JP2567862B2 - How to measure resistance - Google Patents

How to measure resistance

Info

Publication number
JP2567862B2
JP2567862B2 JP62180487A JP18048787A JP2567862B2 JP 2567862 B2 JP2567862 B2 JP 2567862B2 JP 62180487 A JP62180487 A JP 62180487A JP 18048787 A JP18048787 A JP 18048787A JP 2567862 B2 JP2567862 B2 JP 2567862B2
Authority
JP
Japan
Prior art keywords
voltage
value
current
resistor
controller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP62180487A
Other languages
Japanese (ja)
Other versions
JPS6423168A (en
Inventor
秀光 斎藤
志津夫 上倉
修一 亀山
勝義 輝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP62180487A priority Critical patent/JP2567862B2/en
Publication of JPS6423168A publication Critical patent/JPS6423168A/en
Application granted granted Critical
Publication of JP2567862B2 publication Critical patent/JP2567862B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【発明の詳細な説明】 [概要] 本発明は複合回路で構成した被測定抵抗体に初期値零
から電流を印加し、電圧を監視することにより抵抗体に
過電流を流すことなくまた過電圧を印加することなく、
安全に抵抗値を測定する方法である。
DETAILED DESCRIPTION OF THE INVENTION [Outline] The present invention applies an electric current from an initial value of zero to a resistor to be measured composed of a composite circuit, and monitors the voltage to prevent an overcurrent from flowing through the resistor and to prevent an overvoltage. Without applying
This is a method of safely measuring the resistance value.

[産業上の利用分野] 本発明は複合回路で構成した被測定抵抗体の抵抗値を
周辺回路に影響を与えず安全に測定する方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for safely measuring the resistance value of a resistor to be measured formed of a composite circuit without affecting the peripheral circuits.

従来の抵抗値測定法は抵抗体に低電圧または定電流を
一挙に印加するため、抵抗体が不良品であるとき予想外
の電流が流れたり過電圧を発生させてしまうなど周辺回
路に悪影響の及ぶことがあった。そのため常に安全に測
定する方法を開発することが要望された。
In the conventional resistance value measurement method, low voltage or constant current is applied to the resistor all at once, so when the resistor is defective, an unexpected current flows or overvoltage is generated, which adversely affects the peripheral circuits. There was an occasion. Therefore, it was demanded to develop a method for always measuring safely.

[従来の技術] 第4図は従来の抵抗値測定法を説明するための図であ
る。図示する集積回路1のピン11と接地2間の抵抗R1
1、ピン12と接地2間の抵抗R12…を順次測定するとき、
定電流源3の一方をまずピン11に、他方を接地2へ接続
し、ピン11と接地2間に定電流Iを一挙に流す。そのと
きピン11と接地2間に生じる電位差を電位差計4で測定
し、電圧V1を得る。抵抗R11はV1/Iを演算して求められ
る。同様に定電流源3の接続をピン12へ変更すると、電
圧V2を測定してV2/Iを演算すればR12が得られる。
[Prior Art] FIG. 4 is a diagram for explaining a conventional resistance value measuring method. Resistor R1 between pin 11 and ground 2 of the illustrated integrated circuit 1
1. When sequentially measuring resistance R12 between pin 12 and ground 2,
One of the constant current sources 3 is first connected to the pin 11 and the other is connected to the ground 2 so that the constant current I flows between the pin 11 and the ground 2 all at once. At that time, the potential difference generated between the pin 11 and the ground 2 is measured by the potentiometer 4 to obtain the voltage V 1 . The resistance R11 is obtained by calculating V 1 / I. When similarly change the connection of the constant current source 3 to the pin 12, R12 can be obtained by calculating the V 2 / I by measuring the voltage V 2.

或いは第5図に示すように電圧Vの定電圧源5を準備
し、その一端を電流計6を介してピン11と接続する。定
電圧源5の他端は接地2と接続する。そのとき流れる電
流I1を電流計6により測定して演算し、V/I1=R11を得
る。同様にピン12と接続してV/I2=R12を得る。
Alternatively, as shown in FIG. 5, a constant voltage source 5 of voltage V is prepared and one end thereof is connected to pin 11 via ammeter 6. The other end of the constant voltage source 5 is connected to the ground 2. The current I 1 flowing at that time is measured by the ammeter 6 and calculated to obtain V / I 1 = R 11. Similarly connect to pin 12 to get V / I 2 = R12.

[発明が解決しようとする問題点] 抵抗値を測定すべき抵抗体が単体として取り出すこと
が出来れば、第4図のように定電流源と接続し、または
定電圧源と第5図のように接続して測定することも問題
は少ないが、その抵抗体が複合回路となっていて、他の
トランジスタ・ダイオード・コンデンサなどと接続され
ている場合は、複合回路の接地間抵抗値を求めることと
なる。そして回路の製造時におけるミス或いは使用中の
経時変化により発生した欠陥があると、接続した定電圧
源の電圧が一挙に接続点へ印加されたときに予想外の電
流が流れたり、接続した定電流源から電流が一挙に接続
点へ印加されたときに予想外の電圧が発生し、他の回路
素子に悪影響を及ぼし、また測定器を破壊する恐れがあ
った。
[Problems to be Solved by the Invention] If the resistor whose resistance value is to be measured can be taken out as a single unit, it is connected to a constant current source as shown in FIG. 4, or a constant voltage source and as shown in FIG. Although there is no problem in connecting to and measuring with a resistor, if the resistor is a composite circuit and it is connected to other transistors, diodes, capacitors, etc., calculate the resistance value between the ground of the composite circuit. Becomes If there is a defect caused by a mistake in manufacturing the circuit or a change with time during use, an unexpected current will flow when the voltage of the connected constant voltage source is applied to the connection point all at once, or the connected When a current was applied from the current source to the connection point all at once, an unexpected voltage was generated, which adversely affected other circuit elements and might damage the measuring instrument.

本発明の目的は前述の欠点を改善し、過電流など予定
しない電流・電圧を発生させずに安全に複合回路で構成
した抵抗体の抵抗値を測定する方法を提供することにあ
る。
An object of the present invention is to improve the above-mentioned drawbacks and to provide a method for safely measuring the resistance value of a resistor composed of a composite circuit without generating an unexpected current or voltage such as an overcurrent.

[問題点を解決するための手段] 第1図は本発明の原理構成を示す図である。第1図に
おいて、1は集積回路、11は集積回路のピン、2は接
地、71はピン11と接地2間の被測定抵抗体、30は電流値
をプログラマブルに可変できる定電流源、4は電圧測定
器、80はコントローラ、83は電圧比較器を示す。
[Means for Solving the Problems] FIG. 1 is a diagram showing the principle configuration of the present invention. In FIG. 1, 1 is an integrated circuit, 11 is a pin of the integrated circuit, 2 is a ground, 71 is a resistor to be measured between the pin 11 and the ground 2, 30 is a constant current source whose programmable current value can be varied, and 4 is A voltage measuring device, 80 is a controller, and 83 is a voltage comparator.

本発明の構成は下記のとおりである。被測定抵抗体71
にプログラマブルに設定可能な定電流源30及び電圧比較
器83、またそれらをコントロールするコントローラ80、
そして電圧測定器4とを接続し、前記定電流源30からの
抵抗体71に印加する電流を、初期値零から線形に増加さ
せ、所定の電流値、または所定の電圧値になったことを
コントローラ80が直接に、または電圧比較器83を介して
知った時に、コントローラ80からの命令により電流の増
加を止め、その時の電流値と、電圧測定器4により測定
した抵抗体71両端の電圧値とから演算して、抵抗体71の
抵抗値を測定する方法である。
The structure of the present invention is as follows. Resistor to be measured 71
A programmable constant current source 30 and a voltage comparator 83, and a controller 80 for controlling them.
Then, the voltage measuring device 4 is connected, and the current applied to the resistor 71 from the constant current source 30 is linearly increased from an initial value of zero to reach a predetermined current value or a predetermined voltage value. When the controller 80 knows it directly or through the voltage comparator 83, the increase of the current is stopped by the command from the controller 80, and the current value at that time and the voltage value across the resistor 71 measured by the voltage measuring device 4 This is a method of measuring the resistance value of the resistor 71 by calculating from

[作用] 定電流源30は初期値零としてピン11と接続し、ピン11
と接地2間が被測定抵抗体71となる。電圧測定器4の測
定値は当初は零である。定電流源30はプログラマブルに
電流値を変化させることが可能であるから、コントロー
ラ80の指令により電流値を線形に増加させる。第2図A,
Bは時間tの経過に対する電流・電圧変化の状況を示す
図である。電流が所定値Isに達したとき(時間t1)、或
いは電圧測定器4の読みV1が所定値に達したとき(時間
t2)、のより小さい方の時間において電流増加を停止さ
せる。前者はコントローラ80が直接に判断して停止さ
せ、後者は電圧比較器83が判断してコントローラ80に通
知して、電流増加を停止させる。そしてコントローラ80
はV1/Iを演算してR11を求める。被測定抵抗体71が電流
に対し非線形特性を有するとき、電圧波形は第2図Bの
ように直線的に増加するとは限らないから、少なくとも
電流Iは線形に増加させてR11の正確な値を得る。
[Operation] The constant current source 30 is connected to pin 11 with an initial value of zero, and pin 11
The resistor 71 to be measured is between the ground and the ground 2. The measured value of the voltage measuring device 4 is initially zero. Since the constant current source 30 can change the current value in a programmable manner, the current value is linearly increased according to a command from the controller 80. Figure 2A,
B is a diagram showing a situation of current / voltage changes with the passage of time t. When the current reaches a predetermined value Is (time t 1 ) or when the reading V 1 of the voltage measuring device 4 reaches a predetermined value (time t 1 ).
The current increase is stopped at a time shorter than t 2 ). In the former case, the controller 80 directly judges and stops the latter, and in the latter case, the voltage comparator 83 judges and notifies the controller 80 to stop the current increase. And controller 80
Calculates V 1 / I to obtain R 11. When the resistor to be measured 71 has a non-linear characteristic with respect to the current, the voltage waveform does not necessarily increase linearly as shown in FIG. 2B, so at least the current I is increased linearly to obtain an accurate value of R11. obtain.

[実施例] 第3図は本発明の実施例の構成を示す図である。第3
図において80はコントローラ、81は定電流源駆動用ディ
ジタル・アナログ(D/A)変換器、82は最大印加許容電
圧値設定用D/A変換器、83は電圧比較器、84は電圧測定
用A/D変換器を示す。その他の第1図と同一符号は同様
のものを示す。コントローラ80はD/A変換器81に対し初
期値からデータを増大させる。すると、定電流源30は初
期値零から線形に増大する電流を出力するから、被測定
抵抗体71の両端の電圧値は変化する。一方D/A変換器82
は抵抗体71への最大印加許容電圧を電圧比較器83に設定
している。よって抵抗体71の電圧が設定電圧値まで上昇
したという信号が電圧比較器83からコントローラ80に達
したときは、その時点で電流値の増加を停止させる。ま
たは、定電流源30からの電流値が最大印加許容電流値ま
で増加したときにコントローラ80からの指令で電流値の
増加を停止する。
[Embodiment] FIG. 3 is a diagram showing a configuration of an embodiment of the present invention. Third
In the figure, 80 is a controller, 81 is a digital-analog (D / A) converter for driving a constant current source, 82 is a D / A converter for setting the maximum applied allowable voltage value, 83 is a voltage comparator, and 84 is for voltage measurement. An A / D converter is shown. Other than that, the same reference numerals as those in FIG. 1 indicate the same parts. The controller 80 causes the D / A converter 81 to increase the data from the initial value. Then, the constant current source 30 outputs a current that linearly increases from the initial value of zero, so that the voltage value across the resistor 71 to be measured changes. Meanwhile, D / A converter 82
Sets the maximum allowable voltage applied to the resistor 71 in the voltage comparator 83. Therefore, when a signal indicating that the voltage of the resistor 71 has risen to the set voltage value reaches the controller 80 from the voltage comparator 83, the increase of the current value is stopped at that time. Alternatively, when the current value from the constant current source 30 has increased to the maximum allowable current value, the controller 80 stops increasing the current value in response to a command.

前述のような電流値上昇を停止させた何れの場合にお
いても、電流値はD/A変換器81の入力データから判定す
る。また電圧値は電圧測定器4からの電圧値をA/D変換
器84を介して取得する。次に中央処理装置80は電圧/電
流の演算を行い抵抗体71の抵抗値を得る。
In any case where the current value increase is stopped as described above, the current value is determined from the input data of the D / A converter 81. As the voltage value, the voltage value from the voltage measuring device 4 is acquired via the A / D converter 84. Next, the central processing unit 80 calculates the voltage / current and obtains the resistance value of the resistor 71.

このとき所定電流、または所定電圧値における抵抗値
を求めることが可能であり、抵抗体71が非線形特性であ
れば、連続的に何点かを測定すれば全体の特性が順次に
求められる。
At this time, the resistance value at a predetermined current or a predetermined voltage value can be obtained, and if the resistor 71 has a nonlinear characteristic, the entire characteristic can be sequentially obtained by continuously measuring several points.

[発明の効果] このようにして本発明によると、設定電流値で印加電
流を停止できるために、過電流による被試験体の破壊を
防止できる。また、常に被試験体の電圧を電圧比較器で
監視しているので、最大許容印加電圧になった時に印加
電流を停止できるため、過電圧による被試験体の破壊を
防止できる。
[Effects of the Invention] According to the present invention as described above, the applied current can be stopped at the set current value, so that the device under test can be prevented from being destroyed by an overcurrent. Further, since the voltage of the device under test is constantly monitored by the voltage comparator, the applied current can be stopped when the maximum allowable applied voltage is reached, so that the device under test can be prevented from being damaged by overvoltage.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の原理構成を示す図、 第2図A,Bは第1図の動作波形図、 第3図は本発明の実施例の構成を示す図、 第4図・第5図は従来の抵抗値測定を説明する図であ
る。 1……集積回路 11,12……集積回路のピン 2……接地 3,30……定電流源 4……電圧測定器 5……定電圧源 6……電流計 71……被測定抵抗体 80……中央処理装置
FIG. 1 is a diagram showing a principle configuration of the present invention, FIGS. 2A and 2B are operation waveform diagrams of FIG. 1, FIG. 3 is a diagram showing a configuration of an embodiment of the present invention, and FIGS. FIG. 6 is a diagram illustrating a conventional resistance value measurement. 1 …… Integrated circuit 11,12 …… Integrated circuit pin 2 …… Grounding 3,30 …… Constant current source 4 …… Voltage measuring instrument 5 …… Constant voltage source 6 …… Ammeter 71 …… Resistance to be measured 80 ... Central processing unit

フロントページの続き (72)発明者 輝 勝義 神奈川県川崎市中原区上小田中1015番地 富士通株式会社内 (56)参考文献 特開 昭48−40383(JP,A) 特開 昭55−119066(JP,A) 特開 昭55−58467(JP,A)Continued Front Page (72) Inventor Katsuyoshi Katsuki, Nakahara-ku, Kawasaki City, Kanagawa 1015 Kamiodanaka, Fujitsu Limited (56) References JP-A-48-40383 (JP, A) JP-A-55-119066 (JP, A) JP-A-55-58467 (JP, A)

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】複合回路で構成した被測定抵抗体(71)に
対して、プログラマブルに設定された定電流源(30)及
び電圧比較器(83)、またそれらをコントロールするコ
ントローラ(80)、そして電圧測定器(4)とを接続
し、 前記定電流源(30)から前記複合回路で構成した抵抗体
(71)に印加する電流を、初期値零から線形に増加さ
せ、所定の電流値または電圧値になったことを前記コン
トローラ(80)が直接に、または電圧比較器(83)を介
して知った時に、 前記コントローラ(80)からの命令により電流の増加を
止め、 その時の電流値と、電圧測定器(4)により測定した前
記抵抗体(71)両端の電圧値とから演算して、抵抗体
(71)の抵抗値を測定すること を特徴とする抵抗値の測定方法。
1. A constant current source (30) and a voltage comparator (83) which are set programmable with respect to a resistor to be measured (71) composed of a composite circuit, and a controller (80) for controlling them. A voltage measuring device (4) is connected, and the current applied from the constant current source (30) to the resistor (71) composed of the composite circuit is increased linearly from an initial value of zero to a predetermined current value. Alternatively, when the controller (80) knows that the voltage value has been reached, either directly or via the voltage comparator (83), the increase in current is stopped by an instruction from the controller (80), and the current value at that time is stopped. And a voltage value across the resistor (71) measured by a voltage measuring device (4) to measure the resistance value of the resistor (71).
JP62180487A 1987-07-20 1987-07-20 How to measure resistance Expired - Fee Related JP2567862B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62180487A JP2567862B2 (en) 1987-07-20 1987-07-20 How to measure resistance

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62180487A JP2567862B2 (en) 1987-07-20 1987-07-20 How to measure resistance

Publications (2)

Publication Number Publication Date
JPS6423168A JPS6423168A (en) 1989-01-25
JP2567862B2 true JP2567862B2 (en) 1996-12-25

Family

ID=16084088

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62180487A Expired - Fee Related JP2567862B2 (en) 1987-07-20 1987-07-20 How to measure resistance

Country Status (1)

Country Link
JP (1) JP2567862B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW279242B (en) * 1994-11-29 1996-06-21 Asahi Denka Kogyo Kk The wasted-gas processing method & device for CVD apparatus
EP3109648B1 (en) * 2015-06-25 2018-05-02 Mitsubishi Electric R&D Centre Europe B.V. Method and system for on-line monitoring an electrolytic capacitor condition

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE7505070L (en) * 1974-05-02 1975-11-03 Simpson Ag Maschinen SEWERAGE FACILITY.
JPS5558467A (en) * 1978-10-25 1980-05-01 Hodaka Denshi Gijutsu Kenkyusho:Kk Inductive load measuring method
JPS55119066A (en) * 1979-03-09 1980-09-12 Yokogawa Hokushin Electric Corp Measuring device for contact resistance

Also Published As

Publication number Publication date
JPS6423168A (en) 1989-01-25

Similar Documents

Publication Publication Date Title
JP3108455B2 (en) How to measure breakdown voltage
JP2567862B2 (en) How to measure resistance
JPH04248472A (en) Method of measuring resistance value
JPH01502391A (en) Cable failure detection device
JP3216171B2 (en) IC test equipment calibration method
US5005008A (en) Method and apparatus for providing thermodynamic protection of a driver circuit used in an in-circuit tester
US4068166A (en) Method and apparatus for measuring percent error of an impedance
US7084648B2 (en) Semiconductor testing
JPS6314784B2 (en)
JPH11281688A (en) Constant-current source and resistancemeasuring device
JP3208195B2 (en) Measuring device for device drive current during aging
US3510775A (en) In-circuit semiconductor leakage testing means and method
JP2919312B2 (en) Inspection method for semiconductor device
JP2666352B2 (en) Circuit connection test method
JP2509631Y2 (en) Multi-channel resistance measuring device
SU382092A1 (en) 8THE UNION I
JPH05232172A (en) Method and device for testing power amplifier
JPS5999368A (en) Method and apparatus for measuring inverse voltage of semiconductor element
JP2948633B2 (en) Method for measuring voltage of semiconductor device
JPH067154B2 (en) Electrostatic breakdown test equipment for semiconductor devices
JPS63210787A (en) Locating method for accident point of cable
JPS58111533A (en) Input circuit
JPS5924390B2 (en) Voltage applied current measurement circuit
JPS5897802A (en) Device for selecting fixed resistance value for adjustment
JPS5931011B2 (en) Method for measuring input offset voltage of semiconductor integrated linear circuit

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees