JP2025512043A5 - - Google Patents

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Publication number
JP2025512043A5
JP2025512043A5 JP2024560385A JP2024560385A JP2025512043A5 JP 2025512043 A5 JP2025512043 A5 JP 2025512043A5 JP 2024560385 A JP2024560385 A JP 2024560385A JP 2024560385 A JP2024560385 A JP 2024560385A JP 2025512043 A5 JP2025512043 A5 JP 2025512043A5
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JP
Japan
Prior art keywords
imaging
imaging system
topography
distance
dark
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2024560385A
Other languages
English (en)
Japanese (ja)
Other versions
JP2025512043A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/IB2023/053797 external-priority patent/WO2023199265A1/en
Publication of JP2025512043A publication Critical patent/JP2025512043A/ja
Publication of JP2025512043A5 publication Critical patent/JP2025512043A5/ja
Pending legal-status Critical Current

Links

JP2024560385A 2022-04-15 2023-04-13 作業面を検査するためのシステム及び方法 Pending JP2025512043A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202263363063P 2022-04-15 2022-04-15
US63/363,063 2022-04-15
PCT/IB2023/053797 WO2023199265A1 (en) 2022-04-15 2023-04-13 Systems and methods for inspecting a worksurface

Publications (2)

Publication Number Publication Date
JP2025512043A JP2025512043A (ja) 2025-04-16
JP2025512043A5 true JP2025512043A5 (enExample) 2026-04-15

Family

ID=86185299

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024560385A Pending JP2025512043A (ja) 2022-04-15 2023-04-13 作業面を検査するためのシステム及び方法

Country Status (4)

Country Link
US (1) US20250259296A1 (enExample)
EP (1) EP4508389A1 (enExample)
JP (1) JP2025512043A (enExample)
WO (1) WO2023199265A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025235569A1 (en) * 2024-05-09 2025-11-13 Dpdm Technologies Llc Dermatological imaging system guided by 3d mapping

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6327374B1 (en) * 1999-02-18 2001-12-04 Thermo Radiometrie Oy Arrangement and method for inspection of surface quality
KR101332786B1 (ko) * 2005-02-18 2013-11-25 쇼오트 아게 결함 검출 및/또는 분류 방법 및 장치
JP5110977B2 (ja) * 2007-06-22 2012-12-26 株式会社日立ハイテクノロジーズ 欠陥観察装置及びその方法
DE102012101377B4 (de) * 2012-02-21 2017-02-09 Leica Biosystems Nussloch Gmbh Verfahren bei der Vorbereitung von Proben zum Mikroskopieren und Vorrichtung zum Überprüfen der Eindeckqualität von Proben
US11455716B2 (en) * 2018-11-13 2022-09-27 Rivian Ip Holdings, Llc Image analysis of applied adhesive with fluorescence enhancement

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