JP2004006994A - Light-emitting diode array and optical printhead equipped with it - Google Patents

Light-emitting diode array and optical printhead equipped with it Download PDF

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JP2004006994A
JP2004006994A JP2003306982A JP2003306982A JP2004006994A JP 2004006994 A JP2004006994 A JP 2004006994A JP 2003306982 A JP2003306982 A JP 2003306982A JP 2003306982 A JP2003306982 A JP 2003306982A JP 2004006994 A JP2004006994 A JP 2004006994A
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light
emitting diode
diode array
electrode
electrode wiring
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JP3806707B2 (en
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Shoji Inaba
稲葉 昌治
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Tokyo Sanyo Electric Co Ltd
Sanyo Electric Co Ltd
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Tokyo Sanyo Electric Co Ltd
Tottori Sanyo Electric Co Ltd
Sanyo Electric Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/0212Auxiliary members for bonding areas, e.g. spacers
    • H01L2224/02122Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body
    • H01L2224/02163Auxiliary members for bonding areas, e.g. spacers being formed on the semiconductor or solid-state body on the bonding area
    • H01L2224/02165Reinforcing structures
    • H01L2224/02166Collar structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144Gold (Au) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/783Means for applying energy, e.g. heating means by means of pressure
    • H01L2224/78301Capillary
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8512Aligning
    • H01L2224/85148Aligning involving movement of a part of the bonding apparatus
    • H01L2224/85169Aligning involving movement of a part of the bonding apparatus being the upper part of the bonding apparatus, i.e. bonding head, e.g. capillary or wedge
    • H01L2224/8518Translational movements
    • H01L2224/85181Translational movements connecting first on the semiconductor or solid-state body, i.e. on-chip, regular stitch

Abstract

<P>PROBLEM TO BE SOLVED: To provide an optical printhead capable of reliably realizing wire bonding and performing high-reliability bonding in a light-emitting diode array of high density of 600 dpi or more. <P>SOLUTION: The light-emitting diode array where a plurality of light-emitting areas 21 and a separate longitudinal electrode 23 connected with the light-emitting areas 21 though an electrode wire 22 are disposed is characterized in that a protective film 25 is formed on the surface of the wire 22 and the surface of an edge section of the electrode 23 and the protective film on a long-side edge of the electrode 23 is removed. <P>COPYRIGHT: (C)2004,JPO

Description

 本発明は発光ダイオードアレイ及びそれを備える光プリントヘッドに関する。 The present invention relates to a light emitting diode array and an optical print head including the same.

 発光ダイオード(light emitting diode:LEDという)素子は、発光が鮮やかであること、駆動電圧が低く周辺回路が容易になるなどの理由により従来より表示デバイスとして幅広く使用されている。 2. Description of the Related Art Light emitting diode (LED) elements have been widely used as display devices in the past because of their vivid emission, low driving voltage, and easy peripheral circuits.

 電子写真方式を採用した光プリンタ等の光源等への応用を目的として、発光ダイオードアレイを用いた光プリントヘッドの研究が盛んに行われている。 光 Optical print heads using a light-emitting diode array have been actively studied for the purpose of application to a light source of an optical printer or the like employing an electrophotographic method.

 自己発光型の発光ダイオードアレイを光源とした光プリンタは、画像信号に応じて発光ダイオードアレイの各ドットを発光させ、分布屈折率レンズなどの等倍結像素子により、感光体ドラム上に露光して静電潜像を形成し、現像器でトナーを選択的に付着させたあと、普通紙などに付着したトナーを転写させることにより印字を行うものである。 An optical printer using a self-luminous light-emitting diode array as a light source emits each dot of the light-emitting diode array in response to an image signal, and exposes the photosensitive drum with a 1: 1 imaging element such as a distributed index lens. After forming an electrostatic latent image by using a developing device, toner is selectively adhered thereto, and then printing is performed by transferring the toner adhered to plain paper or the like.

 発光ダイオードアレイを用いたへッドは、(1)可動部がなく、かつ構成部品も少ないことから、小型化が可能となる、(2)アレイチップの接続により、長尺化が容易であるなどの特長を持つ。 A head using a light-emitting diode array can be downsized because (1) there are no moving parts and there are few components, and (2) it is easy to increase the length by connecting an array chip. With features such as.

 ところで、発光領域の密度が例えば600dpiの発光ダイオードアレイは、発光領域のピッチが42〜43μmとなり、発光領域の幅は、発光領域間の非発光領域の幅を考慮すると前記ピッチよりもさらに短くなる。また、発光領域上の電極は、その電極幅が42〜43μm以下の幅で、42〜43μmのピッチで形成されることになる。そして、発光領域上の電極と接続する配線用の電極は、ピッチが42〜43μmかそれ以下で、幅が42〜43μm以下の細幅に形成され、ボンディング用の幅広電極(パッド)に接続される。このように電極配線が形成された発光ダイオードアレイとこの発光ダイオードアレイを駆動する例えば駆動素子とは、ワイヤボンディング等によって電気的に接続する必要がある。 By the way, in a light emitting diode array having a light emitting region density of, for example, 600 dpi, the pitch of the light emitting region is 42 to 43 μm, and the width of the light emitting region is further shorter than the pitch in consideration of the width of the non-light emitting region between the light emitting regions. . Further, the electrodes on the light emitting region are formed with a width of 42 to 43 μm or less and a pitch of 42 to 43 μm. The wiring electrodes connected to the electrodes on the light emitting region are formed to have a narrow width of 42 to 43 μm or less and a width of 42 to 43 μm or less, and are connected to wide electrodes (pads) for bonding. You. It is necessary to electrically connect the light emitting diode array on which the electrode wiring is formed as described above to, for example, a driving element for driving the light emitting diode array by wire bonding or the like.

 現在最も幅の狭いボンディングを行うことが可能なステッチボンディングでも、ボンディング幅は40μmであり、ボンディング装置の位置精度を考慮すると更に20μm程度の幅が必要となる。つまり、ボンディング用電極の幅としては、少なくとも60μm程度を確保する必要がある。 (4) Even the stitch bonding which can perform the narrowest bonding at present has a bonding width of 40 μm, and further needs a width of about 20 μm in consideration of the positional accuracy of the bonding apparatus. That is, it is necessary to secure at least about 60 μm as the width of the bonding electrode.

 したがって、例えば600dpi以上のような高密度発光ダイオードアレイの場合では、ボンディング用の電極を一列に配列するとワイヤボンディングが困難であるので、千鳥状の2列に配列してボンディング用の電極ピッチを大きくしているが、それにも係わらず、ボンディング用電極の幅は60μm程度しか確保することができないので、発光ダイオードアレイと駆動素子とをワイヤボンディングによって配線するのは極めて困難になりつつある。 Therefore, in the case of a high-density light emitting diode array of, for example, 600 dpi or more, wire bonding is difficult if the bonding electrodes are arranged in a single row, and the bonding electrode pitch is increased by arranging in a staggered two rows. Nevertheless, the width of the bonding electrode can be as small as only about 60 μm. However, it is becoming extremely difficult to wire the light emitting diode array and the driving element by wire bonding.

 従来のこの種の光プリンタ用発光ダイオード(アレイ)として、例えば、特許文献1〜3に開示されたものがある。 As conventional light-emitting diodes (arrays) for this type of optical printer, there are, for example, those disclosed in Patent Documents 1 to 3.

 図4は上記文献記載の光プリンタ用発光ダイオードアレイを示す平面図であり、図5は図4のA−A’矢視断面図である。 FIG. 4 is a plan view showing a light emitting diode array for an optical printer described in the above document, and FIG. 5 is a sectional view taken along the line A-A 'in FIG.

 これらの図において、1はGaP,GaAsP,GaAlAs,GaAs等からなる化合物半導体であり、その表面には1列又は千鳥状に整列した複数の発光領域11を選択的拡散によって形成している。2,3,4は化合物半導体1の表面に順次積層して設けられたSi3N4,SiO2,Al2O3等からなる絶縁膜である。これら絶縁膜2,3,4は、発光領域の選択拡散膜や化合物半導体表面の保護膜、ピンホール対策膜や配線補強下地膜、光取出し・輝度調整膜等の目的で複数層設けられる。5は絶縁膜2,3の上に積層され、発光領域11にオーミック接触の取られたAl等からなる電極層であり、発光領域に接続する電極、ボンディング用の電極、これらを接続する配線用の電極となる。6は化合物半導体1の裏面に設けられたAu等からなる共通電極である。 In these figures, reference numeral 1 denotes a compound semiconductor made of GaP, GaAsP, GaAlAs, GaAs, etc., and a plurality of light emitting regions 11 arranged in a row or in a staggered pattern are formed on the surface thereof by selective diffusion. Reference numerals 2, 3, and 4 denote insulating films made of Si3 N4, SiO2, Al2 O3, and the like, which are sequentially laminated on the surface of the compound semiconductor 1. The insulating films 2, 3, and 4 are provided in a plurality of layers for the purpose of a selective diffusion film in the light emitting region, a protective film on the surface of the compound semiconductor, a pinhole countermeasure film, a wiring reinforcing base film, and a light extraction / brightness adjusting film. Reference numeral 5 denotes an electrode layer made of Al or the like, which is laminated on the insulating films 2 and 3 and has an ohmic contact with the light emitting region 11, for connecting to the light emitting region, for bonding, and for wiring for connecting these. Electrode. Reference numeral 6 denotes a common electrode made of Au or the like provided on the back surface of the compound semiconductor 1.

 ここで、例えば600dpi以上のような高密度発光ダイオードアレイになると、各発光ダイオードアレイの上面のボンディング用電極に直接ワイヤボンディングする方法では、以下のような問題点が発生する。 Here, in the case of a high-density light-emitting diode array of, for example, 600 dpi or more, the following problems occur in the method of performing wire bonding directly to the bonding electrode on the upper surface of each light-emitting diode array.

 すなわち、配線密度を高めるために、ボンディング用電極に接続する配線の電極幅、並びに隣接する配線の間隔を極めて小さくすると、アレイの洗浄工程や、ヘッドの組立て工程中に加わる外力によって配線電極が変形した場合に、変形した配線電極が隣接配線に容易に接触するので、腐蝕防止等のために各配線電極上に形成する保護膜を更に厚くする必要がある。例えば、300dpi程度の発光ダイオードアレイでは、0.2μm程度の無機膜(SiO2、SiN等)による保護膜の形成で済んでいたものが、600dpi以上のような高密度発光ダイオードアレイになると、上記薄膜では十分な保護機能が得られないため、絶縁膜4としてポリイミド系の材料を用いることが試みられている。 In other words, if the electrode width of the wiring connected to the bonding electrode and the distance between adjacent wirings are made extremely small in order to increase the wiring density, the wiring electrodes will be deformed by the external force applied during the array cleaning process and the head assembly process. In such a case, the deformed wiring electrode easily comes into contact with the adjacent wiring, so that it is necessary to further thicken the protective film formed on each wiring electrode to prevent corrosion and the like. For example, in a light emitting diode array of about 300 dpi, the formation of a protective film using an inorganic film (SiO 2, SiN, etc.) of about 0.2 μm is sufficient. However, since a sufficient protection function cannot be obtained, it has been attempted to use a polyimide-based material as the insulating film 4.

 図6〜図8は、絶縁膜4として例えばポリイミド系の材料を用いた発光ダイオードアレイへのワイヤボンディングを説明するための図である。 FIGS. 6 to 8 are diagrams for explaining wire bonding to a light-emitting diode array using, for example, a polyimide-based material as the insulating film 4.

 図6に示すように、絶縁膜4として例えばポリイミド系の材料を用いる場合、電極層5上にポリイミド系の厚膜溶液をスピンオンして保護膜となる絶縁膜4を形成し、さらに絶縁膜4上部をエッチングによりパターニングして配線接続用の透孔4aを設ける。この配線接続用の透孔4aは、例えば図7のハッチング部分に示すように開口され、電極層5上に幅広の接続領域5aが形成される。 As shown in FIG. 6, when, for example, a polyimide-based material is used as the insulating film 4, a polyimide-based thick film solution is spun on the electrode layer 5 to form the insulating film 4 serving as a protective film. The upper portion is patterned by etching to provide a through hole 4a for wiring connection. The wiring connection through hole 4 a is opened, for example, as shown by a hatched portion in FIG. 7, and a wide connection region 5 a is formed on the electrode layer 5.

 そして図8に示すように、電極層5の接続領域5a上を、キャピラリ12を用いて例えば金線からなるボンディングワイヤ13によりボールボンディングし、さらにボールボンディングした接続領域5aと駆動素子の出力端子とをボンディングワイヤ13により各々接続する。または、まず駆動素子の出力端子をボンディングワイヤ13によりボールボンディングし、次いでボールボンディングした駆動素子の出力端子と接続領域5aとをボンディングワイヤ13により各々接続するようにしてもよい。この場合には、セカンドボンディングとなる接続領域5a上にボール部分がないためボンディングワイヤ13を潰しながら擦れるようにボンディングする必要がある。
実公平7−36754号公報 特開平5−347430号公報 特開平5−155063号公報
Then, as shown in FIG. 8, the connection region 5a of the electrode layer 5 is ball-bonded by using a capillary 12 with a bonding wire 13 made of, for example, a gold wire. Are respectively connected by bonding wires 13. Alternatively, the output terminals of the drive elements may be first ball-bonded with the bonding wires 13, and then the output terminals of the ball-bonded drive elements and the connection regions 5 a may be connected with the bonding wires 13. In this case, since there is no ball portion on the connection region 5a where the second bonding is to be performed, it is necessary to bond the bonding wire 13 so as to rub it while crushing it.
Japanese Utility Model Publication No. 7-36754 JP-A-5-347430 JP-A-5-155063

 ところが、図6に示すように例えばポリイミド系の厚膜(1〜2μm)で保護する場合、接続領域上にこのような厚膜があるので、ボンディング時にボンディングワイヤが適当に潰れず接続が不十分であるという問題点が生じた。特に、セカンドボンディングにより接続領域上にボンディングワイヤをボンディングする場合には、接続領域上の厚膜が高さ方向の障害となって接続が不完全になることがあり、最悪の場合にはキャピラリが厚膜に衝突しボンディング自体ができないことがあった。また、ボンディング強度が不十分であると、ボンディング部の異種金属(通常はΑl/Au)同士の熱膨張の差異や経時変化によって断線等が発生する確率が高くなる。 However, as shown in FIG. 6, in the case of protection with a polyimide-based thick film (1 to 2 μm), such a thick film exists on the connection region, so that the bonding wire is not appropriately broken during bonding and the connection is insufficient. Is a problem. In particular, when a bonding wire is bonded on the connection region by second bonding, the thick film on the connection region may obstruct the height direction and the connection may be incomplete. In the worst case, the capillary may not be connected. In some cases, the bonding itself could not be performed due to collision with the thick film. In addition, if the bonding strength is insufficient, the probability of occurrence of disconnection or the like due to a difference in thermal expansion between different metals (usually Αl / Au) in the bonding portion or a change with time increases.

 以上はボールボンディングの場合であるが、高密度接続が可能なステッチボンディングについても同様な不具合がある。 The above is the case of ball bonding, but there is a similar problem with stitch bonding that enables high-density connection.

 本発明は、上述した従来の問題点を解消することを目的とし、例えば600dpi以上の高解像度が要求され、ワイヤボンディングによる高密度接続が必要な場合において、確実にワイヤボンディングを実現でき、信頼性の高いボンディングが可能な発光ダイオードアレイ、及びそれを備える光プリントヘッドを提供することを目的とする。 An object of the present invention is to solve the above-described conventional problems. For example, when high resolution of 600 dpi or more is required and high-density connection by wire bonding is required, wire bonding can be reliably realized. It is an object of the present invention to provide a light emitting diode array capable of performing high bonding and an optical print head including the same.

 本発明の発光ダイオードアレイは、請求項1に記載のように、複数の発光領域と、該発光領域に電極配線を介して接続された縦長の個別電極とを、配置してなる発光ダイオードアレイにおいて、前記電極配線の表面と前記個別電極のエッジ部分の表面に保護膜を形成するとともに、前記個別電極の長辺エッジ上の保護膜は除去されていることを特徴とする。 A light-emitting diode array according to the present invention is a light-emitting diode array in which a plurality of light-emitting regions and a vertically long individual electrode connected to the light-emitting region via an electrode wiring are arranged. A protective film is formed on a surface of the electrode wiring and a surface of an edge portion of the individual electrode, and the protective film on a long side edge of the individual electrode is removed.

 本発明の発光ダイオードアレイは、請求項2に記載のように、整列された複数の発光領域と、該発光領域に電極配線を介して接続され千鳥状に整列された縦長の個別電極とを、複数列配置してなる発光ダイオードアレイにおいて、千鳥状1列目の個別電極間を通り千鳥状2列目の個別電極に配線される電極配線を保護するように、前記電極配線の表面に保護膜を形成するとともに、前記個別電極の大部分を露出させた状態で前記個別電極のエッジ部分の表面に保護膜を形成し、前記個別電極の長辺エッジ上の保護膜は除去されていることを特徴とする。 The light-emitting diode array of the present invention, as described in claim 2, a plurality of aligned light-emitting regions, and vertically elongated individual electrodes connected to the light-emitting region via electrode wiring and arranged in a staggered manner, In a light-emitting diode array having a plurality of rows, a protective film is formed on the surface of the electrode wiring so as to protect the electrode wiring which is passed between the individual electrodes in the staggered first row and is wired to the individual electrodes in the second staggered row. And forming a protective film on the surface of the edge portion of the individual electrode in a state where most of the individual electrode is exposed, and that the protective film on the long side edge of the individual electrode is removed. Features.

 本発明の発光ダイオードアレイは、請求項3に記載のように、整列された複数の発光領域と、該発光領域に電極配線を介して接続され、前記発光領域の整列方向と同方向に隣接して整列された少なくとも2列以上の個別電極とを備える発光ダイオードアレイにおいて、少なくとも前記個別電極部分を除く電極配線の表面と、前記個別電極の列の間に保護膜を備えたことを特徴とする。 According to a third aspect of the present invention, there is provided the light emitting diode array, wherein the plurality of aligned light emitting regions are connected to the light emitting regions via an electrode wiring, and are adjacent to each other in the same direction as the alignment direction of the light emitting regions. A light-emitting diode array comprising at least two or more rows of individual electrodes arranged in a line, wherein a protective film is provided between the surface of the electrode wiring except at least the individual electrode portion and the row of the individual electrodes. .

 本発明の発光ダイオードアレイは、請求項4に記載のように、前記保護膜とは別に、前記発光領域を覆う薄膜を個別電極の腐蝕防止用として形成していることを特徴とする。 In the light emitting diode array according to the present invention, a thin film covering the light emitting region is formed separately from the protective film to prevent corrosion of the individual electrodes.

 本発明の光プリントヘッドは、請求項5に記載のように、発光ダイオードアレイと、このアレイを駆動するため駆動素子と、前記アレイと駆動素子間をボンディングによって電気的に接続する金属細線とを備える光プリントヘッドにおいて、前記発光ダイオードアレイとして上記の発光ダイオードアレイを用いたことを特徴とする。 An optical print head according to the present invention includes a light emitting diode array, a driving element for driving the array, and a thin metal wire electrically connecting the array and the driving element by bonding. In the optical print head provided, the light emitting diode array is used as the light emitting diode array.

 本発明の光プリントヘッドは、請求項6に記載のように、発光ダイオードアレイと、このアレイを駆動するため駆動素子と、前記アレイと駆動素子間をボンディングによって電気的に接続する金属細線とを備え、金属細線の第1ボンディングが前記駆動素子側に行われ、第2ボンディングが前記発光ダイオードアレイ側に行われた光プリントヘッドにおいて、前記発光ダイオードアレイとして上記の発光ダイオードアレイを用いたことを特徴とする。 An optical print head according to the present invention includes a light emitting diode array, a driving element for driving the array, and a thin metal wire electrically connecting the array and the driving element by bonding. In the optical print head, wherein the first bonding of the thin metal wire is performed on the driving element side and the second bonding is performed on the light emitting diode array side, the light emitting diode array is used as the light emitting diode array. Features.

 本発明に係る発光ダイオードアレイ、並びに光プリントヘッドは、例えば600dpi以上の高密度な発光ダイオードアレイにおいて、電極配線の表面保護を図るとともに、確実なボンディングを行うことができ、信頼性の高い光プリントヘッドを実現することができる。 The light-emitting diode array and the optical print head according to the present invention can provide a highly reliable optical print in a high-density light-emitting diode array of, for example, 600 dpi or more, while protecting the surface of the electrode wiring and performing reliable bonding. A head can be realized.

 図1は本発明の実施形態に係る発光ダイオードアレイの構造を示す平面図であり、この発光ダイオードアレイは、ドット密度が600dpi相当である。 FIG. 1 is a plan view showing the structure of a light emitting diode array according to an embodiment of the present invention. This light emitting diode array has a dot density equivalent to 600 dpi.

 図2は図1の発光ダイオードアレイのA−A′矢視断面図、図3は図1の発光ダイオードアレイのB−B′矢視断面図である。 FIG. 2 is a cross-sectional view of the light-emitting diode array of FIG. 1 taken along the line AA ', and FIG. 3 is a cross-sectional view of the light-emitting diode array of FIG.

 これらの図において、20は、発光領域21を構成する発光ダイオードを複数個集積した発光ダイオードアレイであり、GaP,GaAsP,GaAlAs,GaAs等からなる化合物半導体を主たる材料として構成している。発光ダイオードアレイ20の表面には1列に整列した複数の発光領域21を選択的拡散によって形成し、これらを600dpiのピッチ(約42〜43μm)で直線状に配設されている。この発光領域21は、光プリンタヘッドとして組み立てられたとき、発光ダイオードアレイの継目部分においても等間隔(42.3μm)で、かつ直線性良く整列して配置される。 In these figures, reference numeral 20 denotes a light-emitting diode array in which a plurality of light-emitting diodes constituting the light-emitting region 21 are integrated, and the main material is a compound semiconductor made of GaP, GaAsP, GaAlAs, GaAs, or the like. A plurality of light emitting regions 21 arranged in a line are formed on the surface of the light emitting diode array 20 by selective diffusion, and these are arranged linearly at a pitch of 600 dpi (about 42 to 43 μm). When the light emitting regions 21 are assembled as an optical printer head, they are arranged at equal intervals (42.3 μm) and with good linearity even at the joint portion of the light emitting diode array.

 この発光領域21にはオーミック接触の取られたAl等からなる電極配線22が接続され、電極配線22の他端は個別電極(アノード電極)の電極配線パッド23として千鳥状2列に整列配置される。電極配線パッド23は、ワイヤボンディング用であり、例えば幅が60μm、長さが120μmの縦長で、各電極配線パッド23のエッジ部は除去され、また、千鳥状2列の駆動素子側の電極配線パッド23の電極配線22部分は幅広23aに形成されている。千鳥状1列目の電極配線パッド23と千鳥状2列目の電極配線パッド23とは、例えば横方向が40.5μm、縦方向が135μmの千鳥段差を有する。 An electrode wiring 22 made of Al or the like in ohmic contact is connected to the light emitting region 21, and the other end of the electrode wiring 22 is arranged in two rows in a zigzag pattern as electrode wiring pads 23 of individual electrodes (anode electrodes). You. The electrode wiring pads 23 are for wire bonding. For example, the width is 60 μm and the length is 120 μm. The electrode wiring pads 23 are vertically long. Edges of each electrode wiring pad 23 are removed. The electrode wiring 22 portion of the pad 23 is formed to be wide 23a. The staggered first row of electrode wiring pads 23 and the staggered second row of electrode wiring pads 23 have, for example, a staggered step of 40.5 μm in the horizontal direction and 135 μm in the vertical direction.

 また、図3に示すように発光ダイオードアレイ20の裏面には全面にわたってAu等からなる共通電極(カソード電極)24が形成されている。 As shown in FIG. 3, a common electrode (cathode electrode) 24 made of Au or the like is formed on the entire back surface of the light emitting diode array 20.

 このような発光ダイオードアレイ20において、発光領域21と電極配線パッド23部を除く電極配線22の表面に、ポリイミド系の材料からなる厚膜の表面保護膜25を形成する。図1のハッチング部分は、表面保護膜25の形成領域を示しており、このハッチング部分に示すように高密度配線のために極細線化された電極配線22の表面部分のみを覆うように表面保護膜25を形成し、その他の領域、特に各電極配線パッド23上には表面保護膜25を被膜しない構成とする。すなわち、従来の一般的な配線ルールでは、腐蝕防止等のため電極配線表面及び電極配線パッドのエッジ部分を保護膜により保護しているが、本実施形態では、一般的な配線ルールを留保し、電極配線パッド23部分に関しては厚膜による保護をせず、高密度配線のために極細線化された電極配線22の表面部分のみに表面保護膜25を形成するものである。 In such a light emitting diode array 20, a thick surface protection film 25 made of a polyimide material is formed on the surface of the electrode wiring 22 excluding the light emitting region 21 and the electrode wiring pad 23. The hatched portion in FIG. 1 shows the region where the surface protection film 25 is formed. As shown in the hatched portion, the surface protection film is formed so as to cover only the surface portion of the electrode wiring 22 which has been thinned for high-density wiring. The film 25 is formed, and the surface protection film 25 is not coated on other regions, especially on the respective electrode wiring pads 23. That is, in the conventional general wiring rule, the surface of the electrode wiring and the edge portion of the electrode wiring pad are protected by the protective film for corrosion prevention or the like, but in the present embodiment, the general wiring rule is reserved. The electrode wiring pad 23 is not protected by a thick film, and the surface protection film 25 is formed only on the surface of the electrode wiring 22 which is ultra-fine for high-density wiring.

 表面保護膜25が被膜されていない電極配線パッド23は、エッジ部分の厚膜による影響を受けることなく、確実に駆動素子の出力端子(図示せず)とワイヤボンディングされて電気的に接続される。 The electrode wiring pad 23 on which the surface protection film 25 is not coated is reliably connected to an output terminal (not shown) of the driving element by wire bonding without being affected by the thick film at the edge portion and is electrically connected. .

 表面保護膜25の一部は、千鳥状1列目の電極配線パッド23と千鳥状2列目の電極配線パッド23との間隔部分に保護膜25aとして配置されている。この保護膜25aは、千鳥状1列目の電極配線パッド23に接続したワイヤボンディング用の金属細線27が、隣接する千鳥状2列目の電極配線パッド23に接触するのを防ぐように機能する。 (4) A part of the surface protective film 25 is disposed as a protective film 25a in a space between the first staggered electrode wiring pads 23 and the second staggered electrode wiring pads 23. The protective film 25a functions so as to prevent the thin metal wire 27 for wire bonding connected to the staggered first-row electrode wiring pads 23 from contacting the adjacent staggered second-row electrode wiring pads 23. .

 以下、上記発光ダイオードアレイ20の製造方法、並びにそれを光プリントヘッドに用いる場合の製造方法について説明する。 Hereinafter, a method for manufacturing the light-emitting diode array 20 and a method for using the same in an optical print head will be described.

 発光ダイオードアレイ20は、GaP,GaAsP,GaAlAs,GaAs等からなる化合物半導体により構成され、その表面には1列に整列した複数の発光領域21とこの発光領域21にオーミック接触の取られたAl等からなる電極配線22を有し、電極配線22の他端は個別電極(アノード電極)の電極配線パッド23として千鳥状2列に整列配置される。 The light-emitting diode array 20 is made of a compound semiconductor made of GaP, GaAsP, GaAlAs, GaAs, or the like. , And the other end of the electrode wiring 22 is arranged in two lines in a staggered manner as electrode wiring pads 23 of individual electrodes (anode electrodes).

 また、図3に示すように個別発光素子20の裏面にはAu等からなる共通電極(カソード電極)24が形成されている。 (3) As shown in FIG. 3, a common electrode (cathode electrode) 24 made of Au or the like is formed on the back surface of the individual light emitting element 20.

 この状態で、電極配線22及び電極配線パッド23部を含む発光ダイオードアレイ20表面上にポリイミド系の厚膜溶液をスピンオンして1μm程度の厚膜の表面保護膜25を形成する。 In this state, a polyimide-based thick film solution is spun on the surface of the light emitting diode array 20 including the electrode wiring 22 and the electrode wiring pad 23 to form a surface protection film 25 having a thickness of about 1 μm.

 次いで、図1のハッチング部分に示す形状のマスクパターン(レジスト)を用いてエッチングし、さらにこのレジストを除去して、発光領域21と電極配線パッド23部を除く電極配線22の表面のみにポリイミド系の材料からなる厚膜の表面保護膜25を形成する。 Then, etching is performed using a mask pattern (resist) having a shape shown by hatching in FIG. 1, and the resist is further removed, so that a polyimide-based material is formed only on the surface of the electrode wiring 22 except for the light emitting region 21 and the electrode wiring pad 23. A thick surface protection film 25 made of the above material is formed.

 これにより、図1のハッチング部分に示すように、高密度配線のために極細線化された電極配線22の表面部分のみを覆うように表面保護膜25が形成され、各電極配線パッド23上には表面保護膜25は被膜されない。また、発光領域21表面にも表面保護膜25は形成されない。 Thereby, as shown by the hatched portion in FIG. 1, the surface protection film 25 is formed so as to cover only the surface portion of the electrode wiring 22 which has been thinned for high-density wiring. The surface protective film 25 is not coated. Also, the surface protection film 25 is not formed on the surface of the light emitting region 21.

 厚膜の表面保護膜25が必要とされるのは、高密度配線のための細線化した電極配線22の保護のためであり、特に、千鳥状1列目の各電極配線パッド23間を通り千鳥状2列目の電極配線パッド23に配線される電極配線22の保護のためである。すなわち、この高密度配線の細い配線部分が保護できればその目的は達成できるので、電極配線22の表面部分のみを覆うように表面保護膜25を形成し、各電極配線パッド23上には表面保護膜25を被膜しない。 The thick surface protection film 25 is required to protect the thinned electrode wiring 22 for high-density wiring. In particular, the thick surface protection film 25 passes between the electrode wiring pads 23 in the staggered first row. This is for protection of the electrode wiring 22 that is wired to the electrode wiring pads 23 in the staggered second column. That is, if the thin wiring portion of the high-density wiring can be protected, the object can be achieved. 25 is not coated.

 次いで、個別電極となる電極配線パッド23と図示しない駆動素子の出力端子とをワイヤボンド法による金線等の金属細線(ボンディングワイヤ)27により各々電気的に接続する。電極配線パッド23上には、エッジ部分を含め接続領域全面に表面保護膜(厚膜)25が存在しないので、駆動素子側に第1ボンディングを行った後、電極配線パッド23上に第2ボンディングを行って接続領域上に金属細線27をボンディングする場合であっても、接続領域上の厚膜が高さ方向の障害となって接続が不完全になることがなく、十分なボンディング強度を得ることができ、信頼性の高い光プリントヘッドが実現できる。 Next, the electrode wiring pads 23 serving as individual electrodes and the output terminals of the driving elements (not shown) are electrically connected to each other by thin metal wires (bonding wires) 27 such as gold wires by a wire bonding method. Since the surface protection film (thick film) 25 does not exist on the entire surface of the connection region including the edge portion on the electrode wiring pad 23, the first bonding is performed on the drive element side, and then the second bonding is performed on the electrode wiring pad 23. And bonding the thin metal wire 27 to the connection region by performing the above-described process, the thick film on the connection region does not obstruct the height direction and the connection is not incomplete, and a sufficient bonding strength is obtained. And a highly reliable optical print head can be realized.

 ところで、電極配線パッド23上には表面保護膜25が被膜されていないので、この電極配線パッド23表面上の腐蝕防止等の保護は図られないことになる。しかし、この電極配線パッド23は、例えば幅が60μm、長さが120μmであり、高密度配線電極22(最小部分は数μm程度)の幅と比べて比較にならない程面積が大きいので、電極配線パッド23表面上である程度の腐蝕が進行したとしても基本的には問題とならない。 Since the surface protective film 25 is not coated on the electrode wiring pad 23, protection such as corrosion prevention on the surface of the electrode wiring pad 23 cannot be achieved. However, the electrode wiring pad 23 has, for example, a width of 60 μm and a length of 120 μm, and has an area that is too large to be compared with the width of the high-density wiring electrode 22 (the minimum part is about several μm). Even if a certain degree of corrosion progresses on the surface of the pad 23, there is basically no problem.

 但し、上記電極配線パッド23の腐蝕防止を図るために、(1)電極配線パッド23上にワニス等を塗る、または(2)腐蝕防止用の薄膜を形成する、方法を採ることができる。このようにすれば、電極配線パッド23上における腐蝕を防止することができ、より信頼性を高めることができる。本実施形態では、上記(2)腐蝕防止用の薄膜を形成する方法を採用した。図2及び図3には、この目的で形成した腐蝕防止用被膜26を示している。この場合の腐蝕防止用被膜26の形成は、上述したポリイミド系の材料からなる厚膜の表面保護膜25と異なり、単に腐蝕を防止するための薄膜であるため、窒化ケイ素(Si3N4)、酸化ケイ素(SiO2)等による薄い無機膜の形成で済む。さらに、このような窒化ケイ素、酸化ケイ素よる無機膜は、光取出し・輝度調整膜等の別の目的で発光領域21上を覆う必要があり、本実施形態では、上記2つの目的を兼ねて窒化ケイ素による被膜の形成を行った。 However, in order to prevent corrosion of the electrode wiring pad 23, a method of (1) applying a varnish or the like on the electrode wiring pad 23 or (2) forming a thin film for corrosion prevention can be adopted. In this way, corrosion on the electrode wiring pads 23 can be prevented, and reliability can be further improved. In the present embodiment, the method (2) of forming a thin film for preventing corrosion is adopted. 2 and 3 show a corrosion prevention film 26 formed for this purpose. In this case, the formation of the corrosion prevention coating 26 is different from the thick surface protection film 25 made of a polyimide-based material described above, and is merely a thin film for preventing corrosion. Therefore, silicon nitride (Si3 N4), silicon oxide It is sufficient to form a thin inorganic film by (SiO2) or the like. Further, such an inorganic film made of silicon nitride or silicon oxide needs to cover the light emitting region 21 for another purpose such as a light extraction / brightness adjustment film. In the present embodiment, the nitride film serves both of the two purposes. A film was formed with silicon.

 以上説明したように、実施形態に係る光プリントヘッドは、発光ダイオードアレイの発光領域21と電極配線パッド23(個別電極)を除く電極配線22の表面のみにポリイミド系の材料からなる厚膜の表面保護膜25を形成するように構成したので、電極配線22の表面部分には高密度配線に伴う十分な厚さの保護膜を形成して電極配線22の保護の実効(電極配線22の外力による変形防止、変形に伴う短絡事故防止)を図ることができるとともに、電極配線パッド23と駆動素子とをワイヤボンディングする場合にも、表面保護膜25上に高さ方向の厚膜の障害がないため十分なボンディング強度を得ることができ、信頼性の高い光プリントヘッドを実現することができる。 As described above, the optical print head according to the embodiment has the surface of the thick film made of a polyimide-based material only on the surface of the electrode wiring 22 except for the light emitting region 21 of the light emitting diode array and the electrode wiring pad 23 (individual electrode). Since the protective film 25 is formed, a protective film having a sufficient thickness accompanying the high-density wiring is formed on the surface of the electrode wiring 22 to effectively protect the electrode wiring 22 (by the external force of the electrode wiring 22). Deformation and short-circuit accidents caused by the deformation), and there is no obstruction of the thick film in the height direction on the surface protection film 25 when the electrode wiring pad 23 and the driving element are wire-bonded. A sufficient bonding strength can be obtained, and a highly reliable optical print head can be realized.

 また、表面保護膜の形成のマスクの形状変更のみで済むため、従来例と比較して特別な部材や製造工程の増大は一切なく、容易かつ直ちに実施可能であるという優れた効果を有する。 た め Since only the shape of the mask for forming the surface protective film needs to be changed, there is no special member or an increase in the number of manufacturing steps as compared with the conventional example, and there is an excellent effect that it can be easily and immediately implemented.

 したがって、本発光ダイオードアレイの構造では、電極配線パッドが現状のワイヤーボンディング技術で十分接続可能な配置構造をとれるために、600dpi以上のような高密度な光プリントヘッドが可能である。 Therefore, in the structure of the present light-emitting diode array, a high-density optical print head of 600 dpi or more is possible because an arrangement structure in which the electrode wiring pads can be sufficiently connected by the current wire bonding technology can be obtained.

 なお、本実施形態の発光ダイオードアレイでは、電極配線22の表面部分を覆うように表面保護膜25を形成しているが、少なくとも電極配線パッド(個別電極)23部分を除く電極配線22の表面に表面保護膜25を備えた構成であれば、どのような構成でもよく、要は、ボンディング可能な十分な幅の接続領域が確保されていればよい。例えば、前記図1に示すように千鳥状2列の駆動素子側の電極配線パッド23の電極配線22部分は、電極配線22の補強のため幅広23aに形成されているが、この幅広23aの半分まで表面保護膜25を覆うようにしている。 In the light emitting diode array of the present embodiment, the surface protection film 25 is formed so as to cover the surface portion of the electrode wiring 22, but at least the surface of the electrode wiring 22 excluding the electrode wiring pad (individual electrode) 23 portion. Any structure may be used as long as the structure includes the surface protection film 25. In short, it is sufficient that a connection region having a sufficient width capable of bonding is secured. For example, as shown in FIG. 1, the electrode wiring 22 portion of the electrode wiring pads 23 on the drive element side in two rows in a staggered manner is formed to have a wide width 23 a for reinforcing the electrode wiring 22. Up to the surface protection film 25.

 また、本実施形態では、電極配線パッド(個別電極)23部分を除く電極配線22の表面に表面保護膜25を形成しているが、この表面保護膜25の膜厚が、個別電極の膜厚以下のときも本実施形態と同様な効果を得ることができることは勿論である。 Further, in the present embodiment, the surface protection film 25 is formed on the surface of the electrode wiring 22 except for the electrode wiring pad (individual electrode) 23 portion. Of course, the same effects as in the present embodiment can be obtained in the following cases.

 基本的には、電極配線パッド(個別電極)23上において、表面保護膜25の厚膜がボンデイングの支障がない状態で形成されていればよい。つまり、電極配線パッド23の幅は光プリントヘッドの高密度(高解像度)化に伴って狭くなる傾向にあるので、電極配線パッド23の幅方向(電極配線パッド23の配列方向)に位置するエッジの上に表面保護膜25が形成されると、上述のようにワイヤボンディングの支障になる。よって、電極配線パッド23のエッジの内、電極配線パッド23の幅方向に位置するエッジ上に表面保護膜25を形成することは好ましくない。しかしながら、電極配線パッド23の長さは光プリントヘッドの高密度(高解像度)化に係わらず比較的自由に設定することができる。したがって、電極配線パッド23が縦長に形成され、その長さが、上述のようなワイヤボンディングの支障にならない長さであれば、電極配線パッド23の長さ方向(電極配線パッド23の配列方向と直交する方向)のエッジ(短辺エッジ)に限り、例えば図1に示すような位置に表面保護膜25bを形成しても良い。 Basically, it is only necessary that the thick film of the surface protection film 25 be formed on the electrode wiring pad (individual electrode) 23 without any hindrance to bonding. That is, since the width of the electrode wiring pad 23 tends to become narrower as the density of the optical print head becomes higher (higher resolution), the edge located in the width direction of the electrode wiring pad 23 (the arrangement direction of the electrode wiring pad 23). When the surface protection film 25 is formed on the surface, the wire bonding is hindered as described above. Therefore, it is not preferable to form the surface protection film 25 on the edge of the electrode wiring pad 23 in the width direction of the electrode wiring pad 23. However, the length of the electrode wiring pad 23 can be set relatively freely regardless of the high density (high resolution) of the optical print head. Therefore, if the electrode wiring pad 23 is formed to be vertically long and the length does not hinder the wire bonding as described above, the length direction of the electrode wiring pad 23 (the arrangement direction of the electrode wiring pad 23) The surface protective film 25b may be formed only at the edge (short side edge) of the direction (perpendicular to the direction), for example, at the position shown in FIG.

 すなわち、従来と同様に、電極配線パッド23の大部分を表面を露出させ、電極配線パッド23のエッジ部分のみを覆うように表面保護膜25を形成するが、電極配線パッド23が縦長であれば、電極配線パッド23の幅方向(長辺エッジ上)の表面保護膜25は除去し、電極配線パッド23の長さ方向(短辺エッジ上)の表面保護膜25のみを残すように、表面保護膜25bを形成することができる。このように、電極配線パッド23の各々に、その表面の内、長さ方向のエッジ(短辺エッジ)、特に金属細線27と平面的な重なりを持つエッジのみに表面保護膜25bを形成すれば、上記保護膜25aと同様に、電極配線パッド23の長さ方向に沿ってワイヤボンディングされる金属細線27が垂れ下がったときに、垂れ下がった金属細線27の一部を保護膜25bが支え、金属細線27と隣接する電極配線パッド23との接触(短絡)を未然に防止することができる。 That is, as in the conventional case, the surface protection film 25 is formed so as to expose most of the surface of the electrode wiring pad 23 and cover only the edge portion of the electrode wiring pad 23. If the electrode wiring pad 23 is vertically long, Then, the surface protection film 25 in the width direction (on the long side edge) of the electrode wiring pad 23 is removed, and the surface protection film 25 is left so as to leave only the surface protection film 25 in the length direction (on the short side edge) of the electrode wiring pad 23. The film 25b can be formed. As described above, if the surface protection film 25b is formed on each of the electrode wiring pads 23 only at the edge in the length direction (short side edge), particularly at the edge having a planar overlap with the thin metal wire 27, of the surface thereof. Similarly to the above-described protective film 25a, when the thin metal wire 27 to be wire-bonded hangs down along the length direction of the electrode wiring pad 23, a part of the hanging thin metal wire 27 is supported by the protective film 25b. The contact (short circuit) between the electrode wiring pad 27 and the adjacent electrode wiring pad 23 can be prevented beforehand.

 また、表面保護膜は、ポリイミドが一般的であるが、1μm程度以上の厚膜になってもクラッキングが入らない膜であればどのような膜でもよく、例えばケイ素化合物に有機バインダーを添加したものでもよい。 The surface protective film is generally made of polyimide, but may be any film as long as it does not crack even if it becomes a thick film of about 1 μm or more, for example, a compound obtained by adding an organic binder to a silicon compound. May be.

 また、本実施形態では、個別電極の腐蝕防止用として窒化ケイ素膜による被膜(腐蝕防止用被膜26)の形成を行っている。この薄膜は発光領域部分の反射防止膜を兼用するのを目的の1つとしているので、窒化ケイ素膜を使用しているが、薄膜の表面保護としては酸化ケイ素膜も使用可能である。但し、窒化ケイ素膜は屈折率が酸化ケイ素膜より大きく反射防止効果が大きいこと、さらには疎水性が高く信頼性が高いので窒化ケイ素膜使用が適当である。 In the present embodiment, a film made of a silicon nitride film (corrosion preventing film 26) is formed to prevent corrosion of the individual electrodes. Since the purpose of this thin film is to serve also as an antireflection film in the light emitting region, a silicon nitride film is used. However, a silicon oxide film can also be used to protect the surface of the thin film. However, since the silicon nitride film has a larger refractive index than the silicon oxide film and a large antireflection effect, and further has high hydrophobicity and high reliability, it is appropriate to use the silicon nitride film.

 また、本実施形態では、600dpi相当のアレイについて説明したが、より高密度な、例えば、1200dpiなどのアレイにも、当然適用可能である。 Also, in the present embodiment, an array corresponding to 600 dpi has been described, but the present invention is naturally applicable to an array having a higher density, for example, 1200 dpi.

 さらに、本実施形態では、異種金属(通常はΑl/Au)同士をボンディングするボールボンディングについて説明したが、高密度接続が可能なステッチボンディングについても同様な効果を得ることができる。 {Furthermore, in the present embodiment, ball bonding for bonding different metals (usually $ 1 / Au) has been described, but the same effect can be obtained with stitch bonding that enables high-density connection.

 また、上記実施形態に係る光プリントヘッドが、上述した構造をとるものであれば、どのような構成でもよく、その製造プロセス、基板の種類、電極等の個数及び大きさ、千鳥状配置の列数を含む配置状態等は上記実施形態に限定されない。 The optical print head according to the embodiment may have any configuration as long as it has the above-described structure. The manufacturing process, the type of the substrate, the number and size of the electrodes and the like, and the rows in a staggered arrangement. The arrangement state including the number is not limited to the above embodiment.

 本発明は、600dpi、1200dpiなどの高密度なアレイに適用可能である。そして、このようなアレイを備える光プリントヘッドに適用可能である。 The present invention is applicable to high-density arrays such as 600 dpi and 1200 dpi. The present invention is applicable to an optical print head having such an array.

本発明を適用した実施形態に係る発光ダイオードアレイの構造を示す平面図である。It is a top view showing the structure of the light emitting diode array concerning the embodiment to which the present invention is applied. 図1のA−A′矢視断面図である。FIG. 2 is a sectional view taken along the line AA ′ in FIG. 1. 図1のB−B′矢視断面図である。FIG. 2 is a sectional view taken along the line BB ′ in FIG. 1. 従来の光プリンタ用発光ダイオードアレイを示す平面図である。FIG. 9 is a plan view showing a conventional light emitting diode array for an optical printer. 図4のA−A’矢視断面図である。FIG. 5 is a sectional view taken along the line A-A ′ in FIG. 4. 従来の発光ダイオードアレイのワイヤボンディングを説明するための断面図である。FIG. 9 is a cross-sectional view illustrating wire bonding of a conventional light emitting diode array. 従来の発光ダイオードアレイのワイヤボンディングを説明するための平面図である。FIG. 9 is a plan view for explaining wire bonding of a conventional light emitting diode array. 従来の発光ダイオードアレイのワイヤボンディングを説明するための断面図である。FIG. 9 is a cross-sectional view illustrating wire bonding of a conventional light emitting diode array.

符号の説明Explanation of reference numerals

 20 発光ダイオードアレイ
 21 発光領域
 22 電極配線
 23 電極配線パッド(個別電極)
 24 共通電極(カソード電極)
 25 表面保護膜
 26腐蝕防止用被膜
Reference Signs List 20 light-emitting diode array 21 light-emitting area 22 electrode wiring 23 electrode wiring pad (individual electrode)
24 Common electrode (cathode electrode)
25 Surface protection film 26 Corrosion prevention film

Claims (6)

 複数の発光領域と、該発光領域に電極配線を介して接続された縦長の個別電極とを、配置してなる発光ダイオードアレイにおいて、前記電極配線の表面と前記個別電極のエッジ部分の表面に保護膜を形成するとともに、前記個別電極の長辺エッジ上の保護膜は除去されていることを特徴とする発光ダイオードアレイ。 In a light-emitting diode array in which a plurality of light-emitting regions and a vertically long individual electrode connected to the light-emitting region via an electrode wiring are arranged, the surface of the electrode wiring and the surface of an edge portion of the individual electrode are protected. A light emitting diode array, wherein a film is formed and a protective film on a long side edge of the individual electrode is removed.  整列された複数の発光領域と、該発光領域に電極配線を介して接続され千鳥状に整列された縦長の個別電極とを、複数列配置してなる発光ダイオードアレイにおいて、千鳥状1列目の個別電極間を通り千鳥状2列目の個別電極に配線される電極配線を保護するように、前記電極配線の表面に保護膜を形成するとともに、前記個別電極の大部分を露出させた状態で前記個別電極のエッジ部分の表面に保護膜を形成し、前記個別電極の長辺エッジ上の保護膜は除去されていることを特徴とする発光ダイオードアレイ。 In a light-emitting diode array in which a plurality of aligned light-emitting regions and a plurality of vertically elongated individual electrodes connected to the light-emitting regions via electrode wiring and arranged in a staggered manner are arranged in a plurality of rows, A protective film is formed on the surface of the electrode wiring so as to protect the electrode wiring wired to the individual electrodes in the staggered second row passing between the individual electrodes, and in a state where most of the individual electrodes are exposed. A light emitting diode array, wherein a protective film is formed on a surface of an edge portion of the individual electrode, and the protective film on a long side edge of the individual electrode is removed.  整列された複数の発光領域と、該発光領域に電極配線を介して接続され、前記発光領域の整列方向と同方向に隣接して整列された少なくとも2列以上の個別電極とを備える発光ダイオードアレイにおいて、少なくとも前記個別電極部分を除く電極配線の表面と、前記個別電極の列の間に保護膜を備えたことを特徴とする発光ダイオードアレイ。 A light-emitting diode array comprising a plurality of aligned light-emitting regions and at least two or more rows of individual electrodes connected to the light-emitting regions via electrode wirings and aligned adjacent to the light-emitting regions in the same direction as the light-emitting regions. 3. The light-emitting diode array according to claim 1, further comprising a protective film between a surface of the electrode wiring excluding at least the individual electrode portion and a row of the individual electrodes. 前記保護膜とは別に、前記発光領域を覆う薄膜を個別電極の腐蝕防止用として形成していることを特徴とする請求項1ないし3の何れかに記載の発光ダイオードアレイ。 4. The light-emitting diode array according to claim 1, wherein a thin film covering the light-emitting region is formed separately from the protection film to prevent corrosion of the individual electrodes. 発光ダイオードアレイと、このアレイを駆動するため駆動素子と、前記アレイと駆動素子間をボンディングによって電気的に接続する金属細線とを備える光プリントヘッドにおいて、前記発光ダイオードアレイとして請求項1ないし4の何れかに記載の発光ダイオードアレイを用いたことを特徴とする光プリントヘッド。 5. An optical printhead comprising a light emitting diode array, a driving element for driving the array, and a thin metal wire for electrically connecting the array and the driving element by bonding, wherein the light emitting diode array is used as the light emitting diode array. An optical print head using the light-emitting diode array according to any one of the above. 発光ダイオードアレイと、このアレイを駆動するため駆動素子と、前記アレイと駆動素子間をボンディングによって電気的に接続する金属細線とを備え、金属細線の第1ボンディングが前記駆動素子側に行われ、第2ボンディングが前記発光ダイオードアレイ側に行われた光プリントヘッドにおいて、前記発光ダイオードアレイとして請求項1ないし4の何れかに記載の発光ダイオードアレイを用いたことを特徴とする光プリントヘッド。 A light emitting diode array, a driving element for driving the array, and a thin metal wire for electrically connecting the array and the driving element by bonding; a first bonding of the thin metal wire is performed on the driving element side; 5. An optical print head in which the second bonding is performed on the light emitting diode array side, wherein the light emitting diode array according to claim 1 is used as the light emitting diode array.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007299955A (en) * 2006-04-28 2007-11-15 Kyocera Corp Electronic device, light emitting device, and image forming device
US8596820B2 (en) 2005-04-14 2013-12-03 Citizen Electronics Co., Ltd. LED unit and LED lighting lamp using the LED unit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8596820B2 (en) 2005-04-14 2013-12-03 Citizen Electronics Co., Ltd. LED unit and LED lighting lamp using the LED unit
JP2007299955A (en) * 2006-04-28 2007-11-15 Kyocera Corp Electronic device, light emitting device, and image forming device

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