JP2780045B2 - 湿ったガスの露点計測方法および該方法を実施するための装置 - Google Patents

湿ったガスの露点計測方法および該方法を実施するための装置

Info

Publication number
JP2780045B2
JP2780045B2 JP1139354A JP13935489A JP2780045B2 JP 2780045 B2 JP2780045 B2 JP 2780045B2 JP 1139354 A JP1139354 A JP 1139354A JP 13935489 A JP13935489 A JP 13935489A JP 2780045 B2 JP2780045 B2 JP 2780045B2
Authority
JP
Japan
Prior art keywords
gas
dew point
measured
dew
mirror
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP1139354A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0227247A (ja
Inventor
アルトウール・ムッター
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Publication of JPH0227247A publication Critical patent/JPH0227247A/ja
Application granted granted Critical
Publication of JP2780045B2 publication Critical patent/JP2780045B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00Investigating or analyzing materials by the use of thermal means
    • G01N25/56Investigating or analyzing materials by the use of thermal means by investigating moisture content
    • G01N25/66Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point
    • G01N25/68Investigating or analyzing materials by the use of thermal means by investigating moisture content by investigating dew-point by varying the temperature of a condensing surface

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
JP1139354A 1988-06-03 1989-06-02 湿ったガスの露点計測方法および該方法を実施するための装置 Expired - Fee Related JP2780045B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH02130/88-7 1988-06-03
CH2130/88A CH676152A5 (enExample) 1988-06-03 1988-06-03

Publications (2)

Publication Number Publication Date
JPH0227247A JPH0227247A (ja) 1990-01-30
JP2780045B2 true JP2780045B2 (ja) 1998-07-23

Family

ID=4226582

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1139354A Expired - Fee Related JP2780045B2 (ja) 1988-06-03 1989-06-02 湿ったガスの露点計測方法および該方法を実施するための装置

Country Status (6)

Country Link
EP (1) EP0345215B1 (enExample)
JP (1) JP2780045B2 (enExample)
AT (1) ATE112628T1 (enExample)
CH (1) CH676152A5 (enExample)
DE (1) DE58908467D1 (enExample)
HK (1) HK104695A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005098404A1 (ja) * 2004-03-30 2005-10-20 Yamatake Corporation 検出面上状態検出装置
WO2006132224A1 (ja) * 2005-06-09 2006-12-14 Tokyo University Of Agriculture And Technology 反射率変化型センサ、光学式測定装置、反射率変化型センサの製造方法、並びに反射率変化型センサ用自己組織化微粒子単層膜、自己組織化微粒子単層膜及びこれら単層膜の製造方法

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1992018854A1 (en) * 1991-04-18 1992-10-29 Osaka Sanso Kogyo Ltd. Method of measuring the dew point and/or frost point of a gas having low water content and apparatus therefor
US5470154A (en) * 1991-04-18 1995-11-28 Osaka Sanso Kogyo Ltd. Method of cleaning the reflector mirror in an optical dew point meter and an optical dew point meter equipped with a cleaning device
US5482371A (en) * 1991-04-18 1996-01-09 Osaka Sanso Kogyo Ltd. Method and apparatus for measuring the dew point and/or frost point of a gas having low water content
IT1255296B (it) * 1992-05-26 1995-10-26 Getters Spa Apparecchiatura per introdurre in modo controllato quantita' minime di umidita' in un flusso di gas secco
DE102016120423B4 (de) * 2016-10-26 2018-12-27 Pro-Chem Analytik GmbH & Co. KG Vorrichtung zur optischen Taupunktmessung
JP7124106B2 (ja) * 2018-10-05 2022-08-23 明星電気株式会社 ラジオゾンデ用の鏡面冷却式露点計

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2893237A (en) * 1955-05-11 1959-07-07 Surface Combustion Corp Dew point indicator
US3112648A (en) * 1961-12-11 1963-12-03 George A Dulk Peltier dew point hygrometer
US4083224A (en) * 1975-09-29 1978-04-11 The University Of Sydney Phase transition detector

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005098404A1 (ja) * 2004-03-30 2005-10-20 Yamatake Corporation 検出面上状態検出装置
US7380980B2 (en) 2004-03-30 2008-06-03 Yamatake Corporation Detector for detecting state on detection surface
WO2006132224A1 (ja) * 2005-06-09 2006-12-14 Tokyo University Of Agriculture And Technology 反射率変化型センサ、光学式測定装置、反射率変化型センサの製造方法、並びに反射率変化型センサ用自己組織化微粒子単層膜、自己組織化微粒子単層膜及びこれら単層膜の製造方法
JP5167486B2 (ja) * 2005-06-09 2013-03-21 国立大学法人東京農工大学 反射率変化型センサ、光学式測定装置、反射率変化型センサの製造方法、並びに反射率変化型センサ用自己組織化微粒子単層膜、自己組織化微粒子単層膜及びこれら単層膜の製造方法

Also Published As

Publication number Publication date
JPH0227247A (ja) 1990-01-30
EP0345215A3 (de) 1991-04-03
HK104695A (en) 1995-07-07
EP0345215B1 (de) 1994-10-05
EP0345215A2 (de) 1989-12-06
ATE112628T1 (de) 1994-10-15
CH676152A5 (enExample) 1990-12-14
DE58908467D1 (de) 1994-11-10

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