JP2816623B2 - Single crystal manufacturing apparatus and manufacturing method - Google Patents

Single crystal manufacturing apparatus and manufacturing method

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Publication number
JP2816623B2
JP2816623B2 JP8788192A JP8788192A JP2816623B2 JP 2816623 B2 JP2816623 B2 JP 2816623B2 JP 8788192 A JP8788192 A JP 8788192A JP 8788192 A JP8788192 A JP 8788192A JP 2816623 B2 JP2816623 B2 JP 2816623B2
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JP
Japan
Prior art keywords
single crystal
crucible
inner crucible
raw material
gas collecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP8788192A
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Japanese (ja)
Other versions
JPH05254982A (en
Inventor
豊志 岩切
正人 今井
Original Assignee
コマツ電子金属株式会社
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Priority to JP8788192A priority Critical patent/JP2816623B2/en
Publication of JPH05254982A publication Critical patent/JPH05254982A/en
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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、連続チャージ法による
単結晶製造装置および製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus and a method for producing a single crystal by a continuous charge method.

【0002】[0002]

【従来の技術】半導体素子の基板となるSi単結晶をC
Z法によって製造する場合、引き上げた単結晶の量に応
じて原料をるつぼ内に供給し、連続的に単結晶を引き上
げる連続チャージ法と、偏析現象による単結晶の抵抗率
変化を小さくするため、石英るつぼを二重構造とし、内
側のるつぼから単結晶を引き上げる二重るつぼ法とを組
み合わせた半導体単結晶育成装置が知られている。(U
SP2892739号、特開昭61−36197号参
照)
2. Description of the Related Art A silicon single crystal serving as a substrate of a semiconductor device is
In the case of manufacturing by the Z method, a raw material is supplied into a crucible according to the amount of the pulled single crystal, and a continuous charge method in which the single crystal is continuously pulled, and in order to reduce a change in resistivity of the single crystal due to a segregation phenomenon, There is known a semiconductor single crystal growing apparatus which combines a quartz crucible with a double structure and a double crucible method for pulling a single crystal from an inner crucible. (U
SP2892739, JP-A-61-36197)

【0003】[0003]

【発明が解決しようとする課題】上記従来の半導体単結
晶製造装置には、次のような問題点がある。 (1)石英るつぼの縁やチャンバ内に、揮発性のSiO
x が堆積しやすい。 (2)初期原料の溶解中に内側るつぼが変形する。 (3)単結晶育成部に不純物が混入し、単結晶純度の低
下を招く。 本発明は上記従来の問題点に着目し、これらの不具合発
生を未然に防止して高純度の単結晶を得ることができる
ような、単結晶製造装置および製造方法を提供すること
を目的とする。
The conventional semiconductor single crystal manufacturing apparatus has the following problems. (1) Volatile SiO is placed on the edge of the quartz crucible and in the chamber.
x tends to accumulate. (2) The inner crucible is deformed during melting of the initial material. (3) Impurities are mixed into the single crystal growing portion, resulting in a decrease in single crystal purity. An object of the present invention is to provide a single crystal manufacturing apparatus and a manufacturing method that can focus on the above conventional problems and can obtain a high-purity single crystal by preventing the occurrence of these problems beforehand. .

【0004】[0004]

【課題を解決するための手段】上記目的を達成するため
に本発明に係る単結晶製造装置は、中空円筒状の内側る
つぼの上端内側にガス捕集筒を固着し、前記ガス捕集筒
の下端は融液面との間に一定の隙間を保つとともに、前
記内側るつぼの内周とガス捕集筒の外周との間に形成さ
れるガス捕集管の上端に排気管を接続する構成とし、前
記内側るつぼと、内側るつぼに固着したガス捕集筒およ
び排気管とを昇降させる手段を設け、チャンバ外部から
原料を供給する原料供給管を、外側るつぼの内周と内側
るつぼの外周との間に配設するものとし、本発明に係る
単結晶製造方法は、上記単結晶製造装置において、初期
原料の溶解時には、内側るつぼと、内側るつぼに固着し
たガス捕集筒および排気管とを上昇させて、外側るつぼ
に充填した初期原料を溶解し、単結晶引き上げ時には前
記内側るつぼを下降させ、内側るつぼの下端を融液に浸
すことによって、単結晶引き上げ部の気相と原料供給部
の気相とを分離するとともに、ガス捕集管で捕集した融
液面上のガスを、排気管を介してチャンバ外部に排出す
ることとした。
In order to achieve the above object, a single crystal manufacturing apparatus according to the present invention has a gas collecting cylinder fixed to the inside of the upper end of a hollow cylindrical inner crucible, The lower end keeps a constant gap between the melt surface and the exhaust pipe connected to the upper end of the gas collecting pipe formed between the inner circumference of the inner crucible and the outer circumference of the gas collecting cylinder. Means for raising and lowering the inner crucible, a gas collecting cylinder and an exhaust pipe fixed to the inner crucible, and providing a raw material supply pipe for supplying a raw material from the outside of the chamber with an inner periphery of the outer crucible and an outer periphery of the inner crucible. The single crystal manufacturing method according to the present invention, in the single crystal manufacturing apparatus, raises the inner crucible and the gas collecting cylinder and the exhaust pipe fixed to the inner crucible when the initial raw material is melted. Let the initial crucible fill the outer crucible When the single crystal is pulled up, the inner crucible is lowered and the lower end of the inner crucible is immersed in the melt to separate the gas phase of the single crystal pulling section from the gas phase of the raw material supply section and collect gas. The gas on the surface of the melt collected by the pipe is discharged to the outside of the chamber through the exhaust pipe.

【0005】[0005]

【作用】上記構成によれば、昇降自在で中空円筒状の内
側るつぼの上端内側にガス捕集筒を固着し、前記ガス捕
集筒の下端は融液面との間に一定の隙間を保つととも
に、前記内側るつぼの内周とガス捕集筒の外周との間に
形成されるガス捕集管の上端に排気管を接続したので、
単結晶育成時に融液面上に存在する揮発性のSiOx
は、チャンバ上部から引き上げ単結晶に沿って流下する
不活性ガスとともに、ガス捕集管から排気管を経てチャ
ンバ外部に排出される。また、チャンバ外部から原料を
供給する原料供給管を外側るつぼの内周と内側るつぼの
外周との間に配設し、単結晶引き上げ時には内側るつぼ
の下端を融液に浸すことにしたので、単結晶育成部の気
相と原料供給部の気相とを分離することができる。これ
により、単結晶育成部に対する不純物混入と、るつぼ、
チャンバ等に対するSiOx の堆積とを確実に防止する
ことができる。
According to the above construction, a gas collecting cylinder is fixed to the inside of the upper end of a hollow cylindrical inner crucible which can freely move up and down, and the lower end of the gas collecting cylinder keeps a constant gap between itself and the melt surface. Along with connecting an exhaust pipe to the upper end of a gas collecting pipe formed between the inner circumference of the inner crucible and the outer circumference of the gas collecting cylinder,
Volatile SiOx present on the melt surface during single crystal growth
Together with the inert gas pulled up from the upper part of the chamber and flowing down along the single crystal, is discharged from the gas collecting pipe to the outside of the chamber via the exhaust pipe. Further, a raw material supply pipe for supplying a raw material from the outside of the chamber is disposed between the inner periphery of the outer crucible and the outer periphery of the inner crucible, and the lower end of the inner crucible is immersed in the melt when pulling a single crystal. The gas phase of the crystal growth section and the gas phase of the raw material supply section can be separated. Thereby, impurities are mixed into the single crystal growing portion, and the crucible,
It is possible to reliably prevent the deposition of SiOx on the chamber and the like.

【0006】初期原料の溶解時には、内側るつぼと、内
側るつぼに固着したガス捕集筒および排気管とを上昇さ
せ、外側るつぼのみで初期原料を溶解することにしたの
で、内側るつぼの熱変形を防止することができるととも
に、初期原料の溶解効率を向上させることができる。
At the time of melting the initial raw material, the inner crucible, the gas collecting cylinder and the exhaust pipe fixed to the inner crucible are raised, and the initial raw material is melted only with the outer crucible. In addition to preventing the dissolution, the dissolution efficiency of the initial raw material can be improved.

【0007】[0007]

【実施例】以下に本発明に係る単結晶製造装置および製
造方法の実施例について、図面を参照して説明する。図
1は、請求項1および請求項2に記載した単結晶製造装
置の第1実施例における概略構造を示す断面図である。
チャンバ1内に黒鉛るつぼの内面に石英るつぼを嵌着し
た外側るつぼ2が設けられ、この外側るつぼ2はるつぼ
軸3に固着されている。内側るつぼ4は、黒鉛管4aの
下端に石英管4bを連結した中空円筒であり、図示しな
いワイヤケーブル等によって単結晶引上げ軸5に釣支さ
れ、単結晶引上げ軸5の上下動に伴って上下動すること
ができるようになっている。前記内側るつぼ4の内側に
は、上端が大径となるテーパを有する中空円筒状のガス
捕集筒6が設けられ、内側るつぼ4の上端とガス捕集筒
6の上端とは同一平面内にあって、かつ、内側るつぼ4
の内周とガス捕集筒6の外周との隙間は前記上端で封止
されている。そして、前記内側るつぼ4の内周とガス捕
集筒6の外周との隙間によってガス捕集管7が形成され
ている。また、内側るつぼ4の内周に通じる排気管8が
内側るつぼ4の上端2箇所に固着され、この排気管8の
端末部はチャンバ1の内周に近接している。このよう
に、内側るつぼ4とガス捕集筒6および排気管8とによ
って、排気機構9が構成されている。本実施例では前記
排気管8を内側るつぼ4の内周に対して180°間隔に
2本設けているが、これに限るものではなく、たとえば
120°間隔に3本の排気管を設けてもよい。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of a single crystal manufacturing apparatus and a manufacturing method according to the present invention will be described below with reference to the drawings. FIG. 1 is a sectional view showing a schematic structure of a first embodiment of a single crystal manufacturing apparatus according to the first and second aspects.
An outer crucible 2 in which a quartz crucible is fitted on the inner surface of a graphite crucible is provided in a chamber 1, and the outer crucible 2 is fixed to a crucible shaft 3. The inner crucible 4 is a hollow cylinder in which a quartz tube 4b is connected to a lower end of a graphite tube 4a, and is supported by a single crystal pulling shaft 5 by a wire cable (not shown) or the like. You can move. Inside the inner crucible 4, a hollow cylindrical gas collecting cylinder 6 having a taper whose upper end has a large diameter is provided, and the upper end of the inner crucible 4 and the upper end of the gas collecting cylinder 6 are in the same plane. There and inside crucible 4
The gap between the inner periphery of the gas collecting cylinder 6 and the outer periphery of the gas collecting cylinder 6 is sealed at the upper end. A gas collecting tube 7 is formed by a gap between the inner periphery of the inner crucible 4 and the outer periphery of the gas collecting tube 6. Exhaust pipes 8 communicating with the inner periphery of the inner crucible 4 are fixed to two upper ends of the inner crucible 4, and the end of the exhaust pipe 8 is close to the inner periphery of the chamber 1. As described above, the exhaust mechanism 9 is configured by the inner crucible 4, the gas collecting cylinder 6, and the exhaust pipe 8. In the present embodiment, the two exhaust pipes 8 are provided at 180 ° intervals with respect to the inner circumference of the inner crucible 4, but the present invention is not limited to this. For example, three exhaust pipes may be provided at 120 ° intervals. Good.

【0008】単結晶引上げ軸5の下降に伴って前記内側
るつぼ4が所定の位置に下降したとき、内側るつぼ4の
上端に固着された排気管8の中心線と一致する位置に中
心線を有する排気口10が設けられ、この排気口10は
チャンバ1の側壁を貫通していて、水平方向にスライド
可能となっている。また原料供給管11は、チャンバ1
の上部外方からチャンバ1を貫通し、前記外側るつぼ2
の内周と内側るつぼ4の外周との隙間に挿入されてい
る。チャンバ1の底板1aには、中心にるつぼ軸3を挿
通する穴が設けられ、その周囲に複数個の排気口12が
配設されている。なお、13はヒータ、14は保温筒、
15は融液面、16は引き上げ単結晶である。
When the inner crucible 4 is lowered to a predetermined position with the lowering of the single crystal pulling shaft 5, a center line is provided at a position coinciding with the center line of the exhaust pipe 8 fixed to the upper end of the inner crucible 4. An exhaust port 10 is provided, which penetrates the side wall of the chamber 1 and is slidable in the horizontal direction. The raw material supply pipe 11 is provided in the chamber 1
Penetrates the chamber 1 from the upper outside of the outer crucible 2
Of the inner crucible and the outer periphery of the inner crucible 4. The bottom plate 1a of the chamber 1 is provided with a hole through which the crucible shaft 3 is inserted at the center, and a plurality of exhaust ports 12 are provided around the hole. In addition, 13 is a heater, 14 is a heat retaining cylinder,
Reference numeral 15 denotes a melt surface, and reference numeral 16 denotes a pulled single crystal.

【0009】次に、上記単結晶製造装置による単結晶製
造方法について説明する。まず外側るつぼ2内に初期原
料のSi多結晶を充填し、内側るつぼ4および内側るつ
ぼ4と一体に構成されたガス捕集筒6、排気管8を単結
晶引上げ軸5の上昇により吊り上げた状態にした後、前
記初期原料をヒータ13により溶解する。
Next, a method for producing a single crystal by the above-described apparatus for producing a single crystal will be described. First, the outer crucible 2 is filled with polycrystalline Si as an initial material, and the inner crucible 4, the gas collecting cylinder 6 and the exhaust pipe 8 integrally formed with the inner crucible 4 are lifted by raising the single crystal pulling shaft 5. After that, the initial raw material is melted by the heater 13.

【0010】初期原料の溶解が完了した後、内側るつぼ
4を所定の位置に下降させると、排気口10がチャンバ
1内方にスライドして排気管8の端末部が排気口10に
挿嵌されるとともに、内側るつぼ4下部の石英管4bが
融液に浸される。この状態で、内側るつぼ4と外側るつ
ぼ2との隙間に原料供給管11から原料を補給しつつ、
内側るつぼ4の内側から単結晶16を引き上げる。この
ときチャンバ1上方から導入されたアルゴンガスは、チ
ャンバ1内に充満するとともに、引き上げ単結晶16に
沿って下降し、ガス捕集管7の下端からガス捕集管7内
に入り、排気管8内を通って排気口10からチャンバ1
の外に排出される。そのため、融液面15上に存在する
揮発性のSiOx が、外側るつぼ2の縁やヒータ13等
の内部に堆積しない。また、ガス捕集筒6の下端部分は
高温になるので、SiOx が堆積することはない。ま
た、前記原料供給管11下端開口部近傍や外側るつぼ2
の内外周近傍に存在する不純物は、アルゴンガスととも
に排気口12からチャンバ1の外に排出される。このよ
うに、内側るつぼ4の下端を融液に浸すことにより、原
料供給管11端末部近傍の気相と内側るつぼ4内の気相
とが内側るつぼ4によって分離されるので、単結晶の欠
陥発生原因となる不純物混入を防止することができ、よ
り信頼性の高い半導体単結晶を得ることが可能となる。
After the melting of the initial raw materials is completed, when the inner crucible 4 is lowered to a predetermined position, the exhaust port 10 slides into the chamber 1 and the end of the exhaust pipe 8 is inserted into the exhaust port 10. At the same time, the quartz tube 4b below the inner crucible 4 is immersed in the melt. In this state, while supplying the raw material from the raw material supply pipe 11 to the gap between the inner crucible 4 and the outer crucible 2,
The single crystal 16 is pulled from the inside of the inner crucible 4. At this time, the argon gas introduced from above the chamber 1 fills the chamber 1 and rises and descends along the single crystal 16, enters the gas collecting pipe 7 from the lower end of the gas collecting pipe 7, and 8 through the exhaust port 10 to the chamber 1
Is discharged outside. Therefore, volatile SiOx existing on the melt surface 15 does not deposit on the edge of the outer crucible 2 or inside the heater 13 or the like. Further, since the lower end portion of the gas collecting cylinder 6 becomes high in temperature, SiOx does not deposit. Further, the vicinity of the lower end opening of the raw material supply pipe 11 or the outer crucible 2
The impurities existing in the vicinity of the inner and outer peripheries are discharged out of the chamber 1 through the exhaust port 12 together with the argon gas. By immersing the lower end of the inner crucible 4 in the melt as described above, the gas phase in the vicinity of the end of the raw material supply pipe 11 and the gas phase in the inner crucible 4 are separated by the inner crucible 4, so that the single crystal defect It is possible to prevent impurities from being mixed, and to obtain a more reliable semiconductor single crystal.

【0011】更に、特に高温となる初期原料溶解時に、
支えのない内側るつぼ4を外側るつぼ2の上方に退避さ
せ、内側るつぼ4の熱変形を防止するとともに、内側る
つぼ4の介在による初期原料への伝熱効率低下を防いで
初期原料の溶解効率を高め、溶解所要時間の短縮を図っ
ている。
Further, particularly when the initial raw materials are dissolved at a high temperature,
The unsupported inner crucible 4 is retracted above the outer crucible 2 to prevent thermal deformation of the inner crucible 4 and to prevent a decrease in heat transfer efficiency to the initial raw material due to the interposition of the inner crucible 4, thereby increasing the melting efficiency of the initial raw material. In addition, the time required for dissolution is reduced.

【0012】図2は本発明の第2実施例を示す断面図
で、チャンバ1の外部上方からチャンバ1を貫通して垂
直に上下動するロッド17の下端が排気管8に固着され
ている。内側るつぼ4を含む排気機構9は、図示しない
ロッド昇降機構が前記ロッド17を昇降させることによ
って上下動し、所定の位置に下降したとき排気管8の端
末と排気口10とが連結される。その他の構造、機能は
第1実施例と同じである。
FIG. 2 is a sectional view showing a second embodiment of the present invention. The lower end of a rod 17 vertically moving through the chamber 1 from above the outside of the chamber 1 is fixed to the exhaust pipe 8. The exhaust mechanism 9 including the inner crucible 4 moves up and down by raising and lowering the rod 17 by a rod elevating mechanism (not shown), and when it is lowered to a predetermined position, the terminal of the exhaust pipe 8 and the exhaust port 10 are connected. Other structures and functions are the same as those of the first embodiment.

【0013】図3は本発明の第3実施例である。ヒータ
13を包囲するように設けられた保温筒14には、垂直
方向に貫通する気導孔18が設けられ、チャンバ1の底
板1aに前記気導孔18に通じる排気口19が取着され
ている。ガス捕集管7に通じる排気管8の端末部は、前
記気導孔18の上端開口部で下方に屈曲し、内側るつぼ
4を含む排気機構9が所定の位置に下降したとき、排気
管8の端末部が気導孔18の上端開口部に挿嵌されるよ
うになっている。融液面15上に存在する揮発性のSi
Ox は、排気管8と気導孔18とを経て排気口19から
外部に排出される。その他の構造、機能は第1実施例と
同じである。
FIG. 3 shows a third embodiment of the present invention. An air conducting hole 18 penetrating in the vertical direction is provided in the heat retaining cylinder 14 provided so as to surround the heater 13, and an exhaust port 19 communicating with the air conducting hole 18 is attached to the bottom plate 1 a of the chamber 1. I have. The end portion of the exhaust pipe 8 communicating with the gas collecting pipe 7 is bent downward at the upper end opening of the air guide hole 18, and when the exhaust mechanism 9 including the inner crucible 4 is lowered to a predetermined position, the exhaust pipe 8 is closed. Is inserted into the upper end opening of the air guide hole 18. Volatile Si existing on the melt surface 15
Ox is discharged to the outside from the exhaust port 19 through the exhaust pipe 8 and the air conduction hole 18. Other structures and functions are the same as those of the first embodiment.

【0014】図4は本発明の第4実施例を示したもの
で、内側るつぼ4を含む排気機構9をロッド17によっ
て昇降自在としたものである。本実施例の構造、機能は
上記第3実施例と同一である。
FIG. 4 shows a fourth embodiment of the present invention, in which an exhaust mechanism 9 including an inner crucible 4 can be moved up and down by a rod 17. The structure and function of this embodiment are the same as those of the third embodiment.

【0015】[0015]

【発明の効果】以上説明したように本発明によれば、昇
降自在で中空円筒状の内側るつぼの上端内側にガス捕集
筒を固着し、前記内側るつぼの内周とガス捕集筒の外周
との間に形成されるガス捕集管内に揮発性のSiOx を
導き、排気管を介して前記SiOx をチャンバ外部に排
出するとともに、外側るつぼの内周と内側るつぼの外周
との間に原料供給管を配設することによって、単結晶育
成部の気相と原料供給部の気相とを分離したので、Si
Ox の引き上げ単結晶への付着、あるいは供給原料に付
着している不純物の単結晶への混入を防止することがで
き、高純度で信頼性の高い単結晶を得ることが可能とな
る。また、るつぼ、チャンバ等に対するSiOx の堆積
を確実に防止することができる。
As described above, according to the present invention, a gas collecting cylinder is fixed to the inside of the upper end of a hollow cylindrical inner crucible which can freely move up and down, and the inner periphery of the inner crucible and the outer periphery of the gas collecting cylinder are fixed. The volatile SiOx is introduced into a gas collecting pipe formed between the outer crucible and the exhaust pipe, and the raw material is supplied between the inner circumference of the outer crucible and the outer circumference of the inner crucible. By disposing the pipe, the gas phase of the single crystal growing section and the gas phase of the raw material supply section were separated.
It is possible to prevent Ox from being adhered to the pulled single crystal or to prevent impurities adhering to the feed material from being mixed into the single crystal, so that a single crystal having high purity and high reliability can be obtained. Further, the deposition of SiOx on the crucible, the chamber and the like can be reliably prevented.

【0016】初期原料の溶解時には内側るつぼを上昇さ
せることにしたので、内側るつぼの熱変形を防止するこ
とができるとともに、初期原料の溶解効率向上によって
作業能率の向上を図ることができる。更に、単結晶引き
上げ中の原料供給に際しては、内側るつぼによって融液
面が仕切られているので、供給原料の投入によって融液
面に発生する波紋の単結晶育成部に対する伝播を防止す
ることができる。
Since the inner crucible is raised when the initial raw material is melted, thermal deformation of the inner crucible can be prevented, and work efficiency can be improved by improving the melting efficiency of the initial raw material. Furthermore, since the melt surface is partitioned by the inner crucible during the supply of the raw material during the pulling of the single crystal, it is possible to prevent the ripples generated on the melt surface by the supply of the raw material from being propagated to the single crystal growing portion. .

【図面の簡単な説明】[Brief description of the drawings]

【図1】第1実施例による単結晶製造装置の概略構造を
示す断面図である。
FIG. 1 is a sectional view showing a schematic structure of a single crystal manufacturing apparatus according to a first embodiment.

【図2】第2実施例による単結晶製造装置の概略構造を
示す断面図である。
FIG. 2 is a sectional view showing a schematic structure of a single crystal manufacturing apparatus according to a second embodiment.

【図3】第3実施例による単結晶製造装置の概略構造を
示す断面図である。
FIG. 3 is a sectional view showing a schematic structure of a single crystal manufacturing apparatus according to a third embodiment.

【図4】第4実施例による単結晶製造装置の概略構造を
示す断面図である。
FIG. 4 is a sectional view showing a schematic structure of a single crystal manufacturing apparatus according to a fourth embodiment.

【符号の説明】[Explanation of symbols]

1 チャンバ 2 外側るつぼ 4 内側るつぼ 6 ガス捕集筒 7 ガス捕集管 8 排気管 11 原料供給管 15 融液面 16 単結晶 DESCRIPTION OF SYMBOLS 1 Chamber 2 Outer crucible 4 Inner crucible 6 Gas collection tube 7 Gas collection tube 8 Exhaust tube 11 Raw material supply tube 15 Melt surface 16 Single crystal

フロントページの続き (56)参考文献 特開 平5−51291(JP,A) 特開 平4−317492(JP,A) 特開 平5−85880(JP,A) 特開 平5−43380(JP,A) 特開 昭61−36197(JP,A) 特開 平5−117075(JP,A) 特開 昭54−41280(JP,A) 実開 平4−84362(JP,U) (58)調査した分野(Int.Cl.6,DB名) C30B 15/00 - 15/36 C30B 28/00 - 35/00 H01L 21/208Continuation of front page (56) References JP-A-5-51291 (JP, A) JP-A-4-317492 (JP, A) JP-A-5-85880 (JP, A) JP-A-5-43380 (JP) JP-A-61-36197 (JP, A) JP-A-5-117075 (JP, A) JP-A-54-41280 (JP, A) JP-A-4-84362 (JP, U) (58) Field surveyed (Int.Cl. 6 , DB name) C30B 15/00-15/36 C30B 28/00-35/00 H01L 21/208

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 中空円筒状の内側るつぼの上端内側にガ
ス捕集筒を固着し、前記ガス捕集筒の下端は融液面との
間に一定の隙間を保つとともに、前記内側るつぼの内周
とガス捕集筒の外周との間に形成されるガス捕集管の上
端に排気管を接続する構成とし、前記内側るつぼと、内
側るつぼに固着したガス捕集筒および排気管とを昇降さ
せる手段を設け、チャンバ外部から原料を供給する原料
供給管を、外側るつぼの内周と内側るつぼの外周との間
に配設したことを特徴とする単結晶製造装置。
1. A gas collecting cylinder is fixed to the inside of an upper end of a hollow cylindrical inner crucible, and a lower end of the gas collecting cylinder keeps a constant gap with a melt surface, and the inside of the inner crucible is fixed. An exhaust pipe is connected to the upper end of a gas collecting pipe formed between the circumference and the outer circumference of the gas collecting cylinder, and the inner crucible and the gas collecting cylinder and the exhaust pipe fixed to the inner crucible are raised and lowered. A single crystal manufacturing apparatus, characterized in that a raw material supply pipe for supplying a raw material from outside the chamber is provided between the inner periphery of the outer crucible and the outer periphery of the inner crucible.
【請求項2】 請求項1の単結晶製造装置において、初
期原料の溶解時には、内側るつぼと、内側るつぼに固着
したガス捕集筒および排気管とを上昇させて、外側るつ
ぼに充填した初期原料を溶解し、単結晶引き上げ時には
前記内側るつぼを下降させ、内側るつぼの下端を融液に
浸すことによって、単結晶引き上げ部の気相と原料供給
部の気相とを分離するとともに、ガス捕集管で捕集した
融液面上のガスを、排気管を介してチャンバ外部に排出
することを特徴とする単結晶製造方法。
2. The single crystal production apparatus according to claim 1, wherein when the initial raw material is dissolved, the inner crucible, the gas collecting cylinder and the exhaust pipe fixed to the inner crucible are raised, and the outer raw material is filled in the outer crucible. When the single crystal is pulled up, the inner crucible is lowered and the lower end of the inner crucible is immersed in the melt to separate the gas phase of the single crystal pulling section from the gas phase of the raw material supply section and collect gas. A method for producing a single crystal, wherein a gas on a melt surface collected by a pipe is discharged to the outside of a chamber through an exhaust pipe.
JP8788192A 1992-03-11 1992-03-11 Single crystal manufacturing apparatus and manufacturing method Expired - Lifetime JP2816623B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8788192A JP2816623B2 (en) 1992-03-11 1992-03-11 Single crystal manufacturing apparatus and manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8788192A JP2816623B2 (en) 1992-03-11 1992-03-11 Single crystal manufacturing apparatus and manufacturing method

Publications (2)

Publication Number Publication Date
JPH05254982A JPH05254982A (en) 1993-10-05
JP2816623B2 true JP2816623B2 (en) 1998-10-27

Family

ID=13927216

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2816623B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0765954B1 (en) * 1995-09-26 1999-04-28 Balzers und Leybold Deutschland Holding Aktiengesellschaft Crystal pulling apparatus
JP4730937B2 (en) 2004-12-13 2011-07-20 Sumco Techxiv株式会社 Semiconductor single crystal manufacturing apparatus and manufacturing method
US10378121B2 (en) 2015-11-24 2019-08-13 Globalwafers Co., Ltd. Crystal pulling system and method for inhibiting precipitate build-up in exhaust flow path

Also Published As

Publication number Publication date
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