JP2546611Y2 - Ic試験装置 - Google Patents
Ic試験装置Info
- Publication number
- JP2546611Y2 JP2546611Y2 JP1990110347U JP11034790U JP2546611Y2 JP 2546611 Y2 JP2546611 Y2 JP 2546611Y2 JP 1990110347 U JP1990110347 U JP 1990110347U JP 11034790 U JP11034790 U JP 11034790U JP 2546611 Y2 JP2546611 Y2 JP 2546611Y2
- Authority
- JP
- Japan
- Prior art keywords
- rail
- movable rail
- movable
- input
- lead
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000005452 bending Methods 0.000 description 12
- 238000000926 separation method Methods 0.000 description 9
- 238000011144 upstream manufacturing Methods 0.000 description 6
- 230000002950 deficient Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Landscapes
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Lead Frames For Integrated Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990110347U JP2546611Y2 (ja) | 1990-10-22 | 1990-10-22 | Ic試験装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990110347U JP2546611Y2 (ja) | 1990-10-22 | 1990-10-22 | Ic試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0467340U JPH0467340U (enrdf_load_stackoverflow) | 1992-06-15 |
| JP2546611Y2 true JP2546611Y2 (ja) | 1997-09-03 |
Family
ID=31857668
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1990110347U Expired - Lifetime JP2546611Y2 (ja) | 1990-10-22 | 1990-10-22 | Ic試験装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2546611Y2 (enrdf_load_stackoverflow) |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57149745A (en) * | 1981-03-11 | 1982-09-16 | Tokyo Seimitsu Co Ltd | Selector for semiconductor element, etc. |
| JPH0238456Y2 (enrdf_load_stackoverflow) * | 1985-12-19 | 1990-10-17 | ||
| JPS62167486A (ja) * | 1986-01-13 | 1987-07-23 | Shimadzu Corp | Can型ic用自動検査装置 |
| JPS6454334U (enrdf_load_stackoverflow) * | 1987-09-30 | 1989-04-04 | ||
| JPH0167580U (enrdf_load_stackoverflow) * | 1987-10-26 | 1989-05-01 | ||
| JPH0743051Y2 (ja) * | 1988-06-30 | 1995-10-04 | 株式会社アドバンテスト | Ic分離装置 |
-
1990
- 1990-10-22 JP JP1990110347U patent/JP2546611Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0467340U (enrdf_load_stackoverflow) | 1992-06-15 |
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