JP2513113B2 - Double resin sealing device for semiconductor device - Google Patents

Double resin sealing device for semiconductor device

Info

Publication number
JP2513113B2
JP2513113B2 JP4079893A JP4079893A JP2513113B2 JP 2513113 B2 JP2513113 B2 JP 2513113B2 JP 4079893 A JP4079893 A JP 4079893A JP 4079893 A JP4079893 A JP 4079893A JP 2513113 B2 JP2513113 B2 JP 2513113B2
Authority
JP
Japan
Prior art keywords
resin
resin sealing
mold
cavity
runner
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP4079893A
Other languages
Japanese (ja)
Other versions
JPH06252191A (en
Inventor
秀樹 水野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP4079893A priority Critical patent/JP2513113B2/en
Publication of JPH06252191A publication Critical patent/JPH06252191A/en
Application granted granted Critical
Publication of JP2513113B2 publication Critical patent/JP2513113B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はリードフレームに載置さ
れた半導体チップを樹脂封止する半導体装置の樹脂封止
装置に関し、特に、リードフレームに複数個並べ載置さ
れた個々の半導体チップを樹脂封止し、樹脂封止された
複数のモールド体を一括して樹脂封止する半導体装置の
二重樹脂封止装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a resin sealing device for a semiconductor device which seals a semiconductor chip mounted on a lead frame with a resin, and more particularly to a plurality of individual semiconductor chips mounted side by side on a lead frame. The present invention relates to a double resin sealing device for a semiconductor device, which is resin-sealed and collectively seals a plurality of resin-molded mold bodies.

【0002】[0002]

【従来の技術】通常、フォトカプラのような対方向型半
導体装置は、それぞれの半導体チップを個々に一次樹脂
封止金型で樹脂モールドし、その後、半導体チップが樹
脂封止された複数のモールド体を並べて配置し二次樹脂
封止金型で一括してモールドし、対方向型半導体装置の
外郭体を成形していた。
2. Description of the Related Art Generally, in a counter-directional semiconductor device such as a photocoupler, each semiconductor chip is individually resin-molded with a primary resin-sealing die, and then the semiconductor chips are resin-sealed. The bodies are arranged side by side and molded together with a secondary resin sealing mold to form the outer shell of the counter-directional semiconductor device.

【0003】図4(a)及び(b)は従来の二重樹脂封
止装置の一例における一次及び二次樹脂封止金型の下型
を示す部分平面図である。従来、この種の二重樹脂封止
装置は、図4(a)に示す一次樹脂封止金型と、図4
(b)に示す二次樹脂封止金型とで構成されていた。
FIGS. 4 (a) and 4 (b) are partial plan views showing a lower die of a primary and secondary resin sealing mold in an example of a conventional double resin sealing device. Conventionally, this type of double resin encapsulation device includes a primary resin encapsulation mold shown in FIG.
It was comprised with the secondary resin sealing metal mold | die shown to (b).

【0004】これら樹脂封止金型の構造は、上型(図示
せず)の窪みとで閉鎖空間を形成するキャビテイ16及
び17と、これらキャビティ16,17にランナ12
a,12bから供給される溶融樹脂を注入するゲート1
4a,14bをもつクロスランナ13a,13bとがそ
れぞれの下型11a,11bに形成されていた。また、
このクロスランナ13,13bは、樹脂封止金型の標準
化のために同じ位置に施されていた。
The structures of these resin-sealing molds are such that cavities 16 and 17 which form a closed space with a recess of an upper mold (not shown), and runners 12 in these cavities 16 and 17.
Gate 1 for injecting the molten resin supplied from a and 12b
Cross runners 13a and 13b having 4a and 14b were formed on the lower molds 11a and 11b, respectively. Also,
The cross runners 13 and 13b were provided at the same position for standardization of the resin sealing mold.

【0005】図5は図4(a)の下型とリードフレーム
の搭載状態を示す部分平面図、図6は一次樹脂封止後に
発生するクロスランナ近傍に生ずる樹脂ばりを示す断面
図、図7(a)及び(b)は図4(b)の下型とリード
フレームの搭載状態を示す部分平面図(a)及びBーB
断面図(b)である。次に、この二重樹脂封止装置によ
る半導体装置の樹脂封止方法を説明する。まず、図5に
示すように、帯状のリードフレーム20を一次樹脂封止
金型の下型11aに乗せ、リードフレーム20に搭載さ
れた半導体チップ21を各キャビティ16に挿入する。
次に、図示されていない上型と合せ型閉めを行なう。そ
して、ランナ12aからクロスランナ13aに溶融樹脂
を流し、ゲート14aよりキャビティ16に溶融樹脂を
注入する。注入完了後、所定の硬化時間が経過してか
ら、型開きし、数珠繋ぎのように樹脂封止されたモール
ド体を一次樹脂封止金型より取外す。
FIG. 5 is a partial plan view showing a mounting state of the lower die and the lead frame of FIG. 4A, FIG. 6 is a sectional view showing a resin burr generated in the vicinity of the cross runner generated after the primary resin sealing, and FIG. FIGS. 4A and 4B are partial plan views showing a mounting state of the lower die and the lead frame of FIG. 4B, and FIGS.
It is sectional drawing (b). Next, a resin sealing method for a semiconductor device by this double resin sealing device will be described. First, as shown in FIG. 5, the strip-shaped lead frame 20 is placed on the lower mold 11 a of the primary resin sealing mold, and the semiconductor chip 21 mounted on the lead frame 20 is inserted into each cavity 16.
Next, the upper mold (not shown) and the mold are closed. Then, the molten resin is flown from the runner 12a to the cross runner 13a, and the molten resin is injected into the cavity 16 from the gate 14a. After a predetermined curing time has elapsed after the completion of the injection, the mold is opened, and the resin-sealed mold body like a beaded string is removed from the primary resin-sealed mold.

【0006】次に、一次樹脂封止金型より取外したモー
ルド体22には、図7に示すように、クロスランナ付近
の樹脂溜めによるリードフレーム20に付着したゲート
樹脂ばり24が取付いた状態なので、このゲート残りで
あるゲート樹脂ばりをはつりモールド体22より除去す
る。そして樹脂封止されたモールド体からリード側には
み出す樹脂ばりを樹脂ばり除去型で除去し一次樹脂封止
後の処理を完了する。
Next, as shown in FIG. 7, the gate resin burr 24 attached to the lead frame 20 by the resin reservoir near the cross runner is attached to the mold body 22 removed from the primary resin sealing die. The gate resin flash, which is the remaining gate, is removed from the chipping mold body 22. Then, the resin burr protruding from the resin-sealed mold body to the lead side is removed by a resin burr removal type, and the process after the primary resin sealing is completed.

【0007】次に、図7(a)に示すように、並べて樹
脂封止されたモールド体22の全てがキャビティ17に
収納されるようにリードフレーム20を下型11bに位
置決め載置する。そして、型閉めしてから、ランナ12
bからクロスランナ13bに溶融樹脂を流し、ゲート1
4bより溶融樹脂をキャビティ17に注入し、複数のモ
ールドを一体化して半導体装置の外郭体を成形する。
Next, as shown in FIG. 7A, the lead frame 20 is positioned and mounted on the lower mold 11b so that all of the mold bodies 22 which are lined and resin-sealed are housed in the cavity 17. And after closing the mold, runner 12
The molten resin is flowed from b to the cross runner 13b, and the gate 1
Molten resin is injected into the cavity 17 from 4b, and a plurality of molds are integrated to form the outer shell of the semiconductor device.

【0008】このようにリードフレームに並べて搭載さ
れた個々の半導体チップを樹脂封止してから、個々のモ
ールド体の位置をリードフレームで維持した状態で一括
モールドすることによって、相互の位置関係を崩すこと
無く一体成形することが出来るものであった。
As described above, the individual semiconductor chips mounted side by side on the lead frame are resin-sealed, and then they are collectively molded while maintaining the positions of the individual molded bodies on the lead frame, so that the mutual positional relationship is maintained. It could be integrally molded without breaking.

【0009】[0009]

【発明が解決しようとする課題】しかしながら、上述し
た従来の二重樹脂封止装置では、一次樹脂封止後に樹脂
ばり除去工程で樹脂ばりを除去するものの、図7(b)
に示すように、クロスランナ13a上に付着した図7の
ゲート残りであるゲート樹脂ばり24が完全に除去され
ずに残部24aとしてしばしば残る。そしてそれぞれの
下型11a,11bのクロスランナ13a,13bの位
置が一致しているので、二次樹脂封止の際に、この残部
24aが二次樹脂封止金型のクロスランナ13bに入り
込み、ゲート14bから注入される溶融樹脂の流れの妨
げとなり、樹脂の流れに伴いその残部に溶融樹脂が披着
し益々肥大して流量抵抗が大きくなる。この結果、注入
される溶融樹脂の流量が不足しキャビティ17の隅々ま
で樹脂が十分充填されずに硬化し、樹脂供給不足による
樹脂外郭体の欠け、凹み等を生じさせ品質上の重大な欠
陥となる。
However, in the conventional double resin sealing device described above, the resin flash is removed in the resin flash removing step after the primary resin sealing, but FIG.
As shown in FIG. 7, the gate resin flash 24, which is the gate residue of FIG. 7 attached on the cross runner 13a, is not completely removed and often remains as the remaining portion 24a. Since the positions of the cross runners 13a and 13b of the respective lower molds 11a and 11b are aligned with each other, the remaining portion 24a enters the cross runner 13b of the secondary resin sealing die during the secondary resin sealing, The flow of the molten resin injected from the gate 14b is obstructed, and the molten resin adheres to the remaining portion of the resin along with the flow of the resin, and the flow resistance increases as the flow rate increases. As a result, the flow rate of the injected molten resin is insufficient, the resin is not sufficiently filled in every corner of the cavity 17, and the resin is cured, resulting in chipping or denting of the resin outer shell due to insufficient resin supply, which is a serious defect in quality. Becomes

【0010】このため、一次樹脂封止後のゲート残りを
除去した後、残部の有無を検査し、有ればホーニングに
よりリードフレームの表面を円滑に仕上げてから二次樹
脂封止を行なっていた。しかし、この作業はオフライン
で行なわなければならず、樹脂封止ラインを円滑に運用
させることが困難であるばかりか、多大な工数を浪費す
る欠点がある。また、この対策として、例えば、ゲート
残りを除去し易いように、ゲートに近いクロスランナの
樹脂流入経路を狭くしてゲート残りに切欠きを設け、ゲ
ート残りがその切欠き部から折れ易くした方法がある
が、ゲート残りを完全に除去することが出来ず解決には
至っていない。
For this reason, after removing the gate residue after the primary resin sealing, the presence or absence of the remaining portion is inspected, and if there is, the surface of the lead frame is smoothly finished by honing and then the secondary resin sealing is performed. . However, this work must be performed off-line, and it is difficult to operate the resin sealing line smoothly, and there is a drawback that a great number of man-hours are wasted. As a countermeasure against this, for example, in order to easily remove the remaining gate, a method of narrowing the resin inflow path of the cross runner close to the gate and providing a notch in the remaining gate, and making the remaining gate easily broken from the notch However, the rest of the gate cannot be completely removed and it has not been resolved.

【0011】従って、本発明の目的は、一次樹脂封止後
に樹脂ばりが多少残っていても、欠損のない樹脂外郭体
に成形できるとともに樹脂封止ラインの運転を円滑に出
来る半導体装置の二重樹脂封止装置を提供することであ
る。
Therefore, an object of the present invention is to provide a dual semiconductor device which can be molded into a resin outer body having no defects even if some resin burrs remain after the primary resin encapsulation and the operation of the resin encapsulation line can be smoothly performed. It is to provide a resin sealing device.

【0012】[0012]

【課題を解決するための手段】本発明の特徴は、帯状の
リードフレームに帯の幅方向に並べ載置される複数の単
一半導体チップのそれぞれを独立して包み収納する複数
の第1のキャビティと、これら第1のキャビティのそれ
ぞれに溶融樹脂を注入する第1のゲートをもつとともに
第1のランナより派生する第1のクロスランナを有する
一次樹脂封止金型と、この一次樹脂封止金型で樹脂封止
し形成され前記リードフレームに数珠状に連結された複
数のモールド体列を包み収納する第2のキャビティと、
この第2のキャビティに溶樹脂を注入する第2のゲート
を有するとともに第2のランナより派生する第2のクロ
スランナを有する二次樹脂封止金型とを備える半導体装
置の二重樹脂封止装置において、前記一次樹脂封止金型
と前記二次樹脂封止とを前記第1のキャビティの並ぶ方
向と前記第2のキャビティの長手方向とを平行にして並
べ配置し平行移動して前記第1のキャビティと前記第2
のキャビティとを位置合せしたときに、前記第1のクロ
スランナと前記第2のクロスランナの位置が異なる半導
体装置の二重樹脂封止装置である。
A feature of the present invention is that a plurality of first semiconductor chips, each of which is mounted on a strip-shaped lead frame and arranged side by side in the width direction of the strip, are individually wrapped and housed. A primary resin sealing die having a cavity, a first gate for injecting a molten resin into each of these first cavities, and a first cross runner derived from the first runner, and this primary resin sealing A second cavity for enclosing and accommodating a plurality of mold body rows formed by resin-sealing with a mold and connected to the lead frame in a beaded shape;
A double resin encapsulation of a semiconductor device including a secondary resin encapsulation mold having a second gate for injecting a molten resin into the second cavity and having a second cross runner derived from the second runner. In the apparatus, the primary resin sealing die and the secondary resin sealing die are arranged side by side with the direction in which the first cavities are aligned and the longitudinal direction of the second cavities in parallel and are moved in parallel to each other. 1 cavity and the second
Is a double resin encapsulation device for a semiconductor device in which the positions of the first cross runner and the second cross runner are different when they are aligned with each other.

【0013】また、前記一次樹脂封止金型の前記第1の
クロスランナの位置に対応する前記二次樹脂封止金型の
下型面に望ぞましくは窪みを形成することである。
Further, it is desirable to form a recess in the lower mold surface of the secondary resin sealing mold corresponding to the position of the first cross runner of the primary resin sealing mold.

【0014】[0014]

【実施例】次に、本発明について図面を参照して説明す
る。
Next, the present invention will be described with reference to the drawings.

【0015】図1(a)及び(b)は本発明の二重樹脂
封止装置の一実施例における一次及び二次樹脂封止金型
の下型を示す部分平面図である。この二重樹脂封止装置
は、図1(a)に示す一次樹脂封止金型の下型9aにお
けるクロスランナ1aの位置と図1(b)に示す二次樹
脂封止金型の下型9bにおけるクロスランナ1bの位置
とは一致しないように、それそれのキャビティ16,1
7の中心位置から対称に外れた位置にクロスランナ1a
と1bを形成したことである。
FIGS. 1 (a) and 1 (b) are partial plan views showing a lower die of a primary and secondary resin sealing die in an embodiment of a double resin sealing device of the present invention. This double resin sealing device is provided with a position of the cross runner 1a in the lower die 9a of the primary resin sealing die shown in FIG. 1 (a) and a lower die of the secondary resin sealing die shown in FIG. 1 (b). The cavities 16, 1 of the cross runner 1b so that they do not coincide with the positions of the cross runner 1b
The cross runner 1a is symmetrically displaced from the center position of 7
And 1b are formed.

【0016】このように一次樹脂封止金型のクロスラン
ナ1aの位置と二次樹脂封止金型のクロスランナ1bの
位置を違えれば、一次樹脂封止作業で形成されるゲート
残りの樹脂残部は、二次樹脂封止の際に、二次樹脂封止
金型のクロスランナ1bに挿入されることない。また、
代りに挿入されるリードフレームの部分は何も被着され
ていない円滑な金属面であるので、溶融樹脂の流れの抵
抗にならなず、その部分に溶融樹脂が付着することがな
い。この結果、従来、起きていた樹脂供給不足による樹
脂外郭体の欠損が皆無となった。
As described above, if the position of the cross runner 1a of the primary resin sealing die and the position of the cross runner 1b of the secondary resin sealing die are different, the resin remaining on the gate formed in the primary resin sealing operation The remaining portion is not inserted into the cross runner 1b of the secondary resin sealing die during the secondary resin sealing. Also,
Since the portion of the lead frame to be inserted instead is a smooth metal surface on which nothing is adhered, it does not become a resistance to the flow of the molten resin, and the molten resin does not adhere to that portion. As a result, there has been no loss of the resin outer shell due to the insufficient supply of resin, which has occurred conventionally.

【0017】なお、除去できなかった樹脂の残部は、型
閉めの際に、リードフレームと型面で挾さまれ、残部の
厚み分だけリードフレームと型面との隙間が大きくな
り、他の場所より樹脂ばりがより大きくなるものの、そ
の樹脂ばりそのものが薄く簡単に除去できるから、樹脂
ばり除去作業の効率を低下させるものではない。
The remaining portion of the resin that cannot be removed is sandwiched between the lead frame and the die surface when the die is closed, and the gap between the lead frame and the die surface increases by the thickness of the remaining portion. Although the resin flash becomes larger, the resin flash itself is thin and can be easily removed, so that the efficiency of the resin flash removal work is not reduced.

【0018】図2(a)及び(b)は本発明の二重樹脂
封止装置の他の実施例における一次及び二次樹脂封止金
型の下型を示す部分平面図である。この二重樹脂封止装
置は、図2に示すように、一次樹脂封止金型における下
型10aのランナ4及びクロスランナ6と二次樹脂封止
金型における下型10bのランナ5及びクロスランナ7
とをキャビティ16,17を跨がって互いに反対の位置
に設けたことである。
2 (a) and 2 (b) are partial plan views showing the lower molds of the primary and secondary resin sealing molds in another embodiment of the double resin sealing device of the present invention. As shown in FIG. 2, this double resin sealing device includes a runner 4 and a cross runner 6 of a lower die 10a in a primary resin sealing die and a runner 5 and a cross of a lower die 10b in a secondary resin sealing die. Runner 7
And are provided at positions opposite to each other across the cavities 16 and 17.

【0019】また、二次樹脂封止金型の下型の面には、
一次樹脂封止金型のクロスランナ6に対応する位置に樹
脂残部の逃げである窪み8を形成したことである。この
窪み8は、一次樹脂封止の際に除去出来なかったゲート
残りの残部を入れ、二次樹脂封止の際に完全に型閉めで
きるようにし、前述の実施例に比較しこの部分で発生す
る樹脂ばりをより少なくしたことである。特に、半導体
装置の外郭体が大型のものには、大型化に伴ないケート
残り及びその残部がより大きくなることが予想されるの
で、この実施例の二重樹脂封止装置を適用するのが望ま
しい。
On the lower die surface of the secondary resin sealing die,
This is to form a recess 8 which is a relief of the remaining resin at a position corresponding to the cross runner 6 of the primary resin sealing die. This recess 8 is formed at this portion as compared with the above-described embodiment, by allowing the remaining portion of the gate remaining that could not be removed during the primary resin sealing to be completely closed during the secondary resin sealing. This means that the amount of resin flash used is reduced. In particular, in the case where the outer casing of the semiconductor device is large, it is expected that the remaining portion of the silicate and its remaining portion will become larger with the increase in size, so it is recommended to apply the double resin sealing device of this embodiment. desirable.

【0020】図3(a)〜(e)は図2の二重樹脂封止
装置による半導体装置の二重樹脂封止方法を説明するた
めの工程順に示す部分平面図である。次に、本発明の半
導体装置の二重樹脂封止装置を理解し易いように樹脂封
止工程順に従って二重樹脂封止方法を説明する。
3 (a) to 3 (e) are partial plan views showing the order of steps for explaining the double resin sealing method of the semiconductor device by the double resin sealing device of FIG. Next, a double resin sealing method will be described in the order of the resin sealing steps so that the semiconductor device double resin sealing device of the present invention can be easily understood.

【0021】まず、図3(a)に示すように、一次樹脂
封止金型の下型10aに半導体チップ21を搭載した帯
状のリードフレーム20を乗せ、各キャビティ16内に
半導体チップ21が収納されるように位置決めする。こ
の位置決めは、通常、リードフレーム20の外枠に形成
された穴に下型10aのピンが挿入されることによって
行なわれる。
First, as shown in FIG. 3A, the strip-shaped lead frame 20 having the semiconductor chip 21 mounted thereon is placed on the lower mold 10a of the primary resin-sealed mold, and the semiconductor chip 21 is housed in each cavity 16. Position as required. This positioning is usually performed by inserting a pin of the lower mold 10a into a hole formed in the outer frame of the lead frame 20.

【0022】次に、図3(b)に示すように、一次樹脂
封止金型よりリードフレーム20を取外し、モールド体
22周囲の樹脂ばりとクロスランナ6付近のゲート樹脂
ばり24が付着した状態で一次樹脂封止済みのリードフ
レーム20を樹脂ばり除去装置(図示せず)に移載す
る。そして、まず、図3(c)に示すように、ゲート樹
脂ばり24がはつり除去され、その残部24aがリード
フレーム20の裏面に残されたままになる。引続き、モ
ールド体22の周囲の樹脂ばりが除去され、図3(d)
に示すように、リードフレーム20は二次樹脂封止金型
の下型10bに移載される。
Next, as shown in FIG. 3B, the lead frame 20 is removed from the primary resin sealing mold, and the resin flash around the mold 22 and the gate flash 24 near the cross runner 6 are attached. Then, the lead frame 20 having the primary resin sealed therein is transferred to a resin flash removing device (not shown). Then, first, as shown in FIG. 3C, the gate resin burr 24 is chipped off, and the remaining portion 24 a remains on the back surface of the lead frame 20. Subsequently, the resin flash around the mold body 22 is removed, and FIG.
As shown in, the lead frame 20 is transferred to the lower die 10b of the secondary resin sealing die.

【0023】次に、モールド体をキャビティ17内に、
リードフレーム20に付着した残部24aを窪み8に入
るように位置決めする。そして、型閉めした後、ランナ
5よりクロスランナ7を介して溶融樹脂を流し、ゲート
よりキャビテイ17に溶融樹脂を注入する。このとき、
クロスランナ7の上部にあるリードフレーム20の部分
は、何も付着していない清浄な金属面であるので、溶融
樹脂は何も抵抗なく円滑に注入される。注入完了し所定
の硬化時間経過後、型開きし、二次樹脂封止が完了した
リードフレーム20を下型10bより取外す。そして、
図3(e)に示す樹脂外郭体25の周囲に付着した樹脂
ばり、残部24a及び新たに付着したゲート樹脂ばり2
6を除去して完了する。
Next, the mold body is placed in the cavity 17.
The remaining portion 24a attached to the lead frame 20 is positioned so as to enter the recess 8. Then, after the mold is closed, the molten resin is flown from the runner 5 through the cross runner 7, and the molten resin is injected into the cavity 17 from the gate. At this time,
The portion of the lead frame 20 on the upper part of the cross runner 7 is a clean metal surface on which nothing is attached, so that the molten resin is smoothly injected without any resistance. After the injection is completed and a predetermined curing time has elapsed, the mold is opened and the lead frame 20 on which the secondary resin sealing is completed is removed from the lower mold 10b. And
Resin burrs attached to the periphery of the resin shell 25 shown in FIG. 3E, the remaining portion 24a and newly attached gate resin burrs 2
Complete with 6 removed.

【0024】このように、単にクロスランナの位置を変
えるだけで、ゲート残りの除去に固執することなく運転
できるので、装置を一時停止してオフラインでリードフ
レームの表面仕上げする必要が無くなり、樹脂封止ライ
ンの稼働をスムースにし装置の稼働率も飛躍的に向上す
ることが出来た。
As described above, by simply changing the position of the cross runner, the operation can be performed without sticking to the removal of the remaining gate, so that it is not necessary to temporarily stop the apparatus and finish the surface of the lead frame offline. The operation of the stop line was made smooth, and the operating rate of the equipment could be dramatically improved.

【0025】[0025]

【発明の効果】以上説明したように本発明は、一次及び
二次樹脂封止金型のキャビティに溶融樹脂を注入するゲ
ートをもつクロスランナの位置を互いに違えて設けるこ
とで、一次樹脂封止時に発生するゲート残りの残部が二
次樹脂封止金型のクロスランナに前記残部が入り込むこ
とが無く、二次樹脂封止時の樹脂注入が抵抗無く円滑に
注入されるので、樹脂外郭態に欠損を生じること無く成
形出来るという効果がある。また、従来オフラインで行
なわれていた前記残部の除去及び表面仕上げが全く必要
が無くなり、これら樹脂封止金型を含めた樹脂封止ライ
ンが極めて円滑に運転出来るという効果がある。
As described above, according to the present invention, the positions of the cross runners having the gates for injecting the molten resin into the cavities of the primary and secondary resin sealing molds are different from each other so that the primary resin sealing is performed. Occasionally, the remaining portion of the remaining gate does not enter the cross runner of the secondary resin sealing die, and the resin is smoothly injected without any resistance during the secondary resin encapsulation. There is an effect that molding can be performed without causing defects. Further, there is no need to completely remove the remaining portion and finish the surface, which has been conventionally performed off-line, and there is an effect that the resin sealing line including these resin sealing molds can be operated extremely smoothly.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の二重樹脂封止装置の一実施例における
一次及び二次樹脂封止金型の下型を示す部分平面図であ
る。
FIG. 1 is a partial plan view showing a lower die of a primary and secondary resin sealing die in an embodiment of a double resin sealing device of the present invention.

【図2】本発明の二重樹脂封止装置の他の実施例におけ
る一次及び二次樹脂封止金型の下型を示す部分平面図で
ある。
FIG. 2 is a partial plan view showing a lower die of a primary and secondary resin sealing mold in another embodiment of the double resin sealing device of the present invention.

【図3】図2の二重樹脂封止装置による半導体装置の二
重樹脂封止方法を説明するための工程順に示す部分平面
図である。
3A and 3B are partial plan views showing the order of steps for explaining a double resin sealing method for a semiconductor device by the double resin sealing device of FIG.

【図4】従来の二重樹脂封止装置の一例における一次及
び二次樹脂封止金型の下型を示す部分平面図である。
FIG. 4 is a partial plan view showing a lower die of a primary and secondary resin sealing mold in an example of a conventional double resin sealing device.

【図5】図4(a)の下型とリードフレームの搭載状態
を示す部分平面図である。
5 is a partial plan view showing a mounted state of the lower die and the lead frame of FIG. 4 (a).

【図6】一次樹脂封止後に発生するクロスランナ近傍に
生ずる樹脂ばりを示す断面図である。
FIG. 6 is a cross-sectional view showing a resin flash generated in the vicinity of the cross runner generated after the primary resin sealing.

【図7】図4(b)の下型とリードフレームの搭載状態
を示す部分平面図(a)及びBーB断面図(b)であ
る。
FIG. 7 is a partial plan view (a) and a BB sectional view (b) showing a mounted state of the lower die and the lead frame of FIG. 4 (b).

【符号の説明】[Explanation of symbols]

1a,1b,6,7,13a,13b クロスランナ 2a,2b,4,5,12a,12b ランナ 3a,3b,6a,7a,14a,14b ゲート 8 窪み 9a,9b,10a,10b,11a,11b 下型 16,17 キャビティ 20 リードフレーム 21 半導体チップ 22 モールド体 24,26 ゲート樹脂ばり 24a 残部 25 樹脂外郭部 1a, 1b, 6, 7, 13a, 13b Cross runners 2a, 2b, 4,5, 12a, 12b Runners 3a, 3b, 6a, 7a, 14a, 14b Gate 8 recess 9a, 9b, 10a, 10b, 11a, 11b Lower mold 16,17 Cavity 20 Lead frame 21 Semiconductor chip 22 Molded body 24,26 Gate resin burr 24a Remaining 25 Resin outer shell

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 帯状のリードフレームに帯の幅方向に並
べ載置される複数の単一半導体チップのそれぞれを独立
して包み収納する複数の第1のキャビティと、これら第
1のキャビティのそれぞれに溶融樹脂を注入する第1の
ゲートをもつとともに第1のランナより派生する第1の
クロスランナを有する一次樹脂封止金型と、 この一次樹脂封止金型で樹脂封止し形成され前記リード
フレームに数珠状に連結された複数のモールド体列を包
み収納する第2のキャビティと、この第2のキャビティ
に溶樹脂を注入する第2のゲートを有するとともに第2
のランナより派生する第2のクロスランナを有する二次
樹脂封止金型とを備える半導体装置の二重樹脂封止装置
において、 前記一次樹脂封止金型と前記二次樹脂封止とを前記第1
のキャビティの並ぶ方向と前記第2のキャビティの長手
方向とを平行にして並べ配置し平行移動して前記第1の
キャビティと前記第2のキャビティとを位置合せしたと
きに、前記第1のクロスランナと前記第2のクロスラン
ナの位置が異なることを特徴とする半導体装置の二重樹
脂封止装置。
1. A plurality of first cavities for individually enclosing and accommodating a plurality of single semiconductor chips mounted side by side in the width direction of the band on a band-shaped lead frame, and each of these first cavities. A primary resin encapsulation mold having a first gate for injecting a molten resin into the resin and a first cross runner derived from the first runner; The second frame has a second cavity for enclosing and accommodating a plurality of mold body rows connected in a bead shape in a lead frame, and a second gate for injecting molten resin into the second cavity.
In a double resin encapsulation device for a semiconductor device, which comprises a secondary resin encapsulation mold having a second cross runner derived from the above runner, the primary resin encapsulation mold and the secondary resin encapsulation are described above. First
When the first cavity and the second cavity are aligned by arranging the cavities of the first cavity and the second cavity in the longitudinal direction in parallel and arranging the first cavity and the second cavity in parallel, A double resin encapsulation device for a semiconductor device, wherein the runner and the second cross runner are different in position.
【請求項2】 前記一次樹脂封止金型の前記第1のクロ
スランナの位置に対応する前記二次樹脂封止金型の下型
面に窪みが形成されていることを特徴とする請求項1記
載の半導体装置の二重樹脂封止装置。
2. A depression is formed in a lower mold surface of the secondary resin sealing mold corresponding to a position of the first cross runner of the primary resin sealing mold. 2. A double resin sealing device for a semiconductor device according to 1.
JP4079893A 1993-03-02 1993-03-02 Double resin sealing device for semiconductor device Expired - Fee Related JP2513113B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4079893A JP2513113B2 (en) 1993-03-02 1993-03-02 Double resin sealing device for semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4079893A JP2513113B2 (en) 1993-03-02 1993-03-02 Double resin sealing device for semiconductor device

Publications (2)

Publication Number Publication Date
JPH06252191A JPH06252191A (en) 1994-09-09
JP2513113B2 true JP2513113B2 (en) 1996-07-03

Family

ID=12590650

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4079893A Expired - Fee Related JP2513113B2 (en) 1993-03-02 1993-03-02 Double resin sealing device for semiconductor device

Country Status (1)

Country Link
JP (1) JP2513113B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6602430B1 (en) * 2000-08-18 2003-08-05 Micron Technology, Inc. Methods for finishing microelectronic device packages

Also Published As

Publication number Publication date
JPH06252191A (en) 1994-09-09

Similar Documents

Publication Publication Date Title
US7537967B2 (en) Mold cleaning sheet and manufacturing method of a semiconductor device using the same
JP3897478B2 (en) Apparatus for manufacturing resin-encapsulated semiconductor device and method for manufacturing the same
JP2010010702A (en) Method of manufacturing semiconductor device
KR100244966B1 (en) Apparatus having trim punch with air flow route for trimming gate scrap
JP5054923B2 (en) Resin sealing molding method for electronic parts
JP2513113B2 (en) Double resin sealing device for semiconductor device
JP4628543B2 (en) Method of sealing electronic component arranged on mold member, mold and carrier
JP4202632B2 (en) Resin sealing structure for batch sealing type semiconductor package and manufacturing apparatus thereof
JP2002506287A5 (en)
JP3511768B2 (en) Method for manufacturing semiconductor device
JPH08227960A (en) Lead frame for semiconductor device
JP4500435B2 (en) Semiconductor aggregate substrate resin sealing body, manufacturing method and manufacturing apparatus thereof
JPH1187433A (en) Semiconductor device and its manufacture
JP2778332B2 (en) Method for manufacturing semiconductor device
JPS5933838A (en) Metal mold for resin sealing of semiconductor
JP3499269B2 (en) Cover frame and resin sealing method
JP3499266B2 (en) Carrier frame and resin sealing method
JPH05237864A (en) Production of resin sealing-type semiconductor device and jig used therefor
JPH06177192A (en) Resin molding apparatus
JPH058106Y2 (en)
JP2006339676A (en) Manufacturing method of semiconductor device
JP3444747B2 (en) Resin sealing molding method for electronic parts
JPS63172433A (en) Manufacture of resin sealed type semiconductor device
JPH0722561A (en) Semiconductor device lead frame and manufacture of semiconductor device employing lead frame
JPH04249121A (en) Resin sealed mold

Legal Events

Date Code Title Description
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 19960305

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313111

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20080430

Year of fee payment: 12

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090430

Year of fee payment: 13

LAPS Cancellation because of no payment of annual fees