JP2864942B2 - Method for detecting conduction failure of parallel contacts - Google Patents

Method for detecting conduction failure of parallel contacts

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Publication number
JP2864942B2
JP2864942B2 JP11245693A JP11245693A JP2864942B2 JP 2864942 B2 JP2864942 B2 JP 2864942B2 JP 11245693 A JP11245693 A JP 11245693A JP 11245693 A JP11245693 A JP 11245693A JP 2864942 B2 JP2864942 B2 JP 2864942B2
Authority
JP
Japan
Prior art keywords
contacts
contact
conduction failure
current
parallel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP11245693A
Other languages
Japanese (ja)
Other versions
JPH06302242A (en
Inventor
欣弘 江田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TAKAOKA SEISAKUSHO KK
Original Assignee
TAKAOKA SEISAKUSHO KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TAKAOKA SEISAKUSHO KK filed Critical TAKAOKA SEISAKUSHO KK
Priority to JP11245693A priority Critical patent/JP2864942B2/en
Publication of JPH06302242A publication Critical patent/JPH06302242A/en
Application granted granted Critical
Publication of JP2864942B2 publication Critical patent/JP2864942B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、並列に設けられた接点
の導通不良検出方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for detecting conduction failure of contacts provided in parallel.

【0002】[0002]

【従来の技術】従来から、接点開閉の信頼性向上或いは
一接点あたりの電流容量の低減という目的のため、接点
を並列化するという技術が用いられている。これによ
り、これらの接点のうち少なくとも一つ以上の接点以外
の接点が破壊或いは接触抵抗の増加により導通不良を起
こしても、残った健全接点により電流が流されるため、
外面上影響が現れることは少ない。ところがこの場合、
導通不良になった接点がこれまで流していた電流は残っ
た健全接点に流れることになり、電流容量の面で健全接
点にかかる負担が大きくなる。この結果健全接点の寿命
が短縮されたり、最悪の場合、接点が破壊され、負荷に
対し電力を供給できなくなることもある。また、電流容
量の面では健全接点のみでも充分である場合も、並列接
点数の減少のため、信頼性が低下した状態での稼働とな
り不都合である。これらの問題を回避するため、負荷へ
電力を供給するための主接点と同時に動作する補助接点
を疑似的に主接点の情報として扱い、この情報をもとに
異常を早期発見する方法もあるが、あくまで主接点と補
助接点は別接点であるため、必ずしも両者の接触状態が
一致するとは限らないという欠点がある。
2. Description of the Related Art Conventionally, a technique of connecting contacts in parallel has been used for the purpose of improving the reliability of contact opening / closing or reducing the current capacity per contact. Thereby, even if a contact other than at least one of these contacts causes a conduction failure due to destruction or an increase in contact resistance, current flows through the remaining healthy contacts,
External effects are unlikely to appear. However, in this case,
The current that has flowed from the contact that has failed to conduct until now flows to the remaining healthy contact, which increases the load on the healthy contact in terms of current capacity. As a result, the life of the healthy contact may be shortened, or in the worst case, the contact may be broken, and power may not be supplied to the load. In addition, even when only healthy contacts are sufficient in terms of current capacity, the operation is performed in a state where reliability is reduced because the number of parallel contacts is reduced, which is inconvenient. To avoid these problems, there is a method of treating auxiliary contacts that operate simultaneously with the main contacts for supplying power to the load as pseudo main contact information, and using this information to detect abnormalities early. However, since the main contact and the auxiliary contact are separate contacts, there is a drawback that the contact states of both do not always match.

【0003】[0003]

【発明が解決しようとする課題】従来の技術において、
導通不良の全く発生しない接点は製造不可能であり、前
記従来の技術に示すような問題が起こる恐れは常に存在
する。そこで本発明は、前述の問題を起因とする重大不
具合への発展を未然に防ぐため、並列化接点の導通不良
検出方法を提供することを目的とする。
SUMMARY OF THE INVENTION In the prior art,
A contact having no conduction failure cannot be manufactured, and there is always a risk that the problems as described in the above-mentioned prior art may occur. Accordingly, an object of the present invention is to provide a method for detecting conduction failure of parallel contacts in order to prevent the development of a serious failure due to the above-mentioned problem.

【0004】[0004]

【課題を解決するための手段】本発明においては複数の
接点が並列に配置され、且つ、これらの接点に同時に電
流が流れる回路において、各々の接点を流れる電流を検
出する電流センサと、各々の検出値同士を比較する手段
と、比較の結果に応じて警報出力を発することができる
手段を使用する。
According to the present invention, in a circuit in which a plurality of contacts are arranged in parallel and a current flows through these contacts simultaneously, a current sensor for detecting a current flowing through each contact, Means for comparing the detected values and means for issuing an alarm output in accordance with the result of the comparison are used.

【0005】[0005]

【作用】上記のように構成された本発明によれば、並列
化された接点が一つでも導通不良を起こした場合、これ
を検出することができる。
According to the present invention having the above-described structure, when even one of the parallel contacts has a conduction failure, it can be detected.

【0006】[0006]

【実施例】図1は本発明の並列化接点の導通不良検出方
法の一例を示す図である。なお、説明の単純化のために
図1中の並列接点数は2個とする。図1では、電源部1
から負荷2への経路中に、同時に動作する2個の接点3
a、3bを並列に配置し、これらの開閉により負荷2に
対する電力供給の制御を行っている。また、接点3a、
3bのある並列回路部分には各々電流センサ4a、4b
があり、接点3a、3bに流れる電流を検出する。電流
に比例する検出値はすべて比較判断部5に集められ、各
々の相互間で値の比較が行われる。いま、接点3a、3
bとも健全、且つON状態で、両者の接触抵抗がほぼ等
しく、回路の抵抗率は一様であるとすると、電源部1か
ら負荷2へ流れる電流はほぼ等分されるため、電流セン
サ4a、4bで検出される値も等しく、比較判断部5は
比較の結果、正常であると判断する。ところが、例えば
接点3aで導通不良が発生したとすると、接点3aに流
れる電流は減少するとともに接点3bに流れる電流は増
加するため、電流センサ4a、4bで検出される値に相
違が生じることになる。これらの値を受けた比較判断部
5は比較の結果、接点の導通不良が発生した状態である
と判断するとともに警報出力部6を起動する。起動され
た警報出力部6は、必要とする出力形態で接点が導通不
良である旨を出力する。以上のように、各々の接点に流
れる電流値を相互に比較すれば、図1のような2個の並
列化接点に限らず、3個以上の並列化接点の導通不良検
出にも適用が可能である。図2は本発明の並列化接点の
導通不良検出方法を使用した一例を示す図である。電源
部1から負荷2への経路は制御回路3cによって制御さ
れるリレー3の接点3a、3bにより開閉され、負荷2
に対する電力供給の制御が行われている。なお、接点3
a、3bは並列に配置され、それぞれの接点を流れる電
流は電流センサ4a、4bにより電流に比例した検出値
としてA/D変換回路5aに入力される。各々の検出値
はA/D変換回路5aでアナログ量からディジタル量へ
の変換を行った後、CPU回路5bに引き渡され比較、
判断されることになる。前述作用の項で述べたように、
接点3a、3bとも健全状態であれば電流センサ4a、
4bの検出値はほぼ等しく、CPU回路5bでは比較の
結果、正常と判断するため、駆動回路6aへの出力は行
わない。しかし、接点3a、3bのいずれかが導通不良
を起こした場合は電流センサ4a、4bの検出値が異な
るため、CPU回路5bは比較結果より、接点の導通不
良と判断する。このときCPU回路5bは駆動回路6a
を起動し、表示灯6bを点灯させる。以上のような実施
例により、並列化された接点の導通不良を検出して、そ
の旨を外部に通報できるようになる。また図3は、本発
明を使用した他の例を示す図であり、図2のCPU回路
5bの出力を電源部1内に設けた電源出力停止回路1a
に送るように変更し、図2に示した例のような接点の導
通不良発生の際には、電源出力停止回路1aを動作さ
せ、電源部1からの電源供給を停止するようにしたもの
である。図3に示す例は電流容量の小さい接点を並列に
使用することで、より大きな負荷電流を制御している場
合に特に有効であり、導通不良発生にともなう健全接点
への電流集中を電源供給の停止により回避し、ひいては
過電流による加熱、焼損等を未然に防ぐことができる。
なお、これらの実施にあたっては、接点相互間での回路
抵抗、動作時間の誤差、電流センサの誤差等を許容した
比較判断部とすることで、より使用しやすいものにな
る。
FIG. 1 is a diagram showing an example of a method for detecting conduction failure of parallel contacts according to the present invention. It is assumed that the number of parallel contacts in FIG. 1 is two for simplification of the description. In FIG. 1, the power supply unit 1
Two contacts 3 operating simultaneously in the path from
The power supply to the load 2 is controlled by opening and closing these components a and 3b in parallel. Also, the contacts 3a,
In the parallel circuit part with 3b, current sensors 4a, 4b
And detects the current flowing through the contacts 3a and 3b. All the detected values proportional to the current are collected by the comparison judging unit 5, and the values are compared between each other. Now, the contacts 3a, 3
b is sound and in the ON state, the contact resistances of the two are almost equal, and the resistivity of the circuit is uniform. Since the current flowing from the power supply unit 1 to the load 2 is almost equally divided, the current sensors 4a, The values detected in 4b are also equal, and the comparison determination unit 5 determines that the value is normal as a result of the comparison. However, for example, if a conduction failure occurs at the contact 3a, the current flowing to the contact 3a decreases and the current flowing to the contact 3b increases, so that the values detected by the current sensors 4a and 4b differ. . As a result of the comparison, the comparing and judging unit 5 which receives these values judges that the conduction failure of the contact has occurred and activates the alarm output unit 6. The activated alarm output unit 6 outputs a signal indicating that the contact is defective in a required output form. As described above, when the current values flowing through the respective contacts are compared with each other, the present invention can be applied not only to the two parallel contacts as shown in FIG. 1 but also to the detection of conduction failure of three or more parallel contacts. It is. FIG. 2 is a diagram showing an example in which the method for detecting conduction failure of parallel contacts according to the present invention is used. The path from the power supply unit 1 to the load 2 is opened and closed by the contacts 3a and 3b of the relay 3 controlled by the control circuit 3c.
Is controlled. Contact 3
The currents a and 3b are arranged in parallel, and the current flowing through each contact is input to the A / D conversion circuit 5a by the current sensors 4a and 4b as a detection value proportional to the current. Each of the detected values is converted from an analog amount to a digital amount by an A / D conversion circuit 5a, and then passed to a CPU circuit 5b for comparison.
Will be judged. As mentioned in the previous section,
If both the contacts 3a and 3b are in a healthy state, the current sensor 4a,
The detection values of 4b are almost equal, and the CPU circuit 5b does not output to the drive circuit 6a because the result of the comparison determines that it is normal. However, if any one of the contacts 3a, 3b has a conduction failure, the detection values of the current sensors 4a, 4b are different, and the CPU circuit 5b determines from the comparison result that the conduction of the contact is defective. At this time, the CPU circuit 5b is driven by the drive circuit 6a.
Is activated, and the indicator lamp 6b is turned on. According to the above-described embodiment, it is possible to detect the conduction failure of the parallelized contacts and report the fact to the outside. FIG. 3 is a diagram showing another example using the present invention. The output of the CPU circuit 5b in FIG.
The power supply output stop circuit 1a is operated and the power supply from the power supply unit 1 is stopped in the event of a contact failure such as the example shown in FIG. is there. The example shown in FIG. 3 is particularly effective when a larger load current is controlled by using contacts having a small current capacity in parallel. This can be avoided by stopping, and thus, heating, burning and the like due to overcurrent can be prevented beforehand.
In these implementations, it is easier to use the comparison and determination unit by allowing the circuit resistance, the operating time error, the current sensor error, and the like between the contacts.

【0007】[0007]

【発明の効果】本発明によれば、上述したように接点の
導通不良に起因する機器信頼性の低下や、重大不具合を
未然に回避できる効果がある。また、本発明による異常
の早期発見から未然回避措置を講じることが容易になる
ため、これまで接触不良に起因する加熱、焼損事故を懸
念して電流容量の大きな接点を並列化していたものも、
電流容量の小さな接点に置き換えることが可能となり、
コンパクト化、コストダウンに貢献できる。
According to the present invention, as described above, there is an effect that it is possible to prevent a decrease in device reliability or a serious problem due to the conduction failure of the contacts. In addition, since it is easy to take preventive measures from early detection of an abnormality according to the present invention beforehand, heating caused by poor contact, and those having a large current capacity contact in parallel with concern for a burnout accident,
It is possible to replace the contact with a smaller current capacity,
It can contribute to downsizing and cost reduction.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の並列化接点の導通不良検出方法の一例
を示す図である。
FIG. 1 is a diagram showing an example of a method for detecting conduction failure of parallelized contacts according to the present invention.

【図2】本発明の検出方法を使用した一例を示す図であ
る。
FIG. 2 is a diagram showing an example using the detection method of the present invention.

【図3】本発明の検出方法を使用した他の例を示す図で
ある。
FIG. 3 is a diagram showing another example using the detection method of the present invention.

【符号の説明】[Explanation of symbols]

1 電源部 1a 電源出力停止回路 2 負荷 3 リレー 3a、3b 接点 3c 制御回路 4a、4b 電流センサ 5 比較判断部 5a A/D変換回路 5b CPU回路 6 警報出力部 6a 駆動回路 6b 表示灯 Reference Signs List 1 power supply section 1a power supply output stop circuit 2 load 3 relay 3a, 3b contact 3c control circuit 4a, 4b current sensor 5 comparison / determination section 5a A / D conversion circuit 5b CPU circuit 6 alarm output section 6a drive circuit 6b indicator light

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 複数の接点が並列に配置され、且つ、こ
れらの接点に同時に電流が流れる回路において、各々の
接点を流れる電流を電流センサにより検出し、各々の検
出値を比較して、比較の結果、検出値の少なくとも一つ
以上が他と大幅に異なる場合、警報出力を発することを
特徴とする並列化接点の導通不良検出方法。
In a circuit in which a plurality of contacts are arranged in parallel and a current flows through these contacts at the same time, a current flowing through each contact is detected by a current sensor, and each detected value is compared. As a result, when at least one of the detected values is significantly different from the others, an alarm output is issued, thereby detecting a conduction failure of the parallelized contacts.
JP11245693A 1993-04-16 1993-04-16 Method for detecting conduction failure of parallel contacts Expired - Lifetime JP2864942B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11245693A JP2864942B2 (en) 1993-04-16 1993-04-16 Method for detecting conduction failure of parallel contacts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11245693A JP2864942B2 (en) 1993-04-16 1993-04-16 Method for detecting conduction failure of parallel contacts

Publications (2)

Publication Number Publication Date
JPH06302242A JPH06302242A (en) 1994-10-28
JP2864942B2 true JP2864942B2 (en) 1999-03-08

Family

ID=14587096

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11245693A Expired - Lifetime JP2864942B2 (en) 1993-04-16 1993-04-16 Method for detecting conduction failure of parallel contacts

Country Status (1)

Country Link
JP (1) JP2864942B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016076468A (en) * 2014-10-04 2016-05-12 日工電気株式会社 Reliable electric switch device

Also Published As

Publication number Publication date
JPH06302242A (en) 1994-10-28

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