JPH01174954A - Heat analyzer - Google Patents
Heat analyzerInfo
- Publication number
- JPH01174954A JPH01174954A JP33249287A JP33249287A JPH01174954A JP H01174954 A JPH01174954 A JP H01174954A JP 33249287 A JP33249287 A JP 33249287A JP 33249287 A JP33249287 A JP 33249287A JP H01174954 A JPH01174954 A JP H01174954A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- heating furnace
- converter
- function
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010438 heat treatment Methods 0.000 claims abstract description 39
- 238000004364 calculation method Methods 0.000 claims description 11
- 238000005259 measurement Methods 0.000 claims description 8
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 230000000704 physical effect Effects 0.000 claims description 4
- 238000002076 thermal analysis method Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 2
- 230000004069 differentiation Effects 0.000 abstract 1
- 230000010354 integration Effects 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 4
- 238000012905 input function Methods 0.000 description 2
- 210000000988 bone and bone Anatomy 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
Landscapes
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Control Of Temperature (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は材料の物性の温度依存性を測定する熱分析装置
に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a thermal analysis device for measuring the temperature dependence of physical properties of materials.
本発明は、測定すべき試料の温度を正確に所望の温度関
数に従って変化させることを目的とするため、温度関数
発生器と温度変換器と温度電圧変換器と加熱炉と比較演
算回路と比例電力発生器と測定部とから構成され、前記
温度変換器において、前記加熱炉と前記測定部に置かれ
た試料の間の温度ずれを補正する温度変換を行うことに
より、上記の目的を達成させたものである。The present invention aims to change the temperature of a sample to be measured accurately according to a desired temperature function. The above object is achieved by performing temperature conversion in the temperature converter, which is composed of a generator and a measurement section, to correct a temperature difference between the sample placed in the heating furnace and the measurement section. It is something.
従来、この種の発明に関しては、前記温度変換器をもた
ないものや、前記温度変換器をもたず加熱炉温度の代わ
りに試料温度を前記比較演算回路に入力して加熱炉に供
給する電力を制御するものである。Conventionally, in this type of invention, there are those that do not have the temperature converter, or those that do not have the temperature converter and input the sample temperature instead of the heating furnace temperature to the comparison calculation circuit and supply it to the heating furnace. It controls electric power.
上記従来技術においては、前者の場合、加熱炉温度が所
望の温度関数に一致するように制御することは比較的容
易であるが、その際、試料温度は加熱炉温度よりも常に
低く、しかも、そのずれ幅は温度に依存するため、試料
温度を所望の温度関数に一致させることは極めて難しい
という欠点があった。また、後者の場合は試料温度を制
御信号として加熱炉制御を行うため、試料温度は所望の
温度関数に比較的一致しやすいが、制御対象である加熱
炉の温度変化が、制御信号（試料温度）の変化として検
出されるまでに時間遅れが発生するため、制御が不安定
で乱れやすくなるという欠点があった。In the above conventional technology, in the former case, it is relatively easy to control the heating furnace temperature so that it matches a desired temperature function, but in this case, the sample temperature is always lower than the heating furnace temperature, and Since the width of the deviation depends on the temperature, it is extremely difficult to match the sample temperature to a desired temperature function. In addition, in the latter case, the heating furnace is controlled using the sample temperature as a control signal, so the sample temperature is relatively likely to match the desired temperature function. ), there is a time delay before it is detected as a change, which has the disadvantage of making control unstable and prone to disturbances.
本発明は上記の欠点を無くするために開発されたもので
、その主たる構成要件は、温度関数発生器と温度変換器
と温度電圧変換器と加熱炉と比較演算回路と比例電圧発
生器と測定部とから成っている。The present invention was developed to eliminate the above drawbacks, and its main components are a temperature function generator, a temperature converter, a temperature voltage converter, a heating furnace, a comparison calculation circuit, a proportional voltage generator, and a measurement It consists of the following sections.
上記構成の作用は、先ず温度関数発生器に所望の関数形
を入力すると、温度変換器において加熱炉温度と試料温
度の差に相当する温度骨が該関数に上乗せされるように
関数形が修正変換される。The effect of the above configuration is that when a desired function form is first input to the temperature function generator, the function form is modified in the temperature converter so that a temperature bone corresponding to the difference between the heating furnace temperature and the sample temperature is added to the function. converted.
加熱炉温度は修正された関数形により制御されるため、
最初入力された関数形より高めの温度に制御されるが、
この時、試料温度は加熱炉温度よりも温度勾配により低
くなり、結果的にほぼ所望の関数形に一致する。又、制
御対象である加熱炉の温度が直接制御信号となるため帰
還ループの時間遅れが小さく、制御は安定に行われる。Since the furnace temperature is controlled by a modified functional form,
Although the temperature is controlled to be higher than the initially input function form,
At this time, the sample temperature becomes lower than the heating furnace temperature due to the temperature gradient, and as a result, it almost matches the desired functional form. Furthermore, since the temperature of the heating furnace to be controlled becomes a direct control signal, the time delay in the feedback loop is small and control is performed stably.
従って、測定すべき試料の温度を正確に所望の温度関数
に従って変化させるという目的を達成する。Thus, the objective of changing the temperature of the sample to be measured precisely according to the desired temperature function is achieved.
以下、本発明を一実施例に示した図面に基づき詳細に説
明すると、図中１は温度関数発生器であり、温度関数発
生器１には温度変換器２が接続され、温度変換器２には
温度電圧変換器３が接続されている。４は加熱炉で、加
熱炉４と前記温度電圧変換器３とは比較演算回路５に接
続され、比較演算回路５は比例電力発生器６に接続され
、比例電力発生器６は前記加熱炉４に接続されている。Hereinafter, the present invention will be explained in detail based on a drawing showing an embodiment. In the drawing, 1 is a temperature function generator, a temperature converter 2 is connected to the temperature function generator 1, and a temperature converter 2 is connected to the temperature function generator 1. is connected to the temperature voltage converter 3. 4 is a heating furnace, the heating furnace 4 and the temperature voltage converter 3 are connected to a comparison calculation circuit 5, the comparison calculation circuit 5 is connected to a proportional power generator 6, and the proportional power generator 6 is connected to the heating furnace 4. It is connected to the.
さらに、加熱炉４には測定すべき試料（図示せず）の温
度および物性値を計測する測定部７が接続されている。Furthermore, a measurement unit 7 is connected to the heating furnace 4 to measure the temperature and physical property values of a sample (not shown) to be measured.
先ず、温度関数発生器１に所望の関数形を入力すると、
温度変換器２では加熱炉４の温度と測定部７に置かれた
前記試料の温度との差を該関数に上乗せする形で関数形
が修正される。修正された温度関数は温度変換器２から
温度電圧変換器３に送られ温度関数から使用する温度検
出器の温度電圧特性に合わせた電圧関数へと変換される
。前記加熱炉４の中に配置された温度検出器（図示せず
）による温度検出信号と該電圧関数とは、比較演算回路
５に送られ信号差に対し比例積分微分制御演算を施され
た後、演算信号が比例電力発生器６に送られ、該演算信
号に比例した電力が、比例電力発生器６から加熱炉４に
供給され加熱炉４の温度制御が行われる。さらに加熱炉
４から測定部７に置かれた前記試料には伝導、対流ある
いは輻射による熱の伝達が生じ、測定部７では該試料の
温度および物性値測定信号を出力している。First, when a desired function form is input into the temperature function generator 1,
In the temperature converter 2, the function form is modified by adding the difference between the temperature of the heating furnace 4 and the temperature of the sample placed in the measuring section 7 to the function. The corrected temperature function is sent from the temperature converter 2 to the temperature-voltage converter 3, and is converted from the temperature function into a voltage function that matches the temperature-voltage characteristics of the temperature detector used. The temperature detection signal from a temperature detector (not shown) disposed in the heating furnace 4 and the voltage function are sent to a comparison calculation circuit 5, where the signal difference is subjected to proportional-integral-derivative control calculation. A calculation signal is sent to the proportional power generator 6, and electric power proportional to the calculation signal is supplied from the proportional power generator 6 to the heating furnace 4 to control the temperature of the heating furnace 4. Furthermore, heat is transferred from the heating furnace 4 to the sample placed in the measurement section 7 by conduction, convection, or radiation, and the measurement section 7 outputs temperature and physical property measurement signals of the sample.
温度変換器２における温度変換についてさらに詳しく説
明すると、先ず、加熱炉４を各温度で一定温度保持させ
るように温度関数発生器１に関数形を与え、この時の加
熱炉温度と試料温度との関係を、
加熱炉温度＝ｆ（試料温度）
となるように多項式近似しておく。温度変換器２の働き
は、入力値に対して上記変換ｒを施して出力することに
ある。To explain in more detail the temperature conversion in the temperature converter 2, first, a function form is given to the temperature function generator 1 so as to maintain the heating furnace 4 at a constant temperature at each temperature, and the relationship between the heating furnace temperature and the sample temperature at this time is determined. The relationship is approximated by a polynomial so that heating furnace temperature = f (sample temperature). The function of the temperature converter 2 is to perform the above conversion r on the input value and output the result.
こうして、前記温度関数発生器１に入力された関数は、
温度変換器２により加熱炉と試料の温度ずれを見込む形
で高めに修正され、最終的に試料温度は最初に入力され
た関数形にほぼ一致し、目的を達する。In this way, the function input to the temperature function generator 1 is:
The temperature converter 2 corrects the temperature to a higher value to take into account the temperature difference between the heating furnace and the sample, and finally the sample temperature almost matches the initially input function form and reaches the objective.
なお、温度関数発生器１．温度変換器２．温度電圧変換
器３および比較演算回路５は、アナログ回路でも、デジ
タル回路でも構成することができるが、この選択が本発
明の内容を制限するものでないのは勿論のことである。Note that the temperature function generator 1. Temperature converter 2. The temperature-voltage converter 3 and the comparison calculation circuit 5 can be configured with either an analog circuit or a digital circuit, but it goes without saying that this selection does not limit the content of the present invention.
以上のように本発明によれば、温度関数発生器と温度電
圧変換器との間に温度変換器を設は制御対象である加熱
炉の温度と試料温度とのずれを常に補正するようにした
から、試料温度を所望の温度関数に従って変化させるこ
とができ、しかも測定者は、加熱炉温度と試料温度の間
のずれを意識する必要がない。さらに、制御対象である
加熱炉の温度を直接制御信号として利用するため、制御
帰還ループの時間遅れが小さく常に安定した制御が行わ
れるという効果を有する。As described above, according to the present invention, the temperature converter is installed between the temperature function generator and the temperature-voltage converter to constantly correct the difference between the temperature of the heating furnace that is the object of control and the sample temperature. Therefore, the sample temperature can be changed according to a desired temperature function, and the measurer does not need to be aware of the deviation between the heating furnace temperature and the sample temperature. Furthermore, since the temperature of the heating furnace to be controlled is directly used as a control signal, there is an effect that the time delay of the control feedback loop is small and stable control is always performed.
図面は本発明の実施例を示すブロック図である。 １・・・温度関数発生器 ２・・・温度変換器 ３・・・温度電圧変換器 ４・・・加熱炉 ５・・・比較演算回路 ６・・・比例電力発生器 ７・・・測定部 以上 出願人 セイコー電子工業株式会社 The drawing is a block diagram showing an embodiment of the invention. 1...Temperature function generator 2...Temperature converter 3...Temperature voltage converter 4... Heating furnace 5... Comparison calculation circuit 6...Proportional power generator 7...Measuring part that's all Applicant: Seiko Electronics Industries Co., Ltd.
Claims (2)
れた温度変換器と、前記温度変換器に接続された温度電
圧変換器と、温度検出器を備え分析すべき試料の温度を
変化させる加熱炉と、前記温度電圧変換器および前記加
熱炉に接続され両者の信号値を比較する比較演算回路と
、前記比較演算回路に接続され入力値に比例した電力を
前記加熱炉に供給する比例電力発生器と、前記加熱炉に
接続され分析すべき試料の温度および物性値を計測する
測定部とを備え、前記温度変換器は前記加熱炉の温度と
前記試料の温度の間のずれをオフセットとして加える変
換を行うことを特徴とする熱分析装置。(1) A temperature function generator, a temperature converter connected to the temperature function generator, a temperature voltage converter connected to the temperature converter, and a temperature detector to change the temperature of the sample to be analyzed. a heating furnace connected to the temperature-voltage converter and the heating furnace to compare the signal values of both, and a proportional circuit connected to the comparison calculation circuit and supplying electric power proportional to the input value to the heating furnace. The temperature converter includes an electric power generator and a measurement unit that is connected to the heating furnace and measures the temperature and physical property values of the sample to be analyzed, and the temperature converter offsets the difference between the temperature of the heating furnace and the temperature of the sample. A thermal analysis device characterized in that it performs a conversion that adds as follows.
温度で一定温度保持することにより、あらかじめ設定し
、温度変換器を動作させることを特徴とする特許請求の
範囲第１項記載の熱分析装置。(2) The temperature difference between the heating furnace and the sample is set in advance by maintaining the heating furnace at a constant temperature at each temperature, and a temperature converter is operated. The thermal analysis device described.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62332492A JP2651495B2 (en) | 1987-12-29 | 1987-12-29 | Thermal analyzer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62332492A JP2651495B2 (en) | 1987-12-29 | 1987-12-29 | Thermal analyzer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01174954A true JPH01174954A (en) | 1989-07-11 |
| JP2651495B2 JP2651495B2 (en) | 1997-09-10 |
Family
ID=18255548
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62332492A Expired - Lifetime JP2651495B2 (en) | 1987-12-29 | 1987-12-29 | Thermal analyzer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2651495B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007322364A (en) * | 2006-06-05 | 2007-12-13 | Sii Nanotechnology Inc | Thermal analyzer |
| CN107014859A (en) * | 2009-02-03 | 2017-08-04 | 梅特勒-托莱多有限公司 | Thermal analyzer |
| CN109031942A (en) * | 2018-07-31 | 2018-12-18 | 清华大学 | A method of calorimeter calorimetric process lag link is corrected using transmission function |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55141059U (en) * | 1979-03-30 | 1980-10-08 | ||
| JPS61110713A (en) * | 1984-11-06 | 1986-05-29 | Toshiba Corp | Temperature controlling system of annealing surface |
-
1987
- 1987-12-29 JP JP62332492A patent/JP2651495B2/en not_active Expired - Lifetime
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS55141059U (en) * | 1979-03-30 | 1980-10-08 | ||
| JPS61110713A (en) * | 1984-11-06 | 1986-05-29 | Toshiba Corp | Temperature controlling system of annealing surface |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007322364A (en) * | 2006-06-05 | 2007-12-13 | Sii Nanotechnology Inc | Thermal analyzer |
| US7781703B2 (en) | 2006-06-05 | 2010-08-24 | Sii Nanotechnology Inc. | Thermal analyzer |
| DE102007021323B4 (en) * | 2006-06-05 | 2013-10-17 | Sii Nano Technology Inc. | The thermal analysis apparatus |
| CN107014859A (en) * | 2009-02-03 | 2017-08-04 | 梅特勒-托莱多有限公司 | Thermal analyzer |
| CN109031942A (en) * | 2018-07-31 | 2018-12-18 | 清华大学 | A method of calorimeter calorimetric process lag link is corrected using transmission function |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2651495B2 (en) | 1997-09-10 |
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