JP2661447B2 - I / O device test method - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for testing an input / output device (I / O) of a computer system. In recent years, computer systems have been required to be non-stop, and active maintenance has been required for maintenance. For this purpose, it is required to perform a hardware test in parallel with a general job under the operating system (OS).

[0002]

2. Description of the Related Art FIG. 4 is a diagram for explaining a conventional test method for an input / output device. A conventional RAS test, for example, a test for an input / output device (I / O) 4 is performed by a tester, for example, a service processor (SVP) 3 from a test target device (an input / output device (I / O)
O)) 4 or the central processing unit (CPU) 1 executes the stand-alone test program 400 under the control of the test monitor 40 to test the input / output device (I / O) 4 .

[0003]

In general, performing a RAS test under the operating system (OS) 20 means that the general job 21 affects the test job, specifically, for example, the main storage device (OS). (MSU) 2 If a collision occurs with the common area on the MSU 2 or if an absolute address is specified in a test job, an exception interrupt is usually issued because the area may be used by a general job. RAS test under the operating system (OS) 20 has not been conducted so far.

Therefore, in order to execute the RAS test, as described above, the service processor (SVP) 3 tests the device under test {input / output device (I / O)} 4 or the test monitor 4
0, the operating system (OS) 20 is temporarily stopped, the execution of the general job 21 is stopped, the test monitor 40 is loaded, and the test program 4 is executed.
00, the operating system (OS) 2
There was a problem that the stop of 0 and the initial program loading (OS IPL) of the operating system (OS) 20 after the test ended took a long time, and the work under the operating system (OS) 20 was temporarily suspended. .

[0005] In view of the above-mentioned conventional disadvantages, the present invention provides an operating system (O / O) for testing an input / output device (I / O).
S), the I / O device (I /
It is intended to provide a test method capable of performing the test of O).

[0006]

FIG. 1 is a block diagram showing the principle of the present invention. The above problems are solved by an input / output device (I / O) test method configured as follows.

(1) A test job 22 of the same rank as a general job 21 is placed under the operating system (OS) 20 of the computer system, and the operating system (OS) 2
0, an input / output device test unit 201 having the same interface as the device driver 200 for accessing the input / output device (I / O) 4 is provided.The test job 22 is executed by the operating system (OS) 20. The I / O device test unit 201 that issues a single test execution instruction command to the I / O device test unit 201 provided therein, and receives the test execution instruction command, makes the device driver 200
The input / output device (I / O) 4 is configured to be accessed and tested via an interface to the input / output device (I / O) 4.

(2) A test job 22 of the same rank as a general job 21 is placed under the operating system (OS) 20 of the computer system, and the operating system (OS) 2
0, an input / output device test unit 201a for testing an input / output device (I / O) is provided, and the input / output device test unit 201a is provided with a device driver 20 under the operating system (OS) 20.
0 is started to access the input / output device (I / O) 4, and the test job 22 is executed by the input / output device test unit 201 a provided in the operating system (OS) 20. The input / output device test unit 201a which issues a single test execution instruction command and receives the test execution instruction command activates the device driver 200 and accesses the input / output device (I / O) 4. To be tested.

[0009]

[Operation] That is, in the present invention, 1) a general job is:
Under normal operating system (OS) to prevent test jobs from affecting test jobs and general jobs, and to enable test jobs to operate with absolute addressing Instead of the job
Test with the operating system kernel itself.

In the kernel of the operating system (OS), since a plurality of jobs do not operate at the same time, a general job does not affect a test job, and a test job does not affect a general job.

In the operating system (OS), an absolute address is designated and the operating system (O
Since S) is not recognized as an exception, an absolute address can be specified, and the test program can be easily constructed.

2) Specifically, a test job under the operating system (OS)
(OS) kernel (nucleus) own function, for example, I / O device
Since the conditions for directly activating (I / O) are not disclosed to the public, it is not possible to directly access the input / output device (I / O) under the operating system (OS).

Accordingly, the present invention focuses on the fact that the interface (startup condition) of a device driver for accessing an input / output device (I / O) under the operating system (OS) is open to the public. The input / output device (I / O) is configured to be tested using the driver interface.

That is, a test job is provided at the same position as a general job, and the operating system (OS)
In the kernel of, for example,
A RAS test device driver (input / output device test unit) is provided, and a test execution instruction command is issued from the test job to the operating system (OS).

The I / O management mechanism in the kernel of the operating system (OS) that has received the test execution instruction command executes the above-described RAS test execution in the same manner as receiving an ordinary I / O instruction execution instruction from a general job. The device driver is called, and the input / output device (I / O) is tested by the RAS test device driver.

In a normal device driver, a plurality of commands are prepared, and the device driver operates according to the commands. However, the RAS test device driver of the present invention has only one command, and the single command (test execution instruction) is issued. Command) to perform all of the pre-processing, testing, and post-processing of the test.

When a plurality of commands are provided in the same manner as in a normal device driver, the input / output management mechanism in the operating system (OS) kernel receives the RAS every time the plurality of commands are received. Since the operation is to start the test device driver, the test on the input / output device (I / O) to be tested may be interrupted.

Therefore, in the present invention, as described above, only one test execution instruction command is prepared, and the RAS test device driver is activated by the test execution instruction command. For example, an address register (AR) is used as a parameter of a hardware command for an input / output device (I / O).
First, write the start address of the used area of the main storage unit (MSU), write hard commands (read, write, seek, etc.) to the command register (CR), and execute any hard command .

In the following, the kernel of the operating system (OS) may be expressed as an operating system (OS) for convenience of explanation. By configuring as above to test the input / output device (I / O), the RAS test for the input / output device (I / O) can be performed under the operating system (OS).
Stop general jobs and operating system (OS)
Stop and post-test operating system (OS)
The initial program loading (IPL) takes a long time, and there is an effect that the work under the operating system (OS) is not interrupted temporarily.

[0020]

BRIEF DESCRIPTION OF THE DRAWINGS FIG. FIG. 1 described above is a principle configuration diagram of the present invention.
FIG. 3 is a flowchart showing an embodiment of the present invention.
FIG. 2 shows an operation flow of the test job, and FIG. 3 shows an operation flow of the input / output device test unit in the operating system (OS).

In the present invention, a general job is controlled under the operating system (OS) 20 of the computer system.
A test job 22 of the same rank as 21 is placed, and an input / output device test unit 201 having the same interface as the device driver 200 for accessing the input / output device (I / O) 4 is provided in the operating system (OS) 20. , Test job above 22
Issues a single test execution instruction command to the input / output device test unit 201 provided in the operating system (OS) 20 and receives the test execution instruction command. Means for accessing and testing the input / output device (I / O) 4 via an interface to the input / output device (I / O) 4 of the device driver 200, or an operating system (OS) 2
0, an input / output device test unit 201a for testing an input / output device (I / O) is provided, and the input / output device test unit 201a includes a device driver 2 under the operating system (OS) 20.
The means for starting 00 and testing the input / output device (I / O) 4
This is a necessary means for carrying out the present invention. Note that the same reference numerals indicate the same object throughout the drawings.

Hereinafter, a method of testing an input / output device (I / O) according to the present invention will be described with reference to FIGS. First, in the present invention, as shown in FIG. 1, a test job 22 of the same rank as a general job 21 is placed under an operating system (OS) 20 of a computer system, and the operating system (OS) 20 An input / output device test unit 201 having the same interface as the device driver 200 for the input / output device (I / O) 4 is provided therein.

Therefore, when the test job 22 is started under the control of the operating system (OS) 20,
The test job 22 operates according to the operation flow shown in FIG.

Processing step 100: A test start message is displayed on a display screen (not shown). Processing step 101: input / output device test unit (RAS
The test device driver (201) is loaded into the kernel 20 of the operating system (OS).

Processing step 102: I / O device test section
(RAS test device driver) 201, issues a test execution instruction command. In the present invention, as described above, only one test execution instruction command is prepared.

By consolidating the test instructions for the input / output device (I / O) 4 into the test execution instruction command, the test instructions from the kernel 20 can be efficiently (specifically, the test instructions from the kernel 20). The input / output device (I / O) 4 can be tested without interruption.

Processing step 103: Checking whether the return value (condition code) of the test execution instruction command is “0”, and if it is “0” indicating normal termination,
The process proceeds to processing step 104, but if it is not “0”, it means that an error has been detected, so the process jumps to processing step 105.

Processing step 104: Since the processing is normally completed,
A test end message is displayed on the display screen, and the test of the input / output device (I / O) 4 ends. Processing steps 105 and 106: Since an error has occurred, a main storage device for interfacing with the input / output device test unit 201 is used.
(MSU) 2 The area of {see FIG. 4} is read, the error message is edited and displayed on the display screen, and the process proceeds to the processing step 104.

The operation of the test job 22 placed on the same rank as the general job 21 has been described.
The operation of the input / output device test unit 201 that operates under the kernel 20 and is started by only one test execution instruction command issued from the maker will be described with reference to FIG.

Processing step 300: The initial state of the device to be tested, here, the input / output device (I / O) 4 is read and saved in a specific area of the main storage device (MSU) 2. Processing step 301: The start address of the area of the main storage device (MSU) 2 used in correspondence with each test item of the input / output device (I / O) 4 is used as a command parameter as an address register (A
Write to R).

Processing step 302: Hard commands (eg, read, read, etc.) corresponding to each test item of the input / output device (I / O) 4
Write, seek, etc.) as command parameters in the command register (CR).

When the command parameters are set, the input / output device (I / O) 4 of the device under test is
The hardware command is issued to the input / output device (I / O) 4 through an interface provided in the device driver 200 for the (I / O) 4, and a test such as read / write is performed. The result is set in the status register (SR).

Processing steps 303 and 304: The contents of the status register (SR) are read, and it is determined whether or not the processing ends normally.
If it is “0”, it is regarded as a normal end and the processing step
The process proceeds to 305, but if it is not “0”, the process jumps to processing step 306 as an abnormal end.

Processing step 305: As a normal end, the state of the device under test {input / output device (I / O)} 4 is returned to the initial state before the test, and the test is terminated. Processing Step 3
06: As an abnormal end, the details of the error are written in the area for interfacing with the test job 22 on the main storage device (MSU) 2.

In the above embodiment, the input / output device test unit 201 under the kernel 20 is configured to have the same interface as the normal device driver 200. In this case, the operating system (OS) 20 The I / O device test section 201 is used by both the designer and the test user.
Need to be designed. As described above, originally, there is a device driver 200 for accessing the input / output device (I / O) 4 under the kernel 20. An input / output device test unit 201a having no configuration for the device (I / O) 4 is constructed, and the input / output device test unit 201a activates the device driver 200 whose start condition is disclosed, and The device (I / O) 4 may be configured to be tested. In this case, it goes without saying that the input / output device test unit 201a can be designed only by the test user. .

As described above, the present invention provides an input / output device (I / O)
In order to test, a test job of the same rank as a general job is placed under the operating system (OS) of the computer system, and the input / output device (I / O) is accessed in the operating system (OS) An input / output device test unit having the same interface as the device driver is provided, or the input / output device test unit is provided with the operating system (OS).
And issues only one test execution instruction command from the test job to the input / output device test unit under the operating system (OS) from the test job. The I / O device testing unit accesses the I / O device (I / O) via the device driver interface based on the above, and performs a test of the I / O device (I / O) in parallel with a general job. There is a characteristic in that it is performed by doing.

[0037]

As described in detail above, the test method of the input / output device (I / O) of the present invention is a test method of the same rank as a general job under the operating system (OS) of a computer system. Place the job and operating system (OS)
An I / O device testing unit with the same interface as the device driver to access the I / O device (I / O) should be provided, or the I / O device testing unit should be installed in the operating system (OS). A device driver is configured to be started, and only one test execution instruction command is issued from the test job to the input / output device test unit under the operating system (OS), and based on the test execution instruction command. , The input / output device test unit communicates with the input / output device (I
/ O) and the test of the input / output device (I / O) is performed in parallel with the general job, so that the input / output device (I / O) is controlled under the operating system (OS). / O)
RAS test is possible, and to test the input / output device (I / O), stop the operating system (OS), stop general jobs, stop the operating system (OS), It takes time for the initial program loading (IPL) of the operating system (OS) after the test is completed, and the work under the operating system (OS) does not have to be temporarily interrupted.
(I / O) can be tested.

[Brief description of the drawings]

FIG. 1 is a block diagram of the principle of the present invention.

FIG. 2 is a flowchart showing an embodiment of the present invention (part 1).

FIG. 3 is a flowchart showing an embodiment of the present invention (part 2).

FIG. 4 is a diagram illustrating a conventional test method for an input / output device.

[Explanation of symbols]

1 Central processing unit (CPU) 2 Main storage device
(MSU) 20 Operating system (OS) or kernel 21 General job 22 Test job 200 Device driver 201, 201a Input / output device test unit or RAS test device driver 3 Service processor (SVP) 4 Input / output device
(I / O) 40 Test monitor 400 Stand-alone test program Test execution instruction command Interface with device driver input / output device (I / O) 100 to 106,300 to 306 Processing steps

Claims (2)

(57) [Claims] 1. A test job (22) of the same rank as a general job (21) is placed under an operating system (OS) (20) of a computer system, and is placed in the operating system (OS) (20). An input / output device test unit (201) having the same interface as the device driver (200) for accessing the input / output device (I / O) (4) is provided, and the test job (22) is provided by the operating system.
(OS) The input / output device test section (2
01), the input / output device test unit (201) that has received the single test execution instruction command () and received the test execution instruction command () becomes the input / output device (I / O) of the device driver (200). A method for testing an input / output device, characterized in that the input / output device (I / O) (4) is accessed and tested via an interface () for the (4). 2. A test job (22) having the same rank as a general job (21) is placed under the operating system (OS) (20) of the computer system, and is placed in the operating system (OS) (20). Input / output device test section for testing the input / output device (I / O) (4)
(201a), and the input / output device test unit (201a) is provided with a device driver (20) under the operating system (OS) (20).
0) to access the input / output device (I / O) (4), and the test job (22)
(OS) Input / output device test unit (201a) provided in (20)
Issues only one test execution command ().
The input / output device test unit (201a) receiving the test execution instruction command () activates the device driver (200) and accesses and tests the input / output device (I / O) (4). A test method for an input / output device characterized by the following.