JP2610757B2 - Method for producing ultra-thin Au-Si alloy brazing material with excellent thickness accuracy - Google Patents

Method for producing ultra-thin Au-Si alloy brazing material with excellent thickness accuracy

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Publication number
JP2610757B2
JP2610757B2 JP4273014A JP27301492A JP2610757B2 JP 2610757 B2 JP2610757 B2 JP 2610757B2 JP 4273014 A JP4273014 A JP 4273014A JP 27301492 A JP27301492 A JP 27301492A JP 2610757 B2 JP2610757 B2 JP 2610757B2
Authority
JP
Japan
Prior art keywords
brazing material
foil
thickness
alloy
less
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP4273014A
Other languages
Japanese (ja)
Other versions
JPH06122092A (en
Inventor
有一 佐藤
實 山手
宏 飯田
新 田中
年裕 花村
陽一 池松
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP4273014A priority Critical patent/JP2610757B2/en
Publication of JPH06122092A publication Critical patent/JPH06122092A/en
Application granted granted Critical
Publication of JP2610757B2 publication Critical patent/JP2610757B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、特に電子部品の接合に
用いられるAu−Si合金ろう材の製造方法に関するも
のである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing an Au-Si alloy brazing material used particularly for joining electronic components.

【0002】[0002]

【従来の技術】ろう材として用いる材料の板厚は、使用
するろう材の量を制御するのに重要な因子である。使用
するろう材の量が変動すると、得られる製品の特性、形
状に変動が生じる。特に、電子部品においては、接合部
の性能がその部品の性能に大きくかかわることや、部品
の大きさが小さいことなどから使用するろう材の量の制
御は重要である。箔状のろう材を使用する場合、使用量
は箔の面積でも制御できるが、接合する箇所が微小であ
る電子部品などにおいては箔の面積のみでの制御では不
可能で、箔の板厚を用いての制御が必要となる。しかし
ながら、これまで電子部品などの接合に用いられている
箔状のAu−Si合金ろう材は薄くてもせいぜい50μ
mで、提供できる箔の板厚に制限があった。したがっ
て、ろう材の使用量が微量である場合にその量の制御が
非常に困難であった。
2. Description of the Related Art The thickness of a material used as a brazing material is an important factor for controlling the amount of a brazing material to be used. When the amount of the brazing filler metal used changes, the characteristics and shape of the obtained product change. In particular, in the case of electronic components, it is important to control the amount of brazing material to be used because the performance of the joint greatly affects the performance of the component and the size of the component is small. When using a brazing material in the form of foil, the amount of use can be controlled by the area of the foil, but in the case of electronic components with small joints, it is not possible to control only by the area of the foil. It is necessary to control it. However, the foil-like Au-Si alloy brazing material used to join electronic parts and the like has a thickness of at most 50 μm.
m, there was a limit on the thickness of foil that could be provided. Therefore, when the used amount of the brazing material is very small, it is very difficult to control the amount.

【0003】従来のAu−Si合金ろう材におけるこの
板厚における制限は、製造方法に由来していた。これま
で、Au−Si合金ろう材は通常の造塊鋳造法で凝固さ
せて、その後、箔状とするために熱間あるいは温間で圧
延することにより製造されていた。Au−Si合金はそ
の機械的性質から冷間での圧延は不可能で、熱間あるい
は温間で圧延しなければならないが、熱間圧延でも得ら
れる箔の板厚には制限があり、その下限は50μmであ
った。
[0003] The limitation on the thickness of the conventional Au-Si alloy brazing material originated from the manufacturing method. Heretofore, the Au-Si alloy brazing material has been manufactured by solidifying by a normal ingot casting method, and thereafter hot or warm rolling to form a foil. Au-Si alloys cannot be cold rolled due to their mechanical properties and must be rolled hot or warm. However, the thickness of the foil obtained by hot rolling is also limited. The lower limit was 50 μm.

【0004】一方、これまでより薄い箔状のAu−Si
合金ろう材が得られる方法として、例えば特開昭54−
103764号公報においては、単ロール法により、板
厚50μm以下の全体が非晶質あるいは表面層が非晶質
である箔状のAu−Si合金ろう材が得られると述べら
れている。しかしながら、実際には単ロール法により箔
状のAu−Si合金は得られるものの、この箔状の合金
は非常に脆く、ろう材として使用するには適していな
い。しかも、このような箔は板厚精度が例えば板厚の±
20%以上と悪く、この点からもろう材として使用する
には適していない。なぜなら、板厚精度が不良な箔は、
目的としているろう材の使用量の制御の点から問題とな
るからである。
On the other hand, a thinner foil-like Au-Si
As a method for obtaining an alloy brazing material, for example,
No. 103764 states that a foil-like Au—Si alloy brazing material having a plate thickness of 50 μm or less entirely amorphous or an amorphous surface layer can be obtained by a single roll method. However, although a foil-like Au-Si alloy is actually obtained by a single roll method, this foil-like alloy is very brittle and is not suitable for use as a brazing material. Moreover, such foils have a thickness accuracy of, for example, ±
It is not good for use as a brazing material from this point. Because foil with poor thickness accuracy,
This is because there is a problem in controlling the amount of the brazing material to be used.

【0005】また、特開昭55−103297号公報で
は、63.5μmを超えない少なくとも50%が非晶質
組織で延性なろう材が提案されている。このような薄い
ろう材は、少なくとも105 ℃/sの速度で急冷するこ
とから得られると述べられているが、このような鋳造ま
まの箔では、やはり箔の板厚精度が不良で、ろう材の使
用量が微量でかつ、その使用量の管理が厳しい電子部品
などでのろう材としての使用には好ましくない。
In addition, Japanese Patent Application Laid-Open No. 55-103297 proposes a brazing filler metal having at least 50% of an amorphous structure and ductility not exceeding 63.5 μm. Although it is stated that such a thin brazing material is obtained by quenching at a rate of at least 10 5 ° C / s, such an as-cast foil still has poor thickness accuracy of the foil, and It is not preferable for use as a brazing filler metal in electronic parts and the like in which the amount of use of the material is very small and the amount of use is strictly controlled.

【0006】[0006]

【発明が解決しようとする課題】本発明は、電子部品な
どのろう材として用いられるAu−Si合金ろう材にお
いて、上記したような問題を解消するものであり、板厚
が50μm未満で、しかも板厚精度に優れたAu−Si
合金ろう材の製造方法を提供することを目的とする。
SUMMARY OF THE INVENTION The present invention is to solve the above-mentioned problems in an Au-Si alloy brazing material used as a brazing material for electronic parts and the like, and has a plate thickness of less than 50 μm and Au-Si with excellent thickness accuracy
An object of the present invention is to provide a method for manufacturing an alloy brazing material.

【0007】[0007]

【課題を解決するための手段】上記目的を達成するため
に、本発明は以下の構成を要旨とする。すなわち、Si
含有量が10質量(mass)%以下であるAu−Si合金
を単ロール法により急冷凝固して非晶質箔とし、さら
に、100℃以上、融点直下の温度範囲で熱処理した
後、50μm未満の所定板厚まで、かつ、板厚精度が板
厚の±10%以下となる冷間圧延を施すことを特徴とす
る板厚精度の優れた極薄Au−Si合金ろう材の製造方
法である。
In order to achieve the above object, the present invention has the following constitution. That is, Si
Au-Si alloy having a content of 10 mass% or less
Is rapidly solidified by a single roll method to form an amorphous foil.
Heat-treated in a temperature range of 100 ° C. or higher and just below the melting point.
Then, cold rolling is performed to a predetermined plate thickness of less than 50 μm and a plate thickness accuracy of ± 10% or less of the plate thickness, the ultra-thin Au-Si alloy brazing material having an excellent plate thickness accuracy . Manufacturing method
Is the law.

【0008】以下に本発明を詳細に説明する。Hereinafter, the present invention will be described in detail.

【0009】本発明は、Au−Si合金を単ロール法に
より急冷凝固し、さらに適切な条件で熱処理すれば、箔
の延性が発現し、冷間での圧延が可能で、板厚精度に優
れた極めて薄いAu−Si合金箔が得られるという、新
しい知見に基づくものである。
According to the present invention, if the Au-Si alloy is rapidly solidified by a single roll method and further heat-treated under appropriate conditions, the ductility of the foil is developed, the cold rolling is possible, and the sheet thickness accuracy is excellent. It is based on a new finding that an extremely thin Au-Si alloy foil can be obtained.

【0010】板厚が50μm未満で、板厚精度が板厚の
±10%以下であるAu−Si合金ろう材を得る方法に
ついて以下に具体的に説明する。すなわち、Au−Si
合金を、例えば高周波誘導溶解などにより溶解し、銅な
どの熱伝導率の高い金属からなるロール上に噴出して、
板厚が100μm前後の箔状のAu−Si合金とする。
この時、ロールは表面速度で例えば5m/s以上の高速
で回転している。得られる箔の板厚はロールの表面速度
などの製造因子によって制御できる。なお、Au−Si
合金箔を製造するための適切な鋳造条件については後述
の実施例において具体的に述べる。
A method for obtaining an Au-Si alloy brazing material having a thickness of less than 50 μm and a thickness accuracy of ± 10% or less of the thickness is specifically described below. That is, Au-Si
The alloy is melted, for example, by high-frequency induction melting, and spouted onto a roll made of a metal with high thermal conductivity, such as copper,
A foil-like Au-Si alloy having a thickness of about 100 μm is used.
At this time, the roll is rotating at a high surface speed of, for example, 5 m / s or more. The thickness of the resulting foil can be controlled by manufacturing factors such as the surface speed of the roll. In addition, Au-Si
Appropriate casting conditions for producing the alloy foil will be specifically described in Examples below.

【0011】次に、この箔を適切な条件で熱処理する。
この時、最適な熱処理条件はAu−Si合金中のSi含
有量によって異なるが、処理温度の範囲は100℃以上
から融点直下の温度とする。また、処理時間は数分から
十数時間程度までの範囲とし、処理温度が高いほど短時
間でよい。例えば、Si含有量が3.15mass%の共晶
組成の場合の最適な熱処理条件は、処理温度が150℃
〜360℃、処理時間が5分〜5時間である。この熱処
理により箔の延性が発現し、冷間でも圧延が可能とな
る。なお、各種Au−Si合金についての最適な熱処理
条件については実施例中で具体的に述べている。
Next, the foil is heat-treated under appropriate conditions.
At this time, the optimal heat treatment condition varies depending on the Si content in the Au-Si alloy, but the treatment temperature is set to a temperature of 100 ° C. or more to just below the melting point. Further, the processing time is in the range of several minutes to about ten and several hours, and the higher the processing temperature, the shorter the processing time. For example, the optimum heat treatment condition in the case of a eutectic composition having a Si content of 3.15 mass% is as follows:
To 360 ° C., and the treatment time is 5 minutes to 5 hours. Due to this heat treatment, ductility of the foil is developed, and rolling can be performed even in a cold state. The optimum heat treatment conditions for various Au-Si alloys are specifically described in Examples.

【0012】さらに、箔の板厚精度を向上させるために
冷間圧延を施し、50μm以下の所定の板厚の箔とす
る。この時、箔の板厚精度を改善するにはある程度の圧
下量が必要であり、箔の最終目標板厚にもよるが、単ロ
ール法で鋳造して得る箔の板厚は、100μm前後とす
ることが好ましい。なお、本発明の箔の板厚精度の範囲
を規定するのに用いる数値は、箔の平均板厚に対する最
大および最小板厚の変動分のその平均板厚に対する割合
でもって示す。例えば、平均板厚40μmの箔で板厚の
変動が±4μm以内にある場合、この箔の板厚精度は±
10%以下と表現する。
Further, in order to improve the thickness accuracy of the foil, cold rolling is performed to obtain a foil having a predetermined thickness of 50 μm or less. At this time, a certain amount of reduction is required to improve the thickness accuracy of the foil, and depending on the final target thickness of the foil, the thickness of the foil obtained by casting by the single roll method is about 100 μm. Is preferred. The numerical values used to define the range of the thickness accuracy of the foil of the present invention are indicated by the ratio of the variation of the maximum and minimum thickness to the average thickness of the foil to the average thickness. For example, when the thickness of a foil having an average thickness of 40 μm is within ± 4 μm, the thickness accuracy of the foil is ± 40 μm.
Expressed as 10% or less.

【0013】単ロール法による箔状のAu−Si合金ろ
う材の製造は、特にSi含有量が10mass%以下となる
と容易になるので、Si含有量が10mass%以下の場合
にこのような極薄の箔のろう材の提供がより効果的であ
る。
[0013] The production of a foil-shaped Au-Si alloy brazing material by the single roll method is particularly easy when the Si content is 10 mass% or less. It is more effective to provide the brazing material of the foil.

【0014】[0014]

【作用】本発明により、板厚が50μm以下で、板厚精
度が良好なAu−Si合金ろう材の提供が可能になった
ことから、電子部品などの接合においてろう材の使用量
の制御が容易になり、ろう付けに使用するろう材の量の
変動に起因してこれまで発生していた製品の特性、形状
における変動を抑えることが可能になった。また、ろう
材過多によるトラブルの発生も抑えることが可能になっ
た。
According to the present invention, it is possible to provide an Au-Si alloy brazing material having a plate thickness of 50 μm or less and a good plate thickness accuracy. Therefore, it is possible to control the amount of the brazing material used in joining electronic parts and the like. This has made it easier to suppress variations in the properties and shapes of products that have occurred until now due to variations in the amount of brazing material used for brazing. In addition, the occurrence of troubles due to excessive brazing material can be suppressed.

【0015】[0015]

【実施例】表1に示すような各種のSi含有量からなる
Au−Si合金200gを、単ロール法により板幅が6
mmで各種の板厚からなる箔を作製した。単ロール装置の
ロールは銅からなり、その直径は300mmであった。鋳
造時、噴出圧は0.2kg/cm2 とし、鋳造雰囲気はヘリ
ウムガスとした。次に、得られた箔を適切な条件で熱処
理した。それぞれの熱処理条件については表1に示す。
このようにして準備したAu−Si合金箔について、径
が60mmの1対のロールを用いて1〜数回、各種の荷重
のもとで圧延した。こうして得られた箔について板厚お
よび板厚精度を調査した。結果を表1に示す。
EXAMPLE 200 g of an Au--Si alloy having various Si contents as shown in Table 1 was applied to a sheet having a width of 6 by a single roll method.
Foil having various thicknesses was prepared in mm. The roll of the single roll device was made of copper and had a diameter of 300 mm. During casting, the ejection pressure was 0.2 kg / cm 2 and the casting atmosphere was helium gas. Next, the obtained foil was heat-treated under appropriate conditions. Table 1 shows the respective heat treatment conditions.
The thus prepared Au—Si alloy foil was rolled under various loads one to several times using a pair of rolls having a diameter of 60 mm. The thickness and accuracy of the thickness of the foil thus obtained were investigated. Table 1 shows the results.

【0016】[0016]

【表1】 [Table 1]

【0017】表1に示すように、50μm未満でほぼ目
標どおりの板厚からなり、板厚精度が板厚の±10%以
下であるAu−Si合金ろう材となった。このようなA
u−Si合金ろう材は、ろう付け時の使用量が微小な量
の場合でもその使用量の制御を可能にし、電子部品など
の接合用として極めて好適であった。
As shown in Table 1, an Au—Si alloy brazing material having a thickness of less than 50 μm and a thickness almost as intended and having a thickness accuracy of ± 10% or less of the thickness was obtained. Such an A
The u-Si alloy brazing material enables the use amount to be controlled even when the amount used at the time of brazing is very small, and was extremely suitable for joining electronic parts and the like.

【0018】[0018]

【発明の効果】以上のように、本発明によるAu−Si
合金ろう材は、従来のAu−Si合金ろう材に比べて使
用量の制御を微少な単位まで可能とすることから、特に
ろう材の使用量が微少であるような電子部品などの接合
において、電子部品の品質の向上、品質の均一化および
製造歩留が著しく向上する。
As described above, the Au-Si according to the present invention is described.
Since the alloy brazing filler metal enables the control of the usage amount to a minute unit as compared with the conventional Au-Si alloy brazing filler metal, particularly in the joining of electronic parts and the like in which the usage amount of the brazing filler metal is small , The quality of electronic components is improved, the quality is made uniform, and the production yield is remarkably improved.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 田中 新 福岡県北九州市戸畑区飛幡町1番1号 新日本製鐵株式会社 八幡製鐵所内 (72)発明者 花村 年裕 神奈川県川崎市中原区井田1618番地 新 日本製鐵株式会社 先端技術研究所内 (72)発明者 池松 陽一 神奈川県川崎市中原区井田1618番地 新 日本製鐵株式会社 先端技術研究所内 (56)参考文献 特開 昭60−199593(JP,A) ──────────────────────────────────────────────────続 き Continuing from the front page (72) Inventor Tanaka Shin 1-1, Tobata-cho, Tobata-ku, Kitakyushu-shi, Fukuoka Nippon Steel Corporation Yawata Works (72) Inventor Tomohiro Hanamura Nakahara-ku, Kawasaki-shi, Kanagawa 1618 Ida New Nippon Steel Corporation Advanced Technology Research Laboratories (72) Inventor Yoichi Ikematsu 1618 Ida Nakahara-ku Kawasaki City, Kanagawa Prefecture New Nippon Steel Corporation Advanced Technology Research Laboratories (56) References JP 60-199593 (JP, A)

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 Si含有量が10質量(mass)%以下で
あるAu−Si合金を単ロール法により急冷凝固して非
晶質箔とし、さらに、100℃以上、融点直下の温度範
囲で熱処理した後、50μm未満の所定板厚まで、
つ、板厚精度が板厚の±10%以下となる冷間圧延を施
ことを特徴とする板厚精度の優れた極薄Au−Si合
金ろう材の製造方法
1. When the Si content is 10% by mass or less,
A certain Au-Si alloy is rapidly solidified by the single roll method
Amorphous foil and a temperature range of 100 ° C or higher and just below the melting point
After the heat treatment , the steel sheet is cold rolled to a predetermined thickness of less than 50 μm and the thickness accuracy is ± 10% or less of the thickness.
Excellent ultrathin Au-Si manufacturing method of alloy brazing material accuracy of plate thickness, characterized in that to.
JP4273014A 1992-10-12 1992-10-12 Method for producing ultra-thin Au-Si alloy brazing material with excellent thickness accuracy Expired - Lifetime JP2610757B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4273014A JP2610757B2 (en) 1992-10-12 1992-10-12 Method for producing ultra-thin Au-Si alloy brazing material with excellent thickness accuracy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4273014A JP2610757B2 (en) 1992-10-12 1992-10-12 Method for producing ultra-thin Au-Si alloy brazing material with excellent thickness accuracy

Publications (2)

Publication Number Publication Date
JPH06122092A JPH06122092A (en) 1994-05-06
JP2610757B2 true JP2610757B2 (en) 1997-05-14

Family

ID=17521960

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2610757B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6891686B2 (en) * 2017-07-18 2021-06-18 大日本印刷株式会社 Manufacturing method of sheet brazing material and heat exchanger

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60199593A (en) * 1983-12-13 1985-10-09 アライド・コ−ポレ−シヨン Rapidly solidified filler metal for brazing

Also Published As

Publication number Publication date
JPH06122092A (en) 1994-05-06

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