JP2570348Y2 - Single crystal growth equipment - Google Patents

Single crystal growth equipment

Info

Publication number
JP2570348Y2
JP2570348Y2 JP11344491U JP11344491U JP2570348Y2 JP 2570348 Y2 JP2570348 Y2 JP 2570348Y2 JP 11344491 U JP11344491 U JP 11344491U JP 11344491 U JP11344491 U JP 11344491U JP 2570348 Y2 JP2570348 Y2 JP 2570348Y2
Authority
JP
Japan
Prior art keywords
heater
crucible
single crystal
axial direction
crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP11344491U
Other languages
Japanese (ja)
Other versions
JPH0546967U (en
Inventor
房雄 田畑
誠人 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Sitix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Sitix Corp filed Critical Sumitomo Sitix Corp
Priority to JP11344491U priority Critical patent/JP2570348Y2/en
Publication of JPH0546967U publication Critical patent/JPH0546967U/en
Application granted granted Critical
Publication of JP2570348Y2 publication Critical patent/JP2570348Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【考案の詳細な説明】[Detailed description of the invention]

【0001】[0001]

【産業上の利用分野】本考案はチョクラルスキー法(CZ
法),溶融層法等による単結晶成長装置の改良に関す
る。
[Industrial application field] The present invention uses the Czochralski method (CZ).
Method), and an improvement of a single crystal growth apparatus using a molten layer method.

【0002】[0002]

【従来の技術】図4はチョクラルスキー法を利用した一
般的な単結晶成長装置を示す模式的縦断面図であり、図
中1は坩堝、2はカーボン製の円筒形をなすヒータを示
している。図示しないチャンバ内に坩堝1及びこれと同
心円状にヒータ2が配設されている。坩堝1は石英製の
内層坩堝1aの外側にカーボン製の外層坩堝1bを配した2
重構造に構成されており、内層坩堝1a内に結晶原料を投
入し、ヒータ2に通電して加熱溶融せしめるようになっ
ている。ヒータ2はその下端部に設けた電極(図示せ
ず)を通じて通電することにより加熱を行うようになっ
ている。
2. Description of the Related Art FIG. 4 is a schematic longitudinal sectional view showing a general single crystal growth apparatus utilizing the Czochralski method, wherein 1 is a crucible, 2 is a cylindrical heater made of carbon. ing. A crucible 1 and a heater 2 are arranged concentrically with the crucible 1 in a chamber (not shown). The crucible 1 has an outer layer crucible 1b made of carbon arranged outside an inner layer crucible 1a made of quartz.
The crystal material is put into the inner layer crucible 1a, and the heater 2 is energized to be heated and melted. The heater 2 is heated by energizing through an electrode (not shown) provided at the lower end thereof.

【0003】而してこのような従来装置にあっては坩堝
1内の結晶用原料を溶融した後、この溶融液に引上軸3
の下端に吊るした種結晶4を浸し、これを回転させつつ
上昇させることで種結晶4の下端に単結晶5を成長させ
てゆくようになっている。
In such a conventional apparatus, after the raw material for crystallization in the crucible 1 is melted, the molten liquid is added to the pulling shaft 3.
A single crystal 5 is grown at the lower end of the seed crystal 4 by immersing the seed crystal 4 suspended at the lower end of the seed crystal 4 and rotating and raising the seed crystal 4.

【0004】[0004]

【考案が解決しようとする課題】ところで上述した如き
従来装置にあってはヒータ2は内径,外径が均一、即ち
軸心線方向,周方向において肉厚が一定な円筒形に形成
されていること、ヒータ2の上,下端部からの放熱に加
えてヒータ2の中心部からの熱が逃げ難い等のため、ヒ
ータ2の軸心線方向における発熱分布はヒータの中央部
位で最高となり、上,下端側に向かうに従って急激に低
くなる。しかもヒータ2はカーボン製であるため、溶融
液表面から蒸発するSiOX ガスと反応して劣化するが、
この劣化の程度は高温部でより速く反応が進行するた
め、ヒータ2の肉厚が軸心線方向の中央部が劣化によっ
て薄肉化し、抵抗値が増大して薄肉化した部分の発熱量
が一層増大する。
By the way, in the conventional apparatus as described above, the heater 2 is formed in a cylindrical shape having a uniform inner diameter and outer diameter, that is, a constant thickness in the axial direction and the circumferential direction. In addition, since the heat from the central portion of the heater 2 is difficult to escape in addition to the heat radiation from the upper and lower ends of the heater 2, the heat generation distribution in the axial direction of the heater 2 is highest at the central portion of the heater. , It decreases rapidly toward the lower end. Moreover, since the heater 2 is made of carbon, it degrades by reacting with the SiO X gas evaporating from the surface of the melt.
The degree of this deterioration is such that the reaction proceeds more rapidly in the high-temperature portion, so that the thickness of the heater 2 becomes thinner due to the deterioration in the central portion in the axial direction, and the heating value of the thinned portion is further increased by increasing the resistance value. Increase.

【0005】図5はヒータ2の使用初期の温度分布と、
劣化後の温度分布とを示すグラフであり、横軸に発熱温
度を、また縦軸にヒータ2の軸心線方向の位置をとって
示してある。グラフ中、破線はヒータの使用開始初期に
おける結晶用原料溶融時の温度分布を、また実線は単結
晶の引上げバッチ回数が70回のときの結晶用原料溶融時
の温度分布を夫々示している。このグラフから明らかな
ように使用開始初期においてもヒータ2の中央部の温度
は上,下端部の温度と比較して大きくなっているが、引
上げバッチ回数が増大するとその温度差が一層顕著とな
ることが解る。
FIG. 5 shows the temperature distribution of the heater 2 at the beginning of use,
5 is a graph showing the temperature distribution after deterioration, in which the abscissa indicates the heat generation temperature, and the ordinate indicates the position of the heater 2 in the axial direction. In the graph, the dashed line shows the temperature distribution at the time of melting the crystal raw material at the beginning of use of the heater, and the solid line shows the temperature distribution at the time of melting the crystal raw material when the number of single crystal pulling batches is 70. As is clear from this graph, even at the beginning of use, the temperature at the center of the heater 2 is higher than the temperatures at the upper and lower ends, but the temperature difference becomes more remarkable as the number of pulling batches increases. I understand.

【0006】このようなヒータを用いて坩堝を加熱する
と、坩堝1はヒータ2によって局所的に加熱されること
となり、坩堝の軟化変形,ヒータ2の中央部と対抗する
領域付近における溶融液の沸騰,内層坩堝1aの溶解等を
引き起こし、単結晶の有転位化を生じ、製品歩留を低下
させる等の問題があった。本考案はかかる事情に鑑みな
されたものであって、その目的とするところはヒータの
軸心線方向における温度分布を均一化して局部的な劣化
を抑制し、坩堝の局所加熱を防止してその寿命の延長が
図れ、更に製品歩留りの向上を図れるようにした単結晶
成長装置を提供するにある。
When the crucible is heated by using such a heater, the crucible 1 is locally heated by the heater 2, so that the crucible is softened and deformed, and the molten liquid is boiled in the vicinity of a region opposed to the center of the heater 2. In addition, there are problems such as melting of the inner layer crucible 1a, dislocation of the single crystal, and reduction of the product yield. The present invention has been made in view of such circumstances, and its purpose is to uniformize the temperature distribution in the axial direction of the heater to suppress local deterioration and prevent local heating of the crucible. It is an object of the present invention to provide a single crystal growth apparatus capable of extending the life and further improving the product yield.

【0007】[0007]

【課題を解決するための手段】本考案に係る単結晶成長
装置は、坩堝の周囲に円筒形状をなすヒータを配置し、
坩堝内にて結晶用原料を溶解し、その溶融液に種結晶を
浸漬して単結晶を引上げる単結晶成長装置において、ヒ
ータの軸心線方向の発熱分布を均一にすべく軸心線方向
の両端部の肉厚を中央部よりも薄肉としたことを特徴と
する。
According to the present invention, there is provided a single crystal growing apparatus in which a cylindrical heater is arranged around a crucible,
In a single crystal growing apparatus in which a raw material for crystal is melted in a crucible and a single crystal is pulled by dipping a seed crystal in the melt, the heat is distributed in the axial direction to make the heat distribution in the axial direction of the heater uniform. Are characterized in that the thickness of both ends is thinner than the center.

【0008】[0008]

【作用】本考案にあってはヒータの軸心線方向における
両端部の肉厚を中央部よりも薄肉化することにより、両
端部の電気抵抗値を中央部のそれよりも相対的に大きく
し、発熱量を高め、軸心線方向における発熱量の均一化
が図れることとなる。
According to the present invention, the electric resistance of both ends in the axial direction of the heater is made thinner than that of the central part so that the electric resistance value of both ends is made larger than that of the central part. Thus, the amount of generated heat is increased, and the amount of generated heat in the axial direction can be made uniform.

【0009】[0009]

【実施例】以下、本考案をその実施例を示す図面に基づ
き具体的に説明する。図1は本考案に係る単結晶成長装
置の縦断面図であり、図中11は坩堝、12はカーボン製の
円筒形状をなすヒータを示している。図示しないチャン
バ内に坩堝11及びその周囲にヒータ12が同心円状に配設
されている。坩堝11は従来装置と同様に石英製の内層坩
堝11a と、カーボン製の外層坩堝11b とを内,外に同心
状に配設して2重構造に構成されており、内層坩堝11a
内に投入した結晶用原料をヒータ12にて加熱溶解するよ
うになっている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be specifically described below with reference to the drawings showing embodiments thereof. FIG. 1 is a longitudinal sectional view of a single crystal growth apparatus according to the present invention, in which 11 denotes a crucible, and 12 denotes a cylindrical heater made of carbon. A crucible 11 and a heater 12 are provided concentrically around the crucible 11 in a chamber (not shown). The crucible 11 has a double structure in which an inner layer crucible 11a made of quartz and an outer layer crucible 11b made of carbon are arranged concentrically inside and outside similarly to the conventional apparatus.
The raw material for crystallization put into the furnace is heated and melted by the heater 12.

【0010】ヒータ12は円筒形状に形成され、その両端
面から軸心線方向における全長Lの夫々1/4 Lの長さの
範囲では夫々上端側,下端側に向かうに従って肉厚を漸
次薄肉化、具体的には上,下端末部の肉厚を中央部の肉
厚tよりも20%薄くし、その分だけ電気抵抗値を大きく
して発熱量を増大させ、発熱分布の均一化を図ってい
る。
The heater 12 is formed in a cylindrical shape, and the thickness thereof is gradually reduced toward the upper end and the lower end in a range of 1/4 L of the total length L in the axial direction from both end surfaces. Specifically, the thickness of the upper and lower terminal portions is made 20% thinner than the thickness t of the central portion, and the electric resistance value is increased by that amount to increase the calorific value, thereby making the heat distribution uniform. ing.

【0011】而してこのような本考案装置にあっては、
坩堝11内に結晶用原料を投入し、ヒータ12を作動してこ
れを溶解した後、溶融液中に引上軸13に吊るした種結晶
14を浸し、これを回転させつつ上昇させることで種結晶
14の下端に単結晶15を成長せしめていくようになってい
る。
[0011] Thus, in such a device of the present invention,
The raw material for the crystal is put into the crucible 11, the heater 12 is operated to dissolve the material, and the seed crystal is suspended in the melt on the pulling shaft 13.
Soak 14 and raise it while rotating it to seed crystal
The single crystal 15 is grown at the lower end of the substrate 14.

【0012】図2は本考案装置におけるヒータの温度分
布を示すグラフであり、横軸に発熱温度を、また縦軸に
ヒータ12の軸心線方向における位置をとって示してい
る。グラフ中、破線は坩堝11の使用開始初期における温
度分布、実線は引上げバッチ回数Bt が70回に達したと
きのヒータ12の温度分布を示している。なお2点鎖線は
従来装置における引上げバッチ回数70回の温度分布を示
している。このグラフから明らかなように、ヒータ12の
使用初期の温度分布及び引上げバッチ回数70回目の温度
分布のいずれの場合もヒータ12の軸心線方向における温
度分布が大幅に均一化されていることが解る。これによ
ってヒータ12の寿命は従来の内径, 外径が均一なヒータ
に比べて30%延長し得ることが確認された。
FIG. 2 is a graph showing the temperature distribution of the heater in the apparatus of the present invention, in which the abscissa indicates the heat generation temperature and the ordinate indicates the position of the heater 12 in the axial direction. In the graph, the broken line the temperature distribution in the use initial period of the crucible 11, a solid line shows the temperature distribution of the heater 12 when the pulling batch number B t has reached 70 times. The two-dot chain line shows the temperature distribution when the number of batches is 70 in the conventional apparatus. As is clear from this graph, the temperature distribution in the axial direction of the heater 12 is significantly uniform in both the temperature distribution in the initial stage of use of the heater 12 and the temperature distribution in the 70th pulling batch. I understand. As a result, it was confirmed that the life of the heater 12 can be extended by 30% as compared with the conventional heater having a uniform inner diameter and outer diameter.

【0013】図3は本考案装置と従来装置とにおける単
結晶の引上げ歩留りの比較結果を示すグラフであり、横
軸に引上げのバッチ回数(引上げた単結晶の本数)を、
また縦軸に歩留りをとって示してある。グラフ中実線は
本考案装置の、また2点鎖線は従来装置の各結果を示し
ている。このグラフから明らかな如く、従来装置と比較
して本考案装置は引上げバッチ回数が増大しても歩留り
の低下が小さくなっていることが解る。
FIG. 3 is a graph showing a comparison result of pulling yield of a single crystal between the device of the present invention and the conventional device. The horizontal axis represents the number of batches of pulling (the number of pulled single crystals).
The vertical axis shows the yield. In the graph, the solid line shows the results of the device of the present invention, and the two-dot chain line shows the results of the conventional device. As is apparent from this graph, the yield of the device of the present invention is smaller than that of the conventional device even when the number of pulling batches is increased.

【0014】なお上述の実施例はヒータの肉厚をその軸
心線方向の位置に応じて変えることで発熱分布を改善し
た場合を示したが、これと同様に周囲のチャンバ内に配
設する保温材の保温状態を適正に設定することとしても
よい。
In the above-described embodiment, the case where the heat generation distribution is improved by changing the thickness of the heater in accordance with the position in the axial direction of the heater has been described. Similarly, the heater is disposed in the surrounding chamber. The heat retaining state of the heat retaining material may be appropriately set.

【0015】[0015]

【考案の効果】以上の如く本考案装置にあってはヒータ
における軸心線方向の中央部よりも両端部の肉厚を薄く
してあるから、この部分の電気抵抗値が大きくなり、ヒ
ータの軸心線方向における両端部の発熱温度が中央部よ
りも相対的に高められて発熱温度が均一化され、ヒータ
並びに坩堝に対する局部的な加熱が抑制されてヒータの
劣化、坩堝の損傷が防止され、更には引上げるべき単結
晶の単結晶化率が向上して歩留りを大幅に向上し得る
等、本考案は優れた効果を奏するものである。
As described above, in the device of the present invention, the thickness of the heater at both ends is smaller than that at the center in the axial direction. The exothermic temperature at both ends in the axial direction is relatively higher than that at the center, so that the exothermic temperature is equalized, local heating of the heater and crucible is suppressed, and deterioration of the heater and damage to the crucible are prevented. In addition, the present invention has excellent effects such that the single crystallization rate of the single crystal to be pulled can be improved and the yield can be greatly improved.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本考案装置の模式的縦断面図である。FIG. 1 is a schematic longitudinal sectional view of the device of the present invention.

【図2】本考案装置の軸心線方向における発熱分布を示
すグラフである。
FIG. 2 is a graph showing a heat generation distribution in the axial direction of the device of the present invention.

【図3】本考案装置と従来装置との単結晶歩留りの比較
結果を示すグラフである。
FIG. 3 is a graph showing a comparison result of a single crystal yield between the device of the present invention and a conventional device.

【図4】従来のチョクラルスキー法による結晶成長装置
の模式的縦断面図である。
FIG. 4 is a schematic longitudinal sectional view of a conventional crystal growth apparatus using the Czochralski method.

【図5】ヒータの軸心線方向の発熱分布を示すグラフで
ある。
FIG. 5 is a graph showing a heat generation distribution in the axial direction of the heater.

【符号の説明】[Explanation of symbols]

11 坩堝 11a 内層坩堝 11b 外層坩堝 12 ヒータ 13 引上軸 14 種結晶 15 単結晶 11 crucible 11a inner crucible 11b outer crucible 12 heater 13 pulling shaft 14 seed crystal 15 single crystal

Claims (1)

(57)【実用新案登録請求の範囲】(57) [Scope of request for utility model registration] 【請求項1】 坩堝の周囲に円筒形状をなすヒータを配
置し、坩堝内にて結晶用原料を溶解し、その溶融液に種
結晶を浸漬して単結晶を引上げる単結晶成長装置におい
て、ヒータの軸心線方向の発熱分布を均一にすべく軸心
線方向の両端部の肉厚を中央部よりも薄肉としたことを
特徴とする単結晶成長装置。
1. A single crystal growing apparatus in which a cylindrical heater is arranged around a crucible, a raw material for crystal is melted in the crucible, and a seed crystal is immersed in the melt to pull up a single crystal. A single crystal growth apparatus characterized in that the thickness of both ends in the axial direction is made thinner than the central portion in order to make the heat distribution in the axial direction of the heater uniform.
JP11344491U 1991-11-28 1991-11-28 Single crystal growth equipment Expired - Lifetime JP2570348Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11344491U JP2570348Y2 (en) 1991-11-28 1991-11-28 Single crystal growth equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11344491U JP2570348Y2 (en) 1991-11-28 1991-11-28 Single crystal growth equipment

Publications (2)

Publication Number Publication Date
JPH0546967U JPH0546967U (en) 1993-06-22
JP2570348Y2 true JP2570348Y2 (en) 1998-05-06

Family

ID=14612387

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11344491U Expired - Lifetime JP2570348Y2 (en) 1991-11-28 1991-11-28 Single crystal growth equipment

Country Status (1)

Country Link
JP (1) JP2570348Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5417965B2 (en) * 2009-04-21 2014-02-19 株式会社Sumco Single crystal growth method

Also Published As

Publication number Publication date
JPH0546967U (en) 1993-06-22

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