JP2522803Y2 - ドライエッチング用終点検出装置 - Google Patents

ドライエッチング用終点検出装置

Info

Publication number
JP2522803Y2
JP2522803Y2 JP1989060526U JP6052689U JP2522803Y2 JP 2522803 Y2 JP2522803 Y2 JP 2522803Y2 JP 1989060526 U JP1989060526 U JP 1989060526U JP 6052689 U JP6052689 U JP 6052689U JP 2522803 Y2 JP2522803 Y2 JP 2522803Y2
Authority
JP
Japan
Prior art keywords
laser beam
laser
end point
dry etching
wafer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1989060526U
Other languages
English (en)
Japanese (ja)
Other versions
JPH031532U (enrdf_load_stackoverflow
Inventor
義裕 柿本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP1989060526U priority Critical patent/JP2522803Y2/ja
Publication of JPH031532U publication Critical patent/JPH031532U/ja
Application granted granted Critical
Publication of JP2522803Y2 publication Critical patent/JP2522803Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • ing And Chemical Polishing (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Drying Of Semiconductors (AREA)
JP1989060526U 1989-05-25 1989-05-25 ドライエッチング用終点検出装置 Expired - Lifetime JP2522803Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1989060526U JP2522803Y2 (ja) 1989-05-25 1989-05-25 ドライエッチング用終点検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989060526U JP2522803Y2 (ja) 1989-05-25 1989-05-25 ドライエッチング用終点検出装置

Publications (2)

Publication Number Publication Date
JPH031532U JPH031532U (enrdf_load_stackoverflow) 1991-01-09
JP2522803Y2 true JP2522803Y2 (ja) 1997-01-16

Family

ID=31587965

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989060526U Expired - Lifetime JP2522803Y2 (ja) 1989-05-25 1989-05-25 ドライエッチング用終点検出装置

Country Status (1)

Country Link
JP (1) JP2522803Y2 (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5274514U (enrdf_load_stackoverflow) * 1975-12-01 1977-06-03
JP2011137843A (ja) * 2008-03-27 2011-07-14 Nec Corp エッチング終点検出パターンおよびエッチング終点検出方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5834309A (ja) * 1981-08-25 1983-02-28 Nok Corp 非接触式面性状測定法
JPS61250520A (ja) * 1985-04-30 1986-11-07 Hoya Corp 液面レベル計
JPH0691045B2 (ja) * 1986-03-03 1994-11-14 日電アネルバ株式会社 エツチングモニタ−装置

Also Published As

Publication number Publication date
JPH031532U (enrdf_load_stackoverflow) 1991-01-09

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term