JP2024108448A5 - - Google Patents

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Publication number
JP2024108448A5
JP2024108448A5 JP2023012826A JP2023012826A JP2024108448A5 JP 2024108448 A5 JP2024108448 A5 JP 2024108448A5 JP 2023012826 A JP2023012826 A JP 2023012826A JP 2023012826 A JP2023012826 A JP 2023012826A JP 2024108448 A5 JP2024108448 A5 JP 2024108448A5
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JP
Japan
Prior art keywords
arrangement
ray detector
detector
axis
adjustment mechanism
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023012826A
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English (en)
Japanese (ja)
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JP2024108448A (ja
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Publication date
Application filed filed Critical
Priority to JP2023012826A priority Critical patent/JP2024108448A/ja
Priority claimed from JP2023012826A external-priority patent/JP2024108448A/ja
Priority to US18/407,503 priority patent/US12487195B2/en
Publication of JP2024108448A publication Critical patent/JP2024108448A/ja
Publication of JP2024108448A5 publication Critical patent/JP2024108448A5/ja
Pending legal-status Critical Current

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JP2023012826A 2023-01-31 2023-01-31 検出器台座及びｘ線回折装置 Pending JP2024108448A (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2023012826A JP2024108448A (ja) 2023-01-31 2023-01-31 検出器台座及びｘ線回折装置
US18/407,503 US12487195B2 (en) 2023-01-31 2024-01-09 Detector stand and X-ray diffraction apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2023012826A JP2024108448A (ja) 2023-01-31 2023-01-31 検出器台座及びｘ線回折装置

Publications (2)

Publication Number Publication Date
JP2024108448A JP2024108448A (ja) 2024-08-13
JP2024108448A5 true JP2024108448A5 (enExample) 2025-03-31

Family

ID=91964247

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023012826A Pending JP2024108448A (ja) 2023-01-31 2023-01-31 検出器台座及びｘ線回折装置

Country Status (2)

Country Link
US (1) US12487195B2 (enExample)
JP (1) JP2024108448A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2024108448A (ja) * 2023-01-31 2024-08-13 株式会社リガク 検出器台座及びｘ線回折装置

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01187441A (ja) * 1988-01-22 1989-07-26 Rigaku Denki Kk Ｘ線回折装置の三軸回転ゴニオメータ
JP2984232B2 (ja) * 1996-10-25 1999-11-29 株式会社テクノス研究所 Ｘ線分析装置およびｘ線照射角設定方法
US6744850B2 (en) * 2001-01-11 2004-06-01 Therma-Wave, Inc. X-ray reflectance measurement system with adjustable resolution
US6895075B2 (en) * 2003-02-12 2005-05-17 Jordan Valley Applied Radiation Ltd. X-ray reflectometry with small-angle scattering measurement
JP2005055241A (ja) * 2003-08-01 2005-03-03 Rigaku Corp 結晶試料ホルダと結晶評価システム
DE10340072A1 (de) * 2003-08-30 2005-03-31 Bruker Axs Gmbh Virtueller 2-dimensionaler Detektor
US7120228B2 (en) * 2004-09-21 2006-10-10 Jordan Valley Applied Radiation Ltd. Combined X-ray reflectometer and diffractometer
DE102004050543A1 (de) * 2004-10-16 2006-04-20 Bruker Axs Gmbh Analysegerät mit variabel ausgeleuchtetem Streifendetektor
US7190762B2 (en) * 2004-10-29 2007-03-13 Broker Axs, Inc Scanning line detector for two-dimensional x-ray diffractometer
DE102006011004B4 (de) * 2006-03-09 2008-12-04 Siemens Ag Röntgensystem mit Röntgen-Flachdetektoren
JP2007256542A (ja) * 2006-03-22 2007-10-04 Expert Of Japan:Kk 固定アタッチメント
US7920676B2 (en) * 2007-05-04 2011-04-05 Xradia, Inc. CD-GISAXS system and method
RU2419088C1 (ru) * 2010-02-01 2011-05-20 Учреждение Российской академии наук Физический институт им. П.Н. Лебедева РАН (ФИАН) Рентгеновский спектрометр
CN104737005B (zh) * 2012-10-18 2017-09-29 卡尔蔡司X射线显微镜公司 具有晶粒取向映射功能的实验室x射线微断层扫描系统
JP2014089143A (ja) * 2012-10-31 2014-05-15 Rigaku Corp Ｘ線検出器およびｘ線回折装置
US9557282B1 (en) * 2013-06-17 2017-01-31 U.S. Department Of Energy High precision detector robot arm system
CN109313145A (zh) * 2016-07-15 2019-02-05 株式会社理学 X射线检测设备、x射线薄膜检测方法和测量摇摆曲线的方法
WO2018027321A1 (en) * 2016-08-10 2018-02-15 Proto Manufacturing Ltd. Mounting system and sample holder for x-ray diffraction apparatus
JP6467600B2 (ja) * 2016-09-30 2019-02-13 株式会社リガク 波長分散型蛍光ｘ線分析装置
US10295484B2 (en) * 2017-04-05 2019-05-21 Bruker Axs, Inc. Method and apparatus for extending angular coverage for a scanning two-dimensional X-ray detector
JP2018205247A (ja) * 2017-06-08 2018-12-27 富士通株式会社 Ｘ線回折分析方法及びｘ線回折分析装置
US11867595B2 (en) * 2019-10-14 2024-01-09 Industrial Technology Research Institute X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate
EP3961199A1 (en) * 2020-08-24 2022-03-02 Malvern Panalytical B.V. X-ray detector for x-ray diffraction analysis apparatus
WO2023205358A1 (en) * 2022-04-20 2023-10-26 Arion Diagnostics, Inc. Diffractive analyzer of patient tissue
JP2024108448A (ja) * 2023-01-31 2024-08-13 株式会社リガク 検出器台座及びｘ線回折装置

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