JP2024108448A5 - - Google Patents
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- Publication number
- JP2024108448A5 JP2024108448A5 JP2023012826A JP2023012826A JP2024108448A5 JP 2024108448 A5 JP2024108448 A5 JP 2024108448A5 JP 2023012826 A JP2023012826 A JP 2023012826A JP 2023012826 A JP2023012826 A JP 2023012826A JP 2024108448 A5 JP2024108448 A5 JP 2024108448A5
- Authority
- JP
- Japan
- Prior art keywords
- arrangement
- ray detector
- detector
- axis
- adjustment mechanism
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007246 mechanism Effects 0.000 claims description 46
- 238000001514 detection method Methods 0.000 claims description 4
- 238000002441 X-ray diffraction Methods 0.000 claims 2
- 230000001105 regulatory effect Effects 0.000 claims 2
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims 1
- 238000000034 method Methods 0.000 description 1
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023012826A JP2024108448A (ja) | 2023-01-31 | 2023-01-31 | 検出器台座及びｘ線回折装置 |
| US18/407,503 US12487195B2 (en) | 2023-01-31 | 2024-01-09 | Detector stand and X-ray diffraction apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023012826A JP2024108448A (ja) | 2023-01-31 | 2023-01-31 | 検出器台座及びｘ線回折装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2024108448A JP2024108448A (ja) | 2024-08-13 |
| JP2024108448A5 true JP2024108448A5 (enExample) | 2025-03-31 |
Family
ID=91964247
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023012826A Pending JP2024108448A (ja) | 2023-01-31 | 2023-01-31 | 検出器台座及びｘ線回折装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US12487195B2 (enExample) |
| JP (1) | JP2024108448A (enExample) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2024108448A (ja) * | 2023-01-31 | 2024-08-13 | 株式会社リガク | 検出器台座及びｘ線回折装置 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01187441A (ja) * | 1988-01-22 | 1989-07-26 | Rigaku Denki Kk | Ｘ線回折装置の三軸回転ゴニオメータ |
| JP2984232B2 (ja) * | 1996-10-25 | 1999-11-29 | 株式会社テクノス研究所 | Ｘ線分析装置およびｘ線照射角設定方法 |
| US6744850B2 (en) * | 2001-01-11 | 2004-06-01 | Therma-Wave, Inc. | X-ray reflectance measurement system with adjustable resolution |
| US6895075B2 (en) * | 2003-02-12 | 2005-05-17 | Jordan Valley Applied Radiation Ltd. | X-ray reflectometry with small-angle scattering measurement |
| DE10340072A1 (de) * | 2003-08-30 | 2005-03-31 | Bruker Axs Gmbh | Virtueller 2-dimensionaler Detektor |
| US7120228B2 (en) * | 2004-09-21 | 2006-10-10 | Jordan Valley Applied Radiation Ltd. | Combined X-ray reflectometer and diffractometer |
| US7190762B2 (en) * | 2004-10-29 | 2007-03-13 | Broker Axs, Inc | Scanning line detector for two-dimensional x-ray diffractometer |
| DE102006011004B4 (de) * | 2006-03-09 | 2008-12-04 | Siemens Ag | Röntgensystem mit Röntgen-Flachdetektoren |
| US7920676B2 (en) * | 2007-05-04 | 2011-04-05 | Xradia, Inc. | CD-GISAXS system and method |
| RU2419088C1 (ru) * | 2010-02-01 | 2011-05-20 | Учреждение Российской академии наук Физический институт им. П.Н. Лебедева РАН (ФИАН) | Рентгеновский спектрометр |
| JP2014089143A (ja) * | 2012-10-31 | 2014-05-15 | Rigaku Corp | Ｘ線検出器およびｘ線回折装置 |
| US9557282B1 (en) * | 2013-06-17 | 2017-01-31 | U.S. Department Of Energy | High precision detector robot arm system |
| DE112017003580T5 (de) * | 2016-07-15 | 2019-05-09 | Rigaku Corporation | Röntgeninspektionsvorrichtung, Röntgendünnfilminspektionsverfahren und Verfahren zum Messen einer Rocking-Kurve |
| US10794844B2 (en) * | 2016-08-10 | 2020-10-06 | Proto Manufacturing, Ltd. | Mounting system and sample holder for X-ray diffraction apparatus |
| JP6467600B2 (ja) * | 2016-09-30 | 2019-02-13 | 株式会社リガク | 波長分散型蛍光ｘ線分析装置 |
| US10295484B2 (en) * | 2017-04-05 | 2019-05-21 | Bruker Axs, Inc. | Method and apparatus for extending angular coverage for a scanning two-dimensional X-ray detector |
| JP2018205247A (ja) * | 2017-06-08 | 2018-12-27 | 富士通株式会社 | Ｘ線回折分析方法及びｘ線回折分析装置 |
| US11867595B2 (en) * | 2019-10-14 | 2024-01-09 | Industrial Technology Research Institute | X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate |
| US12336851B2 (en) * | 2022-04-20 | 2025-06-24 | Arion Diagnostics, Inc. | Diffractive analyzer of patient tissue |
| JP2024108448A (ja) * | 2023-01-31 | 2024-08-13 | 株式会社リガク | 検出器台座及びｘ線回折装置 |
-
2023
- 2023-01-31 JP JP2023012826A patent/JP2024108448A/ja active Pending
-
2024
- 2024-01-09 US US18/407,503 patent/US12487195B2/en active Active
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