JP2651495B2 - Thermal analyzer - Google Patents

Thermal analyzer

Info

Publication number
JP2651495B2
JP2651495B2 JP62332492A JP33249287A JP2651495B2 JP 2651495 B2 JP2651495 B2 JP 2651495B2 JP 62332492 A JP62332492 A JP 62332492A JP 33249287 A JP33249287 A JP 33249287A JP 2651495 B2 JP2651495 B2 JP 2651495B2
Authority
JP
Japan
Prior art keywords
temperature
function
heating furnace
sample
converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP62332492A
Other languages
Japanese (ja)
Other versions
JPH01174954A (en
Inventor
信隆 中村
晴男 武田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP62332492A priority Critical patent/JP2651495B2/en
Publication of JPH01174954A publication Critical patent/JPH01174954A/en
Application granted granted Critical
Publication of JP2651495B2 publication Critical patent/JP2651495B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Control Of Temperature (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は材料の物性の温度依存性を測定する熱分析装
置に関するものである。
Description: TECHNICAL FIELD The present invention relates to a thermal analyzer for measuring the temperature dependence of physical properties of a material.

〔発明の概要〕[Summary of the Invention]

本発明は、測定すべき試料の温度を正確に所望の温度
関数に従って変化させることを目的とするため、温度関
数発生器と温度関数変換器と温度電圧変換器と加熱炉と
比較演算回路と比例電力発生器と測定部とから構成さ
れ、前記温度関数変換器において、前記加熱炉と前記測
定部に置かれた試料の間の温度ずれを補正する温度変換
を行うことにより、上記の目的を達成させたものであ
る。
The present invention aims to change the temperature of a sample to be measured accurately in accordance with a desired temperature function. Therefore, a temperature function generator, a temperature function converter, a temperature-voltage converter, a heating furnace, a comparison furnace, The above object is achieved by performing a temperature conversion that includes a power generator and a measurement unit and corrects a temperature difference between the heating furnace and a sample placed in the measurement unit in the temperature function converter. It was made.

〔従来の技術〕 従来、この種の発明に関しては、前記温度関数変換器
をもたないものや、前記温度関数変換器をもたず加熱炉
温度の代わりに試料温度を前記比較演算回路に入力して
加熱炉に供給する電力を制御するものである。
[Prior art] Conventionally, with respect to this type of invention, a sample having no temperature function converter or a sample temperature instead of a heating furnace temperature without the temperature function converter is input to the comparison operation circuit. And controls the power supplied to the heating furnace.

〔発明が解決しようとする問題点〕[Problems to be solved by the invention]

上記従来技術においては、前者の場合、加熱炉温度が
所望の温度関数に一致するように制御することは比較的
容易であるが、その際、試料温度は加熱炉温度よりも常
に低く、しかも、そのずれ幅は温度に依存するため、試
料温度を所望の温度関数に一致させることは極めて難し
いという欠点があった。また、後者の場合は試料温度を
制御信号として加熱炉制御を行うため、試料温度は所望
の温度関数に比較的一致しやすいが、制御対象である加
熱炉の温度変化が、制御信号(試料温度)の変化として
検出されるまでに時間遅れが発生するため、制御が不安
定で乱れやすくなるという欠点があった。
In the prior art described above, in the former case, it is relatively easy to control the heating furnace temperature to match a desired temperature function, but at this time, the sample temperature is always lower than the heating furnace temperature, and Since the deviation width depends on the temperature, there is a disadvantage that it is extremely difficult to make the sample temperature coincide with a desired temperature function. In the latter case, since the heating furnace is controlled using the sample temperature as a control signal, the sample temperature relatively easily matches the desired temperature function. However, the change in temperature of the heating furnace to be controlled is controlled by the control signal (sample temperature). Since a time delay occurs before the change is detected, the control is unstable and easily disturbed.

〔問題点を解決するための手段〕[Means for solving the problem]

本初明は上記の欠点を無くするために開発されたもの
で、その主たる構成要件は、温度関数発生器と温度関数
変換器と温度電圧変換器と加熱炉と比較演算回路と比例
電圧発生器と測定部とから成っている。
The primary purpose of this invention was to eliminate the above-mentioned disadvantages, and its main components were a temperature function generator, a temperature function converter, a temperature-voltage converter, a heating furnace, a comparison operation circuit, and a proportional voltage generator. And a measuring unit.

〔作用〕[Action]

上記構成の作用は、先ず温度関数発生器に所望の関数
形を入力すると、温度関数変換器において加熱炉温度と
試料温度の差に相当する温度分が該関数に上乗せされる
ように関数形が修正変換される。加熱炉温度は修正され
た関数形により制御されるため、最初入力された関数形
より高めの温度に制御されるが、この時、試料温度は加
熱炉温度よりも温度勾配により低くなり、結果的にほぼ
所望の関数形に一致する。又、制御対象である加熱炉の
温度が直接制御信号となるため帰還ループの時間遅れが
小さく、制御は安定に行われる。従って、測定すべき試
料の温度を正確に所望の温度関数に従って変化させると
いう目的を達成する。
The operation of the above configuration is as follows. First, when a desired function form is input to the temperature function generator, the function form is such that a temperature component corresponding to the difference between the furnace temperature and the sample temperature is added to the function in the temperature function converter. Modified conversion. Since the furnace temperature is controlled by the modified function form, the temperature is controlled to be higher than the initially input function form, but at this time, the sample temperature becomes lower due to the temperature gradient than the furnace temperature, and as a result, Approximately matches the desired functional form. Further, since the temperature of the heating furnace to be controlled is directly a control signal, the time delay of the feedback loop is small, and the control is performed stably. Accordingly, the object of changing the temperature of the sample to be measured exactly according to a desired temperature function is achieved.

〔実施例〕〔Example〕

以下、本発明を一実施例に示した図面に基づき詳細に
説明すると、図中1は温度関数発生器であり、温度関数
発生器1には温度関数変換器2が接続され、温度関数変
換器2には温度電圧変換器3が接続されている。4は加
熱炉で、加熱炉4と前記温度電圧変換器3とは比較演算
回路5に接続され、比較演算回路5は比例電力発生器6
に接続され、比例電力発生器6は前記加熱炉4に接続さ
れている。さらに、加熱炉4には測定すべき試料(図示
せず)の温度および物性値を計測する測定部7が接続さ
れている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the drawings shown in one embodiment. In the drawings, reference numeral 1 denotes a temperature function generator, and a temperature function converter 2 is connected to the temperature function generator 1; A temperature-voltage converter 3 is connected to 2. Reference numeral 4 denotes a heating furnace. The heating furnace 4 and the temperature-voltage converter 3 are connected to a comparison operation circuit 5, and the comparison operation circuit 5 includes a proportional power generator 6
And the proportional power generator 6 is connected to the heating furnace 4. Further, the heating furnace 4 is connected to a measuring section 7 for measuring the temperature and physical properties of a sample (not shown) to be measured.

先ず、温度関数発生器1に所望の温度関数形を入力す
ると、温度関数変換器2では加熱炉4の温度と測定部7
に置かれた前記試料の温度との差を該温度関数に上乗せ
する形で温度関数形が修正される。修正された温度関数
は温度関数変換器2から温度電圧変換器3に送られ温度
関数から使用する温度検出器の温度電圧特性に合わせた
電圧関数へと変換される。前記加熱炉4の中に配置され
た温度検出器(図示せず)による温度検出信号と該電圧
関数とは、比較演算回路5に送られ信号差に対し比較積
分微分制御演算を施された後、演算信号が比例電力発生
器6に送られ、該演算信号に比例した電力が、比例電力
発生器6から加熱炉4に供給され加熱炉4の温度制御が
行われる。さらに加熱炉4から測定部7に置かれた前記
試料には伝導,対流あるいは輻射による熱の伝達が生
じ、測定部7では該試料の温度および物性値測定信号を
出力している。
First, when a desired temperature function form is input to the temperature function generator 1, the temperature function converter 2 compares the temperature of the heating furnace 4 with the measurement unit 7.
The temperature function form is modified in such a manner that the difference from the temperature of the sample placed in the temperature function is added to the temperature function. The corrected temperature function is sent from the temperature function converter 2 to the temperature-voltage converter 3 and converted from the temperature function into a voltage function that matches the temperature-voltage characteristics of the temperature detector used. A temperature detection signal from a temperature detector (not shown) arranged in the heating furnace 4 and the voltage function are sent to a comparison operation circuit 5 and subjected to a comparison integral / differential control operation on a signal difference. , An operation signal is sent to the proportional power generator 6, and power proportional to the operation signal is supplied from the proportional power generator 6 to the heating furnace 4 to control the temperature of the heating furnace 4. Further, heat is transmitted from the heating furnace 4 to the sample placed in the measuring section 7 by conduction, convection or radiation, and the measuring section 7 outputs a temperature and physical property value measurement signal of the sample.

温度関数変換器2における温度変換についてさらに詳
しく説明すると、先ず、加熱炉4を各温度で一定温度保
持させるように温度関数発生器1に関数形を与え、この
時の加熱炉温度と試料温度との関係を、 加熱炉温度=f(試料温度) となるように多項式近似しておく。温度関数変換器2の
働きは、入力値に対して上記変換fを施して出力するこ
とにある。
The temperature conversion in the temperature function converter 2 will be described in more detail. First, a function form is given to the temperature function generator 1 so as to keep the heating furnace 4 at a constant temperature at each temperature. Is approximated by a polynomial so that heating furnace temperature = f (sample temperature). The function of the temperature function converter 2 is to apply the above-mentioned conversion f to the input value and output the result.

こうして、前記温度関数発生器1に入力された関数
は、温度関数変換器2により加熱炉と試料の温度ずれを
見込む形で高めに修正され、最終的に試料温度は最初に
入力された関数形にほぼ一致し、目的を達する。
In this way, the function input to the temperature function generator 1 is corrected to be higher by the temperature function converter 2 in view of the temperature difference between the heating furnace and the sample, and finally the sample temperature is changed to the function type initially input. Almost match, reach the purpose.

なお、温度関数発生器1,温度関数変換器2,温度電圧変
換器3および比較演算回路5は、アナログ回路でも、デ
ジタル回路でも構成することができるが、この選択が本
発明の内容を制限するものでないのは勿論のことであ
る。
The temperature function generator 1, the temperature function converter 2, the temperature-voltage converter 3, and the comparison operation circuit 5 can be constituted by an analog circuit or a digital circuit, but this selection limits the contents of the present invention. Of course it is not.

〔発明の効果〕〔The invention's effect〕

以上のように本発明によれば、温度関数発生器と温度
電圧変換器との間に温度関数変換器を設け制御対象であ
る加熱炉の温度と試料温度とのずれを常に補正するよう
にしたから、試料温度を所望の温度関数に従って変化さ
せることができ、しかも測定者は、加熱炉温度と試料温
度の間のずれを意識する必要がない。さらに、制御対象
である加熱炉の温度を直接制御信号として利用するた
め、制御帰還ループの時間遅れが小さく常に安定した制
御が行われるという効果を有する。
As described above, according to the present invention, the temperature function converter is provided between the temperature function generator and the temperature-voltage converter, and the deviation between the temperature of the heating furnace to be controlled and the sample temperature is always corrected. Therefore, the sample temperature can be changed according to a desired temperature function, and the operator does not need to be aware of the difference between the heating furnace temperature and the sample temperature. Furthermore, since the temperature of the heating furnace to be controlled is directly used as a control signal, there is an effect that a time delay of the control feedback loop is small and stable control is always performed.

【図面の簡単な説明】[Brief description of the drawings]

図面は本発明の実施例を示すブロック図である。 1……温度関数発生器 2……温度関数変換器 3……温度電圧変換器 4……加熱炉 5……比較演算回路 6……比例電力発生器 7……測定部 The drawing is a block diagram showing an embodiment of the present invention. DESCRIPTION OF SYMBOLS 1 ... Temperature function generator 2 ... Temperature function converter 3 ... Temperature-voltage converter 4 ... Heating furnace 5 ... Comparison arithmetic circuit 6 ... Proportional power generator 7 ... Measurement part

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】時間を変数として温度に対応した温度関数
を発生する温度関数発生器と、前記温度関数発生器に接
続され、試料の温度を変化させる加熱炉と、前記試料の
温度と前記加熱炉の温度を検出する温度検出器と、前記
温度関数発生器に接続され、前記検出器により検出され
た前記試料の温度と前記加熱炉の温度の温度差に基づい
て前記温度関数を修正し、あらかじめ修正された前記温
度関数のみにより前記加熱炉の温度を制御する信号を出
力する温度関数変換器と、前記加熱炉に接続され分析す
べき試料物性値を計測する測定部とを備えることを特徴
とする熱分析装置。
1. A temperature function generator for generating a temperature function corresponding to a temperature using time as a variable, a heating furnace connected to the temperature function generator for changing a temperature of a sample, a temperature of the sample, and the heating of the sample. A temperature detector for detecting the temperature of the furnace, connected to the temperature function generator, to correct the temperature function based on the temperature difference between the temperature of the sample and the temperature of the heating furnace detected by the detector, A temperature function converter that outputs a signal for controlling the temperature of the heating furnace only by the previously corrected temperature function, and a measuring unit that is connected to the heating furnace and measures a physical property value of a sample to be analyzed. Thermal analyzer.
【請求項2】前記加熱炉と試料の間の温度差は、加熱炉
を各温度で一定温度保持して求め、そして前記温度関数
変換器を動作させる特許請求の範囲第1項記載の熱分析
装置。
2. The thermal analysis apparatus according to claim 1, wherein the temperature difference between the heating furnace and the sample is obtained by maintaining the heating furnace at a constant temperature at each temperature, and operating the temperature function converter. apparatus.
JP62332492A 1987-12-29 1987-12-29 Thermal analyzer Expired - Lifetime JP2651495B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62332492A JP2651495B2 (en) 1987-12-29 1987-12-29 Thermal analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62332492A JP2651495B2 (en) 1987-12-29 1987-12-29 Thermal analyzer

Publications (2)

Publication Number Publication Date
JPH01174954A JPH01174954A (en) 1989-07-11
JP2651495B2 true JP2651495B2 (en) 1997-09-10

Family

ID=18255548

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62332492A Expired - Lifetime JP2651495B2 (en) 1987-12-29 1987-12-29 Thermal analyzer

Country Status (1)

Country Link
JP (1) JP2651495B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4849961B2 (en) * 2006-06-05 2012-01-11 エスアイアイ・ナノテクノロジー株式会社 Thermal analyzer
EP2214005B1 (en) * 2009-02-03 2019-09-18 Mettler-Toledo GmbH Thermo-Analytical Instrument
CN109031942B (en) * 2018-07-31 2020-08-11 清华大学 Method for correcting calorimeter calorimetric process delay link by using transfer function

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6247074Y2 (en) * 1979-03-30 1987-12-24
JPS61110713A (en) * 1984-11-06 1986-05-29 Toshiba Corp Temperature controlling system of annealing surface

Also Published As

Publication number Publication date
JPH01174954A (en) 1989-07-11

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