JP2777442B2 - Light emitting diode array - Google Patents

Light emitting diode array

Info

Publication number
JP2777442B2
JP2777442B2 JP33421089A JP33421089A JP2777442B2 JP 2777442 B2 JP2777442 B2 JP 2777442B2 JP 33421089 A JP33421089 A JP 33421089A JP 33421089 A JP33421089 A JP 33421089A JP 2777442 B2 JP2777442 B2 JP 2777442B2
Authority
JP
Japan
Prior art keywords
light
light emitting
insulating film
diode array
emitting diode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP33421089A
Other languages
Japanese (ja)
Other versions
JPH03194977A (en
Inventor
稲葉  昌治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Sanyo Denki Co Ltd
Original Assignee
Tottori Sanyo Electric Co Ltd
Sanyo Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tottori Sanyo Electric Co Ltd, Sanyo Denki Co Ltd filed Critical Tottori Sanyo Electric Co Ltd
Priority to JP33421089A priority Critical patent/JP2777442B2/en
Publication of JPH03194977A publication Critical patent/JPH03194977A/en
Application granted granted Critical
Publication of JP2777442B2 publication Critical patent/JP2777442B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】 (イ)産業上の利用分野 本発明は高密度の印字または表示に好適な発光ダイオ
ードアレイに関する。
The present invention relates to a light emitting diode array suitable for high-density printing or display.

(ロ)従来の技術 従来より、光プリンタに用いる発光ダイオードアレイ
あるいはヘッドアップディスプレイなどの投影型表示に
用いる発光ダイオードアレイは、印字ドットまたは表示
ドットに対応する発行領域を化合物半導体の表面に複数
個設け、その化合物半導体の表面に絶縁膜を介して発光
領域にオーミック接触をなした電極を形成していた。
(B) Conventional technology Conventionally, a light emitting diode array used for an optical printer or a light emitting diode array used for a projection type display such as a head-up display has a plurality of printing regions corresponding to print dots or display dots on the surface of a compound semiconductor. In this case, an electrode was formed on the surface of the compound semiconductor in ohmic contact with the light emitting region via an insulating film.

この様なモノリシック型の発光ダイオードアレイにお
いては、特開昭61−3763号公報、特開昭62−242558号公
報などに示されているごとく表面に薄膜上の絶縁被膜を
設けている。この絶縁被膜は、発光領域の選択拡散に用
いたもの、化合物半導体表面の保護のためのもの、絶縁
被膜などのピンホールを対策するためのもの、ワイヤー
ボンドなどの配線における電極下地の硬度を維持したり
衝撃を吸収するためのもの、発光領域の輝度調節用のも
のなどの目的があり、これらを達成するために化合物半
導体の表面には絶縁被膜が複数層設けられることが多く
なった。
In such a monolithic light emitting diode array, an insulating coating on a thin film is provided on the surface as disclosed in JP-A-61-3763 and JP-A-62-242558. This insulating film is used for selective diffusion of the light emitting area, for protecting the surface of the compound semiconductor, for preventing pinholes such as the insulating film, and for maintaining the hardness of the electrode base in wiring such as wire bonding. There are objects such as one for absorbing dripping and impact and one for adjusting the luminance of the light emitting region. In order to achieve these objects, a plurality of insulating films are often provided on the surface of the compound semiconductor.

(ハ)発明が解決しようとする課題 ところがドット間隔が狭くなったり、ドットが小さく
密集するようになると、電極が細くなって破断し易くな
り、さらに、ドットの輪郭の不明瞭さが目立つと共にド
ット間の光クロストークが生じ易くなる。
(C) Problems to be Solved by the Invention However, when the dot interval becomes narrower or the dots become smaller and denser, the electrodes become thinner and easily broken, and furthermore, the outline of the dots becomes conspicuous and the dots become conspicuous. Optical crosstalk between them is likely to occur.

この様子を検討した結果、これらの問題点が発生する
のは400dpi(1インチあたり400ドット)以上の解像度
のときに顕著となり、電極の断線は、積層により絶縁被
膜が厚くなるにつれオーミックをとる時に絶縁被膜の表
面から化合物半導体の表面までの段差が大きくなるから
であり、また輪郭不明瞭と光のクロストークは、絶縁被
膜が光伝播体(光パイプ)となり、この光伝播量は絶縁
被膜の積層界面があると多くなり、光拡散が著しく目立
つことが分かった。
As a result of examining this situation, these problems will become more noticeable at resolutions of 400 dpi (400 dots per inch) or more. This is because the step from the surface of the insulating film to the surface of the compound semiconductor becomes large, and the unclear contour and crosstalk of light are caused by the fact that the insulating film becomes a light propagation body (light pipe), and the amount of light propagation is It was found that the number increased when there was a lamination interface, and that light diffusion was significantly conspicuous.

(ニ)課題を解決するための手段 本発明は上述の点を考慮して成されたもので、発光領
域の周囲を覆う第1の絶縁被膜と、その発行領域を含む
帯状部を除いて基板表面に設けられた第2の絶縁被膜
と、発光領域の各々にオーミック接触され第2の絶縁被
膜上に迄延在して設けられた電極との積層構造とするも
のである。
(D) Means for Solving the Problems The present invention has been made in view of the above points, and has the following features: a first insulating film covering a periphery of a light emitting region; It has a laminated structure of a second insulating film provided on the surface and an electrode provided in ohmic contact with each of the light emitting regions and extending up to the second insulating film.

(ホ)作用 これにより電極は絶縁被膜表面から段階的に化合物半
導体に近づくので段差は小さく、各々の発光領域の近
く、とりわけ発光領域の相互間位置には絶縁被膜の界面
がないから光伝播の量は少なくなる。
(E) Action Since the electrode gradually approaches the compound semiconductor from the surface of the insulating film, the step is small, and there is no interface of the insulating film near each light-emitting region, especially at a position between the light-emitting regions. The amount is smaller.

(ヘ)実施例 以下850dpiの発光ダイオードアレイを例に、図面に従
って本発明の実施例を説明する。
(F) Embodiment An embodiment of the present invention will be described below with reference to the drawings, using a light emitting diode array of 850 dpi as an example.

1はGaP、GaAsP、GaAlAs、GaAs等からなる化合物半導
体で、その表面には選択拡散法などにより1列または千
鳥状複数列に整列した複数の発光領域11を有しており、
発光領域は例えば表面が40×15μm、深さ2〜7μm
で、図の如く千鳥状2列配置のときは、発行領域11の中
心を基準として、列の間隔が約60.0μm、同じ列内の発
光領域間隔(即ち配列ピッチ)が約117.6μmである。
Reference numeral 1 denotes a compound semiconductor made of GaP, GaAsP, GaAlAs, GaAs, or the like, and has a plurality of light emitting regions 11 arranged in one row or in a staggered plurality of rows on the surface thereof by a selective diffusion method or the like.
The light emitting region has, for example, a surface of 40 × 15 μm and a depth of 2 to 7 μm.
In the case of a two-row staggered arrangement as shown in the figure, the spacing between the rows is about 60.0 μm, and the spacing between the light emitting areas in the same row (that is, the arrangement pitch) is about 117.6 μm with respect to the center of the emission area 11.

2、3は化合物半導体1の表面に順次積層して設けら
れたSi3N4、SiO2、Al2O3等からなる第1、第2の絶縁被
膜で拡散膜や表面保護膜の場合には600〜1500Å、ピン
ホール対策膜や配線補強下地膜の場合は800〜2000Å、
光取出し・輝度調整膜の場合には900〜3000Å程度の厚
みの膜が用いられる。この第1の絶縁被膜2は発光領域
11の周囲を覆うように例えば発光領域に相当する位置毎
に35×10μmの透孔を持って化合物半導体1の表面に設
けられ、第2の絶縁被膜3は発光領域11を含む帯状部A
を除いて基板表面の第1の絶縁被膜2上に設けられてお
り、帯状部Aは例えば幅が100μmである。
Reference numerals 2 and 3 denote first and second insulating films made of Si 3 N 4 , SiO 2 , Al 2 O 3, etc., which are sequentially laminated on the surface of the compound semiconductor 1. Is 600 ~ 1500Å, 800 ~ 2000Å for pinhole countermeasure film and wiring reinforcement base film,
In the case of a light extraction / brightness adjustment film, a film having a thickness of about 900 to 3000 mm is used. This first insulating film 2 is a light emitting region
The second insulating film 3 is provided on the surface of the compound semiconductor 1 with a hole of 35 × 10 μm, for example, at a position corresponding to the light-emitting region so as to cover the periphery of the light-emitting region 11.
Is provided on the first insulating film 2 on the substrate surface except for the band-shaped portion A having a width of, for example, 100 μm.

4は、その絶縁被膜2、3の上に積層され、発光領域
11にオーミック接触のとられた電極で、Al、Cr等からな
る。この電極4は、発光領域11の近傍では発光領域がド
ット形状として所定の形・大きさをなすに支障のないよ
うに、例えば幅6μmと細くしまた発光領域の中央部を
横ぎるように配置され、化合物半導体1の端縁近傍では
配線領域(ワイヤボンドパットまたはバンプパット)と
なるので幅50〜100μmとして設けられており、その中
間では、例えば絶縁被膜3の端部(段部)に於て、リー
ド部として隣接配線と短絡事故を起こさない程度に幅を
広くしてもよい。そしてこの電極4は厚みが厚すぎると
肩崩れを生じたり発光領域11の発光状態の像に陰を落と
すので好ましくなく、薄すぎると断線を生じやすいの
で、実用的には厚さを1.0〜5μmとするのが好まし
い。また必要に応じて電極4には、その下方に配線時の
衝撃緩衝用の絶縁層、あるいは配線部分を除く上方に保
護用の絶縁層を設けてもよい。
4 is laminated on the insulating coatings 2 and 3 to form a light emitting region.
Electrode 11 in ohmic contact made of Al, Cr, etc. The electrode 4 is thinned to, for example, 6 μm in width in the vicinity of the light emitting region 11 so as not to hinder the formation of a predetermined shape and size as a dot shape, and is disposed so as to cross the center of the light emitting region. In the vicinity of the edge of the compound semiconductor 1, a wiring region (wire bond pad or bump pad) is formed, so that the width is set to 50 to 100 μm. Therefore, the width of the lead portion may be widened so as not to cause a short circuit accident with the adjacent wiring. If the thickness of the electrode 4 is too large, it is not preferable because the shoulder collapses or a shadow is cast on the image of the light emitting state of the light emitting region 11, and if the electrode 4 is too thin, disconnection easily occurs. It is preferred that If necessary, the electrode 4 may be provided with an insulating layer for buffering impact during wiring or a protective insulating layer above the electrode 4 except for the wiring portion.

5は化合物半導体1の裏面に設けられ、Au等からなる
共通電極である。この様な共通電極は、化合物半導体1
の表面側に設けることもできる。
Reference numeral 5 denotes a common electrode provided on the back surface of the compound semiconductor 1 and made of Au or the like. Such a common electrode is a compound semiconductor 1
Can also be provided on the surface side of.

(ト)発明の効果 以上のような構成により、電極は絶縁被膜の表面が段
階的に低くなって化合物半導体の表面に近づくので各々
の段差は小さく、各々の発光領域の近く、とりわけ発光
領域の相互間位置には絶縁被膜の界面がないから光伝播
の量は少なくなる。例えば上述の例では、発光領域の発
行状態の大きさは42×17μmと、四角形の発光領域の各
々の辺において1μmしか大きくならず、しかもその輪
郭は鮮明で、さらに隣接発光領域との光クロストーク
は、印字または投影された表示においては全く認められ
なかった。
(G) Effects of the Invention With the above-described configuration, the electrode has a stepwise lower surface of the insulating film and comes closer to the surface of the compound semiconductor. Since there is no interface between the insulating films at the positions between them, the amount of light propagation is reduced. For example, in the above-described example, the size of the emission state of the light-emitting region is 42 × 17 μm, which is only 1 μm larger on each side of the rectangular light-emitting region, and the outline is sharp, and the light crossing with the adjacent light-emitting region is further improved. No talk was observed on the printed or projected display.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明実施例の発光ダイオードアレイの断面
図、(第2図のX−X部)で、第2図はその発光ダイオ
ードアレイの要部平面図である。 1……化合物半導体、11……発行領域、2……第1の絶
縁被膜、3……第2の絶縁被膜、4……電極。
FIG. 1 is a cross-sectional view of a light emitting diode array according to an embodiment of the present invention (XX section in FIG. 2), and FIG. 2 is a plan view of a main part of the light emitting diode array. 1 ... Compound semiconductor, 11 ... Issue area, 2 ... First insulating coating, 3 ... Second insulating coating, 4 ... Electrode.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】半導体基板表面に整列して設けられた複数
の発光領域と、その発光領域の周囲を覆う第1の絶縁被
膜と、前記発光領域を含む帯状部を除いて基板表面に設
けられた第2の絶縁被膜と、発光領域の各々にオーミッ
ク接触され第2の絶縁被膜上に迄延在して設けられた電
極とを具備したことを特徴とする発光ダイオードアレ
イ。
A plurality of light-emitting regions arranged on the surface of the semiconductor substrate, a first insulating film covering the periphery of the light-emitting regions, and a plurality of light-emitting regions provided on the surface of the substrate except for a strip including the light-emitting regions. A light-emitting diode array comprising: a second insulating film; and an electrode provided in ohmic contact with each of the light-emitting regions and extending over the second insulating film.
JP33421089A 1989-12-22 1989-12-22 Light emitting diode array Expired - Fee Related JP2777442B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP33421089A JP2777442B2 (en) 1989-12-22 1989-12-22 Light emitting diode array

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33421089A JP2777442B2 (en) 1989-12-22 1989-12-22 Light emitting diode array

Publications (2)

Publication Number Publication Date
JPH03194977A JPH03194977A (en) 1991-08-26
JP2777442B2 true JP2777442B2 (en) 1998-07-16

Family

ID=18274774

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33421089A Expired - Fee Related JP2777442B2 (en) 1989-12-22 1989-12-22 Light emitting diode array

Country Status (1)

Country Link
JP (1) JP2777442B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104298078A (en) * 2009-05-14 2015-01-21 4233999加拿大股份有限公司 System for and method of providing high resolution images using monolithic arrays of light emitting diodes
TWI488332B (en) * 2012-10-31 2015-06-11 Nisho Image Tech Inc Structure of light emitting diode array and printing head and printing device for the same

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0610707Y2 (en) * 1985-10-02 1994-03-16 三洋電機株式会社 Light emitting diode

Also Published As

Publication number Publication date
JPH03194977A (en) 1991-08-26

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