JP2868461B2 - Resist coating equipment - Google Patents

Resist coating equipment

Info

Publication number
JP2868461B2
JP2868461B2 JP13667396A JP13667396A JP2868461B2 JP 2868461 B2 JP2868461 B2 JP 2868461B2 JP 13667396 A JP13667396 A JP 13667396A JP 13667396 A JP13667396 A JP 13667396A JP 2868461 B2 JP2868461 B2 JP 2868461B2
Authority
JP
Japan
Prior art keywords
substrate
resist
turntable
thinner
resist coating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP13667396A
Other languages
Japanese (ja)
Other versions
JPH09320940A (en
Inventor
幸一郎 潟山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KAGOSHIMA NIPPON DENKI KK
Original Assignee
KAGOSHIMA NIPPON DENKI KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KAGOSHIMA NIPPON DENKI KK filed Critical KAGOSHIMA NIPPON DENKI KK
Priority to JP13667396A priority Critical patent/JP2868461B2/en
Publication of JPH09320940A publication Critical patent/JPH09320940A/en
Application granted granted Critical
Publication of JP2868461B2 publication Critical patent/JP2868461B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Coating Apparatus (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明はレジスト塗布装置に
関し、特に半導体装置や液晶表示装置の製造工程で使用
されるレジスト塗布装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a resist coating apparatus, and more particularly, to a resist coating apparatus used in a manufacturing process of a semiconductor device or a liquid crystal display.

【0002】[0002]

【従来の技術】従来のレジスト塗布装置では、まず、図
4(a)に示すように、回転台3の上に置かれた基板1
を基板吸引口10から吸引して固定し回転台3を回転す
ることにより基板1上に塗布されたレジスト膜8を均一
に広げる。次に図4(b)に示すように、基板1の周辺
に配置されているレジスト除去用シンナーノズル11か
らシンナーを供給し、基板1の上下面及び端面部分につ
いた不要なレジスト膜8を除去する。このとき、図4
(c)に示すように、基板1と押え部品4との間には間
隙ができるので、この間隙にレジスト膜8が流入してし
まう。
2. Description of the Related Art In a conventional resist coating apparatus, first, as shown in FIG.
The resist film 8 applied on the substrate 1 is uniformly spread by rotating the turntable 3 while sucking and fixing the resist from the substrate suction port 10. Next, as shown in FIG. 4B, a thinner is supplied from a thinner nozzle 11 for resist removal disposed around the substrate 1 to remove unnecessary resist films 8 on the upper and lower surfaces and the end surface of the substrate 1. I do. At this time, FIG.
As shown in (c), a gap is formed between the substrate 1 and the holding component 4, and the resist film 8 flows into this gap.

【0003】この欠点を改善するために、特開昭61−
5536号公報では、図5に示すように、回転台3の上
に置かれた基板1は、基板吸着口10によって吸着固定
され、その後、押え部品4で基板1の表面の一部が固定
される。次に、基板1上にレジストを滴下し、回転台3
を回転することによってレジスト膜を均一に広げる。と
ころが、図6(a),(b)に示す水平方向への移動方
式及び図6(c)に示す倒立方式のいずれの方式をとっ
ても、基板1と押え部品4の間には間隙ができ、この間
隙にレジストが流入する。
In order to improve this disadvantage, Japanese Patent Application Laid-Open No.
In Japanese Patent No. 5536, as shown in FIG. 5, the substrate 1 placed on the turntable 3 is fixed by suction through the substrate suction port 10, and then, a part of the surface of the substrate 1 is fixed by the holding component 4. You. Next, a resist is dropped on the substrate 1 and the turntable 3
Is rotated to spread the resist film uniformly. However, in any of the horizontal movement method shown in FIGS. 6A and 6B and the inverted method shown in FIG. 6C, a gap is formed between the substrate 1 and the holding component 4. The resist flows into this gap.

【0004】[0004]

【発明が解決しようとする課題】第1の問題点は、従来
の技術においては、レジストを均一に広げる時に、基板
の周辺部分にレジストが付かないようにすることであ
る。その理由は、周辺部分のレジスト除去をレジスト膜
を均一に広げた後で除去するため、工程数が増えて生産
性が低下するためである。
A first problem in the prior art is that the resist is not applied to the peripheral portion of the substrate when the resist is uniformly spread. The reason for this is that since the resist is removed after the resist film is uniformly spread over the peripheral portion, the number of steps is increased and the productivity is reduced.

【0005】第2の問題点は、従来の技術においては、
基板周辺をマスクする押え部品と基板との微小な間隙に
レジストが入ることである。その理由は、機械的なシー
ルでは、完全に密着シールできないからである。
[0005] The second problem is that in the prior art,
That is, the resist enters into a minute gap between the substrate and a pressing component that masks the periphery of the substrate. The reason is that a mechanical seal cannot completely seal the contact tightly.

【0006】本発明の目的は、基板の周辺に不要なレジ
ストが付着することを防止する機能と、押え部品を自己
洗浄する機能とを有することにより、製品の品質向上
と、生産性を向上することである。
An object of the present invention is to improve the quality of a product and improve productivity by having a function of preventing unnecessary resist from adhering to the periphery of a substrate and a function of self-cleaning a holding part. That is.

【0007】[0007]

【課題を解決するための手段】本発明の特徴は、回転台
上に基板を支持固定しレジスト膜を形成するレジスト塗
布装置において、前記回転台表面から突出し前記基板を
支える複数のピンと、前記回転台と前記基板との間に形
成される空間部に不活性ガスを流し込む手段と、前記回
転台周囲に開閉自在な機構により前記基板の全ての周辺
部分を押圧する押え部品と備えるレジスト塗布装置であ
また、前記押え部品の上下両面にシンナーを供給す
るシンナーノズルを備えることが望ましい。
Means for Solving the Problems The feature of the present invention, in the resist coating apparatus for forming a support fixed to the resist film of the substrate on the turntable, the protruding substrate from the turntable surface
A plurality of supporting pins and a shape between the turntable and the substrate.
Means for flowing a space to the inert gas is made, all the pressing parts and comprises Ru resist coating unit der for pressing the peripheral portion of the substrate by openable mechanisms to the rotary table around
You . In addition, thinner is supplied to both upper and lower surfaces of the holding part.
It is desirable to have a thinner nozzle.

【0008】本発明のレジスト塗布装置によれば、基板
1は、回転台3の上に配した複数のピン2の上に置かれ
た後押え部品4で上方から固定される。その後、基板1
とピン2及び押え部品4の間にできる空間に不活性ガス
注入口5からガスを流し、基板1と押え部品4の間にで
きる微小な間隙をシールする。ここで、基板1の上にレ
ジストを滴下し、回転台3を回転させレジスト供給ノズ
ル7からレジストを均一に広げる。最後に、押え部品4
を開き、基板1を取り出した後で、押え部品4の上下部
の位置に配したシンナーノズル6よりシンナー9を流し
ながら回転台3を回転させて押え部品4を洗浄する。
According to the resist coating apparatus of the present invention, the substrate 1 is placed on the plurality of pins 2 arranged on the turntable 3 and then fixed from above by the pressing component 4. Then, the substrate 1
Gas flows from the inert gas inlet 5 into the space formed between the substrate 1 and the pin 2 and the holding part 4 to seal a small gap formed between the substrate 1 and the holding part 4. Here, a resist is dropped on the substrate 1 and the turntable 3 is rotated to spread the resist uniformly from the resist supply nozzle 7. Finally, presser part 4
After the substrate 1 is taken out, the turntable 3 is rotated while flowing the thinner 9 from the thinner nozzle 6 disposed at the upper and lower positions of the presser component 4 to wash the presser component 4.

【0009】[0009]

【発明の実施の形態】次に本発明の実施の形態について
図面を参照して説明する。
Embodiments of the present invention will now be described with reference to the drawings.

【0010】図1は本発明の実施の形態のレジスト塗布
装置の一実施例の斜視図、図2(a),(b)は図1の
A−A線断面図及びその周辺部の部分拡大断面図であ
る。本発明の実施の形態のレジスト塗布装置の一実施例
は、図1及び図2(a),(b)に示すように、複数の
ピン2を有する回転台3と、基板1の周辺部の全周の全
てを押える押え部品4と、この押え部品4と複数のピン
2で基板1を挟み込んだ時にできる空間に不活性ガスを
注入する不活性ガス注入口5を有している。基板1は、
回転台3上に設けられたピン2の上に載置された後、押
え部品4が破線の位置から動いて回転台3上のピン2と
で基板1を固定する。この時にできる回転台3と基板1
の空間に不活性ガス注入口5から不活性ガスを流し込む
ことにより、押え部品4と基板1の間隙に不活性ガスが
充填されているため、この間隙にレジストが流入するこ
とはない。
FIG. 1 is a perspective view of an example of a resist coating apparatus according to an embodiment of the present invention. FIGS. 2A and 2B are cross-sectional views taken along the line AA of FIG. It is sectional drawing. As shown in FIGS. 1 and 2A and 2B, an example of a resist coating apparatus according to an embodiment of the present invention includes a turntable 3 having a plurality of pins 2 and a peripheral portion of a substrate 1. It has a holding component 4 for holding the entire circumference, and an inert gas inlet 5 for injecting an inert gas into a space formed when the substrate 1 is sandwiched between the holding component 4 and a plurality of pins 2. Substrate 1
After being placed on the pins 2 provided on the turntable 3, the holding component 4 moves from the position indicated by the broken line and fixes the substrate 1 with the pins 2 on the turntable 3. Turntable 3 and substrate 1 formed at this time
By flowing the inert gas from the inert gas injection port 5 into the space, the space between the holding component 4 and the substrate 1 is filled with the inert gas, so that the resist does not flow into this space.

【0011】図3は本発明の実施の形態の一実施例の洗
浄動作を説明する図1のA−A線断面図である。図3に
示すように、押え部品4に付着したレジスト膜8は、シ
ンナーノズル6より供給されるシンナー10によって洗
浄する。この時に、押え部品4に均一にシンナー9が供
給されるように、回転台3の回転数と同期してシンナー
ノズル6を左右に移動させ、押え部品4に付着したレジ
スト膜8を外側へ排出する。
FIG. 3 is a sectional view taken along the line AA of FIG. 1 for explaining the cleaning operation of one embodiment of the embodiment of the present invention. As shown in FIG. 3, the resist film 8 adhered to the pressing component 4 is cleaned by a thinner 10 supplied from a thinner nozzle 6. At this time, the thinner nozzle 6 is moved to the left and right in synchronization with the rotation speed of the turntable 3 so that the thinner 9 is uniformly supplied to the pressing part 4, and the resist film 8 attached to the pressing part 4 is discharged to the outside. I do.

【0012】次に本発明の実施の形態のレジスト塗布装
置の動作について説明する。まず、押え部品4を開いた
状態で基板1を回転台3の上に載置する。次に、押え部
品4を閉じて基板1の周辺部を押え、不活性ガス注入口
5より不活性ガスを注入する。これにより、基板1と押
え部品4及び押え部品4同志の間隙を不活性ガスで充填
する。この状態で、レジスト供給ノズル7よりレジスト
を基板1の表面に滴下し、回転台3を回転させてレジス
ト膜8を均一に広げる。中央に滴下したレジストは、回
転台3の回転につれて基板の周辺部に広がるが、基板1
と押え板4の間はガスで充填されているので入り込めな
い。従って、押え部品4の上側テーパー部を通り基板1
の端面や裏面に回り込むことなく外部へ飛ばされる。次
に、レジスト膜8が均一に広がった後、押え部品4を開
いて基板1を取り出す。
Next, the operation of the resist coating apparatus according to the embodiment of the present invention will be described. First, the substrate 1 is placed on the turntable 3 with the holding part 4 opened. Next, the holding part 4 is closed to hold the periphery of the substrate 1, and an inert gas is injected from the inert gas inlet 5. Thus, the gap between the substrate 1 and the holding component 4 and between the holding components 4 is filled with the inert gas. In this state, a resist is dropped from the resist supply nozzle 7 onto the surface of the substrate 1 and the turntable 3 is rotated to spread the resist film 8 evenly. The resist dropped at the center spreads around the substrate as the turntable 3 rotates.
And the presser plate 4 are filled with gas and cannot enter. Accordingly, the substrate 1 passes through the upper tapered portion of the holding component 4.
It is blown out without going around the end surface or back surface. Next, after the resist film 8 has spread uniformly, the holding component 4 is opened and the substrate 1 is taken out.

【0013】さらに、シンナーノズル6よりシンナー9
を押え部品4の表裏に供給し、押え部品4を開いたまま
回転台3を再び回転させて押え部品4に付着したレジス
ト膜8を除去する。この時、シンナノズル6は、押え部
品4の先端部にシンナー9を供給するように、回転台3
と同期を取って左右に移動させる。
Further, the thinner 9 is supplied from the thinner nozzle 6.
Is supplied to the front and back of the holding part 4, and the turntable 3 is rotated again with the holding part 4 open to remove the resist film 8 attached to the holding part 4. At this time, the thinner nozzle 6 rotates the turntable 3 so as to supply the thinner 9 to the front end of the holding part 4.
Synchronize with and move left and right.

【0014】[0014]

【発明の効果】第1の効果は、基板の端面,裏面にレジ
ストが付着しないということである。その理由は、基板
の周辺部を押え、さらに、レジストの進入を防ぐ為の不
活性ガスを使用するからである。
The first effect is that the resist does not adhere to the end face and the back face of the substrate. The reason is that an inert gas is used to hold down the peripheral portion of the substrate and to prevent the resist from entering.

【0015】第2の効果は、機構部に付着した不要なレ
ジストを、シンナーにより自己洗浄できるということで
ある。その理由は、周辺部の押え部品を分割化し、全開
できる構造にしてあるからである。
The second effect is that unnecessary resist adhering to the mechanism can be self-cleaned by a thinner. The reason for this is that the holding part in the peripheral part is divided so as to be fully open.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態のレジスト塗布装置の一実
施例の斜視図である。
FIG. 1 is a perspective view of an example of a resist coating apparatus according to an embodiment of the present invention.

【図2】(a),(b)は図1のA−A線断面図及びそ
の周辺部の部分拡大断面図である。
2A and 2B are a cross-sectional view taken along line AA of FIG. 1 and a partially enlarged cross-sectional view of a peripheral portion thereof.

【図3】本発明の実施の形態の一実施例の洗浄動作を説
明する図1のA−A線断面図である。
FIG. 3 is a sectional view taken along the line AA of FIG. 1 for explaining a cleaning operation of one example of the embodiment of the present invention.

【図4】(a)〜(c)は従来のレジスト塗布方法を説
明する断面図である。
FIGS. 4A to 4C are cross-sectional views illustrating a conventional resist coating method.

【図5】従来のレジスト塗布装置の一例の斜視図であ
る。
FIG. 5 is a perspective view of an example of a conventional resist coating apparatus.

【図6】図6(a)〜(c)は図5の押え部品の動作を
説明する側面図である。
6 (a) to 6 (c) are side views for explaining the operation of the pressing part of FIG.

【符号の説明】[Explanation of symbols]

1 基板 2 ピン 3 回転台 4 押え部品 5 不活性ガス注入口 6 シンナーノズル 7 レジスト供給ノズル 8 レジスト膜 9 シンナー 10 基板吸着口 11 レジスト除去用シンナーノズル DESCRIPTION OF SYMBOLS 1 Substrate 2 Pin 3 Turntable 4 Holding part 5 Inert gas injection port 6 Thinner nozzle 7 Resist supply nozzle 8 Resist film 9 Thinner 10 Substrate suction port 11 Thinner nozzle for resist removal

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.6,DB名) H01L 21/027 B05C 11/08 G03F 7/16 H01L 21/68 ──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. 6 , DB name) H01L 21/027 B05C 11/08 G03F 7/16 H01L 21/68

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 回転台上に基板を支持固定しレジスト膜
を形成するレジスト塗布装置において、前記回転台表面
から突出し前記基板を支える複数のピンと、前記回転台
と前記基板との間に形成される空間部に不活性ガスを流
し込む手段と、前記回転台周囲に開閉自在な機構により
前記基板の全ての周辺部分を押圧する押え部品と備える
ことを特徴とするレジスト塗布装置。
1. A resist coating apparatus for supporting and fixing a substrate on a turntable to form a resist film.
A plurality of pins projecting from the
Flowing an inert gas into the space formed between
Means Komu to, resist coating apparatus, characterized in that it comprises all of the pressing part for pressing the peripheral portion of the substrate by openable mechanism on the turntable periphery.
【請求項2】 前記押え部品の上下両面にシンナーを供
給するシンナーノズルを備えることを特徴とする請求項
1記載のレジスト塗布装置。
2. A thinner is provided on both upper and lower surfaces of the holding part.
The resist coating apparatus according to claim 1, further comprising a thinner nozzle for supplying the resist.
JP13667396A 1996-05-30 1996-05-30 Resist coating equipment Expired - Fee Related JP2868461B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13667396A JP2868461B2 (en) 1996-05-30 1996-05-30 Resist coating equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13667396A JP2868461B2 (en) 1996-05-30 1996-05-30 Resist coating equipment

Publications (2)

Publication Number Publication Date
JPH09320940A JPH09320940A (en) 1997-12-12
JP2868461B2 true JP2868461B2 (en) 1999-03-10

Family

ID=15180808

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13667396A Expired - Fee Related JP2868461B2 (en) 1996-05-30 1996-05-30 Resist coating equipment

Country Status (1)

Country Link
JP (1) JP2868461B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20000023376A (en) * 1998-09-24 2000-04-25 히가시 데쓰로 Rotating cup and coating apparatus and coating method
CN111017487B (en) * 2019-12-24 2021-05-28 荆门微田智能科技有限公司 Chain type lifting device for cleaning and drying chain type wafer

Also Published As

Publication number Publication date
JPH09320940A (en) 1997-12-12

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