JP2597228B2 - プローブ・チップ - Google Patents
プローブ・チップInfo
- Publication number
- JP2597228B2 JP2597228B2 JP2263701A JP26370190A JP2597228B2 JP 2597228 B2 JP2597228 B2 JP 2597228B2 JP 2263701 A JP2263701 A JP 2263701A JP 26370190 A JP26370190 A JP 26370190A JP 2597228 B2 JP2597228 B2 JP 2597228B2
- Authority
- JP
- Japan
- Prior art keywords
- leads
- probe tip
- integrated circuit
- flexible body
- recesses
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US41679289A | 1989-10-02 | 1989-10-02 | |
| US416792 | 1989-10-02 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03129500A JPH03129500A (ja) | 1991-06-03 |
| JP2597228B2 true JP2597228B2 (ja) | 1997-04-02 |
Family
ID=23651319
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2263701A Expired - Fee Related JP2597228B2 (ja) | 1989-10-02 | 1990-10-01 | プローブ・チップ |
Country Status (3)
| Country | Link |
|---|---|
| JP (1) | JP2597228B2 (en:Method) |
| DE (1) | DE4028948A1 (en:Method) |
| GB (1) | GB2236630A (en:Method) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5701086A (en) * | 1993-10-26 | 1997-12-23 | Hewlett-Packard Company | Connecting test equipment to adjacent legs of an IC or the like by interdigitating conductive wedges with the legs |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1209554A (en) * | 1968-04-17 | 1970-10-21 | Associated Semiconductor Mft | Improvements in electrical component test apparatus |
| US3646579A (en) * | 1969-05-02 | 1972-02-29 | Data Display Syst | Logic circuit probe with screw thread adjustment and interchangeable circuitry to match circuit being monitored |
| BE756745A (fr) * | 1969-10-01 | 1971-03-01 | Asea Ab | Dispositif d'essai d'installations de protection a relais et d'equipement automatique |
| US4281888A (en) * | 1979-09-07 | 1981-08-04 | Western Electric Company, Inc. | Apparatus for testing leads of fuse holders |
| JPS58172874U (ja) * | 1982-05-13 | 1983-11-18 | 日立電子株式会社 | プロ−ブ用ピンチヤ−チツプ |
| DE8505357U1 (de) * | 1985-02-25 | 1986-06-26 | Siemens AG, 1000 Berlin und 8000 München | Prüfklammer zum elektrischen Kontaktieren von Leitungen |
| DE3607734A1 (de) * | 1986-03-08 | 1987-09-10 | Hirschmann Electric | Pruefklemme |
| EP0256541A3 (de) * | 1986-08-19 | 1990-03-14 | Feinmetall Gesellschaft mit beschrÀ¤nkter Haftung | Kontaktiervorrichtung |
| JPS63159768U (en:Method) * | 1987-04-08 | 1988-10-19 | ||
| DE3832410C2 (de) * | 1987-10-09 | 1994-07-28 | Feinmetall Gmbh | Kontaktvorrichtung |
-
1990
- 1990-08-23 GB GB9018525A patent/GB2236630A/en not_active Withdrawn
- 1990-09-12 DE DE19904028948 patent/DE4028948A1/de active Granted
- 1990-10-01 JP JP2263701A patent/JP2597228B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JPH03129500A (ja) | 1991-06-03 |
| DE4028948A1 (de) | 1991-04-18 |
| DE4028948C2 (en:Method) | 1992-01-09 |
| GB2236630A (en) | 1991-04-10 |
| GB9018525D0 (en) | 1990-10-10 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080109 Year of fee payment: 11 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090109 Year of fee payment: 12 |
|
| LAPS | Cancellation because of no payment of annual fees |