JP2647318B2 - 非直線ひずみの自動測定装置 - Google Patents

非直線ひずみの自動測定装置

Info

Publication number
JP2647318B2
JP2647318B2 JP32110892A JP32110892A JP2647318B2 JP 2647318 B2 JP2647318 B2 JP 2647318B2 JP 32110892 A JP32110892 A JP 32110892A JP 32110892 A JP32110892 A JP 32110892A JP 2647318 B2 JP2647318 B2 JP 2647318B2
Authority
JP
Japan
Prior art keywords
frequency
measured
residual signal
intermodulation
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP32110892A
Other languages
English (en)
Japanese (ja)
Other versions
JPH05215797A (ja
Inventor
クーフエル ボルフガング
ケルンヒエン ボルフガング
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Roode Unto Shubarutsu Unto Co KG GmbH
Original Assignee
Roode Unto Shubarutsu Unto Co KG GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Roode Unto Shubarutsu Unto Co KG GmbH filed Critical Roode Unto Shubarutsu Unto Co KG GmbH
Publication of JPH05215797A publication Critical patent/JPH05215797A/ja
Application granted granted Critical
Publication of JP2647318B2 publication Critical patent/JP2647318B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/20—Measurement of non-linear distortion

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Mathematical Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
JP32110892A 1991-10-18 1992-10-16 非直線ひずみの自動測定装置 Expired - Lifetime JP2647318B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4134473.1 1991-10-18
DE19914134473 DE4134473A1 (de) 1991-10-18 1991-10-18 Anordnung zum automatischen messen von nichtlinearen verzerrrungen eines messobjektes

Publications (2)

Publication Number Publication Date
JPH05215797A JPH05215797A (ja) 1993-08-24
JP2647318B2 true JP2647318B2 (ja) 1997-08-27

Family

ID=6442945

Family Applications (1)

Application Number Title Priority Date Filing Date
JP32110892A Expired - Lifetime JP2647318B2 (ja) 1991-10-18 1992-10-16 非直線ひずみの自動測定装置

Country Status (2)

Country Link
JP (1) JP2647318B2 (enrdf_load_stackoverflow)
DE (1) DE4134473A1 (enrdf_load_stackoverflow)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2073894B (en) * 1980-04-11 1984-03-14 Tektronix Inc Automatic im distortion test selector
DE3437303C2 (de) * 1984-10-11 1987-03-05 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Verfahren zur meßtechnischen Erfassung von Klirreffekten an einem elektroakustischen Wandler, insbesondere Lautsprecher oder Kopfhörer

Also Published As

Publication number Publication date
DE4134473A1 (de) 1993-04-22
JPH05215797A (ja) 1993-08-24
DE4134473C2 (enrdf_load_stackoverflow) 1993-08-19

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