JP2001099641A - Surface shape measurement method - Google Patents

Surface shape measurement method

Info

Publication number
JP2001099641A
JP2001099641A JP31575399A JP31575399A JP2001099641A JP 2001099641 A JP2001099641 A JP 2001099641A JP 31575399 A JP31575399 A JP 31575399A JP 31575399 A JP31575399 A JP 31575399A JP 2001099641 A JP2001099641 A JP 2001099641A
Authority
JP
Japan
Prior art keywords
probe
contact
coordinates
coordinate
contact point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP31575399A
Other languages
Japanese (ja)
Inventor
Akira Shimizu
清水  晃
Hiroshi Makino
洋 牧野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pentel Co Ltd
Original Assignee
Pentel Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pentel Co Ltd filed Critical Pentel Co Ltd
Priority to JP31575399A priority Critical patent/JP2001099641A/en
Publication of JP2001099641A publication Critical patent/JP2001099641A/en
Pending legal-status Critical Current

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  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

PROBLEM TO BE SOLVED: To immediately read the surface coordinates of three or more points around a probe at the time of measuring center coordinate of a contact type probes and obtain a normal to surface near a contact point. SOLUTION: Three or more non-contact displacement meters are attached to a contact type coordinate measurement probe concentrically to the axis of the probe to measure three or more coordinate values around the probe tip end and at the same time of measuring the center coordinate of the contact type probe, three or more surface coordinates around the probe are read to obtain a normal to surface near the contact point and the coordinate of contact point is immediately obtained by offsetting by the probe radius.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、3次元座標を計測
し、その測定点の座標の集合から物体形状を生成する表
面形状測定方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a surface shape measuring method for measuring three-dimensional coordinates and generating an object shape from a set of coordinates of the measurement points.

【0002】[0002]

【従来の技術】3次元座標を計測し、その測定点の座標
の集合から物体形状を生成する方法は良く知られてい
る。図7のような直交する3軸の直動部を有する3次元
測定機20を用いる場合が多い。3次元座標計測用の接
触式プローブ21を図8のような形状とすると、物体表
面に図10の如く、測定点a,a,aに接触し、
図11の如くフィットする曲面22を生成し、図12の
ようなオフセット曲面23を生成する。接触したときの
接触部分の座標は式1のようにして求められる。 (式1) P=P+R・n P:接触点の座標 R:プローブの半径 pa:プローブ球の中心座標 n:接触点における単位法線ベクトル 平面で構成されるような形状の場合、表面形状の法線ベ
クトルは簡単に求めることができる。一方、自由曲面で
構成される形状の場合、形状を再現する為には計測点を
増やして表面形状を取り込む必要がある。これらの計測
点から、面の法線方向を推測して、接触部分の座標の集
合として立体形状を復元する。
2. Description of the Related Art A method of measuring three-dimensional coordinates and generating an object shape from a set of coordinates of the measurement points is well known. In many cases, a three-dimensional measuring machine 20 having three linearly moving parts orthogonal to each other as shown in FIG. 7 is used. If the contact probe 21 for three-dimensional coordinate measurement is shaped as shown in FIG. 8, it comes into contact with the object surface at the measurement points a 1 , a 2 , a 3 as shown in FIG.
A fitted surface 22 is generated as shown in FIG. 11, and an offset surface 23 as shown in FIG. 12 is generated. The coordinates of the contact portion at the time of contact are obtained as in Expression 1. (Equation 1) P = P a + R · n P: coordinates of contact point R: radius of probe pa: center coordinates of probe sphere n: unit normal vector at contact point The normal vector of the shape can be easily obtained. On the other hand, in the case of a shape composed of a free-form surface, it is necessary to increase the number of measurement points and capture the surface shape in order to reproduce the shape. From these measurement points, the normal direction of the surface is estimated, and the three-dimensional shape is restored as a set of coordinates of the contact portion.

【0003】[0003]

【発明が解決しようとする課題】しかしながら複雑な形
状の場合、数万点以上の計測を行う必要があり、手動計
測では多大な労力を必要とする。また、正確な表面形状
を再現する為にプローブ形状と接触点を考慮してオフセ
ット曲面などを生成する必要がある。多数の計測点か
ら、オフセット曲面を生成する為に必要な法線ベクトル
の生成は以下のようにして行うのが一般的である。ま
ず、多数の測定点(プローブの中心座標)から最小二乗
法などによってフィットする曲面を生成する。次に生成
した曲面の法線ベクトルにそって被測定物体の内部方向
にプローブの半径だけオフセットした曲面を生成する。
この曲面が物体の表面形状と一致すると仮定して測定値
とする。上述により、従来の接触式3次元測定機による
自由曲面形状の計測は、自由曲面、オフセット曲面を生
成可能なソフトウェアが必要である。また、プローブを
手動で操作して任意の計測ポイントへ移動し、ワーク表
面へ接触させ即座に座標値を求めることができない。す
なわち、計測のリアルタイム性が必要な場合にはオフセ
ット曲面生成の為の計測とソフトウェア処理の作業が必
要なため適用不可能であるという問題点があった。
However, in the case of a complex shape, it is necessary to measure more than tens of thousands of points, and manual measurement requires a great deal of labor. Further, in order to reproduce an accurate surface shape, it is necessary to generate an offset curved surface or the like in consideration of a probe shape and a contact point. In general, a normal vector required to generate an offset curved surface from a large number of measurement points is generated as follows. First, a curved surface to be fitted is generated from a large number of measurement points (center coordinates of the probe) by the least square method or the like. Next, a curved surface is generated which is offset by the radius of the probe toward the inside of the measured object along the normal vector of the generated curved surface.
Assuming that this curved surface matches the surface shape of the object, the measured value is used as the measured value. As described above, the measurement of the free-form surface shape by the conventional contact type three-dimensional measuring machine requires software capable of generating a free-form surface and an offset surface. In addition, the probe cannot be manually operated to move to an arbitrary measurement point, come into contact with the work surface, and immediately obtain a coordinate value. That is, when real-time measurement is required, there is a problem in that measurement and software processing for generating an offset curved surface are required, so that the method cannot be applied.

【0004】[0004]

【課題を解決するための手段】本発明は上記問題点を解
決することを目的とし、接触式座標測定用プローブに3
つ以上の非接触式変位計をプローブの軸に対して同心円
上に取り付け、プローブ先端の周囲3点以上の座標値を
計測するようにし、接触式プローブの中心座標を計測す
るのと同時にプローブの周囲3点以上の表面座標を読み
取ることで接触点付近の面法線を求め、プローブ半径分
オフセットして接触点の座標を即座に求める如くしたこ
とを特徴とする。
SUMMARY OF THE INVENTION An object of the present invention is to solve the above-mentioned problems, and to provide a probe for contact-type coordinate measurement with a probe.
At least three non-contact displacement gauges are mounted on a concentric circle with respect to the probe axis to measure coordinate values at three or more points around the probe tip. By reading the surface coordinates of three or more surrounding points, the surface normal near the contact point is obtained, and the coordinates of the contact point are immediately obtained by offsetting by the probe radius.

【0005】[0005]

【発明の実施の形態】本発明の実施の形態を図1乃至図
6に示した一実施例に基づいて詳細に説明する。接触式
座標測定用プローブ1に3つ以上の非接触式変位計2,
3,4をプローブ1の軸に対して同心円上に取り付け、
プローブ先端の周囲3点以上の座標値を計測するように
したものを示す。接触式プローブ1の中心座標を計測す
るのと同時にプローブ1の周囲3点以上の表面座標を読
み取ることで接触点付近の面法線を求め、プローブ1半
径分オフセットして接触点の座標を即座に求めることが
できる。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described in detail with reference to one embodiment shown in FIGS. Three or more non-contact displacement gauges are provided on the contact coordinate measuring probe 1,
3 and 4 are attached concentrically to the axis of the probe 1,
This figure shows a configuration in which coordinate values at three or more points around the tip of the probe are measured. At the same time as measuring the center coordinates of the contact probe 1, the surface coordinates at three or more points around the probe 1 are read to determine the surface normal near the contact point, and the coordinates of the contact point are immediately offset by the radius of the probe 1. Can be sought.

【0006】プローブ接触点付近の法線方向は次の手順
によって求められる。図4乃至図6に示す3つの非接触
式変位計2,3,4を同心円上に配置した場合、それぞ
れの計測された座標値をm,m,mとすると、2
つのベクトルa,bが求められる。この2つのベクトル
を含む平面の法線方向は外積a×b ただし、a=m−m b=m−m によって求められる。これをスカラで割り、正規化する
と n=a×b/|a×b| よって計測値から、形状表面の座標値は以下のようにな
る。 P=P+R・n なお、非接触変位計の配置は、プローブ先端が計測点の
なす3角形の内側にあればよく、正三角形である必要は
ない。又、プローブ先端形状は球以外の場合でも適用可
能である。
The normal direction near the probe contact point is determined by the following procedure. When three non-contact displacement meters 2, 3, and 4 shown in FIGS. 4 to 6 are arranged on concentric circles, and the measured coordinate values are m 1 , m 2 , and m 3 , 2
Two vectors a and b are obtained. The normal direction of the plane containing these two vectors is determined by the outer product a × b, where a = m 2 −m 3 b = m 3 −m 1 . When this is divided by a scalar and normalized, n = a × b / | a × b | Therefore, from the measured values, the coordinate values of the shape surface are as follows. P = P a + Rn The arrangement of the non-contact displacement meter may be such that the tip of the probe is inside the triangle formed by the measurement points, and does not need to be a regular triangle. Also, the probe tip shape can be applied to cases other than spherical.

【0007】[0007]

【発明の効果】本発明は、接触式座標測定用プローブに
3つ以上の非接触式変位計をプローブの軸に対して同心
円上に取り付け、プローブ先端の周囲3点以上の座標値
を計測するようにし、接触式プローブの中心座標を計測
するのと同時にプローブの周囲3点以上の表面座標を読
み取ることで接触点付近の面法線を求め、プローブ半径
分オフセットして接触点の座標を即座に求めることがで
きるので、3次元複雑形状を計測する場合必要だった曲
面処理ソフトウェアが不要になり、データ処理の工程が
省略できるので計測を簡単に行うことができる。法線方
向を求める為の多点計測を行う必要がない為、従来の方
式と比べて少ない測定点数で正確な表面形状を再現でき
る。
According to the present invention, three or more non-contact displacement gauges are attached to a contact coordinate measuring probe on a concentric circle with respect to the axis of the probe, and three or more coordinate values around the tip of the probe are measured. Measure the center coordinates of the contact probe and simultaneously read the surface coordinates of three or more points around the probe to find the surface normal near the contact point, offset the probe radius and immediately set the coordinates of the contact point This eliminates the need for curved surface processing software required when measuring a three-dimensional complex shape, and simplifies the measurement because the data processing step can be omitted. Since it is not necessary to perform multi-point measurement for obtaining the normal direction, an accurate surface shape can be reproduced with a smaller number of measurement points than the conventional method.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の一実施例正面図である。FIG. 1 is a front view of one embodiment of the present invention.

【図2】図1の外観斜視図である。FIG. 2 is an external perspective view of FIG.

【図3】図1の作用説明正面図である。FIG. 3 is a front view for explaining the operation of FIG. 1;

【図4】図3のプローブと測定点の上面図である。FIG. 4 is a top view of the probe and measurement points of FIG. 3;

【図5】図4の作用説明平面図である。FIG. 5 is an operation explanatory plan view of FIG. 4;

【図6】図5の作用説明平面図である。FIG. 6 is a plan view for explaining the operation of FIG. 5;

【図7】従来の3軸直動部を有する3次元測定機の外観
斜視図である。
FIG. 7 is an external perspective view of a conventional three-dimensional measuring machine having a three-axis linearly moving portion.

【図8】図7のウローブ正面図である。FIG. 8 is a front view of the wobble of FIG. 7;

【図9】計測用プローブと測定面を示す図である。FIG. 9 is a diagram showing a measurement probe and a measurement surface.

【図10】測定値の補正方法を示す図である。FIG. 10 is a diagram illustrating a method of correcting a measured value.

【符号の説明】[Explanation of symbols]

1 接触式座標測定用プローブ 2,3,4 非接触式変位計 P 接触点の座標 R プローブの半径 P プローブ球の中心座標 n 接触点における単位法線ベクトル1 Contact-type coordinate measuring probe 2, 3, 4 Non-contact type displacement meter P Coordinate of contact point R Probe radius P 1 Center coordinate of probe sphere n Unit normal vector at contact point

───────────────────────────────────────────────────── フロントページの続き Fターム(参考) 2F069 AA04 AA66 DD15 GG01 GG04 GG35 GG58 GG59 GG62 GG64 HH01 HH09 JJ00 LL02 NN00 ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 2F069 AA04 AA66 DD15 GG01 GG04 GG35 GG58 GG59 GG62 GG64 HH01 HH09 JJ00 LL02 NN00

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 接触式座標測定用プローブに3つ以上の
非接触式変位計をプローブの軸に対して同心円上に取り
付け、プローブ先端の周囲3点以上の座標値を計測する
ようにし、接触式プローブの中心座標を計測するのと同
時にプローブの周囲3点以上の表面座標を読み取ること
で接触点付近の面法線を求め、プローブ半径分オフセッ
トして接触点の座標を即座に求める如くした表面形状測
定方法。
At least three non-contact displacement gauges are attached to a contact type coordinate measuring probe on a concentric circle with respect to an axis of the probe, and coordinate values at three or more points around a tip of the probe are measured. By reading the surface coordinates of three or more points around the probe at the same time as measuring the center coordinates of the probe, the surface normal near the contact point is obtained, and the coordinates of the contact point are immediately obtained by offsetting by the probe radius. Surface shape measurement method.
JP31575399A 1999-09-30 1999-09-30 Surface shape measurement method Pending JP2001099641A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP31575399A JP2001099641A (en) 1999-09-30 1999-09-30 Surface shape measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP31575399A JP2001099641A (en) 1999-09-30 1999-09-30 Surface shape measurement method

Publications (1)

Publication Number Publication Date
JP2001099641A true JP2001099641A (en) 2001-04-13

Family

ID=18069143

Family Applications (1)

Application Number Title Priority Date Filing Date
JP31575399A Pending JP2001099641A (en) 1999-09-30 1999-09-30 Surface shape measurement method

Country Status (1)

Country Link
JP (1) JP2001099641A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004535580A (en) * 2001-07-16 2004-11-25 ベルス・メステヒニーク・ゲーエムベーハー Surface characteristic measuring method and coordinate measuring device
JP2006317200A (en) * 2005-05-11 2006-11-24 Canon Inc Surface shape measuring apparatus
JP2010523959A (en) * 2007-04-03 2010-07-15 ストレステック,オウ Goniometer
WO2013121595A1 (en) * 2012-02-15 2013-08-22 三菱重工業株式会社 Normal detection method, normal detection device, and machining machine provided with normal detection function
US20130226513A1 (en) * 2012-02-29 2013-08-29 Mitsubishi Heavy Industries, Ltd. Normal-line detection method, normal-line detection device, and machine tool having normal-line detection function
CN107121113A (en) * 2017-04-24 2017-09-01 上海现代先进超精密制造中心有限公司 The detection method of heavy caliber based on three coordinates, complex free curved surface element

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004535580A (en) * 2001-07-16 2004-11-25 ベルス・メステヒニーク・ゲーエムベーハー Surface characteristic measuring method and coordinate measuring device
JP2006317200A (en) * 2005-05-11 2006-11-24 Canon Inc Surface shape measuring apparatus
JP4500729B2 (en) * 2005-05-11 2010-07-14 キヤノン株式会社 Surface shape measuring device
JP2010523959A (en) * 2007-04-03 2010-07-15 ストレステック,オウ Goniometer
WO2013121595A1 (en) * 2012-02-15 2013-08-22 三菱重工業株式会社 Normal detection method, normal detection device, and machining machine provided with normal detection function
JP2013167508A (en) * 2012-02-15 2013-08-29 Mitsubishi Heavy Ind Ltd Normal line detection method, normal line detection device and processor provided with normal line detection function
EP2827098A4 (en) * 2012-02-15 2015-12-30 Mitsubishi Heavy Ind Ltd Normal detection method, normal detection device, and machining machine provided with normal detection function
US10132624B2 (en) 2012-02-15 2018-11-20 Mitsubishi Heavy Industries, Ltd. Normal detection method, normal detection device, and machining machine provided with normal detection function
US20130226513A1 (en) * 2012-02-29 2013-08-29 Mitsubishi Heavy Industries, Ltd. Normal-line detection method, normal-line detection device, and machine tool having normal-line detection function
JP2013181758A (en) * 2012-02-29 2013-09-12 Mitsubishi Heavy Ind Ltd Normal line detection method, normal line detection device and processor provided with normal line detection function
US9619433B2 (en) * 2012-02-29 2017-04-11 Mitsubishi Heavy Industries, Ltd. Normal-line detection method, normal-line detection device, and machine tool having normal-line detection function
CN107121113A (en) * 2017-04-24 2017-09-01 上海现代先进超精密制造中心有限公司 The detection method of heavy caliber based on three coordinates, complex free curved surface element

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