JP2920701B2 - Method and apparatus for developing resist - Google Patents

Method and apparatus for developing resist

Info

Publication number
JP2920701B2
JP2920701B2 JP3063894A JP6389491A JP2920701B2 JP 2920701 B2 JP2920701 B2 JP 2920701B2 JP 3063894 A JP3063894 A JP 3063894A JP 6389491 A JP6389491 A JP 6389491A JP 2920701 B2 JP2920701 B2 JP 2920701B2
Authority
JP
Japan
Prior art keywords
developing
resist
developing solution
developer
chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP3063894A
Other languages
Japanese (ja)
Other versions
JPH04276757A (en
Inventor
芳英 西山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Metal Mining Co Ltd
Original Assignee
Sumitomo Metal Mining Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Mining Co Ltd filed Critical Sumitomo Metal Mining Co Ltd
Priority to JP3063894A priority Critical patent/JP2920701B2/en
Publication of JPH04276757A publication Critical patent/JPH04276757A/en
Application granted granted Critical
Publication of JP2920701B2 publication Critical patent/JP2920701B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Photosensitive Polymer And Photoresist Processing (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、ICリードフレーム製
造におけるエッチング工程などにおいて、材料面の汚れ
がなく、レジストパターンの均一性が高い安定した現像
が、短時間に材料両面を同時に現像することができるレ
ジストの現像方法及びその装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to the development of an IC lead frame in an etching process and the like, in which a stable development with no contamination on the material surface and a high uniformity of the resist pattern can be performed simultaneously on both surfaces of the material in a short time. The present invention relates to a method for developing a resist and an apparatus therefor.

【0002】[0002]

【従来の技術】一般に、IC用リードフレーム製造のエ
ッチング工程においては、リードフレーム材料を選択エ
ッチングする場合、基板材上に、所定パターンを形成す
るための部分となるマスクとなるレジスト層を、塗布
し、これに所定パターンの露光を行ない、これを現像す
ることによってレジストのパターンを形成し、その後、
材料をエッチングすることが行なわれている。
2. Description of the Related Art Generally, in an etching process for manufacturing a lead frame for IC, when a lead frame material is selectively etched, a resist layer serving as a mask serving as a portion for forming a predetermined pattern is coated on a substrate material. Then, this is subjected to a predetermined pattern exposure, and by developing this, a resist pattern is formed,
Etching material has been performed.

【0003】近年、IC用リードフレームのパターン
は、微細化の一途をたどり、それに伴なって製造工程に
新規技術が採用されてきている。すなわち、たとえば、
微細化リードフレームパターンの形成に対応するため
に、高感度、高解像力のレジスト類及び露光機を使用し
て、レジストパターン形成の現像工程でパターンの解像
力が損なわれたり、パターンのばらつきが発生したりし
ないようにしている。
In recent years, the pattern of an IC lead frame has been steadily miniaturized, and accordingly, a new technology has been adopted in a manufacturing process. That is, for example,
In order to respond to the formation of miniaturized lead frame patterns, using high-sensitivity, high-resolution resists and exposure equipment, the resolution of the pattern is impaired during the development process of resist pattern formation, and pattern variations occur. Or not.

【0004】パターン形成の各工程のうち、現像を行な
う方法としては、従来、レジストを塗布し、露光した後
の材料(以下、単に材料という)を現像液が満たされた
槽中に浸漬する方法(以下、ディップ法という)、ある
いは、材料を横方向に搬送しながら現像液をスプレーや
シャワーによって材料に接触させる方法(以下、スプレ
ー法という)とがある。
As a method of developing in each of the steps of pattern formation, conventionally, a method of applying a resist and immersing a material after exposure (hereinafter simply referred to as a material) in a bath filled with a developer is known. (Hereinafter, referred to as a dip method), or a method in which a developer is brought into contact with a material by spraying or showering while transporting the material in a lateral direction (hereinafter, referred to as a spray method).

【0005】一般に、ディップ法では、材料の処理能力
が大きく、現像液温度を一定に保持し得、材料面内のパ
ターン形成の均一性が良いといった利点があるが、現像
液中へのレジストの混入などにより材料面に汚れが付き
易いためにパターン欠陥の発生が多く高品質のものが得
難く、現像液が劣化し易く、パターン寸法の制御が困難
であるという欠点がある。又、スプレー法では、材料面
に汚れが付き難いという利点があるが、材料の処理能力
が小さく、現像液温を一定に保持し難く、材料面内でス
プレーやシャワーの圧力あるいはノズルの状態が均一化
されないことが多く、現像むらを発生し易く、パターン
形成のばらつきが生ずるなどといった欠点がある。
In general, the dipping method has an advantage that the processing ability of the material is large, the temperature of the developing solution can be kept constant, and the uniformity of pattern formation in the surface of the material is good. Since the material surface is liable to be stained due to contamination or the like, pattern defects are often generated and it is difficult to obtain a high-quality product, the developer is easily deteriorated, and it is difficult to control the pattern size. The spray method has an advantage that the surface of the material is not easily stained, but the processing capability of the material is small, it is difficult to keep the temperature of the developer constant, and the spray or shower pressure or the state of the nozzle in the material surface is reduced. There are many drawbacks such as non-uniformity, easy development unevenness, and variations in pattern formation.

【0006】これらの欠点を改善し、良好なレジストパ
ターンを得ることができるレジストの現像方法として、
たとえば、第2図に示すように、試料保持枠11′中に
保持した試料12′をレジスト層16′を有する面を上
向きにして、搬送方向と直交する方向に傾斜させ、現像
室内へ連続的又は断続的に送り込み、ノズル9′−1か
ら吐出され層流発生部14′で層流13′とされ、レジ
スト層16′表面に沿って薄い層流13′として流下す
る現像液17′で現像する方法(特公平1−44011
号公報)が開示されている。
[0006] As a method of developing a resist capable of improving these disadvantages and obtaining a good resist pattern,
For example, as shown in FIG. 2, a sample 12 'held in a sample holding frame 11' is inclined in a direction perpendicular to the transport direction with the surface having the resist layer 16 'facing upward, and is continuously introduced into the developing chamber. Alternatively, the developer is intermittently fed, is discharged from the nozzle 9'-1, is formed into a laminar flow 13 'at the laminar flow generating portion 14', and is developed with the developing solution 17 'flowing down as a thin laminar flow 13' along the surface of the resist layer 16 '. Method (Japanese Patent Publication No. 1-444011)
Gazette).

【0007】[0007]

【発明が解決しようとする課題】しかしながら、特公平
1−44011号公報記載の方法は、一工程において片
面だけしか現像処理ができず、両面現像を行なうために
は、試料の傾斜方向を反転させ、前記の操作を繰り返す
といったような片面ずつ現像を行なう必要があるといっ
た問題がある。
However, in the method described in Japanese Patent Publication No. 144401/1989, development processing can be performed only on one side in one step, and in order to perform double-sided development, the inclination direction of the sample is reversed. There is a problem that it is necessary to perform the development one by one, such as repeating the above operation.

【0008】本発明は、従来法の欠点である材料面への
汚れの付着をなくし、現像液の劣化を防ぎ、処理能力を
高め、現像液温度を安定に保ち、パターン形成のばらつ
きを除去し、1回の処理で両面同時に現像し得て高品質
な微細化パターンを連続的に得ることができる現像方法
とその方法を施行するのに好適な装置を提供することを
目的とするものである。
The present invention eliminates the disadvantages of the conventional method, namely, the adhesion of dirt to the material surface, the prevention of deterioration of the developer, the improvement of the processing capability, the stable temperature of the developer, and the elimination of variations in pattern formation. It is an object of the present invention to provide a developing method capable of continuously developing high-quality miniaturized patterns by simultaneously developing both surfaces in one processing, and an apparatus suitable for performing the method. .

【0009】[0009]

【課題を解決するための手段】本発明者は、前記問題を
解決し、前記目的を達成するために研究を重ねた結果、
材料を現像液中に浸漬した後、垂直方向に搬送し、この
搬送中に複数段で両側から現像液を吹き付けるようにす
ることによって目的を達し得ることを見出して本発明を
完成するに至った。すなわち、本発明の第1の実施態様
は、露光処理されたレジスト層を両面に有する材料の連
続現像処理において、前記材料を現像液中に浸漬した
後、垂直方向に搬送し、垂直搬送中に複数段にスプレー
又はシャワー状態で循環現像液及び新現像液を前記材料
の両面からレジスト面上に吹き付けると共に、少くとも
最上段で吹き付ける現像液を新液とし、垂直引き上げ搬
送状態でレジストパターンを前記材料の両面に連続的に
同時に形成するレジストの現像方法であり、第2の実施
態様は、現像液を収容した現像室、該現像室内に設けた
垂直搬送用ローラ、現像室内に上下関係に複数段に水平
に材料の両面に対向して設けられかつ少くとも最上段を
新液の現像液とした1対のノズルとを設けてなるレジス
トの現像装置である。
Means for Solving the Problems The present inventor has conducted studies to solve the above problems and achieve the above object, and as a result,
The present invention was completed by immersing the material in the developer and then transporting the material in the vertical direction, and finding that the object could be achieved by spraying the developer from both sides in a plurality of stages during this transport. . That is, the first embodiment of the present invention is a method of continuously developing a material having an exposed resist layer on both surfaces, after immersing the material in a developer, transporting the material in a vertical direction, and during the vertical transport. While spraying a circulating developer and a new developer onto the resist surface from both sides of the material in a spray or shower state in a plurality of stages, the developing solution sprayed at least on the uppermost stage is a new solution, and the resist pattern is vertically lifted and transported. The second embodiment is a method of developing a resist that is simultaneously and continuously formed on both surfaces of a material. In a second embodiment, a developing chamber containing a developing solution, a vertical conveying roller provided in the developing chamber, and a plurality of This is a resist developing device which is provided with a pair of nozzles which are horizontally provided on both sides of the material and opposed to both surfaces of the material, and at least the uppermost part is a new developing solution.

【0010】[0010]

【作用】本発明はこのように、現像液中を搬送して現像
し、さらに、垂直方向にローラによって転位して材料の
両面から現像液を吹き付けるように設けた複数のノズル
から現像液を吹き付けて現像するものであり、とくに、
最上段のノズルからは新らしい現像液を吹き付けて現像
する方法及び装置であるので汚れのない鮮明なパターン
を1回の処理で両面同時に現像することができるもので
ある。したがって、現像液の温度と現像能力とを一定に
保ちつつスプレー圧力を任意に制御できるので、現像条
件の再現性がよい。又、材料両面に現像液を吹き付ける
中を垂直に材料を引き上げるので、材料内、材料間での
レジストパターンの均一性が高い。さらに、現像の仕上
げに新らしい現像液を吹き付けるので材料に汚れが付着
しないものである。
According to the present invention, as described above, the developer is transported in the developer and developed, and the developer is sprayed from a plurality of nozzles provided so as to be displaced by a roller in the vertical direction and spray the developer from both sides of the material. And develop, especially
Since a new developing solution is sprayed from the uppermost nozzle and developed, a clear pattern without stain can be developed simultaneously on both sides in one process. Therefore, since the spray pressure can be arbitrarily controlled while keeping the temperature of the developer and the developing ability constant, the reproducibility of the developing conditions is good. Further, since the material is pulled up vertically while the developing solution is sprayed on both surfaces of the material, the uniformity of the resist pattern within the material and between the materials is high. Further, since a new developing solution is sprayed on the finish of development, no stain is attached to the material.

【0011】[0011]

【実施例】次に、添付の図面に基づいて本発明の実施例
を述べる。
Next, an embodiment of the present invention will be described with reference to the accompanying drawings.

【0012】図1は、本発明装置の一実施例を示す説明
用概念図である。
FIG. 1 is an explanatory conceptual diagram showing an embodiment of the apparatus of the present invention.

【0013】1は、現像室であって、横長の箱形をした
水平室1aと、水平室1aの一方側に縦長に設置された
垂直室1bからなり、現像室1には、現像液2が収容さ
れていてディップ現像を行ない、垂直室1bでは、後述
する垂直搬送中にスプレー現像を行ない得るようになっ
ている。3は、材料であって、基材両面に塗布されたレ
ジストが前工程ですでに露光されていて、水平室1a中
に設置されている1組のそれぞれ1対の水平搬送用ロー
ラ11a及び11bによって略水平に支持され、水平室
1a中の現像液2の中に浸漬されて一部現像されながら
略水平方向に搬送され、垂直室1b側に設けられた水平
搬送用ローラ11bの直上に間隔をおいて垂直室1b内
に設けられた1対の垂直搬送用ローラ12と水平搬送用
ローラ11bとによって支持されて垂直上方向に転位さ
れて搬送されるようになっている。4は、循環液用ノズ
ルであって、現像室1の垂直室1b内に、垂直上方向に
搬送される材料3の両面に一対として上下関係で複数段
に設けられ、水平室1a内の現像液2をポンプ5によっ
て抜き出してバルブ8と圧力計9とによってそれぞれ流
量と吹き付け圧力とを調節して材料3の両面に吹き付け
て両面同時に現像し得るようにされている。6は、新液
用ノズルであって、循環液用ノズル4の上側に循環液用
ノズル4と同様に設けられ、貯槽(図示せず)から新ら
しい現像液を新現像液管7から温度制御部16によって
液温を所定温度に調節し、バルブ8と圧力計9によって
流量吹き付け圧力を調節して材料3の両面に吹き付け
て、材料3の現像を仕上げるとともに材料3面に付着し
た汚れを除去し、現像仕上げ面を清浄に保持し得るよう
にする。10は、現像液排出口であって、新液用ノズル
6から吹き付けられ、水平室1a中の現像液2中へ流入
する新らしい現像液量に相当する量の現像液2を、たと
えばオーバーフローによって排出し得るようになってい
る。16は、温度制御部であって、たとえば、ヒーター
13、温度計14、温調計15などからなり、水平室1
a及び新現像液管7に設けられ、それぞれの現像液の温
度制御を行なうようになっている。
Reference numeral 1 denotes a developing chamber, which comprises a horizontal chamber 1a having a horizontally long box shape, and a vertical chamber 1b vertically installed on one side of the horizontal chamber 1a. Is accommodated in the vertical chamber 1b so that spray development can be performed during vertical transport described later. Reference numeral 3 denotes a material, in which a resist applied to both surfaces of the base material has already been exposed in the previous process, and a pair of a pair of horizontal transport rollers 11a and 11b installed in the horizontal chamber 1a. , Is immersed in the developing solution 2 in the horizontal chamber 1a and is transported in a substantially horizontal direction while being partially developed, and is directly above a horizontal transport roller 11b provided on the vertical chamber 1b side. At this time, a pair of vertical transfer rollers 12 and a horizontal transfer roller 11b provided in the vertical chamber 1b support and are displaced vertically upward and transferred. Reference numeral 4 denotes a circulating liquid nozzle, which is provided in a vertical chamber 1b of the developing chamber 1 in plural stages in a vertical relationship on both surfaces of the material 3 conveyed vertically upward, and is provided in a plurality of stages in the horizontal chamber 1a. The liquid 2 is drawn out by the pump 5, and the flow rate and the spraying pressure are adjusted by the valve 8 and the pressure gauge 9, respectively, so that the liquid 2 can be sprayed on both sides and the both sides can be developed simultaneously. Reference numeral 6 denotes a new liquid nozzle, which is provided above the circulating liquid nozzle 4 in the same manner as the circulating liquid nozzle 4, and controls the temperature of a new developing liquid from a storage tank (not shown) through a new developing liquid pipe 7. The liquid temperature is adjusted to a predetermined temperature by the part 16, the flow rate is adjusted by the valve 8 and the pressure gauge 9, and the spray pressure is adjusted to spray on both surfaces of the material 3, thereby completing the development of the material 3 and removing dirt attached to the surface of the material 3. So that the developed surface can be kept clean. Reference numeral 10 denotes a developing solution discharge port for discharging an amount of the developing solution 2 sprayed from the new solution nozzle 6 and corresponding to a new developing solution amount flowing into the developing solution 2 in the horizontal chamber 1a, for example, by overflow. It can be discharged. Reference numeral 16 denotes a temperature control unit, which includes, for example, a heater 13, a thermometer 14, a temperature controller 15, and the like.
a and the new developing solution pipe 7 to control the temperature of each developing solution.

【0014】上述した実施例で示した本発明装置を使用
して、現像液温35.0℃、吹き付け圧力0.8Kg/
cm、新現像液供給量10l/分、現像時間50秒間
に設定して現像処理を行なった。すなわち、両面にレジ
ストを塗布し、前工程で露光処理をうけた材料3を、現
像室1の水平室1a内へ水平搬送用ローラ11a、11
bによって略水平に支持されて現像液2中を略水平に搬
送されて一部現像され、水平搬送用ローラ11b及び垂
直搬送用ローラ12によって搬送方向を垂直上方向に転
位されて垂直室1b内を垂直上方に搬送される。この垂
直に引き上げられて搬送される間に、水平室1aからポ
ンプ5によって送られバルブ8と圧力計9とによって所
定の流量と圧力に調節された現像液2が、複数段に設け
られた一対の循環液用ノズル4から材料3の両面に同時
に吹き付けられて現像が進行する。しかして、最上段に
設けられた新液用ノズル6からは、新らしい現像液が、
温度制御部16で所定液温に調整され、バルブ8、圧力
計9によって所定の流量、圧力に調整されて材料3の両
面に同時に吹き付けられて現像を完結するとともに、材
料3面は付着している汚れを除去され、現像仕上げ面を
清浄にされて現像室1から次工程へ搬送される。現像液
2は、新液用ノズル6から供給される新らしい現像液の
量に相当する量が現像液排出口10から排出される。
Using the apparatus of the present invention described in the above embodiment, the developer temperature was 35.0 ° C. and the spray pressure was 0.8 kg / g.
The developing process was carried out by setting the developing solution at 10 cm 2 , the supply amount of the new developing solution was 10 l / min, and the developing time was 50 seconds. That is, the material 3 that has been coated with a resist on both sides and has been exposed in the previous process is transferred into the horizontal chamber 1a of the developing chamber 1 by horizontal transport rollers 11a,
b, is transported substantially horizontally in the developing solution 2 and partially developed, and is displaced vertically upward by the horizontal transport roller 11b and the vertical transport roller 12 so as to be in the vertical chamber 1b. Is transported vertically upward. While being vertically lifted and transported, the developing solution 2 sent from the horizontal chamber 1a by the pump 5 and adjusted to a predetermined flow rate and pressure by the valve 8 and the pressure gauge 9 is provided in a plurality of stages. Are sprayed onto both surfaces of the material 3 at the same time from the circulating liquid nozzle 4 and the development proceeds. Thus, from the new liquid nozzle 6 provided at the top, a new developing liquid
The temperature is adjusted to a predetermined liquid temperature by the temperature control unit 16, adjusted to a predetermined flow rate and pressure by the valve 8 and the pressure gauge 9, and simultaneously sprayed onto both surfaces of the material 3 to complete the development, and the material 3 surface adheres. The remaining contaminants are removed, and the developed surface is cleaned, and then transferred from the developing chamber 1 to the next step. The amount of the developing solution 2 corresponding to the amount of the new developing solution supplied from the new solution nozzle 6 is discharged from the developing solution discharge port 10.

【0015】現像終了後、試料表面を観察したところ、
汚れや現像むらは全く認められず、レジストパターン形
状も良好であった。又、現像液温度の変動は±0.3℃
以内で十分安定しており、パターン寸法のばらつきは材
料内、材料間、表裏ともに0.5μm以内であり、高い
均一性のパターンが連続的に得られていることが認めら
れた。さらに、現像時間は、材料3の搬送速度によって
調整できるが、50秒間で現像は完了しており、従来法
と比較して短かく、十分大きな処理能力が得られること
が認められた。
After the development was completed, the surface of the sample was observed.
No staining or uneven development was observed, and the resist pattern shape was also good. Fluctuation of developer temperature is ± 0.3 ℃
Within this range, the pattern dimensional variation was within 0.5 μm within the material, between the materials, and on both sides, and it was confirmed that a highly uniform pattern was continuously obtained. Further, although the development time can be adjusted by the transport speed of the material 3, the development was completed in 50 seconds, which was shorter than the conventional method, and it was recognized that a sufficiently large processing capacity was obtained.

【0016】[0016]

【発明の効果】本発明は、両面にレジストを塗布し、露
光した材料を、まず現像液中を搬送した後、垂直方向に
転位させ、垂直に引き上げて搬送する途中で複数段で現
像液を両面に吹き付けて両面同時に現像し、とくに最上
段で新しい現像液を吹き付けるようにしたので、安定し
た現像条件が得られ、レジストパターンの均一性が高
く、材料の汚れがない製品を、1回の現像処理によっ
て、現像時間を短くし得、両面を同時に現像し得て、連
続的に製造し得るものであって顕著な効果が認められ
る。
According to the present invention, the resist is applied to both sides, and the exposed material is first transported in a developing solution, then displaced in the vertical direction, pulled up vertically and transported in a plurality of stages during the transport. Since both sides are sprayed and the both sides are developed at the same time and a new developing solution is sprayed especially on the top stage, stable developing conditions are obtained, the uniformity of the resist pattern is high, and the product with no material contamination By the development treatment, the development time can be shortened, both sides can be simultaneously developed, and the production can be continuously performed, and a remarkable effect is recognized.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明装置の一実施例を示す説明用概略図であ
る。
FIG. 1 is an explanatory schematic view showing an embodiment of the apparatus of the present invention.

【図2】従来例の一実施例を示す側断面図である。FIG. 2 is a side sectional view showing one embodiment of a conventional example.

【符号の説明】[Explanation of symbols]

1 現像室 1a 水平室 1b 垂直室 2 現像液 3 材料 4 循環液用ノズル 6 新液用ノズル 11a、11b 水平搬送用ローラ 12 垂直搬送用ローラ 16 温度制御部 REFERENCE SIGNS LIST 1 developing chamber 1a horizontal chamber 1b vertical chamber 2 developer 3 material 4 circulating liquid nozzle 6 new liquid nozzle 11a, 11b horizontal transport roller 12 vertical transport roller 16 temperature controller

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 露光処理されたレジスト層を両面に有す
る材料の連続現像処理において、前記材料を現像液中に
浸漬した後、垂直方向に搬送し、垂直搬送中に複数段に
スプレー又はシャワー状態で現像液を前記材料の両面か
らレジスト面上に吹き付けると共に、少くとも最上段で
吹き付ける現像液を新液とし、垂直引き上げ搬送状態で
レジストパターンを前記材料の両面に連続的に同時に形
成することを特徴とするレジストの現像方法。
1. In a continuous development process of a material having an exposed resist layer on both surfaces, the material is immersed in a developer and then conveyed vertically, and sprayed or showered in a plurality of stages during the vertical conveyance. Spraying a developing solution onto the resist surface from both sides of the material at the same time, and using a developing solution sprayed at least on the uppermost stage as a new solution, and forming a resist pattern on both sides of the material continuously and simultaneously in a vertically pulled and conveyed state. Characteristic method of developing resist.
【請求項2】 現像液を収容した現像室、該現像室内に
設けた垂直搬送用ローラ、現像室内に上下関係に複数段
に水平に材料の両面に対向して設けられかつ少くとも最
上段を新液の現像液用とした1対のノズルとを設けてな
ることを特徴とするレジストの現像装置。
2. A developing chamber containing a developing solution, a vertical conveying roller provided in the developing chamber, and a plurality of vertical stages in the developing chamber. A resist developing device comprising a pair of nozzles for a new developing solution.
JP3063894A 1991-03-05 1991-03-05 Method and apparatus for developing resist Expired - Lifetime JP2920701B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3063894A JP2920701B2 (en) 1991-03-05 1991-03-05 Method and apparatus for developing resist

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3063894A JP2920701B2 (en) 1991-03-05 1991-03-05 Method and apparatus for developing resist

Publications (2)

Publication Number Publication Date
JPH04276757A JPH04276757A (en) 1992-10-01
JP2920701B2 true JP2920701B2 (en) 1999-07-19

Family

ID=13242466

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3063894A Expired - Lifetime JP2920701B2 (en) 1991-03-05 1991-03-05 Method and apparatus for developing resist

Country Status (1)

Country Link
JP (1) JP2920701B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6421075B2 (en) * 2015-05-11 2018-11-07 富士フイルム株式会社 Developing apparatus, developing method, pattern forming apparatus, and pattern forming method
JP7101036B2 (en) * 2018-04-26 2022-07-14 東京エレクトロン株式会社 Treatment liquid supply device and treatment liquid supply method

Also Published As

Publication number Publication date
JPH04276757A (en) 1992-10-01

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