重なる位置にある。接触検出ユニット3を上
昇していくと、対のパッド6,7は対応する端子5に接
触することとなるが、この時にパッド6,7は互いに導
通状態となるので、パッド6,7の導通を検出すること
によりパッド6,7と端子5との接触を検出することが
できる。
FIGS. 2A to 2C are enlarged views of the portions A, B and C shown in FIG. 1, respectively. On the upper surface of the contact detection unit 3 (corresponding to the contact detection surface described in the claims), a pair of contact pads 6 and 7 corresponding to the respective terminals 5 are provided.
And the pads 6 and 7 are located at positions where at least a part thereof overlaps with the corresponding terminal 5. When the contact detection unit 3 is moved upward, the pads 6 and 7 of the pair come into contact with the corresponding terminals 5, but at this time, the pads 6 and 7 become conductive with each other. Is detected, contact between the pads 6 and 7 and the terminal 5 can be detected.

【0016】図3は図1に示す装置を用いた端子のコプ
ラナリティ測定方法を示す図で、図3(a1)〜(a
3)は側面図を示し、図3(b1)〜(b3)は正面図
を示す。なお、図3(b1)〜(b3)において端子5
として端子5の先端のみを示してある(図4(b1)〜
(b4)も同じ)。
FIG. 3 is a diagram showing a method of measuring coplanarity of a terminal using the apparatus shown in FIG. 1, and FIG. 3 (a1) to FIG.
3) shows a side view, and FIGS. 3 (b1) to (b3) show front views. In FIG. 3 (b1) to (b3), the terminal 5
Only the tip of the terminal 5 is shown (FIG. 4B1).
(The same applies to (b4)).

【0017】図3(a1),(b1)に示すように先ず
被検査物1の本体を受け台2に載せセットする。この
時、接触検出ユニット3はどのパッド6,7も端子5と
接触しないように十分に下げておく。次に、接触検出ユ
ニット3を上昇させ、図3(a2),(b2)のように
いずれかの端子5とパッド6,7の接触を検出した時の
接触検出ユニット3の高さを端子最下点(最も下にある
端子5の接触部の位置)として測定する。さらに、接触
検出ユニット3を上昇させ、図3(a3),(b3)の
ように端子5のすべてのパッド6,7との接触を検出し
た時の接触検出ユニット3の高さを端子最上点として測
定する。この後に端子最上点の高さから端子最下点の高
さを減算して最も上にある端子5の接触部の高さと最も
下にある端子5の接触部の高さとの差を求め、端子のコ
プラナリティを算出する。
As shown in FIGS. 3 (a1) and 3 (b1), first, the main body of the inspection object 1 is placed on the receiving table 2 and set. At this time, the contact detection unit 3 is sufficiently lowered so that none of the pads 6 and 7 come into contact with the terminal 5. Next, the contact detection unit 3 is raised, and the height of the contact detection unit 3 when the contact between any of the terminals 5 and the pads 6 and 7 is detected as shown in FIGS. It is measured as the lower point (the position of the contact portion of the terminal 5 at the lowest position). Further, the contact detection unit 3 is raised, and the height of the contact detection unit 3 when the contact of all the pads 6 and 7 of the terminal 5 is detected as shown in FIGS. Measured as Thereafter, the difference between the height of the contact portion of the uppermost terminal 5 and the height of the contact portion of the lowermost terminal 5 is obtained by subtracting the height of the terminal lowermost point from the height of the terminal uppermost point. Is calculated.

【0018】図3に示す端子のコプラナリティ測定方法
では、端子に酸化皮膜などがあって、端子5の対応のパ
ッド6,7とが物理的に接触しても直ちにパッド6,7
が電気的に導通しない場合は端子のコプラナリティを正
確に測定できない。
In the method of measuring coplanarity of a terminal shown in FIG. 3, even if the terminal has an oxide film or the like and is physically in contact with the corresponding pad 6, 7 of the terminal 5, the pad 6, 7
If the terminals are not electrically conductive, the coplanarity of the terminals cannot be measured accurately.

【0019】図4は、図1に示す装置を用いた他の端子
のコプラナリティの測定方法を示し、この方法は、端子
5との物理的接触によるパッド6,7の電気的導通がこ
れらに生じた酸化被膜などに影響を受ける場合でも正確
に端子のコプラナリティを測定できるものである。図4
(a1)〜(a4)は側面図を示し、図4(b1)〜
(b4)は正面図を示す。
FIG. 4 shows a method for measuring the coplanarity of other terminals using the apparatus shown in FIG. 1. In this method, electrical conduction between the pads 6 and 7 due to physical contact with the terminal 5 occurs in these terminals. It can accurately measure the coplanarity of the terminal even when the terminal is affected by an oxide film or the like. FIG.
(A1) to (a4) show side views, and FIG.
(B4) shows a front view.

【0020】図4(a1),(b1)に示すように、受
け台2に被検査物を載せセットする。この時、接触検出
ユニット3はどのパッド6,7も端子5と接触しないよ
うに十分に下げておく。次に、接触検出ユニットを端子
5の全てがパッド6,7と接触する高さよりさらに上昇
させ、図4(a2),(b2)に示すように端子5を押
して弾性変形範囲でたわませる上限付近まで上昇させ
る。この動作で、端子5とパッド6,7の接触面の酸化
皮膜を接触圧及び摺動によって破壊する。
As shown in FIGS. 4 (a1) and 4 (b1), the object to be inspected is placed on the receiving table 2 and set. At this time, the contact detection unit 3 is sufficiently lowered so that none of the pads 6 and 7 come into contact with the terminal 5. Next, the contact detection unit is further raised from the height at which all of the terminals 5 are in contact with the pads 6 and 7, and as shown in FIGS. 4 (a2) and 4 (b2), the terminal 5 is pushed to bend within the elastic deformation range. Raise to near. With this operation, the oxide film on the contact surface between the terminal 5 and the pads 6, 7 is broken by the contact pressure and sliding.

【0021】この後に、接触検出ユニット3を下降さ
せ、図4(a3),(b3)のようにいずれかの端子5
とパッド6,7とが接触しなくなった時の接触検出ユニ
ット3の高さを端子最上点として測定する。さらに、接
触検出ユニット3を下降させ、図4(a4),(b4)
のように端子5の全てがパッド6,7と接触しなくなっ
た時の接触検出ユニット3の高さを端子最下点として測
定する。この後に端子最上点の高さから端子最下点の高
さを減算し、端子のコプラナリティを算出する。
Thereafter, the contact detection unit 3 is lowered, and any one of the terminals 5 is connected as shown in FIGS. 4 (a3) and 4 (b3).
The height of the contact detection unit 3 when the pads 6 and 7 are no longer in contact is measured as the terminal uppermost point. Further, the contact detection unit 3 is lowered, and FIGS. 4 (a4) and (b4)
The height of the contact detection unit 3 when all of the terminals 5 are no longer in contact with the pads 6 and 7 is measured as the terminal lowest point. Thereafter, the height of the terminal bottom point is subtracted from the height of the terminal top point to calculate the coplanarity of the terminal.

【0022】なお、図3及び図4に示した端子のコプラ
ナリティ測定方法において、接触検出ユニット3上に設
けられた複数対のパッド6,7のそれぞれの高さのばら
つきを予め測定しておき、端子5が接触したパッド6,
7の高さのばらつきにより端子最上点の高さ及び端子最
下点の高さを補正することにより、パッド6,7の高さ
のばらつきの影響を除いたより正確な端子のコプラナリ
ティを得ることができる。
In the terminal coplanarity measuring method shown in FIGS. 3 and 4, the height variations of a plurality of pairs of pads 6 and 7 provided on the contact detection unit 3 are measured in advance. Pad 6, which contacted terminal 5,
By correcting the height of the uppermost point of the terminal and the height of the lowermost point of the terminal based on the variation in the height of the pad 7, a more accurate terminal coplanarity excluding the influence of the dispersion in the height of the pads 6 and 7 can be obtained. it can.

【0023】図1には被検査物1の一側面のみに端子5
が列設された場合を示したが、ICのように被検査物1
の両側面に端子5が列設されている場合は、受け台2の
両側に接触検出ユニット3を設けてもよく、さらに、こ
れら両側の接触検出ユニット3を別々に上下動させるよ
うにしても、一体として上下動させるようにしても本発
明は実施できる。
FIG. 1 shows a terminal 5 on only one side of the object 1 to be inspected.
Are shown in a row, but the inspection object 1 is like an IC.
When the terminals 5 are arranged in a row on both side surfaces, the contact detection units 3 may be provided on both sides of the cradle 2, and the contact detection units 3 on both sides may be individually moved up and down. The present invention can be practiced even if it is vertically moved as a unit.

【0024】また、上述の実施の形態では被検査物1を
固定し、接触検出ユニット3を上下動させたが、接触検
出ユニット3を固定し被検査物1を動かすようにしても
よい。
In the above-described embodiment, the inspection object 1 is fixed and the contact detection unit 3 is moved up and down. However, the contact detection unit 3 may be fixed and the inspection object 1 may be moved.

【0025】また、上述の実施の形態では、端子最上点
の高さから端子最下点の高さを減算して最も上にある端
子5の接触部の高さと最も下にある端子5の接触部の高
さとの差を求めて端子のコプラナリティとしていたが、
端子5と接触した時の接触検出ユニットの高さから端子
5それぞれの高さを算出して端子のコプラナリティを求
めることもできる。
In the above-described embodiment, the height of the terminal at the lowest point is subtracted from the height of the terminal at the highest point, and the height of the contact portion of the terminal 5 at the top and the contact of the terminal 5 at the lowest are determined. The difference with the height of the part was determined and the coplanarity of the terminal was used,
It is also possible to calculate the height of each terminal 5 from the height of the contact detection unit when it comes into contact with the terminal 5 and obtain the coplanarity of the terminal.

【0026】[0026]

【発明の効果】以上説明したように本発明は、被検査物
の端子の接触部の位置を接触検出ユニットの端子に接触
した時の位置から算出し、光学画像を用いないため、被
検査物の両側面に端子が設けられていても正確に端子の
コプラナリティを測定できるというように被検査物の形
状による制限を受けないで端子のコプラナリティを測定
できるという効果がある。
As described above, according to the present invention, the position of the contact portion of the terminal of the object to be inspected is calculated from the position at the time of contact with the terminal of the contact detection unit, and no optical image is used. Thus, even if terminals are provided on both side surfaces of the device, the coplanarity of the terminals can be measured without being limited by the shape of the object to be inspected, such that the coplanarity of the terminals can be accurately measured.

【0027】また、接触検出ユニットに設けた複数のパ
ッドの対をなすものどうしの導通により対応する端子の
接触検出ユニットとの接触を検出でき、さらに端子を弾
性限度範囲内でたわませるまで接触検出ユニットを移動
させることによって、酸化皮膜などのパッドと端子との
導通を阻害する要因を取り除き、端子と接触検出ユニッ
トとの物理的接触とが正確に端子とパッドとの電気的導
通となるため正確な端子のコプラナリティを測定でき
る。
Further, the contact of the corresponding terminal with the contact detection unit can be detected by conduction between a plurality of pairs of pads provided on the contact detection unit, and furthermore, the contact is made until the terminal is bent within the elastic limit range. By moving the detection unit, the factors that hinder the conduction between the pad and the terminal, such as an oxide film, are removed, and the physical contact between the terminal and the contact detection unit accurately establishes electrical conduction between the terminal and the pad. Accurate terminal coplanarity can be measured.

【0028】また、接触検出ユニットのパッド等の端子
接触面と垂直な方向の位置のばらつきを予め測定してお
き、このばらつきで接触検出ユニットの端子に接触した
時の位置を補正することにより、端子のコプラナリティ
の測定精度を上げることができる。
In addition, by measuring in advance the variation in the position of the contact detection unit in the direction perpendicular to the terminal contact surface such as a pad, and correcting the position when the terminal of the contact detection unit comes into contact with this variation, Measurement accuracy of terminal coplanarity can be improved.

【0029】また、本発明は高価な光学装置や画像処理
装置を用いないので、端子のコプラナリティ測定装置の
費用を安くすることができる。
Further, since the present invention does not use an expensive optical device or image processing device, the cost of the terminal coplanarity measuring device can be reduced.

【図面の簡単な説明】[Brief description of the drawings]

【図1】(a)は本発明の実施の形態の端子のコプラナ
リティ測定装置の正面図である。(b)は本発明の実施
の形態の端子のコプラナリティ測定装置の平面図であ
る。(c)は本発明の実施の形態の端子のコプラナリテ
ィ測定装置の側面図である。
FIG. 1A is a front view of a terminal coplanarity measuring apparatus according to an embodiment of the present invention. FIG. 2B is a plan view of the terminal coplanarity measuring device according to the embodiment of the present invention. (C) is a side view of the terminal coplanarity measuring device according to the embodiment of the present invention.

【図2】(a)は図1のA部の拡大図である。(b)は
図1のB部の拡大図である。(c)は図1のC部の拡大
図である。
FIG. 2A is an enlarged view of a portion A in FIG. FIG. 2B is an enlarged view of a portion B in FIG. 1. FIG. 2C is an enlarged view of a portion C in FIG.

【図3】図1に示す装置を用いた端子のコプラナリティ
測定方法を示す図である。
FIG. 3 is a diagram showing a method for measuring coplanarity of a terminal using the apparatus shown in FIG. 1;

【図4】図1に示す装置を用いた他の端子のコプラナリ
ティ測定方法を示す図である。
FIG. 4 is a diagram illustrating a method for measuring coplanarity of another terminal using the device illustrated in FIG. 1;

【図5】従来の端子のコプラナリティ測定方法を示す構
成図である。
FIG. 5 is a configuration diagram showing a conventional method for measuring coplanarity of a terminal.

【図6】図5中のカメラ59で得られた画像を示す図で
ある。
6 is a diagram showing an image obtained by a camera 59 in FIG.

【図7】図6の画像の2値化画像を示す図である。FIG. 7 is a diagram showing a binarized image of the image of FIG. 6;

【符号の説明】[Explanation of symbols]

1 被検査物 2 受け台 3 接触検出ユニット 4 距離検出ユニット 5 端子 6 パッド 7 パッド 51 被検査物 52 測定ステージ 53 基準平面 55,58 端子 59 カメラ 60 光源 DESCRIPTION OF SYMBOLS 1 Inspection object 2 Cradle 3 Contact detection unit 4 Distance detection unit 5 Terminal 6 Pad 7 Pad 51 Inspection object 52 Measurement stage 53 Reference plane 55, 58 Terminal 59 Camera 60 Light source

Claims (8)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 複数の端子を接触部が端子接触面上に在
るようにして設けた被検査物に対し前記端子接触面に平
行な接触検出面を有する接触検出ユニットを前記端子接
触面とは垂直な方向に移動させ、前記端子が前記接触検
出面と接触した時の前記接触検出ユニットの位置を測定
することを特徴とする端子のコプラナリティ測定方法。
1. A contact detection unit having a contact detection surface parallel to the terminal contact surface with respect to an inspection object provided with a plurality of terminals such that contact portions are located on the terminal contact surface. Moving the terminal in a vertical direction and measuring a position of the contact detection unit when the terminal comes into contact with the contact detection surface.
【請求項2】 前記接触検出面の前記複数の端子の接触
部それぞれに対応する位置に対をなす複数対のパッドが
設けられ、この対をなすパッドが前記端子の対応するも
のを介して導通したことを検出することにより、前記端
子の前記接触検出面との接触を検出することを特徴とす
る請求項1記載の端子のコプラナリティ測定方法。
2. A plurality of pairs of pads are provided at positions corresponding to the contact portions of the plurality of terminals on the contact detection surface, and the pads of the pair are electrically connected via corresponding ones of the terminals. 2. The terminal coplanarity measuring method according to claim 1, wherein a contact with the contact detection surface of the terminal is detected by detecting the contact.
【請求項3】 前記接触検出ユニットを前記複数の端子
を全てが前記接触検出面と接触していない位置から前記
複数の端子の全てが前記接触検出面と接触する位置まで
移動させて前記端子が前記端子接触面と接触した時の前
記接触検出ユニットの位置を測定することを特徴とする
請求項1又は2記載の端子のコプラナリティ測定方法。
3. The contact detection unit is moved from a position where all of the plurality of terminals are not in contact with the contact detection surface to a position where all of the plurality of terminals are in contact with the contact detection surface. The method for measuring coplanarity of a terminal according to claim 1, wherein a position of the contact detection unit when the terminal is in contact with the terminal contact surface is measured.
【請求項4】 前記接触検出ユニットを前記複数の端子
の全てが前記接触検出面に押されて弾性限度範囲内でた
わまされた位置から前記複数の端子の全てが前記接触検
出面と接触しない位置まで移動させて前記端子が前記端
子接触面と接触した時の前記接触検出ユニットの位置を
測定することを特徴とする請求項1又は2記載の端子の
コプラナリティ測定方法。
4. The contact detection unit according to claim 1, wherein all of the plurality of terminals contact the contact detection surface from a position where all of the plurality of terminals are pressed against the contact detection surface and are deflected within an elastic limit range. The method for measuring coplanarity of a terminal according to claim 1 or 2, wherein the position of the contact detection unit when the terminal comes into contact with the terminal contact surface is measured by moving the terminal to a non-contact position.
【請求項5】 前記端子が前記端子接触面に接触した時
の前記接触検出ユニットの位置から当該端子の前記端子
接触面に垂直な方向の位置を算出することを特徴とする
請求項1から4までのいずれかに記載された端子のコプ
ラナリティ測定方法。
5. The terminal according to claim 1, wherein a position of the terminal in a direction perpendicular to the terminal contact surface is calculated from a position of the contact detection unit when the terminal contacts the terminal contact surface. The method for measuring coplanarity of a terminal described in any of the above.
【請求項6】 前記端子のいずれか1つが前記接触検出
面に接触した時の前記接触検出ユニットの位置と前記端
子の全てが前記接触検出面に接触した時の前記接触検出
ユニットの位置との間の距離を前記端子接触面と垂直な
方向における最も下にある前記端子の接触部と最も上に
ある前記端子の接触部との間の距離として算出すること
を特徴とする請求項1から請求項5までのいずれかに記
載された端子のコプラナリティ測定方法。
6. A position of the contact detection unit when any one of the terminals contacts the contact detection surface and a position of the contact detection unit when all of the terminals contact the contact detection surface. The distance between the contact portions of the lowermost terminal in the direction perpendicular to the terminal contact surface and the contact portion of the uppermost terminal in a direction perpendicular to the terminal contact surface is calculated. Item 6. The method for measuring coplanarity of a terminal according to any one of Items 5 to 5.
【請求項7】 前記接触検出面の前記端子の接触部それ
ぞれに対応する部分又は前記パッドの前記端子接触面と
垂直な方向の位置のばらつきを予め求めておき、前記端
子が前記端子接触面と接触した時の前記接触検出ユニッ
トの位置を前記ばらつきで補正した値から当該端子接触
面に接触した端子の位置又は前記端子接触面の垂直な方
向における最も下にある前記端子の接触部と最も上にあ
る前記端子の接触部との間の距離を算出することを特徴
とする請求項5又は7記載の端子のコプラナリティ測定
方法。
7. Variations in positions of the contact detection surface corresponding to contact portions of the terminals or positions of the pads in a direction perpendicular to the terminal contact surfaces are determined in advance, and the terminals are connected to the terminal contact surfaces. From the value obtained by correcting the position of the contact detection unit at the time of contact with the variation, the position of the terminal contacting the terminal contact surface or the contact portion of the terminal at the bottom in the direction perpendicular to the terminal contact surface and the top. 8. The method for measuring the coplanarity of a terminal according to claim 5, wherein a distance between the terminal and a contact portion of the terminal is calculated.
【請求項8】 複数の端子を接触部が端子接触面に在る
ように設けた被検査物を保持する受け台と,前記端子接
触面と平行な接触検出面を有し、前記端子接触面と垂直
な方向に移動する接触検出ユニットと,前記接触検出面
に前記端子の接触部それぞれに対応する位置に対をなし
て設けられた複数対のパッドと,前記接触検出ユニット
の前記端子接触面と垂直な方向の位置を測定する距離検
出ユニットとを含み、対をなす前記パッドの導通により
対応する前記端子の前記接触検出面との接触を検出する
ことを特徴とする端子のコプラナリティ測定装置。
8. A terminal contact surface, comprising: a pedestal for holding an object to be inspected provided with a plurality of terminals such that contact portions are located on the terminal contact surface; and a contact detection surface parallel to the terminal contact surface. A contact detection unit that moves in a direction perpendicular to the terminal; a plurality of pairs of pads provided on the contact detection surface in pairs corresponding to contact portions of the terminals; and a terminal contact surface of the contact detection unit. And a distance detection unit for measuring a position in a direction perpendicular to the terminal, and detecting contact of the corresponding terminal with the contact detection surface by conduction of the pair of pads.
JP8925097A 1997-04-08 1997-04-08 Terminal coplanarity measuring method and apparatus Expired - Lifetime JP2954075B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8925097A JP2954075B2 (en) 1997-04-08 1997-04-08 Terminal coplanarity measuring method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8925097A JP2954075B2 (en) 1997-04-08 1997-04-08 Terminal coplanarity measuring method and apparatus

Publications (2)

Publication Number Publication Date
JPH10281748A JPH10281748A (en) 1998-10-23
JP2954075B2 true JP2954075B2 (en) 1999-09-27

Family

ID=13965522

Family Applications (1)

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Country Status (1)

Country Link
JP (1) JP2954075B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4660957B2 (en) * 2001-04-23 2011-03-30 イビデン株式会社 Inspection equipment for printed wiring boards
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Also Published As

Publication number Publication date
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