JP2772528B2 - Dielectric porcelain composition - Google Patents
Dielectric porcelain compositionInfo
- Publication number
- JP2772528B2 JP2772528B2 JP63274074A JP27407488A JP2772528B2 JP 2772528 B2 JP2772528 B2 JP 2772528B2 JP 63274074 A JP63274074 A JP 63274074A JP 27407488 A JP27407488 A JP 27407488A JP 2772528 B2 JP2772528 B2 JP 2772528B2
- Authority
- JP
- Japan
- Prior art keywords
- dielectric
- porcelain composition
- powder
- dielectric porcelain
- dielectric constant
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Compositions Of Oxide Ceramics (AREA)
- Inorganic Insulating Materials (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は直流バイアス特性(V−C特性)に優れ、低
温焼成が可能である安価なAg−Pd合金を内部電極とする
積層型磁器コンデンサに適した誘電体磁器組成物に関す
る。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a laminated ceramic capacitor having an internal electrode made of an inexpensive Ag-Pd alloy which has excellent DC bias characteristics (VC characteristics) and can be fired at a low temperature. The present invention relates to a dielectric ceramic composition suitable for:
通信器等において高い直流電圧が印加されて動作する
積層型磁器コンデンサは、当該バイアス電圧によって誘
電体層が一般的には20〜30μmと薄いために、静電容量
値が減少し、適正な動作を阻害する。そのため、誘電体
層の厚さを厚くする、具体的には50〜80μmにする必要
があり、そのため素子が大型になっている。しかし乍
ら、電子部品の小型化が進んでいることから誘電体の厚
さが約20μm程度であってもバイアス電圧によって静電
容量が大きく低下しない誘電体材料に対する市場の要請
がある。In a laminated ceramic capacitor that operates by applying a high DC voltage to a communication device or the like, the dielectric layer is generally thin, such as 20 to 30 μm, due to the bias voltage. Inhibits. Therefore, it is necessary to increase the thickness of the dielectric layer, specifically, to 50 to 80 μm, and the element becomes large. However, as electronic components have been miniaturized, there is a demand in the market for a dielectric material whose capacitance is not greatly reduced by a bias voltage even when the thickness of the dielectric is about 20 μm.
このような誘電体材料の比誘電率は実用時には1500以
上が必要であり、その為誘電体組成物はチタン酸バリウ
ムを主成分とするものが用いられ、多結晶体の結晶粒子
の大きさを小さくして1粒子当たりの電界強度を下げる
ことにより、全体としてV−C特性を改善するという設
計思想に立脚し、主成分チタン酸バリウムに対して種々
の添加物が検討され、一定の成果がみられたが、本質的
にチタン酸バリウムの強誘電的性質に基因する、バイア
ス電圧印加による比誘電率の低下を回避することができ
ず、市場の要請に合うまでに至っていない。The relative dielectric constant of such a dielectric material is required to be 1500 or more in practical use. Therefore, a dielectric composition containing barium titanate as a main component is used, and the size of polycrystalline crystal particles is reduced. Based on the design philosophy of improving the VC characteristics as a whole by reducing the electric field intensity per particle by making it smaller, various additives were studied for the main component barium titanate, and a certain result was obtained. However, a decrease in the relative dielectric constant due to the application of a bias voltage, which is essentially caused by the ferroelectric properties of barium titanate, cannot be avoided, and has not yet met the demands of the market.
本発明は上記問題を解決することを目的とするもので
具体的には1150℃以下の低温での焼成が可能な誘電体磁
器組成物であって、誘電特性上、比誘電率1500以上、誘
電損失2.5%以下、絶縁抵抗が25℃にて1.0×1012Ω・cm
以上、125℃において1.0×1011Ω・cm以上、V−C特性
−15%以上の特性を有する誘電体磁器組成物を提供する
にある。The present invention has been made to solve the above problems, and is specifically a dielectric porcelain composition that can be fired at a low temperature of 1150 ° C. or less. Loss less than 2.5%, insulation resistance 1.0 × 10 12 Ωcm at 25 ° C
It is an object of the present invention to provide a dielectric ceramic composition having a characteristic of 1.0 × 10 11 Ω · cm or more at 125 ° C. and a VC characteristic of −15% or more.
本発明によれば、チタン酸バリウム多結晶体の結晶粒
子を小さくするとともに結晶粒子の表面層を比誘電率の
小さい常誘電体により構成する。即ち、各結晶粒子に印
加される電界の大部分が、常誘電的性質を有する比較的
小さい比誘電率(εr50)の粒子表面層に印加され、強
誘電的性質を有する比較的大きい比誘電率をもつ結晶粒
内部に印加される電界が軽減される。その結果、比誘電
率の電界依存性を本質的に有しない常誘電相から成る結
晶粒表面が印加電圧(印加電界)の大部分を担うことに
なり、多結晶体の比誘電率電界依存性を軽減することが
出来る。この技術思想に立脚し、チタン酸バリウム結晶
粒表面に限局し、常誘電相に改質できる組成系を探索研
究の結果、Sr2Bi4Ti5O18で表わされる物質を添加する事
に依って実現できることを見い出した。According to the present invention, the crystal grains of the barium titanate polycrystal are reduced, and the surface layer of the crystal grains is formed of a paraelectric substance having a small relative dielectric constant. That is, most of the electric field applied to each crystal grain is applied to a particle surface layer having a relatively small relative dielectric constant (εr50) having a paraelectric property, and a relatively large relative dielectric constant having a ferroelectric property. The electric field applied inside the crystal grain having As a result, the crystal grain surface composed of a paraelectric phase having essentially no electric field dependence of the relative dielectric constant bears most of the applied voltage (applied electric field). Can be reduced. Based on this technical idea, as a result of exploration research, a composition system that can be restricted to the surface of barium titanate crystal grains and can be modified into a paraelectric phase was found, and as a result of adding a substance represented by Sr 2 Bi 4 Ti 5 O 18 , And found that it can be realized.
よって本発明は、大部分のBaTiO3結晶粒と該結晶粒界
に存在するSr2Bi4Ti5O18からなり、 下記式(1-x)BaTiO3+xSr2Bi4Ti5O18 で表した時、xの値が0.025乃至0.075となるように、Ba
TiO3粉末と、Sr2Bi4Ti5O18合成粉末とを用いて構成す
る。特に、xの値が0.025乃至0.05である磁器組成物に
おいて市場の要請に十分応えられる前記目的を満たし、
Ag−Pd合金を内部電極とする積層型磁器コンデンサに適
した誘電体磁器組成物を提供することができる。Therefore, the present invention comprises most of BaTiO 3 crystal grains and Sr 2 Bi 4 Ti 5 O 18 present at the grain boundaries, and is represented by the following formula (1-x) BaTiO 3 + xSr 2 Bi 4 Ti 5 O 18 Then, Ba so that the value of x is 0.025 to 0.075
It is composed of TiO 3 powder and Sr 2 Bi 4 Ti 5 O 18 synthetic powder. In particular, the value of x is 0.025 to 0.05 in the porcelain composition, which satisfies the above-mentioned object of sufficiently satisfying the market requirements,
A dielectric ceramic composition suitable for a laminated ceramic capacitor using an Ag-Pd alloy as an internal electrode can be provided.
本発明の構成において、Sr2Bi4Ti5O18の配合比を示す
x値が0.025を下回ると絶縁抵抗が1×1012Ω・cmを下
回り、V−C特性が−15%を下回るため目的に合わな
い。一方、x値が0.075を上回ると比誘電率が1500を下
回り、実用に合わないという問題が生じる。In the structure of the present invention, when the value x indicating the compounding ratio of Sr 2 Bi 4 Ti 5 O 18 is less than 0.025, the insulation resistance is less than 1 × 10 12 Ω · cm, and the VC characteristic is less than −15%. Not fit for purpose. On the other hand, when the value x exceeds 0.075, the relative dielectric constant falls below 1500, which causes a problem that it is not suitable for practical use.
純度99.5%以上のSrCO3,Bi2O3及びTiO2をモル比で2:
2:5の割合になる様に秤量し、全量を200gとして内容積
1のポリエチレン製容器に、メノウ玉石400g、イオン
交換水400ccと共に入れ、ボールミルにて混合する。混
合粉を乾燥し、アルミナルツボにいれて、900℃で2時
間仮焼し、Sr2Bi4Ti5O18粉末を合成した。得た粉末はX
線回析によりSr2Bi4Ti5O18以外の結晶相は含まないこと
を確認した。SrCO 3 , Bi 2 O 3 and TiO 2 with a purity of 99.5% or more in a molar ratio of 2:
The mixture is weighed so as to have a ratio of 2: 5, the total amount is 200 g, and it is put in a polyethylene container having an internal volume of 1 together with 400 g of agate cobblestone and 400 cc of ion-exchanged water, and mixed by a ball mill. The mixed powder was dried, placed in an alumina crucible, and calcined at 900 ° C. for 2 hours to synthesize Sr 2 Bi 4 Ti 5 O 18 powder. The powder obtained is X
It was confirmed by line diffraction that no crystal phase other than Sr 2 Bi 4 Ti 5 O 18 was contained.
こうして得たSr2Bi4Ti5O18合成粉末と純度99%以上の
BaTiO3粉末を第1表の組成になる様に秤量し、全量200g
を前述と同様の方法で混合し、950℃で2時間仮焼し
た。ボールミルにて粉砕の後、粉末100重量部に対し酢
酸ビニル2重量部をライカイ器中で添加し、造粒した後
に、直径12mmφ、厚さ約0.8mmにプレス成形した。The Sr 2 Bi 4 Ti 5 O 18 synthetic powder obtained in this way and a purity of 99% or more
BaTiO 3 powder was weighed to the composition shown in Table 1 and the total amount was 200 g.
Was mixed in the same manner as described above, and calcined at 950 ° C. for 2 hours. After pulverizing with a ball mill, 2 parts by weight of vinyl acetate was added to 100 parts by weight of the powder in a Reika apparatus, and the mixture was granulated, and then pressed to a diameter of 12 mm and a thickness of about 0.8 mm.
この円板状の成形体を1120℃〜1450℃で焼成した。 This disk-shaped compact was fired at 1120 ° C to 1450 ° C.
得た焼結体を約0.35mmの厚さになる様に研磨し両面に
In−Ga合金を塗付して平行円板コンデンサを作成し評価
試料とした。The obtained sintered body is polished to a thickness of about 0.35 mm and on both sides
An In-Ga alloy was applied to prepare a parallel disk capacitor, which was used as an evaluation sample.
得られた試料に対し、LCRメータ(YHP4274A)を用い
て1KHz、1.0Vrmsの正弦波入力信号により静電容量及び
誘電損失(DF)を測定し、絶縁抵抗計により50VDCを1
分間印加し、得た抵抗値と試料の寸法から絶縁抵抗率
(IR)を計算し、25℃及び125℃において測定した。ま
た、室温に於いて試料に直流電界が2.5KV/mmになるよう
に外部から直流電圧を印加して静電容量を測定し、直流
電圧を印加しない場合に対する変化率を求め、V−C特
性とした。The capacitance and dielectric loss (DF) of the obtained sample were measured using a 1 KHz, 1.0 Vrms sine wave input signal using an LCR meter (YHP4274A), and 50 V DC was measured using an insulation resistance meter.
The temperature was measured at 25 ° C. and 125 ° C. by calculating the insulation resistivity (IR) from the obtained resistance value and the dimensions of the sample. Also, at room temperature, the capacitance was measured by applying a DC voltage from the outside so that the DC electric field was 2.5 KV / mm, and the rate of change with no DC voltage applied was determined. And
第1表中、No.1,2,4の試料に対しては、直流バイアス
0〜3.0(KV/mm)印加に対する静電容量の変化率ΔC/C
(V−C特性)を第1図に示した。 In Table 1, for samples Nos. 1, 2, and 4, the rate of change of capacitance ΔC / C with respect to application of DC bias 0 to 3.0 (KV / mm)
(VC characteristics) are shown in FIG.
表から明らかなようにSr2Bi4Ti5O18(SBT)を含まな
い試料番号1は、V−C特性が−30%を下回りかつ125
℃でのIRが小さすぎ測定不能である。As is clear from the table, the sample No. 1 which does not contain Sr 2 Bi 4 Ti 5 O 18 (SBT) has a VC characteristic lower than −30% and 125%.
IR at ℃ is too small to measure.
試料番号2,3,4及び6は、εrが1500以上、DFが2.5%
以下、25℃及び125℃のIRがそれぞれ1.0×1012Ω・cm以
上及び1.0×1011Ω・cm以上であり、V−C特性が−15
%以上であり、かつ、焼結温度は1150℃以下であり、本
発明の目的を満たすものである。Sample Nos. 2, 3, 4 and 6 have εr of 1500 or more and DF of 2.5%
Hereinafter, the IR at 25 ° C. and 125 ° C. is 1.0 × 10 12 Ω · cm or more and 1.0 × 10 11 Ω · cm or more, respectively, and the VC characteristic is −15.
% And the sintering temperature is 1150 ° C. or less, which satisfies the object of the present invention.
試料番号5はεr,DF及びV−C特性は良好であるが、
125℃でのIRが小さすぎるため測定不能で実用に供せな
い。また第1図から明らかにV−C特性におけるSBTの
効果が理解できる。Sample No. 5 has good εr, DF and VC characteristics,
The IR at 125 ° C is too small to be measured and cannot be put to practical use. FIG. 1 clearly shows the effect of SBT on the VC characteristics.
試料番号7は、Sr2Bi4Ti5O18が7.5モル%を超える試
料であり、比誘電率εrが小さい。Sample No. 7 is a sample in which Sr 2 Bi 4 Ti 5 O 18 exceeds 7.5 mol%, and has a small relative dielectric constant εr.
Sr2Bi4Ti5O18を2.5〜7.5モル%を含むBaTiO3からなる
誘電体磁器は絶縁抵抗が高く、印加直流バイアス電圧に
よる比誘電率の低下の極めて小さく、かつ焼結温度が11
20〜1150℃と低く、積層型磁器コンデンサとして応用し
た場合、電極材料として用いられるAg−Pd合金のAgの分
率が70重量%まで可能あることから経済性が図られる。A dielectric ceramic made of BaTiO 3 containing 2.5 to 7.5 mol% of Sr 2 Bi 4 Ti 5 O 18 has a high insulation resistance, a very small decrease in the relative dielectric constant due to an applied DC bias voltage, and a sintering temperature of 11%.
As low as 20 to 1150 ° C., when applied as a laminated ceramic capacitor, the Ag-Pd alloy used as an electrode material can achieve an Ag fraction of up to 70% by weight, which is economical.
従って、高い直流バイアス電圧が印加される回路素子
として使われるコンデンサ素子として誘電体の厚さが約
20μm程度であっても回路特性の要求に対応でき、経済
性の高い積層型磁器コンデンサを提供することが出来
る。Therefore, as a capacitor element used as a circuit element to which a high DC bias voltage is applied, the thickness of the dielectric is about
Even with a thickness of about 20 μm, it is possible to meet the requirements of circuit characteristics and to provide a highly economical laminated ceramic capacitor.
第1図は直流バイアス印加電圧と静電容量の変化率(Δ
C/C)との関係を示す図である。FIG. 1 shows the DC bias application voltage and the change rate of the capacitance (Δ
FIG.
Claims (1)
って、 (1−x)BaTiO3+xSr2Bi4Ti5O18の組成式におけるx
値が0.025乃至0.075とした誘電体磁器組成物。1. A method according to claim 1, wherein the BaTiO 3 powder and the Sr 2 Bi 4 Ti 5 O 18 synthetic powder have a composition formula of (1-x) BaTiO 3 + xSr 2 Bi 4 Ti 5 O 18.
A dielectric ceramic composition having a value of 0.025 to 0.075.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63274074A JP2772528B2 (en) | 1988-10-28 | 1988-10-28 | Dielectric porcelain composition |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63274074A JP2772528B2 (en) | 1988-10-28 | 1988-10-28 | Dielectric porcelain composition |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH02120276A JPH02120276A (en) | 1990-05-08 |
JP2772528B2 true JP2772528B2 (en) | 1998-07-02 |
Family
ID=17536611
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63274074A Expired - Fee Related JP2772528B2 (en) | 1988-10-28 | 1988-10-28 | Dielectric porcelain composition |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2772528B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5345834B2 (en) * | 2008-12-24 | 2013-11-20 | 株式会社日本セラテック | Lead-free piezoelectric ceramic, multilayer piezoelectric device, and lead-free piezoelectric ceramic manufacturing method |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3237571A1 (en) * | 1982-10-09 | 1984-04-12 | Philips Patentverwaltung Gmbh, 2000 Hamburg | CERAMIC DIELECTRIC BASED ON WISMUT CONTAINING BATI0 (DOWN ARROW) 3 (DOWN ARROW) |
-
1988
- 1988-10-28 JP JP63274074A patent/JP2772528B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH02120276A (en) | 1990-05-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH0518201B2 (en) | ||
US20030104924A1 (en) | Sodium copper titanate compositions containing a rare earth, yttrium or bismuth | |
JPH0283256A (en) | Dielectric material porcelain composition | |
JP2772528B2 (en) | Dielectric porcelain composition | |
JP2003531809A (en) | Substituted barium titanate and barium strontium titanate ferroelectric composition | |
JPS597665B2 (en) | High dielectric constant porcelain composition | |
JP3250923B2 (en) | Dielectric porcelain composition | |
JPH0416884B2 (en) | ||
JP3435039B2 (en) | Dielectric ceramics and multilayer ceramic capacitors | |
JPS6032344B2 (en) | Grain boundary insulated semiconductor porcelain capacitor material | |
Gururaja et al. | Dielectric behaviour of PLZT ceramics modified by Ca2, Sr2, Nd3 and Y3 ions° | |
JP2505030B2 (en) | High-permittivity porcelain composition for temperature compensation and method for producing the same | |
JP3250917B2 (en) | Dielectric porcelain composition | |
JP2902925B2 (en) | Dielectric porcelain composition | |
JP2571386B2 (en) | High dielectric constant dielectric porcelain composition | |
JP3250927B2 (en) | Dielectric porcelain composition | |
JP2003532979A (en) | Tunable device incorporating BiCu3Ti3FeO12 | |
JPS6050809A (en) | Dielectric porcelain composition | |
JPH0522667B2 (en) | ||
JP3336194B2 (en) | Dielectric porcelain | |
JP2900687B2 (en) | Semiconductor porcelain composition and method for producing the same | |
KR870001658B1 (en) | Current restriction element responsive to applied voltage | |
JPS6032343B2 (en) | Grain boundary insulated semiconductor porcelain capacitor material | |
Kuharuangrong et al. | Doped Bi0. 5Na0. 5TiO3-PbTiO3 relaxor ferroelectric ceramics | |
JPH01239704A (en) | Ceramic component with high dielectric constant |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |