JP2687510B2 - Manufacturing method of chip-shaped solid electrolytic capacitor - Google Patents
Manufacturing method of chip-shaped solid electrolytic capacitorInfo
- Publication number
- JP2687510B2 JP2687510B2 JP63297572A JP29757288A JP2687510B2 JP 2687510 B2 JP2687510 B2 JP 2687510B2 JP 63297572 A JP63297572 A JP 63297572A JP 29757288 A JP29757288 A JP 29757288A JP 2687510 B2 JP2687510 B2 JP 2687510B2
- Authority
- JP
- Japan
- Prior art keywords
- cathode
- melting point
- lead terminal
- solid electrolytic
- point solder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明はチップ状固体電解コンデンサに関し、特にっ
チップ状固体電解コンデンサの陰極層と陰極リード端子
接続部の構造に関する。The present invention relates to a chip solid electrolytic capacitor, and more particularly to a structure of a cathode layer and a cathode lead terminal connecting portion of the chip solid electrolytic capacitor.
近年、電子機器の軽薄短小化と表面実装技術の進展に
伴い、小型・大容量を特徴とするチップ状固体電解コン
デンサはその市場規模を著しく拡大しており、種々の用
途に供されている。2. Description of the Related Art In recent years, as electronic devices have become lighter, thinner and smaller, and surface mounting technology has progressed, the market size of chip-shaped solid electrolytic capacitors featuring small size and large capacity has expanded remarkably, and they are used for various applications.
従来、この種のチップ状固体電解コンデンサは第4図
に示すように、陽極リード2と表面に形成された陰極層
3とを備えるコンデンサ素子1の上記陽極リード2と陽
極リード端子4とを溶接により接続し、陰極層3と陰極
リード端子5を導電性接着剤13で接続し、陽・陰極リー
ド4,5の露出部を残し樹脂7で外装し、さらに樹脂7の
外周面に沿って陽・陰極リード端子4,5を折り曲げるこ
とにより構成されている。Conventionally, in this type of chip solid electrolytic capacitor, as shown in FIG. 4, an anode lead 2 and an anode lead terminal 4 of a capacitor element 1 having an anode lead 2 and a cathode layer 3 formed on the surface thereof are welded to each other. The cathode layer 3 and the cathode lead terminal 5 are connected with a conductive adhesive 13, and the positive and negative electrode leads 4 and 5 are covered with a resin 7 while leaving the exposed portions of the positive and negative leads 4 and 5 along the outer peripheral surface of the resin 7. -It is configured by bending the cathode lead terminals 4 and 5.
上述した従来のチップ状固体電解コンデンサは、陰極
層3と陰極リード端子5を導電性接着剤13にて接続して
いるので、以下に述べるような欠点がある。The above-mentioned conventional chip-shaped solid electrolytic capacitor has the following drawbacks because the cathode layer 3 and the cathode lead terminal 5 are connected by the conductive adhesive 13.
(1)導電性接着剤13は一般的に金属粉末と接着力の強
い樹脂よりなるが、高い導電性を待たせるために金属粉
末の含有率を高くする必要があり、このために接続強度
が弱くなる。したがって、工程中の機械的ストレスや実
装時に熱ストレスにより接続が不十分となり、延いては
オープンモードとなって電気的特性を喪失することがあ
る。(1) The conductive adhesive 13 is generally composed of a metal powder and a resin having a strong adhesive force, but it is necessary to increase the content ratio of the metal powder in order to wait for high conductivity. become weak. Therefore, the connection may be insufficient due to mechanical stress during the process or thermal stress at the time of mounting, which may result in an open mode and loss of electrical characteristics.
(2)又、導電性接着剤13の陰極リード端子5への塗布
は、一般的にディスペンサーによって一定量づつ塗布す
るが、塗布面積が小さくかつ塗布量も微少であるため、
塗布量を一定にすることが困難である。したがって、接
続強度のバラツキが大きくオープンモードの発生する危
険性が高い。(2) Further, the conductive lead 13 is generally applied to the cathode lead terminal 5 in a fixed amount by a dispenser, but since the applied area is small and the applied amount is very small,
It is difficult to make the coating amount constant. Therefore, there is a large variation in connection strength, and there is a high risk that the open mode will occur.
(3)さらに、ディスペンサーによる塗布は、塗布量の
バラツキがより大きくなるため塗布スピードを早くする
ことが困難であり、又塗布量の管理や硬化状態の管理お
よび接続強度のチェック等、工程が煩雑であり、製造コ
ストが高くなる。(3) Further, in the case of applying with a dispenser, it is difficult to increase the application speed because the application amount varies more, and the process is complicated, such as application amount management, curing state management and connection strength check. Therefore, the manufacturing cost becomes high.
本発明の目的は、従来の欠点を除去し、陰極層と陰極
リード端子の接続が導電性、接続強度が優れ、かつ作業
性、均一性がよく、工程管理も容易に出来るチップ状固
体電解コンデンサを提供することにある。An object of the present invention is to eliminate the drawbacks of the prior art, the cathode layer and the cathode lead terminal are electrically conductive and have excellent connection strength, good workability and uniformity, and a chip-shaped solid electrolytic capacitor which is easy in process control. To provide.
本発明のチップ状固体電解コンデンサの製造方法は、
一端面に植立された陽極リードと表面に形成された陰極
層とを備えるコンデンサ素子を形成する工程と、前記陽
極リードには陽極リード端子を電気導通的に固着し、前
記陰極層には陰極リード端子を電気導通的に固着する工
程と、前記陽極リード端子及び陰極リード端子固着済み
のコンデンサ素子を、樹脂外装する工程とを含むチップ
状固体電解コンデンサの製造方法において、前記陰極層
と前記陰極リード端子との固着に際して、陰極層と固着
すべき部分に融点が230℃以上の高融点半田を予めメッ
キした陰極リード端子を用い、前記高融点半田を溶融さ
せ再固化させることにより、前記陰極層と前記陰極リー
ドとを固着することを特徴とする。又、前記陰極リード
端子として、母材が、前記高融点半田より低融点の半田
により覆われ、その低融点の半田上に前記高融点半田が
形成されている構造の陰極リード端子を用いることを特
徴とする。The method for manufacturing the chip solid electrolytic capacitor of the present invention is
A step of forming a capacitor element comprising an anode lead set up on one end surface and a cathode layer formed on the surface; an anode lead terminal is electrically conductively fixed to the anode lead, and a cathode is formed on the cathode layer. In a method for manufacturing a chip solid electrolytic capacitor, including a step of electrically fixing lead terminals, and a step of resin-coating the capacitor element to which the anode lead terminal and the cathode lead terminal are fixed, the cathode layer and the cathode At the time of fixing with the lead terminal, the cathode layer is preliminarily plated with a high melting point solder having a melting point of 230 ° C. or more in the portion to be fixed with the cathode layer, and the high melting point solder is melted and resolidified to thereby form the cathode layer. And the cathode lead are fixed to each other. Further, as the cathode lead terminal, it is preferable to use a cathode lead terminal having a structure in which a base material is covered with a solder having a lower melting point than the high melting point solder, and the high melting point solder is formed on the low melting point solder. Characterize.
次に、本発明について図面を参照して説明する。第1
図は本発明の一実施例の側断面図である。Next, the present invention will be described with reference to the drawings. First
The drawing is a side sectional view of an embodiment of the present invention.
第1図に示すように、陽極リード2と陰極層3を有す
るコンデンサ素子1の陽極リード2に陽極リード端子4
を溶接により接続し、陰極層3を陰極リード端子5の段
差部に予めメッキされた高融点半田6の上に配置した
後、陰極層3と陰極リード端子5を圧接した状態のまま
高融点半田6の融点を超える高温炉を通過させ、高融点
半田6を溶解したのち常温に放置し凝固させることによ
り陰極層3と陰極リード端子5を接続し、次に陽極リー
ド端子4と陰極リード端子5の露出部を残して樹脂7に
よりトランスファーモールド手段により外装し、さら
に、各リード端子の露出部を樹脂7の外周面に沿って折
り曲げチップ状固体電解コンデンサを形成した。As shown in FIG. 1, the anode lead 2 of the capacitor element 1 having the anode lead 2 and the cathode layer 3 is connected to the anode lead terminal 4.
Are connected by welding, and the cathode layer 3 is placed on the high-melting-point solder 6 pre-plated on the step portion of the cathode lead terminal 5, and then the high-melting-point solder with the cathode layer 3 and the cathode lead terminal 5 being pressed together. The high-melting-point solder 6 is passed through a high-temperature furnace having a melting point higher than that of 6, and the high-melting-point solder 6 is left at room temperature to solidify to connect the cathode layer 3 and the cathode lead terminal 5, and then the anode lead terminal 4 and the cathode lead terminal 5 The exposed part of each of the lead terminals was covered with the resin 7 by transfer molding means, and the exposed part of each lead terminal was bent along the outer peripheral surface of the resin 7 to form a chip solid electrolytic capacitor.
次に、陰極リード端子5へ高融点半田6をメッキする
手段について第2図および第3図(a)〜(c)を用い
て説明する。Next, a means for plating the high melting point solder 6 on the cathode lead terminal 5 will be described with reference to FIGS. 2 and 3A to 3C.
第2図は本発明の陽・陰極リード端子を連続的に形成
したリードフレーム8の正面図であり、第3図(a)〜
(c)は陽・陰極リード端子4,5を形成する前のリード
フレーム8の斜視図であり、(a)はメッキ前、(b)
は低融点半田メッキ後、(c)は高融点半田メッキ後で
ある。FIG. 2 is a front view of the lead frame 8 in which the positive and negative electrode lead terminals of the present invention are continuously formed, and FIG.
(C) is a perspective view of the lead frame 8 before forming the positive and negative electrode lead terminals 4 and 5, (a) before plating, (b).
Is after low melting point solder plating, and (c) is after high melting point solder plating.
工程順に説明すると、母材10は鉄とニッケルの合金か
らなる幅30mm、厚さ0.1mmの帯板であり、この母材10に
ニッケル下地メッキを施した後例えばスズ:鉛が重量比
で6:4の低融点半田メッキ11を母材10の両面に形成し
た。次にテープやレジスト等により低融点半田メッキ11
の一部の面を除いてマスキングし例えばスズ:鉛が重量
比で5:95の高融点半田メッキ12を形成した。さらに、マ
スキング材を除去して第3図(c)のような帯板を形成
した。この後、所定の金型にてこの帯板を打ち抜き加工
して支持板9を有する第2図のようなリードフレーム8
を形成した。この後のチップ状固体電解コンデンサの製
造手段は前述の通りである。Explaining in the order of steps, the base material 10 is a strip plate made of an alloy of iron and nickel and having a width of 30 mm and a thickness of 0.1 mm. After the base material 10 is plated with nickel undercoat, for example, tin: lead has a weight ratio of 6 : 4 low melting point solder plating 11 was formed on both surfaces of the base material 10. Next, low melting point solder plating 11
Masking was performed excluding a part of the surface of, for example, tin: lead to form a high melting point solder plating 12 having a weight ratio of 5:95. Further, the masking material was removed to form a strip plate as shown in FIG. 3 (c). After that, this strip plate is punched by a predetermined die and has a support plate 9 as shown in FIG.
Was formed. The manufacturing method of the chip solid electrolytic capacitor thereafter is as described above.
このように形成されるチップ状固体電解コンデンサに
対して、外装前で陰極層3と陰極リード端子5との接続
強度を調べたところ、従来の導電性接着剤の場合と比較
して3倍以上の接続強度を有し、又そのバラツキも半分
以上であることが確認できた。When the connection strength between the cathode layer 3 and the cathode lead terminal 5 was examined for the chip-shaped solid electrolytic capacitor thus formed before the packaging, it was three times or more that of the conventional conductive adhesive. It has been confirmed that the connection strength of No. 1 was obtained and the variation was more than half.
さらに、外装前で落下試験により機械的にストレスを
加えた後に外装し電気的特性を調べたところ、従来の導
電性接着剤を使用した品物が約1%のオーブンモードが
発生したのちに対し、本発明の品物は1個も発生しなか
った。Furthermore, when mechanical stress was applied by a drop test before packaging and packaging was performed and the electrical characteristics were examined, it was found that about 1% of the oven mode occurred in the products using the conventional conductive adhesive. None of the products of the invention occurred.
又、さらに、本発明によれば導電性接着剤の塗布およ
びその乾燥や接続強度のチェックが不要であり、半田メ
ッキの溶融させる工程だけで十分な品質の接続状態が得
られ、大幅に工程を簡略化することができた。Further, according to the present invention, it is not necessary to apply a conductive adhesive, to dry it, and to check the connection strength, and a connection state of sufficient quality can be obtained only by the step of melting the solder plating. It was possible to simplify.
尚、本発明では、低融点半田メッキの上に部分的に高
融点半田メッキを形成したが、高融点半田メッキを直接
母材へ部分メッキした低融点半田メッキを樹脂による外
装工程後露出した陽・陰極リード端子に行なっても同様
の効果が得られることはいうまでもない。In the present invention, the high-melting-point solder plating is partially formed on the low-melting-point solder plating. However, the low-melting-point solder plating obtained by partially plating the high-melting-point solder plating directly on the base material is exposed after the exterior process with the resin. Needless to say, the same effect can be obtained by applying it to the cathode lead terminal.
又、本発明でいう高融点半田とはチップ状固体電解コ
ンデンサの実装温度より高融点である半田のことを示
し、通常230℃以上の融点を有する半田を示す。又、低
融点半田とはその逆に実装温度以下で十分に溶解する半
田のことであり、通常220℃以下の融点を有する半田を
示す。Further, the high melting point solder referred to in the present invention means a solder having a melting point higher than the mounting temperature of the chip solid electrolytic capacitor, and usually a solder having a melting point of 230 ° C. or higher. On the contrary, the low melting point solder is a solder which is sufficiently melted at a mounting temperature or lower, and usually indicates a solder having a melting point of 220 ° C. or lower.
以上説明したように本発明、陰極層と陰極リード端子
の接続に高融点半田を用いること、および高融点半田を
予め部分メッキによりリードフレームに設けておくこと
により、以下のような効果がある。As described above, the present invention has the following effects by using the high melting point solder for connecting the cathode layer and the cathode lead terminal and by preliminarily providing the high melting point solder on the lead frame by partial plating.
(1)陰極層と陰極リード端子の接続を強固にできる。(1) The connection between the cathode layer and the cathode lead terminal can be strengthened.
(2)同じく接続のバラツキを小さくできる。(2) Similarly, variations in connection can be reduced.
(3)工程を簡略にし、コストを安価にできる。(3) The process can be simplified and the cost can be reduced.
第1図は本発明の一実施例のチップ状固体電解コンデン
サの側断面図、第2図は陽・陰極リード端子を連続的に
形成したリードフレームの正面図、第3図(a)〜
(c)は陽・陰極リード端子を形成する前のリードフレ
ームの斜視図であり、(a)はメッキ前、(b)は低融
点半田のメッキ後、(c)は高融点半田のメッキ後の斜
視図、第4図は従来のチップ状固体電解コンデンサの一
例の側断面図である。 1……コンデンサ素子、2……陽極リード、3……陰極
層、4……陽極リード端子、5……陰極リード端子、6
……高融点半田、7……樹脂、8……リードフレーム、
9……支持板、10……母材、11……低融点半田メッキ、
12……高融点半田メッキ、13……導電性接着剤。FIG. 1 is a side sectional view of a chip solid electrolytic capacitor of one embodiment of the present invention, FIG. 2 is a front view of a lead frame in which positive and negative electrode lead terminals are continuously formed, and FIG.
(C) is a perspective view of the lead frame before forming the positive and negative electrode lead terminals, (a) is before plating, (b) is after low melting point solder plating, (c) is after high melting point solder plating FIG. 4 is a side sectional view of an example of a conventional chip solid electrolytic capacitor. 1 ... Capacitor element, 2 ... Anode lead, 3 ... Cathode layer, 4 ... Anode lead terminal, 5 ... Cathode lead terminal, 6
…… High melting point solder, 7 …… Resin, 8 …… Lead frame,
9 ... Support plate, 10 ... Base material, 11 ... Low melting point solder plating,
12 …… High melting point solder plating, 13 …… Conductive adhesive.
Claims (2)
成された陰極層とを備えるコンデンサ素子を形成する工
程と、前記陽極リードには陽極リード端子を電気導通的
に固着し、前記陰極層には陰極リード端子を電気導通的
に固着する工程と、前記陽極リード端子及び陰極リード
端子固着済みのコンデンサ素子を樹脂外装する工程とを
含むチップ状固体電解コンデンサの製造方法において、 前記陰極層と前記陰極リード端子との固着に際して、陰
極層と固着すべき部分に融点が230℃以上の高融点半田
を予めメッキした陰極リード端子を用い、前記高融点半
田を溶融させ再固化させることにより、前記陰極層と前
記陰極リードとを固着することを特徴とするチップ状固
体電解コンデンサの製造方法。1. A step of forming a capacitor element comprising an anode lead set up on one end surface and a cathode layer formed on the surface, and an anode lead terminal is electrically conductively fixed to the anode lead, A method of manufacturing a chip solid electrolytic capacitor, comprising: a step of electrically fixing a cathode lead terminal to a cathode layer; and a step of resin-encapsulating the capacitor element with the anode lead terminal and the cathode lead terminal fixed, wherein the cathode When fixing the layer and the cathode lead terminal, by using a cathode lead terminal having a high melting point solder having a melting point of 230 ° C. or higher pre-plated in a portion to be fixed to the cathode layer, by melting and resolidifying the high melting point solder, A method for manufacturing a chip solid electrolytic capacitor, characterized in that the cathode layer and the cathode lead are fixed to each other.
高融点半田より低融点の半田により覆われ、その低融点
の半田上に前記高融点半田が形成されている構造の陰極
リード端子を用いることを特徴とする特許請求の範囲第
1項記載のチップ状固体電解コンデンサの製造方法。2. A cathode lead terminal having a structure in which a base material is covered with a solder having a melting point lower than that of the high melting point solder, and the high melting point solder is formed on the low melting point solder as the cathode lead terminal. The method for producing a chip-shaped solid electrolytic capacitor according to claim 1, which is used.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63297572A JP2687510B2 (en) | 1988-11-24 | 1988-11-24 | Manufacturing method of chip-shaped solid electrolytic capacitor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63297572A JP2687510B2 (en) | 1988-11-24 | 1988-11-24 | Manufacturing method of chip-shaped solid electrolytic capacitor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH02143411A JPH02143411A (en) | 1990-06-01 |
JP2687510B2 true JP2687510B2 (en) | 1997-12-08 |
Family
ID=17848288
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63297572A Expired - Lifetime JP2687510B2 (en) | 1988-11-24 | 1988-11-24 | Manufacturing method of chip-shaped solid electrolytic capacitor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2687510B2 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0459934U (en) * | 1990-09-29 | 1992-05-22 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59124709A (en) * | 1982-12-29 | 1984-07-18 | 富士通株式会社 | Method of producing solid electrolytic condenser |
JPS60213017A (en) * | 1984-04-09 | 1985-10-25 | 松下電器産業株式会社 | Chip-shaped solid electrolytic condenser |
-
1988
- 1988-11-24 JP JP63297572A patent/JP2687510B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH02143411A (en) | 1990-06-01 |
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