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Application filed by 理学電機株式会社filedCritical理学電機株式会社
Priority to JP8543490UpriorityCriticalpatent/JP2508884Y2/ja
Publication of JPH0443254UpublicationCriticalpatent/JPH0443254U/ja
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Publication of JP2508884Y2publicationCriticalpatent/JP2508884Y2/ja
Ball-mapping system comprising a sample stage and a sample holder for receiving ball-shaped sample, and method of operating ball-mapping system for collecting x-ray diffraction data at measurement points located on ball-shaped sample