JP2667019B2 - CT type measuring device - Google Patents
CT type measuring deviceInfo
- Publication number
- JP2667019B2 JP2667019B2 JP25241689A JP25241689A JP2667019B2 JP 2667019 B2 JP2667019 B2 JP 2667019B2 JP 25241689 A JP25241689 A JP 25241689A JP 25241689 A JP25241689 A JP 25241689A JP 2667019 B2 JP2667019 B2 JP 2667019B2
- Authority
- JP
- Japan
- Prior art keywords
- image data
- cross
- design drawing
- work
- sectional
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Description
【発明の詳細な説明】 ［発明の目的］ （産業上の利用分野） この発明は、CT（Computer Tomography）産業分野に
応用して各種物品の寸法、形状を測定するCT式計測装置
に関する。[Detailed Description of the Invention] [Object of the Invention] (Industrial application field) The present invention relates to a CT (Computer Tomography) industrial apparatus which measures the size and shape of various articles by applying it to the field of CT.
（従来の技術） 例えば成形品の内部形状を非破壊的に調べる手段とし
て、従来からいわゆる産業用CTによりワークの断面画像
を生成することが行われている。このCT断面画像をハー
ドコピー化し、そのCT断面図と前記ワークの設計図とを
照らし合わせ、ワークが設計図どおりに仕上っているか
どうか等を調べる。(Prior Art) For example, as a means for non-destructively examining the internal shape of a molded product, a so-called industrial CT has been used to generate a cross-sectional image of a workpiece. This CT cross-sectional image is converted into a hard copy, and the CT cross-sectional view is compared with the design drawing of the work to check whether or not the work is finished as designed.
（発明が解決しようとする課題） ハードコピー化したCT断面図と設計図とを照らし合わ
せる作業は、デバイダや物差し等の製図用具を用いた完
全な入手作業であり、非常に能率が悪いとともに、測定
精度が人によってバラツキやすいという問題があった。(Problem to be Solved by the Invention) The work of comparing the hard copy CT sectional view with the design drawing is a complete acquisition work using a drawing tool such as a divider or a ruler, and is extremely inefficient. There has been a problem that the measurement accuracy tends to vary from person to person.
この発明は前述した従来の問題点に鑑みなされたもの
で、その目的は、ワークのCT断面画像データとそのワー
クの設計図とを比較対照する寸法計測を自動化すること
にある。The present invention has been made in view of the above-described conventional problems, and has as its object to automate dimension measurement for comparing and contrasting CT cross-sectional image data of a work with a design drawing of the work.
［発明の構成］ （課題を解決するための手段） この発明に係るCT式計測装置は、ワークの所定部位の
断面画像データを得るCTと、前記ワークの所定部位の設
計図画像データを入力する手段と、前記CT断面画像デー
タと前記設計図画像データの縮尺率を合致させる手段
と、前記CT断面画像データと前記設計図画像データとを
特徴点を基準に位置、方向を合わせて等価的に重ね合わ
せる手段と、重ね合わされた前記CT断面画像データと前
記設計図画像データとの差分を演算して表示する手段と
を備えたものである。[Means for Solving the Problems] A CT-type measuring apparatus according to the present invention inputs a CT for obtaining cross-sectional image data of a predetermined portion of a work and design drawing image data of a predetermined portion of the work. Means, means for matching the scale of the CT cross-sectional image data and the design drawing image data, and equivalently aligning the position and direction of the CT cross-sectional image data and the design drawing image data with reference to a feature point. Means for superimposing, and means for calculating and displaying the difference between the superposed CT cross-sectional image data and the design drawing image data.
（作用） CTにより得られた断面画像データと別に入力した設計
図画像データとが装置内のメモリ上にてパターンマッチ
ングに似た手法で処理され、両画像データを重ね合わせ
たときの差分が表示されるとともに、その差分の寸法等
が定量化される。(Function) The cross-sectional image data obtained by CT and the design image data input separately are processed on the memory in the device in a method similar to pattern matching, and the difference when both image data are superimposed is displayed. And the size of the difference is quantified.
（実施例） 第１図は本発明の一実施例によるCT式計測装置の概略
構成を示す。この装置は、周知のＸ線によるCTスキャナ
１と、CTスキャナ１で採取された投影データから断面画
像データを合成するCT画像合成部２と、用紙上の設計図
のイメージを光電的に読み取るイメージリーダ３と、各
種コマンドやデータを入力するためのキーボードやポイ
ンティングデバイス（マウス）等を含むコンソール４
と、当該装置の各部を統括するメインプロセッサ５と、
画像データを格納するための大容量の画像メモリ６と、
メモリ６上の画像データを処理する画像プロセッサ７
と、ディスプレイ９に関する制御を行うディスプレイコ
ントローラ８と、プリンタ11に関する制御を行うプリン
タコントローラ10を備えている。(Embodiment) FIG. 1 shows a schematic configuration of a CT-type measuring apparatus according to an embodiment of the present invention. This apparatus includes a well-known X-ray CT scanner 1, a CT image synthesizing unit 2 for synthesizing cross-sectional image data from projection data collected by the CT scanner 1, and an image for photoelectrically reading a design drawing image on paper. A reader 4 and a console 4 including a keyboard and pointing device (mouse) for inputting various commands and data
And a main processor 5 for controlling each part of the device;
A large-capacity image memory 6 for storing image data;
Image processor 7 for processing image data on the memory 6
The display controller 8 controls the display 9, and the printer controller 10 controls the printer 11.
第２図は本装置の主要な動作の概略を示すフローチャ
ートである。FIG. 2 is a flowchart showing an outline of main operations of the present apparatus.
まずCTスキャナ１によりワークの所定部位を走査し
（ステップ201）、その走査データをCT画像合成部２で
処理してワークの断面画像データを生成し、その画像デ
ータをメモリ６に格納するとともに、ディスプレイ９に
そのCT断面画像を表示する（ステップ202）。First, a predetermined part of the work is scanned by the CT scanner 1 (step 201), the scan data is processed by the CT image synthesizing unit 2 to generate cross-sectional image data of the work, and the image data is stored in the memory 6; The CT sectional image is displayed on the display 9 (step 202).
次に、前記ワークの所定部位の設計図をイメージリー
ダ３で読み取り、その設計図画像データをメモリ６に格
納するとともに、ディスプレイ９に表示する（ステップ
203）。なお、CT断面画像と設計図画像の表示色を異な
らせて区別できるようにする。Next, a design drawing of a predetermined portion of the work is read by the image reader 3, and the design drawing image data is stored in the memory 6 and displayed on the display 9 (step
203). The display colors of the CT cross-sectional image and the design drawing image should be different so that they can be distinguished.
次に、CT断面画像データと設計図画像データとが同じ
縮尺率になるように、画像プロセッサ７によりメモリ６
における両画像データの少なくとも一方に拡大または縮
小の処理を施し、その処理後の両画像データをディスプ
レイ９に表示する（ステップ204）。Next, the image processor 7 controls the memory 6 so that the CT section image data and the design drawing image data have the same scale.
In step 204, at least one of the two image data is subjected to enlargement or reduction processing, and the processed image data is displayed on the display 9 (step 204).
次に、前記両画像の特徴点（予め定めたワーク上の
点、画像の重心等）を基準にし、両画像が重なり合うよ
うに、画像プロセッサ７によりメモリ６における両画像
データの少なくとも一方に平行移動および回転の処理を
施し、その処理後の両画像データをディスプレイ９に表
示する（ステップ205）。これによりディスプレイ９上
における両画像が前記特徴点を基準にして重ね合わされ
る。Next, the image processor 7 translates at least one of the two image data in the memory 6 so that the two images overlap each other, based on the feature points of the two images (points on a predetermined work, the center of gravity of the images, and the like). And rotation processing, and display the processed image data on the display 9 (step 205). As a result, both images on the display 9 are superimposed on the basis of the feature point.
次に、前述のようにメモリ６上で等価的に重ね合わさ
れている両画像データの差分を画像プロセッサ７で演算
し、その差分の寸法を定量的に求めて出力するととも
に、ディスプレイ９上で差分が明瞭に分かるような形態
で表示する（ステップ206）。Next, as described above, the difference between the two image data equivalently superimposed on the memory 6 is calculated by the image processor 7, the size of the difference is quantitatively obtained and output, and the difference is displayed on the display 9. Are displayed in a form that allows the user to clearly understand (step 206).
［発明の効果］ 以上詳細に説明したように、この発明のCT式計測装置
によれば、ワークの断面形状を非破壊的に計測できるだ
けでなく、そのCT断面とそのワークの設計図とを比較対
照して誤差寸法を計測する作業がCT断面画像データと設
計図画像データのレベルでコンピュータ処理によって行
えるので、従来のように人手処理による方法に比べて高
能率、高精度になる。[Effects of the Invention] As described in detail above, according to the CT-type measuring apparatus of the present invention, not only can the cross-sectional shape of a work be measured nondestructively, but also the CT cross-section can be compared with the design drawing of the work. In contrast, since the work of measuring the error dimension can be performed by computer processing at the level of CT cross-sectional image data and design drawing image data, the efficiency and accuracy are higher than in the conventional method using manual processing.
第１図は本発明の一実施例によるCT式計測装置の概略構
成ブロック図、第２図同上装置の主要な動作の概略フロ
ーチャートである。FIG. 1 is a schematic block diagram of a CT type measuring apparatus according to an embodiment of the present invention, and FIG. 2 is a schematic flowchart of main operations of the apparatus shown in FIG.
Claims (1)
CTと、前記ワークの所定部位の設計図画像データを入力
する手段と、前記CT断面画像データと前記設計図画像デ
ータの縮尺率を合致させる手段と、前記CT断面画像デー
タと前記設計図画像データとを特徴点を基準に位置、方
向を合わせて等価的に重ね合わせる手段と、重ね合わさ
れた前記CT断面画像データと前記設計図画像データとの
差分を演算して表示する手段とを備えたCT式計測装置。1. Obtaining cross-sectional image data of a predetermined portion of a workpiece.
CT, means for inputting design drawing image data of a predetermined portion of the work, means for matching the scale ratio of the CT cross-sectional image data and the design drawing image data, and the CT cross-sectional image data and the design drawing image data A means for equivalently superimposing the positions and directions based on the feature points, and a means for calculating and displaying a difference between the superimposed CT cross-sectional image data and the design drawing image data. Measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25241689A JP2667019B2 (en) | 1989-09-29 | 1989-09-29 | CT type measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP25241689A JP2667019B2 (en) | 1989-09-29 | 1989-09-29 | CT type measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03115805A JPH03115805A (en) | 1991-05-16 |
| JP2667019B2 true JP2667019B2 (en) | 1997-10-22 |
Family
ID=17237051
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP25241689A Expired - Lifetime JP2667019B2 (en) | 1989-09-29 | 1989-09-29 | CT type measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2667019B2 (en) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004132944A (en) * | 2002-08-16 | 2004-04-30 | Foundation For The Promotion Of Industrial Science | System and method for evaluating manufacturing error and program for the same |
| JP2009109416A (en) * | 2007-10-31 | 2009-05-21 | Hitachi Ltd | Inspection method and inspection system of assembly |
| JP7154535B2 (en) | 2018-07-04 | 2022-10-18 | 国立大学法人 東京大学 | Dimensional measurement method using projection image obtained by X-ray CT device |
-
1989
- 1989-09-29 JP JP25241689A patent/JP2667019B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03115805A (en) | 1991-05-16 |
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