JP2867718B2 - Suspended particle counter - Google Patents

Suspended particle counter

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Publication number
JP2867718B2
JP2867718B2 JP3015154A JP1515491A JP2867718B2 JP 2867718 B2 JP2867718 B2 JP 2867718B2 JP 3015154 A JP3015154 A JP 3015154A JP 1515491 A JP1515491 A JP 1515491A JP 2867718 B2 JP2867718 B2 JP 2867718B2
Authority
JP
Japan
Prior art keywords
laser beam
floating
particle counter
scattered
light receiving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP3015154A
Other languages
Japanese (ja)
Other versions
JPH04254741A (en
Inventor
考治郎 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP3015154A priority Critical patent/JP2867718B2/en
Publication of JPH04254741A publication Critical patent/JPH04254741A/en
Application granted granted Critical
Publication of JP2867718B2 publication Critical patent/JP2867718B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、空間を浮遊する微粒子
( 以下、「浮遊微粒子」という) を計数する浮遊微粒子
計数器、特に浮遊微粒子を正確に計数できる浮遊微粒子
計数器に関する。微細な配線パターンを有する半導体装
置を歩留り良く製造するには、半導体装置を製造するた
めのクリーンルーム内の浮遊微粒子の数量を極限まで減
少させることが肝要である。そして、このためには浮遊
微粒子を正確に計数できる浮遊微粒子計数器が不可欠と
なる。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to fine particles floating in space.
The present invention relates to a suspended particle counter for counting suspended particles (hereinafter, referred to as “suspended particles”), and particularly to a suspended particle counter capable of accurately counting suspended particles. In order to manufacture a semiconductor device having a fine wiring pattern with good yield, it is important to reduce the number of floating particles in a clean room for manufacturing the semiconductor device to the limit. For this purpose, a floating particle counter capable of accurately counting floating particles is indispensable.

【0002】[0002]

【従来の技術】次に、従来の浮遊微粒子計数器につい
て、図2を参照しながら説明する。図2は、従来の浮遊
微粒子計数器を模式的に示す要部斜視図である。なお、
本明細書においては、同一部品、同一材料等に対しては
全図をとおして同じ符号を付与してある。
2. Description of the Related Art Next, a conventional suspended particle counter will be described with reference to FIG. FIG. 2 is a perspective view of a main part schematically showing a conventional suspended particle counter. In addition,
In this specification, the same reference numerals are given to the same parts, the same materials, and the like throughout the drawings.

【0003】従来の浮遊微粒子計数器は、図2に示すよ
うに互いの反射面21a,22a を対向且つ平行且つ離隔した
第1の平面鏡21と第2の平面鏡22の何れかの反射面にレ
ーザ光線発生器11が発生したレーザ光線12を斜めから照
射し、この反射面21a,22a 間で繰り返し反射させてジグ
ザグ状(Zigzag;つづら折り) にしたレーザ光線12を浮遊
微粒子10に照射して放射状の散乱光13を形成し、そし
て、レーザ光線12の進行方向を望む方向に受光面16a を
向けたホトダイオードアレイ16が散乱光13を受光する度
毎に出力するパルス状の電気信号の数をパルスカウンタ
(図示せず)で計数するように構成していた。
As shown in FIG. 2, a conventional floating particle counter employs a laser on one of a first plane mirror 21 and a second plane mirror 22 whose reflection surfaces 21a and 22a are opposed to each other and parallel and separated from each other. The laser beam 12 generated by the light beam generator 11 is irradiated obliquely, and the zigzag (Zigzag; zigzag) laser beam 12 that is repeatedly reflected between the reflection surfaces 21a and 22a is irradiated to the floating fine particles 10 to radiate the laser beam 12. A pulse counter counts the number of pulse-like electrical signals output each time the photodiode array 16 that forms the scattered light 13 and faces the light receiving surface 16a in the direction in which the laser beam 12 travels is desired to receive the scattered light 13. (Not shown).

【0004】[0004]

【発明が解決しようとする課題】ところが、浮遊微粒子
10からの散乱光13は放射状になってあらゆる方向に進行
するから、ホトダイオードアレイ16に入射する散乱光13
は極めて微弱になり、S/N比(ホトダイオードアレイ
16からパルスカウンタに入力されるパルス状の電気信号
の波高値とホトダイオードアレイ16とパルスカウンタの
内部雑音電圧値の比)が低下することとなる。このため
に従来の浮遊微粒子計数器は、浮遊微粒子10を正確に計
数できないという問題があった。
However, suspended particulates
Since the scattered light 13 from the light source 10 is radial and travels in all directions, the scattered light 13
Becomes extremely weak, and the S / N ratio (photodiode array
As a result, the ratio of the peak value of the pulse-like electric signal input to the pulse counter to the internal noise voltage between the photodiode array 16 and the pulse counter decreases. For this reason, the conventional suspended particle counter has a problem that the suspended particles 10 cannot be accurately counted.

【0005】本発明は、このような問題を解消するため
になされたものであって、その目的は、S/N比を向上
して空間を浮遊する浮遊微粒子を正確に計数できる浮遊
微粒子計数器を提供することにある。
The present invention has been made in order to solve such a problem, and an object of the present invention is to improve a S / N ratio and accurately count floating particles floating in space. Is to provide.

【0006】[0006]

【課題を解決するための手段】前記目的は、図1に示す
ように浮遊微粒子にレーザ光線を照射し、微粒子が散乱
したレーザ光線の散乱光を検出して浮遊微粒子を計数す
る浮遊微粒子計数器において、発生したビーム状のレー
ザ光線12を浮遊微粒子10に照射するレーザ光線発生器11
と、レーザ光線12の進行方向に反射面14a を向けて配列
されて、直線状に連なる曲率中心14b をレーザ光線12の
光軸12a に一致させた円筒型凹面鏡14と、レーザ光線12
を中間位置に介在させて入射面15a を円筒型凹面鏡14の
反射面14a に対向させて、入射面15a 側の直線状に連な
る焦点位置15b をレーザ光線12の光軸12a に一致させた
シリンドリカルレンズ15と、受光面16a をシリンドリカ
ルレンズ15の出射面15c 側の焦点位置15d に合わせて点
列され、シリンドリカルレンズ15の出射面15c から出射
した浮遊微粒子10が散乱したレーザ光線12の散乱光13を
受光面16a に入射して電気信号に変換する複数の受光素
子16とを含んで構成したことを特徴とする浮遊微粒子計
数器により達成される。
The object of the present invention is to provide a floating particle counter for irradiating a floating particle with a laser beam as shown in FIG. 1 and detecting the scattered light of the laser beam scattered by the particle to count the floating particle. A laser beam generator 11 for irradiating a floating particle 10 with the generated laser beam 12
A cylindrical concave mirror 14, which is arranged with the reflecting surface 14 a facing the direction of travel of the laser beam 12 and whose linearly continuous center of curvature 14 b coincides with the optical axis 12 a of the laser beam 12,
With the incident surface 15a facing the reflecting surface 14a of the cylindrical concave mirror 14, and a linearly-focused focal position 15b on the incident surface 15a side coinciding with the optical axis 12a of the laser beam 12. The scattered light 13 of the laser beam 12 scattered by the floating fine particles 10 scattered from the light exit surface 15c of the cylindrical lens 15 with the light receiving surface 16a aligned with the focal position 15d on the exit surface 15c side of the cylindrical lens 15 is formed. This is achieved by a floating particle counter characterized by comprising a plurality of light receiving elements 16 which are incident on a light receiving surface 16a and convert the electric signals into electric signals.

【0007】[0007]

【作用】本発明の浮遊微粒子計数器は、図1に示すよう
に浮遊微粒子10が散乱した散乱光13で、円筒型凹面鏡14
の方向に向かう散乱光13はこの反射面14a で反射した後
にシリンドリカルレンズ15を通過して受光素子16に入射
する。また、直接シリンドリカルレンズ15の方向に向か
う散乱光13は、シリンドリカルレンズ15を通過して受光
素子16に入射することとなる。
The floating particle counter according to the present invention uses the scattered light 13 scattered by the floating particles 10 as shown in FIG.
The scattered light 13 traveling in this direction is reflected by the reflecting surface 14a and then passes through the cylindrical lens 15 to enter the light receiving element 16. Further, the scattered light 13 directly traveling in the direction of the cylindrical lens 15 passes through the cylindrical lens 15 and enters the light receiving element 16.

【0008】したがって、本発明の浮遊微粒子計数器に
おいては、浮遊微粒子10が放射状に反射したレーザ光線
12の散乱光13は受光素子16に同時に入射することとな
り、受光素子16が散乱光13の入射と同時に出力するパル
ス状の電気信号の波高値は大きくなってS/N比が向上
し、浮遊微粒子を正確に計数できることとなる。
Accordingly, in the floating particle counter according to the present invention, the floating particle 10 has a laser beam reflected radially.
The scattered light 13 of 12 is incident on the light receiving element 16 at the same time, and the peak value of the pulse-like electric signal output from the light receiving element 16 at the same time as the incidence of the scattered light 13 is increased, the S / N ratio is improved, and the floating Fine particles can be accurately counted.

【0009】[0009]

【実施例】以下、本発明の一実施例の浮遊微粒子計数器
について、図1を参照しながら説明する。図1は、本発
明の一実施例の浮遊微粒子計数器を説明するための図で
あって、同図(a) は装置の要部の構成を模式的に示す斜
視図、同図(b) は要部の断面図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS A floating particle counter according to one embodiment of the present invention will be described below with reference to FIG. FIG. 1 is a view for explaining a suspended particle counter according to one embodiment of the present invention. FIG. 1 (a) is a perspective view schematically showing a configuration of a main part of the apparatus, and FIG. Is a sectional view of a main part.

【0010】同図(a) 及び同図(b) に示す本発明の一実
施例の浮遊微粒子計数器は、発生したビーム状のレーザ
光線12を空間内で浮遊する微粒子10に照射するレーザ光
線発生器11と、レーザ光線12の進行方向に円筒を半割り
しその内面を用いて形成した如くの反射面14a を向けて
配列されて、直線状に連なる曲率中心14b をレーザ光線
12の光軸12a に一致させた円筒型凹面鏡14と、レーザ光
線12を中間位置に介在させて平坦な入射面15a を円筒型
凹面鏡14の反射面14a に対向させて、入射面15a 側の直
線状に連なる焦点位置15b をレーザ光線12の光軸12a に
一致させたシリンドリカルレンズ15と、受光面16a をシ
リンドリカルレンズ15の円柱周壁状をした出射面15c 側
の焦点位置15d に合わせて点列され、シリンドリカルレ
ンズ15の出射面15c から出射した浮遊微粒子10が散乱し
たレーザ光線12の散乱光13を受光面16a に入射して電気
信号に変換する複数の受光素子、例えばホトダイオード
アレイ16を含んで構成したものである。
A floating particle counter according to one embodiment of the present invention shown in FIGS. 1A and 1B is a laser beam for irradiating a generated laser beam 12 to particles 10 floating in space. The generator 11 and the laser beam 12 are arranged in such a manner that a cylinder is halved in the direction of travel of the laser beam 12 and a reflecting surface 14a formed by using the inner surface thereof faces the laser beam.
A cylindrical concave mirror 14 aligned with the optical axis 12a of the laser 12 and a laser beam 12 interposed at an intermediate position so that the flat incident surface 15a faces the reflecting surface 14a of the cylindrical concave mirror 14, and a straight line on the incident surface 15a side is formed. The cylindrical lens 15 whose focal point 15b is aligned with the optical axis 12a of the laser beam 12, and the light receiving surface 16a is aligned with the focal point 15d of the cylindrical lens 15 on the side of the exit surface 15c having a cylindrical peripheral wall shape. A plurality of light receiving elements, such as a photodiode array 16, for converting the scattered light 13 of the laser beam 12 scattered by the floating fine particles 10 emitted from the emission surface 15c of the cylindrical lens 15 into a light receiving surface 16a and converting the scattered light 13 into an electric signal. It was done.

【0011】このように構成した本発明の一実施例の浮
遊微粒子計数器は、同図(b) に示すように浮遊微粒子10
が散乱したレーザ光線12の散乱光13で、円筒型凹面鏡14
の方向に向かう散乱光13はこの反射面14a で反射した後
にシリンドリカルレンズ15を通過して受光素子16に入射
する。また、直接シリンドリカルレンズ15の方向に向か
う散乱光13は、シリンドリカルレンズ15を通過して受光
素子16に入射することとなる。
The floating particle counter according to one embodiment of the present invention having the above-described structure is configured as shown in FIG.
Scattered light 13 of the laser beam 12 scattered by the cylindrical concave mirror 14
The scattered light 13 traveling in this direction is reflected by the reflecting surface 14a and then passes through the cylindrical lens 15 to enter the light receiving element 16. Further, the scattered light 13 directly traveling in the direction of the cylindrical lens 15 passes through the cylindrical lens 15 and enters the light receiving element 16.

【0012】したがって、本発明の浮遊微粒子計数器に
おいては、浮遊微粒子10が放射状に反射したレーザ光線
12の散乱光13は受光素子16に同時に入射することとな
り、受光素子16が散乱光13の入射と同時に出力するパル
ス状の電気信号の波高値は大きくなってS/N比が向上
し、浮遊微粒子を正確に計数できることとなる。
Therefore, in the floating particle counter of the present invention, the floating particle 10 is a laser beam reflected radially.
The scattered light 13 of 12 is incident on the light receiving element 16 at the same time, and the peak value of the pulse-like electric signal output from the light receiving element 16 at the same time as the incidence of the scattered light 13 is increased, the S / N ratio is improved, and the floating Fine particles can be accurately counted.

【0013】[0013]

【発明の効果】以上説明したように本発明は、浮遊微粒
子を正確に計数できる浮遊微粒子計数器を提供すること
を可能にする。したがって、本発明の浮遊微粒子計数器
を採用するとクリーンルーム等の浮遊微粒子の管理が正
確となることにより、半導体装置等の製造歩留りを向上
できることとなる。
As described above, the present invention makes it possible to provide a floating particle counter capable of accurately counting floating particles. Therefore, when the floating particle counter of the present invention is employed, the management of floating particles in a clean room or the like becomes more accurate, so that the production yield of semiconductor devices and the like can be improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】は、本発明の一実施例の浮遊微粒子計数器を説
明するための図、
FIG. 1 is a diagram for explaining a suspended particle counter according to one embodiment of the present invention;

【図2】は、従来の浮遊微粒子計数器を模式的に示す要
部斜視図である。
FIG. 2 is a perspective view of an essential part schematically showing a conventional suspended particle counter.

【符号の説明】[Explanation of symbols]

10は、浮遊微粒子、 11は、レーザ光線発生器、 12は、レーザ光線、 12a は、レーザ光線の光軸、 13は、散乱光、 14は、円筒型凹面鏡、 14a は、円筒型凹面鏡の反射面、 14b は、曲率中心、 15は、シリンドリカルレンズ、 15a は、シリンドリカルレンズの入射面、 15b と15d は、シリンドリカルレンズの焦点位置、 15c は、シリンドリカルレンズの出射面、 16は、受光素子 (ホトダイオードアレイ) 、 16a は、受光面、 21は、第1の平面鏡、 21a は、第1の平面鏡の反射面、 22は、第2の平面鏡、 22a は、第2の平面鏡の反射面をそれぞれ示す。 10 is a floating particle, 11 is a laser beam generator, 12 is a laser beam, 12a is an optical axis of a laser beam, 13 is scattered light, 14 is a cylindrical concave mirror, and 14a is a reflection of a cylindrical concave mirror. Surface, 14b is the center of curvature, 15 is the cylindrical lens, 15a is the entrance surface of the cylindrical lens, 15b and 15d are the focal positions of the cylindrical lens, 15c is the exit surface of the cylindrical lens, and 16 is the light receiving element (photodiode Array 16a is a light receiving surface, 21 is a first plane mirror, 21a is a reflection plane of the first plane mirror, 22 is a second plane mirror, and 22a is a reflection plane of the second plane mirror.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 空間を浮遊する微粒子にレーザ光線を照
射し、微粒子が散乱したレーザ光線の散乱光を検出して
微粒子を計数する浮遊微粒子計数器において、発生した
ビーム状の前記レーザ光線(12)を前記浮遊微粒子(10)に
照射するレーザ光線発生器(11)と、前記レーザ光線(12)
の進行方向に反射面(14a) を向けて配列されて、直線状
に連なる曲率中心(14b) をレーザ光線(12)の光軸(12a)
に一致させた円筒型凹面鏡(14)と、前記レーザ光線(12)
を中間位置に介在させて入射面(15a) を前記円筒型凹面
鏡(14)の反射面(14a) に対向させて、前記入射面(15a)
側の直線状に連なる焦点位置(15b) をレーザ光線(12)の
光軸(12a) に一致させたシリンドリカルレンズ(15)と、
受光面(16a) を前記シリンドリカルレンズ(15)の出射面
(15c) 側の焦点位置(15d) に合わせて点列され、シリン
ドリカルレンズ(15)の出射面(15c) から出射した前記浮
遊微粒子(10)が散乱した前記レーザ光線(12)の散乱光(1
3)を受光面(16a) に入射して電気信号に変換する複数の
受光素子(16)とを含んで構成したことを特徴とする浮遊
微粒子計数器。
A floating particle counter for irradiating a laser beam to fine particles floating in a space and detecting the scattered light of the laser beam scattered by the fine particles to count the fine particles. A laser beam generator (11) for irradiating the suspended fine particles (10) with the laser beam (12)
The reflection center (14a) is oriented in the direction of travel of the laser beam (12a).
A cylindrical concave mirror (14) matched with the laser beam (12)
The incident surface (15a) is positioned at an intermediate position so that the incident surface (15a) faces the reflecting surface (14a) of the cylindrical concave mirror (14).
A cylindrical lens (15) in which the focal position (15b) connected linearly on the side coincides with the optical axis (12a) of the laser beam (12);
The light receiving surface (16a) is connected to the emission surface of the cylindrical lens (15).
The scattered light (12) of the laser beam (12) which is scattered by the floating particulate 1
A floating particle counter characterized by comprising a plurality of light receiving elements (16) for converting 3) into a light receiving surface (16a) and converting the light into electric signals.
JP3015154A 1991-02-06 1991-02-06 Suspended particle counter Expired - Lifetime JP2867718B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3015154A JP2867718B2 (en) 1991-02-06 1991-02-06 Suspended particle counter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3015154A JP2867718B2 (en) 1991-02-06 1991-02-06 Suspended particle counter

Publications (2)

Publication Number Publication Date
JPH04254741A JPH04254741A (en) 1992-09-10
JP2867718B2 true JP2867718B2 (en) 1999-03-10

Family

ID=11880881

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3015154A Expired - Lifetime JP2867718B2 (en) 1991-02-06 1991-02-06 Suspended particle counter

Country Status (1)

Country Link
JP (1) JP2867718B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190084537A (en) * 2018-01-08 2019-07-17 (주)싸이닉솔루션 Dust measuring apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190084537A (en) * 2018-01-08 2019-07-17 (주)싸이닉솔루션 Dust measuring apparatus

Also Published As

Publication number Publication date
JPH04254741A (en) 1992-09-10

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