JP2024120275A - 自覚式検眼装置および自覚式検眼プログラム - Google Patents

自覚式検眼装置および自覚式検眼プログラム Download PDF

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Publication number
JP2024120275A
JP2024120275A JP2023026950A JP2023026950A JP2024120275A JP 2024120275 A JP2024120275 A JP 2024120275A JP 2023026950 A JP2023026950 A JP 2023026950A JP 2023026950 A JP2023026950 A JP 2023026950A JP 2024120275 A JP2024120275 A JP 2024120275A
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Japan
Prior art keywords
eye
subject
test
overcorrection
subjective
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Pending
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JP2023026950A
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Japanese (ja)
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JP2024120275A5 (https=
Inventor
知宏 上川
Tomohiro Kamikawa
譲児 瀬古
Joji Seko
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2023026950A priority Critical patent/JP2024120275A/ja
Publication of JP2024120275A publication Critical patent/JP2024120275A/ja
Publication of JP2024120275A5 publication Critical patent/JP2024120275A5/ja
Pending legal-status Critical Current

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JP2023026950A 2023-02-24 2023-02-24 自覚式検眼装置および自覚式検眼プログラム Pending JP2024120275A (ja)

Priority Applications (1)

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JP2023026950A JP2024120275A (ja) 2023-02-24 2023-02-24 自覚式検眼装置および自覚式検眼プログラム

Applications Claiming Priority (1)

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JP2023026950A JP2024120275A (ja) 2023-02-24 2023-02-24 自覚式検眼装置および自覚式検眼プログラム

Publications (2)

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JP2024120275A true JP2024120275A (ja) 2024-09-05
JP2024120275A5 JP2024120275A5 (https=) 2025-12-25

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JP2023026950A Pending JP2024120275A (ja) 2023-02-24 2023-02-24 自覚式検眼装置および自覚式検眼プログラム

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JP (1) JP2024120275A (https=)

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