JP2024545563A - ロバストなテンソル化成形設定点波形ストリーミング制御 - Google Patents
ロバストなテンソル化成形設定点波形ストリーミング制御 Download PDFInfo
- Publication number
- JP2024545563A JP2024545563A JP2024524631A JP2024524631A JP2024545563A JP 2024545563 A JP2024545563 A JP 2024545563A JP 2024524631 A JP2024524631 A JP 2024524631A JP 2024524631 A JP2024524631 A JP 2024524631A JP 2024545563 A JP2024545563 A JP 2024545563A
- Authority
- JP
- Japan
- Prior art keywords
- setpoint
- waveform
- streaming
- setpoint waveform
- module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
- H01J37/32155—Frequency modulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32917—Plasma diagnostics
- H01J37/32926—Software, data control or modelling
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Measuring Pulse, Heart Rate, Blood Pressure Or Blood Flow (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US17/509,539 | 2021-10-25 | ||
| US17/509,539 US12300464B2 (en) | 2021-10-25 | 2021-10-25 | Robust tensorized shaped setpoint waveform streaming control |
| PCT/US2022/047059 WO2023076079A1 (en) | 2021-10-25 | 2022-10-18 | Robust tensorized shaped setpoint waveform streaming control |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2024545563A true JP2024545563A (ja) | 2024-12-10 |
| JP2024545563A5 JP2024545563A5 (https=) | 2025-10-30 |
Family
ID=86057270
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2024524631A Pending JP2024545563A (ja) | 2021-10-25 | 2022-10-18 | ロバストなテンソル化成形設定点波形ストリーミング制御 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US12300464B2 (https=) |
| EP (1) | EP4423792A4 (https=) |
| JP (1) | JP2024545563A (https=) |
| TW (1) | TW202324149A (https=) |
| WO (1) | WO2023076079A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12360512B2 (en) | 2022-03-03 | 2025-07-15 | Advanced Energy Industries, Inc. | Multi-step predictive control system |
| US12272536B2 (en) * | 2022-03-03 | 2025-04-08 | Advanced Energy Industries, Inc. | Systems and methods for delay and amplitude correction |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008218898A (ja) * | 2007-03-07 | 2008-09-18 | Hitachi High-Technologies Corp | プラズマ処理装置 |
| US8258874B2 (en) | 2008-12-31 | 2012-09-04 | Advanced Energy Industries, Inc. | Dual-mode control of a power generator |
| US8040068B2 (en) | 2009-02-05 | 2011-10-18 | Mks Instruments, Inc. | Radio frequency power control system |
| US8659335B2 (en) | 2009-06-25 | 2014-02-25 | Mks Instruments, Inc. | Method and system for controlling radio frequency power |
| US8716984B2 (en) | 2009-06-29 | 2014-05-06 | Advanced Energy Industries, Inc. | Method and apparatus for modifying the sensitivity of an electrical generator to a nonlinear load |
| US8916793B2 (en) * | 2010-06-08 | 2014-12-23 | Applied Materials, Inc. | Temperature control in plasma processing apparatus using pulsed heat transfer fluid flow |
| US9309594B2 (en) * | 2010-04-26 | 2016-04-12 | Advanced Energy Industries, Inc. | System, method and apparatus for controlling ion energy distribution of a projected plasma |
| US8773019B2 (en) * | 2012-02-23 | 2014-07-08 | Mks Instruments, Inc. | Feedback control and coherency of multiple power supplies in radio frequency power delivery systems for pulsed mode schemes in thin film processing |
| JP6063776B2 (ja) * | 2013-03-04 | 2017-01-18 | 東京エレクトロン株式会社 | 基板搬送経路の決定方法、基板搬送装置、基板処理装置及びプログラム |
| US10049857B2 (en) | 2014-12-04 | 2018-08-14 | Mks Instruments, Inc. | Adaptive periodic waveform controller |
| US9721758B2 (en) | 2015-07-13 | 2017-08-01 | Mks Instruments, Inc. | Unified RF power delivery single input, multiple output control for continuous and pulse mode operation |
| US10395895B2 (en) | 2015-08-27 | 2019-08-27 | Mks Instruments, Inc. | Feedback control by RF waveform tailoring for ion energy distribution |
| CN107219478A (zh) * | 2016-03-22 | 2017-09-29 | 西门子(深圳)磁共振有限公司 | 一种磁共振成像系统的谱仪和信号处理板 |
| US10571551B2 (en) * | 2016-05-05 | 2020-02-25 | Rohde & Schwarz Gmbh & Co. Kg | Signal generation device and method |
| US10546724B2 (en) * | 2017-05-10 | 2020-01-28 | Mks Instruments, Inc. | Pulsed, bidirectional radio frequency source/load |
| US10396601B2 (en) * | 2017-05-25 | 2019-08-27 | Mks Instruments, Inc. | Piecewise RF power systems and methods for supplying pre-distorted RF bias voltage signals to an electrode in a processing chamber |
| CN115662868A (zh) * | 2017-07-07 | 2023-01-31 | 先进能源工业公司 | 等离子体功率输送系统的周期间控制系统及其操作方法 |
| JP7121506B2 (ja) * | 2018-03-14 | 2022-08-18 | 株式会社日立ハイテク | 探索装置、探索方法及びプラズマ処理装置 |
| JP7170422B2 (ja) * | 2018-05-15 | 2022-11-14 | 東京エレクトロン株式会社 | 処理装置 |
| US11042140B2 (en) | 2018-06-26 | 2021-06-22 | Mks Instruments, Inc. | Adaptive control for a power generator |
| US11626907B2 (en) * | 2019-06-19 | 2023-04-11 | Analogic Corporation | Radio frequency generators, and related systems, methods, and devices |
| WO2022169518A1 (en) * | 2021-02-05 | 2022-08-11 | Lam Research Corporation | Duty cycle control to achieve uniformity |
| US11715624B2 (en) * | 2021-08-09 | 2023-08-01 | Mks Instruments, Inc. | Adaptive pulse shaping with post match sensor |
-
2021
- 2021-10-25 US US17/509,539 patent/US12300464B2/en active Active
-
2022
- 2022-10-18 JP JP2024524631A patent/JP2024545563A/ja active Pending
- 2022-10-18 WO PCT/US2022/047059 patent/WO2023076079A1/en not_active Ceased
- 2022-10-18 EP EP22887951.6A patent/EP4423792A4/en active Pending
- 2022-10-20 TW TW111139835A patent/TW202324149A/zh unknown
-
2025
- 2025-04-23 US US19/186,843 patent/US20250253134A1/en active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| US12300464B2 (en) | 2025-05-13 |
| US20250253134A1 (en) | 2025-08-07 |
| EP4423792A4 (en) | 2025-09-17 |
| EP4423792A1 (en) | 2024-09-04 |
| US20230125521A1 (en) | 2023-04-27 |
| TW202324149A (zh) | 2023-06-16 |
| WO2023076079A1 (en) | 2023-05-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20251020 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20251020 |